Testing mechanism
By designing a test mechanism including test module, crimp module and pull-up module, the problem of difficult separation between crimp module and test module in chip testing is solved, the simplicity and safety of separation operation are achieved, and the testing efficiency is improved.
Patent Information
- Application Number
- CN202421434538.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-21
- Publication Date
- 2025-07-01
- Estimated Expiration
- 2034-06-21
AI Technical Summary
During the chip testing process, the separation between the crimp module and the test module is difficult to easily affect the testing efficiency.
A testing mechanism is designed, including a test module, a crimp module and a pull-up assembly. The crimp module is detachably connected to the test module, and a simple separation between the crimp module and the test module is achieved through snap and pull-up components.
The auxiliary pull-up assembly assists in the separation between the crimp module and the test module, and the operation is simple, avoiding damage to the test mechanism and the product to be tested during the separation process, and improving the testing efficiency.
Smart Images
Figure CN223051360U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of product testing, and particularly to a testing mechanism. Background Art
[0002] In the fields of electronic components, chips, digital products, etc., products need to be tested before packaging to detect whether the functions of the tested products are normal. When testing a chip, for example, a crimping module is used to crimp the chip onto a test module to electrically connect the chip to the test module, and then the chip is powered on for testing.
[0003] Currently, during the testing process of a chip, the chip is usually carried on a test module, and the crimping module moves towards the test module to achieve the crimping test of the chip. Since the test probes of the crimping module are usually cooperated with the test module by plugging, there is an insertion and extraction force between the crimping module and the test module, resulting in difficult separation between the crimping module and the test module after the chip testing is completed, and it is not convenient to operate, seriously affecting the testing efficiency of the chip. Summary of the Invention
[0004] Based on this, it is necessary to provide a testing mechanism for the problem that it is difficult to separate the crimping module from the test module after the existing chip testing is completed.
[0005] A testing mechanism, the testing mechanism includes:
[0006] A test module, the test module has a card slot and a carrying position for carrying a product to be tested;
[0007] A crimping module, the crimping module is detachably connected to the test module and can move towards or away from the test module, the crimping module includes a buckle; and
[0008] An assisting extraction component, the assisting extraction component is arranged on the test module;
[0009] Wherein, the buckle has a first state of being clamped in the card slot and a second state of being separated from the card slot. When the buckle is in the first state, the crimping module is connected to the test module. When the buckle is in the second state, the crimping module is separated from the test module, and the assisting extraction component abuts against the crimping module and applies a force to the crimping module in the direction away from the test module.
[0010] In one embodiment, the assisting extraction component includes a base and an abutting plate, the base is arranged on the test module, and the abutting plate is rotatably arranged on the base;
[0011] When the buckle is in the second state, the buckle applies a force to the abutment plate to make the abutment plate rotate relative to the base, and one end of the abutment plate away from the base abuts against a side of the crimping module close to the test module.
[0012] In one embodiment, the abutment plate is provided with an abutment column protruding therefrom, and when the buckle is in the second state, the buckle abuts against the abutment column to enable the abutment plate to rotate relative to the base.
[0013] In one of the embodiments, the crimping module further includes a mounting plate;
[0014] The buckle includes a body and an operating portion and a clamping portion located at opposite ends of the body. The body is rotatably disposed on the mounting plate. When the body rotates relative to the mounting plate, the clamping portion can be clamped in the slot or abut against the pull-out aid component.
[0015] In one embodiment, the crimping die set further comprises a plurality of first elastic members, and the plurality of first elastic members are arranged at intervals along the circumferential direction of the crimping die set;
[0016] When the crimping module is connected to the testing module, the plurality of first elastic members are all located between the crimping module and the testing module.
[0017] In one of the embodiments, the crimping module further includes a plurality of guide posts, and the testing module is provided with a plurality of guide holes cooperating with the guide posts.
