Probe assembly and detection device

Abstract

The utility model discloses a probe assembly and a detection device, and relates to the field of circuit board detection. The probe assembly comprises a test pin, a spring clamp and a limiting block. The test pin is suitable for detecting a circuit board. The spring clamp comprises an upper elastic arm and a lower elastic arm, and an interval space is formed between the upper elastic arm and the lower elastic arm; the limiting block is detachably connected with the spring clamp, a limiting column is arranged on the side, facing the spring clamp, of the limiting block, and the limiting column is arranged in the interval space so as to abut against and limit the upper elastic arm. The upper elastic arm and the lower elastic arm play an elastic buffering role when the test pin contacts a circuit board, the contact acting force is weakened, the limiting column on the limiting block abuts against and limits the upper elastic arm, the elastic deformation of the upper elastic arm is actively limited and controlled, and the acting force of the elastic reset of the upper elastic arm to drive the test pin to contact the circuit board is reduced. Therefore, contact traces or collision traces of test points are reduced, and the quality and reliability of the circuit board are improved.

Description

Technical Field

[0001] The utility model relates to the field of circuit board detection, in particular to a probe assembly and a detection device. Background Art

[0002] As a carrier for components and signal transmission, the integrity of the signals on a circuit board has an increasingly prominent impact on the electrical performance of a communication system. Before the circuit board is put into use, it is necessary to perform test detection on the circuit board. At present, the circuit board can be tested for signals through flying probe testing. The flying probe testing uses movable independent probes to accurately locate the points to be tested for electrical performance detection according to a pre-set test program. During the test, these probes are controlled by a computer to contact the pads, contacts, vias or component leads on the circuit board point by point according to the designed path and sequence, so as to measure electrical parameters such as resistance, capacitance, voltage, and current between them, thereby determining whether the circuit is unobstructed, short-circuited, open-circuited, and whether the component functions are normal.

[0003] However, since the test probes will quickly contact the circuit board, different degrees of contact marks or impact marks will be generated at the test points of the circuit board, which poses a risk of reducing the quality and reliability of the circuit board. Summary of the Utility Model

[0004] To solve the technical problems raised in the above background art, the utility model provides a probe assembly, including:

[0005] A test needle suitable for detecting a circuit board;

[0006] A spring clip, the spring clip includes an upper elastic arm and a lower elastic arm, there is a spaced space between the upper elastic arm and the lower elastic arm, and the mounting side of the test needle is fixed at the joint part of the upper elastic arm and the lower elastic arm;

[0007] And a limit block, the limit block is detachably connected to the spring clip, a limit post is provided on the side of the limit block facing the spring clip, and the limit post is arranged in the spaced space to abut and limit the upper elastic arm.

[0008] As a preferred technical solution, the spring clip further includes a mounting part, and the mounting part and the limit block are detachably configured.

[0009] As a preferred technical solution, the upper elastic arm is provided with a first load reduction part and a third load reduction part arranged at intervals, the first load reduction part is adjacent to the joint part, and the third load reduction part is adjacent to the mounting part;

[0010] The lower elastic arm is provided with a second load reduction part and a fourth load reduction part arranged at intervals, the second load reduction part is adjacent to the joint part, and the fourth load reduction part is adjacent to the mounting part.

[0011] As a preferred technical solution, the second load reduction part and the first load reduction part are arranged in the height direction, the fourth load reduction part and the third load reduction part are arranged with a dislocation in the height direction, and the linear distance from the second load reduction part to the first load reduction part is less than the linear distance from the third load reduction part to the fourth load reduction part.

[0012] As a preferred technical solution, an installation channel is provided inside the spring clip. The test probe includes a needle body and a tip part. The needle body is assembled in the installation channel, and the tip part is adapted to contact the circuit board; the installation channel is constructed to be inclined downward on the joint part so that the test probe is inclined towards the circuit board.

