Testing device and aging testing system for electronic detonator control module

Abstract

The utility model discloses a test device and an aging test system for an electronic detonator control module, and belongs to the technical field of electronic detonator test equipment. The testing device for the electronic detonator control module comprises a base, the base is provided with a placing limiting groove used for placing a to-be-tested module, the to-be-tested module can be placed in the placing limiting groove, and the to-be-tested module placed in the placing limiting groove is limited in the circumferential direction; a plurality of pairs of test probes are arranged in one-to-one correspondence with the plurality of pairs of connection pins, and one ends, facing the connection pins, of each pair of test probes are used for being in top contact with and electrically connected with each pair of connection pins which are arranged right opposite to each other; and the test control circuit board is arranged on one side of the base, and one end, deviating from the connecting pin, of each pair of test probes is electrically connected with a test control circuit arranged on the test control circuit board. The testing device for the electronic detonator control module is beneficial to improving the testing efficiency of the electronic detonator control module and improving the testing accuracy.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic detonator testing equipment, in particular to a testing device and an aging testing system for an electronic detonator control module. Background Art

[0002] At present, electronic detonators are widely used in occasions such as tunnel excavation, dangerous blasting, demolition blasting, ore-rock separation, and open-pit blasting. The electronic detonator control module in the electronic detonator is the main detonation control part of the electronic detonator. The electronic detonator control module mainly includes a control circuit board and a control chip, an ignition element, an energy storage capacitor, and multiple electronic components installed on the control circuit board. The performance and reliability of the electronic detonator control module will directly affect the reliability of the electronic detonator.

[0003] Furthermore, in the prior art, in order to reduce the production cost of the electronic detonator control module, it is produced by means of mass production. During the process of mass-producing the electronic detonator control module, due to the influence of factors such as production technology and the working conditions of production equipment, a small number of defective products will be produced. Therefore, it is necessary to test the produced electronic detonator control modules to screen out the defective products among multiple electronic detonator control modules, so as to eliminate the screened defective products and avoid the defective products from leaving the factory.

[0004] Furthermore, in the prior art, in order to test the electronic detonator control module, testers need to sequentially place multiple electronic detonator control modules on the test fixture, and then fix the placement of multiple electronic detonator control modules through the test fixture and perform power-on testing; during the process of placing multiple electronic detonator control modules, it is necessary to adjust the placement postures of multiple electronic detonator control modules. After the test is completed, testers need to sequentially take out multiple electronic detonator control modules placed on the test fixture. The operation is cumbersome, the workload is large, and the test efficiency is low; in addition, the differences in the placement postures of multiple electronic detonator control modules by testers on the test fixture are also likely to lead to differences in test results. Therefore, there is an urgent need for a testing device that is beneficial to improving the test efficiency of the electronic detonator control module and the accuracy of the test. Summary of the Invention

[0005] The purpose of the utility model is to overcome at least one of the above-mentioned deficiencies in the prior art, and provide a testing device for an electronic detonator control module that is beneficial to improving the test efficiency of the electronic detonator control module and the accuracy of the test. In addition, an aging testing system for an electronic detonator control module is also provided.

[0006] The technical solution of the utility model to solve the above technical problems is as follows:

[0007] According to one aspect of the present application, a test device for an electronic detonator control module is provided, which is used to test the electronic detonator control module. A plurality of the electronic detonator control modules are arranged on a circuit board substrate. A plurality of circuit board branches are arranged on the circuit board substrate at intervals. Each of the circuit board branches is provided with a plurality of electronic components, and a pair of connecting pins are connected to one end of each circuit board branch in the length direction. The circuit board branches, the plurality of electronic components arranged on the circuit board branches, and the pair of connecting pins together constitute an electronic detonator control module. The circuit board substrate provided with the plurality of the electronic detonator control modules constitutes a module to be tested. The test device for the electronic detonator control module comprises:

[0008] A base, wherein the base is provided with a placement limiting groove for placing the module to be tested, the module to be tested can be placed in the placement limiting groove, and the placement limiting groove can limit the module to be tested placed in the placement limiting groove in a circumferential direction;

[0009] A plurality of test probes are provided corresponding to the plurality of connection pins one by one, and one end of each pair of the test probes facing the connection pins is used to contact and electrically connect with each pair of the connection pins arranged opposite to each other;

[0010] A test control circuit board is arranged on one side of the base, and one end of each pair of the test probes away from the connecting pins is electrically connected to a test control circuit arranged on the test control circuit board.

[0011] The beneficial effects of the utility model are as follows: the base in the present embodiment is provided with a placement limit groove for placing the module to be tested, which is convenient for placing the module to be tested in the placement limit groove, and the placement limit groove is used to limit the module to be tested in the circumferential direction, so that multiple electronic detonator control modules can be placed on the base at one time, and multiple electronic detonator control modules in the module to be tested are arranged on the circuit board substrate, and the placement posture of the circuit board substrate can be made suitable by straightening and limiting the placement posture of the circuit board substrate, which is conducive to quickly placing multiple electronic detonator control modules and ensuring the suitability of placing multiple electronic detonator control modules, thereby improving the testing efficiency of the electronic detonator control modules; further, by providing multiple pairs of test probes and test control circuit boards, one end of each pair of test probes is electrically connected to the test control circuit provided on the test control circuit board, and one end of the test probe is contacted with the connection pin stop top, so that multiple electronic detonator control modules can be quickly electrically connected to the test control circuit board, which is convenient for powering on and synchronously testing multiple electronic detonator control modules respectively through a test control circuit board.

[0012] In addition, based on the above technical solution, the present invention may also be improved as follows and may have the following additional technical features.

[0013] According to an embodiment of the present application, the front side of the placement limiting groove is open to form a placement through - opening, the left - hand inner wall of the placement limiting groove forms a left - hand limiting edge, the right - hand inner wall of the placement limiting groove forms a right - hand limiting edge, and the rear - hand inner wall of the placement limiting groove forms a rear - hand limiting edge;

[0014] The test device for the electronic detonator control module further includes:

[0015] A front - side locking device, detachably installed on the base and located in the front part of the placement through - opening. The front - side locking device protrudes upward in the vertical direction, and the rear end of the front - side locking device forms a front - side limiting edge. The left - hand limiting edge, the right - hand limiting edge, the rear - hand limiting edge, and the front - side locking device can lock the module under test placed therebetween.

[0016] In this embodiment, the front - side opening of the placement limiting groove forms a placement through - opening, which is convenient for placing the module under test into the placement limiting groove through the placement through - opening. Further, by detachably installing the front - side locking device in the front part of the placement through - opening, it is convenient to lock the module under test placed between the left - hand limiting edge, the right - hand limiting edge, the rear - hand limiting edge, and the front - side locking device, so as to fix the module under test. In addition, the front - side locking device is detachable. After the test is completed, it is convenient to remove the front - side locking device and then take out the module under test, so as to take out multiple electronic detonator control modules together.