[0018] In one embodiment, the crimping module further includes a first signal adapter and a probe module, and the test module further includes a second signal adapter;
[0019] When the crimping module is connected to the testing module, the first signal adapter is plugged into the second signal adapter, and the probe module is electrically connected to the product to be tested.
[0020] In one embodiment, the testing mechanism further includes an adapter plate, which is disposed on the crimping module or the testing module, and the adapter plate is communicatively connected to the first signal adapter and / or the second signal adapter for deriving signals of the first signal adapter and the second signal adapter.
[0021] In one of the embodiments, the test module further includes a test seat and at least one clamping member, the test seat is provided with the bearing position, and the clamping member is slidably disposed on the test seat for clamping and fixing the product to be tested in the bearing position.
[0022] In one embodiment, there are two of the snap fasteners, the card slots and the assisting extraction components. The two snap fasteners are arranged on opposite sides of the crimping module, the two card slots are formed on opposite sides of the test module, and the two assisting extraction components are arranged on opposite sides of the test module.
[0023] For the above-mentioned test mechanism, when a product to be tested needs to be subjected to a crimping test, the product to be tested is placed on the bearing position of the test module, and the crimping module moves towards the direction close to the test module. When the snap fastener is in the first state of being snapped into the card slot, the crimping module is connected to the test module, and the crimping module performs a crimping test on the product to be tested; and after the crimping test of the product to be tested is completed, the snap fastener exits the card slot, and at the same time, the assisting extraction component abuts against the crimping module and applies a force to the crimping module in the direction away from the test module to push the separation between the crimping module and the test module. The test mechanism provided by the present application assists the separation between the crimping module and the test module through the assisting extraction component, the separation operation is simple, and damage to the test mechanism and the product to be tested can be avoided during the separation process. Description of the Drawings
[0024] Figure 1 It is an exploded schematic view of the test mechanism provided in some embodiments.
[0025] Figure 2 It is a schematic structural view of the test mechanism provided in some embodiments in the first state.
[0026] Figure 3 It is a schematic structural view of the test mechanism provided in some embodiments in the second state.
[0027] Figure 4 It is a schematic structural view of the test module provided in some embodiments.
[0028] Figure 5 It is a schematic structural view of the crimping module provided in some embodiments.
[0029] Reference Signs:
[0030] 100, test mechanism;
[0031] 110, test module; 111, card slot; 112, bearing position; 113, guiding hole; 114, second signal adapter; 115, test base; 116, clamping member; 120, crimping module; 121, snap fastener; 1211, body; 1212, operating part; 1213, engaging part; 122, mounting plate; 123, first elastic member; 124, guiding column; 125, first signal adapter; 126, probe module; 130, assisting extraction component; 131, base; 132, abutting plate; 133, abutting column; 140, second elastic member; 150, adapter plate;
[0032] 200. Product to be measured. Specific implementation mode
[0033] To make the above objects, features, and advantages of the present application more obvious and understandable, the following will describe the specific implementation mode of the present application in detail with reference to the accompanying drawings. Many specific details are set forth in the following description to fully understand the present application. However, the present application can be implemented in many other ways different from those described herein. Those skilled in the art can make similar improvements without departing from the connotation of the present application. Therefore, the present application is not limited by the specific embodiments disclosed below.
[0034] In the description of the present application, it should be understood that if there are terms such as "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., the orientation or positional relationship indicated by these terms is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present application.
[0035] In addition, if there are terms such as "first" and "second", these terms are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present application, if there is a term "plural", the meaning of "plural" is at least two, such as two, three, etc., unless otherwise specifically defined.
[0036] In the present application, unless otherwise clearly defined and limited, if there are terms such as "installation", "connection", "connection", "fixation", etc., these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium. It can be the communication inside two elements or the interaction relationship between two elements, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.
