Probe mechanism based on SMT first workpiece automatic detection equipment

Abstract

The utility model relates to the technical field of automatic detection, in particular to a probe mechanism based on SMT first workpiece automatic detection equipment, which comprises a mechanism body, and the mechanism body comprises a movable support, a lifting guide rail electric cylinder, a rotating platform, an adjusting buffer assembly, a plurality of test probes and a visual detection assembly. The movable support is arranged on the rear side of the lifting guide rail electric cylinder. The lifting guide rail electric cylinder is arranged on the rear side of the rotating platform; the rotating platform is used for rotating and adjusting the buffer assembly and the plurality of test probes; the plurality of test probes are arranged at the bottom of the adjusting buffer assembly; the visual detection assembly is arranged on one side of the movable support. The utility model aims to provide a probe mechanism based on SMT first workpiece automatic detection equipment.

Description

Technical Field

[0001] The utility model relates to the technical field of automatic detection, in particular to a probe mechanism based on an SMT first-piece automatic detection device. Background Art

[0002] Automation refers to the process in which machine equipment, systems or processes, production, and management processes achieve expected goals according to human requirements through automatic detection, information processing, analysis and judgment, and manipulation and control with little or no direct human participation. Automation technology is widely used in industries, agriculture, military, scientific research, transportation, commerce, medical care, services, and households, etc. The adoption of automation technology can not only liberate people from heavy physical labor, part of mental labor, and harsh and dangerous working environments, but also expand the functions of human organs, greatly improve labor productivity, and enhance the ability of humans to understand and transform the world. Therefore, automation is an important condition and remarkable symbol for the modernization of industry, agriculture, national defense, and science and technology.

[0003] At present, the detection schemes for component values such as capacitors and resistors on circuit boards are detected by automatic equipment. However, since the probes need to contact each component on the circuit board, the fixed installation of the probes is likely to damage the components on the circuit board, affecting the reliability of the circuit board. Summary of the Utility Model

[0004] Based on this, the purpose of the utility model is to provide a probe mechanism based on an SMT first-piece automatic detection device that reduces damage and improves accuracy.

[0005] The utility model adopts the following technical solutions:

[0006] A probe mechanism based on an SMT first-piece automatic detection device includes a mechanism body, and the mechanism body includes a movable bracket, a lifting guide rail electric cylinder, a rotating platform, an adjusting buffer assembly, a plurality of test probes, and a vision detection component; the movable bracket is arranged at the rear side of the lifting guide rail electric cylinder; the lifting guide rail electric cylinder is arranged at the rear side of the rotating platform; the rotating platform is used for rotating and adjusting the buffer assembly and a plurality of test probes; the plurality of test probes are arranged at the bottom of the adjusting buffer assembly; the vision detection component is arranged at one side of the movable bracket.

[0007] For further improvement of the above technical solution, the movable bracket is movably connected with a driving mechanism, and the driving mechanism is a linear module.

[0008] For further improvement of the above technical solution, a lifting slider is connected to one side of the lifting guide rail electric cylinder, the lifting slider is connected with a connecting plate, and the connecting plate is connected to one side of the rotating platform.

[0009] A further improvement to the above technical solution is that a rotation motor is connected to the top of the rotation platform.

[0010] A further improvement to the above technical solution is that the adjustment and buffering component includes an adjustment motor, a first slider, a second slider, a first L-shaped connecting block, a first probe connecting block, a second L-shaped connecting block, and a second probe connecting block; the output end of the adjustment motor is connected to an adjustment gear, the inner side of the first slider is connected to a first rack, the inner side of the second slider is connected to a second rack, and the adjustment gear is respectively connected to the first rack and the second rack; the first L-shaped connecting block is movably connected to the first probe connecting block through a linear guide rail; the second L-shaped connecting block is movably connected to the second probe connecting block through a linear guide rail; the first probe connecting block and the second probe connecting block are respectively connected to the upper part of the test probe.

[0011] A further improvement to the above technical solution is that a first spring column is connected between the bottom of the first L-shaped connecting block and the top of the first probe connecting block.

