Pin test circuit
By designing a pin test circuit and using the energy storage module and switch module to output pulse signals, the problem of inconvenient pulse resistance testing of chip pins is solved, and convenient and accurate testing results are achieved.
Patent Information
- Application Number
- CN202422091538.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-27
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2034-08-27
AI Technical Summary
The prior art lacks an effective way to verify the pulse resistance of chip pins under laboratory conditions, resulting in inconvenience in testing.
A pin testing circuit is designed, including energy storage module, switching module, driving module and control module. The energy storage module is charged through an external power supply, the switching module is controlled to turn on and off, and the pulse signal is output to test the pulse resistance of the chip pins.
It improves the convenience and accuracy of chip pin anti-pulse capability testing, and realizes efficient testing under laboratory conditions.
Smart Images
Figure CN223123175U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of chip testing, in particular to a pin testing circuit. Background Art
[0002] In the data sheet of the chip, there are test items such as the maximum limit value that electronic components can withstand. Under laboratory conditions, there is no verification method for high pulses. Usually, it needs to be sent to other testing institutions for auxiliary testing, which brings great inconvenience to the anti-pulse ability test of the chip pins. Content of the Utility Model
[0003] The utility model provides a pin testing circuit to improve the convenience and accuracy of the anti-pulse ability test of chip pins.
[0004] According to one aspect of the utility model, a pin testing circuit is provided, including: an energy storage module, a switch module, a driving module, and a control module;
[0005] One end of the energy storage module is connected to a power supply, and the other end of the energy storage module is connected to the first end of the switch module; the energy storage module is used to output a test signal to the pin to be tested during discharge;
[0006] The control end of the switch module is connected to the driving module, and the second end of the switch module is connected to the pin to be tested; the switch module is used to control the energy storage module to output a test signal to the pin to be tested according to the on or off state;
[0007] The driving module is connected to the control module, and the driving module is used to output a driving signal according to the control signal output by the control module to control the on or off of the switch module.
[0008] Optionally, the switch module includes a first transistor and a second transistor;
[0009] The first end of the first transistor is connected to the energy storage module, the second end of the first transistor is connected to the pin to be tested, and the control end of the first transistor is connected to the first end of the second transistor;
[0010] The control end of the second transistor is connected to the driving module, and the second end of the second transistor is grounded; the second transistor is used to control the on or off of the first transistor according to the driving signal output by the driving module.
[0011] Optionally, the driving module includes a third transistor and a fourth transistor;
[0012] The first end of the third transistor is connected to the power supply end of the control module, and the second end of the third transistor is respectively connected to the first end of the fourth transistor and the control end of the second transistor;
[0013] The second end of the fourth transistor is grounded, and the control end of the third transistor is respectively connected to the control end of the fourth transistor and the first control end of the control module.
[0014] Optionally, the switch module further includes a first resistor and a second resistor;
[0015] One end of the first resistor is connected to the first end of the first transistor, and the other end of the first resistor is connected to the control end of the first transistor;
[0016] One end of the second resistor is connected to the control end of the second transistor, and the other end of the second resistor is grounded.
[0017] Optionally, the drive module further includes a third resistor, a fourth resistor, a diode, a fifth resistor, a sixth resistor, and a triode;
[0018] One end of the third resistor is connected to the first control end of the control module, and the other end of the third resistor is respectively connected to the control end of the third transistor and the control end of the fourth transistor;
[0019] One end of the fourth resistor is connected to the anode of the diode, and the other end of the fourth resistor is respectively connected to the second end of the third transistor and the first end of the fourth transistor;
[0020] The cathode of the diode is connected to the control end of the second transistor;
[0021] One end of the fifth resistor is connected to the control end of the fourth transistor, and the other end of the fifth resistor is connected to the second end of the fourth transistor;
[0022] One end of the sixth resistor is connected to the control end of the second transistor, and the other end of the sixth resistor is connected to the first end of the triode;
[0023] The control end of the triode is connected to the anode of the diode, and the second end of the triode is grounded.
[0024] Optionally, the energy storage module includes at least one capacitor, and at least one of the capacitors is connected in parallel; the first end of the capacitor is connected to the power supply, and the second end of the capacitor is grounded.
[0025] Optionally, at least one of the capacitors is a variable capacitor and / or is detachably electrically connected.
[0026] Optionally, a voltage stabilizing module is further included. One end of the voltage stabilizing module is connected to the second end of the first transistor, and the other end of the voltage stabilizing module is grounded.
