Test device

Abstract

The embodiment of the utility model provides test equipment, which is used for testing an infrared focal plane array detector and comprises a test tool, a shading baffle and a driver, the number of the testing tools is multiple, the testing tools are arranged at intervals, the testing tools are provided with setting areas, the setting areas are used for setting infrared focal plane array detectors, the shading baffle is provided with multiple testing auxiliary areas, the testing auxiliary areas comprise shading areas and light-transmitting areas, and the driver is in driving connection with the shading baffle. The shading baffle is driven to be switched between a light transmitting position and a shading position; under the condition that the shading baffle is located at the shading position, the testing tools are opposite to the shading areas in a one-to-one correspondence manner; under the condition that the shading baffle is located at the light-transmitting position, the testing tools are opposite to the light-transmitting areas in a one-to-one correspondence mode.

Description

Technical Field

[0001] This application relates to the technical field of infrared focal plane array detector testing, and particularly relates to a testing device. Background Art

[0002] Infrared focal plane array (IRFPA) detectors are one of the most widely used infrared detectors currently. It is a planar array composed of a series of tiny detectors, which can simultaneously detect the temperature of each pixel in an infrared image. Infrared focal plane array detectors have important applications in many fields. For example, infrared focal plane array detectors can be applied in fields such as security, medical treatment, and vehicles. When using an infrared focal plane array detector, it is necessary to accurately understand the parameter information of the infrared focal plane array detector in order to bring out the maximum performance of the infrared focal plane array detector. In the related art, the testing device can only test one infrared focal plane array detector at a time. Thus, the testing device in the related art has the problem of low testing efficiency. Summary of the Utility Model

[0003] An embodiment of this application provides a testing device to solve the problem of how to improve the testing efficiency of the testing device.

[0004] The testing device provided by the embodiment of this application is used to test an infrared focal plane array detector. The testing device includes: a testing fixture, a light-shielding baffle, and a driver; the number of the testing fixtures is multiple, and the multiple testing fixtures are arranged at intervals. The testing fixture is provided with a setting area for setting the infrared focal plane array detector. The light-shielding baffle is provided with multiple testing auxiliary areas, and each testing auxiliary area includes a light-shielding area and a light-transmitting area. The driver is drivingly connected to the light-shielding baffle to drive the light-shielding baffle to switch between a light-transmitting position and a light-blocking position; when the light-shielding baffle is in the light-blocking position, the setting areas correspond to the light-shielding areas one by one; when the light-shielding baffle is in the light-transmitting position, the setting areas correspond to the light-transmitting areas one by one.

[0005] Optionally, the testing fixture further includes a detector interface board for electrically connecting to the infrared focal plane array detector and for supplying power to the infrared focal plane array detector.

[0006] Optionally, the testing fixture further includes a data collector connected to the detector interface board, and the data collector is used to receive the data generated by the infrared focal plane array detector via the detector interface board.

[0007] Optionally, the test equipment further includes a network switch and a host computer, and each of the data collectors and the host computer are communicatively connected to the network switch.

[0008] Optionally, the test fixture includes an optical lens, and the light-shielding baffle is located on a side of the optical lens away from the setting area. When the light-shielding baffle is located at the light-transmitting position, the optical lens is opposite to the light-transmitting area in a one-to-one correspondence.

[0009] Optionally, the test tool further includes a carrier, and the setting area is located on the carrier.

[0010] Optionally, the testing tool also includes an optical lens mount, which is arranged outside the setting area, one end of the optical lens mount is detachably connected to the carrier, and the other end of the optical lens mount is connected to the optical lens, the carrier, the optical lens mount and the optical lens form a accommodating cavity, and the setting area is located in the accommodating cavity.

[0011] Optionally, the test fixture further comprises a lock, wherein the lock is movably connected to the optical lens holder, and the lock is used to connect to a peripheral portion of the carrier.

[0012] Optionally, the test fixture further comprises a holding member, and the holding member is used to be connected to the carrier to limit the infrared focal plane array detector to the setting area.

[0013] Optionally, the testing device further comprises a base and a plurality of pillars, the testing tool is arranged on the base, each of the pillars is arranged on the base, the light-shielding baffle is supported by the pillars, and a ball bearing is arranged on one side of the pillar facing the light-shielding baffle.

[0014] At least one of the above technical solutions adopted in the embodiments of the present application can achieve the following beneficial effects:

[0015] In an embodiment of the present application, the test equipment includes a plurality of test fixtures, each of which can be provided with an infrared focal plane array detector. In addition, the light shielding baffle is provided with a plurality of test auxiliary areas. Thus, the light shielding baffle can be driven by a driver to switch between a light transmitting position and a blocking position, so as to perform a blocking test and an imaging test on each infrared focal plane array detector. Since the test equipment can test multiple infrared focal plane array detectors simultaneously, it has the characteristic of higher test efficiency compared with the test equipment in the related art that can only test one infrared focal plane array detector at a time.

