Flip knob test seat suitable for chips with various thicknesses

Abstract

The utility model relates to the technical field of chip test seats, and discloses a flip knob test seat suitable for chips with various thicknesses, the flip knob test seat comprises a loading test part and a pressing part, the loading test part comprises a base and a chip pressing claw arranged between the base and the pressing part, the bottom of the base is provided with a probe test part, and the probe test part is provided with a probe. And the probe testing part comprises a basic probe station integrally arranged at the bottom of the base and an auxiliary limiting frame detachably connected above the basic probe station. According to the utility model, through the arrangement of the knob and the buckle structure, under the cooperation effect of the knob and the buckle structure, the pressing distance of the pressing block can be flexibly adjusted, chips with different thicknesses can be tested in a compatible manner, and the use effect of the prior art is greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip test sockets, in particular to a flip knob test socket applicable to chips with multiple thicknesses. Background Technique

[0002] Traditional aging test sockets are mainly composed of a base, an upper cover, a lower cover, a limiting frame, etc. Its main working principle is as follows: under the external force applied to the upper part of the test socket, the upper cover moves downward; a hinge structure is formed by the upper cover and the pressing claws, and the upper cover drives the pressing claws to rotate and open; the chip is placed in the chip placement groove of the limiting frame; the external force is slowly removed, the upper cover moves upward and drives the pressing claws to rotate in the opposite direction, pressing the chip to fix the chip position, and waiting for the next test, etc. Among them, the limiting frame is the main component for placing the chip, and its upper part contains a chip fixing groove for placing the chip, an avoidance groove for the pressing claws, and slots for chip picking and placing avoidance, etc.; usually, due to different chip size specifications, the design of the chip limiting frame also has corresponding differences, that is, the chip and the chip limiting frame are in one-to-one correspondence.

[0003] For some chips, there may only be process differences in the external dimensions, and their internal packaging forms and the layout of test points are the same. In actual production, using different test sockets for different chips with small differences will cause problems such as an increase in the number of test socket products, the inability to make full use of the same product components, waste, and confusion among production personnel.

[0004] In the Chinese patent with the publication number CN 219625539 U, an aging test socket compatible with multiple chip aging tests is disclosed, including a loading test part and a pressing part. The loading test part includes a base and chip pressing claws arranged between the base and the pressing part. A probe test part is provided at the bottom of the base. The probe test part includes a basic probe table integrally arranged at the bottom of the base and an auxiliary limiting frame detachably connected above the basic probe table. The advantages of the utility model are that a single test socket corresponds to test chips of multiple sizes, and the quick replacement of a single component realizes the rapid switching of test product types, saves the time for replacing test product types, avoids the problems of a large number of products and difficult personnel operation in actual production, integrates product components, makes full use of product components, avoids waste, and provides a direction for one-to-two or one-to-many test socket product tests, expanding the applicable range of a single test socket.

[0005] However, when the existing technology is used, the pressing distance of the test socket cannot be flexibly adjusted, and it cannot be compatible with testing chips of different thicknesses. Summary of the Utility Model

[0006] The purpose of the utility model is to solve the problems existing in the prior art, and to propose a flip knob test socket applicable to chips with multiple thicknesses.

[0007] To achieve the above object, the utility model adopts the following technical solutions:

[0008] A flip knob test seat applicable to chips of multiple thicknesses, comprising a loading and testing part and a pressing part. The loading and testing part includes a base and a chip pressing claw arranged between the base and the pressing part. A probe testing part is provided at the bottom of the base. The probe testing part includes a basic probe table integrally arranged at the bottom of the base and an auxiliary limiting frame detachably connected above the basic probe table. The pressing part is rotationally connected to the base through a rotating shaft and a torsion spring. A knob is arranged on the other side of the pressing part. A threaded rod is arranged on one side of the knob. The threaded rod movably penetrates through the pressing part and is threadedly connected to the pressing part. A pressing block is movably embedded and installed on the other side of the pressing part. One end of the pressing part far from the rotating shaft is detachably connected to the base through a buckle structure.