[0037] In this application, unless otherwise clearly specified and defined, when a first feature is described as being "on" or "under" a second feature or similar descriptions, it may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the horizontal height of the first feature is higher than that of the second feature. The first feature being "under", "beneath" and "underneath" the second feature may be that the first feature is directly below or obliquely below the second feature, or simply means that the horizontal height of the first feature is less than that of the second feature.
[0038] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or there may also be an intermediate element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intermediate element at the same time. If so, the terms "vertical", "horizontal", "up", "down", "left", "right" and similar expressions used in this application are only for the purpose of illustration and do not represent the only implementation.
[0039] The technical solutions provided by the embodiments of this application are introduced below in conjunction with the accompanying drawings.
[0040] Refer to Figure 1 As shown, this application provides a test mechanism 100. The test mechanism 100 includes a test module 110, a crimping module 120 and a pulling assistance component 130. The pulling assistance component 130 is disposed on the test module 110. The test module 110 has a card slot 111 and a carrying position 112. The carrying position 112 is used to carry the product under test 200. And when the product under test 200 is carried on the carrying position 112, the crimping module 120 can perform a crimping test on the product under test 200. Among them, in this embodiment, the product under test 200 is a chip. Of course, in other feasible embodiments, the product under test 200 can also be a circuit board, a digital product, etc. The specific type of the product under test 200 is not limited in this application.
[0041] The crimping module 120 is detachably connected to the testing module 110, and the crimping module 120 can move in a direction approaching or away from the testing module 110. The crimping module 120 includes a snap 121. It should be noted that in this embodiment, when a crimping test needs to be performed on the product under test 200, the crimping module 120 needs to move in a direction approaching the testing module 110 so that the crimping module 120 is connected to the testing module 110. The crimping module 120 applies a test pressure to the product under test 200. The crimping module 120 can perform a crimping test on the product under test 200. After the crimping test of the product under test 200 is completed, the crimping module 120 needs to move in a direction away from the testing module 110 so that the crimping module 120 is detached from the testing module 110, facilitating the picking and placing operations of the product under test 200 that has completed the test on the testing module 110.
[0042] Wherein, the snap 121 has a first state of being snapped into the slot 111 and a second state of being separated from the slot 111. Refer to Figure 2 As shown, when the snap 121 is in the first state, the snap 121 is snapped into the slot 111 to lock the crimping module 120 and the testing module 110, so that the crimping module 120 is connected to the testing module 110. The crimping module 120 applies a test pressure to the product under test 200. The crimping module 120 performs a crimping test on the product under test 200. Refer to Figure 3 As shown, when the snap 121 is in the second state, the snap 121 is separated from the slot 111 to unlock the crimping module 120 and the testing module 110, so that the crimping module 120 is separated from the testing module 110. And the assisting extraction component 130 abuts against the crimping module 120 and applies a force to the crimping module 120 in a direction away from the testing module 110 to promote the separation between the crimping module 120 and the testing module 110.
[0043] For the above-mentioned testing mechanism 100, when a crimping test needs to be performed on the product under test 200, the product under test 200 is placed on the bearing position 112 of the testing module 110. The crimping module 120 moves in a direction approaching the testing module 110. When the snap 121 is in the first state of being snapped into the slot 111, the crimping module 120 is connected to the testing module 110, and the crimping module 120 performs a crimping test on the product under test 200. After the crimping test of the product under test 200 is completed, the snap 121 exits the slot 111. At the same time, the assisting extraction component 130 abuts against the crimping module 120 and applies a force to the crimping module 120 in a direction away from the testing module 110 to promote the separation between the crimping module 120 and the testing module 110. The testing mechanism 100 provided by the present application assists in completing the separation between the crimping module 120 and the testing module 110 through the assisting extraction component 130. The separation operation is simple and can avoid damaging the testing mechanism 100 and the product under test 200 during the separation process.