[0027] Optionally, a discharging module is further included. The discharging module includes a fifth transistor and a seventh resistor;
[0028] The first end of the fifth transistor is connected to the second end of the first transistor. The second end of the fifth transistor is connected in series with the seventh resistor and grounded. The control end of the fifth transistor is connected to the second control end of the control module.
[0029] Optionally, the control module is an MCU. The first transistor and the third transistor are P-type MOS transistors. The second transistor, the fourth transistor and the fifth transistor are N-type MOS transistors. The triode is a PNP-type triode.
[0030] The technical solution provided by the embodiment of the present invention charges the energy storage module through an external power supply. When the switching module is turned on, the energy storage module outputs a pulse signal to the pin to be tested. The height of the pulse signal is controlled by the amount of electric energy charged by the energy storage module, and the control module controls the driving module to drive the switching module to be turned on and off for a certain time, so as to control the width of the pulse signal output to the pin to be tested, thereby realizing the test of the anti-pulse ability of the pin under laboratory conditions, and improving the convenience and accuracy of the test of the anti-pulse ability of the chip pin.
[0031] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present invention, nor is it used to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. Description of the Drawings
[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.
[0033] Figure 1 It is a schematic structural diagram of a pin test circuit provided by an embodiment of the present invention;
[0034] Figure 2 It is a schematic structural diagram of another pin test circuit provided by an embodiment of the present invention;
[0035] Figure 3 It is a schematic structural diagram of a control module provided by an embodiment of the present invention. Detailed implementation manners
[0036] In order to enable those skilled in the art to better understand the solutions of the present utility model, the technical solutions in the embodiments of the present utility model will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments in the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.
[0037] It should be noted that the terms "first", "second", etc. in the description and claims of the present utility model and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that such used data can be interchanged under appropriate circumstances so that the embodiments of the present utility model described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.
[0038] Figure 1 This is a schematic structural diagram of a pin test circuit provided by an embodiment of the present utility model. Refer to Figure 1 , the pin test circuit includes: an energy storage module 100, a switch module 200, a driving module 300, and a control module 400; one end of the energy storage module 100 is connected to the power supply 10, and the other end of the energy storage module 100 is connected to the first end of the switch module 200; the energy storage module 100 is used to output a test signal to the pin 20 to be tested during discharge; the control end of the switch module 200 is connected to the driving module 300, and the second end of the switch module 200 is connected to the pin 20 to be tested; the switch module 200 is used to control the energy storage module 100 to output a test signal to the pin 20 to be tested according to the on or off state; the driving module 300 is connected to the control module 400, and the driving module 300 is used to output a driving signal according to the control signal output by the control module 400 to control the on or off of the switch module 200.
[0039] Specifically, the energy storage module 100 is charged by an external power supply 10 to store electrical energy. During testing, the energy storage module 100 releases the electrical energy stored during charging to output a pulse signal to the pin under test 20. The power supply 10 can be a DC power supply. After the energy storage module 100 is fully charged, it is disconnected from the power supply 10. The more electrical energy the energy storage module 100 stores when fully charged, the higher the height of the pulse signal output during testing. The first end of the switch module 200 is connected to the energy storage module 100, the second end of the switch module 200 is connected to the pin under test 20, and the control end of the switch module 200 is connected to the driving module 300. When the driving module 300 controls the switch module 200 to conduct, the pulse signal output by the energy storage module 100 is output to the pin under test 20 through the switch module 200; when the driving module 300 controls the switch module 200 to turn off, the energy storage module 100 and the pin under test 20 cannot form a path. The control module 400 is connected to the driving module 300. The control module 400 outputs a control signal to the driving module 300, so that the driving module 300 can control the on and off time of the switch module 200, thereby controlling the width of the pulse signal output from the energy storage module 100 to the pin under test 20. By controlling the amount of electrical energy stored in the energy storage module 100 when fully charged and the on and off time of the switch module 200, the height and width of the pulse signal output to the pin under test 20 are controlled, thereby realizing the test of the pulse resistance of the pin.
[0040] The technical solution provided by the embodiment of the present invention charges the energy storage module through an external power supply. When the switch module conducts, the energy storage module outputs a pulse signal to the pin under test 20. The height of the pulse signal is controlled by the amount of electrical energy stored in the energy storage module, and the on and off time of the driving module driving the switch module is controlled by the control module, thereby controlling the width of the pulse signal output to the pin under test 20, so that the test of the pulse resistance of the pin is realized under laboratory conditions, and the convenience and accuracy of the pulse resistance test of the chip pin are improved.