[0009] Preferably, a countersunk hole is formed on the outer side edge of the auxiliary limiting frame. A positioning screw is screwed on the top of the base at a position opposite to the countersunk hole, and the positioning screw is adapted to the countersunk hole. The bottom of the auxiliary limiting frame abuts against the top of the basic probe table.

[0010] Preferably, a plurality of protrusions are arranged at the bottom of the chip pressing claw. Probe holes are formed on the basic probe table, and probes are arranged inside the probe holes. A groove adapted to the protrusions is extended and arranged at the top of the probe hole.

[0011] Preferably, the auxiliary limiting frame is a replaceable part and has a variety of selectable sizes.

[0012] Preferably, the buckle structure includes a limiting block arranged on one side of the base and a buckle member arranged on one side of the pressing part.

[0013] Preferably, a receiving groove is formed at a position corresponding to the pressing block on the pressing part, and the thickness of the receiving groove is greater than the thickness of the pressing block. T-shaped guide rods are movably penetrated through the four corners of the pressing block, and one end of each T-shaped guide rod is threadedly connected to the pressing block through a thread. The T-shaped end of the T-shaped guide rod is located on the side of the pressing part far from the base, and the T-shaped guide rod movably penetrates through the pressing part.

[0014] Compared with the prior art, the beneficial effects of the utility model are as follows:

[0015] In the utility model, through the arranged knob and buckle structure, under the combined action of the knob and the buckle structure, the pressing distance of the pressing block can be flexibly adjusted, different thickness chips can be compatibly tested, and the use effect of the prior art is greatly improved. Description of the Drawings

[0016] Figure 1Schematic three-dimensional view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0017] Figure 2 Right view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0018] Figure 3 Left view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0019] Figure 4 Rear view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0020] Figure 5 Front view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0021] Figure 6 Top view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model

[0022] Figure 7 Bottom view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0023] Figure 8 Cross-sectional view of the open state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0024] Figure 9 Schematic three-dimensional view of the T-shaped guide rod of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0025] Figure 10 Side schematic three-dimensional view of the T-shaped guide rod of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0026] Figure 11 Schematic three-dimensional view of the closed state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0027] Figure 12 Rear view of the closed state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0028] Figure 13 Side view of the closed state of a flip-knob test socket for chips of various thicknesses proposed by the present utility model;

[0029] Figure 14Schematic diagram of the corresponding adjustment of the knob of a flip - knob test seat suitable for chips of various thicknesses proposed by the present utility model;

[0030] Figure 15 Schematic diagram of the knob of a flip - knob test seat suitable for chips of various thicknesses proposed by the present utility model corresponding to different chips;

[0031] Figure 16 Schematic diagram of the rotation of the knob of a flip - knob test seat suitable for chips of various thicknesses proposed by the present utility model.

[0032] In the figure: 1. Pressing part; 2. Base; 3. Chip pressing claw; 4. Probe test part; 5. Basic probe table; 6. Auxiliary limiting frame; 7. Rotating shaft; 8. Torsion spring; 9. Knob; 10. Threaded rod; 11. Pressing block; 12. Buckling part; 13. Limiting block; 14. Countersunk hole; 15. Positioning screw; 16. Protrusion; 17. Accommodating groove; 18. T - shaped guide rod. Specific implementation mode

[0033] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments.

[0034] Embodiment 1

[0035] Refer to Figures 1-16 , a flip - knob test seat suitable for chips of various thicknesses, including a loading and testing part and a pressing part 1. The loading and testing part includes a base 2 and a chip pressing claw 3 arranged between the base 2 and the pressing part 1. A probe test part 4 is provided at the bottom of the base 2. The probe test part 4 includes a basic probe table 5 integrally arranged at the bottom of the base 2 and an auxiliary limiting frame 6 detachably connected above the basic probe table 5. The pressing part 1 is rotationally connected to the base 2 through a rotating shaft 7 and a torsion spring 8 (the pressing part 1 is fixedly connected to the rotating shaft 7, and the rotating shaft 7 is connected to the base 2 through the torsion spring 8). A knob 9 is arranged on the other side of the pressing part 1. A threaded rod 10 is arranged on one side of the knob 9. The threaded rod 10 movably penetrates through the pressing part 1 and is threadedly connected to the pressing part 1. A pressing block 11 is movably embedded and installed on the other side of the pressing part 1. One end of the pressing part 1 far from the rotating shaft 7 is detachably connected to the base 2 through a buckling structure.