[0013] As a preferred technical solution, the installation channel has a conductive connection area, a middle section installation area, and a through area; the conductive connection area is arranged at one end of the needle body away from the tip part, the middle section installation area is connected in the extension path of the installation channel, and a part of the needle body close to the tip part penetrates through the through area.

[0014] As a preferred technical solution, a left stepped part and a right stepped part are constructed on any elastic arm. In the direction from the installation part to the joint part, the left stepped part and the right stepped part are arranged in sequence, and the thickness of the installation part is greater than the thickness of the joint part; and / or

[0015] A weight reduction part is provided on any elastic arm, and a plurality of the weight reduction parts are arranged at intervals along the extension direction of any elastic arm; and / or

[0016] A relief part is provided on the side of the joint part away from the first elastic arm. The relief part has a relief wall surface arranged obliquely, and the relief wall surface extends parallel to the length direction of the test probe. The area of the relief wall surface decreases along the inclination direction from its upper side to its lower side.

[0017] The present utility model also provides a detection device, including the above-mentioned probe assembly.

[0018] As a preferred technical solution, the detection device further includes an installation component and a driving component. The installation end of the driving component is fixedly connected to the installation component, the probe assembly is connected to the driving end of the driving component, and the driving component is adapted to drive the test probe in the probe assembly to approach and contact or move away from the circuit board.

[0019] As a preferred technical solution, the driving assembly includes a driving member, a pulley member, a sliding member, and an adapter block. The pulley member is disposed at the driving end of the driving member. The sliding member is fixedly connected to the pulley member. One side of the adapter block is fixedly connected to the sliding member, and one side of the adapter block is fixedly connected to the probe assembly; and / or

[0020] The detection device further includes a vision assembly. The vision assembly includes a lens acquisition part and a light source holder that are spaced apart. The lens acquisition part and the light source holder are respectively detachably connected to the mounting assembly.

[0021] The technical solution provided by the present invention has the following advantages:

[0022] The probe assembly provided by the present invention includes a test needle, a spring clip, and a limit block. The test needle is adapted to detect a circuit board. The spring clip includes an upper elastic arm and a lower elastic arm. There is a spaced space between the upper elastic arm and the lower elastic arm. The mounting side of the test needle is fixed to the joint part of the upper elastic arm and the lower elastic arm. The limit block is detachably connected to the spring clip. A limit post is provided on the side of the limit block facing the spring clip, and the limit post is disposed in the spaced space to abut and limit the upper elastic arm.

[0023] For the probe assembly with this structure, when the test needle contacts the circuit board through the upper elastic arm and the lower elastic arm, an elastic buffering effect is exerted to weaken the contact force. The limit post on the limit block abuts and limits the upper elastic arm to actively limit and control the elastic deformation of the upper elastic arm, reducing the force of the upper elastic arm's elastic reset driving the test needle to contact the circuit board, thereby reducing the contact marks or impact marks at the test points and improving the quality and reliability of the circuit board. Description of the Drawings

[0024] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the following drawings are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0025] Figure 1 It is a schematic structural diagram of the probe assembly provided by the present invention;

[0026] Figure 2 For Figure 1 The partial enlarged view at A in

[0027] Figure 3 It is a schematic structural diagram of the spring clip in the probe assembly provided by the present invention;

[0028] Figure 4Schematic diagram of the connection between the test pin and the spring clip in the probe assembly provided by the present utility model;

[0029] Figure 5 Schematic diagram of the structure of the test pin and the spring clip in the probe assembly provided by the present utility model;

[0030] Figure 6 Schematic diagram of the structure of the driving assembly in the detection device provided by the present utility model;

[0031] Figure 7 Schematic diagram of the side view of the structure of the driving assembly in the detection device provided by the present utility model;

[0032] Figure 8 Schematic diagram of the structure of the detection device provided by the present utility model;

[0033] Description of the reference numerals:

[0034] 11 - Side plate; 12 - Fixed bracket; 13 - Driving fixed plate; 14 - Driving protection cover; 15 - Adapter protection cover;

