Chip test fixture

Abstract

The utility model relates to the field of chip production test, and discloses a chip test fixture, which comprises a test bench, a chip test circuit board and a chip limiting mechanism, the chip test circuit board is fixed in the test bench, the upper end face of the test bench is provided with a limiting concave table structure, and the chip limiting mechanism is arranged on the limiting concave table structure. The bottom of the limiting concave platform structure is provided with a test butt joint module which is in butt joint with the chip test circuit board, and the chip limiting mechanism comprises a chip limiting frame which is arranged in the limiting concave platform structure and a chip upper limiting part which is arranged on the upper surface of the test bench and is used for limiting the upper surface of a chip. The limiting concave table structure and the chip limiting frame are correspondingly provided with a first magnetic piece and a second magnetic piece which attract each other, taking and placing receding grooves are formed in the two corresponding sides of the limiting concave table structure, and taking and placing receding concave tables are arranged at the positions, corresponding to the taking and placing receding grooves, of the lower end of the outer side wall of the chip limiting frame. The chip limiting frame is simple, convenient and fast to replace, and the detection efficiency of small-batch products or samples is effectively improved.

Description

Technical Field

[0001] The utility model relates to the field of chip production testing, in particular to a chip testing fixture. Background Art

[0002] Chip test fixtures are widely used in semiconductor manufacturing, quality control, electronics industry, information technology, automotive industry and other fields. In the field of semiconductor manufacturing, chip test fixtures are used for wafer-level testing and post-packaging testing to analyze chip performance and ensure chip quality. Existing test fixtures are generally targeted at a certain type of chip. In chip generation and manufacturing, a fixture is specially made to perform performance analysis or quality inspection on a certain type of chip. The test fixture includes a test fixture stand and a chip test circuit board and a chip limit mechanism that are fixed and locked on the test fixture stand. With the improvement of technology, when the chip test circuit board can test multiple types of chips, the chip limit frame used to limit the chip on the chip limit mechanism is generally locked by multiple very small screws. When performing performance analysis or quality inspection on small batches and multiple types of chips, special tools are required to remove the small screws to replace the chip limit frame. The operation is cumbersome and inconvenient, and the small screws are easy to lose, and the replacement efficiency is low. Utility Model Content

[0003] The utility model provides a chip testing fixture, which solves the problems of the existing chip testing fixture that the chip limit frame replacement operation is cumbersome and inconvenient, small screws are easily lost, and the efficiency is low when performing performance analysis or quality inspection on small batches and multiple types of chips.

[0004] The technical solution adopted by the utility model to solve its technical problems is: a chip test fixture, including a test bench, a chip test circuit board and a chip limit mechanism, the chip test circuit board is fixed inside the test bench, a limit recess structure is set on the upper end surface of the test bench, a test docking module docking with the chip test circuit board is set at the bottom of the limit recess structure, the chip limit mechanism includes a chip limit frame set inside the limit recess structure and a chip upper limit component set on the upper surface of the test bench to limit the upper surface of the chip, the limit recess structure and the chip limit frame are correspondingly provided with a first magnetic part and a second magnetic part adsorbed to each other, the corresponding two sides of the limit recess structure are provided with a pick-and-place clearance groove, and the lower end of the outer wall of the chip limit frame is provided with a pick-and-place clearance recess at a position corresponding to the pick-and-place clearance groove. By replacing the chip limit frame to limit the test of chips of different specifications, the chip limit frame is magnetically adsorbed and provided with a pick-and-place clearance structure, and the pick-and-place operation is simple, convenient and fast, which effectively improves the detection efficiency of small batch products or samples.

[0005] Furthermore, the positioning recess structure includes an upper positioning recess and a lower positioning recess, the upper positioning recess is located at the periphery of the upper end of the lower positioning recess, the chip positioning frame includes an upper positioning frame limited by the upper positioning recess and a lower positioning frame located in the lower positioning recess to limit the chip, and the first magnetic member and the second magnetic member are fixedly arranged on the upper positioning recess and the upper positioning frame respectively. The two-step recess is used to limit the chip positioning frame and indirectly limit the chip, and the influence of the magnetic attraction structure on the chip test is avoided while limiting the adsorption.

[0006] Furthermore, an external clearance platform is arranged at the periphery of the upper end of the upper limit recess, the access groove is arranged outside the upper limit recess, and the access groove is located within the bottom range of the external clearance platform. The external clearance platform further facilitates the replacement and access of the chip limit frame.

[0007] Furthermore, the upper end of the side wall of the upper limit recess is provided with an outwardly expanded guiding slope, which prevents the chip limit frame from being difficult to align with the upper limit recess in the case of high-precision limiting, effectively reducing the installation difficulty of the chip limit frame and improving replacement efficiency.

[0008] Furthermore, high-precision positioning columns and high-precision positioning holes are provided at corresponding positions on the bottom surface of the upper limit concave platform and the lower end of the upper limit frame, thereby improving the positioning accuracy of the chip limit frame and ensuring the consistency and stability of the test.