[0041] Optionally, Figure 2 is a schematic structural diagram of another pin test circuit provided by the embodiment of the present invention. On the basis of the above embodiment, see Figure 2 . The switch module 200 includes a first transistor Q1 and a second transistor Q2; the first end of the first transistor Q1 is connected to the energy storage module 100, the second end of the first transistor Q1 is connected to the pin under test 20, and the control end of the first transistor Q1 is connected to the first end of the second transistor Q2; the control end of the second transistor Q2 is connected to the driving module 300, and the second end of the second transistor Q2 is grounded; the second transistor Q2 is used to control the conduction or cut-off of the first transistor Q1 according to the driving signal output by the driving module 300.
[0042] Specifically, the first end of the first transistor Q1 is connected to the energy storage module 100, and the second end of the first transistor Q1 is connected to the pin to be tested 20. Thus, the first transistor Q1 directly controls the conduction and disconnection between the energy storage module 100 and the pin to be tested 20. The control end of the first transistor Q1 is connected to the first end of the second transistor Q2, the second end of the second transistor Q2 is grounded, and the control end of the second transistor Q2 is connected to the driving module 300. Thus, the conduction and cutoff of the first transistor Q1 are controlled by the second transistor Q2, so as to continuously output a pulse signal to the pin to be tested 20 to implement the anti-pulse ability test of the pin.
[0043] Exemplarily, as Figure 2 shown, the first transistor Q1 can be a P-type transistor, and the second transistor Q2 can be an N-type transistor. The first end of the first transistor Q1 can be the source electrode, and the source electrode of the first transistor Q1 is connected to the energy storage module 100; the second end of the first transistor Q1 can be the drain electrode, and the drain electrode of the first transistor Q1 is connected to the pin to be tested 20; the control end of the first transistor Q1 can be the gate electrode, the first end of the second transistor Q2 can be the drain electrode, and the gate electrode of the first transistor Q1 is connected to the drain electrode of the second transistor Q2; the second end of the second transistor Q2 can be the source electrode, and the source electrode of the second transistor Q2 is grounded; the control end of the second transistor Q2 can be the gate electrode, and the gate electrode of the second transistor Q2 is connected to the driving module 300. The driving module 300 controls the conduction and cutoff of the second transistor Q2 by controlling the magnitude of the gate voltage of the second transistor Q2, and further controls the magnitude of the gate voltage of the first transistor Q1, thereby controlling the conduction and cutoff of the first transistor Q1.
[0044] Optionally, on the basis of the above embodiment, continue to refer to Figure 2 . The driving module 300 includes a third transistor Q3 and a fourth transistor Q4; the first end of the third transistor Q3 is connected to the power supply terminal DVDD of the control module 400, and the second end of the third transistor Q3 is respectively connected to the first end of the fourth transistor Q4 and the control end of the second transistor Q2; the second end of the fourth transistor Q4 is grounded, and the control end of the third transistor Q3 is respectively connected to the control end of the fourth transistor Q4 and the first control end PB10 of the control module 400.
[0045] Specifically, the first control end PB10 of the control module 400 controls the conduction and cutoff of the third transistor Q3, thereby controlling the driving module 200 to output a control signal to the gate electrode of the second transistor Q2, thereby controlling the conduction and cutoff of the second transistor Q2. Exemplarily, as Figure 2As shown, the third transistor Q3 can be a P-type transistor, and the fourth transistor Q4 can be an N-type transistor. The first end of the third transistor Q3 can be the source, the second end of the third transistor Q3 can be the drain, and the control end of the third transistor Q3 can be the gate; the first end of the fourth transistor Q4 can be the drain, the second end of the fourth transistor Q4 can be the source, and the control end of the fourth transistor Q4 can be the gate. The drain of the third transistor Q3 is connected to the drain of the fourth transistor Q4 and is connected to the gate of the second transistor Q2. The gate of the third transistor Q3 is connected to the gate of the fourth transistor Q4 and is connected to the first control terminal PB10 of the control module 400, so that the third transistor Q3 and the fourth transistor Q4 can form a push-pull circuit structure. When the first control terminal PB10 of the control module 400 outputs a low-level signal, the third transistor Q3 is turned on, and the fourth transistor Q4 is turned off. The high-level signal output by the power supply terminal DVDD of the control module 400 is output to the gate of the second transistor Q2 through the third transistor Q3, so as to control the second transistor Q2 to be turned on, so that the gate of the first transistor Q1 is grounded through the turned-on second transistor Q2, so that the first transistor Q1 is turned on, and the energy storage module 100 outputs a pulse signal to the pin under test 20 through the first transistor Q1. When the first control terminal PB10 of the control module 400 outputs a high-level signal, the fourth transistor Q4 is turned on, the third transistor Q3 is turned off, and the gate of the second transistor Q2 cannot receive the high-level signal output by the power supply terminal DVDD of the control module 400, so that the second transistor Q2 and then the first transistor Q1 are turned off, so as to realize controlling the width of the pulse signal output to the pin under test 20 by controlling the on and off time of the first transistor Q1.