[0035] 21 - Driving member; 22 - Driving wheel; 23 - Transmission belt; 24 - Driven wheel; 25 - Sliding member; 26 - Moving seat; 27 - Linear guide; 28 - Stop block; 29 - Adapter block;

[0036] 31 - Test pin; 311 - Pin body; 312 - Tip portion;

[0037] 32 - Spring clip; 32a - Upper elastic arm; 32b - Lower elastic arm; 32c - Installation part; 32d - Binding part; 32e - Left stepped portion; 32f - Right stepped portion; 321 - Installation channel; 322 - Spacing space; 323 - First load reduction part; 324 - Second load reduction part; 325 - Third load reduction part; 326 - Fourth load reduction part; 327 - Weight reduction part; 328 - Avoidance part; 329 - Connection hole;

[0038] 33 - Limit block; 331 - Limit body; 332 - Limit post;

[0039] 34 - Test circuit board; 35 - Test wire;

[0040] 41 - Lens acquisition part; 42 - Light source holder. Detailed implementation manners

[0041] Next, the technical solutions of the present utility model will be clearly and completely described in conjunction with the accompanying drawings. Obviously, the described embodiments are some, but not all, of the embodiments of the present utility model. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.

[0042] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present utility model. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0043] In the description of the present utility model, it should be noted that unless otherwise clearly specified and defined, the terms "installed", "connected", and "coupled" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0044] In addition, the technical features involved in different embodiments of the present utility model described below can be combined with each other as long as they do not conflict with each other.

[0045] Embodiment

[0046] This embodiment provides a probe assembly. Refer to Figure 1 , the probe assembly includes a test pin 31, a spring clip 32, and a limit block 33. The test pin 31 is adapted to detect a circuit board. The test pin 31 is connected to the spring clip 32, and the limit block 33 and the spring clip 32 are detachably connected.

[0047] Refer to Figure 4 , the test pin 31 includes a pin body 311 and a tip portion 312. The pin body 311 is assembled in the installation channel 321, and the tip portion 312 is adapted to contact the circuit board.

[0048] Refer to Figure 3 , the spring clip 32 includes an upper elastic arm 32a, a lower elastic arm 32b, and an installation portion 32c. Among them, there is an interval space 322 between the upper elastic arm 32a and the lower elastic arm 32b. The installation side of the test pin 31 is fixed to the joint portion 32d of the upper elastic arm 32a and the lower elastic arm 32b; an installation channel 321 is provided inside the spring clip 32, and the installation channel 321 is inclined downward and arranged on the joint portion 32d so that the test pin 31 is inclined towards the circuit board.

[0049] As a preferred embodiment, the installation channel 321 has a conductive connection area, a middle section installation area, and a through area; the conductive connection area is arranged at one end of the needle body 311 away from the tip 312, the middle section installation area is arranged within the extension path of the installation channel 321, and a part of the needle body 311 close to the tip 312 penetrates through the through area.

[0050] In a specific embodiment, the installation channel 321 is arranged as an open channel, so as to facilitate the combined assembly of the test needle 31 and facilitate the implementation of the conductive connection of the test needle 31. Among them, the test needle 31 is conductively connected to the configured test circuit board 34, and the test needle 31 can establish an electrical signal path with the test circuit board 34 by means of conductive adhesive bonding or conductive material welding.

[0051] In this embodiment, referring to Figure 2 , the limiting block 33 includes a limiting body 331 and a limiting column 332. The limiting column 332 is arranged on the side of the limiting block 33 facing the spring clip 32. Among them, the limiting column 332 is arranged in the spaced space 322 to abut against and limit the upper elastic arm 32a. Figure 3 And Figure 4 For example, when the test needle 31 contacts the circuit board downward, when the combined part 32d is subjected to the reaction force of the circuit board on the test needle 31, it drives the right ends of the upper elastic arm 32a and the lower elastic arm 32b to elastically deform upward. A relative displacement occurs between the upper elastic arm 32a and the limiting column 332. When the upper elastic arm 32a elastically returns to its original position, the limiting column 332 abuts against the upper elastic arm 32a to control the return stroke of the upper elastic arm 32a. Correspondingly, the return stroke of the lower elastic arm 32b is also restricted by the limiting column 332, thereby reducing the contact force of the test needle 31 on the circuit board.

