Chassis structure for testing performance of chip-type multi-terminal component

Abstract

The utility model provides a chassis structure for testing the performance of a chip-type multi-terminal component. The chassis structure comprises a first test piece assembly, a second test piece assembly, a third test piece assembly, a fourth test piece assembly, a circular disc and a power mechanism, the power mechanism is arranged below the center of the circular disc; the first test piece assembly, the second test piece assembly, the third test piece assembly and the fourth test piece assembly are arranged around the edge of the circular disc to form a circular ring; the first test piece assembly and the fourth test piece assembly are both provided with test holes penetrating up and down. The second test piece assembly and the fourth test piece assembly move or replace positions according to preset test requirements. The chassis structure for testing the performance of the chip-type multi-terminal component provides a more flexible, compatible, convenient and efficient test solution through the movable and replaceable test piece assembly, and has a remarkable promotion effect on improving the test quality and the production efficiency of the electronic component manufacturing industry.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic component testing equipment, and particularly relates to a chassis structure for testing the performance of chip multi-terminal components. Background Art

[0002] In the electronic component manufacturing industry, testing the performance of chip multi-terminal components is one of the key steps to ensure product quality. Traditional testing methods usually involve fixed testing fixtures, which often need to be customized for different types of components, resulting in a large amount of time and cost for reconfiguration when changing the test object; in addition, traditional testing equipment may not be able to efficiently handle large-scale testing requirements, especially when frequent changes in test conditions are required.

[0003] Deficiencies of the prior art:

[0004] 1. The test chassis structure in the prior art may not be applicable to all types of chip multi-terminal components. Especially for components with special shapes or sizes, additional customized designs may be required, increasing the complexity of manufacturing and maintenance.

[0005] 2. The test points on the traditional test chassis are fixed and cannot be dynamically adjusted as needed, resulting in some test resources being idle in some cases and reducing the overall resource utilization efficiency.

[0006] Therefore, there are deficiencies in the prior art and further improvements are needed. Summary of the Utility Model

[0007] In view of the problems existing in the prior art, the utility model provides a chassis structure for testing the performance of chip multi-terminal components.

[0008] To achieve the above object, the specific scheme of the utility model is as follows:

[0009] The utility model provides a chassis structure for testing the performance of chip multi-terminal components, including:

[0010] A first test piece assembly, a second test piece assembly, a third test piece assembly, a fourth test piece assembly, a circular disk, and a power mechanism;

[0011] The power mechanism is arranged below the center of the circular disk and is used to drive the circular disk to rotate. The first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly are arranged around the edge of the circular disk to form an annular shape;

[0012] The first test piece assembly and the fourth test piece assembly are both provided with test holes penetrating up and down;

[0013] The second test piece assembly and the fourth test piece assembly move or replace positions according to preset test requirements;

[0014] The power mechanism is used to drive the circular disk to rotate, thereby driving the first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly arranged on the edge of the circular disk to rotate.

[0015] Further, the first test piece assembly is semi-circular ring-shaped, and the second test piece assembly, the third test piece assembly, and the fourth test piece assembly also form a semi-circular ring, jointly forming a circular ring.

[0016] Further, a first circular groove and a second circular groove are provided on the upper surface of the circular ring formed by the first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly;

[0017] The first circular groove and the second circular groove are concentric circles.

[0018] Further, the first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly have the same thickness.

[0019] Further, the second test piece assembly is composed of a first sector plate and a second sector plate which are stacked up and down;

[0020] Test holes are provided on the first sector plate.

[0021] Further, the fourth test piece assembly includes: a third sector plate, a fourth sector plate, and a first support plate;

[0022] The third sector plate, the fourth sector plate, and the first support plate are stacked up and down in sequence;

[0023] Test holes are provided on the first support plate;

[0024] The fourth sector plate is provided with a strip hole penetrating up and down, the first support plate is embedded in the strip hole, and a concave groove is provided at a position on the third sector plate corresponding to the test hole.

[0025] Further, the number of the test holes is two, three, or four, which is set according to the number of terminals of the component to be tested.

[0026] Further, a probe is respectively provided below each test hole, and a lifting mechanism is provided at the lower end of each probe for driving the probe to move up and down.

[0027] Further, the power mechanism is a first motor, and the circular disk is installed on the output shaft of the first motor through a plurality of bolts.

[0028] Furthermore, the second test piece assembly and the fourth test piece assembly are arranged at intervals from each other.

[0029] Adopting the technical solution of the present utility model has the following beneficial effects:

[0030] 1. Dynamically adjust the test configuration: By adjusting the positions of the first to fourth test piece assemblies, it can quickly adapt to different test requirements, significantly improving the flexibility of the test process.

[0031] 2. Adapt to various numbers of terminals: The number of test holes can be flexibly set according to the number of terminals of the component (two, three or four), enabling this test chassis to be widely applicable to various chip multi-terminal components, and improving the versatility and compatibility of the test platform.

