ATE machine V93000-based high-precision ADC four-station simultaneous testing device

Abstract

The utility model relates to the technical field of testing, in particular to a high-precision ADC four-station simultaneous testing device based on ATE machine table V93000, which comprises a clamp and a frame structure matched with the ATE machine table, a test board is arranged at the top of the clamp, and a plurality of contact points electrically connected with a test interface of the ATE machine table are arranged at the bottom of the test board; the top of the test board is provided with a device seat, and each terminal of the device seat is electrically connected with the corresponding contact point; the top of the test board is also provided with a control circuit which is electrically connected with the plurality of contact points and the device seat. According to the utility model, four-station automatic simultaneous testing can be realized, so that a large amount of time can be saved, the testing efficiency, the machine utilization rate and the testing yield can be improved, and the testing resources can be fully utilized.

Description

Technical Field

[0001] The utility model relates to the technical field of testing, in particular to a testing device for high-precision ADC four-station simultaneous testing based on the ATE machine V93000. Background Technique

[0002] AD7606BSTZ is an 8-channel 16-bit bipolar synchronous sampling ADC. This chip uses ±10V and ±5V bipolar analog inputs and has an on-chip reference voltage source of 2.5V. This circuit is widely used in process control, data acquisition systems, digital gain, offset voltage adjustment, and programmable voltage sources. In view of the current trend of the gradually expanding application scope of such high-precision ADC products, how to improve the reliability and testing efficiency of high-precision ADCs has become an urgent problem to be solved. Content of the Utility Model

[0003] The utility model provides a testing device for high-precision ADC four-station simultaneous testing based on the ATE machine V93000, which can realize four-station automatic simultaneous testing. Therefore, it can save a large amount of time, improve the testing efficiency, the utilization rate of the machine, and the yield of testing, so as to make full use of testing resources.

[0004] To achieve the above object, the utility model provides the following technical solution: A testing device for high-precision ADC four-station simultaneous testing based on the ATE machine V93000, which includes: a fixture, a frame structure adapted to the ATE machine, and a testing board is installed on the top of the fixture. A plurality of contact points electrically connected to the testing interface of the ATE machine are provided at the bottom of the testing board; a testing board, a device seat is provided on the top of the testing board, and each terminal of the device seat is electrically connected to the corresponding contact point; a control circuit electrically connected to a plurality of the contact points and the device seat is further provided on the top of the testing board.

[0005] Preferably, the device seat includes four chip mounting seats, and the plurality of contact points are divided into four regions corresponding to the four chip mounting seats. The contact points in each region are electrically connected to the corresponding chip mounting seat through their respective control circuits.

[0006] Preferably, the control circuit includes a power interface and a relay electrically connected between the power interface and the chip mounting seat.

[0007] Preferably, a modification pad electrically connected to each of the contact points is provided on the top of the testing board.

[0008] The beneficial effects of the present utility model are as follows: During the testing process, the ADC chip is installed on the device socket, and the test board is installed and tested with the ATE machine using a fixture. It can test one or more ADC chips, and the four designed chip sockets achieve four-station automated simultaneous testing. This design can save a large amount of time, improve the testing efficiency, the utilization rate of the machine, and the testing yield rate, thereby fully utilizing the testing resources. During the single-station and multi-station testing processes, the tester can send control signals to the control circuit through the V93000, and then manage the power supply to each chip socket through the relay, meeting the testing requirements of single-station and multi-station. When the test board needs to be debugged or fails, the function modification and fault repair of the test board can be achieved by using the modified pads to connect the flying wires. Therefore, during the later use of the test board, various technical problems can be flexibly addressed. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0010] Figure 1 It is a schematic diagram of the overall structure of the present utility model;

[0011] Figure 2 It is a schematic diagram of the bottom structure of the test board of the present utility model;

[0012] Figure 3 It is a schematic diagram of the fixture structure of the present utility model;

[0013] Figure 4 It is a schematic diagram of the chip socket structure.

