Tray assembly
By designing the concave and convex test position structure of the tray assembly, the problems of low flip efficiency and high mold cost of the lens module are solved, and the fast, stable flip and efficient test of the lens module are achieved.
Patent Information
- Application Number
- CN202422428116.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-08
- Publication Date
- 2025-07-22
- Estimated Expiration
- 2034-10-08
AI Technical Summary
In the production process of lens modules, the prior art requires manual transfer of lens modules from one test tray to another for front and back test of lens modules, which results in time-consuming and labor-consuming, low flip efficiency, and easy to damage the lens module. At the same time, two sets of molds are required to increase costs.
A tray assembly is designed, in which the surfaces of the two disk bodies are respectively provided with recessed and convex test positions, so that the lens module can be quickly flipped through overlapping, and the position of the object to be tested is limited by using the test positions of the two disk bodies to be tested to ensure stability and protection during the flip process.
It realizes rapid flip of the lens module, reduces manual operation, improves test efficiency, reduces damage risk, and reduces mold cost.
Smart Images

Figure CN223138951U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic component testing, and particularly to a tray assembly. Background Art
[0002] During the production process of a lens module, it is usually necessary to test both the front and back sides of the lens module. For example, after testing the side with the lens facing up, the back side is then tested. In the related art, trays of two different specifications are usually used to test the lens module. Therefore, when switching the test surface of the lens module, it is necessary to manually use tweezers to transfer the lens module from one test tray to another. Since a tray usually carries multiple lens modules, manually transferring each lens module one by one is time-consuming and laborious, and the lens flipping efficiency is low, affecting the test efficiency of the lens module. Summary of the Utility Model
[0003] An embodiment of this application discloses a tray assembly for improving the flipping efficiency of the test surface of a lens module.
[0004] To achieve the above object, this application discloses a tray assembly, including:
[0005] Multiple disk bodies, the multiple disk bodies are stacked along a first direction; the disk body includes:
[0006] A first surface, on which a plurality of first test positions are recessed, and the first test positions are configured to place an object to be tested;
[0007] A second surface, the second surface is opposite to the first surface along the first direction, and a plurality of second test positions are protruded on the second surface;
[0008] Among two adjacent stacked disk bodies, the first test position of one of the disk bodies is correspondingly and cooperatively connected with the second test position of the other disk body to limit the position of the object to be tested;
[0009] Wherein, the first direction is the thickness direction of the disk body.
[0010] As an optional implementation manner, the first test position is recessed from the first surface towards the second surface to form a protruding portion on the second surface, and the protruding portion forms the second test position.
[0011] As an optional implementation manner, the first test position includes a first supporting portion and a first limiting portion, the first supporting portion is configured to place the object to be tested, the first limiting portion is arranged on the outer periphery of the supporting portion, and the first limiting portion is configured to limit the position of the object to be tested on the first supporting portion.
[0012] As an alternative implementation, there are a plurality of the first limiting portions, and the plurality of the first limiting portions are arranged at intervals along the outer periphery of the first supporting portion. The interval portion between two adjacent ones of the first limiting portions is recessed along the first direction to form a second limiting portion protruding on the second surface;
[0013] The second test position includes a second supporting portion and a plurality of the second limiting portions. The second supporting portion is arranged corresponding to the first supporting portion, and the plurality of the second limiting portions are arranged at intervals along the outer periphery of the second supporting portion.
[0014] As an alternative implementation, the first supporting portion includes a first sub-supporting portion and a second sub-supporting portion. The first sub-supporting portion is connected to the second sub-supporting portion. The first sub-supporting portion is configured to support the main body portion of the object to be tested, and the second sub-supporting portion is configured to support the extension portion of the object to be tested. The first limiting portion is located on the outer periphery of the first sub-supporting portion.
[0015] As an alternative implementation, a first convex portion is further provided on the first surface. The first convex portion is located on the outer periphery of the first test position, and the first convex portion is configured to abut against the second surface of another disk body when two adjacent disk bodies are stacked.
[0016] As an alternative implementation, the second test position includes a second supporting portion and a second limiting portion. The second limiting portion is provided on the outer periphery of the second supporting portion, and the second limiting portion protrudes from the second supporting portion along the first direction.