[0012] A further improvement to the above technical solution is that a second spring column is connected between the bottom of the second L-shaped connecting block and the top of the second probe connecting block.

[0013] A further improvement to the above technical solution is that the adjustment and buffering component further includes a slide rail, and the first slider and the second slider are respectively movably connected to the slide rail.

[0014] A further improvement to the above technical solution is that a first detection camera is provided on one side of the adjustment and buffering component.

[0015] A further improvement to the above technical solution is that the vision detection component includes a second detection camera and a detection lighting lamp. The second detection camera is provided on the upper part of the movable bracket; there are two detection lighting lamps, and the two detection lighting lamps are respectively provided on both sides of the lower part of the movable bracket, and the second detection camera is provided above the two detection lighting lamps.

[0016] The beneficial effects of the present utility model are as follows:

[0017] The present utility model is provided with an adjustment and buffering component and a plurality of test probes. The test probes realize smooth up and down movement through the linear guide rails of the adjustment and buffering component; according to the size of the components to be tested, the width of the test probes is automatically adjusted by the adjustment motor, the adjustment gear, the first slider, the second slider, the first rack, and the second rack; when detecting resistors, capacitors, and inductors on the circuit board, through the linear guide rails, the first spring column and the second spring column, it is ensured that the pressure applied by the test probes to the resistors, capacitors, and inductors is constant, ensuring that the components are not damaged and ensuring the repeated accuracy of the measurement. Description of the Drawings

[0018] Figure 1 Schematic diagram of the probe mechanism of the SMT first-piece automatic detection device of the present utility model;

[0019] Figure 2 is Figure 1 Partial schematic diagram of the probe mechanism of the SMT first-piece automatic detection device;

[0020] Figure 3 is Figure 1 Schematic diagram of the adjustment buffer assembly of the probe mechanism of the SMT first-piece automatic detection device;

[0021] Figure 4 is Figure 3 Partial enlarged view of circle A of the adjustment buffer assembly of the probe mechanism of the SMT first-piece automatic detection device.

[0022] The reference numerals in the figure are:

[0023] 10. Mechanism body; 11. Movable bracket; 12. Test probe; 13. Driving mechanism; 30. Lifting guide rail electric cylinder; 31. Lifting slider; 32. Connecting plate; 40. Rotating platform; 41. Rotating motor; 50. Adjustment buffer assembly; 51. Adjustment motor; 511. Adjustment gear; 52. First slider; 521. First rack; 53. Second slider; 531. Second rack; 54. First L-shaped connecting block; 541. First spring column; 55. First probe connecting block; 56. Second L-shaped connecting block; 561. Second spring column; 57. Second probe connecting block; 58. Linear guide rail; 59. Slide rail; 60. Vision detection component; 61. Second detection camera; 62. Detection lighting lamp; 70. First detection camera. Specific embodiments

[0024] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.

[0025] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by terms such as "vertical direction", "up", "down", "horizontal", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present utility model. In addition, "first", "second", "third", "fourth" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0026] In the description of the present utility model, it should also be noted that unless otherwise clearly specified and limited, the terms "set", "installed", "connected", "connected to" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection. It can be a mechanical connection or an electrical connection. It can be a direct connection or a connection through an intermediate medium. It can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific situations.

[0027] As Figures 1 to 4 shown, it is an embodiment of the present utility model, which relates to a probe mechanism based on an SMT first-piece automatic detection device, including a mechanism body 10. The mechanism body 10 includes a movable bracket 11, a lifting guide rail electric cylinder 30, a rotating platform 40, an adjusting buffer assembly 50, a plurality of test probes 12 and a vision detection assembly 60. The movable bracket 11 is arranged at the rear side of the lifting guide rail electric cylinder 30. The lifting guide rail electric cylinder 30 is arranged at the rear side of the rotating platform 40. The rotating platform 40 is used for rotating and adjusting the buffer assembly 50 and a plurality of test probes 12. The plurality of test probes 12 are arranged at the bottom of the adjusting buffer assembly 50. The vision detection assembly 60 is arranged at one side of the movable bracket 11.

