Characteristic testing device for semiconductor laser

Abstract

The utility model discloses a characteristic testing device for a semiconductor laser, which comprises a tester and a laser frame, the tester comprises a plurality of groups of detachably mounted or movable assembly frames, the inside of each assembly frame is movably connected with a testing panel, and one side of the testing panel close to the laser frame is fixedly provided with an optical testing piece. The optical test piece is used for receiving and detecting laser emitted by the semiconductor laser to-be-tested piece on the laser frame; any two adjacent assembling frames are detachably installed through a rotating device, and the included angle or distance between any two assembling frames which are installed in a matched mode is adjusted through the rotating device. The assembling frame can be freely disassembled and assembled through the rotating device, coordinate curves are drawn according to the receiving magnitude and distance of the optical test piece to laser energy, the use characteristics of the tested piece of the semiconductor laser can be found out, the assembling frame can be freely matched and selected for operation according to requirements, and the application range is wide.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor laser test specimens testing, and specifically relates to a characteristic testing device for semiconductor lasers. Background Art

[0002] A semiconductor laser test specimen is a device that uses semiconductor materials (usually compound semiconductors such as selenides, nitrides, or phosphides) to emit laser light. They play a crucial role in many modern technological applications, including communication, medical, material processing, and optical sensing. The working principle of a semiconductor laser test specimen is similar to that of other types of lasers. They utilize the recombination process of electrons and holes in the semiconductor lattice to generate light. When an electric current passes through the semiconductor material, electrons and holes combine and emit photons, thereby generating a laser beam. Compared with other types of lasers, semiconductor laser test specimens have the advantages of smaller volume, higher efficiency, and lower cost, and are therefore widely used in various devices and systems.

[0003] The patent with the publication number CN102109571B discloses a characteristic testing system for semiconductor laser test specimens. Specifically, it discloses "a characteristic testing system for semiconductor laser test specimens, including an optical platform and a computer system, characterized in that: a two-dimensional translation guide rail is fixedly arranged on the optical platform, the two-dimensional translation guide rail is fixedly provided with a laser fixing seat through a slider, a tested laser is arranged on the laser fixing seat, and a laser temperature control module for controlling the temperature of the tested laser is also arranged on the laser fixing seat; one or more of an LIV and a spectrum testing module, a polarization testing module, a near-field spot testing module, a near-field nonlinear testing module, a far-field testing module, and a spatial spectrum testing module, which are respectively connected to the computer system, are arranged beside the two-dimensional translation guide rail; the tested laser is connected to the computer system through a semiconductor laser test specimen driver; the near-field nonlinear testing module includes a lens system and a first CCD camera; the light emitted by the tested laser is collimated into parallel light through the lens system in sequence, and the parallel light is magnified and presented on the first CCD camera" The technical solution realizes the technical effect of "the utility model is used for the high-precision and automatic testing of semiconductor laser test specimens, especially high-power semiconductor laser test specimens, and reduces the detection and production manufacturing costs of semiconductor laser test specimens".

[0004] However, when this device is used, it can only perform characteristic tests on semiconductor laser test specimens with a single frequency, and there is no test solution for the energy loss test of semiconductor laser test specimens, resulting in incomplete characteristic test efficiency of semiconductor laser test specimens. Content of the Utility Model

[0005] The purpose of the present utility model is to provide a characteristic testing device for semiconductor lasers to solve the problems raised in the above-mentioned background technology.

[0006] To achieve the above object, the present utility model provides the following technical solution: A characteristic testing device for semiconductor lasers, including a tester and a laser holder. The tester includes several groups of assembly frames that can be detachably installed or moved. A test panel is movably connected inside the assembly frame. The laser holder is used to install the semiconductor laser to be tested. A light testing piece is fixedly installed on one side of the test panel close to the laser holder. The light testing piece is used to receive and detect the laser emitted by the semiconductor laser to be tested on the laser holder; Any two adjacent assembly frames are detachably installed through a rotating device, and the included angle or distance between any two cooperatively installed assembly frames can be adjusted through the rotating device. A structure for locking the test panel after rotation is provided inside the assembly frame.

