Test platform

Abstract

The embodiment of the utility model provides a test platform, and the test platform comprises a carrier which comprises a plurality of surfaces, and the plurality of surfaces form a cavity in a surrounding manner; the interior of the cavity is divided into a plurality of accommodating spaces, the accommodating spaces at least comprise a first accommodating space, and the first accommodating space is used for accommodating a control system, controlling a to-be-tested element and collecting test data obtained by testing the to-be-tested element; a first surface in the plurality of surfaces is used for bearing a display device, and the display device is used for displaying test data obtained by testing a to-be-tested element; the first surface is used for providing a plurality of surfaces, the second surface in the plurality of surfaces is used for providing a plurality of types of test interfaces communicated with the control system, the plurality of types of test interfaces are used for connecting different types of to-be-tested elements, and the control system is used for outputting control signals so as to test the to-be-tested elements.

Description

Technical Field

[0001] This application relates to the field of testing technologies, and more particularly, to a testing platform. Background Art

[0002] When conducting tests on some components currently, such as heating blankets and electronic scales, separate tests need to be provided according to the differences of individual components. However, in one scenario, it may be necessary to test multiple different components, which requires multiple tests, and different test tools may be needed for each test, resulting in relatively cumbersome test operations. Summary of the Utility Model

[0003] The purpose of this application is to provide a testing platform that can reduce the complexity of testing different components.

[0004] In a first aspect, the present utility model provides a testing platform, including: a carrier, including a plurality of surfaces, and the plurality of surfaces surround to form a cavity; the cavity is divided into a plurality of accommodation spaces, at least including a first accommodation space, and the first accommodation space is used to accommodate a control system for controlling a component to be tested and collecting test data obtained by testing the component to be tested; a first surface among the plurality of surfaces is used to carry a display device, and the display device is used to display the test data obtained by testing the component to be tested; a second surface among the plurality of surfaces is used to provide multiple types of test interfaces communicated with the control system, and the multiple types of test interfaces are used to connect different types of components to be tested, and the control system is used to output a control signal to test the component to be tested.

[0005] In the testing platform provided by the embodiments of this application, a carrier with a plurality of accommodation spaces is provided, and some devices or components required for testing can be accommodated in this space. The testing platform can provide multiple types of test interfaces to test different types of components, so that the testing of components can be realized in a more convenient and fast way. Moreover, the test data is displayed through the display device, making the test results of the components more intuitive.

[0006] In an alternative embodiment, the plurality of accommodation spaces include a second accommodation space, and the second accommodation space is used to accommodate a vacuum pump; one of the surfaces in the second accommodation space is the third surface among the plurality of surfaces of the carrier, and an electromagnetic interface connected to the vacuum pump is provided on the third surface for connecting a pneumatic component to be tested and providing a gas source for the pneumatic component to be tested through the vacuum pump.

[0007] In an alternative embodiment, a pressure regulating valve is provided on the vacuum pump for regulating the air pressure of the vacuum pump.

[0008] In the above embodiments, by providing a vacuum pump, it can be used to provide a gas source for test components such as solenoid valves and pneumatic components, so as to realize the testing of solenoid valves and pneumatic components and other test components.

[0009] In an alternative embodiment, the multiple types of test interfaces include: an AC380 or AC220V power supply interface, which is used to supply power to the first type of components to be tested; a aviation plug connector, which is used to connect the first type of components to be tested.

[0010] In an alternative embodiment, the multiple types of test interfaces include a DC24V interface, which is used to supply power to the second type of components to be tested; an analog signal transmitter is connected between the DC24V interface and the control system, which is used to convert the signals collected by the second type of components to be tested.

[0011] In an alternative embodiment, the control system is connected to a power conversion device, which is used to convert the accessed power into DC24V and provide power output through the DC24V interface provided on the second side, where the number of DC24V interfaces is greater than the preset number of types of the second type of components to be tested.

[0012] In an alternative embodiment, the control system includes multiple functional modules, the DC24V interface accesses at least one of the functional modules, and the functional module is used to provide test functions for testing the corresponding types of components to be tested.

[0013] In the above embodiments, the number of types of components to be tested suitable for accessing the DC24V interface can be provided, and multiple types of components to be tested can be tested simultaneously, which can improve the test efficiency.

[0014] In an alternative embodiment, the multiple accommodation spaces further include a third accommodation space for accommodating tools; one of the surfaces of the third accommodation space is the fourth surface among the multiple surfaces of the carrier, and a cabinet door is provided on the fourth surface.

[0015] In the above embodiments, a space for accommodating tools can also be provided on the test platform, which can facilitate the placement of some physical tools that can be used during the test, so that the test platform can better adapt to more scenarios to cope with some scenarios where physical tools are temporarily needed.

