Test device

Abstract

The embodiment of the utility model provides test equipment, which is used for testing an infrared focal plane array detector and comprises a test tool, a shading baffle plate, a driver, a trigger piece, a first position sensor and a second position sensor, the test tool is provided with a setting area, the setting area is used for setting an infrared focal plane array detector, the shading baffle is provided with a test auxiliary area, the test auxiliary area comprises a shading area and a light-transmitting area, the driver is in driving connection with the shading baffle so as to drive the shading baffle to be switched between a light-transmitting position and a shading position, and the trigger piece is connected with the shading baffle; under the condition that the shading baffle is located at the shading position, the triggering piece triggers the first position sensor, and the testing tools are opposite to the shading areas in a one-to-one correspondence mode; when the shading baffle is located at the light-transmitting position, the triggering piece triggers the second position sensor, and the testing tools are opposite to the light-transmitting areas in a one-to-one correspondence mode.

Description

Technical Field

[0001] This application relates to the technical field of infrared focal plane array detector testing, and particularly to a testing device. Background Art

[0002] Infrared focal plane array (IRFPA) detectors are one of the most widely used infrared detectors currently. It is a planar array composed of a series of tiny detectors that can simultaneously detect the temperatures of each pixel in an infrared image. Infrared focal plane array detectors have important applications in many fields. For example, infrared focal plane array detectors can be applied to fields such as security, medical treatment, and vehicles. When using an infrared focal plane array detector, it is necessary to accurately understand the parameter information of the infrared focal plane array detector in order to maximize the performance of the infrared focal plane array detector.

[0003] In related technologies, the testing device uses an infrared focal plane array detector with a lens to collect high and low temperature signals from a blackbody target, and uses an infrared focal plane array detector without a lens with an open shutter to collect high and low temperature signals from the blackbody target to calculate two sets of correction coefficients, thereby realizing the correction of the non-uniform response of the infrared focal plane array detector. This testing method requires the implementation of an algorithm and has the problem of relatively high technical difficulty. Summary of the Utility Model

[0004] Embodiments of this application provide a testing device to solve the problem of how to provide a simple testing device for testing an infrared focal plane array detector.

[0005] The testing device provided by the embodiments of this application is used to test an infrared focal plane array detector. The testing device includes: a testing fixture, a light-shielding baffle, a driver, a trigger, a first position sensor, and a second position sensor; the testing fixture is provided with a setting area for setting the infrared focal plane array detector, the light-shielding baffle is provided with a testing auxiliary area, and the testing auxiliary area includes a light-shielding area and a light-transmitting area. The driver is drivingly connected to the light-shielding baffle to drive the light-shielding baffle to switch between a light-transmitting position and a light-blocking position. The trigger is connected to the light-shielding baffle; when the light-shielding baffle is in the light-blocking position, the trigger triggers the first position sensor, and the setting area is opposite to the light-shielding area; when the light-shielding baffle is in the light-transmitting position, the trigger triggers the second position sensor, and the setting area is opposite to the light-transmitting area.

[0006] Optionally, the driver is a linear driver, which includes a body part and a power output member. The power output member can move linearly relative to the body part. The testing device further includes a connecting bracket, and the power output member is connected to the light-shielding baffle through the connecting bracket.

[0007] Optionally, the triggering member is connected to the power output member.

[0008] Optionally, the first position sensor and the second position sensor are spaced apart and arranged on the body part.

[0009] Optionally, the number of the testing jigs is multiple, and the multiple testing jigs are spaced apart; the number of the testing auxiliary areas is equal to the number of the testing jigs, and the testing auxiliary areas and the setting areas are arranged opposite to each other in a one-to-one correspondence.

[0010] Optionally, the testing device further includes a base and multiple support columns. The testing jig is arranged on the base, each support column is arranged on the base, and the light-shielding baffle is supported by the support columns.

[0011] Optionally, balls are arranged on one side of the support column facing the light-shielding baffle.

[0012] Optionally, the first position sensor is a first position switch, and the second position sensor is a second position switch.

