Visual inspection device for surface defects of electronic component

Abstract

The utility model discloses a visual inspection device for surface defects of an electronic component, which belongs to the technical field of visual inspection and comprises a bearing platform, a detection platform and a detection platform, the image acquisition device is used for acquiring an image of the surface defect of the diode element; the bearing table is provided with a roller shaft assembly, and the roller shaft assembly comprises a driving roller shaft and a driven roller shaft; a plastic package body of the diode element is arranged between the driving roll shaft and the driven roll shaft and is in contact with the roll surfaces of the driving roll shaft and the driven roll shaft; the driving roll shaft rotates to drive the plastic package body to rotate around the own axial direction; pins on the two sides of the plastic package body extend out of the roller surface; the bearing table is further provided with a radial limiting assembly and an axial limiting assembly, the radial limiting assembly limits radial movement of the pins, and the axial limiting assembly limits axial movement of the pins. According to the utility model, the position deviation of the diode element during rotation can be avoided, and the accuracy of a detection result is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of visual detection, in particular to a visual detection device for surface defects of electronic components. Background Art

[0002] At present, many components use machine vision to detect surface defects, thereby improving detection efficiency and saving labor. However, existing visual inspection devices can usually only inspect one side of the component at a time, which requires turning over for inspection after each inspection. However, for cylindrical components such as diodes, the pin section of the diode product is cylindrical, and the plastic package end is approximately spherical. In addition, the external dimensions of different products vary. Generally, one machine needs to realize the inspection of a series of products, so the placement position of the active shaft and driven shaft products cannot be made into a groove shape that matches the product size.

[0003] In the prior art, a Chinese patent document with publication number CN216926610U discloses a component defect detection device based on computer vision, including a vibrating feeder, wherein a first roller and a second roller are installed at the end of the vibrating feeder; at least one of the first roller and the second roller is a threaded roller; the first roller and the second roller are both connected to a first transmission wheel, the first transmission wheel is connected to a second transmission wheel through a transmission belt, the second transmission wheel is connected to a rotating device, the first roller and the second roller are parallel to each other, and a camera is installed on the upper part.

[0004] As can be seen from the above, the prior art uses the first roller and the second roller to support products such as diodes. However, in addition to the plastic package, the diode also includes pins, which are not regular cylindrical structures. Therefore, when the diode rotates with the first roller and the second roller, if the pins are lifted up, the position of the diode will be shifted, affecting the accuracy of the visual inspection results. Utility Model Content

[0005] The purpose of the utility model is to provide a visual inspection device for electronic component surface defects, so as to solve the problem that in the prior art, the component defect inspection device uses a roller bearing to support a diode product. If the pin of the diode is lifted up when the diode rotates with the roller, the position of the diode will be shifted, thus affecting the accuracy of the visual inspection result.

[0006] To achieve the above object, the present utility model provides a visual inspection device for surface defects of electronic components, including a carrying platform for carrying diode components; an image acquisition device for acquiring images of the surface defects of the diode components; the carrying platform is provided with a roller shaft assembly, and the roller shaft assembly includes a driving roller shaft and a driven roller shaft; the plastic package of the diode component is arranged between the driving roller shaft and the driven roller shaft and is in contact with the roller surfaces of both, and the driving roller shaft rotates to drive the plastic package to rotate around its own axis; the pins on both sides of the plastic package extend beyond the roller surface; the carrying platform is further provided with a radial limiting assembly and an axial limiting assembly, the radial limiting assembly restricts the radial movement of the pins, and the axial limiting assembly restricts the axial movement of the pins.

[0007] Further, the radial limiting assembly includes an upper limiting member and a lower limiting member, and the upper limiting member and the lower limiting member are respectively located on opposite sides of the pin and are in contact with the pin.

[0008] Further, the upper limiting member includes an upper limiting arm and upper limiting claws connected to both ends of the upper limiting arm, and the upper limiting arm is provided with a through hole parallel to the axial direction of the pin; the carrying platform is provided with a rotating shaft, and the upper limiting member is rotationally connected to the rotating shaft through the through hole; the upper limiting member rotates around the rotating shaft to separate or contact the upper limiting claws from the pin.

[0009] Further, the contact surface between the upper limiting claw and the pin is provided with a notch structure, and the notch structure buckles on the pin when the upper limiting claw contacts the pin.

