Socket for electrical component test

Abstract

The utility model provides a socket for testing electrical components, which comprises a base, a plurality of vertical holes are vertically arranged on the outer edges of the two sides of the upper surface of the base, and supporting springs are vertically and fixedly connected to the bottom ends inside the plurality of vertical holes. According to the socket for testing the electrical component, the plurality of sliding columns and the transverse plate are arranged, the plurality of vertical holes are formed in the base of the socket, the supporting springs are fixedly connected in the plurality of vertical holes, the sliding columns are limited by the supporting springs, and when the supporting springs are not stressed, the supporting springs are fixed on the transverse plate, so that the sliding columns are fixed on the transverse plate. The sliding columns cannot completely enter the vertical holes, so that the transverse plate is kept in a suspended state, at the moment, people put down the pressing seat and then apply pressure downwards to tightly press a test piece in the device, under the action of the structure, the pressing process of the pressing seat is changed into the overall vertical downward process, the test piece cannot be deviated, and the test piece is prevented from being damaged. The test effect is ensured.

Description

Technical Field

[0001] The utility model relates to the technical field of electrical devices, in particular to a socket used for testing electrical components. Background Art

[0002] The IC test socket is a standard test device that tests the electrical performance and electrical connections of IC devices to check for manufacturing defects and component failures. It is mainly used to check the open and short circuit conditions of single IC components and various circuit networks online, as well as analog device function and digital device logic function testing.

[0003] When using an IC test socket to test chips and other components, the test piece is first placed inside the test socket, and then the top cover of the test socket is closed, and the test piece is pressed down to test it. However, the current structure of the test socket often has a top cover connected by a hinge, so when it is pressed down, a part of it will first contact the test piece. At this time, one end of the test piece may be pressed down and lifted up, causing the test piece to shift, affecting the test results.

[0004] Therefore, it is necessary to provide a new socket for electrical component testing to solve the above technical problems. Summary of the invention

[0005] The utility model provides a socket for testing electrical components, which solves the technical problem that the top cover of the current test socket structure is often connected in a hinged manner, so when it is pressed down, a part of it will first contact the test piece. At this time, one end of the test piece may be pressed down and tilted, causing the test piece to deviate, affecting the test result.

[0006] In order to solve the above technical problems, the utility model provides a socket for testing electrical components, comprising a base, wherein the outer edges of both sides of the upper surface of the base are vertically provided with a plurality of vertical holes, the bottom ends of the plurality of vertical holes are vertically fixedly connected with support springs, the other ends of the plurality of support springs are respectively fixedly connected with sliding columns respectively slidably connected to the plurality of vertical holes, and the top ends of the plurality of sliding columns on the same side are laterally fixedly connected with a cross plate;

[0007] The connecting seats have two and are respectively fixedly connected to the rear ends of the upper surfaces of the two horizontal plates; a rotating shaft is connected between the two connecting seats for transverse rotation; and a lower pressing seat is fixedly connected to the outer surface of the rotating shaft.

[0008] Preferably, a device groove is vertically opened in the middle of the upper surface of the base, and a plurality of return springs are vertically fixedly connected inside the device groove, and the top ends of the plurality of return springs are laterally fixedly connected with a placement plate which is vertically slidably connected to the inside of the device groove.

[0009] Preferably, a pressing block corresponding to the placing plate is fixedly connected to the bottom end of the pressing seat. When the plurality of supporting springs are not stressed, the pressing block does not contact the placing plate.

[0010] Preferably, support blocks are fixedly connected to both side surfaces of the front part of the pressing seat.

[0011] Preferably, mounting grooves are formed at the bottoms of the front and rear ends of the pressing seat. L-shaped hooks are rotatably connected to the interiors of the two mounting grooves, and clamping grooves adapted to the hooks are formed on the front and rear end surfaces of the base.

[0012] Preferably, a tension spring is transversely fixedly connected between the inner end surface of the hook and the outer surface of the pressing seat.

