Test structure

Abstract

The utility model relates to the field of integrated circuit testing, in particular to a testing structure which comprises a fixing base and a testing piece set, the fixing base is used for supporting a product, the testing piece set is used for conducting electricity for pins of the product, and the fixing base is provided with a material ejecting mechanism used for providing counter-acting force when the product is pressed downwards. The test piece group comprises a first test piece and a second test piece, the first test piece is located on the adjacent side of the fixed seat, and the second test piece is located on the side, away from the fixed seat, of the first test piece. The test structure has the advantages that the stability and reliability of the test structure in the test process are improved, and bad test results or failures are reduced.

Description

Technical Field

[0001] This application relates to the field of integrated circuit testing, and particularly to a test structure. Background Art

[0002] During the semiconductor chip testing process, the test chip is an important tool for testing the electronic products to be tested. The structure and design of the test chip have an important impact on the accuracy of the test results and the test efficiency. Most of the existing test chips adopt a left - right structure. However, when facing products with narrow pin widths, there are many problems with the left - right structure.

[0003] First of all, the test chip with a left - right structure has a small contact area, which easily leads to an increase in impedance during testing and affects the accuracy of the test results. Secondly, with the increase in the number of uses, the test chip with a left - right structure is prone to problems such as an increase in the spacing and tilting, resulting in poor test contact or even test failure, and this situation needs to be improved. Utility Model Content

[0004] In order to improve the stability and reliability of the test structure during the testing process and reduce the occurrence of bad test results or failures, this application provides a test structure.

[0005] A test structure provided by this application adopts the following technical solutions:

[0006] A test structure includes a fixed seat and a test chip group. The fixed seat is used to support the product, and the test chip group is used to conduct electricity for the pins of the product. A ejector mechanism for providing a reaction force when the product is pressed down is arranged on the fixed seat. The test chip group includes a first test chip and a second test chip. The first test chip is located on the adjacent side of the fixed seat, and the second test chip is located on the side of the first test chip away from the fixed seat.

[0007] By adopting the above - mentioned technical solutions, the fixed seat is used to stabilize the product. The fixed seat is usually designed to be able to accurately place the product to ensure that the pins can be accurately docked with the conductive parts of the test chip group. The test chip group includes a first test chip and a second test chip, and the function of the test chip group is to provide conductive contact for the pins of the product. The ejector mechanism is used to provide a reaction force when the product is pressed to a certain depth, which helps to prevent the test chip and the product from being damaged due to excessive downward pressing during product testing. Compared with the existing left - right structure, the test chip group of this application adopts a front - rear structure design and adds an ejector mechanism to reduce the damage of the test chip and the product, which is beneficial to improving the stability and reliability of the test structure during the testing process and reducing the occurrence of bad test results or failures.

[0008] Optionally, a first contact is provided on one side of the first test piece close to the pin, and a second contact is provided on one side of the second test piece close to the pin. Both the first contact and the second contact are used to abut against the pin. The pin includes a fixing portion, a bending portion, and a contact portion. The first contact can abut against any part of the fixing portion, the bending portion, and the contact portion.

[0009] By adopting the above technical solution, the first test piece and the second test piece are designed in a front-back structure so that the first test piece and the second test piece are connected to the same side of the pin. That is, the contact (the first contact or the second contact) can abut against any part of the fixing portion, the bending portion, and the contact portion of the pin, ensuring that the conduction test can be effectively carried out. The contact design can accurately contact different parts of the pin, ensuring the accuracy and reliability of the conduction test. Through stable contact of the contacts, interference and errors during the test are reduced, and the reliability of the test results is improved.

[0010] Optionally, the second contact abuts against the contact portion of the pin, the first contact abuts against the bending portion of the pin, and the cross-section of the first contact is arc-shaped.

[0011] By adopting the above technical solution, the cross-section of the first contact is arc-shaped, which helps to reduce stress concentration when contacting the bending portion, thereby enhancing the stability and long-term reliability of the contact. The arc-shaped cross-section of the contact can usually distribute pressure more evenly and can better adapt to the curved shape of the pin during the connection process. By designing the first contact as arc-shaped, the stability and accuracy during the test are guaranteed, which helps to reduce the error rate and defective rate in production, and improves production efficiency and product quality.