[0010] Further, the lower limiting member includes a lower limiting arm and two lower limiting claws connected to the lower limiting arm, and the two lower limiting claws are respectively located on both sides of the plastic package, and the ends of the lower limiting claws abut against the pins.

[0011] Further, the axial limiting assembly includes a first axial limiting block and a second axial limiting block, and the first axial limiting block and the second axial limiting block respectively abut against the ends of the pins on both sides.

[0012] Further, a driving pulley is arranged at the driving end of the driving roller shaft, and the driving pulley is connected to a driving mechanism through a first transmission belt; driven pulleys are respectively arranged at the driven ends of the driving roller shaft and the driven roller shaft, and the first driven pulley and the second driven pulley are connected through a second transmission belt.

[0013] Further, the second transmission belt is arranged around a tensioning pulley, and the tensioning pulley is connected to an adjusting bolt through a tensioning nut, and the adjusting bolt is rotated to tension the second transmission belt by the tensioning pulley.

[0014] Further, it further includes a machine platform, and the carrier is disposed on the surface of the machine platform; an installation plate is longitudinally disposed on the surface of the machine platform, and the image acquisition device is mounted on the installation plate; a light source device is disposed between the image acquisition device and the carrier, and the light source device illuminates the diode element at the carrier.

[0015] Further, the light source device is of an annular structure, and the image acquisition device acquires the surface image of the diode element through the hole in the middle of the annular structure.

[0016] Adopting the technical solution provided by the present utility model, compared with the existing well-known technologies, it has the following beneficial effects:

[0017] For the visual inspection device for surface defects of an electronic component of the present utility model, the rotation of the roller shaft assembly drives the rotation of the diode element, so that the image acquisition device can acquire the defect conditions at various circumferential positions on the surface of the diode element. The radial limit assembly and the axial limit assembly can limit the radial movement and axial movement of the pin, avoiding the position deviation of the diode element during rotation and affecting the accuracy of the visual inspection result. Moreover, the radial limit assembly and the axial limit assembly can overcome the drawback of the pin warping.

[0018] Obviously, the elements or features described in the above single embodiment can be used alone or in combination in other embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In the drawings, the dimensions and ratios do not represent the dimensions and ratios of the actual product. The drawings are merely illustrative and, for clarity, some non-essential elements or features are omitted.

[0020] Figure 1 is a schematic structural diagram of an embodiment of the present utility model;

[0021] Figure 2 is a schematic structural diagram of the carrier in an embodiment of the present utility model;

[0022] Figure 3 is a schematic structural diagram of the radial limit assembly and the axial limit assembly in an embodiment of the present utility model;

[0023] Figure 4 is a schematic structural diagram of the radial limit assembly in an embodiment of the present utility model;

[0024] Figure 5 is a schematic structural diagram of the roller shaft assembly carrying the diode element in an embodiment of the present utility model;

[0025] Figure 6 is a schematic transmission structural diagram of the roller shaft assembly in an embodiment of the present utility model;

[0026] Figure 7It is a schematic diagram of the assembly structure of the tension pulley in the embodiment of the present utility model.

[0027] Description of the reference numerals

[0028] 100, machine platform; 200, mounting plate; 300, image acquisition device; 400, light source device; 500, carrier table; 510, driving roller shaft; 511, first shaft portion; 512, first roller portion; 513, first driven pulley; 514, driving pulley; 520, driven roller shaft; 521, second shaft portion; 522, second roller portion; 523, second driven pulley; 530, upper limit member; 531, upper limit claw; 532, through hole; 533, upper limit arm; 534, notch structure; 540, lower limit member; 541, lower limit claw; 542, lower limit arm; 550, rotating shaft; 560, first axial limit block; 570, second axial limit block; 580, tension pulley; 581, adjusting bolt; 590, baffle; 600, diode element; 610, plastic package; 620, pin; 700, driving mechanism; 710, first transmission belt; 720, second transmission belt. Detailed implementation manners

[0029] Next, the present utility model will be described in detail with reference to the accompanying drawings. What is described here is only the preferred implementation manner of the present utility model. Those skilled in the art can think of other ways to implement the present utility model on the basis of the preferred implementation manner, and other ways also fall within the scope of the present utility model.

