Circuit test probe card

Abstract

The utility model relates to the technical field of probe cards, and discloses a circuit test probe card, which comprises a PCB substrate, an MLO substrate is fixed on the top surface of the PCB substrate, a dismounting assembly is arranged on the top surface of the MLO substrate, the dismounting assembly comprises a mounting plate which is detachably arranged on the top surface of the MLO substrate, a rotating ring is arranged on the outer wall of the mounting plate, and the rotating ring is connected with the mounting plate. Two clamping grooves are formed in the bottom face of the rotating ring, and a connecting ring is fixed to the outer wall of the MLO substrate. The mounting plate is limited through the limiting rod, so that the mounting plate can drive the probe to vertically descend and accurately abut against the contact of the MLO substrate, the problem that the probe and the contact of the MLO substrate are not easy to align is effectively avoided, the clamping block and the clamping groove can be clamped by rotating the rotating ring through the arrangement of the rotating ring, and the clamping effect of the MLO substrate is improved. The two ends of the mounting plate are fixed at the same time, and the problem that in the mounting process of the mounting plate, the mounting plate inclines due to the fact that the mounting plate is fixed firstly, and a probe is likely to be bent due to oblique force is effectively solved.

Description

Technical Field

[0001] The utility model relates to the technical field of probe cards, in particular to a circuit test probe card. Background Art

[0002] During the chip production process, it is necessary to ensure that the various functions of the chip meet the design requirements through testing means. During the test before wafer packaging, the object to be measured is placed on the probe body stage, and then the probe body on the probe card is directly contacted with the pads or bumps on the chip to lead out the chip signals generated by the tester and apply them to the device under test, and transmit the feedback signals in the device under test back to the tester, thus completing the entire test.

[0003] An existing probe card (Publication No.: CN220509007U) has the following defects: during the use of the above device, the support backing plate is installed on the MLO substrate through bolts, and no positioning mechanism is provided, resulting in difficult alignment between the bottom end of the probe on the support backing plate and the contact point of the MLO substrate, causing difficult installation. At the same time, since one end of the support backing plate is bolt-fixed first during installation, the support backing plate is in an inclined state at this time, and the contact point between the bottom end of the probe and the MLO substrate forms a certain inclined angle. When fixing the other end of the support backing plate, it will cause the support backing plate to drive the probe to be inclined and press down to the contact point of the MLO substrate, which may cause the bottom end of the probe to bend. Therefore, the present utility model is proposed. Summary of the Utility Model

[0004] The purpose of the present utility model is to solve the problems existing in the prior art, and to propose a circuit test probe card.

[0005] In order to achieve the above purpose, the present utility model adopts the following technical scheme:

[0006] A circuit test probe card includes a PCB substrate, an MLO substrate is fixed on the top surface of the PCB substrate, a disassembly and assembly component is arranged on the top surface of the MLO substrate, the disassembly and assembly component includes a mounting plate detachably arranged on the top surface of the MLO substrate, a rotating ring is arranged on the outer wall of the mounting plate, two clamping grooves are opened on the bottom surface of the rotating ring, a connecting ring is fixed on the outer wall of the MLO substrate, and a clamping block is fixed on the top surface of the connecting ring, and the clamping block is slidably clamped inside the clamping groove.

[0007] Preferably, a plurality of probes are inserted through the top surface of the mounting plate, the bottom end of the probe abuts against the contact point on the top surface of the MLO substrate, a plurality of limiting rods are fixed on the top surface of the MLO substrate, a plurality of limiting holes are opened on the top surface of the mounting plate, the limiting rods are slidably inserted inside the limiting holes, a pressing groove is opened on the outer wall of the mounting plate, a rotating groove is opened on the inner wall of the rotating ring, a pressing ring is slidably arranged inside the rotating groove, and the pressing ring is slidably inserted inside the pressing groove.

[0008] Preferably, a counterbore is formed in the top surface of the rotating ring, a bolt is inserted into the counterbore, and the bolt is threadedly connected to the top surface of the connecting ring.

[0009] Preferably, a plurality of springs are fixed between the bottom surface of the pressing ring and the bottom surface of the inner wall of the pressing groove.

[0010] Preferably, a plurality of support rods are inserted through and slidably arranged on the top surface of the pressing ring, both ends of the support rods are fixed to the inner top surface and the bottom surface of the pressing groove respectively, and the springs are sleeved on the outer walls of the support rods movably.

[0011] Preferably, two toggle rods are fixed to the outer wall of the rotating ring.

