Electronic component pin testing mechanism
Through the design of negative pressure adsorption assembly and test pen fixer, the problem of position movement and handheld instability in electronic component pin test is solved, achieving a stable test effect.
Patent Information
- Application Number
- CN202421869081.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-05
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2034-08-05
AI Technical Summary
Existing electronic components are easily poked by the test pen during testing, and the handheld test pen is unstable, resulting in inaccurate measurement and poor contact.
The electronic components are fixed with negative pressure adsorption components, and the test pen is fixed with a telescopic arm and test pen retainer to ensure that the test pen is in stable contact with the pin.
The stable fixation of electronic components and the stable operation of the test pen are achieved, which avoids component position movement and hand-held jitter, and improves the accuracy and reliability of the test.
Smart Images
Figure CN223123133U_ABST
Abstract
Description
Technical Field
[0001] The utility model provides a pin testing mechanism for electronic components, which relates to the technical field of electronic component testing. Background Art
[0002] Electronic components are the basic elements in electronic circuits. Conventional electronic components have pins, which are connected to a circuit board through the pins to form an electronic circuit with a specific function. To ensure the performance of electronic components and reduce the failure rate of electronic circuits, electronic components need to be centrally detected after being produced.
[0003] In the prior art, when testing the pins of electronic components, since most of the pins are small in size, generally a test pen is held by hand for detection. However, there are the following problems in manual operation: the volume of the electronic component is small, and when the test pen touches the pin, the position of the electronic component is likely to move, resulting in inaccurate measurement; it is easy to shake unstably when holding the test pen by hand. Especially after the staff works for a long time, the shaking will cause poor contact and affect the test result. For this reason, we propose a pin testing mechanism for electronic components. Content of the Utility Model
[0004] The technical problem to be solved by the utility model is the problem that the existing electronic component pins are easily poked and the test pen held by hand is unstable during testing.
[0005] To solve the above technical problem, the technical solution provided by the utility model is: a pin testing mechanism for electronic components, including a test bench and a bracket fixedly connected to one side of the test bench. The test bench is of a hollow structure and is provided with a negative pressure adsorption component inside. The top of the bracket is fixedly connected with a telescopic arm, and the bottom end of the telescopic arm is fixedly connected with a test pen holder. The negative pressure adsorption component includes a first negative pressure pipe, a main suction head fixedly connected to one end of the first negative pressure pipe, a second negative pressure pipe communicated with the first negative pressure pipe, and a secondary suction head fixedly connected to one end of the second negative pressure pipe. Both the main suction head and the secondary suction head penetrate through the top of the test bench. The test pen holder includes a clamping plate and ball heads rotatably arranged at both ends of the clamping plate. A clamping groove for fixing the test pen is formed on the side wall of the ball head, an opening groove matched with the clamping groove is formed on the side wall of the clamping plate, and a bolt is threadedly connected to the side wall of the clamping plate, and the end of the bolt abuts against the outer wall of the ball head.
[0006] Preferably, the front end of the clamping groove is a straight section, the rear side is an arc section, and a plurality of blocking strips are fixedly connected to the inner side of the arc section and are uniformly arranged from top to bottom.
[0007] Preferably, the telescopic arm includes a rotating shaft arranged at the bottom of the bracket, a first folding arm hinged to the bottom of the rotating shaft, and a second folding arm hinged to the other end of the first folding arm. The test pen holder is fixedly connected to the bottom end of the second folding arm.
[0008] Preferably, a test slot is formed at the top of the test bench. The main suction head and the auxiliary suction heads are both arranged inside the test slot. The main suction head is arranged at the center of the test slot. There are four auxiliary suction heads, which are evenly distributed around the main suction head.
[0009] Preferably, limiting plates are arranged on two adjacent sides of the test slot. One side of the limiting plate is rotatably connected with a screw rod. The screw rod penetrates through the test bench and is in threaded connection with the test bench. One side of the limiting plate is also fixedly connected with a limiting rod. The limiting rod penetrates through the test bench and is in sliding connection with the test bench.
[0010] Preferably, a solenoid valve I is arranged on the first negative pressure pipe, and a solenoid valve II is arranged on the second negative pressure pipe.
[0011] The beneficial effects of the present utility model are as follows:
[0012] Through the arrangement of the negative pressure adsorption assembly, when an electronic component is placed on the test bench, the electronic component can be adsorbed and fixed, avoiding the movement of the electronic component affected by the test pen during subsequent tests.