[0030] Embodiment

[0031] Refer to Figures 1-7, this embodiment provides a visual inspection device for surface defects of electronic components, including a carrier table 500 for carrying diode components 600; an image acquisition device 300 for acquiring images of surface defects of the diode components 600; the carrier table 500 is provided with a roller assembly, and the roller assembly includes a driving roller 510 and a driven roller 520; the plastic package 610 of the diode component 600 is arranged between the driving roller 510 and the driven roller 520 and contacts the roller surfaces of both, and the rotation of the driving roller 510 drives the plastic package 610 to rotate around its own axis; the pins 620 on both sides of the plastic package 610 extend beyond the roller surface. The rotation of the roller assembly drives the diode component 600 to rotate so that the image acquisition device 300 can acquire the defect conditions at various positions in the circumferential direction of the surface of the diode component 600. The carrier table 500 is also provided with a radial limiting component and an axial limiting component. The radial limiting component restricts the radial movement of the pins 620, and the axial limiting component restricts the axial movement of the pins 620. The radial limiting component and the axial limiting component can restrict the radial movement and axial movement of the pins 620, avoiding the position deviation of the diode component 600 during rotation and affecting the accuracy of the visual inspection result. Moreover, the radial limiting component and the axial limiting component can overcome the drawback of the pins 620 warping up.

[0032] It can be understood that the structures of the driving roller 510 and the driven roller 520 are common mechanical structures. As Figure 5 shown, the driving roller 510 includes a first shaft portion 511 and a first roller portion 512. The first shaft portion 511 and the first roller portion 512 are coaxially arranged, and the rotation of the first shaft portion 511 drives the first roller portion 512 to rotate synchronously. Similarly, the driven roller 520 includes a second shaft portion 521 and a second roller portion 522, and the structure is the same as that of the driving roller 510.

[0033] Specifically, in some embodiments of the present application, as Figure 2 , Figure 3 and Figure 4 shown, the radial limiting component includes an upper limiting member 530 and a lower limiting member 540. The upper limiting member 530 and the lower limiting member 540 are respectively located on opposite sides of the pin 620 and contact the pin 620. The upper limiting member 530 and the lower limiting member 540 can clamp the pin 620 to prevent the pin 620 from moving radially.

[0034] Further, the upper limit member 530 includes an upper limit arm 533 and upper limit claws 531 connected to both ends of the upper limit arm 533. The upper limit arm 533 is provided with a through hole 532 parallel to the axial direction of the pin 620. The carrier 500 is provided with a rotating shaft 550, and the upper limit member 530 is rotatably connected to the rotating shaft 550 through the through hole 532. The upper limit member 530 rotates around the rotating shaft 550 to separate or contact the upper limit claws 531 from the pin 620. The upper limit member 530 can be easily taken and placed by flipping the diode element 600, which is beneficial to the continuous progress of the detection work.

[0035] In addition, as Figure 4 shown, the contact surface between the upper limit claw 531 and the pin 620 is provided with a notch structure 534, and the notch structure 534 is buckled on the pin 620 when the upper limit claw 531 contacts the pin 620. The notch structure 534 presents an inverted V-shaped structure, which just buckles on the pin 620, can reduce the friction with the pin 620, and is convenient for the rotation of the diode element 600.

[0036] In some embodiments of the present application, as Figure 4 shown, the lower limit member 540 includes a lower limit arm 542 and two lower limit claws 541 connected to the lower limit arm 542. The two lower limit claws 541 are respectively located on both sides of the plastic package 610, and the ends of the lower limit claws 541 abut against the pins 620. The ends of the lower limit claws 541 are processed with an arc structure to reduce the friction when contacting the pins 620, which is beneficial to the rotation of the diode element 600. It should be noted that the distance between the two lower limit claws 541 is less than the distance between the two upper limit claws 531. The lower limit claws 541 can form a limiting structure with cross support with the upper limit claws 531 to reduce the influence on the rotation of the pins 620. The lower limit member 540 can adjust its position along the axial direction of the diode element 600, and can reasonably adjust the support position of the pins 620.