[0012] Optionally, the second contact abuts against the contact portion of the pin, and an arc groove is provided on the first contact for the bending portion of the pin to be embedded therein.

[0013] By adopting the above technical solution, an arc groove is provided on the first contact. The arc groove is provided to accommodate the bending portion of the pin. The arc groove design can ensure complete fitting of the first contact with the bending portion of the pin, reduce contact resistance and errors in electrical testing, ensure that during the entire test process, the contact between the contact and the pin is stable and lasting, is not easily affected by the external environment or operating conditions, and reduces the test repetition rate and error rate caused by pin contact problems.

[0014] Optionally, the second contact abuts against the contact portion of the pin, and the first contact includes an abutting portion and an avoidance groove. The avoidance groove is provided on one side of the abutting portion close to the bending portion of the pin, and the abutting portion is used to abut against the fixing portion of the pin.

[0015] By adopting the above technical solution, the abutting portion of the first contact is used to abut against the fixing portion of the pin to ensure stable physical contact. The function of the avoidance groove is to accommodate the bent portion of the pin, so that the first contact can avoid the bent portion of the pin when contacting the pin, thereby ensuring the contact area and stability. The abutting portion of the first contact is in close contact with the fixing portion of the pin, ensuring stable electrical connection. The avoidance groove can effectively avoid the bent portion of the pin, preventing damage to the pin or poor electrical connection due to improper contact.

[0016] Optionally, the ejector mechanism includes a moving shaft, a through hole provided in the fixed seat and through which the moving shaft passes, and a driving source for driving the moving shaft to reciprocate. The driving source drives the moving shaft to pass through the through hole and abut against the product.

[0017] By adopting the above technical solution, the moving shaft performs a reciprocating motion under the action of the driving source, passes through the through hole on the fixed seat. During the movement, the movement of the moving shaft causes it to abut against the product, which is used to provide a reaction force when the product is pressed down, helping to prevent damage to the test piece and the product caused by excessive pressing during product testing. The driving source can be driven by a driving source such as an electric motor, a pneumatic device or a hydraulic system.

[0018] Optionally, N guiding bearings are provided in the fixed seat, where N is an integer greater than or equal to 1, and the moving shaft passes through the N guiding bearings.

[0019] By adopting the above technical solution, the number of guiding bearings is preferably 4 to enhance the stability and accuracy of the moving shaft. The moving shaft passes through each guiding bearing, which ensures smooth and precise guiding of the moving shaft during movement and is not prone to deviation or swing.

[0020] Optionally, positioning blocks are provided around the fixed seat, and the positioning blocks are used to limit the product.

[0021] By adopting the above technical solution, the positioning blocks ensure the position and positioning of the product in the ejector mechanism. The product can be accurately positioned and fixed in the fixed seat, preventing the product from moving inside the fixed seat when the ejector mechanism is started. By providing positioning blocks around the fixed seat, the ejector mechanism can provide reliable positioning support during automated production or processing, thereby optimizing the production process, improving efficiency, and ensuring high-quality output of the product.

[0022] In summary, the present application includes at least one of the following beneficial technical effects:

[0023] 1. The fixing base is used to stabilize the product. The fixing base is usually designed to accurately place the product to ensure that the pins can be accurately docked with the conductive parts of the test piece group. The test piece group includes a first test piece and a second test piece. The function of the test piece group is to provide conductive contact for the pins of the product. The ejector mechanism is used to provide a reaction force when the product is pressed to a certain depth, which helps to prevent the test piece and the product from being damaged due to excessive downward pressure during testing. Compared with the prior art using a left-right structure, the test piece group of this application adopts a front-back structure design and adds an ejector mechanism to reduce the damage of the test piece and the product, which is beneficial to improving the stability and reliability of the test structure during the test process and reducing the occurrence of bad test results or failures.