[0013] The test pen is fixed by the telescopic arm and the test pen holder, liberating both hands and simultaneously avoiding the problem of shaking during testing. Description of the Drawings
[0014] Figure 1 It is a schematic diagram of the overall structure of a pin test mechanism for an electronic component of the present utility model.
[0015] Figure 2 It is a schematic diagram of the structure of the negative pressure adsorption assembly of a pin test mechanism for an electronic component of the present utility model.
[0016] Figure 3 It is a schematic diagram of the telescopic arm structure of a pin test mechanism for an electronic component of the present utility model.
[0017] Figure 4 It is a schematic diagram of the structure of the test pen holder of a pin test mechanism for an electronic component of the present utility model.
[0018] (1. Test bench; 2. Bracket; 3. First folding arm; 4. Second folding arm; 5. Test pen holder; 6. Limiting plate; 7. Limiting rod; 8. Screw rod; 9. First negative pressure pipe; 10. Main suction head; 11. Auxiliary suction heads; 12. Test slot; 13. Second negative pressure pipe; 14. Solenoid valve II; 15. Solenoid valve I; 16. Rotating shaft; 17. Clamping plate; 18. Ball head; 19. Clamping groove; 20. Blocking strip; 21. Bolt; 22. Open slot) Detailed Embodiment
[0019] Next, the preferred embodiments of the present utility model will be described in detail with reference to the drawings.
[0020] Referring to Figures 1 to 4 , the present utility model provides a pin testing mechanism for electronic components, including a test bench 1 and a bracket 2 fixedly connected to one side of the test bench 1. The test bench 1 is a hollow structure and is provided with a negative pressure adsorption component inside. The negative pressure adsorption component includes a first negative pressure pipe 9, a main suction head 10 fixedly connected to the end of the first negative pressure pipe 9, a second negative pressure pipe 13 communicated with the first negative pressure pipe 9, and a secondary suction head 11 fixedly connected to the end of the second negative pressure pipe 13. Both the main suction head 10 and the secondary suction head 11 penetrate through the top of the test bench 1. Specifically, the main suction head 10 is connected to an external negative pressure device, which can generate suction inside the main suction head 10 and the secondary suction head 11. When an electronic component is placed on the test bench 1, the electronic component can be adsorbed and fixed by the main suction head 10 and the secondary suction head 11, avoiding the movement of the electronic component affected by the test pen during subsequent testing.
[0021] Furthermore, as shown in Figure 1 and Figure 2 , a test slot 12 is opened on the top of the test bench 1. Both the main suction head 10 and the secondary suction head 11 are arranged inside the test slot 12. The main suction head 10 is arranged at the center of the test slot 12, and there are four secondary suction heads 11, which are evenly distributed around the main suction head 10. A first solenoid valve 15 is arranged on the first negative pressure pipe 9, and a second solenoid valve 14 is arranged on the second negative pressure pipe 13. Specifically, by controlling the opening and closing of the first solenoid valve 15 and the second solenoid valve 14, the main suction head 10 and the secondary suction head 11 can be respectively opened to adsorb and fix electrical components of different sizes.
[0022] Furthermore, as shown in Figure 1 , limit plates 6 are arranged on two adjacent sides of the test slot 12. One side of the limit plate 6 is rotatably connected to a screw rod 8. The screw rod 8 penetrates through the test bench 1 and is threadedly connected to the test bench 1. A limit rod 7 is also fixedly connected to one side of the limit plate 6. The limit rod 7 penetrates through the test bench 1 and is slidably connected to the test bench 1. Specifically, a knob is also fixedly connected to the end of the screw rod 8. By rotating the screw rod 8 through the knob, the limit plate 6 can be driven to move, and the position of the electrical component can be limited by the limit plate 6. When continuously testing electrical components of the same specification, rapid positioning can be carried out when placing the electrical components.
[0023] Furthermore, as shown in Figure 1 and Figure 3 , a telescopic arm is fixedly connected to the top end of the bracket 2, and a test pen holder 5 is fixedly connected to the bottom end of the telescopic arm. The telescopic arm includes a rotating shaft 16 arranged at the bottom of the bracket 2, a first folding arm 3 hinged to the bottom of the rotating shaft 16, and a second folding arm 4 hinged to the other end of the first folding arm 3. The test pen holder 5 is fixedly connected to the bottom end of the second folding arm 4. By dragging the telescopic arm, the position of the test pen holder 5 can be arbitrarily moved.