[0007] As a further scheme of the present utility model: The rotating device includes a hinge and a screw. Threaded holes are provided at both ends of the hinge. The two screws are respectively threadedly connected to the two threaded holes. The two screws are hinged to each other through a cooperating hinge. One end of the screw away from the hinge is connected to a lead screw. A lead screw nut is sleeved on the lead screw, and the lead screw is movably connected to the lead screw nut. A lead screw nut frame is fixedly connected to the side end of the assembly frame. The lead screw nut is fixedly connected to the lead screw nut frame.

[0008] As a further scheme of the present utility model: The laser holder includes an installation frame, a telescopic column, and an anti-detachment elastic frame. The anti-detachment elastic frame is fixedly installed inside the installation frame. The telescopic column is fixedly installed inside the laser holder, and its output end is movably arranged.

[0009] As a further scheme of the present utility model: One end of the test panel passes through the assembly frame and is fixedly connected to a gear shaft. A clamping strip is movably connected to the assembly frame. The clamping strip meshes with the gear shaft and clamps the gear shaft.

[0010] As a further scheme of the present utility model: A bottom support groove is provided on the bottom side of the assembly frame. A ground support is hinged inside the bottom support groove. One end of the ground support is provided with a rounded structure.

[0011] As a further scheme of the present utility model: A rolling ball groove is provided on the bottom side of the assembly frame. A rolling ball is arranged inside the rolling ball groove. The rolling ball is rotatably connected to the rolling ball groove.

[0012] As a further scheme of the present utility model: A servo motor is installed on the assembly frame. A ball screw is provided at the output end of the servo motor. The clamping strip is cooperatively connected to the ball screw.

[0013] As a further solution of the present utility model: an installation groove is provided at the top of the assembly frame, and a magnetic strip is installed in the installation groove. One magnetic strip is installed in the installation grooves of any two adjacent and parallel assembly frames.

[0014] As a further solution of the present utility model: a strip frame is provided on one side of the assembly frame. Among them, the magnetic strip can be placed on the strip frame after being detachably removed from the installation groove.

[0015] As a further solution of the present utility model: an anti - detachment cap is fixedly connected to the end of the lead screw far from the screw.

[0016] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0017] 1. The assembly frame can be freely disassembled and assembled through the rotating device. The laser emitted by the semiconductor laser under test is detected by multiple optical test pieces. According to the acceptance magnitude and distance of the laser energy of the semiconductor laser under test by the optical test pieces, a coordinate curve is drawn to explore the usage characteristics of the semiconductor laser under test; at the same time, it can also detect whether the conventional functions of the semiconductor laser under test are normal. During the process, the rays of the semiconductor laser under test will be emitted onto the test panel and output from the tester after multiple refractions at multiple angles. During the process, the laser energy at the last refraction needs to be recorded and then compared with the laser energy detected for the first time. If it is within the normal value, it indicates that the refraction function of the semiconductor laser under test is normal. This application can be freely combined and selected for operation according to needs, and has a wide range of uses.

[0018] 2. By setting the rotating device, the two screws are hinged to each other through a hinge. Therefore, the position of the lead screw connected to the screw and the lead screw nut arranged on the lead screw can be changed through the hinge. And the two lead screw nuts are respectively connected to the two assembly frames, and the angles of the two assembly frames can be changed, as well as the distance between the two assembly frames, so that the equipment can be freely adjusted for use according to needs. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 is a schematic diagram of the overall structure in the embodiment of the present utility model;

[0020] Figure 2 is a schematic diagram of the usage state of the tester in the embodiment of the present utility model;

[0021] Figure 3 is a schematic diagram of the structure of a single - group assembly frame in the embodiment of the present utility model;

[0022] Figure 4 is a schematic diagram of the disassembled structure of the assembly frame, the rotating device and the magnetic strip in the embodiment of the present utility model;

[0023] Figure 5Schematic diagram of the structure of the assembly rack in the embodiment of the present utility model;

[0024] Figure 6 Schematic diagram of the structure of the rotating device in the embodiment of the present utility model;

[0025] Figure 7 Assembly drawing of the ball groove and the ball in the embodiment of the present utility model;

[0026] Figure 8 Schematic diagram of the structure of the laser rack in the embodiment of the present utility model;

[0027] Figure 9 In the embodiment of the present utility model Figure 3 Enlarged view of part A;

[0028] Figure 10 In the embodiment of the present utility model Figure 4 Enlarged view of part B;

[0029] Figure 11 Schematic diagram of the structure of the test panel in the embodiment of the present utility model.