[0017] As an alternative implementation, the second limiting portion and the second supporting portion enclose a limiting space. A step portion is provided on the second limiting portion. Along the first direction, the step portion is located between the end surfaces of the second supporting portion and the second limiting portion, and the step portion is configured to carry the object to be tested after being turned over.
[0018] As an alternative implementation, the disk body further includes a surrounding portion. The surrounding portion protrudes from the second surface and encloses a stacking space with the second surface. The surrounding portion is provided with a protruding second convex portion. The second convex portion extends to be connected to the second surface. A step surface is formed between the second convex portion and the surrounding portion. In two stacked disk bodies, the step surface of one of the disk bodies abuts against the surface of the surrounding portion of the other disk body facing the first surface.
[0019] As an alternative embodiment, a second convex portion is formed by the surface of the enclosure portion located outside the overlapping space being recessed towards the inside of the overlapping space. The second convex portion is provided with a plurality of breaks so that the second convex portion forms a plurality of sub-portions. The surface of the enclosure portion located outside the overlapping space is recessed at positions corresponding to the sub-portions to form a plurality of sub-recessed portions, and the sub-recessed portions are configured to receive the user's fingers to lift the tray body.
[0020] Compared with the prior art, the beneficial effects of the present application are as follows:
[0021] The present application discloses a tray assembly, including a plurality of tray bodies stacked in sequence along their own thickness directions. The tray body includes a first surface and a second surface. The first surface is provided with a plurality of recessed first test positions, and the second surface is provided with a plurality of protruding second test positions. Among two adjacent stacked tray bodies, the first test position of one tray body is cooperatively connected with the test position of the other tray body to limit the position of the object to be tested in the test position. The present application uses the tray bodies of the tray assembly to support the object to be tested, and at least two tray bodies are used. For example, first test the object to be tested in the first test position of one tray body. After the test is completed, use the second test position of another tray body to cooperatively connect with the first test position of this tray body, so that the first test position is aligned with the second test position, and then flip the two tray bodies. The object to be tested enters the second test position from the first test position. Therefore, the object to be tested can be quickly flipped from one side to the other side. Also, since the tray body has a plurality of test positions, technicians can quickly flip a plurality of objects to be tested at the same time. In this way, rapid transfer and flipping of a plurality of objects to be tested can be achieved. When the object to be tested is a lens module, it is beneficial to improve the test efficiency of the lens module. Description of the Drawings
[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required to be used in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0023] Figure 1 is a schematic structural diagram of a tray assembly disclosed in an embodiment of the present application;
[0024] Figure 2 is another schematic structural diagram of a tray assembly disclosed in an embodiment of the present application;
[0025] Figure 3 is Figure 1 an enlarged view of part A in
[0026] Figure 4 is Figure 2 an enlarged view of part B in
[0027] Figure 5 is a schematic structural view of a disk body disclosed in an embodiment of the present application;
[0028] Figure 6 is Figure 5 an enlarged view of position C in
[0029] Figure 7 is another schematic structural view of the disk body disclosed in an embodiment of the present application.
[0030] Description of reference numerals:
[0031] 100, tray assembly; 1, disk body; 1a, first surface; 1b, second surface; 11, first test position; 111, first supporting portion; 111a, first sub-supporting portion; 111b, second sub-supporting portion; 112, first limiting portion; 12, second test position; 12a, limiting space; 121, second supporting portion; 122, second limiting portion; 122a, stepped portion; 13, first convex portion; 14, enclosing portion; 1c, overlapping space; 15, second convex portion; 15a, stepped surface; 151, sub-portion; 152, sub-recessed portion; 200, object to be tested; 201, main body portion; 202, extended portion;
[0032] X, first direction (thickness direction). Detailed implementation manners
[0033] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.
[0034] In the present application, the orientation or positional relationship indicated by terms such as "upper", "lower", "inner", "outer", "middle", etc. is based on the orientation or positional relationship shown in the accompanying drawings. These terms are mainly used to better describe the present application and its embodiments, and are not used to limit that the indicated device, element or component must have a specific orientation, or be constructed and operated in a specific orientation.