[0032] 3. Modular design: The standardized and modular design of the test piece assembly facilitates quick disassembly, installation and calibration, simplifies the daily maintenance work, and reduces the maintenance cost and time consumption. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 is a perspective view of the present utility model;

[0034] Figure 2 is a perspective view of the present utility model from the bottom view angle;

[0035] Figure 3 is an exploded view of the present utility model;

[0036] Figure 4 is a schematic diagram of the test chassis of the present utility model installed on a test device;

[0037] Figure 5 is a schematic diagram of the fourth test piece assembly of the present utility model cooperating with a probe for testing;

[0038] Figure 6 is an exploded view of the fourth test piece assembly and the probe of the present utility model.

[0039] In the figures:

[0040] 1. The first test piece assembly;

[0041] 2. The second test piece assembly;

[0042] 201. The first sector plate; 202. The second sector plate;

[0043] 3. The third test piece assembly;

[0044] 4. The fourth test piece assembly;

[0045] 401. The third sector plate; 402. The fourth sector plate; 403. The first support plate;

[0046] 404. Strip-shaped hole; 405. Concave groove

[0047] 5. Circular disk; 6. Power mechanism

[0048] 7. Test hole

[0049] 8. First circular groove; 9. Second circular groove

[0050] 10. Probe

[0051] 11. Lifting mechanism; 12. Component to be tested Detailed implementation mode

[0052] The present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present utility model, rather than limiting the present utility model. In addition, it should be noted that for the convenience of description, only the parts related to the present utility model rather than all the structures are shown in the drawings.

[0053] In the description of the present utility model, unless otherwise clearly defined and limited, the terms "connected", "connected to" and "fixed" shall be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and it can be the communication inside two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific situations.

[0054] In the present utility model, unless otherwise clearly defined and limited, the first feature being "above" or "below" the second feature may include the direct contact between the first and second features, or may include the situation where the first and second features are not in direct contact but in contact through other features between them. Moreover, the first feature being "above", "above the" and "on the" second feature includes that the first feature is directly above and obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature being "below", "below the" and "under the" second feature includes that the first feature is directly below and obliquely below the second feature, or only indicates that the horizontal height of the first feature is lower than that of the second feature.

[0055] In the description of this embodiment, the orientation or positional relationships such as "upper", "lower", "front", "rear", "left", and "right" are based on the orientation or positional relationships shown in the drawings. These are only for the convenience of description and simplifying operations, rather than indicating or implying that the device or component referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present utility model. In addition, the terms "first" and "second" are only used for distinction in description and have no special meaning.

[0056] Combined with Figures 1 - 6 As shown, the present utility model provides a chassis structure for performance testing of chip multi-terminal components, including:

[0057] The first test piece assembly 1, the second test piece assembly 2, the third test piece assembly 3, the fourth test piece assembly 4, the circular disk 5, and the power mechanism 6;

[0058] The power mechanism 6 is arranged below the center of the circular disk 5 and is used to drive the circular disk 5 to rotate. The first test piece assembly 1, the second test piece assembly 2, the third test piece assembly 3, and the fourth test piece assembly 4 are arranged around the edge of the circular disk 5 to form an annular shape;

[0059] Both the first test piece assembly 1 and the fourth test piece assembly 4 are provided with test holes 7 that penetrate up and down;

[0060] The second test piece assembly 2 and the fourth test piece assembly 4 are moved or replaced in position according to preset test requirements;

[0061] The power mechanism 6 is used to drive the circular disk 5 to rotate, thereby driving the first test piece assembly 1, the second test piece assembly 2, the third test piece assembly 3, and the fourth test piece assembly 4 arranged on the edge of the circular disk 5 to rotate.

[0062] The first test piece assembly 1 is semi-annular, and the second test piece assembly 2, the third test piece assembly 3, and the fourth test piece assembly 4 also form semi-annular shapes, jointly forming a circular ring.

[0063] The upper surface of the annular shape formed by the first test piece assembly 1, the second test piece assembly 2, the third test piece assembly 3, and the fourth test piece assembly 4 is provided with a first circular groove 8 and a second circular groove 9;

[0064] The first circular groove 8 and the second circular groove 9 are concentric circles.

[0065] The first test piece assembly 1, the second test piece assembly 2, the third test piece assembly 3, and the fourth test piece assembly 4 have the same thickness.

[0066] The second test piece assembly 2 is composed of a first sector plate 201 and a second sector plate 202 which are stacked up and down;

[0067] The first sector plate 201 is provided with test holes 7.

[0068] The fourth test piece assembly 4 includes: a third sector plate 401, a fourth sector plate 402, and a first support plate 403;

[0069] The third sector plate 401, the fourth sector plate 402, and the first support plate 403 are stacked in sequence from bottom to top;

[0070] The first support plate 403 is provided with test holes 7;

[0071] The fourth sector plate 402 is provided with a strip-shaped hole 404 penetrating up and down, the first support plate 403 is embedded in the strip-shaped hole 404, and a recessed groove 405 is provided at a position on the third sector plate 401 corresponding to the test hole 7.