[0016] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. Brief Description of the Drawings

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application or in the related art, the following will briefly introduce the drawings required for use in the description of the embodiments or the related art. Obviously, the drawings in the following description are only some embodiments recorded in the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0018] Figure 1 Schematic diagram of a test device provided by an embodiment of the present application;

[0019] Figure 2 Structural schematic diagram of a test device provided by an embodiment of the present application;

[0020] Figure 3 Top view of a test device provided by an embodiment of the present application, which shows the case where the light-shielding baffle is in the light-transmitting position;

[0021] Figure 4 Cross-sectional view of a test device provided by an embodiment of the present application, which shows the case where the light-shielding baffle is in the light-transmitting position;

[0022] Figure 5 For Figure 4 Partial schematic diagram of the test device shown in;

[0023] Figure 6 Cross-sectional view of a test device provided by an embodiment of the present application, which shows the case where the light-shielding baffle is in the light-blocking position;

[0024] Figure 7 Top view of a test device provided by an embodiment of the present application, which shows the case where the light-shielding baffle is in the light-blocking position;

[0025] Figure 8 Schematic diagram of a test device provided by an embodiment of the present application;

[0026] Figure 9 Schematic diagram of a test device provided by an embodiment of the present application.

[0027] Description of the reference numerals:

[0028] 1 - Test device;

[0029] 10 - Test tooling; 101 - Detector interface board; 102 - Data collector; 11 - Optical lens; 12 - Carrier; 13 - Optical lens holder; 14 - Lock; 15 - Pressing member;

[0030] 20 - Light-shielding baffle; 21 - Light-blocking area; 22 - Light-transmitting area;

[0031] 30 - Driver;

[0032] 41 - Network switch; 42 - Host computer;

[0033] 51 - Base; 52 - Pillar;

[0034] 2 - Infrared focal plane array detector. Specific embodiments

[0035] To make the objectives, technical solutions and advantages of the present application clearer, the technical solutions of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0036] In the description of the present application, it should be noted that unless otherwise clearly defined and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral connection; it may be directly connected, or indirectly connected through an intermediate medium, and it may be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0037] In addition, although the terms used in the present application are selected from well - known and commonly used terms, some of the terms mentioned in the specification of the present application may be selected by the applicant according to his or her judgment, and their detailed meanings are described in the relevant parts of the description herein.

[0038] In addition, it is required to understand the present application not only through the actual terms used, but also through the meaning implied by each term.

[0039] The technical solutions provided by each embodiment of the present application will be described in detail below in conjunction with the drawings.

[0040] An embodiment of the present application provides a test device, which is used to test an infrared focal plane array detector. Referring to Figures 1 to 9 , the test device 1 provided by the embodiment of the present application includes: a test tooling 10, a light - shielding baffle 20 and a driver 30. Among them, the test tooling 10 mainly functions to install the infrared focal plane array detector 2.

[0041] The number of the test toolings 10 is multiple, and the multiple test toolings 10 are arranged at intervals. The test tooling 10 is provided with a setting area for setting the infrared focal plane array detector 2. The light-shielding baffle 20 is provided with a plurality of test auxiliary areas, and the test auxiliary areas include a light-shielding area 21 and a light-transmitting area 22. The driver 30 is drivingly connected to the light-shielding baffle 20 to drive the light-shielding baffle 20 to switch between a light-transmitting position and a light-blocking position. Exemplarily, the driver 30 is a linear motor. For example, the driver 30 is a stepping linear motor. Exemplarily, the driver 30 may also include devices capable of outputting rotational driving forces such as a rotary motor, a pneumatic motor, or a hydraulic motor, and transmission mechanisms capable of converting rotational motion into linear motion such as a lead screw thread transmission mechanism or a gear rack mechanism.

[0042] Specifically refer to Figure 6 and Figure 7 , when the light-shielding baffle 20 is in the light-blocking position, the setting areas correspond to the light-shielding areas 21 one by one. In this way, when the infrared focal plane array detector 2 is provided in the setting area, the infrared focal plane array detector 2 is opposite to the light-shielding area 21, so that the temperatures of the pixels of the infrared focal plane array detector 2 are the same. It should be noted that the scenario of testing the infrared focal plane array detector 2 with the light-shielding baffle 20 in the light-blocking position can be referred to as a blocking test.