[0035] Moreover, in addition to being able to represent the orientation or positional relationship, some of the above terms may also be used to represent other meanings. For example, the term "upper" may also be used to represent a certain attachment relationship or connection relationship in some cases. For those of ordinary skill in the art, the specific meanings of these terms in the present application can be understood according to specific situations.
[0036] In addition, the terms "installed", "set up", "provided with", and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral structure; it can be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, or there can be internal communication between two devices, components, or parts. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0037] In addition, the terms "first", "second", etc. are mainly used to distinguish different devices, components, or parts (the specific types and structures may be the same or different), and are not used to indicate or imply the relative importance and quantity of the indicated devices, components, or parts. Unless otherwise specified, the meaning of "a plurality" is two or more.
[0038] In the production process of a lens module, it is usually necessary to test both the front and back sides of the lens module. For example, first test the side with the lens facing up, and then turn over the lens module to test the other side. In the related art, two different specifications of trays are usually used to test the lens module. For example, first use a tray to hold the lens module. After the test of the side with the lens facing up of the lens module is completed, the technician needs to transfer the lens module originally on one tray to another tray for testing. Since multiple lens modules are carried on the tray at the same time, the technician needs to transfer the lens modules one by one, which is time-consuming and laborious, and the turnover transfer efficiency is low, affecting the test efficiency of the lens module. Moreover, the lens module is small, and the transfer process usually uses tweezers to hold it. Using manual transfer is likely to cause damage to the lens module. In addition, when using two different trays to carry different sides of the same lens module respectively, two sets of molds need to be opened during the production of the trays, and the cost is relatively high.
[0039] Based on this, the present application discloses a tray assembly, and two different surfaces of a single tray can be adapted to two different test surfaces of the lens module. For example, place multiple lens modules on one surface of a tray, then cover this surface with the other surface of another tray, and then turn it over, and the simultaneous turnover of multiple lens modules can be quickly realized. The more trays are stacked, the more lens modules can be turned over simultaneously. In this way, the use of manpower is reduced, the turnover efficiency of the lens module is improved, and it is also beneficial to reduce the damage to the lens module during the manual transfer of the lens module. Moreover, the two different surfaces of the two trays can be mutually engaged, which is beneficial to maintaining the stability of the lens module during turning over, and when multiple trays are stacked, the overall thickness of the tray assembly can also be reduced. In addition, when producing the trays, all the trays of the tray assembly adopt the same component, which is beneficial to reducing the mold opening cost of the tray mold.
[0040] The technical solution of the present application will be further described below in conjunction with embodiments and the accompanying drawings.
[0041] Please refer to Figure 1 and Figure 2 , the present application discloses a tray assembly 100, which includes a plurality of trays 1, and the plurality of trays 1 are stacked one by one along the first direction X. One of the trays 1 includes a first surface 1a and a second surface 1b, and the second surface 1b is arranged opposite to the first surface 1a along the first direction X. The first surface 1a is provided with a plurality of recessed first test positions 11, and the first test positions 11 are configured to place the object to be tested 200. The second surface 1b is provided with a plurality of protruding second test positions 12, and the second test positions 12 are configured to place the object to be tested 200 after being flipped. In two adjacent stacked trays 1, the first test position 11 of one of the trays 1 is correspondingly and cooperatively connected to the second test position 12 of the other tray 1 to limit the position of the object to be tested 200.
[0042] In other words, when two trays 1 are stacked, the first test position 11 and the second test position 12 can be mutually engaged. Specifically, after the tray assembly 100 is flipped, the object to be tested 200 can fall from the first test position 11 onto the second test position 12, and the test surface of the object to be tested 200 is flipped, thereby realizing the flipping of the object to be tested 200. The increase in the first test positions 11 and the second test positions 12 of the tray 1, as well as the increase in the number of trays 1, can increase the objects to be tested 200 that are flipped simultaneously. Moreover, during the flipping process, the mutual engagement of the first test position 11 and the second test position 12 is beneficial to preventing the object to be tested 200 from falling during the flipping process. In this way, after the technician flips the tray assembly 100, the flipping of multiple objects to be tested 200 can be quickly realized, without the need to flip the objects to be tested 200 one by one manually, and the object to be tested 200 can be protected during the flipping process, which is beneficial to improving the test efficiency of the object to be tested 200 while protecting the object to be tested 200.
