Fixture for dynamic and static test of IGBT module
By designing dynamic and static test fixtures with good compatibility in IGBT modules, using probe slider components and slide rail structures, the compatibility problems of different modules are solved, reducing costs and extending the service life of the fixtures.
Patent Information
- Application Number
- CN202422241701.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-12
- Publication Date
- 2025-07-11
- Estimated Expiration
- 2034-09-12
AI Technical Summary
Existing IGBT module dynamic and static testing requires special fixtures, and the diversity of different module designs leads to high fixture development costs, high durability requirements, and lack of fixtures with good compatibility.
Design a clamp for dynamic and static testing of IGBT modules, including a clamp bracket and module connection assembly, the probe slide assembly is oriented to match different IGBT module ports, increasing compatibility, and connecting the test instruments through removable probes and wires.
Reduce the cost of fixture development, increase service life, avoid disassembly and assembly steps, achieve long-term use, and adapt to IGBT modules in different test scenarios.
Smart Images
Figure CN223092022U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of semiconductor finishing, in particular to a fixture for dynamic and static testing of an IGBT module. Background Art
[0002] The power module IGBT is a device that combines power electronic devices according to certain functions and then encapsulates them into modules. Its main functions include but are not limited to motor control, power conversion, and providing overcurrent, overvoltage and short-circuit protection. Through its internal structure and functions, the power module optimizes and simplifies the power electronic system and improves the efficiency, reliability and safety of the system.
[0003] However, there are various styles of IGBT modules, and their design and manufacturing need to consider many factors, including but not limited to power level, voltage range, current capacity, packaging method, heat dissipation requirements, and application scenarios. This leads to the need for special fixtures for different modules for dynamic and static tests of IGBTs. In addition, dynamic and static tests of IGBT modules generally require ultra-large currents and voltages, and the durability requirements for the fixture are also very high. Due to the above factors, the processing cost of the fixture ranges from RMB 30,000 to RMB 200,000 depending on the complexity.
[0004] In summary, how to provide a fixture with good compatibility that can be applied to dynamic and static tests of different IGBT modules is an urgent problem that needs to be solved. Utility Model Content
[0005] In order to solve the above-mentioned deficiencies of the prior art, the utility model provides a fixture for dynamic and static testing of IGBT modules. The probe slider assembly of the fixture can match different ports of different IGBT modules by moving along the first slide rail, thereby increasing the compatibility of the fixture and greatly reducing the cost of fixture development and production; avoiding the steps of fixture disassembly and assembly, and increasing the service life of the fixture.
[0006] The utility model provides a fixture for dynamic and static testing of an IGBT module, wherein the fixture comprises a fixture bracket and a module connecting assembly, wherein the fixture bracket is provided with a test terminal; the module connecting assembly comprises a plurality of probe slider assemblies and a plurality of first slide rails arranged in parallel along a first direction; the probe slider assemblies are matched with the first slide rails and are slidably connected; one end of the test terminal is used for connecting a test instrument, and the other end is used for electrically connecting to the probe slider assembly.
[0007] In a specific embodiment, the probe slider assembly includes a probe and a first slider; the first slider is a probe seat of the probe, and the first slider matches and is slidably connected to the first slide rail.
[0008] In a specific embodiment, the probe is detachably disposed on the first slider and both ends of the probe are exposed outside the first slider.
[0009] In a specific embodiment, the probe is perpendicular to the first slide rail.
[0010] In a specific embodiment, both ends of several of the first slide rails are limited in the fixture bracket.
[0011] In a specific embodiment, the fixture bracket is formed with a through operation window.
[0012] In a more specific embodiment, the fixture further includes a first wire for connecting a test terminal and the probe.
[0013] In a more specific embodiment, the fixture further includes a second wire for connecting an external power supply and the probe.
[0014] In a more specific embodiment, the end face of the end of the probe for electrically contacting the IGBT module is a flat surface.
[0015] In a more specific embodiment, a circumferentially extending portion is formed near the end of the probe.
[0016] In a more specific embodiment, the probe slider assembly further includes a probe sleeve. The probe is matched with and detachably connected to the probe sleeve, and the probe sleeve is disposed on the first slider.
[0017] In a more specific embodiment, the probe slider assembly further includes a probe sleeve. The probe is matched with and detachably connected to the probe sleeve, and the probe sleeve is disposed on the first slider through the probe limiting structure.
[0018] Further, the detachable connection includes one or more of snap connection, threaded connection, and spring clamping.
[0019] In a more specific embodiment, two oppositely arranged slide rail clamping portions are formed on the first slider. Any one of the first slide rails is composed of two slide rails arranged in parallel along the first direction; the slide rail clamping portion is matched with and slidably connected to the first slide rail.