[0013] Optionally, the testing jig includes an optical lens. The light-shielding baffle is located on the side of the optical lens away from the setting area. When the light-shielding baffle is in the light-transmitting position, the optical lens is opposite to the light-transmitting area.

[0014] Optionally, the testing jig further includes a carrier, and the setting area is located on the carrier.

[0015] Optionally, the testing jig further includes an optical lens holder. The optical lens holder is wound around the outside of the setting area. One end of the optical lens holder is detachably connected to the carrier, and the other end of the optical lens holder is connected to the optical lens. The carrier, the optical lens holder and the optical lens enclose a receiving cavity, and the setting area is located in the receiving cavity.

[0016] Optionally, the testing jig further includes a lock. The lock is movably connected to the optical lens holder and is used to connect to the peripheral part of the carrier.

[0017] Optionally, the testing jig further includes a pressing member, which is used to connect to the carrier to limit the infrared focal plane array detector in the setting area.

[0018] The above at least one technical solution adopted in the embodiments of the present application can achieve the following beneficial effects:

[0019] In the embodiments of the present application, when the drive unit drives the light-shielding baffle to dock at the shielding position, the infrared focal plane array detector provided in the setting area is opposite to the light-shielding area, so that the infrared focal plane array detector can be tested for blocking. When the drive unit drives the light-shielding baffle to dock at the light-transmitting position, the infrared focal plane array detector provided in the setting area is opposite to the light-transmitting area, so that the infrared focal plane array detector can be tested for imaging. It can be seen that, compared with the related art, by adopting the solution provided in the embodiments of the present application, there is no need to set up a complex control algorithm. Therefore, the test equipment provided in the embodiments of the present application has the characteristics of simple principle and easy implementation.

[0020] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present application. Description of the Drawings

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related art, the following will briefly introduce the drawings required for use in the description of the embodiments or the related art. Obviously, the drawings in the following description are only some embodiments recorded in the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0022] Figure 1 Schematic diagram of a test device provided by an embodiment of the present application;

[0023] Figure 2 Structural schematic diagram of a test device provided by an embodiment of the present application;

[0024] Figure 3 Cross-sectional view of a test device provided by an embodiment of the present application, showing the case where the light-shielding baffle is in the light-transmitting position;

[0025] Figure 4 For Figure 3 Partial schematic diagram of the test device shown in;

[0026] Figure 5 Cross-sectional view of a test device provided by an embodiment of the present application, showing the case where the light-shielding baffle is in the shielding position;

[0027] Figure 6 Top view of a test device provided by an embodiment of the present application, showing the case where the light-shielding baffle is in the shielding position.

[0028] Description of the reference numerals:

[0029] 1 - Test device;

[0030] 10 - Test tooling; 11 - Optical lens; 12 - Carrier; 13 - Optical lens holder; 14 - Lock; 15 - Pressing member;

[0031] 20 - Light - shielding baffle; 21 - Light - shielding area; 22 - Light - transmitting area;

[0032] 30 - Driver; 31 - Body part; 32 - Power output member;

[0033] 41 - Triggering member; 42 - First position sensor; 43 - Second position sensor; 44 - Connecting bracket;

[0034] 51 - Base; 52 - Support column;

[0035] 2 - Infrared focal plane array detector. Detailed implementation manners

[0036] To make the objectives, technical solutions and advantages of the present application clearer, the technical solutions of the present application will be clearly and completely described below in conjunction with the specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0037] In the description of the present application, it should be noted that unless otherwise clearly defined and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected, or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific situations.

[0038] In addition, although the terms used in the present application are selected from well - known and commonly used terms, some of the terms mentioned in the specification of the present application may be selected by the applicant according to his or her judgment, and their detailed meanings are described in the relevant parts of the description herein.

[0039] In addition, it is required to understand the present application not only through the actual terms used, but also through the meaning implied by each term.

[0040] The following will, in conjunction with the drawings, detail the technical solutions provided by the embodiments of the present application.

