A multi-station testing device

Abstract

The present invention aims to provide a multi-station testing device with multiple testing stations, a small overall volume, and low cost. The present invention includes a base, a carrier moving module, a black card testing module, and a dual-card testing module. The carrier moving module includes a Y-axis driving mechanism and a lifting carrier assembly disposed on the Y-axis driving mechanism. The black card testing module and the dual-card testing module are disposed above the carrier moving module and are sequentially arranged along the length direction of the Y-axis driving mechanism. The black card testing module includes a first testing station and a second testing station sequentially arranged along the Y-axis length direction, and an optical window is provided on the second testing station. The dual-card testing module includes an X-axis driving mechanism, a Z-axis driving mechanism, a gray card testing component, and a supplementary card testing component arranged in parallel on the Z-axis driving mechanism, and the Z-axis driving mechanism is disposed on the movable end of the X-axis driving mechanism. The present invention is applied to the technical field of optical testing.

Description

Technical Field

[0001] The present invention is applied to the technical field of optical testing, and particularly relates to a multi-station testing device. Background Art

[0002] In the optical test of image sensor chips, black cards, gray cards and supplementary cards are needed to test the image sensor chips. The performance of image sensor chips is different under different test cards and different test distances, and traditional test equipment adopts a turntable or side-by-side design. Because it is necessary to test multiple cards and multiple distances, different distance test distances require different card sizes. If a turntable is used, different test cards have different volumes, some require a large space, and small cards take up relatively small space, which seems inconsistent. If a single-direction side-by-side design is used, it will also take up a large space.

[0003] For example, the Chinese patent with publication number 208887897U discloses a gray and black card dark box structure used for optical component testing. The gray card and black card are switched by a gray card moving device arranged outside the dark box, thereby providing a more compact test structure. However, if it is necessary to be compatible with more types of test environments, since the structure of a single device is large, adding multiple workstations will still lead to a significant increase in volume. Summary of the invention

[0004] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a multi-station testing device with many testing stations, small overall volume and low cost.

[0005] The technical solution adopted by the present invention is: the present invention includes a base, a carrier moving module, a black card test module and a dual card test module, the carrier moving module includes a Y-axis drive mechanism and a lifting carrier assembly arranged on the Y-axis drive mechanism, the black card test module and the dual card test module are arranged above the carrier moving module and arranged in sequence along the length direction of the Y-axis drive mechanism, the black card test module includes a first test station and a second test station arranged in sequence along the length direction of the Y-axis, the second test station is provided with an optical window, the dual card test module includes an X-axis drive mechanism, a Z-axis drive mechanism, and a gray card test assembly and a supplementary card test assembly arranged in parallel on the Z-axis drive mechanism, and the Z-axis drive mechanism is arranged on the movable end of the X-axis drive mechanism.

[0006] As can be seen from the above solution, since the black card, the gray card, and the supplementary card have different sizes, where the black card is a test card with a larger area, while the gray card and the supplementary card are both test cards with smaller areas. The supplementary card is a test card for specific colors or specific optical characteristics set according to the characteristics of the product to be tested. By utilizing the difference in area between the large card and the small cards, multiple different workstations are cleverly arranged side by side in the Y direction and side by side in the X direction on the same device, effectively reducing the volume of the test device and lowering the cost of the device. By making the large gray card and the supplementary card have the same or similar size and test distance, they are arranged in adjacent workstations, so that the test workstations on the Y axis can be shared, and the different test distances of different test cards can also be controlled by sharing the Z axis. This effectively reduces the volume of the test device and lowers the cost of the device. The Y-axis drive mechanism is used to drive the lifting carrier assembly to move under the test workstations of the black card test module and the dual-card test module, and realizes docking with the test module through the lifting function of the lifting carrier assembly. By arranging the two groups of test workstations of the black card test module along the length direction of the Y-axis drive mechanism, it is ensured that both groups of test workstations can cooperate with the lifting carrier assembly. The X-axis drive mechanism drives the gray card test component and the supplementary card test component to switch workstations, thereby realizing the sharing of a test workstation by the gray card test component and the supplementary card test component. At the same time, the Z-axis drive mechanism adjusts the height positions of the gray card test component and the supplementary card test component.

[0007] A preferred solution is that the lifting carrier assembly includes a moving plate, a lifting frame, a lifting drive mechanism, and a clamping component. The moving plate is connected to the movable end of the Y-axis drive mechanism. The lifting frame is slidably fitted on the moving plate in the vertical direction. The lifting drive mechanism is fixed on the moving plate. The lifting frame is connected to the movable end of the lifting drive mechanism. A product limiting groove is provided on the lifting frame, and the clamping component is arranged on one side of the product limiting groove.