[0036] When the device is in use, through the set knob 9 and the buckling structure, under the combined action of the knob 9 and the buckling structure, the pressing distance of the pressing block 11 can be flexibly adjusted to be compatible with testing chips of different thicknesses, greatly improving the use effect of the existing technology.

[0037] In this embodiment, a countersunk hole 14 is provided on the outer side of the auxiliary limit frame 6. A positioning screw 15 is screwed at a position on the top of the base 2 corresponding to the countersunk hole 14, and the positioning screw 15 is adapted to the countersunk hole 14. The bottom of the auxiliary limit frame 6 abuts against the top of the basic probe table 5. The detachable installation of the auxiliary limit frame 6 is easy to disassemble and replace, and is compatible with chips of other external dimensions. The design of the countersunk hole 14 of the limit frame is convenient for protecting the solder balls of the test chip.

[0038] In this embodiment, a number of protrusions 16 are provided at the bottom of the chip pressing claw 3. A probe hole is provided on the basic probe table 5, and a probe is provided inside the probe hole. A groove adapted to the protrusion 16 is extended at the top of the probe hole. The protrusion 16 facilitates ejecting the probe and at the same time avoids overpressure to protect the chip.

[0039] In this embodiment, the auxiliary limit frame 6 is a replaceable component and has a variety of selectable sizes.

[0040] In this embodiment, the buckle structure includes a limit block 13 provided on one side of the base 2 and a buckle member 12 provided on one side of the pressing portion 1, which is convenient to connect the pressing portion 1 and the base 2 together through this structure.

[0041] Embodiment 2

[0042] As Figures 1-16 shown, a flip knob test seat applicable to chips of various thicknesses includes a loading and testing portion and a pressing portion 1. The loading and testing portion includes a base 2 and a chip pressing claw 3 provided between the base 2 and the pressing portion 1. A probe testing portion 4 is provided at the bottom of the base 2. The probe testing portion 4 includes a basic probe table 5 integrally provided at the bottom of the base 2 and an auxiliary limit frame 6 detachably connected above the basic probe table 5. The pressing portion 1 is rotatably connected to the base 2 through a rotating shaft 7 and a torsion spring 8 (the pressing portion 1 is fixedly connected to the rotating shaft 7, and the rotating shaft 7 is connected to the base 2 through the torsion spring 8). A knob 9 is provided on the other side of the pressing portion 1. A threaded rod 10 is provided on one side of the knob 9. The threaded rod 10 movably penetrates through the pressing portion 1 and is threadedly connected to the pressing portion 1. A pressing block 11 is movably embedded and installed on the other side of the pressing portion 1. The end of the pressing portion 1 away from the rotating shaft 7 is detachably connected to the base 2 through a buckle structure.

[0043] When the device is in use, through the provided knob 9 and the buckle structure, under the combined action of the knob 9 and the buckle structure, the pressing distance of the pressing block 11 can be flexibly adjusted to be compatible with testing chips of different thicknesses, greatly improving the use effect of the prior art.

[0044] In this embodiment, a countersunk hole 14 is formed on the outer side of the auxiliary limiting frame 6. A positioning screw 15 is screwed at a position on the top of the base 2 corresponding to the countersunk hole 14, and the positioning screw 15 is adapted to the countersunk hole 14. The bottom of the auxiliary limiting frame 6 abuts against the top of the basic probe table 5. The detachable installation of the auxiliary limiting frame 6 is easy to disassemble and replace, and is compatible with chips of other external dimensions. The design of the countersunk hole 14 of the limiting frame is convenient for protecting the solder balls of the test chip.

[0045] In this embodiment, a plurality of protrusions 16 are provided at the bottom of the chip pressing claw 3. The protrusions 16 are semicircular. Probe holes are provided on the basic probe table 5, and probes are arranged inside the probe holes. A groove adapted to the protrusions 16 is extended at the top of the probe holes. The protrusions 16 are convenient for ejecting the probes and avoiding overpressure at the same time, thus protecting the chip.