[0020] In a more specific embodiment, the slide rail clamping portion includes two slot ears arranged up and down, and the two slot ears arranged up and down form a slide rail clamping groove.
[0021] Further, the slot ear is an elastic slot ear.
[0022] Further, second sliders are fixedly connected to both ends of each of the first slide rails.
[0023] Furthermore, the module connection component further includes a second slide rail, which is arranged on the fixture bracket and perpendicular to the first direction; the second slider is matched with and slidably connected to the second slide rail.
[0024] Furthermore, the fixture bracket is an insulating fixture bracket; the first slide rail and the second slide rail are insulating slide rails; the first slider and the second slider are insulating sliders.
[0025] As described above, a fixture for dynamic and static testing of IGBT modules according to the present invention has the following beneficial effects:
[0026] 1) In the present invention, when the fixture is used for dynamic and static testing of IGBT modules, the probe slider assembly can move directionally along the first slide rail to match different ports of different IGBT modules, increasing the compatibility of the fixture, greatly reducing the fixture development and production costs; avoiding the fixture disassembly and assembly steps and increasing the service life of the fixture.
[0027] 2) In the present invention, the first slide rail makes a linear reciprocating motion along the second direction through the second slider, and thus the probe slider assembly makes a linear reciprocating motion along the second direction with the first slide rail that is matched and connected thereto, realizing that the probe slider assembly can match different port positions of different IGBT modules in the second direction, increasing the compatibility of the fixture, and greatly reducing the fixture development and production costs.
[0028] 3) The fixture of the present invention enables the probe slider assembly that reciprocates along the first direction and / or the second direction to match different port positions of different IGBT modules, avoiding the fixture disassembly and assembly steps and increasing the service life of the fixture.
[0029] 4) In the present invention, the probe is matched with and detachably connected to the probe sleeve, and thus the long-term use of the fixture can be realized by replacing the probe.
[0030] 5) In the present invention, the groove ear is an elastic groove ear. Thus, by applying force to deform the groove ear to add or replace the probe slider assembly, the fixture can match IGBT modules with different numbers of ports, and at the same time meet the requirements for the number of probes in different test scenarios. Description of the Drawings
[0031] Figure 1 It is a schematic structural diagram of the fixture for dynamic and static testing of IGBT modules according to the present invention.
[0032] Figure 2 It is a sectional view of the module connection component according to the present invention.
[0033] Figure 3 The circuit schematic diagram of the fixture described in the present utility model for a certain situation during dynamic and static tests.
[0034] Description of the reference numerals in the drawings
[0035] 10 Fixture bracket, 11 Test terminal, 12 Penetrating operation window, 20 Module connection assembly, 21 Second slide rail, 22 Second slider, 23 First slide rail, 24 Probe slider assembly, 241 First slider, 2411 Slide rail clamping part, 242 Probe, 243 Probe sleeve. Specific implementation manners
[0036] The following specific embodiments illustrate the implementation manners of the present utility model. Those skilled in the art can easily understand other advantages and effects of the present utility model from the content disclosed in this specification.
[0037] Please refer to Figures 1 to 3 . It should be noted that the structures, ratios, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those skilled in the art to understand and read, and are not used to limit the limited conditions for the implementation of the present utility model. Therefore, they do not have any technical essence. Any modification of the structure, change of the proportional relationship, or adjustment of the size, without affecting the effects that the present utility model can produce and the purposes that can be achieved, should still fall within the scope that can be covered by the technical content disclosed in the present utility model. At the same time, the terms such as "upper", "lower", "left", "right", "middle", and "one" cited in this specification are only for the convenience of clear narration and are not used to limit the scope for the implementation of the present utility model. The change or adjustment of their relative relationships, without substantial change in the technical content, should also be regarded as the scope within which the present utility model can be implemented.
[0038] The present utility model discloses a fixture for dynamic and static testing of IGBT modules. As Figure 1 shown, the fixture includes a fixture bracket 10 and a module connection assembly 20. The fixture bracket 10 is provided with a test terminal 11; the module connection assembly 20 includes a plurality of probe slider assemblies 24 and a plurality of first slide rails 23 arranged in parallel along a first direction; the probe slider assemblies 24 are matched with and slidably connected to the first slide rails 23; one end of the test terminal 11 is used to connect to a test instrument, and the other end is used to be electrically connected to the probe slider assemblies 24.
[0039] The number of probe slider assemblies 24 that can be slidably connected to the first slide rail 23 can be adjusted according to actual situations, such as 2, 5, 10, 20, etc.
[0040] The test terminal 11 in this application can have multiple test ports, which can be specifically selected according to test needs. Multiple test terminals 11 can also be provided on the fixture in this application.