[0008] As can be seen from the above solution, the Y-axis drive mechanism drives the moving plate to perform a linear motion, realizing driving the lifting frame to perform a linear motion in the Y-axis direction. Then, by setting the lifting drive mechanism to drive the lifting frame to perform a lifting action, it is further realized to dock the product on the lifting frame with the test workstation, enabling the product to enter the test environment. The clamping component cooperates with the product limiting groove to clamp and fix the product to be tested, thereby avoiding displacement of the product to be tested and affecting the test accuracy.

[0009] A further preferred solution is that the clamping assembly includes a pressure block, a limit plate and a return spring. The pressure block is slidably fitted on the lifting frame. An activity groove is provided in the middle of the pressure block. The limit plate is fixed on the lifting frame and is matched with the activity. One end of the pressure block is provided with a lever block, and the other end of the pressure block is provided with a pressure head matched with the product limit groove. The return spring is arranged between the pressure head and the limit plate. An opening and closing assembly matched with the clamping assembly is also provided on the base. The opening and closing assembly includes an opening and closing cylinder and a hook. The hook is fixedly arranged at the movable end of the opening and closing cylinder, and the hook is matched with the lever block.

[0010] As can be seen from the above solution, the movement space of the pressure block is restricted by the cooperation of the limit plate and the activity groove. By arranging the return spring between the limit plate and the pressure head, the pressure head is kept applying pressure on the product to be tested, achieving the effect of clamping the product without jitter.

[0011] A preferred solution is that the black card test module includes a first light-shielding cover, a first bracket and a black card. The first bracket is fixed on the base. The first test station and the second test station are arranged in sequence along a straight line on the first bracket. The black card is fixed on the first bracket and is located above the first test station and the second test station. Product positioning plates are arranged at the bottoms of the first test station and the second test station. Light-passing holes adapted to the products are provided on the product positioning plates. The first light-shielding cover is fixed on the first bracket and cooperates with the first bracket to form a closed space. The black card and the two groups of the first test stations are both located in the closed space.

[0012] As can be seen from the above solution, a test environment is formed by the cooperation of the first light-shielding cover, the first bracket and the black card. At the same time, by providing the optical window on the second test station, the first test station and the second test station are respectively two different test environments, realizing the integration of the two test environments in a whole component. The product positioning plate is used to limit the product and provide a test through-hole for the product.

[0013] A preferred solution is that the X-axis driving mechanism includes a second bracket, a driving cylinder, a movable plate, and two groups of second light-shielding covers. The second bracket is fixed on the base, the driving cylinder is fixed on the second bracket, the movable plate is slidably arranged on the second bracket along the length direction perpendicular to the Y-axis driving mechanism, the movable plate is connected to the movable end of the driving cylinder, the Z-axis driving mechanism is fixed on the movable plate, a third test station and a fourth test station are sequentially arranged on the movable plate along the length direction perpendicular to the Y-axis driving mechanism, the two groups of second light-shielding covers are respectively arranged at the third test station and the fourth test station, the gray card test assembly and the supplementary card test assembly are respectively arranged in cooperation with the two groups of second light-shielding covers, and the Z-axis driving mechanism drives the gray card test assembly and the supplementary card test assembly to perform lifting movements in the second light-shielding cover.

[0014] As can be seen from the above solution, by setting the driving cylinder to drive the movable plate to perform a reciprocating linear motion along the length direction perpendicular to the Y-axis driving mechanism, the test card corresponding to the upper part of the carrier moving module is switched. The second light-shielding cover is matched with the corresponding test station to provide the dark light environment required for the test. The Z-axis driving mechanism drives the gray card test assembly and the supplementary card test assembly to run up and down synchronously, so as to adjust the distance between the gray card and the supplementary card and the product to be tested, and then detect a variety of test environments.

[0015] A further preferred solution is that a number of guide holes are arranged on the lifting frame, and guide pins adapted to the number of guide holes are arranged on the black card test module, the dual-card test module, and the clamping assembly.

[0016] As can be seen from the above solution, the positioning during the docking of the lifting frame and the test station is realized by the adapted guide holes and guide pins, the docking accuracy of the product is improved, and the reliability of the test is ensured.

[0017] A preferred solution is that the present invention further includes a light-shielding hood, a closing door, a lighting component, and a code scanning component. The base is arranged in the light-shielding hood, a material inlet and outlet is arranged on the light-shielding hood, the closing door is movably arranged on the material inlet and outlet, the lighting component and the code scanning component are both arranged on the light-shielding hood, and the lighting component and the code scanning component are both matched with the lifting carrier component.