[0052] In this embodiment, the upper elastic arm 32a and the lower elastic arm 32b are spaced from the lateral end face of the limiting block 33, so that the upper elastic arm 32a and the lower elastic arm 32b can elastically deform freely without being affected by the lateral end face of the limiting block 33.

[0053] The installation part 32c and the limiting block 33 are detachably configured. In a specific embodiment, referring to Figure 4 , at least two connection holes 329 are provided on the installation part 32c. The connection holes 329 are arranged as threaded holes or clamping holes, and corresponding threaded engagement holes or clamping protrusions with corresponding quantities and corresponding assembly positions can be arranged on the side face of the limiting block 33 facing the installation part 32c.

[0054] For the upper elastic arm 32a and the lower elastic arm 32b, both play an elastic buffering and protecting function on the contact between the test needle 31 and the circuit board. A plurality of load-reducing parts are arranged on the spring clip 32. The load-reducing parts, as the weak points of the structural strength on the spring clip 32, can preferentially undergo elastic deformation.

[0055] In some embodiments, referring to Figure 4 , a first load reduction portion 323 and a third load reduction portion 325 are provided on the upper elastic arm 32a at intervals. The first load reduction portion 323 is arranged adjacent to the joint portion 32d, and the third load reduction portion 325 is arranged adjacent to the mounting portion 32c. A second load reduction portion 324 and a fourth load reduction portion 326 are provided on the lower elastic arm 32b at intervals. The second load reduction portion 324 is arranged adjacent to the joint portion 32d, and the fourth load reduction portion 326 is arranged adjacent to the mounting portion 32c.

[0056] Any one of the load reduction portions is arranged as a sunk groove or a sunk hole structure. In a specific embodiment, any one of the load reduction portions is arranged as an arc-shaped groove, and the arc-shaped grooves are hollowed out and distributed on the outer sides of the upper elastic arm 32a and the lower elastic arm 32b and on the inner wall surface of the spaced space 322. With this arrangement, by the distribution inside and outside, the structure of the elastic arm is optimized, the stiffness is reduced, and the toughness of the elastic arm is improved. Of course, the arc-shaped grooves can be hollowed out and distributed only on the outer sides of the upper elastic arm 32a and the lower elastic arm 32b, or only on the inner wall surface of the spaced space 322 formed by the upper elastic arm 32a and the lower elastic arm 32b.

[0057] As a further embodiment, referring to Figure 3 and Figure 4 , any one of the load reduction portions has two arc-shaped grooves arranged inside and outside the spring clip 32, and the two arc-shaped grooves are symmetrically arranged and not connected. With this arrangement, it is beneficial to maximize the reduction of the stiffness of the elastic arm and enable the elastic arm to obtain the best elastic deformation ability.

[0058] In a specific embodiment, the first load reduction portion 323 is arranged at the connection between the upper elastic arm 32a and the joint portion 32d, the second load reduction portion 324 is arranged at the connection between the lower elastic arm 32b and the joint portion 32d, the third load reduction portion 325 is arranged at the connection between the upper elastic arm 32a and the mounting portion 32c, and the fourth load reduction portion 326 is arranged at the connection between the lower elastic arm 32b and the mounting portion 32c.

[0059] In this embodiment, the upper elastic arm 32a, the lower elastic arm 32b, the mounting portion 32c, and the joint portion 32d can equivalently form a structure approximately similar to a quadrilateral. The four load reduction portions are used as the connection nodes of the quadrilateral structure. The four load reduction portions can preferentially deform, and the distance between the four load reduction portions can be adjusted to change the shape of the quadrilateral structure.