[0013] Compared with the related art, the socket for electrical component testing provided by the present utility model has the following beneficial effects: The present utility model provides a socket for electrical component testing. By providing a plurality of sliding columns and a cross plate, a plurality of vertical holes are formed in the base of the device, and supporting springs are fixedly connected to the interiors of the plurality of vertical holes. The supporting springs limit the sliding columns. When the supporting springs are not stressed, the plurality of sliding columns cannot completely enter the interiors of the vertical holes, so that the cross plate remains suspended. At this time, after the pressing seat is placed downwards and then pressed downwards, the test piece in the device can be pressed tightly. Under the action of this structure, the process of pressing down the pressing seat becomes vertically downward as a whole, and the test piece will not be offset, ensuring the test effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 is a schematic structural diagram of a preferred embodiment of the socket for electrical component testing provided by the present utility model;

[0015] Figure 2 is Figure 1 a schematic structural diagram of the test state of the socket for electrical component testing shown;

[0016] Figure 3 is Figure 1 a schematic top view structural diagram of the base part of the socket for electrical component testing shown. Reference numerals in the figure: 1, base; 2, device slot; 3, return spring; 4, placing plate; 5, vertical hole; 6, sliding column; 7, supporting spring; 8, cross plate; 9, connecting seat; 10, pressing seat; 11, support block; 12, pressing block; 13, mounting groove; 14, hook; 15, tension spring; 16, clamping groove. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0017] The present utility model will be further described below with reference to the drawings and embodiments.

[0018] Please refer to Figure 1 , Figure 2 and Figure 3 , wherein, Figure 1 is a schematic structural diagram of a preferred embodiment of the socket for electrical component testing provided by the present utility model; Figure 2 is Figure 1 a schematic structural diagram of the test state of the socket for electrical component testing shown in Figure 3 is Figure 1 a schematic top view structural diagram of the base part of the socket for electrical component testing shown in . The socket for electrical component testing includes: a base 1, on both sides of the outer edge of the upper surface of the base 1, a plurality of vertical holes 5 are vertically opened, at the bottom ends inside the plurality of vertical holes 5, a plurality of support springs 7 are vertically fixedly connected, the other ends of the plurality of support springs 7 are respectively fixedly connected to sliding columns 6 that are respectively slidably connected inside the plurality of vertical holes 5, and the tops of the plurality of sliding columns 6 on the same side are horizontally fixedly connected to a cross plate 8;

[0019] A connecting seat 9, there are two connecting seats 9 and they are respectively fixedly connected to the rear ends of the upper surfaces of the two cross plates 8, a rotating shaft is horizontally rotatably connected between the two connecting seats 9, and a pressing seat 10 is fixedly connected to the outer surface of the rotating shaft.

[0020] A plurality of vertical holes 5 are opened on the base 1 of the device, and a plurality of support springs 7 are fixedly connected inside the plurality of vertical holes 5. The support springs 7 limit the sliding columns 6. When the support springs 7 are not stressed, the plurality of sliding columns 6 cannot completely enter the inside of the vertical holes 5, so that the cross plate 8 remains suspended. When people need to conduct a test, after placing the chip in the base 1, the pressing seat 10 is rotated to a horizontal state, and then pressure can be applied downward to the pressing seat 10 to press the test piece in the device. Under the action of the cross plate 8, the support springs 7 and the sliding columns 6, the process of the pressing seat 10 pressing down becomes vertically downward as a whole, and the test piece will not be offset, ensuring the test effect.

[0021] In the middle of the upper surface of the base 1, a device slot 2 is vertically opened, a plurality of reset springs 3 are vertically fixedly connected inside the device slot 2, and the tops of the plurality of reset springs 3 are horizontally fixedly connected to a placement plate 4 that is vertically slidably connected inside the device slot 2.

[0022] Contact heads for testing are also provided inside the device slot 2. Through holes corresponding to these contact heads are penetrated and opened on the surface of the placement plate 4. After the test piece is placed on the placement plate 4 and pressed down, the placement plate 4 sinks, and the contact heads are exposed and will contact the contacts on the test piece to test the test piece. After the test is completed, the placement plate 4 is no longer stressed, and under the action of the plurality of reset springs 3, the placement plate 4 can be reset.

[0023] The bottom end of the pressing seat 10 is fixedly connected with a pressing block 12 corresponding to the placing plate 4. When the plurality of support springs 7 are not stressed, the pressing block 12 does not contact the placing plate 4.

[0024] During the process of the pressing seat 10 descending, the pressing block 12 descends synchronously to press the test piece.

[0025] Both side surfaces at the front of the pressing seat 10 are fixedly connected with support blocks 11.

[0026] The support blocks 11 play a supporting role to ensure that when the pressing seat 10 rotates to the flat state, its front and rear ends are on the same horizontal plane.

[0027] Installation grooves 13 are formed at the bottoms of the front and rear ends of the pressing seat 10. L-shaped hooks 14 are rotatably connected inside the two installation grooves 13. Card slots 16 adapted to the hooks 14 are formed on the front and rear end surfaces of the base 1.