[0028] Furthermore, the movable bracket 11 is movably connected with a driving mechanism 13, and the driving mechanism 13 is a linear module. Specifically, the driving mechanism 13 drives the mechanism body 10 to translate, improving the detection range of the test probes 12, with strong practicability.

[0029] Furthermore, one side of the lifting guide rail electric cylinder 30 is connected with a lifting slider 31, the lifting slider 31 is connected with a connecting plate 32, and the connecting plate 32 is connected to one side of the rotating platform 40. Specifically, through the lifting guide rail electric cylinder 30, the lifting slider 31 is driven to move, driving the rotating platform 40 connected with the connecting plate 32 to move, and further enabling the test probes 12 to achieve lifting.

[0030] Furthermore, a rotating motor 41 is connected to the top of the rotating platform 40. Specifically, the rotating motor 41 is used to drive the rotation of the rotating platform 40, thereby realizing the rotation of the test probe 12, meeting the detection requirements of different test components, and having a wide range of applications.

[0031] Furthermore, the adjustment and buffer assembly 50 includes an adjustment motor 51, a first slider 52, a second slider 53, a first L-shaped connecting block 54, a first probe connecting block 55, a second L-shaped connecting block 56, and a second probe connecting block 57. The output end of the adjustment motor 51 is connected to an adjustment gear 511. The inner side of the first slider 52 is connected to a first rack 521, and the inner side of the second slider 53 is connected to a second rack 531. The adjustment gear 511 is respectively connected to the first rack 521 and the second rack 531. The first L-shaped connecting block 54 is movably connected to the first probe connecting block 55 through a linear guide rail 58. The second L-shaped connecting block 56 is movably connected to the second probe connecting block 57 through a linear guide rail 58. The first probe connecting block 55 and the second probe connecting block 57 are respectively connected to the upper part of the test probe 12. Specifically, during operation, the adjustment motor 51 is started to drive the rotation of the adjustment gear 511, and at the same time, the first rack 521 and the second rack 531 are driven to move in opposite directions, respectively moving the first slider 52 and the second slider 53 away from or closer to each other, thereby driving the test probes 12 on both sides to move away from or closer to each other, realizing the automatic adjustment of the opening width of the test probes 12, meeting the sizes of different test components, and having a wide range of applications.

[0032] Furthermore, a first spring column 541 is connected between the bottom of the first L-shaped connecting block 54 and the top of the first probe connecting block 55. A second spring column 561 is connected between the bottom of the second L-shaped connecting block 56 and the top of the second probe connecting block 57. Specifically, in cooperation with the linear slide rail 59, it ensures that the pressure exerted by the test probe 12 on resistors, capacitors, and inductors is constant, ensuring no loss of components and ensuring the repeatability accuracy of measurement.

[0033] Furthermore, the adjustment and buffer assembly 50 further includes a slide rail 59, and the first slider 52 and the second slider 53 are respectively movably connected to the slide rail 59. Specifically, the adjustment motor 51 drives the rotation of the adjustment gear 511, causing the first rack 521 and the second rack 531 to move in opposite directions, respectively moving the first slider 52 and the second slider 53 on the slide rail 59 to move away from or closer to each other, with strong practicability.

[0034] Furthermore, a first detection camera 70 is provided on one side of the adjustment and buffer assembly 50. Specifically, through the first detection camera 70, the positions of components such as resistors, capacitors, and inductors on the circuit board can be effectively detected, ensuring the accurate descent and detection of the test probe 12, with strong stability.

[0035] Further, the visual detection component 60 includes a second detection camera 61 and a detection lighting lamp 62. The second detection camera 61 is disposed on the upper part of the movable bracket 11; there are two detection lighting lamps 62, and the two detection lighting lamps 62 are respectively disposed on both sides of the lower part of the movable bracket 11, and the second detection camera 61 is disposed above the two detection lighting lamps 62. Specifically, through the second detection camera 61, components such as chips, diodes, and triodes on the circuit board are detected to determine whether the appearance and polarity are correct. At the same time, the detection lighting lamp 62 is set to increase the brightness during detection and improve the detection accuracy.