[0012] The beneficial effects of the utility model are as follows:

[0013] By providing the mounting plate and the rotating ring, when the probe is inserted into the mounting plate, when the mounting plate is mounted on the MLO substrate, the probe just contacts the contact of the MLO substrate. When mounting, the mounting plate is limited by the limiting rod, so that the mounting plate drives the probe to descend vertically and accurately contact the contact of the MLO substrate, effectively avoiding the problem that the probe is not easy to be aligned with the contact of the MLO substrate. Then, by adopting the rotating ring, the clamping block can be clamped with the clamping groove by rotating the rotating ring, so that both ends of the mounting plate are fixed at the same time, effectively avoiding the problem that one side of the mounting plate is fixed first during the installation process of the mounting plate, resulting in the inclination of the mounting plate and the possible bending of the probe due to the oblique force. Description of the Drawings

[0014] Figure 1 is the three-dimensional structural schematic diagram of the present utility model;

[0015] Figure 2 is the three-dimensional split structural schematic diagram of the present utility model;

[0016] Figure 3 is Figure 2 the enlarged partial structural schematic diagram of A in

[0017] Figure 4 is the cross-sectional structural schematic diagram of the rotating ring of the present utility model.

[0018] In the figure: 1, PCB substrate; 101, MLO substrate; 2, mounting plate; 201, rotating ring; 202, clamping groove; 203, connecting ring; 204, clamping block; 205, probe; 206, limiting rod; 207, limiting hole; 208, pressing groove; 209, rotating groove; 210, pressing ring; 3, counterbore; 4, spring; 401, support rod; 5, toggle rod. Detailed Embodiments

[0019] In order to make the technical means, creative features, achieved purposes and effects realized by the present utility model easy to understand, the present utility model will be further described below in conjunction with specific embodiments.

[0020] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments in the present utility model, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present utility model.

[0021] Please refer to the attached Figure 1 - attached Figure 4 , a circuit test probe card, including a PCB substrate 1. The top surface of the PCB substrate 1 is fixed with an MLO substrate 101. The top surface of the MLO substrate 101 is provided with a disassembly and assembly component. The disassembly and assembly component includes a mounting plate 2 detachably arranged on the top surface of the MLO substrate 101. A rotating ring 201 is arranged on the outer wall of the mounting plate 2. Two clamping grooves 202 are opened on the bottom surface of the rotating ring 201. A connecting ring 203 is fixed on the outer wall of the MLO substrate 101. A clamping block 204 is fixed on the top surface of the connecting ring 203. The clamping block 204 is slidably clamped inside the clamping groove 202.

[0022] In the embodiment, a plurality of probes 205 are inserted through the top surface of the mounting plate 2. The bottom ends of the probes 205 are in contact with the contacts on the top surface of the MLO substrate 101. A plurality of limiting rods 206 are fixed on the top surface of the MLO substrate 101. A plurality of limiting holes 207 are opened on the top surface of the mounting plate 2. The limiting rods 206 are slidably inserted inside the limiting holes 207. A pressing groove 208 is opened on the outer wall of the mounting plate 2. A rotating groove 209 is opened on the inner wall of the rotating ring 201. A pressing ring 210 is slidably arranged inside the rotating groove 209. The pressing ring 210 is slidably inserted inside the pressing groove 208. By providing the mounting plate 2 and the rotating ring 201, when the probes 205 are inserted on the mounting plate 2, when the mounting plate 2 is installed on the MLO substrate 101, the probes 205 just contact the contacts of the MLO substrate 101. When installing, the mounting plate 2 is limited by the limiting rods 206, so that the mounting plate 2 will drive the probes 205 to vertically descend and accurately contact the contacts of the MLO substrate 101, effectively avoiding the problem that the probes 205 are not easy to be aligned with the contacts of the MLO substrate 101. Then, by using the rotating ring 201, the clamping block 204 can be clamped with the clamping groove 202 by rotating the rotating ring 201, so that both ends of the mounting plate 2 are fixed at the same time, effectively avoiding the problem that during the installation process of the mounting plate 2, one side is fixed first, resulting in the mounting plate 2 being tilted, and the probes 205 may be bent due to the oblique force.

[0023] In the embodiment, a hole 3 is provided on the top surface of the rotating ring 201, a bolt is inserted into the hole 3, and the bolt is threadedly connected to the top surface of the connecting ring 203. By setting and using the hole 3 and the bolt, the rotating ring 201 and the connecting ring 203 can be easily detachably installed, and the hole 3 can hide the nut of the bolt to prevent affecting the test of the circuit board by the probe 205.

[0024] In an embodiment, a plurality of springs 4 are fixed between the bottom surface of the pressing ring 210 and the bottom surface of the inner wall of the pressing groove 208. By setting and using the springs 4, the pressing ring 210 can be pressed against the inner bottom surface of the pressing groove 208 by the springs 4, thereby achieving compression of the mounting plate 2, ensuring that the probe 205 and the contact on the MLO substrate 101 are in closer contact.