[0018] As can be seen from the above solution, the light-shielding hood is used to isolate external interference. By setting the closing door, the automatic opening and closing of the material inlet and outlet are realized, and the effect of automatically closing during the test is achieved. The code scanning component is used to scan and identify the product number, and the lighting component is used to provide lighting during loading and code scanning. Description of the Drawings

[0019] Figure 1 is the overall structural schematic diagram of the present invention;

[0020] Figure 2 is the three-dimensional structural schematic diagram of the present invention;

[0021] Figure 3 is the three-dimensional structural schematic diagram of the vehicle moving module;

[0022] Figure 4 is Figure 3 the enlarged view of part A in

[0023] Figure 5 is the three-dimensional structural schematic diagram of the opening and closing assembly;

[0024] Figure 6 is the exploded structural schematic diagram of the black card test module;

[0025] Figure 7 is the three-dimensional structural schematic diagram of the dual card test module;

[0026] Figure 8 is the partial structural schematic diagram of the dual card test module. Detailed implementation manners

[0027] As Figures 1 to 8 shown, in this embodiment, the present invention includes a base 1, a vehicle moving module, a black card test module 3, and a dual card test module 4. The vehicle moving module includes a Y-axis driving mechanism 201 and a lifting vehicle assembly disposed on the Y-axis driving mechanism 201. The black card test module 3 and the dual card test module 4 are disposed above the vehicle moving module and are sequentially arranged along the length direction of the Y-axis driving mechanism 201. The black card test module 3 includes a first test station 301 and a second test station 302 sequentially arranged along the Y-axis length direction. An optical window is disposed on the second test station 302. The dual card test module 4 includes an X-axis driving mechanism, a Z-axis driving mechanism 401, a gray card test assembly 402 and a supplementary card test assembly 403 arranged in parallel on the Z-axis driving mechanism 401. The Z-axis driving mechanism 401 is disposed on the movable end of the X-axis driving mechanism. The Y-axis driving mechanism 201 is a linear motor, and the Z-axis driving mechanism 401 is a linear electric cylinder.

[0028] In this embodiment, the lifting and carrying component includes a moving plate 202, a lifting frame 203, a lifting drive mechanism 204, and a clamping component. The moving plate 202 is connected to the movable end of the Y-axis drive mechanism 201. The lifting frame 203 is slidably fitted on the moving plate 202 in the vertical direction. The lifting drive mechanism 204 is fixed on the moving plate 202, and the lifting frame 203 is connected to the movable end of the lifting drive mechanism 204. A product limiting groove is provided on the lifting frame 203, and the clamping component is arranged on one side of the product limiting groove. A plurality of linear guide rails are arranged on the base 1 along the direction parallel to the Y-axis drive mechanism 201, and the moving plate 202 is slidably fitted on the plurality of linear guide rails. The arrangement of the linear guide rails improves the linear movement accuracy of the moving plate 202. The lifting drive mechanism 204 is a linear electric cylinder, and the movable end of the lifting drive mechanism 204 is rotatably fitted with the lifting frame 203. A floating plate member is floatingly arranged at the top of the lifting frame 203, and the product limiting groove and the clamping component are both arranged on the floating plate member. By providing the floating plate member, the impact force during the docking of the product is absorbed, preventing damage to the product due to docking deviation.

[0029] In this embodiment, the clamping component includes a pressing block 206, a limiting plate 207, and a return spring 208. The pressing block 206 is slidably fitted on the lifting frame 203. An activity groove 209 is provided in the middle of the pressing block 206. The limiting plate 207 is fixed on the lifting frame 203 and the limiting plate 207 is matched with the activity groove 209. A lever block 210 is arranged at one end of the pressing block 206, and a pressing head matched with the product limiting groove is arranged at the other end of the pressing block 206. The return spring 208 is arranged between the pressing head and the limiting plate 207. An opening and closing component matched with the clamping component is further arranged on the base 1. The opening and closing component includes an opening and closing cylinder 211 and a hook 212. The hook 212 is fixedly arranged at the movable end of the opening and closing cylinder 211, and the hook 212 is matched with the lever block 210. A plurality of conduction probes adapted to the product to be tested are arranged on the product limiting groove.