[0014] In the figure: 1. Fixture; 2. Test board; 3. Contact point; 4. Control circuit; 5. Chip socket; 6. Power interface; 7. Relay; 8. Modified pad. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0015] The following will clearly and completely describe the technical solutions of the present utility model in conjunction with the drawings of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, rather than all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present utility model.

[0016] According to Figure 1 、 Figure 2 、Figure 3 , Figure 4 As shown in Figure 4 , a test device for high-precision ADC four-station simultaneous measurement based on the ATE machine V93000 includes: a fixture 1, a frame structure of the fixture 1 adapted to the ATE machine, and a test board 2 is installed on the top of the fixture 1. A plurality of contact points 3 electrically connected to the test interface of the ATE machine are provided at the bottom of the test board 2; a test board 2, a device socket is provided on the top of the test board 2, and each terminal of the device socket is electrically connected to the corresponding contact point 3; a control circuit 4 electrically connected to a plurality of the contact points 3 and the device socket is further provided on the top of the test board 2. Among them, the device socket includes four chip mounting seats 5, and a plurality of the contact points 3 are divided into four regions corresponding to the four chip mounting seats 5. The contact points 3 in each region are respectively electrically connected to the corresponding chip mounting seat 5 through their respective control circuits 4.

[0017] Through the above settings, taking AD7606BSTZ as an example, it is installed on the chip mounting seat 5, and the test board 2 is installed with the ATE machine by using the fixture 1. Next, the test is carried out according to the following steps:

[0018] 1. Connectivity test, that is, except for the power supply pin and the ground pin, a current is applied to each other pin of AD7606BSTZ according to the national military standard for current measurement and voltage measurement. A current of -0.1 mA is applied, and the V93000 collects the voltage value of each pin at this time, and judges whether it is qualified according to the given limit;

[0019] 2. Function test FUNCTION, that is, comparing the input excitation and output excitation to complete the test. After the function test is completed, it means that the function of the chip is normal and prepares for the next test.

[0020] 3. Output high-level test VOH: After applying the corresponding excitation to the input of AD7606BSTZ to make the output pin change from low level to high level and stably output, use V93000 and measure the output voltage by applying a load current according to the national military standard method. The test system automatically collects the voltage value of the high level at this time, and judges whether it is qualified according to the limit given in the device manual;

[0021] 4. Output low-level test VOL: After applying the corresponding excitation to the input of AD7606BSTZ to make the output pin change from high level to low level and stably output, use V93000 and measure the output voltage by applying a load current according to the national military standard method. The test system automatically collects the voltage value of the low level at this time, and judges whether it is qualified according to the limit given in the device manual;

[0022] 5. Leakage current test of input high level \(I_{IH}\): After the AD7606BSTZ starts to work normally and the output is normal and stable, use the V93000 to apply voltage and measure current according to the national military standard method. The test system automatically collects the leakage current value of the input high level at this time, and judges whether it is qualified according to the given judgment limit;

[0023] 6. Leakage current test of input low level \(I_{IL}\): After the AD7606BSTZ starts to work normally and the output is normal and stable, use the V93000 to apply voltage and measure current according to the national military standard method. The test system automatically collects the leakage current value of the input high level at this time, and judges whether it is qualified according to the given judgment limit;

[0024] 7. Power consumption test of power supply: After the AD7606BSTZ starts to work normally and the output is normal and stable, use the V93000 to apply voltage and measure current according to the national military standard method. The test system automatically collects the power consumption value output by the reference pin at this time, and judges whether it is qualified according to the given judgment limit;

[0025] 8. Reference voltage test \(V_{REF}\): After the AD7606BSTZ starts to work normally and the output is normal and stable, use the V93000 to apply current and measure voltage according to the national military standard method. The test system automatically collects the output voltage value at this time, and judges whether it is qualified according to the given judgment limit;