[0041] The embodiments of the present application provide a test device, which is used to test an infrared focal plane array detector. Refer toFigures 1 to 6 The test device 1 provided by the embodiment of the present application includes: a test tooling 10, a light-shielding baffle 20, a driver 30, a trigger 41, a first position sensor 42, and a second position sensor 43.

[0042] The test tooling 10 is provided with a setting area for setting the infrared focal plane array detector 2. The light-shielding baffle 20 is provided with a test auxiliary area, and the test auxiliary area includes a light-shielding area 21 and a light-transmitting area 22. The driver 30 is drivingly connected to the light-shielding baffle 20 to drive the light-shielding baffle 20 to switch between a light-transmitting position and a light-blocking position, and the trigger 41 is connected to the light-shielding baffle 20. Specifically refer to Figure 5 and Figure 6 , when the light-shielding baffle 20 is in the light-blocking position, the trigger 41 triggers the first position sensor 42, and the setting area is opposite to the light-shielding area 21. In this way, by setting the first position sensor 42, the light-shielding baffle 20 can be accurately docked at the light-blocking position. In addition, when the infrared focal plane array detector 2 is provided in the setting area, the infrared focal plane array detector 2 is opposite to the light-shielding area 21, so that the temperatures of the pixels of the infrared focal plane array detector 2 are the same. It should be noted that the scenario of testing the infrared focal plane array detector 2 with the light-shielding baffle 20 in the light-blocking position can be referred to as a blocking test.

[0043] Specifically refer to Figures 2 to 4 , when the light-shielding baffle 20 is in the light-transmitting position, the trigger 41 triggers the second position sensor 43, and the setting area is opposite to the light-transmitting area 22. In this way, by setting the second position sensor 43, the light-shielding baffle 20 can be accurately docked at the light-transmitting position. In addition, when the infrared focal plane array detector 2 is provided in the setting area, the infrared focal plane array detector 2 is opposite to the light-transmitting area 22. A target object to be photographed can be set on the side of the light-transmitting area 22 away from the infrared focal plane array detector 2. Thus, the infrared focal plane array detector 2 can obtain an infrared image of the target object to be photographed, and then test the infrared focal plane array detector 2 in this way. It should be noted that the scenario of testing the infrared focal plane array detector 2 with the light-shielding baffle 20 in the light-transmitting position can be referred to as an imaging test.

[0044] In this way, in the embodiments of the present application, when the drive 30 drives the light-shielding baffle 20 to dock at the shielding position, the infrared focal plane array detector 2 provided in the setting area faces the light-shielding area 21, so that the infrared focal plane array detector 2 can be tested for blocking. When the drive 30 drives the light-shielding baffle 20 to dock at the light-transmitting position, the infrared focal plane array detector 2 provided in the setting area faces the light-transmitting area 22, so that the infrared focal plane array detector 2 can be tested for imaging. It can be seen that, compared with the related art, the solution provided by the embodiments of the present application does not require a complex control algorithm. Therefore, the test device 1 provided by the embodiments of the present application has the characteristics of simple principle and easy implementation.

[0045] In some embodiments, the drive 30 is a linear drive. The linear drive includes a body portion 31 and a power output member 32, and the power output member 32 can move linearly relative to the body portion 31. The test device 1 further includes a connecting bracket 44, and the power output member 32 is connected to the light-shielding baffle 20 through the connecting bracket 44.

[0046] Exemplarily, the drive 30 is a linear motor. For example, the drive 30 is a stepper linear motor. Exemplarily, the drive 30 may also include devices such as a rotary motor, a pneumatic motor, or a hydraulic motor that can output a rotary driving force, and a transmission mechanism such as a lead screw thread transmission mechanism or a gear rack mechanism that can convert rotary motion into linear motion.

[0047] Further, the trigger member 41 can be connected to the power output member 32. The first position sensor 42 and the second position sensor 43 can be spaced apart and arranged on the body portion 31. In some embodiments, the first position sensor 42 is a first position switch, and the second position sensor 43 is a second position switch. It should be noted that a position switch is also called a travel switch or a limit switch. When the position switch is triggered, its contact moves to achieve on or off control of the control circuit to achieve the control purpose.