[0046] Optionally, on the basis of the above embodiment, continue to refer to Figure 2 . The switch module 200 further includes a first resistor R1 and a second resistor R2; one end of the first resistor R1 is connected to the first end of the first transistor Q1, and the other end of the first resistor R1 is connected to the control end of the first transistor Q1; one end of the second resistor R2 is connected to the control end of the second transistor Q2, and the other end of the second resistor R2 is grounded.
[0047] Specifically, one end of the first resistor R1 is connected to the source electrode of the first transistor Q1, and the other end of the first resistor R1 is connected to the gate electrode of the first transistor Q1. When the second transistor Q2 is turned on, the gate electrode of the first transistor Q1 is grounded through the turned-on second transistor Q2. A voltage difference is formed between the source electrode and the gate electrode of the first transistor Q1 through the first resistor R1, thereby turning on the first transistor Q1. One end of the second resistor R2 is connected to the gate electrode of the second transistor Q2, and the other end of the second resistor R2 is connected to the source electrode of the second transistor Q2 and grounded. When the driving module 300 outputs a high-level driving signal, a voltage difference is formed between the source electrode and the gate electrode of the second transistor Q2 through the second resistor R2 to control the second transistor Q2 to turn on.
[0048] Optionally, on the basis of the above embodiment, continue to refer to Figure 2 . The driving module 300 further includes a third resistor R3, a fourth resistor R4, a diode D1, a fifth resistor R5, a sixth resistor R6, and a triode M1. One end of the third resistor R3 is connected to the first control terminal PB10 of the control module 400, and the other end of the third resistor R3 is respectively connected to the control terminals of the third transistor Q3 and the fourth transistor Q4. One end of the fourth resistor R4 is connected to the anode of the diode D1, and the other end of the fourth resistor R4 is respectively connected to the second terminal of the third transistor Q3 and the first terminal of the fourth transistor Q4. The cathode of the diode D1 is connected to the control terminal of the second transistor Q2. One end of the fifth resistor R5 is connected to the control terminal of the fourth transistor Q4, and the other end of the fifth resistor R5 is connected to the second terminal of the fourth transistor Q4. One end of the sixth resistor R6 is connected to the control terminal of the second transistor Q2, and the other end of the sixth resistor R6 is connected to the first terminal of the triode M1. The control terminal of the triode M1 is connected to the anode of the diode D1, and the second terminal of the triode M1 is grounded.
[0049] Specifically, one end of the third resistor R3 is connected to the first control terminal PB10 of the control module 400, and the other end of the third resistor R3 is respectively connected to the gates of the third transistor Q3 and the fourth transistor Q4. The resistance values of the third resistor R3 and the fourth resistor R4 are small, so that interference signals in the input signal and output signal of the driving module 300 can be filtered, preventing misoperation of the driving module 300. Exemplarily, the third resistor R3 and the fourth resistor R4 can be 1 ohm. The anode of the diode D1 is connected to one end of the fourth resistor R4, and the cathode of the diode D1 is connected to the gate of the second transistor Q2. Thus, when a low-level signal is output at the first control terminal PB10 of the control module 400, the third transistor Q3 is turned on, and the high-level signal output from the power supply terminal DVDD of the control module 400 is output to the gate of the second transistor Q2 through the unidirectionally conductive diode D1. One end of the fifth resistor R5 is connected to the gate of the fourth transistor, and the other end of the fifth resistor R5 is connected to the source of the fourth transistor Q4 and grounded, thereby improving the pull-down speed when the fourth transistor Q4 is turned off when a low-level signal is output at the first control terminal PB10 of the control module 400. Exemplarily, as Figure 2 shown, the triode M1 can be a PNP-type triode. The first end of the triode M1 is the collector, the second end of the triode M1 is the emitter, and the control end of the triode M1 is the base. One end of the sixth resistor R6 is connected to the gate of the second transistor Q2, the other end of the sixth resistor R6 is connected to the collector of the triode M1, the base of the triode M1 is connected to the anode of the diode D1, and the emitter of the triode M1 is grounded, thereby further improving the pull-down speed of the turn-off.