[0037] In some embodiments of the present application, as Figure 3 shown, the axial limiting assembly includes a first axial limiting block 560 and a second axial limiting block 570. The first axial limiting block 560 and the second axial limiting block 570 respectively abut against the ends of the pins 620 on both sides. The first axial limiting block 560 and the second axial limiting block 570 can block the axial two ends of the diode element 600 to prevent the diode element 600 from moving axially. Both the first axial limiting block 560 and the second axial limiting block 570 can adjust their positions along the axial direction of the diode element 600, so as to limit the diode element 600 with pins 620 of different lengths.

[0038] In some embodiments of the present application, as Figure 6As shown, a driving pulley 514 is provided at the driving end of the driving roller shaft 510. The driving pulley 514 is connected to the driving mechanism 700 through a first transmission belt 710. First driven pulleys 513 and second driven pulleys 523 are respectively provided at the driven ends of the driving roller shaft 510 and the driven roller shaft 520. The first driven pulley 513 and the second driven pulley 523 are connected through a second transmission belt 720. The driving mechanism 700 uses a stepper motor. The rotation of the stepper motor drives the driving pulley 514 to rotate through the first transmission belt 710, thereby driving the driving roller shaft 510 to rotate. Under the action of the second transmission belt 720, the first driven pulley 513 and the second driven pulley 523, the driven roller shaft 520 rotates in the same direction and synchronously with the driving roller shaft 510. The driving roller shaft 510 and the driven roller shaft 520 are processed from POM material and have a certain surface roughness, so as to drive the diode element 600 to complete a 360-degree rotation.

[0039] Furthermore, as Figure 7 shown, the second transmission belt 720 is arranged to bypass a tension pulley 580. The tension pulley 580, the first driven pulley 513 and the second driven pulley 523 are arranged in a triangle, and the three of them tension the second transmission belt 720. The tension pulley 580 is connected to an adjusting bolt 581 through a tension nut. When the second transmission belt 720 becomes loose after the equipment has been used for a long time, the adjusting bolt 581 is rotated to make the tension pulley 580 tension the second transmission belt 720, extending the service life of the equipment. It can be understood that when the adjusting bolt 581 is rotated in the opposite direction, the tension pulley 580 will move in the opposite direction, causing the second transmission belt 720 to become loose, which is beneficial to replacing the second transmission belt 720. It should be noted that both the first transmission belt 710 and the second transmission belt 720 are belt structures.

[0040] It should be noted that, in order to protect the transmission structures such as the driving pulley 514, the first transmission belt 710, the second transmission belt 720, the tension pulley 580, the first driven pulley 513 and the second driven pulley 523, as Figure 2 shown, a baffle 590 is provided at the position of the bearing table 500 corresponding to the transmission structure. The baffle 590 covers a part of the above-mentioned transmission structure to prevent the transmission structure from coming into direct contact with people and protecting the safety of operators.

[0041] In some embodiments of the present application, as Figure 1As shown in the figure, it further includes a machine platform 100, and a carrier platform 500 is arranged on the surface of the machine platform 100. An installation plate 200 is longitudinally arranged on the surface of the machine platform 100, and an image acquisition device 300 is installed on the installation plate 200; a light source device 400 is arranged between the image acquisition device 300 and the carrier platform 500, and the light source device 400 illuminates the diode element 600 at the carrier platform 500. The image acquisition device 300 is mainly a CCD camera, and the light source device 400 can provide a good shooting environment for the CCD camera. The lens of the CCD camera is arranged perpendicular to the surface of the diode element 600, and the light source device 400 is of an annular structure. The CCD camera acquires the surface image of the diode element 600 through the hole in the middle of the annular structure. The acquired image is processed by professional software to realize the detection of surface defects and the detection of external dimensions.

[0042] It can be understood that the installation positions of the image acquisition device 300, that is, the CCD camera, and the light source device 400 on the installation plate 200 can be adjusted, so as to adjust the clarity of the captured image.

[0043] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "front", "rear", "left", "right", "upper", "lower", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0044] In the description of the present invention, it should be noted that unless otherwise clearly specified and defined, the terms "installation", "connection", and "coupling" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0045] The protection scope of the present invention is only defined by the claims. Benefiting from the teachings of the present invention, those skilled in the art can easily recognize that alternative structures of the structures disclosed in the present invention can be used as feasible alternative embodiments, and the embodiments disclosed in the present invention can be combined to generate new embodiments, which also fall within the scope of the appended claims.