[0017] According to an embodiment of the present application, the distance between the front - side limiting edge and the rear - hand limiting edge is adjustable.

[0018] In this embodiment, the distance between the front - side limiting edge and the rear - hand limiting edge is adjustable, which is convenient for adjusting the distance between the front - side limiting edge and the rear - hand limiting edge according to the width dimension of the circuit board substrate or the module under test in the front - rear direction, so that the placement limiting groove can adapt to circuit board substrates or modules under test with different width dimensions in the front - rear direction, and improve the applicability of the test device.

[0019] According to an embodiment of the present application, a plurality of installation through - grooves are provided at the front end of the base, and the front ends of the installation through - grooves are open;

[0020] The front - side locking device includes:

[0021] Stop blocks, a plurality of which are provided corresponding to the plurality of installation through - grooves. The stop blocks are movably installed in the installation through - grooves. The upper ends of the stop blocks protrude upward to form protruding portions, and the rear ends of the protruding portions form the front - side limiting edges;

[0022] There are multiple locking members, which are provided in one-to-one correspondence with the multiple stop blocks, and the locking members are used to lock and connect the stop blocks to the base.

[0023] In this embodiment, by providing a plurality of installation through grooves at the front end of the base, it is convenient to install the stop blocks in the installation through grooves, and it is convenient to limit the test module placed in the placement limit groove through the stop blocks on the front side; further, the stop blocks are locked and connected to the base through the locking members, so that the stop blocks are fixed on the base, and then the test module placed in the placement limit groove is fixed on the base, which is convenient to fix the multiple electronic detonator control modules in the test module.

[0024] According to an embodiment of the present application, a stop limit convex block is connected to the upper end of the stop block, and the stop limit convex block extends backward to form a stop limit tongue, and the lower side surface of the stop limit tongue can stop against the upper side surface of the circuit board substrate placed in the placement limit groove, and the circuit board substrate placed in the placement limit groove is limited in the placement limit groove in the vertical direction.

[0025] In this embodiment, a stop limit convex block is connected to the upper end of the stop block, and the stop limit convex block extends backward to form a stop limit tongue, which is convenient to stop against the upper side surface of the circuit board substrate through the stop limit tongue, so as to conveniently limit the circuit board substrate placed in the placement limit groove in the placement limit groove in the vertical direction, and realize the fixation of the test module and the multiple electronic detonator control modules in the test module.

[0026] According to an embodiment of the present application, each circuit board strip is respectively wrapped with an insulating sealing colloid, and the other end of each circuit board strip in the length direction is connected with an ignition element, and the ignition element and a pair of connection pins are respectively exposed outside the insulating sealing colloid. The circuit board strip, the multiple electronic components arranged on the circuit board strip, the ignition element and a pair of connection pins together constitute an electronic detonator control module;

[0027] An avoidance groove is further provided on the base, and the avoidance groove communicates with the placement limit groove. When the test module is placed in the placement limit groove, the side wall of the insulating sealing colloid facing the avoidance groove extends into the avoidance groove.

[0028] The electronic detonator control module in this embodiment includes an ignition element and an insulating sealing colloid. The insulating sealing colloid wraps the multiple electronic components arranged on the circuit board strip, and the ignition element is connected to the circuit board strip, making the formed electronic detonator control module closer to the finished product. During the test, the ignition element and the multiple electronic components after encapsulation can be tested together; in addition, in this embodiment, by providing an avoidance groove on the base, the avoidance groove communicates with the placement limit groove, which is convenient to accommodate the insulating sealing colloid through the avoidance groove.

[0029] According to an embodiment of the present application, connection protrusions are provided on the base, the connection protrusions are located at the rear side of the placement limiting groove, and a plurality of pairs of insertion interfaces are provided on the connection protrusions corresponding to a plurality of pairs of the connection pins one by one. A plurality of pairs of test probes are respectively installed on the plurality of pairs of insertion interfaces, and both ends of the plurality of pairs of test probes respectively penetrate out of the insertion interfaces;

[0030] The test control circuit board is installed at the rear side of the connection protrusion, and the rear ends of the plurality of pairs of test probes are respectively electrically connected to the test control circuit provided on the test control circuit board.

[0031] In this embodiment, by providing a plurality of pairs of insertion interfaces on the connection protrusions corresponding to a plurality of pairs of connection pins one by one, it is convenient to respectively install a plurality of pairs of test probes on the plurality of pairs of insertion interfaces; in addition, by installing the test control circuit board at the rear side of the connection protrusion, it is convenient to respectively electrically connect the rear ends of the plurality of pairs of test probes to the test control circuit provided on the test control circuit board.

[0032] According to an embodiment of the present application, the test control circuit board is provided with a plurality of pairs of conductive insertion interfaces corresponding to the plurality of pairs of insertion interfaces one by one. The plurality of pairs of conductive insertion interfaces are respectively electrically connected to the test control circuit provided on the test control circuit board. The rear ends of the plurality of pairs of test probes are respectively inserted into a pair of the conductive insertion interfaces arranged opposite to each other and are electrically connected to the conductive insertion interfaces.

[0033] In this embodiment, the test control circuit board is provided with a plurality of pairs of conductive insertion interfaces corresponding to the plurality of pairs of insertion interfaces one by one. By inserting the test probes into the conductive insertion interfaces, the test probes can be electrically connected to the test control circuit provided on the test control circuit board, which is convenient for quickly electrically connecting the test probes to the test control circuit provided on the test control circuit board.

[0034] According to another aspect of the present application, an aging test system for an electronic detonator control module is provided, including:

[0035] A support frame;

[0036] A master control circuit board, installed on the support frame;

[0037] The above-mentioned test device for an electronic detonator control module, the test device for an electronic detonator control module is installed on the master control circuit board, and the test control circuit provided on the test control circuit board is electrically connected to the master control circuit provided on the master control circuit board;

[0038] A circuit board substrate, on which a plurality of electronic detonator control modules are arranged to form a module to be tested, the module to be tested is placed in the placement limit groove, and each pair of the connecting pins is respectively in contact with and electrically connected to a pair of the test probe stoppers arranged opposite to each other.

[0039] The aging test system for electronic detonator control modules in this embodiment includes a master control circuit board, the above-mentioned test device for electronic detonator control modules and a circuit board substrate. A plurality of electronic detonator control modules are arranged on the circuit board substrate to constitute a module to be tested, so that the module to be tested can be placed in a placement limit groove, and the placement limit groove is used to limit the module to be tested in a circumferential direction, so that a plurality of electronic detonator control modules can be placed on the base at one time, and a plurality of electronic detonator control modules in the module to be tested are arranged on the circuit board substrate. The placement posture of the plurality of electronic detonator control modules can be made suitable by straightening and limiting the placement posture of the circuit board substrate, which is conducive to quickly placing a plurality of electronic detonator control modules and ensuring the suitability of the placement of a plurality of electronic detonator control modules, and is conducive to improving the efficiency of placing and removing a plurality of electronic detonator control modules, thereby improving the efficiency of aging test on the electronic detonator control modules; further, the test control circuit is electrically connected to the master control circuit board, so that the aging test control of the test control circuit can be performed through the master control circuit board.