[0044] In one embodiment, referring to Figure 1 and Figure 4 as shown, the assisting extraction component 130 includes a base 131 and an abutting plate 132. The base 131 is arranged on the test module 110 by means of screwing, welding, etc., so as to arrange the assisting extraction component 130 on the test module 110. The abutting plate 132 is rotatably arranged on the base 131. Exemplarily, the abutting plate 132 is rotatably connected to the base 131 through a pin shaft. When the buckle 121 is in the second state, the buckle 121 exerts an action on the abutting plate 132, so that the abutting plate 132 rotates relative to the base 131. During the rotation process of the abutting plate 132, the end of the abutting plate 132 away from the base 131 abuts against the side of the crimping module 120 close to the test module 110, and the abutting plate 132 exerts a force on the crimping module 120 in the direction away from the test module 110, so as to push the separation between the crimping module 120 and the test module 110, facilitating the picking and placing operation of the product 200 to be tested after the test on the test module 110.
[0045] Furthermore, referring to Figure 1 and Figure 4 as shown, the abutting plate 132 protrudes with an abutting post 133. When the buckle 121 is in the second state, the buckle 121 rotates and abuts against the abutting post 133, so that the abutting plate 132 rotates relative to the base 131, and the abutting plate 132 exerts a force on the crimping module 120 in the direction away from the test module 110, so as to push the separation between the crimping module 120 and the test module 110.
[0046] Preferably, referring to Figure 4 as shown, the abutting post 133 is cylindrical. When the buckle 121 rotates and abuts against the abutting post 133, the buckle 121 abuts against the arc surface of the abutting post 133, avoiding interference of the movement of the buckle 121 during the rotation process of the abutting plate 132, and avoiding the adverse phenomenon of excessive wear of the buckle 121 during the abutting process, protecting the buckle 121 to extend the service life of the buckle 121. Of course, in other feasible embodiments, the abutting post 133 is not limited to the cylindrical shape provided above, and the abutting post 133 can also be other shapes, as long as the abutting surface between the abutting post 133 and the buckle 121 is an arc surface.
[0047] In one embodiment, referring to Figure 1 , Figure 4 and Figure 5As shown, the crimping module 120 also includes a mounting plate 122. The buckle 121 includes a body 1211, an operating portion 1212 and a clamping portion 1213, and the operating portion 1212 and the clamping portion 1213 are respectively located at two ends of the body 1211. Preferably, the body 1211, the operating portion 1212 and the clamping portion 1213 are integrally formed by injection molding, extrusion, etc., so as to simplify the molding method of the buckle 121 and improve the overall structural strength of the buckle 121. The body 1211 is rotatably disposed on the mounting plate 122. When the body 1211 rotates relative to the mounting plate 122, the clamping portion 1213 can be clamped in the slot 111 or abut against the pull-out aid assembly 130. Exemplarily, when the operator applies a force to the crimping module 120 to move toward the test module 110, and when the clamping portion 1213 abuts against the side wall of the slot 111, the main body 1211 rotates relative to the mounting plate 122, and the clamping portion 1213 avoids the side wall of the slot 111. After the clamping portion 1213 passes through the side wall of the slot 111, the main body 1211 rotates in the opposite direction relative to the mounting plate 122, so that the clamping portion 1213 moves toward the direction of insertion into the slot 111, so that the crimping module 120 is connected to the test module 110 and the crimping test is performed on the product 200 to be tested. After the test of the product 200 to be tested is completed, the operator applies a force to the operating portion 1212, the main body 1211 rotates relative to the mounting plate 122, and the clamping portion 1213 moves in the direction of exiting the clamping slot 111. At the same time, during the rotation of the buckle 121, the buckle 121 can abut against the auxiliary extraction component 130 and apply a force on the crimping module 120 in the direction away from the test module 110, so as to promote the separation between the crimping module 120 and the test module 110.
[0048] Further, see Figure 1 and Figure 5 As shown, a second elastic member 140 is arranged between the buckle 121 and the mounting plate 122. One end of the second elastic member 140 is connected to the buckle 121, and the other end of the second elastic member 140 is connected to the mounting plate 122. The deformation of the second elastic member 140 helps to reset the buckle 121 during the rotation process.