[0030] In the figure: 1, tester; 2, assembly rack; 21, screw-nut rack; 22, bottom support groove; 23, built-in ball screw; 24, servo motor; 25, clamping strip; 26, ball groove; 27, ball; 28, bar rack; 29, ground support; 3, test panel; 31, optical test piece; 32, gear shaft; 4, laser rack; 41, mounting frame; 42, telescopic column; 43, anti-detachment spring frame; 5, rotating device; 51, mating hinge; 52, screw rod; 53, screw nut; 54, screw; 55, screw hole; 56, anti-detachment cap; 6, magnetic strip. Detailed implementation manners

[0031] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.

[0032] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present utility model. In addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance. In the description of the present utility model, it should be noted that unless otherwise clearly specified and defined, the terms "installed", "connected", "connected", "set" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific situations. The following describes the embodiments according to the overall structure of the present utility model.

[0033] A characteristic testing device for a semiconductor laser includes a tester 1 and a laser holder 4. The tester 1 includes several groups of assembly frames 2 that can be detachably installed or moved. A test panel 3 is movably connected inside the assembly frame 2. The laser holder 4 is movably connected to the semiconductor laser to be tested. On one side of the test panel 3, an optical test piece 31 for receiving the laser emitted by the laser holder 4 is fixedly installed. The assembly frames 2 are adjusted for the included angle, distance between each other or disassembled and assembled through a rotating device 5, and a structure for locking the test panel 3 after rotation is provided inside the assembly frame 2.

[0034] Other embodiments of the present utility model: Please refer to Figures 1 to 11 , in this embodiment, the assembly frame 2 can be freely disassembled and assembled through the rotating device 5. The specific process is as follows:

[0035] Step S1: Install the semiconductor laser to be tested on the laser holder 4, and at the same time, the semiconductor laser to be tested emits laser;

[0036] Step S2: If it is necessary to test the data of the laser energy loss of the semiconductor laser under test in the case of multi-refraction, four or more mounting brackets 2 can be selected for assembly. During the test, the rays of the semiconductor laser under test will be emitted onto the test panel 3 and received by the optical test piece 31. The optical test piece 31 can be connected to a controller and transmit the captured laser energy magnitude to the test host. In addition, a distance sensor (not shown in the figure) can be provided inside the optical test piece 31 to detect the position and distance from the optical test piece 31 to the optical test piece 31. Then, based on the laser energy received by the optical test piece 31 and the distance, a coordinate curve is drawn to explore the usage characteristics of the semiconductor laser under test;

[0037] Step S3: If it is necessary to detect whether the normal functions of the semiconductor laser under test are normal, less than four mounting brackets 2 can be selected for assembly. During the process, the rays of the semiconductor laser under test will be emitted onto the test panel 3, and after multiple refractions at multiple angles, they will be output from the tester 1. During the process, the laser energy at the last refraction needs to be recorded and then compared with the laser energy detected for the first time. If it is within the normal value, it indicates that the refraction function of the semiconductor laser under test is normal.

[0038] The mounting bracket 2 can be freely disassembled and assembled through the rotating device 5. Based on the laser energy received by the optical test piece 31 and the distance, a coordinate curve is drawn to explore the usage characteristics of the semiconductor laser under test; at the same time, it can also detect whether the normal functions of the semiconductor laser under test are normal. During the process, the rays of the semiconductor laser under test will be emitted onto the test panel 3, and after multiple refractions at multiple angles, they will be output from the tester. During the process, the laser energy at the last refraction needs to be recorded and then compared with the laser energy detected for the first time. If it is within the normal value, it indicates that the refraction function of the semiconductor laser under test is normal. This application can be freely configured and selected for operation according to requirements, with a wide range of uses.