[0040] According to one embodiment of the present application, a plurality of conductive sockets are provided at intervals on the master control circuit board, and the plurality of conductive sockets are electrically connected to the master control circuit provided on the master control circuit board, respectively; a plurality of conductive plug connectors are provided on the test control circuit board, and the plurality of conductive plug connectors are electrically connected to the test control circuit provided on the test control circuit board; the conductive plug connectors are plugged into the conductive sockets and are electrically conductively connected to the conductive sockets.

[0041] In this embodiment, a plurality of conductive sockets are arranged at intervals on the master control circuit board, and a plurality of conductive plug connectors are arranged on the test control circuit board, so that the conductive plug connectors can be easily plugged into the conductive sockets, thereby installing the test device on the conductive sockets and electrically connecting the test control circuit to the master control circuit board.

[0042] According to one embodiment of the present application, the aging test system for the electronic detonator control module further includes:

[0043] An aging test box, an aging test cavity is formed on the inner side of the aging test box, a plurality of support frames are provided, and the plurality of support frames are arranged in the aging test cavity. A plurality of master control circuit boards are horizontally installed on each of the support frames, and the plurality of master control circuit boards are arranged at intervals in the vertical direction. A plurality of test devices for electronic detonator control modules are respectively installed on each of the master control circuit boards, and the test control circuit boards on the plurality of test devices for electronic detonator control modules are respectively electrically connected to the master control circuit provided on the master control circuit board.

[0044] The aging test box in this embodiment is provided with multiple support frames, each of which has multiple master control circuit boards horizontally mounted on it. The multiple master control circuit boards are spaced apart in the vertical direction, and each master control circuit board is respectively mounted with multiple test devices for the electronic detonator control module, thereby increasing the number of electronic detonator control modules that can be tested at one time by the aging test system, which is conducive to realizing large-scale aging tests; further, the test control circuit boards are respectively electrically connected to the master control circuits provided on the master control circuit boards, thereby facilitating aging test control of multiple test control circuits through one master control circuit board, and facilitating powering on and aging tests of multiple electronic detonator control modules respectively. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solution in the present utility model, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0046] Figure 1 This is a structural schematic diagram of a testing device for an electronic detonator control module according to an embodiment of the utility model;

[0047] Figure 2 for Figure 1 Front view after straightening;

[0048] Figure 3 for Figure 2 A top view of

[0049] Figure 4 It is a schematic diagram of the structure of the module to be tested placed in the limit groove on the fixed base in the embodiment of the utility model;

[0050] Figure 5 for Figure 4 A top view of

[0051] Figure 6 It is a schematic diagram of the structure in which the conductive plug connector in the embodiment of the utility model is connected to the test control circuit board;

[0052] Figure 7 This is a schematic structural diagram of the anti-top block in the embodiment of the present utility model;

[0053] Figure 8 This is a schematic structural diagram of the aging test system for the electronic detonator control module in the embodiment of the present utility model;

[0054] Figure 9 This is a schematic structural diagram of the master control circuit board in the embodiment of the present utility model. Detailed implementation manners

[0055] To make the objectives, technical solutions, and advantages of the present application clearer, the following will further describe the embodiments of the present application in detail with reference to the accompanying drawings.

[0056] To be able to more clearly understand the above-mentioned objectives, features, and advantages of the present utility model, the following will further describe the present utility model in detail with reference to the accompanying drawings and specific implementation manners. It should be noted that, without conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0057] Many specific details are set forth in the following description in order to fully understand the present utility model. However, the present utility model can also be implemented in other ways different from those described herein. Therefore, the protection scope of the present utility model is not limited by the specific embodiments disclosed below.

[0058] On one hand of the present application, a test device for an electronic detonator control module is provided. As Figures 1 to 5 shown, it is used to test the electronic detonator control module. A plurality of electronic detonator control modules are arranged on the circuit board substrate 6. A plurality of circuit board strips 60 are spaced on the circuit board substrate 6. Each circuit board strip 60 is provided with a plurality of electronic components, and a pair of connection pins 61 are connected to one end of each circuit board strip 60 in the length direction. The circuit board strip 60, the plurality of electronic components arranged on the circuit board strip 60, and a pair of connection pins 61 together constitute an electronic detonator control module. The circuit board substrate 6 provided with a plurality of electronic detonator control modules constitutes a module to be tested. The test device for the electronic detonator control module includes:

[0059] A base 1, on which a placement limiting groove 10 for placing the module to be tested is provided. The module to be tested can be placed in the placement limiting groove 10, and the placement limiting groove 10 can limit the module to be tested placed in the placement limiting groove 10 in the circumferential direction;

[0060] Test probes 3, there are multiple pairs corresponding to multiple pairs of connection pins 61 one by one. One end of each pair of test probes 3 facing the connection pins 61 is respectively used for abutting contact and electrical connection with each pair of connection pins 61 arranged opposite to each other;

[0061] The test control circuit board 2 is arranged on one side of the base 1 , and one end of each pair of test probes 3 facing away from the connection pins 61 is electrically connected to a test control circuit arranged on the test control circuit board 2 .

[0062] In this embodiment, if Figures 1 to 5 As shown, the base 1 in this embodiment is provided with a placement limit groove 10 for placing the module to be tested, which is convenient for placing the module to be tested in the placement limit groove 10, and the placement limit groove 10 is used to limit the module to be tested in the circumferential direction, so that multiple electronic detonator control modules can be placed on the base 1 at one time, and the multiple electronic detonator control modules in the module to be tested are arranged on the circuit board substrate 6, and the placement posture of the multiple electronic detonator control modules can be made suitable by straightening and limiting the placement posture of the circuit board substrate 6, which is conducive to quickly placing multiple electronic detonator control modules and ensuring the suitability of placing multiple electronic detonator control modules, thereby improving the testing efficiency of the electronic detonator control modules; further, by providing multiple pairs of test probes 3 and a test control circuit board 2, one end of each pair of test probes 3 is electrically connected to the test control circuit provided on the test control circuit board 2, and one end of the test probe 3 is contacted with the connection pin 61 to stop the top, so that the multiple electronic detonator control modules are quickly electrically connected to the test control circuit board 2, so that it is convenient to power on and synchronously test multiple electronic detonator control modules respectively through a test control circuit board 2.