[0041] When the above fixture provided in the embodiment of the present application is used for dynamic and static testing of IGBT modules, the probe slider assembly 24 can move directionally along the first slide rail 23 to match different ports of different IGBT modules, increasing the fixture compatibility, greatly reducing the fixture development and production costs; avoiding the fixture disassembly and assembly steps and increasing the fixture service life.
[0042] In a specific embodiment, when the fixture of the present utility model is used for dynamic and static testing, the IGBT module is carried, abutted or fixed on the fixture, and the ports in the IGBT module are electrically connected to a plurality of probes in the probe slider assembly 24. Then, an external power supply is connected through the probes in the probe slider assembly 24 for power supply, and a test terminal 11 is connected through the probes in the probe slider assembly 24 to turn on the test instrument, forming a circuit schematic diagram as Figure 3 shown. Specifically, the external power supply is electrically connected to the IGBT module through two probe slider assemblies 24 respectively, and the test terminal 11 is electrically connected to the IGBT module through two other probe slider assemblies 24 respectively, thereby forming a test circuit. It should be noted that Figure 3 This is only a schematic illustration of the principle for those familiar with this technology to understand and read, and does not fully show all the structures and positional relationships of the fixture of the present utility model.
[0043] The IGBT module of IGBT generally matches with a fixed base. When using the fixture for dynamic and static testing, the fixed base is fixed on the fixture bracket 10, and then the probe slider assembly 24 is slid to be electrically connected to the IGBT module. One end of the probe in the probe slider assembly 24 contacts and is electrically connected to the port of the IGBT module, and the other end is electrically connected to the external power supply and the test terminal 11 respectively.
[0044] In a specific embodiment, as Figure 2 shown, the probe slider assembly 24 includes a probe 242 and a first slider 241; the first slider 241 is the probe seat of the probe 242, and the first slider 241 is matched with and slidably connected to the first slide rail 23.
[0045] In a specific embodiment, as Figure 2 shown, the probe 242 is detachably arranged on the first slider 241 and both ends of the probe 242 are exposed outside the first slider 241.
[0046] In a more specific embodiment, as Figure 2As shown, the probe slider assembly 24 further includes a probe sleeve 243. The probe 242 is matched with the probe sleeve 243 and detachably connected, and the probe sleeve 243 is provided on the first slider 241, enabling the probe 242 to be conveniently replaced and realizing the long-term use of the fixture.
[0047] Further, as Figure 2 shown, the detachable connection includes one or more of snap connection, threaded connection, and spring clamping.
[0048] In a specific embodiment, as Figures 1 to 2 shown, the probe 242 is perpendicular to the first slide rail 23. The probe 242 perpendicular to the first slide rail 23 enables the probe 242 to stably contact the port of the IGBT module and is not easy to shake.
[0049] In a specific embodiment, as Figure 1 shown, both ends of several of the first slide rails 23 are limited in the fixture bracket 10.
[0050] In a specific embodiment, as Figure 1 shown, the fixture bracket 10 is formed with a through operation window 12. The through operation window 12 provides an operation space for the sliding of the probe slider assembly 24 and facilitates the installation or disassembly of the IGBT module.
[0051] In a more specific embodiment, as Figures 1 to 3 shown, the fixture further includes a first wire for connecting the test terminal 11 and the probe 242; and / or, the fixture further includes a second wire for connecting an external power supply and the probe 242.
[0052] In a more specific embodiment, as Figures 2 to 3 shown, the end face of the end of the probe 242 for electrical contact with the IGBT module is a flat surface. The flat surface is crimped with the port of the IGBT module, making the connection between the probe 242 and the port of the IGBT module more stable.
[0053] In a more specific embodiment, as Figures 2 to 3 shown, a circumferential extension is formed near the end of the probe 242. The circumferential extension provides a force point when replacing the probe 242, realizes the convenient replacement of the probe, and increases the service life of the fixture.
[0054] In a more specific embodiment, as Figures 1 to 2As shown, two relatively arranged slide rail clamping parts 2411 are formed on the first slider 241. Any of the first slide rails 23 is composed of two slide rails arranged in parallel along the first direction; the slide rail clamping parts 2411 are matched with and slidably connected to the first slide rail 23. The two slide rails arranged in parallel along the first direction are respectively slidably connected to the two slide rail clamping parts 2411 on one first slider 241. Any of the first sliders 241 is limited by the two slide rails arranged in parallel along the first direction and can only move linearly along the first direction.
[0055] In a more specific embodiment, the slide rail clamping part 2411 includes two slot ears arranged up and down, and the two slot ears arranged up and down form a slide rail clamping slot.
[0056] In a more specific embodiment, the slot ear is an elastic slot ear. Thus, by applying force, the slot ear is deformed to add or replace the probe slider assembly 24.