[0024] 2. The cross-section of the first contact is arc-shaped, which helps to reduce the stress concentration when contacting the bending part, thereby enhancing the stability and long-term reliability of the contact. The arc-shaped cross-section of the contact can usually distribute the pressure more evenly and can better adapt to the curve shape of the pin during the connection process. By designing the first contact as arc-shaped, the stability and accuracy during the test process are guaranteed, which helps to reduce the error rate and defective rate in production and improve production efficiency and product quality.

[0025] 3. An arc groove is provided on the first contact. The setting of the arc groove is to accommodate the bending part of the pin. The arc groove design can ensure the complete fitting of the first contact and the bending part of the pin, reduce the contact resistance and errors in electrical testing, and ensure that during the entire test process, the contact between the contact and the pin is stable and lasting, not easily affected by the external environment or operating conditions, and reduce the test repetition rate and error rate caused by pin contact problems.

[0026] 4. The abutting part of the first contact is used to abut against the fixing part of the pin to ensure stable physical contact. The function of the avoidance groove is to accommodate the bending part of the pin, so that the first contact can avoid the bending part of the pin when contacting the pin, thereby ensuring the contact area and stability. The abutting part of the first contact is in close contact with the fixing part of the pin, ensuring a stable electrical connection. The avoidance groove can effectively avoid the bending part of the pin, preventing damage to the pin or causing poor electrical connection due to improper contact. Description of the Drawings

[0027] Figure 1 is a schematic structural diagram of the product in the embodiment of this application;

[0028] Figure 2 is a schematic structural diagram of the fixing base and the positioning block in the embodiment of this application;

[0029] Figure 3 is a schematic structural diagram of the first test piece and the second test piece in the embodiment of this application;

[0030] Figure 4It is a schematic structural diagram of the first contact and the second contact in the embodiments of the present application.

[0031] Description of the reference numerals:

[0032] 1. Fixed seat; 2. Test piece group; 4. First test piece; 5. Second test piece; 6. First contact; 7. Second contact; 8. Arc groove; 9. Abutting portion; 10. Avoidance groove; 11. Moving shaft; 14. Guide bearing; 15. Positioning block; 100. Product; 101. Pin; 102. Fixed portion; 103. Bending portion; 104. Contact portion. Specific embodiments

[0033] To make the above objects, features, and advantages of the present application more obvious and understandable, the following will describe the specific embodiments of the present application in detail with reference to the accompanying drawings. Many specific details are set forth in the following description in order to fully understand the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present application. Therefore, the present application is not limited by the specific embodiments disclosed below.

[0034] In the present application, unless otherwise clearly defined and limited, terms such as "installation", "connection", "connection", "fixation", etc. shall be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two components or the interaction relationship between two components, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0035] In the present application, unless otherwise clearly defined and limited, the first feature being "on" or "under" the second feature can be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over", and "on" the second feature can be that the first feature is directly above or obliquely above the second feature, or simply means that the first feature has a higher horizontal height than the second feature. The first feature being "under", "below", and "beneath" the second feature can be that the first feature is directly below or obliquely below the second feature, or simply means that the first feature has a lower horizontal height than the second feature.

[0036] It should be noted that when an element is referred to as "fixed to" or "disposed on" another element, it can be directly on the other element or there may be an intermediate element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intermediate element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only implementation.

[0037] Referring to Figure 1 , a plurality of pins 101 are symmetrically distributed in the product 100. The pins 101 are formed by bending. The pins 101 include a fixing portion 102, a bending portion 103 and a contact portion 104. The fixing portion 102 is the part where the pin 101 extends from the product 100 itself, and is usually the fixing point welded or connected to the body of the product 100; the bending portion 103 of the pin 101 means that after the pin 101 extends from the fixing portion 102, it may need to be bent according to specific design specifications to meet specific installation or connection requirements. For example, the bending portion 103 can make the pin 101 easier to position and fix when inserted into a slot or welded to a circuit board; the contact portion 104 is the end of the pin 101, which is usually the part used for electrical connection with other circuit boards or devices. The contact portion 104 usually needs to ensure good contact performance to transmit signals or power.