[0060] As a preferred embodiment, referring to Figure 4, the second load reduction part 324 and the first load reduction part 323 are arranged in the height direction, the fourth load reduction part 326 and the third load reduction part 325 are arranged with a dislocation in the height direction, and the straight-line distance from the second load reduction part 324 to the first load reduction part 323 is less than the straight-line distance from the third load reduction part 325 to the fourth load reduction part 326. With this kind of arrangement, the upper elastic arm 32a, the lower elastic arm 32b, the installation part 32c and the joint part 32d can equivalently form a trapezoidal structure that is approximately narrower at the top and wider at the bottom, making the deformation ability of the lower elastic arm 32b better than that of the upper elastic arm 32a. On the one hand, it is beneficial to strengthen the relative combination stability between one end of the needle body 311 far from the tip part 312 and the conductive connection area in the installation channel 321 close to the upper elastic arm 32a; on the other hand, it can relatively reduce the elastic effect of the lower elastic arm 32b on the needle body 311 in the middle-section installation area in the installation channel 321 of the joint part 32d, and weaken the interference of the elastic reset of the lower elastic arm 32b on the needle body 311.

[0061] In some embodiments, referring to Figure 4 , a weight reduction part 327 is provided on any one of the elastic arms, and a plurality of weight reduction parts 327 are arranged at intervals along the extension direction of any one of the elastic arms. The weight reduction part 327 is beneficial to make the upper elastic arm 32a and the lower elastic arm 32b lightweight and strengthen the elastic deformation ability of both. In a specific embodiment, the weight reduction part 327 is set as a through hole, and the number of weight reduction parts 327 on the upper elastic arm 32a is the same as the number of weight reduction parts 327 on the lower elastic arm 32b.

[0062] As a preferred embodiment, referring to Figure 5 , a left stepped part 32e and a right stepped part 32f are constructed on any one of the elastic arms. In the direction from the installation part 32c to the joint part 32d, the left stepped part 32e and the right stepped part 32f are arranged in sequence, and the thickness of the installation part 32c is greater than the thickness of the joint part 32d. Through the setting of the left stepped part 32e and the right stepped part 32f, the upper elastic arm 32a and the lower elastic arm 32b have a lightweight design to reduce the stiffness of the elastic arms and the lower elastic arm 32b and improve the elastic deformation ability of both. In a specific embodiment, the thickness of the spring clip 32 decreases from left to right, the installation part 32c is the thickest, and the joint part 32d is the thinnest. Combining Figure 4 and Figure 5 , taking the lower elastic arm 32b as an example, the left stepped part 32e is arranged on the right side of the fourth load reduction part 326, and the right stepped part 32f is arranged on the left side of the second load reduction part 324; correspondingly, on the upper elastic arm 32a, the left stepped part 32e is arranged on the right side of the third load reduction part 325, and the right stepped part 32f is arranged on the left side of the second load reduction part 324; with this kind of arrangement, the first load reduction part 323 and the second load reduction part 324 close to the test needle 31 have better elastic deformation ability to buffer and weaken the impact effect caused by the test needle 31 contacting the circuit board.

[0063] In some embodiments, referring to Figure 2 and Figure 5 , on the side of the engaging portion 32d away from the upper elastic arm 32a, there is a relief portion 328. The relief portion 328 has a slantingly arranged relief wall surface. The relief wall surface extends parallel to the length direction of the test probe 31, and the area of the relief wall surface decreases from its upper side to its lower side in the slanting direction. With this design, when using double probes or multiple probes to test the same circuit board, there can be test points with a smaller distance between multiple test probes 31, and different test points can be arranged more precisely on the circuit board, which is beneficial to improving the test accuracy and test efficiency.

[0064] For the probe assembly provided in this embodiment, when the test probe 31 contacts the circuit board through the upper elastic arm 32a and the lower elastic arm 32b, it plays an elastic buffering role to weaken the contact force. The limiting post 332 on the limiting block 33 abuts against and limits the upper elastic arm 32a, actively limiting and controlling the elastic deformation of the upper elastic arm 32a, reducing the force with which the upper elastic arm 32a drives the test probe 31 to contact the circuit board during elastic reset, thereby reducing the contact marks or impact marks at the test points and improving the quality and reliability of the circuit board.