[0016] In an alternative embodiment, the multiple accommodation spaces further include a fourth accommodation space; one of the surfaces of the fourth accommodation space is the fifth surface among the multiple surfaces of the carrier.

[0017] In the above embodiments, a spare fourth accommodation space may also be provided. If the test functions of the test platform are insufficient in the future, more test functions can be added to this fourth accommodation space and connected and pieced together with the original test platform to provide future expansion capabilities and make the test platform more flexible.

[0018] In an alternative embodiment, a plurality of universal wheels are provided at the bottom of the carrier, and one or more push rods are provided on the carrier.

[0019] In the above embodiments, universal wheels and push rods can be provided on the carrier of the test platform, which can facilitate the movement of the test platform and enable the test platform to adapt to more test scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present application and should not be regarded as limiting the scope. For those of ordinary skill in the art, other related drawings can be obtained based on these drawings without creative efforts.

[0021] Figure 1 Schematic structural diagram of the test platform provided by the embodiment of the present application;

[0022] Figure 2 Schematic structural diagram of the test platform provided by the embodiment of the present application from one angle;

[0023] Figure 3 Partial circuit structural diagram of the control system used by the test platform provided by the embodiment of the present application;

[0024] Figure 4 Another partial circuit structural diagram of the control system used by the test platform provided by the embodiment of the present application.

[0025] Reference Signs: 110 - Carrier; S1 - First Surface; S2 - Second Surface; S3 - Third Surface; S4 - Fourth Surface; S5 - Fifth Surface; S6 - Sixth Surface; S7 - Seventh Surface; 120 - Test Interface; 130 - Universal Wheel; 140 - Push Rod; 150 - Display Device. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0026] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.

[0027] It should be noted that similar reference numerals and letters denote similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. At the same time, in the description of the present application, terms such as "first" and "second" are only used for distinguishing descriptions and cannot be construed as indicating or implying relative importance.

[0028] In the description of the present application, it should be noted that the orientation or positional relationship indicated by terms such as "upper", "lower", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the utility model product is usually placed during use. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be construed as a limitation of the present application.

[0029] In the description of the present application, it should also be noted that unless otherwise clearly specified and limited, the terms "arranged", "installed", "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0030] In the prior art, when testing some components, such as heating blocks, heating blankets, digital display meters, electronic scales, resistors, switch quantities, etc., individual components usually need to be tested separately. When testing separately, their required power supplies, acquisition devices, etc. are usually needed to assist in the testing of the components. Moreover, the functions or devices required for testing different components are also different, which leads to the need to temporarily build a test bench for their functions specifically if different components need to be tested. The implementation method is relatively complex. Further, if the testing of some functions is not considered when temporarily building the test bench, it may lead to the discovery that other functions have not been tested halfway through the testing. After adding and testing the corresponding functions and then continuing the testing, it may lead to a longer testing cycle and incomplete test data, etc. Implementing testing by temporarily building a test bench will result in a longer test preparation time and cannot meet some temporary testing tasks.

[0031] Based on this, the embodiments of the present application provide some test platforms, and these test platforms can test various components that may need to be tested. The test platforms will be introduced below through embodiments.

[0032] Figure 1 It is a schematic structural diagram of the test platform provided by the embodiment of the present application. As Figure 1 shown, the test platform includes: a carrier 110.

[0033] In the embodiments of the present application, the carrier 110 may include multiple surfaces, and the multiple surfaces surround to form a cavity.

[0034] For different functional requirements, the cavity is divided into multiple accommodation spaces. In Figure 1 the illustrated example, the carrier 110 includes eight surfaces, wherein the upper surface and the lower surface are hexagonal, and the six side surfaces are rectangular.

[0035] In one example, the cavity may be divided into six accommodation spaces. Of course, more or fewer accommodation spaces may also be divided inside based on different actual designs.

[0036] In this embodiment, the accommodation spaces included in the carrier 110 at least include a first accommodation space. The first accommodation space is used to accommodate a control system, which is used to control the element to be tested and collect the test data obtained from testing the element to be tested.

[0037] In this embodiment, the test platform can implement testing various elements to be tested by providing some test interfaces 120.

[0038] The first surface S1 of the multiple surfaces of the carrier 110 is used to carry a display device 150, and the display device 150 is used to display the test data obtained from testing the element to be tested. In Figure 1 the illustrated example, when the test platform is placed horizontally, it is presented horizontally, and the surface located on the upper side of the test platform is used as the first surface S1. In Figure 1 the illustrated example, the first surface S1 may also carry input devices such as a mouse and a keyboard.