Claims

1. A visual inspection device for surface defects of electronic components, comprising a carrier table (500) for carrying diode components (600); an image acquisition device (300) for acquiring images of surface defects of the diode components (600); The carrier table (500) is provided with a roller shaft assembly, and the roller shaft assembly includes a driving roller shaft (510) and a driven roller shaft (520); It is characterized in that The plastic package body (610) of the diode component (600) is arranged between the driving roller shaft (510) and the driven roller shaft (520) and contacts the roller surfaces of both. The driving roller shaft (510) rotates to drive the plastic package body (610) to rotate around its own axis; The pin feet (620) on both sides of the plastic package body (610) extend beyond the roller surface; The carrier table (500) is further provided with a radial limiting assembly and an axial limiting assembly. The radial limiting assembly restricts the radial movement of the pin feet (620), and the axial limiting assembly restricts the axial movement of the pin feet (620).

2. The visual inspection device for surface defects of an electronic component according to claim 1, wherein, The radial limiting assembly includes an upper limiting member (530) and a lower limiting member (540), and the upper limiting member (530) and the lower limiting member (540) are respectively located on opposite sides of the pin feet (620) and contact the pin feet (620).

3. An electronic component surface defect vision detection device according to claim 2, characterized in that, The upper limiting member (530) includes an upper limiting arm (533) and upper limiting claws (531) connected to both ends of the upper limiting arm (533). The upper limiting arm (533) is provided with a through hole (532) parallel to the axial direction of the pin feet (620); The carrier table (500) is equipped with a rotating shaft (550), and the upper limiting member (530) is rotatably connected to the rotating shaft (550) through the through hole (532); The upper limiting member (530) rotates around the rotating shaft (550) to separate or contact the upper limiting claws (531) from the pin feet (620).

4. An electronic component surface defect vision detection device according to claim 3, characterized in that, The contact surface between the upper limiting claw (531) and the pin feet (620) is provided with a notch structure (534), and the notch structure (534) is buckled on the pin feet (620) when the upper limiting claw (531) contacts the pin feet (620).

5. An electronic component surface defect vision detection device according to claim 2, characterized in that, The lower limiting member (540) includes a lower limiting arm (542) and two lower limiting claws (541) connected to the lower limiting arm (542). The two lower limiting claws (541) are respectively located on both sides of the plastic package body (610), and the ends of the lower limiting claws (541) abut against the pin feet (620).

6. The visual inspection device for surface defects of an electronic component according to claim 1, characterized in that, The axial limiting assembly includes a first axial limiting block (560) and a second axial limiting block (570), and the first axial limiting block (560) and the second axial limiting block (570) respectively abut against the ends of the pin feet (620) on both sides.

7. The visual inspection device for surface defects of an electronic component according to claim 1, characterized in that, The driving end of the driving roller shaft (510) is provided with a driving pulley (514), and the driving pulley (514) is connected to a driving mechanism (700) through a first transmission belt (710); The driven ends of the driving roller shaft (510) and the driven roller shaft (520) are respectively provided with a first driven pulley (513) and a second driven pulley (523), and the first driven pulley (513) and the second driven pulley (523) are connected through a second transmission belt (720).

8. An electronic component surface defect vision detection device according to claim 7, characterized in that, The second transmission belt (720) is arranged to bypass the tensioning pulley (580). The tensioning pulley (580) is connected to the adjusting bolt (581) through a tensioning nut. Rotating the adjusting bolt (581) causes the tensioning pulley (580) to tension the second transmission belt (720).

9. An electronic component surface defect vision detection device according to claim 1, characterized in that, It further includes a machine platform (100), and the bearing platform (500) is arranged on the surface of the machine platform (100); a mounting plate (200) is longitudinally arranged on the surface of the machine platform (100), and the image acquisition device (300) is mounted on the mounting plate (200); a light source device (400) is arranged between the image acquisition device (300) and the bearing platform (500), and the light source device (400) illuminates the diode element (600) at the bearing platform (500).

10. An electronic component surface defect vision detection device according to claim 9, characterized in that, The light source device (400) is of an annular structure, and the image acquisition device (300) acquires the surface image of the diode element (600) through the hole in the middle of the annular structure.

Images