[0065] This embodiment also provides a detection device, referring to Figures 6 to 8 . The detection device includes a mounting assembly, a driving assembly, and the above-mentioned probe assembly. Among them, the mounting end of the driving assembly is fixedly connected to the mounting assembly, the probe assembly is connected to the driving end of the driving assembly, and the driving assembly is adapted to drive the test probe 31 in the probe assembly to approach, contact, or move away from the circuit board.

[0066] In some embodiments, referring to Figures 6 to 8 , the driving assembly includes a driving member 21, a pulley assembly, a sliding member, and an adapter block 29. The pulley assembly is arranged at the driving end of the driving member 21. The sliding member is fixedly connected to the pulley assembly. One side of the adapter block 29 is fixedly connected to the sliding member, and one side of the adapter block 29 is fixedly connected to the probe assembly. The driving member 21 is set as a bidirectional driving motor. The pulley assembly includes a driving wheel 22, a transmission belt 23, and a driven wheel 24. The driving wheel 22 is installed on the output shaft of the driving motor. The transmission belt 23 is in transmission connection with the driving wheel 22 and the driven wheel 24, and drives the sliding member to slide up and down. The sliding member includes a sliding piece 25, a moving seat 26, a linear guide rail 27, and a stop block 28. The sliding piece 25 is slidably arranged on the linear guide rail 27. The linear guide rail 27 extends in the height direction. The stop block 28 is arranged in the guiding direction of the linear guide rail 27 for the sliding piece 25 to stop the movement of the sliding piece 25. The sliding piece 25 drives the moving seat 26 and the adapter block 29 to slide synchronously during the sliding stroke.

[0067] In a specific embodiment, the tensioning force configured by the pulley component itself can provide buffer assistance for the contact striker between the test needle 31 and the circuit board, so as to reduce the contact mark or strike mark at the test point.

[0068] See also Figure 8 The mounting assembly includes a side plate 11, a fixed bracket 12, and a driving fixed plate 13, which are detachably connected. The linear guide 27 is mounted on the fixed bracket 12, the driving member 21 is mounted on one side of the driving fixed plate 13, and the driven wheel 24 is rotatably configured on the driving fixed plate 13.

[0069] See also Figure 1 The detection device also includes a test circuit board 34 and a signal adapter board, the signal adapter board is used to communicate with the peripheral control device to conduct the test signal; wherein the test circuit board 34 is conductively connected to the test pin 31, and the test circuit board 34 is conductively connected to the signal adapter board through the test wire 35. The test circuit board 34 is fixed on the adapter block 29 and moves with the driving action of the driving component.

[0070] See also Figure 8 The installation assembly also includes a drive protection cover 14 and a transfer protection cover 15. The drive protection cover 14 is detachably connected to the side plate 11. The drive member 21 is arranged in the drive protection cover 14. The transfer protection cover 15 is detachably connected to the side plate 11. The signal transfer board is arranged in the transfer protection cover 15.

[0071] See also Figure 8 The detection device also includes a visual component, which is used to scan the appearance image information of the circuit board. The visual component includes a lens collection part 41 and a light source frame 42 arranged at intervals, and the lens collection part 41 and the light source frame 42 are respectively detachably connected to the installation component.

[0072] Obviously, the above embodiments are merely examples for the purpose of clear explanation, and are not intended to limit the implementation methods. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived therefrom are still within the scope of protection of the invention of the utility model.

Claims

1. A probe assembly, characterized in that, Comprising: A test pin (31), adapted to detect a circuit board; A spring clip (32), the spring clip (32) includes an upper elastic arm (32a) and a lower elastic arm (32b), a spacing space (322) is provided between the upper elastic arm (32a) and the lower elastic arm (32b), and the mounting side of the test pin (31) is fixed to the joint portion (32d) of the upper elastic arm (32a) and the lower elastic arm (32b); And a limiting block (33), the limiting block (33) is detachably connected to the spring clip (32), a limiting post (332) is provided on the side of the limiting block (33) facing the spring clip (32), and the limiting post (332) is arranged in the spacing space (322) to abut and limit the upper elastic arm (32a).