[0043] Optionally, the object to be tested 200 may be, but is not limited to, electronic devices such as a lens module, a sensor module, a speaker module, etc., and the present application does not make specific limitations here. In the following, the object to be tested is taken as an example of a lens module for description.
[0044] It should be noted that in Figure 1 the example shown, the direction indicated by X is the first direction X, and the first direction X may be the thickness direction of the tray 1.
[0045] It can be understood that the flipping of the object 200 to be tested requires at least two disk bodies 1 to be stacked and connected. The number of the tray assemblies 100 can also be three, four, five, six, seven, eight, nine, ten, etc., which is beneficial to supporting more objects 200 to be tested, so that more objects 200 to be tested can be flipped simultaneously.
[0046] In some embodiments, the first test position 11 is recessed from the first surface 1a towards the second surface 1b to form a protruding portion on the second surface 1b, and this protruding portion is formed as the second test position 12. In one example, stamping is performed on the first surface 1a so that the first surface 1a is recessed to form the first test position 11. At the same time, it can protrude on the second surface 1b to form the second test position 12. In another example, when manufacturing the disk body 1, the first test position 11 and the second test position 12 can be integrally injection-molded, so that the second test position 12 protrudes corresponding to the first test position 11, and the first test position 11 is recessed corresponding to the second test position 12. That is, the first test position 11 and the second test position 12 can be processed and formed at one time. That is to say, when multiple disk bodies 1 of the present application are stacked in sequence, the first test positions 11 and the second test positions 12 between the respective disk bodies 1 can be mutually embedded, and the degree of embedding is high, which is beneficial to reducing the fitting gap between two disk bodies 1 when the multiple disk bodies 1 are stacked, so as to facilitate stacking multiple disk bodies 1 at one time.
[0047] Please refer to Figure 3 , optionally, the first test position 11 includes a first supporting portion 111 and a first limiting portion 112. The first supporting portion 111 is configured to place the object 200 to be tested, and the first limiting portion 112 is arranged on the outer periphery of the first supporting portion 111. The first limiting portion 112 is configured to limit the position of the object 200 to be tested in the first supporting portion 111. Exemplarily, taking the object 200 to be tested as a lens module, during the testing process of the lens module, the lens module is placed in the first supporting portion 111. In order to enable the lens module to be more accurately aligned with the testing device during testing, a first limiting portion 112 is arranged on the outer periphery of the first supporting portion 111, so as to limit the position of the lens module in the first supporting portion 111, prevent the position of the lens module in the first supporting portion 111 from changing when it is transported to the testing device, and avoid the situation of inaccurate testing.
[0048] Please refer to together Figure 3 and Figure 4, optionally, there are multiple first limiting parts 112, and the multiple first limiting parts 112 are arranged at intervals along the outer circumference of the first supporting part 111. The interval part between two adjacent first limiting parts 112 is recessed along the first direction X, so as to form a second limiting part 122 protruding on the second surface 1b. The second test position 12 includes a second supporting part 121 and multiple second limiting parts 122. The second supporting part 121 is arranged corresponding to the first supporting part 111, and the multiple second limiting parts 122 are arranged at intervals along the outer circumference of the second supporting part 121. On the one hand, for the accuracy of positioning the object to be tested 200 during the test, multiple first limiting parts 112 are arranged on the outer circumference of the first supporting part 111. In other words, when the object to be tested 200 is located on the first supporting part 111, the multiple first limiting parts 112 are arranged on the outer circumference of the object to be tested 200. On the other hand, when the object to be tested 200 is turned over and placed on the second supporting part 121, the second limiting parts 122 arranged on the outer circumference of the second supporting part 121 can limit the object to be tested 200 located on the second supporting part 121, so as to prevent the position of the object to be tested 200 from moving in the second supporting part 121.