[0038] Embodiment 1

[0039] Referring to Figure 2 , a test structure includes a fixing base 1 and a test chip group 2. The fixing base 1 is used to support the product 100, and the test chip group 2 is used to conduct electricity for the pins 101 of the product 100. A material ejecting mechanism is installed on the fixing base 1. The material ejecting mechanism provides a reaction force after the product 100 is pressed down to a certain depth, which helps to prevent damage to the test chip and the product 100 caused by excessive downward pressing during the test of the product 100.

[0040] Specifically, the ejector mechanism includes a moving shaft 11, a through hole, and a driving source. The through hole is formed in the fixed seat 1 and allows the moving shaft 11 to pass through. The moving shaft 11 performs a reciprocating motion under the action of the driving source. The moving shaft 11 passes through the through hole in the fixed seat 1. During the movement, the movement of the moving shaft 11 causes it to abut against the product 100, which is used to provide a reaction force when the product 100 is pressed downwards, helping to prevent damage to the test piece and the product 100 caused by excessive downward pressing during the product 100 test. The driving source can be driven by a driving source such as an electric motor, a pneumatic device, or a hydraulic system. To ensure the smooth and precise guiding of the moving shaft 11 during the movement, and it is not easy to generate offset or swing, N guiding bearings 14 are installed in the bearing seat. The number of guiding bearings 14 is preferably 4 to enhance the stability and accuracy of the moving shaft 11. The moving shaft 11 passes through each guiding bearing 14 to ensure that the up and down movement of the moving shaft 11 is more precise.

[0041] To enable the ejector mechanism to provide reliable positioning support for the product 100 during operation, positioning blocks 15 are provided around the fixed seat 1. The positioning blocks 15 ensure the position and positioning of the product 100 in the fixed seat 1. The product 100 can be accurately positioned and fixed in the fixed seat 1, preventing the product 100 from moving inside the fixed seat 1 when the ejector mechanism is started, and ensuring the high-quality output of the product 100.

[0042] The test piece group 2 includes a first test piece 4 and a second test piece 5. The first test piece 4 is located on the adjacent side of the fixed seat 1, and the second test piece 5 is located on the side of the first test piece 4 away from the fixed seat 1. A first contact 6 is provided on the side of the first test piece 4 close to the pin 101, and a second contact 7 is provided on the side of the second test piece 5 close to the pin 101. Both the first contact 6 and the second contact 7 are used to abut against the pin 101. The first contact 6 can abut against any part of the fixed part 102, the bent part 103, and the contact part 104 of the pin 101 to ensure effective conduction testing. Through stable contact of the contacts, interference and errors during the testing process are reduced, and the reliability of the test results is improved. Specifically, the second contact 7 abuts against the contact part 104 of the pin 101, and the first contact 6 abuts against the bent part 103 of the pin 101. The cross-section of the first contact 6 is arc-shaped, which helps to reduce stress concentration when contacting the bent part 103, thereby enhancing the stability and long-term reliability of the contact. The arc-shaped cross-section of the contact can usually distribute the pressure more evenly and can better adapt to the curved shape of the pin 101 during the connection process.

[0043] Embodiment 2

[0044] As Figure 3As shown in the figure, the difference between Embodiment 2 and Embodiment 1 lies in the inconsistent structure of the first contact 6. An arc groove 8 is provided on the first contact 6. The design of the arc groove 8 is to accommodate the bent portion 103 of the pin 101. The design of the arc groove 8 can ensure the complete fitting of the first contact 6 and the bent portion 103 of the pin 101, reduce the contact resistance and errors in electrical testing, ensure that during the entire testing process, the contact between the contact and the pin 101 is stable and lasting, is not easily affected by the external environment or operating conditions, and reduces the test repetition rate and error rate caused by problems with the contact of the pin 101.

[0045] Embodiment 3

[0046] As Figure 4 shown in the figure, the difference between Embodiment 3 and Embodiment 1 lies in the inconsistent structure of the first contact 6. The difference between Embodiment 3 and Embodiment 2 lies in the inconsistent structure of the first contact 6. The first contact 6 includes an abutting portion 9 and an avoidance groove 10. The abutting portion 9 of the first contact 6 is used to abut against the fixed portion 102 of the pin 101 to ensure stable physical contact. The function of the avoidance groove 10 is to accommodate the bent portion 103 of the pin 101, so that when the first contact 6 contacts the pin 101, it can avoid the bent portion 103 of the pin 101, thereby ensuring the contact area and stability. The abutting portion 9 of the first contact 6 is in close contact with the fixed portion 102 of the pin 101, ensuring a stable electrical connection. The avoidance groove 10 can effectively avoid the bent portion 103 of the pin 101, preventing damage to the pin 101 or causing poor electrical connection due to improper contact.