[0057] Furthermore, as Figure 1 shown, both ends of each first slide rail 23 are fixedly connected with a second slider 22.
[0058] Even further, as Figure 1 shown, the module connection assembly 20 further includes a second slide rail 21. The second slide rail 21 is arranged on the fixture bracket 10 and is perpendicular to the first direction; the second slider 22 is matched with and slidably connected to the second slide rail 21. In a specific embodiment, there are two second slide rails 21 arranged in parallel. The first slide rail 23 makes a linear reciprocating movement along the second 21 direction through the second slider 22. Thus, the probe slider assembly 24 moves back and forth in the second direction along with the first slide rail 23 that is matched and connected to it, realizing that the probe slider assembly 24 can match different port positions of different IGBT modules in the second direction, increasing the fixture compatibility and greatly reducing the fixture development and manufacturing cost.
[0059] Even further, as Figure 1 shown, the fixture bracket 10 is an insulating fixture bracket; the first slide rail 23 and the second slide rail 21 are insulating slide rails; the first slider 241 and the second slider 22 are insulating sliders. This ensures the safety and accuracy of the test process.
[0060] In summary, the fixture of the present utility model enables the probe slider assembly 24 to match different port positions of different IGBT modules through a plurality of probe slider assemblies 24 that make linear reciprocating movements along the first slide rail 23, increasing the fixture compatibility and greatly reducing the fixture development and manufacturing cost; avoiding the fixture disassembly and assembly steps and increasing the fixture service life.
[0061] In summary, the utility model effectively overcomes various disadvantages in the prior art and has high industrial utilization value.
[0062] The above are only the preferred embodiments of the utility model. It should be pointed out that for those of ordinary skill in the art, without departing from the technical principle of the utility model, several improvements and replacements can be made, and these improvements and replacements should also be regarded as the protection scope of the utility model.
Claims
1. A fixture for dynamic and static testing of IGBT modules, characterized in that, The fixture includes a fixture bracket (10) and a module connection component (20). A test terminal (11) is provided on the fixture bracket (10); the module connection component (20) includes a plurality of probe slider components (24) and a plurality of first slide rails (23) arranged in parallel along a first direction; the probe slider components (24) are matched with and slidably connected to the first slide rails (23); one end of the test terminal (11) is used to connect to a test instrument, and the other end is used to be electrically connected to the probe slider components (24).
2. The fixture according to claim 1, wherein The probe slider component (24) includes a probe (242) and a first slider (241); the first slider (241) is the probe base of the probe (242), and the first slider (241) is matched with and slidably connected to the first slide rail (23); and / or, the probe (242) is detachably provided on the first slider (241) and both ends of the probe (242) are exposed outside the first slider (241); and / or, the probe (242) is perpendicular to the first slide rail (23); and / or, both ends of the plurality of first slide rails (23) are limited in the fixture bracket (10); and / or, an operating window (12) is formed through the fixture bracket (10).
3. The fixture according to claim 2, wherein The fixture further includes a first wire for connecting the test terminal (11) and the probe (242); and / or, the fixture further includes a second wire for connecting an external power supply and the probe (242).
4. The fixture according to claim 2, characterized in that, The end face of the end of the probe (242) for electrically contacting the IGBT module is a flat surface; and / or, a circumferentially extending portion is formed near the end of the probe (242).
5. The fixture according to claim 2, wherein The probe slider component (24) further includes a probe sleeve (243). The probe (242) is matched with and detachably connected to the probe sleeve (243), and the probe sleeve (243) is provided on the first slider (241).
6. The fixture according to claim 5, characterized in that, The detachable connection includes one or more of snap connection, threaded connection, and spring clamping.
7. The jig according to claim 2, wherein Two oppositely arranged slide rail clamping portions (2411) are formed on the first slider (241). Any one of the first slide rails (23) is composed of two slide rails arranged in parallel along the first direction; The slide rail clamping portion (2411) is matched with and slidably connected to the first slide rail (23).
8. The fixture according to claim 7, wherein Both ends of each first slide rail (23) are fixedly connected with a second slider (22); and / or, the slide rail clamping portion (2411) includes two slot ears arranged up and down, and the two slot ears arranged up and down form a slide rail clamping groove.
9. The jig according to claim 8, characterized in that, The module connection component (20) further includes a second slide rail (21). The second slide rail (21) is provided on the fixture bracket (10), and the second slide rail (21) is perpendicular to the first direction; the second slider (22) is matched with and slidably connected to the second slide rail (21); and / or, the slot ear is an elastic slot ear.
10. The fixture according to claim 9, wherein, The fixture bracket (10) is an insulating fixture bracket; the first slide rail (23) and the second slide rail (21) are insulating slide rails; the first slider (241) and the second slider (22) are insulating sliders.