[0063] In this embodiment, if Figure 6 As shown, each pair of connecting pins 61 includes an anode pin and a cathode pin, and the anode pin and the cathode pin are respectively welded to the rear end of the circuit board support 60, and the anode pin and the cathode pin are arranged in parallel; the rear end of the test control circuit board 2 in this embodiment is connected to a conductive plug connector 20, and the conductive plug connector 20 is electrically connected to the test control circuit provided on the test control circuit board 2. Specifically, a plug receiving slot 201 is provided on the conductive plug connector 20, and an anode plug rod 202 and a cathode plug rod 203 are arranged in parallel in the plug receiving slot 201, and the anode plug rod 202 and the cathode plug rod 203 are respectively electrically connected to the test control circuit provided on the test control circuit board 2; in the process of testing multiple electronic detonator control modules, the conductive plug connector 20 is plugged into the output end of the test system to realize power-on to the test control circuit board 2 and transmission of test data.

[0064] Further, such as Figures 1 to 5As shown in the figure, the base 1 in this embodiment is approximately in the shape of a cuboid. The circuit board substrate 6 in the module to be tested in this embodiment is in the shape of a rectangular plate. The placement limiting groove 10 is in the structure of a cuboid cavity. The circuit board substrate 6 includes a left substrate and a right substrate. A first pre-breaking line is provided in the middle of the left substrate and the right substrate, and the first pre-breaking line extends in the front-back direction. Ten circuit board strips 60 are provided on the left substrate. Separation through slots 64 are respectively provided on both sides of each circuit board strip 60. A plurality of electronic components are respectively provided on each circuit board strip 60, and a pair of connection pins 61 are connected to the rear end in the length direction of each circuit board strip 60. A total of ten electronic detonator control modules are provided on the left substrate. In this embodiment, ten pairs of test probes 3 are provided corresponding to the ten electronic detonator control modules on the left substrate. Further, the structure of the right substrate and the left substrate in this embodiment is the same. In addition, the shapes of the base 1 and the circuit board substrate 6 in this embodiment can also be set to other shapes, and the structure of the placement limiting groove 10 can be adaptively adjusted and designed according to the shape of the circuit board substrate 6. The number of electronic detonator control modules provided on the circuit board substrate 6 can be adjusted according to needs.

[0065] Further, as Figure 4 and Figure 5 shown in the figure, a plurality of pre-breaking lines are further provided on the left substrate and the right substrate in the front-back direction in this embodiment, which are used to break off the redundant parts on the left substrate and the right substrate along the pre-breaking lines in the subsequent process to obtain a plurality of independent electronic detonator control modules; it should be noted that the setting of the plurality of pre-breaking lines can refer to the existing technologies in this field and will not be elaborated here.

[0066] In this embodiment, as Figure 4 and Figure 5 shown in the figure, each circuit board strip 60 in this embodiment serves as the control circuit board of an electronic detonator control module. A control circuit, an energy storage capacitor and a plurality of electronic components are provided on the circuit board strip 60. The specific structure of the circuit board strip 60, the plurality of electronic components provided on the circuit board strip 60, and the way the plurality of components are connected to the circuit board strip 60 can all refer to the electronic detonator control modules in the existing technologies and will not be elaborated here.

[0067] In this embodiment, the test device for the electronic detonator control module is specifically used for aging tests on the electronic detonator control module and can also be used for other functional tests on the electronic detonator control module. It should be noted that during the process of using the test device for the electronic detonator control module in this embodiment to conduct aging tests on the electronic detonator control module, operations related to test control, screening out defective products, test data acquisition, test data transmission, recording of defective products, etc. can refer to existing relevant aging test devices in the art. The test control and related operations of the aging test are not the focus of this application and will not be elaborated here.

[0068] An embodiment of the present application, as Figures 1 to 5 shown, the front side of the placement limiting groove 10 is open to form a placement through opening. The left inner wall of the placement limiting groove 10 forms a left limiting edge, the right inner wall of the placement limiting groove 10 forms a right limiting edge, and the rear inner wall of the placement limiting groove 10 forms a rear limiting edge.

[0069] The test device for the electronic detonator control module further includes:

[0070] A front locking device, detachably installed on the base 1 and located in the front part of the placement through opening. The front locking device protrudes upward in the vertical direction, and the rear end of the front locking device forms a front limiting edge. The left limiting edge, the right limiting edge, the rear limiting edge, and the front locking device can lock the module under test placed between them.

[0071] In this embodiment, as Figures 1 to 5 shown, the front side of the placement limiting groove 10 in this embodiment is open to form a placement through opening, which is convenient for placing the module under test into the placement limiting groove 10 through the placement through opening. Further, by detachably installing a front locking device at the front part of the placement through opening, it is convenient to lock the module under test placed between the left limiting edge, the right limiting edge, the rear limiting edge, and the front locking device, so as to fix the module under test. In addition, the front locking device is detachable. After the test is completed, it is convenient to remove the front locking device and then take out the module under test, so as to take out multiple electronic detonator control modules together.

[0072] An embodiment of the present application, as Figure 1 and Figure 3 shown, the distance between the front limiting edge and the rear limiting edge is adjustable.

[0073] In this embodiment, as Figure 1 and Figure 3As shown, the distance between the front limiting edge and the rear limiting edge in this embodiment is adjustable, which is convenient for adjusting the distance between the front limiting edge and the rear limiting edge according to the width dimension of the circuit board substrate 6 or the module to be tested in the front-rear direction, so that the placement limiting groove 10 can adapt to the circuit board substrate 6 or the module to be tested with different width dimensions in the front-rear direction, improving the applicability of the testing device.

[0074] In this embodiment, as Figure 1 and Figure 3 shown, the rear end of the front locking device forms a front limiting edge, and there are various ways to adjust the distance between the front limiting edge and the rear limiting edge; for example, designing front locking devices of multiple specifications, the length dimensions of different specifications of front locking devices in the front-rear direction are different, installing the front locking device on the base 1 and in front of the placement through-hole, and the distances between the front limiting edges and the rear limiting edges of different specifications of front locking devices are different. Thus, according to needs, a suitable specification of the front locking device can be selected and installed on the base 1 to achieve adjusting the distance between the front limiting edge and the rear limiting edge; for another example, a plurality of installation stations are provided in the front-rear direction, and the same front locking device is installed at different installation stations to achieve adjusting the distance between the front limiting edge and the rear limiting edge; for still another example, the front locking device is slidably installed on the base 1 in the front-rear direction and in front of the placement through-hole, and by sliding the front locking device in the front-rear direction, the distance between the front limiting edge and the rear limiting edge of the front locking device is adjusted, and then the front locking device is fixed by a locking fixing member. In addition, the distance between the front limiting edge and the rear limiting edge can also be adjusted by other means.