[0047] The implementation principle of a test structure in an embodiment of the present application is as follows: The fixing seat 1 is used to stabilize the product 100. The fixing seat 1 is usually designed to accurately place the product 100 to ensure that the pin 101 can be accurately docked with the conductive part of the test piece group 2. The test piece group 2 includes a first test piece 4 and a second test piece 5. The function of the test piece group 2 is to provide conductive contact for the pin 101 of the product 100. The ejector mechanism is used to provide a reaction force when the product 100 is pressed to a certain depth, which helps to prevent damage to the test piece and the product 100 caused by excessive downward pressing during the test of the product 100. The first test piece 4 and the second test piece 5 in the test piece group 2 adopt a front-back structure. Compared with the prior art that adopts a left-right structure, the test piece group 2 of the present application adopts a front-back structure design and adds an ejector mechanism to reduce the situation where the test piece and the product 100 are damaged, which is beneficial to improving the stability and reliability of the test structure during the test process and reducing the occurrence of poor test results or failures.

[0048] The above are all preferred embodiments of the present application. The protection scope of the present application is not limited accordingly. Therefore, all equivalent changes made according to the structure, shape, and principle of the present application should be covered within the protection scope of the present application.

Claims

1. A test structure, characterized in that: The invention comprises a fixing seat (1) and a test piece group (2), wherein the fixing seat (1) is used to support a product, and the test piece group (2) is used to conduct electricity for the pins of the product. The fixing seat (1) is provided with a material-lifting mechanism for providing a reaction force when the product is pressed down, and the test piece group (2) comprises a first test piece (4) and a second test piece (5), wherein the first test piece (4) is located on a side adjacent to the fixing seat (1), and the second test piece (5) is located on a side of the first test piece (4) away from the fixing seat (1).

2. A test structure according to claim 1, characterized in that: The first test piece (4) is provided with a first contact (6) on the side close to the pin, and the second test piece (5) is provided with a second contact (7) on the side close to the pin. The first contact (6) and the second contact (7) are both used to abut against the pin. The pin comprises a fixed portion, a bent portion and a contact portion. The first contact (6) can abut against any part of the fixed portion, the bent portion and the contact portion.

3. A test structure according to claim 2, characterized in that: The second contact (7) abuts against the contact portion of the pin, the first contact (6) abuts against the bent portion of the pin, and the cross section of the first contact (6) is in the shape of an arc.

4. A test structure according to claim 2, characterized in that: The second contact (7) abuts against the contact portion of the pin, and the first contact (6) is provided with an arc groove (8), wherein the bent portion of the pin is embedded in the arc groove (8).

5. A test structure according to claim 2, characterized in that: The second contact (7) abuts against the contact portion of the pin, the first contact (6) comprises an abutting portion (9) and an avoidance groove (10), the avoidance groove (10) is arranged on the side of the abutting portion (9) close to the bending portion of the pin, and the abutting portion (9) is used to abut against the fixing portion of the pin.

6. A test structure according to claim 1, characterized in that: The ejecting mechanism comprises a movable shaft (11), a through hole provided on the fixed seat (1) and through which the movable shaft (11) passes, and a driving source for driving the movable shaft (11) to reciprocate, wherein the driving source drives the movable shaft (11) to pass through the through hole and abut against the product.

7. A test structure according to claim 6, characterized in that: N guide bearings (14) are arranged in the fixed seat (1), wherein N is an integer greater than or equal to 1, and the movable shaft (11) passes through the N guide bearings (14).

8. A test structure according to claim 1, characterized in that: Positioning blocks (15) are arranged around the fixing seat (1), and the positioning blocks (15) are used to limit the position of the product.

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