[0049] In addition, since the second limiting part 122 is formed by the interval part between two first limiting parts 112 protruding on the second surface 1b, for example, when the two discs 1 are cooperatively connected to each other, the second limiting part 122 can extend into the interval between the two first limiting parts 112, so that the first limiting part 112 and the second limiting part 122 are fitted and connected, thereby preventing the second limiting part 122 protruding on the second surface 1b from abutting against the first surface 1a when the two discs 1 are cooperatively connected, and preventing the situation that the two discs 1 cannot be effectively cooperatively connected.
[0050] In some other embodiments, the second test position 12 includes a second supporting portion 121 and a second limiting portion 122. The second limiting portion 122 is disposed on the outer periphery of the second supporting portion 121. The second limiting portion 122 protrudes from the second supporting portion 121 along the first direction X. When the two disk bodies 1 are cooperatively connected, the second limiting portion 122 corresponds to the spaced portion between the two first limiting portions 112. That is, the second limiting portion 122 can be formed by protruding alone on the second surface 1b, rather than being formed by protruding along the first direction X on the second surface 1b at the interval between the two first limiting portions 112. During the process of cooperatively connecting the two disk bodies 1, the second limiting portion 122 can be engaged and connected with the spaced portion between the two first limiting portions 112. In the present application, the second limiting portion 122 is provided on the second surface 1b and on the outer periphery of the second supporting portion 121. Considering that when the object to be tested 200 is placed upside down on the second supporting portion 121, the second limiting portion 122 provided on the outer periphery of the second supporting portion 121 can limit the object to be tested 200 located on the second supporting portion 121 to prevent the position of the object to be tested 200 from moving in the second supporting portion 121. Moreover, the second limiting portion 122 can extend into the interval between the two first limiting portions 112, so that the spaced portion of the two first limiting portions 112 can be engaged and connected with the second limiting portion 122, thereby preventing the second limiting portion 122 protruding on the second surface 1b from abutting against the first surface 1a when the two disk bodies 1 are cooperatively connected, and preventing the situation where the two disk bodies 1 cannot be effectively cooperatively connected.
[0051] Optionally, the shapes of the first limiting portion 112 and the second limiting portion 122 can be, but are not limited to, a square prism, a cylinder, a trapezoidal prism, etc. The present application does not make specific limitations here.
[0052] Please refer to Figure 4 , it can be understood that taking the object to be tested 200 as a lens module as an example, when the lens module is placed in the first test position 11 for testing, the lens of the lens module faces upward. When the object to be tested 200 is turned over and located in the second test position 12, the lens faces downward. Considering the protection of the lens, optionally, the second limiting portion 122 and the second supporting portion 121 enclose a limiting space 12a, and a step portion 122a is provided on the second limiting portion 122. Along the first direction X, the step portion 122a is located between the second supporting portion 121 and the end face of the second limiting portion 122, and the step portion 122a is configured to carry the turned-over object to be tested 200. Exemplarily, when the lens module is placed on the step portion 122a, the edge of the lens module is supported by the step portion 122a, and the lens of the lens module is spaced from the second supporting portion 121. In this way, the lens of the lens module will not collide with the second supporting portion 121 after being turned over, thereby avoiding the situation where the lens is damaged.
[0053] Please refer to together Figure 5 and Figure 6, taking the lens module 200 as the object to be tested as an example, the lens module usually includes a main lens part and an external circuit board part. In order to enable the first supporting part 111 to effectively place the object to be tested 200, in some embodiments, the first supporting part 111 includes a first sub-supporting part 111a and a second sub-supporting part 111b. The first sub-supporting part 111a is connected to the second sub-supporting part 111b. The first sub-supporting part 111a is configured to support the main body part 201 of the object to be tested 200, and the second sub-supporting part 111b is configured to support the external part 202 of the object to be tested 200. The first limiting part 112 is located on the outer periphery of the first sub-supporting part 111a. Exemplarily, when the lens module is placed at the first test position 11, the lens main body part 201 is located on the first sub-supporting part 111a, and the external circuit board part is located on the second sub-supporting part 111b. In this application, the object to be tested 200 is supported separately by the first sub-supporting part 111a and the second sub-supporting part 111b, so that the object to be tested 200 can be effectively flattened at the first test position 11 for testing. Moreover, the first limiting part 112 is located on the first sub-supporting part 111a. When the first limiting part 112 limits the lens main body part 201 of the lens module, it is convenient for the testing device to better test the lens main body part 201.