[0039] Among them, as Figure 2 shown, the second surface S2 of the multiple surfaces of the carrier 110 is used to provide multiple types of test interfaces 120 that communicate with the control system. The multiple types of test interfaces 120 are used to connect different types of elements to be tested, and the control system is used to output a control signal to test the element to be tested.

[0040] The element to be tested can access the control system through the test interface 120 to obtain the required control instructions; the control system can obtain the test data of the element to be tested during test control by connecting with the element to be tested.

[0041] Exemplarily, different test interfaces 120 can be set based on different components to be actually tested. For example, the test interface 120 can include interfaces for testing components such as heating blocks, heating blankets, digital display meters, electronic scales, resistors, and digital input / output signals. Of course, depending on different actual requirements, it can also include more different test interfaces 120. For example, it can also include test interfaces 120 for components such as barcode scanners and mass flow controllers (MFCs).

[0042] Through the test platform provided by the embodiments of the present application, when testing components are needed, there is no need to temporarily build a test platform or components. Through the general test platform provided by the present application, the testing of multiple different components to be tested can be achieved.

[0043] In this embodiment, the display device 150 can be an all-in-one machine, and the all-in-one machine can be placed on the first surface S1.

[0044] In this embodiment, the display device 150 can be a split computer device. The monitor of the computer device can be placed on the first surface S1, and the computer host of the computer device can be placed in one of the multiple accommodation spaces. For Figure 1 example, a cabinet door can be opened on the sixth surface S6 of the multiple surfaces of the carrier 110 for accommodating the computer host.

[0045] After the display device 150 runs the monitoring software, it can be used to monitor the components to be tested connected in the test platform and record the test data during the testing process of the components to be tested.

[0046] In the embodiments of the present application, the multiple accommodation spaces can include a second accommodation space for accommodating a vacuum pump.

[0047] One of the surfaces in the second accommodation space is the third surface S3 of the multiple surfaces of the carrier 110. An electromagnetic interface connected to the vacuum pump is provided on the third surface S3 for connecting pneumatic components to be tested and providing a gas source for the pneumatic components to be tested through the vacuum pump.

[0048] The pneumatic components to be tested can be components such as solenoid valves and pneumatic components.

[0049] Optionally, the vacuum pump can draw out the gas source on the third surface S3. The pneumatic components to be tested are logically controlled through a control system, and the data obtained during the test process is collected.

[0050] In this embodiment, in order to cooperate with obtaining test data, the test platform may further include a thermal imager. The control system can control the thermal imager to be used to obtain thermal imaging data of the component to be tested, and store the thermal imaging data, or transmit it to the display device 150 for storage. Optionally, the display device 150 can also display the obtained test data in real time.

[0051] Optionally, a pressure regulating valve can be provided on the vacuum pump for regulating the air pressure of the vacuum pump.

[0052] In an optional implementation manner, the multi-class test interfaces 120 include: an AC380 or AC220V power supply interface, and the AC380 or AC220V power supply interface is used to supply power to the first type of component to be tested.

[0053] The multi-class test interfaces 120 may further include a circular connector, and the circular connector is used to connect the first type of component to be tested.

[0054] Optionally, the multi-class test interfaces 120 may further include power connection terminals.

[0055] The first type of component to be tested may be a component that requires an AC380 or AC220V power supply. For example, a heating block that requires an AC220V power supply; for another example, an AC380V that requires an AC380 power supply; for still another example, a heating blanket that requires an AC220V power supply.

[0056] Exemplarily, the power required for testing the heating block may be the following several types: a 6KW power under AC220V; or a 3.6KW power under AC220V.

[0057] Exemplarily, the power required for testing the heating blanket may be the following two types: a 1KW power under AC220V; a 6KW power under AC380V; a 13KW power under AC380.

[0058] In an optional implementation manner, the multi-class test interfaces 120 include a DC24V interface for supplying power to the second type of component to be tested.

[0059] An analog signal transmitter is connected between the DC24V interface and the control system for converting the signals collected by the second type of component to be tested.

[0060] As Figure 3 shown, the control system is connected to a power conversion device for converting the accessed power into DC24V and providing a power output through the second side S2 to the DC24V interface, where the number of DC24V interfaces is greater than the preset number of types of the second type of component to be tested.

[0061] Exemplarily, as Figure 3As shown, QF211 supplies power to the control system of the test platform, and this power is converted into a safe voltage of DC24V by the power supply PS211 for distribution. In Figure 3 the illustrated example, XT1 provides power outputs for different categories of test components, and multiple power outputs are shown in the figure. The touch screen U1 provided by the control system is used for parameter input during logic testing. In Figure 1 the illustrated example, this touch screen can be set on the seventh side S7.