[0024] Furthermore, as shown in Figure 1 and Figure 4As shown in the figure, the test pen holder 5 includes a clamping plate 17 and ball heads 18 rotatably arranged at both ends of the clamping plate 17. A clamping groove 19 for fixing the test pen is formed in the side wall of the ball head 18. The front end of the clamping groove 19 is a straight section, and the rear side is an arc section. A blocking strip 20 is fixedly connected to the inner side of the arc section. A plurality of blocking strips 20 are uniformly arranged from top to bottom. An opening groove 22 matching the clamping groove 19 is formed in the side wall of the clamping plate 17. A bolt 21 is threadedly connected to the side wall of the clamping plate 17, and the end of the bolt 21 abuts against the outer wall of the ball head 18. Specifically, the test pen can be inserted into the clamping groove 19, and the test pen is fixed by the friction between the blocking strip 20 and the test pen. The ball head 18 is rotated to adjust the angle of the test pen according to the pins. The bolt 21 is tightened, and the ball head 18 is fixed by the bolt 21 abutting against the side wall of the ball head 18. During the test, only need to pull down the telescopic arm to make the test pen contact with the pins.
[0025] Working principle: The electrical component is placed in the test slot 12, the negative pressure adsorption component is turned on to adsorb and fix the electrical component. The test pen is fixed in the clamping groove 19 in advance. Pull down the telescopic arm, rotate the ball head 18 to adjust the test pen so that the test pen contacts the pins, and then tighten the bolt 21 to fix the ball head 18. When testing electrical components of the same specification subsequently, there is no need to adjust the angle of the test pen again, just pull down the telescopic arm directly, which is convenient and fast. By fixing the test pen through the telescopic arm and the test pen holder 5, the problem of hand-held shaking can be avoided.
[0026] The above describes the present invention and its implementation manners. Such description is not restrictive. What is shown in the drawings is only one of the implementation manners of the present invention, and the actual structure is not limited thereto. All in all, if those of ordinary skill in the art are inspired by it and design similar structural modes and embodiments without creative efforts without departing from the creative purpose of the present invention, they shall fall within the protection scope of the present invention.
Claims
1. An electronic component pin testing mechanism, characterized in that: It includes a test bench and a bracket fixedly connected to one side of the test bench. The test bench is of a hollow structure and is provided with a negative pressure adsorption assembly inside. The top of the bracket is fixedly connected with a telescopic arm, and the bottom end of the telescopic arm is fixedly connected with a test pen holder. The negative pressure adsorption assembly includes a first negative pressure pipe, a main suction head fixedly connected to one end of the first negative pressure pipe, a second negative pressure pipe communicated with the first negative pressure pipe, and a secondary suction head fixedly connected to one end of the second negative pressure pipe. Both the main suction head and the secondary suction head penetrate through the top of the test bench. The test pen holder includes a clamping plate and ball heads rotatably arranged at both ends of the clamping plate. A clamping groove for fixing the test pen is formed on the side wall of the ball head, and an opening groove matched with the clamping groove is formed on the side wall of the clamping plate. A bolt is threadedly connected to the side wall of the clamping plate, and the end of the bolt abuts against the outer wall of the ball head.
2. The pin testing mechanism for an electronic component according to claim 1, wherein: The front end of the clamping groove is a straight section, the rear side is an arc section, and a plurality of blocking strips are fixedly connected to the inner side of the arc section and are arranged uniformly from top to bottom.
3. An electronic component pin testing mechanism according to claim 1, characterized in that: The telescopic arm includes a rotating shaft arranged at the bottom of the bracket, a first folding arm hinged to the bottom of the rotating shaft, and a second folding arm hinged to the other end of the first folding arm. The test pen holder is fixedly connected to the bottom end of the second folding arm.
4. The pin testing mechanism for an electronic component according to claim 1, wherein: A test groove is formed on the top of the test bench. Both the main suction head and the secondary suction head are arranged inside the test groove. The main suction head is arranged at the center of the test groove, and there are four secondary suction heads which are evenly distributed around the main suction head.
5. The pin testing mechanism for an electronic component according to claim 4, wherein: Limit plates are arranged on two adjacent sides of the test groove. One side of the limit plate is rotatably connected with a screw rod which penetrates through the test bench and is threadedly connected with the test bench. A limit rod is also fixedly connected to one side of the limit plate, and the limit rod penetrates through the test bench and is slidably connected with the test bench.
6. The pin testing mechanism for an electronic component according to claim 1, characterized in that: A first solenoid valve is arranged on the first negative pressure pipe, and a second solenoid valve is arranged on the second negative pressure pipe.