[0054] Optionally, the shapes of the first sub-supporting part 111a and the second sub-supporting part 111b can be square grooves or adapted to the shapes of the main body part 201 and the external part 202 of the object to be tested 200. This application does not make specific limitations here.
[0055] It can be understood that the second supporting part 121 also has two sub-supporting parts correspondingly arranged at the first test position 11 to facilitate the placement of the object to be tested 200.
[0056] Please refer to Figure 6 , in some embodiments, a first convex part 13 is further provided on the first surface 1a. The first convex part 13 is located on the outer periphery of the first test position 11. The first convex part 13 is configured to abut against the second surface 1b of another disk body 1 when two adjacent disk bodies 1 are stacked. Exemplarily, when two disk bodies 1 are stacked, the first convex part 13 of one disk body 1 abuts against the second surface 1b of another disk body 1 and the first convex part 13 is located on the outer periphery of the second limiting part 122 of another disk body 1. In this way, the first convex part 13 of one disk body 1 catches the second limiting part 122 of another disk body 1, thereby restricting the movement of the two disk bodies 1 in the plane direction of the first surface 1a and preventing the two disk bodies 1 from separating when flipped, which is beneficial to enhancing the mating connection strength of the two disk bodies 1.
[0057] Please refer to Figure 7, Considering further enhancing the mating connection strength between the two disk bodies 1, in some embodiments, the disk body 1 further includes a surrounding portion 14. The surrounding portion 14 protrudes from the second surface 1b and encloses a stacking space 1c on the second surface 1b. The surrounding portion 14 is provided with a protruding second convex portion 15, and the second convex portion 15 extends to be connected to the second surface 1b. A stepped surface 15a is formed between the second convex portion 15 and the surrounding portion 14. Among the two mutually stacked disk bodies 1, the stepped surface 15a of one disk body 1 abuts against one surface of the surrounding portion 14 of the other disk body 1 facing the first surface 1a. That is to say, when the two disk bodies 1 are stacked, the surrounding portions 14 of the two disk bodies 1 are connected to each other, and the surrounding portion 14 and the second surface 1b of one disk body 1 enclose the first surface 1a of the other disk body 1. In this way, when the two disk bodies 1 move in the plane direction of the first surface 1a, the surrounding portion 14 can block the movement of the disk body 1 to prevent the two disk bodies 1 from separating, which is beneficial to the mating connection between the two disk bodies 1.
[0058] Please refer to Figure 7 , Optionally, the surface of the surrounding portion 14 located outside the stacking space 1c is recessed towards the inside of the stacking space 1c to form the second convex portion 15. The second convex portion 15 is provided with a plurality of breaks so that the second convex portion 15 forms a plurality of sub-portions 151. The surface of the surrounding portion 14 located outside the stacking space 1c corresponding to the position of the sub-portion 151 is recessed to form a plurality of sub-recessed portions 152, and the sub-recessed portions 152 are configured to accommodate the user's fingers to lift the tray. Considering that the disk body 1 needs to be manually flipped, the present application provides the sub-recessed portions 152 on the surrounding portion 14 on the outer periphery of the disk body 1 to accommodate the user's fingers, so as to facilitate lifting the disk body 1 for flipping. Moreover, when the disk body 1 is placed on the testing device, the sub-recessed portions 152 can be in positioning cooperation with the positioning structure on the testing device, so as to facilitate determining the position of the disk body 1 placed on the testing device, thereby being beneficial to accurately testing the object 200 to be tested in the disk body 1.
[0059] The above has introduced the tray assembly disclosed in the embodiments of the present application in detail. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the tray assembly of the present application and its core idea; at the same time, for those of ordinary skill in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.
Claims
1. A tray assembly (100), characterized in that, Comprising: A plurality of discs (1), the plurality of discs (1) being stacked along a first direction (X); The disc (1) includes: A first surface (1a) provided with a plurality of recessed first test positions (11) configured to place a test object (200); A second surface (1b) opposite to the first surface (1a) along the first direction (X), the second surface (1b) being provided with a plurality of protruding second test positions (12); Among two adjacent stacked discs (1), the first test position (11) of one of the discs (1) is correspondingly and cooperatively connected to the second test position (12) of the other disc (1) to limit the position of the test object (200); Wherein, the first direction (X) is the thickness direction of the disc (1).