[0039] As a further solution of the present utility model: A characteristic testing device for a semiconductor laser, the rotating device 5 includes a mating hinge 51, a lead screw 52, a lead screw nut 53, a screw rod 54, and a screw hole 55. One side of the mounting bracket 2 is fixedly connected with a lead screw nut bracket 21, the lead screw nut 53 is fixedly connected with the lead screw nut bracket 21, the lead screw 52 is embedded inside the lead screw nut 53 and is movably connected with the lead screw nut 53. One end of the lead screw 52 is fixedly connected with the screw rod 54, and both groups of screw rods 54 are threadedly engaged with the screw hole 55. The two groups of screw rods 54 are hinged to each other through the mating hinge 51.

[0040] Other embodiments of the present utility model: Please refer to Figures 1 to 11, since the rotating device 5 includes a mating hinge 51, a lead screw 52, a lead screw nut 53, a screw rod 54 and a threaded hole 55, one side of the assembly frame 2 is fixedly connected with a lead screw nut frame 21, the lead screw nut 53 is fixedly connected with the lead screw nut frame 21, the lead screw 52 is embedded inside the lead screw nut 53 and is movably connected with the lead screw nut 53, one end of the lead screw 52 is fixedly connected with the screw rod 54, both groups of screw rods 54 are in screw connection with the threaded hole 55, and both groups of screw rods 54 are hinged to each other through the mating hinge 51. Therefore, the angle of the ball screw nut pair composed of the lead screw 52 and the lead screw nut 53 can be changed through the hinge 51, and the distance between the two groups of assembly frames 2 can also be changed during the process of changing the angle, so that the equipment can be freely adjusted for use according to requirements.

[0041] As a further scheme of the present invention: A characteristic testing device for a semiconductor laser, the laser holder 4 includes a mounting frame 41, a telescopic column 42 and an anti - detachment elastic frame 43. The anti - detachment elastic frame 43 is fixedly installed inside the mounting frame 41 and is used for clamping and fixing the semiconductor laser test piece to be tested, and the telescopic column 42 is fixedly installed inside the laser holder 4, and its output end is movably arranged.

[0042] Other embodiments of the present invention: Please refer to Figures 1 to 11 , on the one hand, since a bottom support groove 22 is opened on one side of the test panel 3, a ground support 29 is hinged inside the bottom support groove 22 and one side of the ground support 29 is provided with a rounded - corner structure. On the other hand, since the laser holder 4 includes a mounting frame 41, a telescopic column 42 and an anti - detachment elastic frame 43, the anti - detachment elastic frame 43 is fixedly installed inside the mounting frame 41 and is used for clamping and fixing the semiconductor laser test piece to be tested, and the telescopic column 42 is fixedly installed inside the laser holder 4, and its output end is movably arranged. Therefore, when the equipment is placed and needs to be tested, to prevent the equipment from moving, the assembly frame 2 can be supported by flipping the ground support 29, and the laser holder 4 can be supported by extending and retracting the telescopic column 42, so as to ensure the normal operation of the equipment and avoid the problem that the test effect is inaccurate due to the movement of the semiconductor laser test piece during the test.

[0043] As a further scheme of the present invention: A characteristic testing device for a semiconductor laser, one end of the test panel 3 passes through the assembly frame 2 and is fixedly connected with a gear shaft 32, a clamping strip 25 is movably connected to one side of the assembly frame 2, the clamping strip 25 is movably connected with the gear shaft 32, a servo motor 24 is fixedly installed on one side of the assembly frame 2, a built - in ball screw 23 is arranged at the output end of the servo motor 24, and the clamping strip 25 is assembled with the built - in ball screw 23.

[0044] Other embodiments of the present invention: Please refer to Figure 5 and Figure 9Since one end of the test panel 3 is fixedly connected to the gear shaft 32 after passing through the assembly frame 2, a positioning bar 25 is movably connected to one side of the assembly frame 2, and the positioning bar 25 is movably connected to the gear shaft 32. A servo motor 24 is fixedly installed on one side of the assembly frame 2, and a built-in ball screw 23 is provided at the output end of the servo motor 24. The positioning bar 25 and the built-in ball screw 23 are assembled with each other. Therefore, after the test panel 3 is rotated, the test panel 3 can be fixed by the engagement connection between the positioning bar 25 and the gear shaft 32, thereby preventing the test panel 3 from moving and maintaining the accuracy of the test results of the semiconductor laser test piece.