[0030] In this embodiment, the black card testing module 3 includes a first light-shielding cover 303, a first support 304, and a black card 305. The first support 304 is fixed on the base 1. The first testing station 301 and the second testing station 302 are arranged in sequence along a straight line on the first support 304. The black card 305 is fixed on the first support 304 and is located above the first testing station 301 and the second testing station 302. Product positioning plates are arranged at the bottoms of the first testing station 301 and the second testing station 302. Through holes adapted to the products are arranged on the product positioning plates. The first light-shielding cover 303 is fixed on the first support 304 and cooperates with the first support 304 to form a closed space. The black card 305 and the two groups of the first testing stations 301 are both located in the closed space. The opening and closing air cylinder 211 is fixed on the first support 304.

[0031] In this embodiment, the X-axis driving mechanism includes a second support 404, a driving air cylinder 405, a movable plate 406, and two groups of second light-shielding covers 407. The second support 404 is fixed on the base 1. The driving air cylinder 405 is fixed on the second support 404. The movable plate 406 is slidably arranged on the second support 404 along the length direction perpendicular to the Y-axis driving mechanism 201. The movable plate 406 is connected to the movable end of the driving air cylinder 405. The Z-axis driving mechanism 401 is fixed on the movable plate 406. A third testing station and a fourth testing station are arranged in sequence on the movable plate 406 along the length direction perpendicular to the Y-axis driving mechanism 201. The two groups of second light-shielding covers 407 are respectively arranged on the third testing station and the fourth testing station. The gray card testing assembly 402 and the supplementary card testing assembly 403 are respectively arranged in cooperation with the two groups of second light-shielding covers 407. The Z-axis driving mechanism 401 drives the gray card testing assembly 402 and the supplementary card testing assembly 403 to perform lifting movements in the second light-shielding covers 407. Optical windows are arranged on both the third testing station and the fourth testing station. Buffer devices for limiting and cooperating with the movable plate 406 are arranged at both ends of the second support 404.

[0032] In this embodiment, a plurality of guiding holes 213 are arranged on the lifting frame 203. Guide pins adapted to the plurality of guiding holes 213 are arranged on the black card testing module 3, the dual-card testing module 4, and the clamping assembly.

[0033] In this embodiment, the present invention further includes a light-shielding hood 5, a lighting assembly 6, and a code-scanning assembly 7. The base 1 is disposed within the light-shielding hood 5. The light-shielding hood 5 is provided with a material inlet and outlet. Both the lighting assembly 6 and the code-scanning assembly 7 are disposed on the light-shielding hood 5, and both the lighting assembly 6 and the code-scanning assembly 7 cooperate with the lifting carrier assembly. Detection gratings are provided on both sides of the material inlet and outlet to detect whether there are obstacles passing through the material inlet and outlet, preventing accidental injury.

[0034] Working principle of the present invention:

[0035] During feeding, the Y-axis driving mechanism 201 drives the lifting carrier assembly to move below the opening and closing assembly. The lifting driving mechanism 204 drives the lifting frame 203 to rise and dock with the opening and closing assembly. The opening and closing cylinder 211 drives the pressing block 206 to move through the hook 212, thereby releasing the limit on the product limiting groove. The operator places the product to be tested into the product limiting groove. When the code-scanning assembly 7 detects the product code, it sends a signal to the opening and closing cylinder 211 to loosen, causing the pressing block 206 to press the product to be tested.

[0036] Subsequently, the Y-axis driving mechanism 201 drives the lifting carrier assembly to successively reach the first test station 301, below the dual-card test module 4, and the second test station 301 for testing. Among them, when the lifting carrier assembly moves below the dual-card test module 4, the driving cylinder 405 first drives the supplementary card test assembly 403 to move above the lifting carrier assembly, and then the lifting carrier assembly rises to dock with the third test station corresponding to the supplementary card test assembly 403. During the test, the Z-axis driving mechanism 401 drives the supplementary card test assembly 403 to lift and lower to switch the test stations at different distances of the test card, thereby realizing the detection of multiple test environments. After the supplementary card test assembly 403 completes the test, the lifting carrier assembly descends. After the driving cylinder 405 drives the gray card test assembly 402 to switch to the test position, the lifting carrier assembly rises to dock with the fourth test station corresponding to the gray card test assembly 402 for testing.

[0037] After the test is completed, the lifting carrier assembly returns to the feeding position and cooperates with the opening and closing assembly. Then the operator performs the operations of taking and feeding materials.