[0072] The number of the test holes 7 is two, three or four, and is set according to the number of terminals of the component 12 to be tested.

[0073] A probe 10 is respectively arranged below each test hole 7, and a lifting mechanism 11 is arranged at the lower end of each probe 10 for driving the probe 10 to move up and down.

[0074] The power mechanism 6 is a first motor, and the circular disk 5 is installed on the output shaft of the first motor through a plurality of bolts.

[0075] The second test piece assembly 2 and the fourth test piece assembly 4 are arranged at intervals from each other.

[0076] The principle of the present utility model is as follows:

[0077] The power mechanism 6 is a first motor, located below the center of the circular disk 5, and serves as the power source of the entire test chassis structure. The output shaft of the first motor is connected to the circular disk 5 through a plurality of bolts. When the motor is started, the rotational force of the output shaft is directly transmitted to the circular disk 5, causing the circular disk 5 to rotate around its central axis.

[0078] The first to fourth test piece assemblies 4 are distributed in an annular shape around the edge of the circular disk 5, wherein the first test piece assembly 1 is semi-annular, and the second to fourth test piece assemblies 4 are arranged at intervals to form the other semi-annular shape.

[0079] The first test piece assembly 1 and the fourth test piece assembly 4 are provided with test holes 7, and the number of the holes is determined according to the number of terminals of the component to be tested (two, three or four).

[0080] The second test piece assembly 2 and the fourth test piece assembly 4 can be moved or replaced according to preset test requirements to adapt to different test scenarios.

[0081] The second test piece assembly 2: It is composed of a first sector plate 201 and a second sector plate 202 stacked up and down. A test hole 7 is provided on the first sector plate 201.

[0082] The fourth test piece assembly 4: It includes a third sector plate 401, a fourth sector plate 402 and a first support plate 403. A test hole 7 is provided on the first support plate 403 and is embedded in the strip hole 404 of the fourth sector plate 402; A recessed groove 405 is provided at a position corresponding to the test hole 7 on the third sector plate 401.

[0083] A probe 10 is correspondingly arranged below the test hole 7. A lifting mechanism 11 is equipped at the lower end of each probe 10, which is used to control the up and down movement of the probe 10 to achieve precise contact with the component terminal.

[0084] The above are only the preferred embodiments of the present invention, and do not limit the scope of the present invention. Any equivalent structural transformation made by using the content of the specification and drawings of the present invention under the inventive concept of the present invention, or direct / indirect application in other related technical fields, is included in the protection scope of the present invention.

Claims

1. A chassis structure for performance testing of chip multi-terminal components, characterized in that, Comprising: A first test piece assembly, a second test piece assembly, a third test piece assembly, a fourth test piece assembly, a circular disk, and a power mechanism; The power mechanism is disposed below the center of the circular disk and is used to drive the circular disk to rotate. The first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly are arranged around the edge of the circular disk to form an annular shape; Both the first test piece assembly and the fourth test piece assembly are provided with test holes penetrating up and down; The second test piece assembly and the fourth test piece assembly are moved or replaced in position according to preset test requirements; The power mechanism is used to drive the circular disk to rotate, thereby driving the first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly disposed on the edge of the circular disk to rotate.

2. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein The first test piece assembly is semi-annular, and the second test piece assembly, the third test piece assembly, and the fourth test piece assembly also form semi-annular shapes, jointly forming a circular ring.

3. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein The upper surface of the annular shape formed by the first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly is provided with a first circular groove and a second circular groove; The first circular groove and the second circular groove are concentric circles.

4. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein The first test piece assembly, the second test piece assembly, the third test piece assembly, and the fourth test piece assembly have the same thickness.

5. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein The second test piece assembly is composed of a first sector plate and a second sector plate stacked up and down; The first sector plate is provided with a test hole.

6. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein The fourth test piece assembly includes: a third sector plate, a fourth sector plate, and a first support plate; The third sector plate, the fourth sector plate, and the first support plate are stacked up and down in sequence; The first support plate is provided with a test hole; The fourth sector plate is provided with a strip-shaped hole penetrating up and down, and the first support plate is embedded in the strip-shaped hole. A concave groove is provided at a position on the third sector plate corresponding to the test hole.

7. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein The number of the test holes is two, three, or four, and is set according to the number of terminals of the component to be tested.

8. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein A probe is respectively disposed below each test hole, and a lifting mechanism is disposed at the lower end of each probe for driving the probe to move up and down.

9. The chassis structure for performance testing of chip multi-terminal components according to claim 1, wherein The power mechanism is a first motor, and the circular disk is mounted on the output shaft of the first motor through a plurality of bolts.

10. The chassis structure for performance testing of chip multi-terminal components according to claim 1, characterized in that the second test piece assembly and the fourth test piece assembly are arranged at intervals from each other.

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