[0045] As a further solution of the utility model: a characteristic testing device for semiconductor lasers, a bottom support groove 22 is opened on one side of the test panel 3, a ground support 29 is hinged inside the bottom support groove 22, and one side of the ground support 29 is set as a rounded structure.

[0046] As a further solution of the utility model: a characteristic test device for semiconductor lasers, a ball rolling groove 26 is opened on one side of the assembly frame 2, a ball rolling groove 26 is arranged inside the ball rolling groove 26, and the ball rolling 27 is switched to the ball rolling groove 26.

[0047] Other embodiments of the present invention: Please refer to Figures 1 to 11 Since a ball rolling groove 26 is provided on one side of the assembly frame 2, a ball rolling groove 26 is provided with a ball rolling 27 inside, and the ball rolling 27 is connected to the ball rolling groove 26, the ball rolling 27 can be used to facilitate the movement of the device when the device is not in use.

[0048] As a further solution of the utility model: a characteristic testing device for semiconductor lasers, a servo motor 24 is fixedly installed on one side of the assembly frame 2, an output end of the servo motor 24 is provided with a built-in ball screw 23, and a positioning strip 25 and the built-in ball screw 23 are assembled with each other.

[0049] As a further solution of the utility model: a characteristic test device for semiconductor lasers, a magnetic strip 6 is provided on one side of the assembly rack 2, and two groups of assembly racks 2 are connected by the magnetic strip 6.

[0050] Other embodiments of the present invention: Please refer to Figures 1 to 11 Since a mounting groove is provided on the top of the assembly rack 2, any two adjacent and parallel assembly racks 2 are installed and fixed by a magnetic strip 6 to achieve a limiting effect. Therefore, the assembly rack 2 can be fixed when the assembly rack 2 is gathered, which is convenient for carrying the assembly rack 2.

[0051] As a further solution of the present utility model: A characteristic testing device for a semiconductor laser, one side of the mounting frame 2 is fixedly connected with a strip frame 28. When the magnetic strip 6 is not loaded in the mounting groove, the magnetic strip 6 can be placed on the strip frame 28, and the magnetic strip 6 can be stored through the strip frame 28 and the loss of the magnetic strip 6 can be prevented.

[0052] Other embodiments of the present utility model: Please refer to Figures 1 to 11 , because one side of the mounting frame 2 is fixedly connected with a strip frame 28, the magnetic strip 6 is placed on the strip frame 28, and the magnetic strip 6 can be stored through the strip frame 28 and the loss of the magnetic strip 6 can be prevented.

[0053] As a further solution of the present utility model: A characteristic testing device for a semiconductor laser, a retaining cap 56 is fixedly connected to one end of the lead screw 52 away from the screw 54.

[0054] Other embodiments of the present utility model: Since a retaining cap 56 is fixedly connected to one end of the lead screw 52 away from the screw 54, the problem that the lead screw 52 is pulled away from the lead screw nut frame 21 can be prevented, and the loss of the lead screw 52 can be avoided.

[0055] The working principle of the present utility model is: The mounting frame 2 can be freely disassembled and assembled through the rotating device 5. The specific process is as follows:

[0056] Step S1: The semiconductor laser test piece installed on the laser device rack 4 emits laser light.

[0057] Step S2: If it is necessary to test the data of the laser energy loss of the semiconductor laser test piece under multi-refraction conditions, four or more mounting frames 2 can be selected for assembly as shown in Figure 1 . During the test, the rays of the semiconductor laser test piece will be emitted to the test panel 3 and received by the optical test piece 31. The optical test piece 31 can be connected to a controller and transmit the captured laser energy magnitude to the test host. And a distance sensor can be arranged inside the optical test piece 31 to detect the position and distance from the optical test piece 31 to the optical test piece 31. Then, according to the acceptance magnitude and distance of the laser energy by the optical test piece 31, a coordinate curve is drawn to explore the usage characteristics of the semiconductor laser test piece;

[0058] Step S3: If it is necessary to detect whether the conventional functions of the semiconductor laser test piece are normal, less than four mounting frames 2 can be selected for assembly as shown in Figure 2 . During the process, the rays of the semiconductor laser test piece will be emitted to the test panel 3, refracted at multiple angles many times and then output from the tester 1. During the process, the laser energy at the last refraction needs to be recorded, and then compared with the laser energy detected for the first time. If it is within the normal value, it means that the refraction function of the semiconductor laser test piece is normal.