[0075] An embodiment of the present application, as Figures 1 to 5 shown, a plurality of installation through-grooves 12 are provided at the front end of the base 1, and the front ends of the installation through-grooves 12 are open;

[0076] The front locking device includes:

[0077] A plurality of stop blocks 4 are provided corresponding to the plurality of installation through-grooves 12 one by one. The stop blocks 4 are movably installed in the installation through-grooves 12. The upper ends of the stop blocks 4 protrude upward to form a protruding portion, and the rear end of the protruding portion forms a front limiting edge;

[0078] A plurality of locking members 5 are provided corresponding to the plurality of stop blocks 4 one by one. The locking members 5 are used to lock and connect the stop blocks 4 to the base 1.

[0079] In this embodiment, as Figures 1 to 5As shown, in this embodiment, a plurality of installation through slots 12 are provided at the front end of the base 1, facilitating the installation of the stop block 4 in the installation through slots 12 and facilitating the limitation of the module to be tested placed in the placement limit slot 10 by the stop block 4 at the front side; further, the stop block 4 is tightly connected to the base 1 through the locking member 5, so that the stop block 4 is fixed on the base 1, and then the module to be tested placed in the placement limit slot 10 is fixed on the base 1, facilitating the fixation of a plurality of electronic detonator control modules in the module to be tested.

[0080] In this embodiment, as Figure 4 and Figure 5 shown, in this embodiment, the entire module to be tested is fixed by fixing the circuit board substrate 6 in the module to be tested; for modules to be tested with different specifications, the width dimensions of the circuit board substrate 6 are different. In this embodiment, in order to realize the stop of the circuit board substrate 6 with different sizes by the stop block 4, stop blocks 4 of multiple specifications are designed, and the length dimensions of the stop blocks 4 of different specifications in the front-rear direction are different. The stop blocks 4 are installed in the installation through slots 12, and the distances between the stop blocks 4 of different specifications and the rear limit rib are different, so as to facilitate the fixation of the circuit board substrates 6 with different width dimensions. It should be noted that the module to be tested can also be fixed by other means. For example, several electronic detonator control modules on the module to be tested are fixed, and the integrally connected multiple electronic detonator control modules and the circuit board substrate 6 are also fixed.

[0081] In this embodiment, as Figure 1 and Figure 3 shown, there are two installation through slots 12 in this embodiment, and there are two stop blocks 4. There are two screw through holes II 41 on the stop block 4. Each stop block 4 in this embodiment is fixed by two locking members 5. The locking member 5 is specifically a screw, and the screw passes through the screw through hole II 41 and is threadedly connected to the threaded hole provided on the base 1. Further, there can also be three, four, etc. installation through slots 12 and stop blocks 4 in this embodiment, and each stop block 4 can also be fixed by only one screw.

[0082] In this embodiment, as Figure 4 and Figure 5As shown, the front ends of multiple pairs of test probes 3 in this embodiment are in abutting contact with the rear ends of multiple pairs of connection pins 61. There is a gap between the rear end face of the circuit board substrate 6 and the rear limiting edge of the placement limiting groove 10. The circuit board substrate 6 is fixed under the action of multiple pairs of test probes 3, the left limiting edge, the right limiting edge and the abutting block 4, so as to fix the module to be tested; in the actual use process, the rear end face of the circuit board substrate 6 can also be abutted against the rear limiting edge of the placement limiting groove 10; in addition, there can be various ways to fix the module to be tested in the placement limiting groove 10, and the structure of the placement limiting groove 10 can also have various forms, as long as it is convenient to place the module to be tested and convenient to fix the module to be tested.

[0083] An embodiment of the present application, as Figure 4 and Figure 5 shown, a top limiting convex block 40 is connected to the upper end of the abutting block 4. The top limiting convex block 40 extends backward to form a top limiting tongue 401. The lower side surface of the top limiting tongue 401 can abut against the upper side surface of the circuit board substrate 6 placed in the placement limiting groove 10, and the circuit board substrate 6 placed in the placement limiting groove 10 is limited in the placement limiting groove 10 in the vertical direction.

[0084] In this embodiment, as Figure 4 and Figure 7 shown, a top limiting convex block 40 is connected to the upper end of the abutting block 4 in this embodiment. The top limiting convex block 40 extends backward to form a top limiting tongue 401, which is convenient to abut against the upper side surface of the circuit board substrate 6 through the top limiting tongue 401, so as to conveniently limit the circuit board substrate 6 placed in the placement limiting groove 10 in the placement limiting groove 10 in the vertical direction, and realize the fixation of the module to be tested and multiple electronic detonator control modules in the module to be tested.

[0085] An embodiment of the present application, as Figure 1 、 Figure 4 and Figure 5 shown, an insulating sealing colloid 63 is respectively wrapped around the outer periphery of each circuit board strip 60. The other end of each circuit board strip 60 in the length direction is connected with an ignition element 62. The ignition element 62 and a pair of connection pins 61 are respectively exposed outside the insulating sealing colloid 63. The circuit board strip 60, multiple electronic components arranged on the circuit board strip 60, the ignition element 62 and a pair of connection pins 61 together constitute an electronic detonator control module;

[0086] A relief groove 11 is also provided on the base 1. The relief groove 11 communicates with the placement limiting groove 10. When the module to be tested is placed in the placement limiting groove 10, the side wall of the insulating sealing colloid 63 facing the relief groove 11 extends into the relief groove 11.

[0087] In this embodiment, as Figure 1 andFigure 4 As shown, the electronic detonator control module in this embodiment includes an ignition element 62 and an insulating encapsulant 63. The insulating encapsulant 63 wraps multiple electronic components disposed on the circuit board strip 60. The ignition element 62 is connected to the circuit board strip 60, making the formed electronic detonator control module closer to the finished product. During the testing process, the ignition element 62 and the multiple encapsulated electronic components can be tested together. Additionally, in this embodiment, an avoidance groove 11 is provided on the base 1, and the avoidance groove 11 communicates with the placement limit groove 10, facilitating the accommodation of the insulating encapsulant 63 through the avoidance groove 11.

[0088] In this embodiment, as Figure 1 and Figure 4 shown, the avoidance groove 11 is located below the placement limit groove 10 and communicates with the placement limit groove 10. When the module to be tested is placed in the placement limit groove 10, the lower part of the insulating encapsulant 63 extends into the avoidance groove 11, and the lower side surface of the circuit board substrate 6 is placed on and supported by the bottom side wall of the placement limit groove 10. The placement limit groove 10 in this embodiment has a cuboid cavity structure, and the avoidance groove 11 has a long cuboid cavity structure. Further, a material removal through-hole 14 is also provided on the base 1 in this embodiment, and the material removal through-hole 14 communicates with the avoidance groove 11.

[0089] Further, as Figure 4 and Figure 5 shown, the circuit board substrate 6 in this embodiment includes a left substrate and a right substrate. Correspondingly, there are two avoidance grooves 11 in this embodiment. When the module to be tested is placed in the placement limit groove 10, the lower part of the insulating encapsulant 63 of the electronic detonator control module disposed on the left substrate extends into the left avoidance groove 11, and the lower part of the insulating encapsulant 63 of the electronic detonator control module disposed on the right substrate extends into the right avoidance groove 11.