[0028] A tension spring 15 is horizontally fixedly connected between the inner end surface of the hook 14 and the outer surface of the pressing seat 10.

[0029] The hook 14 is always subjected to a force towards the pressing seat 10 under the action of the tension spring 15. After the pressing seat 10 is pressed down, the bottom end of the hook 14 will automatically snap into the inside of the card slot 16. At this time, the hook 14 can limit the pressing seat 10 to ensure that it can always be closely attached to the base 1.

[0030] The working principle of the socket for electrical component testing provided by the present utility model is as follows:

[0031] A plurality of vertical holes 5 are formed in the base 1 of the device, and support springs 7 are fixedly connected inside the plurality of vertical holes 5. The support springs 7 limit the sliding columns 6. When the support springs 7 are not stressed, the plurality of sliding columns 6 cannot completely enter the inside of the vertical holes 5, so that the cross plate 8 remains suspended. When people need to conduct a test, after placing the chip in the base 1, the pressing seat 10 is rotated to the horizontal state, and then the pressing seat 10 can be pressed downward to press the test piece in the device. Under the action of the cross plate 8, the support springs 7 and the sliding columns 6, the process of the pressing seat 10 pressing down becomes vertically downward as a whole, and the test piece will not be offset, ensuring the test effect.

[0032] Compared with the related art, the socket for electrical component testing provided by the present utility model has the following

[0033] Beneficial effects:

[0034] The utility model provides a socket for testing electrical components, which is provided with a plurality of sliding columns 6 and a cross plate 8. The device is provided with a plurality of vertical holes 5 on the base 1 of the device, and a support spring 7 is fixedly connected inside each of the plurality of vertical holes 5. The support spring 7 restricts the sliding columns 6. When the support spring 7 is not stressed, the plurality of sliding columns 6 cannot fully enter the inside of the vertical holes 5, so that the cross plate 8 remains suspended. At this time, people can only press down the test piece in the device after putting down the pressing seat 10 and then applying pressure downward. Under the action of this structure, the process of pressing down the pressing seat 10 becomes vertically downward as a whole, and the test piece will not be offset, ensuring the test effect.

[0035] The above are only the embodiments of the present utility model, and do not limit the patent scope of the present utility model. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present utility model, or directly or indirectly applied in other related technical fields, shall be equally included in the patent protection scope of the present utility model.

Claims

1. A socket for testing electrical components, characterized in that: The base (1) comprises a plurality of vertical holes (5) vertically formed on the outer edges of both sides of the upper surface of the base (1); the bottom ends of the plurality of vertical holes (5) are vertically fixedly connected to support springs (7); the other ends of the plurality of support springs (7) are respectively fixedly connected to sliding columns (6) respectively slidably connected to the plurality of vertical holes (5); and the top ends of the plurality of sliding columns (6) on the same side are laterally fixedly connected to a transverse plate (8); The connecting seats (9) are provided with two and are respectively fixedly connected to the rear ends of the upper surfaces of the two transverse plates (8); a rotating shaft is connected between the two connecting seats (9) for transverse rotation; and a lower pressing seat (10) is fixedly connected to the outer surface of the rotating shaft.

2. The socket for testing electrical components according to claim 1, characterized in that: A mounting groove (2) is vertically provided in the middle of the upper surface of the base (1), a plurality of return springs (3) are vertically fixedly connected inside the mounting groove (2), and a placement plate (4) vertically slidably connected inside the mounting groove (2) is laterally fixedly connected to the top ends of the plurality of return springs (3).

3. The socket for testing electrical components according to claim 2, characterized in that: The bottom end of the lower pressing seat (10) is fixedly connected with a lower pressing block (12) corresponding to the placement plate (4); when the plurality of support springs (7) are not subjected to force, the lower pressing block (12) is not in contact with the placement plate (4).

4. The socket for testing electrical components according to claim 1, characterized in that: Both side surfaces of the front portion of the lower pressing seat (10) are fixedly connected to the supporting block (11).

5. The socket for testing electrical components according to claim 1, characterized in that: The bottom of the front and rear ends of the lower pressing seat (10) are provided with mounting grooves (13), and the insides of the two mounting grooves (13) are rotatably connected with L-shaped hooks (14), and the front and rear end surfaces of the base (1) are provided with slots (16) adapted to the hooks (14).

6. The socket for testing electrical components according to claim 5, characterized in that: The inner end surface of the hook (14) and the outer surface of the lower pressing seat (10) are transversely fixedly connected with a tension spring (15).

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