Claims

1. A multi-station testing device, characterized in that: It includes a base (1), a vehicle moving module, a black card testing module (3), and a dual-card testing module (4). The vehicle moving module includes a Y-axis driving mechanism (201) and a lifting vehicle assembly disposed on the Y-axis driving mechanism (201). The black card testing module (3) and the dual-card testing module (4) are disposed above the vehicle moving module and are sequentially arranged along the length direction of the Y-axis driving mechanism (201). The black card testing module (3) includes a first testing station (301) and a second testing station (302) sequentially arranged along the Y-axis length direction. An optical window is provided on the second testing station (302). The dual-card testing module (4) includes an X-axis driving mechanism, a Z-axis driving mechanism (401), a gray card testing component (402) and a supplementary card testing component (403) arranged side by side on the Z-axis driving mechanism (401). The Z-axis driving mechanism (401) is disposed on the movable end of the X-axis driving mechanism. The product to be tested is an image sensing chip.

2. The multi-station test device according to claim 1, characterized in that: The lifting vehicle assembly includes a moving plate (202), a lifting frame (203), a lifting driving mechanism (204), and a clamping component. The moving plate (202) is connected to the movable end of the Y-axis driving mechanism (201). The lifting frame (203) is slidably fitted on the moving plate (202) in the vertical direction. The lifting driving mechanism (204) is fixed on the moving plate (202). The lifting frame (203) is connected to the movable end of the lifting driving mechanism (204). A product limiting groove is provided on the lifting frame (203). The clamping component is disposed on one side of the product limiting groove.

3. A multi-station test device according to claim 2, characterized in that: The clamping component includes a pressing block (206), a limiting plate (207), and a return spring (208). The pressing block (206) is slidably fitted on the lifting frame (203). An activity slot (209) is provided in the middle of the pressing block (206). The limiting plate (207) is fixed on the lifting frame (203) and the limiting plate (207) is matched with the activity slot (209). A pulling block (210) is provided at one end of the pressing block (206). A pressing head matched with the product limiting groove is provided at the other end of the pressing block (206). The return spring (208) is disposed between the pressing head and the limiting plate (207). An opening and closing component matched with the clamping component is further provided on the base (1). The opening and closing component includes an opening and closing cylinder (211) and a hook (212). The hook (212) is fixedly disposed on the movable end of the opening and closing cylinder (211). The hook (212) is matched with the pulling block (210).

4. A multi-station test device according to claim 1, characterized in that: The black card test module (3) includes a first light shield (303), a first bracket (304), and a black card (305). The first bracket (304) is fixed on the base (1). The first test station (301) and the second test station (302) are arranged in sequence along a straight line on the first bracket (304). The black card (305) is fixed on the first bracket (304) and is located above the first test station (301) and the second test station (302). Product positioning plates are arranged at the bottoms of the first test station (301) and the second test station (302). Light passing holes adapted to the product are arranged on the product positioning plates. The first light shield (303) is fixed on the first bracket (304) and cooperates with the first bracket (304) to form a closed space. The black card (305) and the two groups of the first test stations (301) are both located in the closed space.

5. A multi-station testing device according to claim 1, characterized in that: The X-axis driving mechanism includes a second bracket (404), a driving cylinder (405), a movable plate (406), and two groups of second light shields (407). The second bracket (404) is fixed on the base (1). The driving cylinder (405) is fixed on the second bracket (404). The movable plate (406) is slidably arranged on the second bracket (404) along the length direction perpendicular to the Y-axis driving mechanism (201). The movable plate (406) is connected to the movable end of the driving cylinder (405). The Z-axis driving mechanism (401) is fixed on the movable plate (406). A third test station and a fourth test station are arranged in sequence on the movable plate (406) along the length direction perpendicular to the Y-axis driving mechanism (201). The two groups of second light shields (407) are respectively arranged on the third test station and the fourth test station. The gray card test assembly (402) and the supplementary card test assembly (403) are respectively arranged in cooperation with the two groups of second light shields (407). The Z-axis driving mechanism (401) drives the gray card test assembly (402) and the supplementary card test assembly (403) to perform a lifting motion in the second light shield (407).

6. The multi-station test device according to claim 2, characterized in that: A number of guiding holes (213) are arranged on the lifting frame (203). Guiding pins adapted to the number of guiding holes (213) are arranged on the black card test module (3), the dual card test module (4), and the clamping assembly.

7. A multi-station test device according to claim 1, characterized in that: It further includes a light shielding machine cover (5), a lighting assembly (6), and a code scanning assembly (7). The base (1) is arranged in the light shielding machine cover (5). A material inlet and outlet is arranged on the light shielding machine cover (5). The lighting assembly (6) and the code scanning assembly (7) are both arranged on the light shielding machine cover (5). The lighting assembly (6) and the code scanning assembly (7) are both in cooperation with the lifting carrier assembly.

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