[0090] Further, as Figure 4 and Figure 5 shown, the ignition element 62 in this embodiment is connected to the front end of the circuit board strip 60. The ignition element 62 includes a pair of conductive pins and an ignition resistor. The pair of conductive pins are welded to the welding pads provided at the front end of the circuit board strip 60, and the ignition resistor is connected between the front ends of the pair of conductive pins. The ignition element 62 can also refer to the existing technologies in this field. Further, the insulating encapsulant 63 in this embodiment is formed by an injection molding process. The formation of the insulating encapsulant 63 can refer to the existing technologies in this field and will not be elaborated here. Additionally, the structure of the insulating encapsulant 63 can also be reasonably designed according to needs.

[0091] An embodiment of the present application, as Figures 1 to 5As shown, a connecting protrusion 13 is provided on the base 1. The connecting protrusion 13 is located at the rear side of the placement limiting groove 10. A plurality of insertion interfaces are provided on the connecting protrusion 13 corresponding to a plurality of pairs of connecting pins 61 one by one. A plurality of pairs of test probes 3 are respectively installed on the plurality of insertion interfaces, and both ends of the plurality of pairs of test probes 3 penetrate through the insertion interfaces respectively.

[0092] The test control circuit board 2 is installed at the rear side of the connecting protrusion 13. The rear ends of the plurality of pairs of test probes 3 are respectively electrically connected to the test control circuits provided on the test control circuit board 2.

[0093] In this embodiment, as Figures 1 to 5 shown, in this embodiment, by providing a plurality of insertion interfaces on the connecting protrusion 13 corresponding to a plurality of pairs of connecting pins 61 one by one, it is convenient to install the plurality of pairs of test probes 3 on the plurality of insertion interfaces respectively; in addition, by installing the test control circuit board 2 at the rear side of the connecting protrusion 13, it is convenient to electrically connect the rear ends of the plurality of pairs of test probes 3 to the test control circuits provided on the test control circuit board 2 respectively.

[0094] In this embodiment, as Figures 1 to 5 shown, a plurality of screw connection through holes 131 are provided on the connecting protrusion 13 of this embodiment along its length direction. A plurality of screw through holes one 23 are provided on the test control circuit board 2 corresponding to the plurality of screw connection through holes 131. The test control circuit board 2 is installed at the rear side of the connecting protrusion 13 through a plurality of fixing screws 21. The fixing screws 21 pass through the screw through holes one 23 and are threadedly connected to the screw connection through holes 131. In addition, the test control circuit board 2 in this embodiment can also be installed at the rear side of the connecting protrusion 13 by other means. Further, the test control circuits provided on the test control circuit board are not illustrated in this embodiment, and the specific structure of the test control circuit can be designed according to needs and will not be elaborated here.

[0095] In this embodiment, as Figure 4 and Figure 5 shown, the circuit board substrate 6 in this embodiment includes a left substrate and a right substrate. Ten electronic detonator control modules are respectively arranged on the left substrate and the right substrate. Correspondingly, a total of twenty pairs of test probes 3 are provided in this embodiment; in addition, the number of test probes 3 provided can also be adjusted according to needs.

[0096] In this embodiment, as Figure 1 、 Figure 4 and Figure 6As shown, the test control circuit board 2 in this embodiment has a strip-shaped structure. To facilitate powering on and testing multiple electronic detonator control modules on the left substrate and the right substrate provided in the circuit board substrate 6 respectively, in this embodiment, two conductive plug connectors 20 are connected to the rear end of the test control circuit board 2. The test control circuit provided on the test control circuit board 2 is set to two groups of circuits. The two conductive plug connectors 20 are respectively electrically connected to one of the two groups of test control circuits on the test control circuit board 2, so as to realize that one conductive plug connector 20 and one group of test control circuits are responsible for the testing work of ten electronic detonator control modules; further, one group of test control circuits can also be provided on the test control circuit board 2.

[0097] An embodiment of the present application, as Figure 1 and Figure 6 shown, the test control circuit board 2 is provided with multiple pairs of conductive plug interfaces 22 corresponding to multiple pairs of plug connection interfaces one by one. The multiple pairs of conductive plug interfaces 22 are respectively electrically connected to the test control circuit provided on the test control circuit board 2. The rear ends of multiple pairs of test probes 3 are respectively inserted into a pair of conductive plug interfaces 22 arranged opposite to each other and are electrically connected to the conductive plug interfaces 22.

[0098] In this embodiment, as Figure 1 and Figure 6 shown, the test control circuit board 2 in this embodiment is provided with multiple pairs of conductive plug interfaces 22 corresponding to multiple pairs of plug connection interfaces one by one. By inserting the test probes 3 into the conductive plug interfaces 22, the test probes 3 can be electrically connected to the test control circuit provided on the test control circuit board 2, which is convenient for quickly electrically connecting the test probes 3 to the test control circuit provided on the test control circuit board 2.

[0099] On the other hand of the present application, an aging test system for an electronic detonator control module is provided, as Figure 8 and Figure 9 shown, including:

[0100] A support frame 7;

[0101] A master control circuit board 8, installed on the support frame 7;

[0102] The above-mentioned test device for an electronic detonator control module, the test device for an electronic detonator control module is installed on the master control circuit board 8, and the test control circuit provided on the test control circuit board 2 is electrically connected to the master control circuit provided on the master control circuit board 8;

[0103] A circuit board substrate 6, on which multiple electronic detonator control modules are arranged in an array to form a module to be tested. The module to be tested is placed in the placement limit groove 10, and each pair of connection pins 61 is respectively in abutting contact and electrically connected to a pair of test probes 3 arranged opposite to each other.

[0104] In this embodiment, if Figure 8 and Figure 9 As shown, the aging test system for electronic detonator control modules in this embodiment includes a master control circuit board 8, the above-mentioned test device for electronic detonator control modules and a circuit board substrate 6. A plurality of electronic detonator control modules are arranged on the circuit board substrate 6 to form a module to be tested, so that the module to be tested can be placed in a placement limit groove 10, and the placement limit groove 10 is used to limit the module to be tested in a circumferential direction, so that a plurality of electronic detonator control modules can be placed on the base 1 at one time, and a plurality of electronic detonator control modules in the module to be tested are arranged on the circuit board substrate 6. By aligning and limiting the placement posture of the circuit board substrate 6, the placement posture of the plurality of electronic detonator control modules can be made suitable, which is conducive to quickly placing a plurality of electronic detonator control modules and ensuring the suitability of the placement of the plurality of electronic detonator control modules, and is conducive to improving the efficiency of placing and removing a plurality of electronic detonator control modules, thereby improving the efficiency of aging test on the electronic detonator control modules; further, the test control circuit is electrically connected to the master control circuit board 8, so that the aging test control of the test control circuit can be performed through the master control circuit board 8.