[0043] Specifically refer to Figures 2 to 5 , when the light-shielding baffle 20 is in the light-transmitting position, the setting areas correspond to the light-transmitting areas 22 one by one. When the infrared focal plane array detector 2 is provided in the setting area, the infrared focal plane array detector 2 is opposite to the light-transmitting area 22. A target object to be photographed can be arranged on the side of the light-transmitting area 22 away from the infrared focal plane array detector 2. Thus, the infrared focal plane array detector 2 can acquire an infrared image of the target object to be photographed, and then the infrared focal plane array detector 2 can be tested in this way. It should be noted that the scenario of testing the infrared focal plane array detector 2 with the light-shielding baffle 20 in the light-transmitting position can be referred to as an imaging test.

[0044] In this way, in the embodiment of the present application, the test device 1 includes a plurality of test toolings 10, and each test tooling 10 can be respectively provided with an infrared focal plane array detector 2. Moreover, the light-shielding baffle 20 is provided with a plurality of test auxiliary areas. Thus, the blocking test and the imaging test can be respectively performed on each infrared focal plane array detector 2 by driving the light-shielding baffle 20 to switch between the light-transmitting position and the light-blocking position through the driver 30. Since the test device 1 can synchronously test a plurality of infrared focal plane array detectors 2, compared with the test device in the related art that can only test one infrared focal plane array detector at a time, it has the characteristic of higher test efficiency.

[0045] In some embodiments, multiple test fixtures 10 are arranged in an array. Exemplarily, the number of test fixtures 10 is 15, and the test fixtures 10 are arranged in a 5-row and 3-column array. Of course, those skilled in the art can also flexibly adjust the arrangement of the test fixtures 10 according to actual needs during the implementation of the solution provided by the embodiments of the present application, and details are not elaborated here.

[0046] Reference Figure 8 , in some embodiments, the test fixture 10 further includes a detector interface board 101. The detector interface board 101 is used to be electrically connected to the infrared focal plane array detector 2, and the detector interface board 101 is used to supply power to the infrared focal plane array detector 2.

[0047] In some embodiments, the test fixture 10 further includes a data collector 102. The data collector 102 is connected to the detector interface board 101, and the data collector 102 is used to receive the data generated by the infrared focal plane array detector 2 via the detector interface board 101.

[0048] Reference Figure 8 and Figure 9 , in some embodiments, the test device 1 further includes a network switch 41 and a host computer 42, and each data collector 102 and the host computer 42 are communicatively connected to the network switch 41. In this way, by means of the communicative connection between each data collector 102 and the host computer 42 and the network switch 41, the data collectors 102 of each test fixture 10 and the host computer 42 are connected to the same network, facilitating data exchange between the test fixture 10 and the host computer 42. It should be noted that the connection of the data collectors 102 of each test fixture 10 and the host computer 42 to the same network can be achieved by referring to the prior art, and details are not elaborated here. It should also be noted that, exemplarily, the network switch 41 can be a router. The host computer 42 can be a computer.

[0049] Reference Figure 4 and Figure 5 , in some embodiments, the test fixture 10 includes an optical lens 11. The light-shielding baffle 20 is located on one side of the optical lens 11 facing away from the setting area. When the light-shielding baffle 20 is in the light-transmitting position, the optical lens 11 is correspondingly opposite to the light-transmitting area 22.

[0050] In some embodiments, the test fixture 10 further includes a carrier 12, and the setting area is located on the carrier 12. In other words, the carrier 12 is used to carry the infrared focal plane array detector 2.

[0051] In some embodiments, the test fixture 10 further includes an optical lens holder 13. The optical lens holder 13 is disposed outside the setting area, one end of the optical lens holder 13 is detachably connected to the carrier 12, and the other end of the optical lens holder 13 is connected to the optical lens 11. The carrier 12, the optical lens holder 13 and the optical lens 11 form a receiving cavity, and the setting area is located in the receiving cavity.

[0052] In some embodiments, the test fixture 10 further includes a lock 14, which is movably connected to the optical lens holder 13, and the lock 14 is used to connect to the peripheral portion of the carrier 12. In this way, during the test process, before disassembling the infrared focal plane array detector 2, the optical lens 11 can be removed more conveniently to avoid interference of the optical lens 11 on the disassembly of the infrared focal plane array detector 2.

[0053] In some embodiments, the test fixture 10 further includes a holding member 15, which is used to connect with the carrier 12 to limit the infrared focal plane array detector 2 to the setting area. It should be noted that a light-transmitting hole is provided at a portion of the holding member 15 that is opposite to the infrared focal plane array detector 2 to prevent the holding member 15 from blocking the infrared focal plane array detector 2.

[0054] In some embodiments, the test device 1 further includes a base 51 and a plurality of pillars 52, the test fixture 10 is disposed on the base 51, each pillar 52 is disposed on the base 51, the light shielding baffle 20 is supported on the pillar 52, and a ball bearing is disposed on one side of the pillar 52 facing the light shielding baffle 20. In this way, when the light shielding baffle 20 is driven, the ball bearing rolls in contact with the light shielding baffle 20 to reduce the friction resistance between the pillar 52 and the light shielding baffle 20.