[0049] In this embodiment, the second elastic member 140 is a reset spring, and the elastic deformation of the second elastic member 140 facilitates the reset of the buckle 121 during the rotation process. Of course, in other feasible embodiments, the second elastic member 140 can also be an elastic sheet or other element that can be deformed under force, and the specific element type of the second elastic member 140 is not limited by this application.
[0050] In one embodiment, refer to Figure 1 , Figure 4 and Figure 5As shown, the crimping module 120 further includes a plurality of first elastic members 123. The plurality of first elastic members 123 are arranged at intervals along the circumferential direction of the crimping module 120. Exemplarily, if there are two first elastic members 123, the two first elastic members 123 are respectively located on opposite sides of the mounting plate 122; if there are four first elastic members 123, the four first elastic members 123 are respectively located at the four corners of the mounting plate 122. When the crimping module 120 is connected to the test module 110, the plurality of first elastic members 123 are all located between the crimping module 120 and the test module 110.
[0051] In the above test mechanism 100, when the crimping module 120 moves in the direction close to the test module 110, the plurality of first elastic members 123 are all compressed to reduce the distance between the crimping module 120 and the test module 110, so that the crimping module 120 can apply a test pressure to the product 200 to be tested for crimping test on the product 200 to be tested. And when the crimping module 120 moves in the direction away from the test module 110, the plurality of first elastic members 123 elastically reset, and the plurality of first elastic members 123 cooperate with the extraction assisting component 130 to apply a force in the direction away from the test module 110 on the crimping module 120, which is beneficial to the separation between the crimping module 120 and the test module 110. And the plurality of first elastic members 123 are arranged at intervals along the circumferential direction of the crimping module 120, so that when the plurality of first elastic members 123 elastically reset, the forces applied by the plurality of first elastic members 123 to the crimping module 120 are uniform in magnitude, and can increase the magnitude of the force applied by the plurality of second elastic members 123 to the crimping module 120, further facilitating the separation between the crimping module 120 and the test module 110.
[0052] Among them, in this embodiment, the first elastic member 123 is a return spring, and the elastic deformation of the first elastic member 123 is beneficial to the separation between the crimping module 120 and the test module 110. Of course, in other feasible embodiments, the first elastic member 123 can also be an elastic sheet or other elements that can deform under force. The specific element type of the first elastic member 123 is not limited in this application.
[0053] In one embodiment, refer to Figure 1 And Figure 5As shown, the crimping module 120 further includes a plurality of guide posts 124. The plurality of guide posts 124 are arranged at intervals along the circumferential direction of the crimping module 120. For example, when there are two guide posts 124, the two guide posts 124 are respectively located on opposite sides of the mounting plate 122. For example, when there are four guide posts 124, the four guide posts 124 are respectively located at the four corners of the mounting plate 122. The test module 110 is provided with a plurality of guide holes 113 that cooperate with the guide posts 124. When the crimping module 120 moves toward the direction close to the test module 110, the plurality of guide posts 124 are correspondingly inserted into the plurality of guide holes 113 to limit the movement path of the crimping module 120, thereby ensuring the position matching accuracy between the crimping module 120 and the test module 110, improving the crimping position accuracy of the crimping module 120 on the test module 110, and ensuring the crimping test reliability of the crimping module 120 for the test module 110. In addition, the guide column 124 ensures that the crimping module 120 moves along a preset path to prevent the test element in the crimping module 120 from being deformed, bent, or other undesirable phenomena due to matching position errors during the crimping process of the crimping module 120, thereby protecting the crimping module 120.
[0054] In one embodiment, refer to Figure 1 , Figure 4 and Figure 5 As shown, the crimping module 120 further includes a first signal adapter 125 and a probe module 126, and the test module 110 further includes a second signal adapter 114. When the crimping module 120 is connected to the test module 110, the first signal adapter 125 is plugged into the second signal adapter 114, and the probe module 126 is electrically connected to the product to be tested 200, so as to perform an electrical crimping test on the product to be tested 200.