[0048] Exemplarily, in combination Figure 1 , when a positive signal is input to the linear motor, the power output member 32 moves from left to right. When the trigger member 41 triggers the second position sensor 43, the second position sensor 43 causes the transmission line to be open, thereby interrupting the output of the signal to stop the power output member 32. In this way, by reasonably setting the installation position of the second position sensor 43, when the light-shielding baffle 20 moves to the light-transmitting position, the trigger member 41 triggers the second position sensor 43, and the light-shielding baffle 20 just docks to the light-transmitting position.

[0049] When a negative signal is input to the linear motor, the power output member 32 moves from right to left. When the trigger member 41 triggers the first position sensor 42, the first position sensor 42 opens the conveying line, thereby interrupting the output of the signal to stop the power output member 32. In this way, by reasonably setting the installation position of the first position sensor 42, when the light-shielding baffle 20 moves to the shielding position, the trigger member 41 triggers the first position sensor 42, and the light-shielding baffle 20 just stops at the shielding position. Exemplarily, the switching of positive and negative signals can be performed by an operator, or a power supply signal automatic switching service solution can be purchased from the corresponding technology service provider, which will not be elaborated here.

[0050] In some embodiments, the number of the test toolings 10 is multiple, and the multiple test toolings 10 are arranged at intervals. The number of the test auxiliary areas is equal to the number of the test toolings 10, and the test auxiliary areas and the setting areas are arranged opposite to each other in a one-to-one correspondence. In this way, each test tooling 10 can be respectively provided with an infrared focal plane array detector 2. Since the light-shielding baffle 20 is provided with multiple test auxiliary areas. Therefore, by driving the light-shielding baffle 20 to switch between the light-transmitting position and the shielding position by the driver 30, the blocking test and the imaging test can be respectively performed on each infrared focal plane array detector 2. Since the test device 1 can synchronously test multiple infrared focal plane array detectors 2, the test efficiency of the test device 1 can be improved.

[0051] In some embodiments, the multiple test toolings 10 are arranged in an array. Exemplarily, the number of the test toolings 10 is 15, and the test toolings 10 are arranged in a 5-row and 3-column array. Of course, those skilled in the art can also flexibly adjust the arrangement mode of the test toolings 10 according to actual needs during the implementation of the solution provided by the embodiments of the present application, which will not be elaborated here.

[0052] Reference Figure 3 and Figure 4 As shown in FIGS. 11 and 12, in some embodiments, the test device 1 further includes a base 51 and multiple support columns 52. The test tooling 10 is arranged on the base 51, each support column 52 is arranged on the base 51, and the light-shielding baffle 20 is supported by the support columns 52. Exemplarily, balls are provided on one side of the support column 52 facing the light-shielding baffle 20. In this way, when the light-shielding baffle 20 is driven, the balls are in rolling contact with the light-shielding baffle 20 to reduce the frictional resistance between the support column 52 and the light-shielding baffle 20.

[0053] In some embodiments, the test tooling 10 includes an optical lens 11. The light-shielding baffle 20 is located on the side of the optical lens 11 away from the setting area. When the light-shielding baffle 20 is in the light-transmitting position, the optical lens 11 is opposite to the light-transmitting area 22.

[0054] In some embodiments, the test fixture 10 further includes a carrier 12, and the setting area is located on the carrier 12. In other words, the carrier 12 is used to carry the infrared focal plane array detector 2.

[0055] In some embodiments, the test fixture 10 further includes an optical lens holder 13. The optical lens holder 13 is wound around the outside of the setting area. One end of the optical lens holder 13 is detachably connected to the carrier 12, and the other end of the optical lens holder 13 is connected to the optical lens 11. The carrier 12, the optical lens holder 13, and the optical lens 11 enclose a receiving cavity, and the setting area is located within the receiving cavity.