[0055] It should be noted that in the related art, the light shielding baffle is arranged on the side of the optical lens facing the infrared focal plane array detector. In this way, based on the test device in the related art, if multiple infrared focal plane array detectors are to be set, it is necessary to set a light shielding baffle on the side of each infrared focal plane array detector facing the optical lens. Since the number of light shielding baffles is the same as the number of infrared focal plane array detectors, the number of light shielding baffles is large, and it is not convenient to use a single driver to drive each light shielding baffle to move synchronously, and therefore, it is not convenient to test multiple infrared focal plane array detectors at the same time. However, using the solution provided in the embodiment of the present application, the light shielding baffle 20 is located on the side of the optical lens 11 away from the infrared focal plane array detector 2. In this way, an integrated light shielding baffle 20 can be set, so that a single driver 30 can be used to drive each test auxiliary area including the light shielding area 21 and the light transmission area 22 to move synchronously, so as to test each infrared focal plane array detector 2 at the same time, thereby improving the test efficiency.

[0056] It should be noted that in this text, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprising", "including" or any other variation thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or elements inherent to such process, method, article or device.

[0057] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the embodiments of the present application. The scope of the embodiments of the present application is defined by the appended claims and their equivalents.

Claims

1. A test device for testing an infrared focal plane array detector (2), characterized in that: The testing device comprises: a testing tool (10), a light shielding baffle (20) and a driver (30); The number of the test fixtures (10) is plural, and the plural test fixtures (10) are arranged at intervals, the test fixture (10) is provided with a setting area, the setting area is used to set the infrared focal plane array detector (2), the light shielding baffle (20) is provided with a plurality of test auxiliary areas, the test auxiliary areas include a light shielding area (21) and a light transmission area (22), and the driver (30) is drivingly connected to the light shielding baffle (20) to drive the light shielding baffle (20) to switch between a light transmission position and a shielding position; When the shading baffle (20) is located at the shielding position, the setting area is opposite to the shading area (21) in a one-to-one correspondence; when the shading baffle (20) is located at the light-transmitting position, the setting area is opposite to the light-transmitting area (22) in a one-to-one correspondence.

2. The test device according to claim 1, characterized in that The testing tool (10) further comprises a detector interface board (101), wherein the detector interface board (101) is used to be electrically connected to the infrared focal plane array detector (2), and the detector interface board (101) is used to supply power to the infrared focal plane array detector (2).

3. The testing device according to claim 2, characterized in that The testing tool (10) further comprises a data collector (102), wherein the data collector (102) is connected to the detector interface board (101), and the data collector (102) is used to receive data generated by the infrared focal plane array detector (2) via the detector interface board (101).

4. The testing device according to claim 3, characterized in that The test equipment further comprises a network switch (41) and a host computer (42), and each of the data collectors (102) and the host computer (42) are communicatively connected to the network switch (41).

5. The testing device according to claim 1, characterized in that The testing fixture (10) comprises an optical lens (11), the light shielding baffle (20) being located on a side of the optical lens (11) away from the setting area, and when the light shielding baffle (20) is located at the light-transmitting position, the optical lens (11) is opposite to the light-transmitting area (22) in a one-to-one correspondence.

6. The testing device according to claim 5, characterized in that The testing tool (10) further comprises a carrier (12), and the setting area is located on the carrier (12).

7. The testing device according to claim 6, characterized in that The testing fixture (10) further comprises an optical lens holder (13), wherein the optical lens holder (13) is disposed outside the setting area, one end of the optical lens holder (13) is detachably connected to the carrier (12), and the other end of the optical lens holder (13) is connected to the optical lens (11); the carrier (12), the optical lens holder (13) and the optical lens (11) form a receiving cavity, and the setting area is located within the receiving cavity.

8. The testing device according to claim 7, characterized in that The testing fixture (10) further comprises a lock buckle (14), wherein the lock buckle (14) is movably connected to the optical lens holder (13), and the lock buckle (14) is used to connect to a peripheral portion of the carrier (12).

9. The testing device according to claim 6, characterized in that The testing fixture (10) further comprises a holding member (15), wherein the holding member (15) is used to be connected to the carrier (12) so as to limit the infrared focal plane array detector (2) to the setting area.

10. The testing device according to claim 1, characterized in that The testing device further comprises a base (51) and a plurality of pillars (52); the testing fixture (10) is arranged on the base (51); each of the pillars (52) is arranged on the base (51); the light shielding baffle (20) is supported by the pillars (52); and a ball bearing is provided on a side of the pillar (52) facing the light shielding baffle (20).

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