[0026] 9. Power supply current test: After the AD7606BSTZ starts to work normally and the output is normal and stable, use the V93000 to automatically collect the current values of each power supply by the test system according to the national military standard method, and judge whether it is qualified according to the given judgment limit;

[0027] 10. Static parameter test: After the AD7606BSTZ starts to work normally and the output is normal and stable, use the V93000 to apply the specified input analog voltage according to the national military standard method. The test system automatically collects the actual code value conversion level at this time, compares it with the fitting straight line, and calculates the values of \(I_{NL}\), \(DNL\), offset error, and gain error, and judges whether it is qualified according to the given judgment limit conditions;

[0028] 11. Dynamic parameter test: After the AD7606BSTZ starts to work normally and the output is normal and stable, use the V93000 to apply the specified input analog voltage according to the national military standard method. The test system automatically collects the appropriate ADC output converted data, and performs FFT operation on the collected data to obtain the converted power spectrum. Calculate the signal-to-noise ratio, signal-to-noise and distortion ratio, total harmonic distortion, and spurious-free dynamic range respectively according to the definition. And judge whether it is qualified according to the given judgment limit;

[0029] 12. Set the method for unqualified interruption testing; if a certain parameter is unqualified during the testing process, the testing process will stop immediately.

[0030] 13. Set the testing sequence of each parameter.

[0031] 14. Compile the test parameters. After the test parameters are written, the program is compiled until the compilation passes.

[0032] Through the above testing process, this testing device can test one or more ADC chips, and the four designed chip mounts 5 achieve four-station automatic simultaneous testing. This design can save a lot of time, improve the testing efficiency, the utilization rate of the machine platform and the yield rate of testing, so as to make full use of the testing resources.

[0033] The control circuit 4 includes a power interface 6 and a relay 7 electrically connected between the power interface 6 and the chip mount 5.

[0034] Through the above settings, during the single-station and multi-station testing processes, the tester can send a control signal to the control circuit 4 through the V93000, so as to manage the power supply of each chip mount 5 through the relay 7. The testing requirements of single-station and multi-station are met.

[0035] The top of the test board 2 is provided with a modification pad 8 electrically connected to each of the contact points 3.

[0036] In this setting, when the test board 2 needs to be debugged or fails, the modification pad 8 can be used to connect the flying wire to realize the function modification and fault repair of the test board 2. Therefore, during the later use of the test board 2, various technical problems can be flexibly handled.

[0037] The above is only the specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of changes or substitutions, which should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. A test device for high-precision ADC four-station simultaneous measurement based on the ATE machine V93000, characterized in that , including: A fixture (1), which has a frame structure adapted to the ATE machine tool, and a test board (2) is installed on the top of the fixture (1). A plurality of contact points (3) electrically connected to the test interface of the ATE machine tool are provided at the bottom of the test board (2); A test board (2), on the top of which a device socket is provided, and each terminal of the device socket is electrically connected to the corresponding contact point (3); A control circuit (4) electrically connected to a plurality of the contact points (3) and the device socket is further provided on the top of the test board (2).

2. The testing device for high-precision ADC four-station simultaneous testing based on the ATE machine V93000 according to claim 1, wherein: The device socket includes four chip mounting seats (5). A plurality of the contact points (3) are divided into four regions corresponding to the four chip mounting seats (5), and the contact points (3) in each region are electrically connected to the corresponding chip mounting seat (5) through their respective control circuits (4).

3. The test device for high-precision ADC four-station simultaneous measurement based on the ATE machine V93000 according to claim 2, wherein: The control circuit (4) includes a power supply interface (6) and a relay (7) electrically connected between the power supply interface (6) and the chip mounting seat (5).

4. A test device for high-precision ADC four-station simultaneous measurement based on the ATE machine V93000 according to claim 1, characterized in that: A modification pad (8) electrically connected to each of the contact points (3) is provided on the top of the test board (2).

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