[0059] The above are only the preferred specific embodiments of the present utility model, but the protection scope of the present utility model is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present utility model, according to the technical solution of the present utility model and its inventive concept, makes equivalent substitutions or changes, and should be covered within the protection scope of the present utility model.

Claims

1. A characteristic testing device for semiconductor lasers, characterized in that: The invention comprises a tester (1) and a laser rack (4), wherein the tester (1) comprises a plurality of groups of detachably mounted or movable assembly racks (2), a test panel (3) being movably connected inside the assembly rack (2), and an optical test piece (31) being fixedly mounted on one side of the test panel (3) close to the laser rack (4); Any two adjacent assembly frames (2) are detachably mounted via a rotating device (5), and any two matching assembly frames (2) can adjust the angle or distance between them via the rotating device (5), and a structure for locking the test panel (3) after rotation is provided inside the assembly frame (2).

2. A characteristic testing device for semiconductor lasers according to claim 1, characterized in that: The rotating device (5) comprises a hinge (51) and a screw rod (54). Both ends of the hinge (51) are provided with screw holes (55). The two screw rods (54) are respectively threadedly connected to the two screw holes (55). The two screw rods (54) are hinged to each other through the matching hinge (51). One end of the screw rod (54) away from the hinge (51) is connected to a screw rod (52). A screw rod nut (53) is sleeved on the screw rod (52), and the screw rod (52) and the screw rod nut (53) are movably connected. The side end of the assembly frame (2) is fixedly connected to a screw rod nut frame (21), and the screw rod nut (53) is fixedly connected to the screw rod nut frame (21).

3. A characteristic testing device for semiconductor lasers according to claim 1, characterized in that: The laser frame (4) comprises a mounting frame (41), a telescopic column (42) and an anti-elasticity frame (43); the anti-elasticity frame (43) is fixedly mounted inside the mounting frame (41); the telescopic column (42) is fixedly mounted inside the laser frame (4), and its output end is movably arranged.

4. A characteristic testing device for semiconductor lasers according to claim 1, characterized in that: One end of the test panel (3) passes through the assembly frame (2) and is fixedly connected to a gear shaft (32). The assembly frame (2) is movably connected to a clamping strip (25). The clamping strip (25) is meshed with the gear shaft (32) to clamp the gear shaft (32).

5. A characteristic testing device for semiconductor lasers according to claim 1, characterized in that: A bottom support groove (22) is provided on the bottom side of the assembly frame (2), a ground support (29) is hingedly connected inside the bottom support groove (22), and one end of the ground support (29) is arranged as a rounded structure.

6. A characteristic testing device for a semiconductor laser according to any one of claims 1 to 5, characterized in that: A ball rolling groove (26) is provided on the bottom side of the assembly frame (2), a ball rolling groove (26) is provided inside with a ball rolling (27), and the ball rolling groove (26) is connected to the ball rolling groove (26).

7. A characteristic testing device for semiconductor lasers according to claim 4, characterized in that: A servo motor (24) is installed on the assembly frame (2), a ball screw (23) is arranged at the output end of the servo motor (24), and the positioning strip (25) is matched and connected with the ball screw (23).

8. A characteristic testing device for semiconductor lasers according to claim 1, characterized in that: A mounting groove is arranged on the top of the assembly rack (2), and a magnetic attraction bar (6) is installed in the mounting groove. One magnetic attraction bar (6) is installed in any two mounting grooves of the assembly racks (2) that are arranged parallel and adjacent to each other.

9. A characteristic testing device for a semiconductor laser according to any one of claims 1 or 8, characterized in that: A bar frame (28) is provided on one side of the assembly frame (2), wherein the magnetic attraction bar (6) can be detached away from the installation groove and then placed on the bar frame.

10. The characteristic testing device for semiconductor laser according to claim 2, characterized in that: An anti-drop cap (56) is fixedly connected to one end of the lead screw (52) away from the screw rod (54).

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