[0025] In the embodiment, a plurality of support rods 401 are inserted through and slidably disposed on the top surface of the pressure ring 210, and both ends of the support rods 401 are respectively fixed to the inner top surface and bottom surface of the pressure groove 208, and the spring 4 is movably sleeved on the outer wall of the support rods 401. The setting and use of the support rods 401 can support the spring 4 and limit the pressure ring 210, thereby preventing the spring 4 from being squeezed and deformed, and preventing the pressure ring 210 from being driven by the rotating ring 201 to rotate due to friction.

[0026] In the embodiment, two toggle rods 5 are fixed to the outer wall of the rotating ring 201. The setting and use of the toggle rods 5 facilitate the staff to better drive the rotating ring 201 to rotate.

[0027] Working principle: When in use, the mounting plate 2 is placed on the top surface of the MLO substrate 101, and then the limiting rod 206 is inserted into the inside of the limiting hole 207. At this time, the rotating ring 201 is pressed, so that the rotating ring 201 drives the pressing ring 210 to squeeze the spring 4 and apply downward pressure to the mounting plate 2, so that the bottom end of the probe 205 contacts the contact point of the MLO substrate 101. At this time, the clamping block 204 is inserted into the inside of the clamping groove 202. Then the staff pinches the toggle rod 5 and rotates the rotating ring 201, so that the clamping block 204 is slidably engaged with the inside of the clamping groove 202. At this time, the staff loosens the rotating ring 201 and screws it in. The bolt is placed inside the hole 3, and then the bolt is tightened to make it threadedly connected with the top surface of the connecting ring 203, thereby completing the installation of the probe 205. Through the setting and use of the spring 4, the pressure ring 210 can be pressed against the inner bottom surface of the pressure groove 208 by the spring 4, thereby achieving the pressing of the mounting plate 2, ensuring that the probe 205 and the contact points on the MLO substrate 101 are more closely contacted. Through the setting and use of the support rod 401, the spring 4 can be supported and the pressure ring 210 can be limited at the same time, preventing the spring 4 from being squeezed and deformed, and preventing the pressure ring 210 from being driven to rotate together with the rotating ring 201 due to friction.

[0028] In addition, it should be understood that although this specification is described according to embodiments, not every embodiment only contains an independent technical solution. This narrative way of the specification is only for clarity. Those skilled in the art should regard the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A circuit test probe card, comprising a PCB substrate (1), characterized in that, An MLO substrate (101) is fixed to the top surface of the PCB substrate (1), and a disassembly assembly is arranged on the top surface of the MLO substrate (101), wherein the disassembly assembly comprises a mounting plate (2) which is detachably arranged on the top surface of the MLO substrate (101), a rotating ring (201) is arranged on the outer wall of the mounting plate (2), and two snap-in grooves (202) are arranged on the bottom surface of the rotating ring (201), a connecting ring (203) is fixed to the outer wall of the MLO substrate (101), and a snap-in block (204) is fixed on the top surface of the connecting ring (203), and the snap-in block (204) is slidably snap-in engaged with the inside of the snap-in groove (202).

2. The circuit test probe card according to claim 1, wherein, A plurality of probes (205) are inserted through the top surface of the mounting plate (2), the bottom ends of the probes (205) are in contact with the contacts on the top surface of the MLO substrate (101), a plurality of limiting rods (206) are fixed to the top surface of the MLO substrate (101), a plurality of limiting holes (207) are provided on the top surface of the mounting plate (2), the limiting rods (206) and the limiting holes (207) are slidably inserted therein, a pressing groove (208) is provided on the outer wall of the mounting plate (2), a rotating groove (209) is provided on the inner wall of the rotating ring (201), a pressing ring (210) is slidably provided inside the rotating groove (209), and the pressing ring (210) and the pressing groove (208) are slidably inserted therein.

3. The circuit test probe card according to claim 2, wherein The top surface of the rotating ring (201) is provided with a counter hole (3), a bolt is inserted into the inside of the counter hole (3), and the bolt is threadedly connected to the top surface of the connecting ring (203).

4. The circuit test probe card according to claim 3, wherein A plurality of springs (4) are fixed between the bottom surface of the pressure ring (210) and the bottom surface of the inner wall of the pressure groove (208).

5. The circuit test probe card according to claim 4, characterized in that, A plurality of support rods (401) are slidably inserted through the top surface of the pressure ring (210), and the two ends of the support rods (401) are respectively fixed to the inner top surface and bottom surface of the pressure groove (208), and the spring (4) is movably sleeved on the outer wall of the support rods (401).

6. The circuit test probe card according to claim 5, characterized in that, Two toggle rods (5) are fixed to the outer wall of the rotating ring (201).

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