2. The tray assembly (100) according to claim 1, characterized in that, The first test position (11) is recessed from the first surface (1a) towards the second surface (1b) to form a protruding portion on the second surface (1b), and the protruding portion forms the second test position (12).
3. The tray assembly (100) according to claim 1, characterized in that, The first test position (11) includes a first supporting portion (111) and a first limiting portion (112), the first supporting portion (111) being configured to place the test object (200), and the first limiting portion (112) being provided on the outer periphery of the first supporting portion (111) and configured to limit the position of the test object (200) on the first supporting portion (111).
4. The tray assembly (100) according to claim 3, characterized in that, There are a plurality of the first limiting portions (112), the plurality of first limiting portions (112) being spaced along the outer periphery of the first supporting portion (111), and the spaced portions between two adjacent first limiting portions (112) being recessed along the first direction (X) to form a second limiting portion (122) protruding on the second surface (1b); The second test position (12) includes a second supporting portion (121) and a plurality of the second limiting portions (122), the second supporting portion (121) being correspondingly arranged with respect to the first supporting portion (111), and the plurality of second limiting portions (122) being spaced along the outer periphery of the second supporting portion (121).
5. The tray assembly (100) according to claim 3, wherein, The first supporting portion (111) includes a first sub-supporting portion (111a) and a second sub-supporting portion (111b), the first sub-supporting portion (111a) being connected to the second sub-supporting portion (111b), the first sub-supporting portion (111a) being configured to support the main body portion (201) of the test object (200), and the second sub-supporting portion (111b) being configured to support the extension portion (202) of the test object (200), and the first limiting portion (112) being located on the outer periphery of the first sub-supporting portion (111a).
6. The tray assembly (100) according to claim 1, characterized in that, A first convex portion (13) is further provided on the first surface (1a). The first convex portion (13) is located on the outer periphery of the first test position (11). The first convex portion (13) is configured to abut against the second surface (1b) of another disc body (1) when two adjacent disc bodies (1) are stacked.
7. The tray assembly (100) according to claim 1, characterized in that, The second test position (12) includes a second supporting portion (121) and a second limiting portion (122). The second limiting portion (122) is provided on the outer periphery of the second supporting portion (121). The second limiting portion (122) protrudes from the second supporting portion (121) along the first direction (X).
8. The tray assembly (100) according to claim 7, characterized in that, The second limiting portion (122) and the second supporting portion (121) enclose a limiting space (12a). A step portion (122a) is provided on the second limiting portion (122). Along the first direction (X), the step portion (122a) is located between the end surfaces of the second supporting portion (121) and the second limiting portion (122). The step portion (122a) is configured to carry the object to be tested (200) after flipping.
9. The tray assembly (100) according to any one of claims 1-8, characterized in that, The disc body (1) further includes a surrounding portion (14). The surrounding portion (14) protrudes from the second surface (1b) and encloses a stacking space (1c) with the second surface (1b). The surrounding portion (14) is provided with a protruding second convex portion (15). The second convex portion (15) extends to be connected to the second surface (1b). A step surface (15a) is formed between the second convex portion (15) and the surrounding portion (14). In two stacked disc bodies (1), the step surface (15a) of one disc body (1) abuts against one surface of the surrounding portion (14) of the other disc body (1) facing the first surface (1a).
10. The tray assembly (100) according to claim 9, wherein, The surface of the surrounding portion (14) located outside the stacking space (1c) is recessed in the direction towards the inside of the stacking space (1c) to form the second convex portion (15). The second convex portion (15) is provided with a plurality of breaks so that the second convex portion (15) forms a plurality of sub-portions (151). The surface of the surrounding portion (14) located outside the stacking space (1c) is recessed at positions corresponding to the sub-portions (151) to form a plurality of sub-recessed portions (152). The sub-recessed portions (152) are configured to accommodate the user's fingers to lift the disc body (1).