[0050] Optionally, on the basis of the above embodiment, continue to refer to Figure 2 . The energy storage module 100 includes at least one capacitor, and at least one capacitor is connected in parallel; the first end of the capacitor is connected to the power supply EX-PW, and the second end of the capacitor is grounded.
[0051] Specifically, the energy storage module 100 can be composed of multiple capacitors connected in parallel. When the energy storage module 100 is charged, the first ends of the multiple capacitors can be connected to the external power supply EX-PW, and the other ends of the multiple capacitors can be commonly grounded. After charging is completed, the energy storage module 100 is disconnected from the external power supply EX-PW. The present invention does not make specific limitations on the capacitance value and quantity of the capacitors here. Exemplarily, as Figure 2 shown, three capacitors, namely capacitor C1, capacitor C2, and capacitor C3, are provided in the energy storage module 100.
[0052] Optionally, on the basis of the above embodiment, continue to refer to Figure 2 . At least one capacitor is a variable capacitor and / or is detachably electrically connected.
[0053] Specifically, the greater the electric energy stored when the energy storage module 100 is fully charged, the higher the height of the pulse signal output during testing. The electric energy stored when the energy storage module 100 is fully charged can be adjusted by changing the capacitance value of the capacitor set in the energy storage module 100. The capacitor in the energy storage module 100 can be a variable capacitance capacitor and / or a fixed capacitance capacitor that can be disassembled and replaced. Exemplarily, as Figure 2 shown, the first capacitor C1 is a variable capacitor, and the capacitors C2 and C3 are capacitors that can be disassembled and replaced.
[0054] Optionally, on the basis of the above embodiment, continue to refer to Figure 2 . The pin test circuit further includes a voltage stabilizing module 500. One end of the voltage stabilizing module 500 is connected to the second end of the first transistor Q1, and the other end of the voltage stabilizing module is grounded.
[0055] Specifically, the voltage stabilizing module 500 can be a voltage stabilizing diode DZ1. The anode of the voltage stabilizing diode DZ1 is grounded, and the cathode of the voltage stabilizing diode DZ1 is connected to the drain of the first transistor Q1, thereby clamping the voltage output to the pin 20 to be tested and preventing damage to the pin caused by excessive voltage of the test pulse signal.
[0056] Optionally, on the basis of the above embodiment, continue to refer to Figure 2 . It further includes a discharging module 600. The discharging module 600 includes a fifth transistor Q5 and a seventh resistor R7; the first end of the fifth transistor Q5 is connected to the second end of the first transistor Q1, the second end of the fifth transistor Q5 is connected in series with the seventh resistor R7 and grounded, and the control end of the fifth transistor Q5 is connected to the second control end PB11 of the control module 400.
[0057] Specifically, the fifth transistor Q5 can be an N-type transistor. The first end of the fifth transistor Q5 can be the drain, the drain of the fifth transistor Q5 is connected to the drain of the first transistor Q1, the second end of the fifth transistor Q5 can be the source, the source of the fifth transistor Q5 is connected in series with the seventh resistor R7 and grounded, and the control end of the fifth transistor Q5 can be the gate, and the gate of the fifth transistor Q5 is connected to the second control end PB11 of the control module 400. After the test is completed, if there is still residual electric energy in the energy storage module 100, the control module 400 can make the fifth transistor Q5 conduct to discharge the residual electric energy of the energy storage module 100 by controlling the second control end PB11.
[0058] Optionally, Figure 3 is a schematic structural diagram of a control module provided by an embodiment of the present invention. On the basis of the above embodiment, refer to Figure 2 and Figure 3. The control module 400 is an MCU (Microcontroller Unit), the first transistor Q1 and the third transistor Q3 are P-type MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors), the second transistor Q2, the fourth transistor Q4 and the fifth transistor Q5 are N-type MOSFETs, and the triode M1 is a PNP-type triode.
[0059] Specifically, the control module 400 can be an MCU. The MCU includes multiple external pins. Exemplarily, as Figure 3 shown, the first control terminal PB10 of the control module 400 can be the 29th pin, which is used to control the conduction and cut-off of the third transistor Q3. The second control terminal PB10 of the control module 400 can be the 30th pin, which is used to control the conduction and cut-off of the fifth transistor Q5 for discharging. The power supply terminal DVDD of the control module 400 can be the 64th pin, which is used to output a control signal to the driving module 300 to control the conduction and cut-off of the second transistor Q2. The 1st pin of the MCU can be connected to the power supply VCC to supply power to the inside of the MCU and the external devices of each output pin. The power supply VCC is also connected to the 64th pin of the MCU through a light-emitting diode. When the MCU is powered on and running, the light-emitting diode lights up, so as to conveniently observe whether the MCU is powered on. The 7th pin of the MCU can be externally connected to a reset circuit RST, which is used to control the MCU to power on manually and re-run the program for testing.