[0055] In the above-mentioned testing mechanism 100, when the crimping module 120 is connected to the testing module 110, the first signal adapter 125 is electrically matched with the second signal adapter 114, the first signal adapter 125 and the second signal adapter 114 form a loop, and the probe module 126 is electrically connected to the product to be tested 200, the probe module 126 and the product to be tested 200 form a loop, which can avoid signal attenuation of the product to be tested 200 due to multiple transfers during the crimping test process, thereby improving the signal testing accuracy and reliability of the product to be tested 200.
[0056] Further, see Figure 1 , Figure 4 and Figure 5As shown, the test mechanism 100 further includes an adapter board 150. The adapter board 150 is disposed on the crimping module 120 or the test module 110 by means of screwing, welding, etc. The adapter board 150 is communicatively connected to the first signal adapter 125 and / or the second signal adapter 114. The adapter board 150 is used to export the test signals of the first signal adapter 125 and the second signal adapter 114. That is to say, the adapter board 150 can export the test signals of the product under test 200 and feedback the test signals of the product under test 200 to the test terminal to visually feedback the test results of the product under test 200.
[0057] In one embodiment, refer to Figure 1 、 Figure 4 and Figure 5 As shown, the test module 110 further includes a test socket 115 and at least one clamping member 116. The test socket 115 is provided with a bearing position 112. For example, the bearing position 112 is a chamber structure opened in the test socket 115, and the bearing position 112 is integrally formed on the test socket 115 by means of injection molding, extrusion, etc. to simplify the forming process of opening the bearing position 112 on the test socket 115. The clamping member 116 is slidably disposed on the test socket 115, and the clamping member 116 is used to clamp and fix the product under test 200 in the bearing position 112. Since during the crimping test operation for products under test 200 with different specifications and sizes, the bearing position 112 may not match the product under test 200. At this time, by sliding the clamping member 116 on the test socket 115, the clamping member 116 can abut against the side wall of the product under test 200 to clamp and fix the product under test 200 in the bearing position 112. Without replacing the test mechanism 100 suitable for the product under test 200, the crimping test can be performed on products under test 200 with different specifications, expanding the applicability of the product under test 200 and reducing the crimping test cost of the product under test 200.
[0058] For example, in this embodiment, refer to Figure 4 As shown, there are two clamping members 116, and the two clamping members 116 are respectively disposed on two adjacent sides of the bearing position 112, further improving the clamping reliability of the clamping member 116 for the product under test 200.
[0059] Exemplarily, refer to Figure 1 、 Figure 4 and Figure 5As shown, in this embodiment, the first signal adapter 125 and the probe module 126 are both disposed on the mounting plate 122, and the signal probes in the first signal adapter 125 and the probe module 126 extend in a direction perpendicular to the connection plane of the mounting plate 122. The second signal adapter 114 is disposed on the test socket 115, and the signal probes in the second signal adapter 114 extend in a direction perpendicular to the connection plane of the test socket 115. Thus, when a crimping test needs to be performed on the product under test 200, a vertical force can be applied to the mounting plate 122 so that the first signal adapter 125 is vertically inserted into the second signal adapter 114, and the probe module 126 vertically abuts against the surface of the product under test 200, that is, the crimping module 120 is vertically connected to the test module 110, avoiding bending, deformation and other adverse phenomena caused by the signal probes in the first signal adapter 125, the probe module 126 and the second signal adapter 114 colliding with other structures, protecting the signal probes in the first signal adapter 125, the probe module 126 and the second signal adapter 114, and improving the test reliability and test life of the test mechanism 100.