[0105] An embodiment of the present application, such as Figure 8 and Figure 9 As shown, a plurality of conductive sockets 80 are provided on the master control circuit board 8 at intervals, and the plurality of conductive sockets 80 are electrically connected to the master control circuit provided on the master control circuit board 8, respectively. A plurality of conductive plug connectors 20 are provided on the test control circuit board 2, and the plurality of conductive plug connectors 20 are electrically connected to the test control circuit provided on the test control circuit board 2. The conductive plug connectors 20 are plugged into the conductive sockets 80 and are electrically connected to the conductive sockets 80.

[0106] In this embodiment, if Figure 9 As shown, in this embodiment, a plurality of conductive sockets 80 are arranged at intervals on the master control circuit board 8, and a plurality of conductive plug connectors 20 are arranged on the test control circuit board 2, so as to facilitate plugging the conductive plug connectors 20 into the conductive sockets 80, thereby installing the test device on the conductive sockets 80 and electrically connecting the test control circuit to the master control circuit board 8.

[0107] In this embodiment, if Figure 8As shown, the support frame 7 in this embodiment includes multiple vertical support beams 70 and multiple horizontal support cross beams 71. The multiple horizontal support cross beams 71 are connected between two vertical support beams 70 at intervals in the vertical direction, forming multiple layers of aging test placement spaces. Multiple test devices for the electronic detonator control module described above can be arranged and placed in each layer of aging test placement space. Further, the master control circuit board 8 in this embodiment has a square plate-like structure, and the front and rear ends of the master control circuit boards 8 in the middle layer and the upper layer are respectively supported by four vertical support beams 70. In addition, the support frame 7 and the master control circuit board 8 in this embodiment can also be set into other structures.

[0108] In this embodiment, as Figure 9 shown, the master control circuit board 8 in this embodiment is provided with four rows of conductive socket connectors 80. The test control circuit board 2 on a set of test devices in this embodiment is provided with two conductive plug connectors 20. The two conductive plug connectors 20 are respectively inserted into two conductive socket connectors 80 arranged side by side in the left-right direction among the two rows of conductive socket connectors 80 on the left or right side. The two rows of conductive socket connectors 80 on the left side provide electrical connection and transmit aging test signals for a set of test devices. The two rows of conductive socket connectors 80 on the right side supply power to another set of test devices and transmit aging test signals. By providing four power-on connection seats 81, each power-on connection seat 81 is electrically connected to a row of conductive socket connectors 80. During the aging test process, the aging test cable is connected to the power-on connection seat 81, which is convenient for powering on multiple electronic detonator control modules on the test devices connected to the conductive socket connectors 80 and performing aging tests. Further, the master control circuit provided on the master control circuit board 8 in this embodiment is not shown in the figure, and the specific structure of the master control circuit can be designed according to needs and will not be elaborated here.

[0109] In this embodiment, as Figure 9As shown, an anode conductive jack 801 and a cathode conductive jack 802 are provided on the conductive socket 80. In this embodiment, an insertion receiving groove 201 is provided on the conductive plug 20. An anode insertion rod 202 and a cathode insertion rod 203 are arranged in parallel in the insertion receiving groove 201. The anode insertion rod 202 and the cathode insertion rod 203 are respectively electrically connected to the test control circuit provided on the test control circuit board 2. When the conductive plug 20 is inserted into the conductive socket 80, the conductive socket 80 extends into and is received in the insertion receiving groove 201. The anode insertion rod 202 is inserted into the anode conductive jack 801, and the cathode insertion rod 203 is inserted into the cathode conductive jack 802. Further, an anode conductive jack 811 and a cathode conductive jack 812 are provided on the power-on connection socket 81 in this embodiment, which is convenient for inserting the power-on cable into the power-on connection socket 81 to realize the connection between the master control circuit board 8 and the control unit in the aging test system. It should be noted that the control unit in the aging test system can refer to the prior art and will not be described in detail here.

[0110] It should be noted that during the process of aging testing the electronic detonator control module using the aging test system for the electronic detonator control module in this embodiment, the related operations such as test control, screening out defective products, test data acquisition, test data transmission, and recording of defective products can refer to the existing related aging test systems in the art. The test control and related operations of the aging test are not the focus of this application and will not be described in detail here. Further, during the process of aging testing the electronic detonator control module using the aging test system for the electronic detonator control module in this embodiment, the aging conditions such as aging voltage, aging temperature, and aging time can also refer to the prior art in the art and will not be elaborated here.

[0111] An embodiment of the present application, the aging test system for the electronic detonator control module further includes:

[0112] An aging test box, an aging experiment cavity is formed inside the aging test box. There are multiple support frames 7, and the multiple support frames 7 are arranged in the aging experiment cavity. Each support frame 7 is horizontally installed with multiple master control circuit boards 8, and the multiple master control circuit boards 8 are arranged at intervals in the vertical direction. Each master control circuit board 8 is respectively installed with multiple test devices for the electronic detonator control module, and the test control circuit boards 2 on the multiple test devices for the electronic detonator control module are respectively electrically connected to the master control circuit provided on the master control circuit board 8.

[0113] In this embodiment, the aging test chamber of this embodiment is provided with a plurality of support frames 7, and a plurality of master control circuit boards 8 are horizontally installed on each support frame 7. The plurality of master control circuit boards 8 are arranged at intervals in the vertical direction. A plurality of test devices for the electronic detonator control module are installed on each master control circuit board 8, which increases the number of electronic detonator control modules that can be tested by the aging test system at one time, facilitating the implementation of large-scale aging tests. Further, the test control circuit board 2 is electrically connected to the master control circuit provided on the master control circuit board 8, which facilitates the aging test control of multiple test control circuits through one master control circuit board 8, and is conducive to powering on and performing aging tests on multiple electronic detonator control modules respectively.

[0114] In this embodiment, the aging test chamber is not illustrated in this embodiment. The structure of the aging test chamber can refer to the existing aging test chamber or be obtained by improving the existing aging test chamber, and will not be elaborated here. Further, other parts included in the aging test system can also refer to the existing electronic detonator control module aging test system, and will not be described in detail here either.

[0115] In addition, except for the technical solutions disclosed in this embodiment, for the multiple electronic components, energy storage capacitors, ignition elements 62, electronic detonator control modules, other parts of the aging test system, and their working principles in the present utility model, etc., reference can be made to the conventional technical solutions in this technical field. These conventional technical solutions are not the focus of the present utility model, and the present utility model will not be described in detail here.

[0116] In the present utility model, the term "plurality" refers to two or more, unless otherwise clearly defined. Terms such as "installed", "connected", "connected to", "fixed", etc. should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or an integral connection; "connected" can be a direct connection or an indirect connection through an intermediate medium. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0117] In the description of the present utility model, it should be understood that the orientation or positional relationship indicated by terms such as "upper", "lower", "front", "rear", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing this application and simplifying the description, rather than indicating or implying that the device or unit referred to must have a specific direction, be constructed and operated in a specific orientation, and therefore, should not be construed as a limitation to this application.