[0062] In Figure 3 the illustrated example, this QF211 can also directly provide power outputs L1 and N1 without being converted by the power supply PS211.

[0063] In one example, Figure 3 the power outputs P24-2 and N24-2 shown can be used as the power output for the thermostat for the component to be tested; the power outputs P24-3 and N24-3 can be used as the power output for the digital display for the component to be tested; the power outputs P24-4 and N24-4 can be used as the power output for the electronic scale for the component to be tested; the power outputs P24-5 and N24-5 can be used as the power output for the PT or analog component for the component to be tested; the power outputs P24-6 and N24-6 can be used as the power output for the digital input / output for the component to be tested; the power outputs P24-7 and N24-7 can be used as the power output for the barcode scanner for the component to be tested; the power outputs P24-8 and N24-8 can be used as the power output for the MFC for the component to be tested; the power outputs P24-9 and N24-9 can be used as the power output for the solenoid valve for the component to be tested. Of course, more power outputs can also be set to be used for connecting more categories of components to be tested.

[0064] Such as Figure 3 shown, the power outputs P24-1 and N24-1 can be used to supply power to the touch screen U1 of the control system and are connected to the touch screen U1 of this control system.

[0065] The components to be tested of the digital input / output type can include components such as sensors, global positioning systems (EFS), and indicator lights.

[0066] In Figure 3 the illustrated example, in order to protect the safety of the control system, a protective grounding wire PE is also provided.

[0067] Such as Figure 4 shown, the control system can include multiple functional modules, and the DC24V interface accesses at least one functional module, and the functional module is used to provide the test functions for testing the corresponding categories of components to be tested. In Figure 4In the example shown, nine functional modules are shown, denoted as A252, A1, A2, A3, A4, A5, A6, A7 and A8.

[0068] For the function test of the thermostat, analog quantity can be output to the thermostat by reserving DC24V and AC220V contacts. For example, when testing the function test of the thermostat, a PT100 component can be configured. For the function test of the digital display, DC24V and AC220V contacts are reserved, analog quantity is transmitted and output, and analog quantity components are configured. For the test of the electronic scale, a 5-core quick-plug interface can be reserved, contacts can be reserved, and the control system can be connected to conduct the test process. For the test of PT and other analog components, a two-wire analog signal can be set, contacts can be reserved, and the control system can be connected to conduct the test process. For the switch quantity test, dry contacts, analog quantity, and PLC input and output points can be configured. For the test of data signals, SB\RS232\RS485, test barcode guns and other instrument interface devices can be configured. For the test of the solenoid valve, a vacuum pump can be configured to provide compressed air for the component to be tested, and air pipes, pressure regulating valves, and joints can be configured.

[0069] Optionally, the control system can be Siemens 1500 series. Figure 4In the illustrated example, the modules used in the A252 function module may include a bus adapter 6ES7193-6AR00-0AA0 and a processing module 6ES7510-1DJ01-0AB0. The modules used in the A1 function module may include a digital input module 6ES7131-6BH01-0BA0 and a DP slave module 6ES71936BP000DA0. The modules used in the A2 function module may include: a digital input module 6ES7131-6BH01-0BA0 and a basic unit module 6ES7193-6BP00-0BA0. The modules used in the A3 function module may include: a digital input module 6ES7132-6BH01-0BA0 and a DP slave module 6ES71936BP000DA0. The modules used in the A4 function module may include: a digital input module 6ES7132-6BH01-0BA0 and a basic unit module 6ES7193-6BP00-0BA0. The modules used in the A5 function module may include a digital input module 6ES7132-6BH01-0BA0 and a basic unit module 6ES7193-6BP00-0BA0. The modules used in the A6 function module may include: an analog input module 6ES7134-6GF00-0AA1 and a basic unit module 6ES7193-6BP00-0BA0. The modules used in the A7 function module may include: an analog input module 6ES7134-6GF00-0AA1 and a basic unit module 6ES7193-6BP00-0BA0. The modules used in the A8 function module may include: an analog module 6ES7134-6JD00-0CA1 and a basic unit module 6ES7193-6BP00-0BA0.

[0070] In this embodiment, for the convenience of testing, among the multiple accommodation spaces, there is also a third accommodation space for accommodating tools. One of the surfaces in the third accommodation space is the fourth surface S4 among the multiple surfaces of the carrier 110, and a cabinet door is provided on the fourth surface S4.

[0071] Through this cabinet door, the tools in the third accommodation space can be taken.