[0056] In some embodiments, the test fixture 10 further includes a latch 14. The latch 14 is movably connected to the optical lens holder 13, and the latch 14 is used to connect to the peripheral portion of the carrier 12. In this way, during the test process, before disassembling and assembling the infrared focal plane array detector 2, the optical lens 11 can be conveniently removed to avoid interference from the optical lens 11 during the disassembly and assembly of the infrared focal plane array detector 2.

[0057] In some embodiments, the test fixture 10 further includes a pressing member 15. The pressing member 15 is used to connect to the carrier 12 to limit the infrared focal plane array detector 2 in the setting area. It should be noted that a light-transmitting hole is provided at the portion of the pressing member 15 opposite to the infrared focal plane array detector 2 to avoid the pressing member 15 blocking the infrared focal plane array detector 2.

[0058] It should be noted that in this document, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device.

[0059] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the embodiments of the present application. The scope of the embodiments of the present application is defined by the appended claims and their equivalents.

Claims

1. A test device (1) for testing an infrared focal plane array detector (2), characterized in that: The testing device (1) comprises: a testing tool (10), a light shielding baffle (20), a driver (30), a trigger (41), a first position sensor (42), and a second position sensor (43); The test fixture (10) is provided with a setting area, the setting area is used to set the infrared focal plane array detector (2), the light shielding baffle (20) is provided with a test auxiliary area, the test auxiliary area includes a light shielding area (21) and a light transmission area (22), the driver (30) is drivingly connected to the light shielding baffle (20) to drive the light shielding baffle (20) to switch between a light transmission position and a shielding position, and the trigger (41) is connected to the light shielding baffle (20); When the light shielding baffle (20) is located at the shielding position, the triggering member (41) triggers the first position sensor (42), and the setting area is opposite to the light shielding area (21); When the light-shielding baffle (20) is located at the light-transmitting position, the triggering member (41) triggers the second position sensor (43), and the setting area is opposite to the light-transmitting area (22).

2. The test device (1) according to claim 1, characterized in that The driver (30) is a linear driver, comprising a main body (31) and a power output member (32), wherein the power output member (32) is capable of moving in a straight line relative to the main body (31), and the test device (1) further comprises a connecting bracket (44), wherein the power output member (32) is connected to the light shielding baffle (20) via the connecting bracket (44).

3. The test device (1) according to claim 2, characterized in that The trigger component (41) is connected to the power output component (32).

4. The test device (1) according to claim 2, characterized in that The first position sensor (42) and the second position sensor (43) are arranged at intervals on the main body (31).

5. The test device (1) according to claim 1, characterized in that The testing device (1) further comprises a base (51) and a plurality of support columns (52); the testing tool (10) is arranged on the base (51); each of the support columns (52) is arranged on the base (51); and the light shielding baffle (20) is supported on the support columns (52).

6. The test device (1) according to claim 1, characterized in that The first position sensor (42) is a first position switch, and the second position sensor (43) is a second position switch.

7. The test device (1) according to claim 1, characterized in that The testing fixture (10) comprises an optical lens (11), the light shielding baffle (20) being located on a side of the optical lens (11) away from the setting area, and when the light shielding baffle (20) is located at the light-transmitting position, the optical lens (11) is opposite to the light-transmitting area (22).

8. The test device (1) according to claim 7, characterized in that The testing tool (10) further comprises a carrier (12), and the setting area is located on the carrier (12).

9. The test device (1) according to claim 8, characterized in that The testing fixture (10) further comprises an optical lens holder (13), wherein the optical lens holder (13) is disposed outside the setting area, one end of the optical lens holder (13) is detachably connected to the carrier (12), and the other end of the optical lens holder (13) is connected to the optical lens (11); the carrier (12), the optical lens holder (13) and the optical lens (11) form a receiving cavity, and the setting area is located within the receiving cavity.

10. The test device (1) according to claim 9, characterized in that The testing fixture (10) further comprises a lock buckle (14), wherein the lock buckle (14) is movably connected to the optical lens holder (13), and the lock buckle (14) is used to connect to a peripheral portion of the carrier (12).

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