[0060] It should be understood that various forms of the processes shown above can be used, reordering, adding or deleting steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in a different order, as long as the desired results of the technical solution of the present invention can be achieved, and no limitation is made herein.
[0061] The above specific embodiments do not constitute a limitation on the protection scope of the present invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.
Claims
1. A pin test circuit, characterized in that, Comprising: An energy storage module, a switching module, a driving module and a control module; One end of the energy storage module is connected to a power supply, and the other end of the energy storage module is connected to the first end of the switching module; the energy storage module is used to output a test signal to a pin to be tested during discharge; The control end of the switching module is connected to the driving module, and the second end of the switching module is connected to the pin to be tested; the switching module is used to control the energy storage module to output a test signal to the pin to be tested according to the on or off state; The driving module is connected to the control module, and the driving module is used to output a driving signal according to the control signal output by the control module to control the on or off of the switching module.
2. The pin test circuit according to claim 1, wherein The switching module includes a first transistor and a second transistor; The first end of the first transistor is connected to the energy storage module, the second end of the first transistor is connected to the pin to be tested, and the control end of the first transistor is connected to the first end of the second transistor; The control end of the second transistor is connected to the driving module, and the second end of the second transistor is grounded; the second transistor is used to control the on or off of the first transistor according to the driving signal output by the driving module.
3. The pin test circuit according to claim 2, wherein The driving module includes a third transistor and a fourth transistor; The first end of the third transistor is connected to the power supply terminal of the control module, and the second end of the third transistor is respectively connected to the first end of the fourth transistor and the control end of the second transistor; The second end of the fourth transistor is grounded, and the control end of the third transistor is respectively connected to the control end of the fourth transistor and the first control end of the control module.
4. The pin test circuit according to claim 2, wherein The switching module further includes a first resistor and a second resistor; One end of the first resistor is connected to the first end of the first transistor, and the other end of the first resistor is connected to the control end of the first transistor; One end of the second resistor is connected to the control end of the second transistor, and the other end of the second resistor is grounded.
5. The pin test circuit according to claim 3, wherein The driving module further includes a third resistor, a fourth resistor, a diode, a fifth resistor, a sixth resistor and a triode; One end of the third resistor is connected to the first control end of the control module, and the other end of the third resistor is respectively connected to the control end of the third transistor and the control end of the fourth transistor; One end of the fourth resistor is connected to the anode of the diode, and the other end of the fourth resistor is respectively connected to the second end of the third transistor and the first end of the fourth transistor; The cathode of the diode is connected to the control end of the second transistor; One end of the fifth resistor is connected to the control end of the fourth transistor, and the other end of the fifth resistor is connected to the second end of the fourth transistor; One end of the sixth resistor is connected to the control end of the second transistor, and the other end of the sixth resistor is connected to the first end of the triode; The control end of the triode is connected to the anode of the diode, and the second end of the triode is grounded.
6. The pin test circuit according to claim 1, wherein The energy storage module includes at least one capacitor, and at least one of the capacitors is connected in parallel; a first end of the capacitor is connected to the power supply, and a second end of the capacitor is grounded.
7. The pin test circuit according to claim 6, wherein At least one of the capacitors is a variable capacitor and / or is detachably electrically connected.
8. The pin test circuit according to claim 2, wherein It further includes a voltage stabilizing module, one end of the voltage stabilizing module is connected to a second end of the first transistor, and the other end of the voltage stabilizing module is grounded.
9. The pin test circuit according to claim 5, wherein It further includes a discharging module, and the discharging module includes a fifth transistor and a seventh resistor; A first end of the fifth transistor is connected to a second end of the first transistor, a second end of the fifth transistor is connected in series with the seventh resistor and is grounded, and a control end of the fifth transistor is connected to a second control end of the control module.
10. The pin test circuit according to claim 9, wherein The control module is an MCU, the first transistor and the third transistor are P-type MOS transistors, the second transistor, the fourth transistor and the fifth transistor are N-type MOS transistors, and the triode is a PNP-type triode.