[0072] The tools may include, but are not limited to, conventional flat-tip, cross-tip screwdrivers, hex wrenches, adjustable wrenches, multimeters, test instruments, etc. Optionally, the third accommodation space can also be used for storing test documents.

[0073] Considering that there may be more functions to be tested or more components to be tested with the development, in order to facilitate the expansion of the test capabilities of the test platform, among the multiple accommodation spaces, there is also a fourth accommodation space.

[0074] One of the surfaces in the fourth accommodation space is the fifth surface S5 among the multiple surfaces of the carrier 110.

[0075] To facilitate the movement of the test platform for testing the device under test at different positions, a plurality of universal wheels 130 can be provided at the bottom of the carrier 110, and one or more push rods 140 can also be provided on the carrier 110.

[0076] For Figure 1 Taking the shown structure as an example, six universal wheels 130 can be provided at the bottom of the carrier 110, and two push rods 140 can be provided on the carrier 110. Of course, depending on the different structural designs of the actual carrier 110, the carrier 110 can also be configured with more or fewer universal wheels 130. For example, the number of the universal wheels 130 can be the same as the number of corners of a polygon whose lower bottom surface is a polygon. Depending on the different structural designs of the actual carrier 110, the carrier 110 can also be configured with more or fewer push rods 140. For example, push rods 140 can be provided in four directions of the carrier 110.

[0077] To further improve the convenience of using the test platform, a socket can also be provided on the first surface S1 to provide power for various electrical devices.

[0078] In the embodiments of the present application, since test configurations for multiple categories of components are provided, testing of multiple categories of components can be achieved, which facilitates the testing of components and thus reduces the complexity of testing components.

[0079] The above are only optional embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application can have various changes and modifications. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included within the protection scope of the present application. It should be noted that similar reference numerals and letters represent similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.

[0080] The above is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of changes or replacements within the technical scope disclosed by the present application, and all should be covered within the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. A test platform, characterized in that, Comprising: A carrier, including a plurality of surfaces that enclose to form a cavity; The cavity is divided into a plurality of accommodation spaces, at least including a first accommodation space, and the first accommodation space is used to accommodate a control system for controlling a device under test and collecting test data obtained from testing the device under test; A first surface among the plurality of surfaces is used to carry a display device, and the display device is used to display the test data obtained from testing the device under test; A second surface among the plurality of surfaces is used to provide multiple types of test interfaces that communicate with the control system, and the multiple types of test interfaces are used to connect different types of devices under test, and the control system is used to output a control signal to test the device under test.

2. The test platform according to claim 1, wherein The plurality of accommodation spaces include a second accommodation space, and the second accommodation space is used to accommodate a vacuum pump; One of the surfaces in the second accommodation space is the third surface among the plurality of surfaces of the carrier, and the third surface is provided with an electromagnetic interface connected to the vacuum pump for connecting a pneumatic device under test and providing a gas source for the pneumatic device under test through the vacuum pump.

3. The test platform according to claim 2, wherein A pressure regulating valve is provided on the vacuum pump for regulating the air pressure of the vacuum pump.

4. The test platform according to claim 1, characterized in that, The multiple types of test interfaces include: an AC380 or AC220V power supply interface, and the AC380 or AC220V power supply interface is used to supply power to a first type of device under test; A aviation plug connector, and the aviation plug connector is used to connect the first type of device under test.

5. The test platform according to claim 1, characterized in that, The multiple types of test interfaces include a DC24V interface for supplying power to a second type of device under test; An analog signal transmitter is connected between the DC24V interface and the control system for converting the signal collected by the second type of device under test.

6. The test platform according to claim 5, characterized in that The control system is connected to a power conversion device for converting the accessed power into DC24V and providing a power output through the DC24V interface provided on the second surface, where the number of DC24V interfaces is greater than the preset number of types of the second type of device under test.

7. The test platform according to claim 5, characterized in that, The control system includes a plurality of functional modules, and the DC24V interface is connected to at least one of the functional modules, and the functional module is used to provide a test function for testing the corresponding type of device under test.

8. The test platform according to claim 1, characterized in that The plurality of accommodation spaces further include a third accommodation space for accommodating tools; One of the surfaces in the third accommodation space is the fourth surface among the plurality of surfaces of the carrier, and the fourth surface is provided with a cabinet door.

9. The test platform according to claim 1, characterized in that, The plurality of accommodation spaces further include a fourth accommodation space; One of the surfaces in the fourth accommodation space is the fifth surface among the plurality of surfaces of the carrier.

10. The test platform according to claim 1, characterized in that, A plurality of universal wheels are provided at the bottom of the carrier, and one or more push rods are provided on the carrier.

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