[0060] In one embodiment, involved Figure 1 As shown, there are two snap fasteners 121, two card slots 111 and two assistive extraction components 130. The two snap fasteners 121 are disposed on opposite sides of the crimping module 120, and the two card slots 111 are formed on opposite sides of the test module 110. When the snap fasteners 121 are in the first state, the mutual snap-fit of the two snap fasteners 121 and the two card slots 111 can improve the snap connection stability between the crimping module 120 and the test module 110. The two assistive extraction components 130 are disposed on opposite sides of the test module 110. When the snap fasteners 121 are in the first state and the assistive extraction components 130 abut against the crimping module 120, the forces applied by the two assistive extraction components 130 to the crimping module 120 are uniform in magnitude, and the magnitude of the force applied by the assistive extraction components 130 to the crimping module 120 can be increased, further facilitating the separation between the crimping module 120 and the test module 110.
[0061] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.
[0062] The above-described embodiments only represent several implementation manners of the present application. Their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the patent application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.
Claims
1. A testing mechanism, characterized in that: The testing organization includes: A test module, the test module having a card slot and a bearing position for bearing a product to be tested; A crimping module, which is detachably connected to the test module and can move toward or away from the test module, and includes a buckle; and An auxiliary extraction component, wherein the auxiliary extraction component is arranged on the test module; Among them, the buckle has a first state in which it is engaged with the slot and a second state separated from the slot. When the buckle is in the first state, the crimping module is connected to the test module. When the buckle is in the second state, the crimping module is separated from the test module, and the auxiliary extraction component abuts against the crimping module and applies a force to the crimping module in a direction away from the test module.
2. The testing mechanism according to claim 1, characterized in that: The auxiliary extraction assembly includes a base and an abutment plate, wherein the base is arranged on the test module, and the abutment plate is rotatably arranged on the base; When the buckle is in the second state, the buckle applies a force to the abutment plate to make the abutment plate rotate relative to the base, and one end of the abutment plate away from the base abuts against a side of the crimping module close to the test module.
3. The testing mechanism according to claim 2, characterized in that: The abutment plate is protruded with an abutment column. When the buckle is in the second state, the buckle abuts against the abutment column to enable the abutment plate to rotate relative to the base.
4. The testing mechanism according to claim 1, characterized in that: The crimping module also includes a mounting plate; The buckle includes a body and an operating portion and a clamping portion located at opposite ends of the body. The body is rotatably disposed on the mounting plate. When the body rotates relative to the mounting plate, the clamping portion can be clamped in the slot or abut against the pull-out aid component.
5. The testing mechanism according to claim 1, characterized in that: The crimping die set further comprises a plurality of first elastic members, which are arranged at intervals along the circumferential direction of the crimping die set; When the crimping module is connected to the testing module, the plurality of first elastic members are all located between the crimping module and the testing module.
6. The testing mechanism according to claim 1, characterized in that: The crimping module also includes a plurality of guide posts, and the testing module is provided with a plurality of guide holes cooperating with the guide posts.
7. The testing mechanism according to claim 1, characterized in that: The crimping module further includes a first signal adapter and a probe module, and the testing module further includes a second signal adapter; When the crimping module is connected to the testing module, the first signal adapter is plugged into the second signal adapter, and the probe module is electrically connected to the product to be tested.
8. The testing mechanism according to claim 7, characterized in that: The testing mechanism also includes an adapter plate, which is arranged on the crimping module or the testing module. The adapter plate is communicatively connected to the first signal adapter and / or the second signal adapter for deriving signals from the first signal adapter and the second signal adapter.
9. The testing mechanism according to claim 1, characterized in that: The test module also includes a test seat and at least one clamping member. The test seat is provided with the bearing position. The clamping member is slidably disposed on the test seat for clamping and fixing the product to be tested in the bearing position.
10. The testing mechanism according to claim 1, characterized in that: There are two buckles, two slots and two pull-out aid components, and the two buckles are arranged on opposite sides of the crimping module, the two slots are opened on opposite sides of the test module, and the two pull-out aid components are arranged on opposite sides of the test module.