[0118] In the description of this specification, the descriptions of the terms "one embodiment", "some embodiments", "specific embodiments", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or instance. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0119] The above are only the preferred embodiments of the present application and are not intended to limit the present application. For those skilled in the art, various changes and modifications can be made to the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included within the protection scope of the present application.

Claims

1. A test device for an electronic detonator control module, which is used to test the electronic detonator control module. A plurality of the electronic detonator control modules are arranged on a circuit board substrate. A plurality of circuit board strips are spaced on the circuit board substrate. A plurality of electronic components are provided on each circuit board strip, and a pair of connection pins are connected to one end of each circuit board strip in the length direction. The circuit board strip, the plurality of electronic components provided on the circuit board strip, and a pair of the connection pins together constitute one electronic detonator control module. The circuit board substrate provided with a plurality of the electronic detonator control modules constitutes a module to be tested, and it is characterized in that, It includes: A base, wherein the base is provided with a placement limiting groove for placing the module to be tested, the module to be tested can be placed in the placement limiting groove, and the placement limiting groove can limit the module to be tested placed in the placement limiting groove in a circumferential direction; A plurality of test probes are provided corresponding to the plurality of connection pins one by one, and one end of each pair of the test probes facing the connection pins is used to contact and electrically connect with each pair of the connection pins arranged opposite to each other; A test control circuit board is arranged on one side of the base, and one end of each pair of the test probes away from the connecting pins is electrically connected to a test control circuit arranged on the test control circuit board.

2. The test device for an electronic detonator control module according to claim 1, characterized in that The front opening of the placement limit groove forms a placement opening, the left inner wall of the placement limit groove forms a left limit retaining edge, the right inner wall of the placement limit groove forms a right limit retaining edge, and the rear inner wall of the placement limit groove forms a rear limit retaining edge; Also includes: A front locking device is detachably mounted on the base and located in front of the placement opening. The front locking device protrudes upward in the vertical direction. The rear end of the front locking device forms a front limiting rib. The left limiting rib, the right limiting rib, the rear limiting rib and the front locking device can lock the module to be tested placed therebetween.

3. The test device for an electronic detonator control module according to claim 2, wherein, The distance between the front limiting rib and the rear limiting rib is adjustable.

4. The test device for an electronic detonator control module according to claim 2, characterized in that, The front end of the base is provided with a plurality of installation slots, and the front ends of the installation slots are open; The front locking device comprises: A plurality of stop blocks are provided corresponding to the plurality of mounting slots, the stop blocks are movably mounted in the mounting slots, the upper end of the stop block protrudes upward to form a convex portion, and the rear end of the convex portion forms the front side limiting retaining edge; A plurality of locking members are provided corresponding to the plurality of top stop blocks, and the locking members are used to lock and connect the top stop blocks to the base.

5. The test device for an electronic detonator control module according to claim 4, characterized in that, A top stop limiting protrusion is connected to the upper end of the top stop block, and the top stop limiting protrusion extends backward to form a top stop limiting tongue. The lower side surface of the top stop limiting tongue can stop the upper side surface of the circuit board substrate placed in the placement limiting groove, thereby confining the circuit board substrate placed in the placement limiting groove within the placement limiting groove in the vertical direction.

6. The test device for an electronic detonator control module according to any one of claims 1 to 5, characterized in that, The outer circumference of each circuit board branch is respectively covered with an insulating sealant, and the other end of each circuit board branch in the length direction is connected to an ignition piece, and the ignition piece and a pair of connecting pins are respectively exposed on the outside of the insulating sealant. The circuit board branch, the plurality of electronic components arranged on the circuit board branch, the ignition piece and a pair of connecting pins together constitute an electronic detonator control module; The base is also provided with an avoidance groove, which is communicated with the placement limiting groove. When the module to be tested is placed in the placement limiting groove, the insulating sealing body extends into the avoidance groove toward the side wall of the avoidance groove.

7. The test device for an electronic detonator control module according to any one of claims 1 to 5, characterized in that, The base is provided with connection protrusions, which are located at the rear side of the placement limit groove. Multiple pairs of insertion interfaces are provided on the connection protrusions corresponding to multiple pairs of the connection pins one by one. Multiple pairs of the test probes are respectively installed on the multiple pairs of insertion interfaces, and both ends of the multiple pairs of test probes respectively penetrate out of the insertion interfaces; The test control circuit board is installed at the rear side of the connection protrusion, and the rear ends of the multiple pairs of test probes are respectively electrically connected to the test control circuit provided on the test control circuit board.

8. The test device for an electronic detonator control module according to claim 7, characterized in that, The test control circuit board is provided with multiple pairs of conductive insertion interfaces corresponding to the multiple pairs of insertion interfaces one by one. The multiple pairs of conductive insertion interfaces are respectively electrically connected to the test control circuit provided on the test control circuit board. The rear ends of the multiple pairs of test probes are respectively inserted into a pair of the conductive insertion interfaces arranged oppositely and are electrically connected to the conductive insertion interfaces.

9. An aging test system for an electronic detonator control module, characterized in that, Comprising: A support frame; A main control circuit board, installed on the support frame; The test device for the electronic detonator control module according to any one of the above claims 1 to 8, the test device for the electronic detonator control module is installed on the main control circuit board, and the test control circuit provided on the test control circuit board is electrically connected to the main control circuit provided on the main control circuit board; A circuit board substrate, on which a plurality of electronic detonator control modules are arranged to form a module to be tested. The module to be tested is placed in the placement limit groove, and each pair of the connection pins respectively makes abutting contact and is electrically connected to a pair of the test probes arranged oppositely.

10. The aging test system for an electronic detonator control module according to claim 9, wherein The main control circuit board is provided with a plurality of conductive socket connectors at intervals. The plurality of conductive socket connectors are respectively electrically connected to the main control circuit provided on the main control circuit board. The test control circuit board is provided with a plurality of conductive plug connectors. The plurality of conductive plug connectors are electrically connected to the test control circuit provided on the test control circuit board. The conductive plug connectors are inserted into the conductive socket connectors and are conductively connected to the conductive socket connectors.

11. The aging test system for an electronic detonator control module according to claim 9, wherein, Further comprising: An aging test box body, an aging experiment cavity is formed inside the aging test box body. There are a plurality of the support frames, and the plurality of support frames are arranged in the aging experiment cavity. Each support frame is horizontally installed with a plurality of the main control circuit boards, and the plurality of main control circuit boards are arranged at intervals in the vertical direction. Each main control circuit board is respectively installed with a plurality of the test devices for the electronic detonator control module, and the test control circuit boards on the plurality of the test devices for the electronic detonator control module are respectively electrically connected to the main control circuit provided on the main control circuit board.

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