[0046] In this embodiment, the auxiliary limiting frame 6 is a replaceable component and has a variety of selectable sizes.

[0047] In this embodiment, the buckle structure includes a limiting block 13 provided on one side of the base 2 and a buckle member 12 provided on one side of the pressing part 1. The buckle member 12 is made of rigid plastic, which is convenient for connecting the pressing part 1 and the base 2 through this structure.

[0048] In this embodiment, a receiving groove 17 is formed at a position on the pressing part 1 corresponding to the pressing block 11, and the thickness of the receiving groove 17 is greater than the thickness of the pressing block 11. T-shaped guide rods 18 are movably penetrated through the four corners of the pressing block 11, and one end of each T-shaped guide rod 18 is screwed to the pressing block 11 through a thread. The T-shaped end of the T-shaped guide rod 18 is located on the side of the pressing part 1 away from the base 2. The T-shaped guide rod 18 movably penetrates through the pressing part 1. By rotating the T-shaped guide rod 18, the position of the pressing block 11 in the receiving groove 17 can be adjusted. By using the position of the T-shaped end of the T-shaped guide rod 18, the pressing stroke of the pressing block 11 can be adjusted to prevent overpressure.

[0049] The above is only a preferred specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention, according to the technical solution of the present invention and its inventive concept, makes equivalent substitutions or changes, and should be covered by the protection scope of the present invention.

Claims

1. A flip-cover knob test seat suitable for chips of various thicknesses, comprising a loading test portion and a pressing portion, wherein the loading test portion comprises a base and a chip pressing claw arranged between the base and the pressing portion, and a probe test portion is arranged at the bottom of the base, wherein the probe test portion comprises a basic probe station integrally arranged at the bottom of the base and an auxiliary limit frame detachably connected above the basic probe station, characterized in that: The pressing part is rotatably connected to the base through a rotating shaft and a torsion spring, a knob is provided on the other side of the pressing part, a threaded rod is provided on one side of the knob, the threaded rod movably passes through the pressing part and is connected to the pressing part through a thread, a pressing block is movably embedded and installed on the other side of the pressing part, and the end of the pressing part away from the rotating shaft is detachably connected to the base through a snap structure.

2. The flip-cover knob test socket applicable to chips of various thicknesses according to claim 1, characterized in that: A countersunk hole is provided on the outer side of the auxiliary limiting frame, a positioning screw is spirally connected to the top of the base opposite to the countersunk hole, and the positioning screw is adapted to the countersunk hole, and the bottom of the auxiliary limiting frame is against the top of the basic probe station.

3. The flip-cover knob test socket applicable to chips of various thicknesses according to claim 1, characterized in that: The bottom of the chip pressing claw is provided with a plurality of protrusions, the basic probe platform is provided with a probe hole, and a probe is arranged inside the probe hole, and a groove matching with the protrusion is extended from the top of the probe hole.

4. The flip-cover knob test socket applicable to chips of various thicknesses according to claim 2, characterized in that: The auxiliary limiting frame is a replaceable component and has a variety of optional sizes.

5. The flip-cover knob test socket applicable to chips of various thicknesses according to claim 1, characterized in that: The buckle structure comprises a limit block arranged on one side of the base and a buckle member arranged on one side of the pressing portion.

6. The flip-cover knob test socket applicable to chips of various thicknesses according to claim 1, characterized in that: An accommodating groove is provided at a position corresponding to the lower pressing part and the lower pressing block, and the thickness of the accommodating groove is greater than the thickness of the lower pressing block. T-shaped guide rods are movably provided at the four corners of the lower pressing block, and one end of the T-shaped guide rod is spirally connected to the lower pressing block through a thread, and the T-shaped end of the T-shaped guide rod is located on the side of the lower pressing part away from the base, and the T-shaped guide rod movably passes through the lower pressing part.

7. The flip-cover knob test socket applicable to chips of various thicknesses according to claim 3, characterized in that: The protrusion is semicircular.

8. The flip-cover knob test socket applicable to chips of various thicknesses according to claim 5, characterized in that: The buckle is made of hard plastic.

Images