2. The probe assembly according to claim 1, wherein, The spring clip (32) further includes a mounting portion (32c), and the mounting portion (32c) and the limiting block (33) are detachably configured.

3. The probe assembly according to claim 2, wherein The upper elastic arm (32a) is provided with a first load reduction portion (323) and a third load reduction portion (325) arranged at intervals, the first load reduction portion (323) is arranged adjacent to the joint portion (32d), and the third load reduction portion (325) is arranged adjacent to the mounting portion (32c); The lower elastic arm (32b) is provided with a second load reduction portion (324) and a fourth load reduction portion (326) arranged at intervals, the second load reduction portion (324) is arranged adjacent to the joint portion (32d), and the fourth load reduction portion (326) is arranged adjacent to the mounting portion (32c).

4. The probe assembly according to claim 3, wherein, The second load reduction portion (324) and the first load reduction portion (323) are arranged in the height direction, the fourth load reduction portion (326) and the third load reduction portion (325) are arranged offset in the height direction, and the straight-line distance from the second load reduction portion (324) to the first load reduction portion (323) is less than the straight-line distance from the third load reduction portion (325) to the fourth load reduction portion (326).

5. The probe assembly according to claim 2, characterized in that An installation channel (321) is provided in the spring clip (32), the test pin (31) includes a pin body (311) and a tip portion (312), the pin body (311) is assembled in the installation channel (321), and the tip portion (312) is adapted to contact the circuit board; the installation channel (321) is inclined downwardly and configured on the joint portion (32d) so that the test pin (31) is inclined towards the circuit board.

6. The probe assembly according to claim 5, wherein The installation channel (321) has a conductive connection area, a middle section installation area and a through area; the conductive connection area is arranged at one end of the pin body (311) away from the tip portion (312), the middle section installation area is connected in the extension path of the installation channel (321), and a part of the pin body (311) close to the tip portion (312) penetrates through the through area.

7. The probe assembly according to any one of claims 2-6, characterized in that, On any elastic arm, a left stepped portion (32e) and a right stepped portion (32f) are constructed. In the direction from the mounting portion (32c) to the coupling portion (32d), the left stepped portion (32e) and the right stepped portion (32f) are arranged in sequence, and the thickness of the mounting portion (32c) is greater than the thickness of the coupling portion (32d); and / or On any elastic arm, a weight-reducing portion (327) is provided, and a plurality of the weight-reducing portions (327) are arranged at intervals along the extending direction of any elastic arm; and / or On the side of the coupling portion (32d) away from the first elastic arm, a relief portion (328) is provided. The relief portion (328) has a slanted relief wall surface, and the relief wall surface extends parallel to the length direction of the test probe (31). The area of the relief wall surface decreases in the slanting direction from its upper side to its lower side.

8. A detection device, characterized in that, Comprising the probe assembly according to any one of claims 1-7.

9. The detection device according to claim 8, characterized in that, The detection device further includes a mounting assembly and a driving assembly. The mounting end of the driving assembly is fixedly connected to the mounting assembly, and the probe assembly is connected to the driving end of the driving assembly. The driving assembly is adapted to drive the test probe (31) in the probe assembly to approach and contact or move away from the circuit board.

10. The detection device according to claim 9, wherein The driving assembly includes a driving member (21), a pulley component, a sliding component, and an adapter block (29). The pulley component is arranged at the driving end of the driving member (21). The sliding component is fixedly connected to the pulley component. One side of the adapter block (29) is fixedly connected to the sliding component, and one side of the adapter block (29) is fixedly connected to the probe assembly; and / or The detection device further includes a vision assembly. The vision assembly includes a lens acquisition part (41) and a light source holder (42) arranged at intervals. The lens acquisition part (41) and the light source holder (42) are respectively detachably connected to the mounting assembly.

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