[0036] The present utility model is provided with an adjustment buffer component 50 and a plurality of test probes 12. The test probes 12 achieve smooth up and down movement through the linear guide rail 58 of the adjustment buffer component 50; according to the size of the components to be tested, the width of the test probes 12 opened is automatically adjusted by adjusting the motor 51, the adjustment gear 511, the first slider 52, the second slider 53, the first rack 521, and the second rack 531; when detecting resistors, capacitors, and inductors on the circuit board, through the linear guide rail 58, the first spring column 541, and the second spring column 561, it is ensured that the pressure applied by the test probes 12 to the resistors, capacitors, and inductors is constant, ensuring that the components are not damaged and ensuring the repeated measurement accuracy.

[0037] The above only expresses the preferred technical solutions of the present utility model, and the description is relatively specific and detailed, but it cannot be understood as a limitation on the scope of the utility model patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present utility model, several modifications and improvements can still be made, and the present utility model also intends to include these modifications and improvements.

Claims

1. A probe mechanism based on an SMT first-piece automatic detection device, characterized in that, It includes a mechanism body, which includes a movable bracket, a lifting guide rail electric cylinder, a rotating platform, an adjustment buffer assembly, a plurality of test probes and a visual detection assembly; the movable bracket is arranged on the rear side of the lifting guide rail electric cylinder; the lifting guide rail electric cylinder is arranged on the rear side of the rotating platform; the rotating platform is used to rotate the adjustment buffer assembly and a plurality of test probes; the plurality of test probes are arranged at the bottom of the adjustment buffer assembly; the visual detection assembly is arranged on one side of the movable bracket.

2. The probe mechanism based on the SMT first-piece automatic detection device according to claim 1, characterized in that, The movable bracket is movably connected with a driving mechanism, and the driving mechanism is a linear module.

3. The probe mechanism of the SMT first-piece automatic detection device according to claim 1, characterized in that, One side of the lifting guide rail electric cylinder is connected with a lifting slide block, the lifting slide block is connected with a connecting plate, and the connecting plate is connected to one side of the rotating platform.

4. The probe mechanism based on the SMT first-piece automatic detection device according to claim 1, characterized in that, The top of the rotating platform is connected with a rotating motor.

5. The probe mechanism of the SMT first-piece automatic detection device according to claim 1, wherein, The adjustment buffer assembly includes an adjustment motor, a first slider, a second slider, a first L-shaped block, a first probe block, a second L-shaped block, and a second probe block; the output end of the adjustment motor is connected to an adjustment gear, the inner side of the first slider is connected to a first rack, the inner side of the second slider is connected to a second rack, and the adjustment gear is respectively connected to the first rack and the second rack; the first L-shaped block is movably connected to the first probe block through a linear guide; the second L-shaped block is movably connected to the second probe block through a linear guide; the first probe block and the second probe block are respectively connected to the upper part of the test probe.

6. The probe mechanism of the SMT first-piece automatic detection device according to claim 5, characterized in that, A first spring column is connected between the bottom of the first L-shaped connection block and the top of the first probe connection block.

7. The probe mechanism of the SMT first-piece automatic detection device according to claim 5, characterized in that, A second spring column is connected between the bottom of the second L-shaped connection block and the top of the second probe connection block.

8. The probe mechanism based on the SMT first-piece automatic detection device according to claim 5, wherein, The adjustment buffer assembly also includes a slide rail, and the first slider and the second slider are movably connected to the slide rail respectively.

9. The probe mechanism of the SMT first-piece automatic detection device according to claim 5, characterized in that, A first detection camera is provided on one side of the adjustment buffer component.

10. The probe mechanism of the SMT first-piece automatic detection device according to claim 1, characterized in that, The visual inspection component includes a second inspection camera and an inspection lighting lamp. The second inspection camera is arranged on the upper part of the movable bracket. Two inspection lighting lamps are provided, and the two inspection lighting lamps are respectively arranged on both sides of the lower part of the movable bracket. The second inspection camera is arranged on the upper part of the two inspection lighting lamps.

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