[0009] Furthermore, the upper limit recess and the upper limit frame are provided with fool-proof structures at corresponding positions to avoid incorrect installation affecting the test and efficiency.

[0010] Furthermore, a plurality of upper avoidance grooves are arranged at intervals on the side wall of the upper limit recess, so as to avoid the outer wall of the high-precision lower chip limit frame and the inner wall of the upper limit recess being too close together to cause the airtightness to be too good and difficult to install and take out.

[0011] Furthermore, the chip limiting frame is provided with a limiting cavity for limiting the chip, the upper end of the limiting cavity is provided with an outwardly expanding guide cavity, the inner wall of the limiting cavity is provided with a plurality of inner avoidance grooves, and the outer wall of the lower limiting frame is provided with a plurality of outer avoidance grooves. This prevents the outer wall of the lower limiting frame from getting stuck with the inner wall of the lower limiting concave platform, and prevents the rectangular chip from getting stuck or damaged by contact with the limiting cavity inside the lower limiting frame, so as to facilitate the use of a suction head to pick up and place the chip in the chip limiting frame.

[0012] Further: The upper limit component on the chip is a flip limit structure fixed by a buckle structure. The upper limit component on the chip includes an accommodation cavity, a mounting plate, and a pressing limit module. The accommodation cavity corresponds to the limit concave structure when the upper limit component on the chip limits the chip located within the limit concave structure. The mounting plate is installed in the accommodation cavity through a rotating shaft. The pressing limit module is elastically installed on the mounting plate and can move in the vertical direction relative to the mounting plate. It elastically presses the upper surface of the chip to accommodate chips of different thicknesses. The pressing limit module has a rotation angle following the mounting plate to avoid excessive pressure on the chip by the corner part that is pressed first during the gradual downward pressing process. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 is the front view schematic diagram of the present invention;

[0014] Figure 2 is the schematic diagram of the structure above the front side after removing the chip limit frame of the present invention;

[0015] Figure 3 is the schematic diagram of the structure at the lower rear of the chip limit frame;

[0016] Figure 4 is the schematic diagram of the structure at the upper rear of the chip limit frame.

[0017] The labels in the figure are: test bench 100, test docking module 110, limit concave structure 120, pick-and-place relief groove 121, external relief platform 122, upper limit concave 123, lower limit concave 124, high-precision positioning post 125, upper avoidance groove 126, guiding inclined surface 127, protruding part 128, first magnetic part 130, chip test circuit board 200, chip limit frame 310, pick-and-place relief concave 311, upper limit frame body 312, lower limit frame body 313, high-precision positioning hole 314, avoidance concave 315, limit cavity 316, guiding cavity 317, inner avoidance groove 318, outer avoidance groove 319, upper limit component 320 on the chip, pressing limit module 321, second magnetic part 330. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0018] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0019] As Figure 1A chip testing fixture as shown includes a test bench 100, a chip testing circuit board 200, and a chip limiting mechanism. The chip testing circuit board 200 is fixed inside the test bench 100. A limiting concave structure 120 is provided on the upper end surface of the test bench 100. A test docking module 110 for docking with the chip testing circuit board 200 is provided at the bottom of the limiting concave structure 120. The chip limiting mechanism includes a chip limiting frame 310 provided inside the limiting concave structure 120 and a chip upper limiting component 320 provided on the upper surface of the test bench 100 for limiting the upper surface of the chip. First magnetic components 130 and second magnetic components 330 that attract each other are correspondingly provided on the limiting concave structure 120 and the chip limiting frame 310. Take-and-place relief grooves 121 are provided on two corresponding sides of the limiting concave structure 120. Take-and-place relief concave platforms 311 are provided at positions corresponding to the take-and-place relief grooves 121 on the lower end of the outer side wall of the chip limiting frame 310.

[0020] In this specific embodiment, the test docking module 110 is a conductive rubber sheet. During testing, first place the chip limiting frame 310 matching the test chip into the limiting concave structure 120. After placement, the first magnetic components 130 in the limiting concave structure 120 and the second magnetic components 330 on the chip limiting frame 310 are correspondingly adsorbed. While the chip limiting frame 310 is accurately limited by the limiting concave structure 120, it is magnetically adsorbed and positioned inside the limiting concave structure 120. Then place the test chip into the chip limiting frame 310, operate the chip upper limiting component 320 to press the chip tightly, and then testing can start. A plurality of buttons are provided on the upper surface of the test bench 100 for controlling the chip testing fixture. After testing, open the chip upper limiting component 320 to take out the test chip. When it is necessary to test other chips of different specifications and models, pinch or clamp the take-and-place relief concave platforms 311 at the lower end of the outer side wall of the chip limiting frame 310 from the take-and-place relief grooves 121 with fingers or tools to take out the chip limiting frame 310. The operation is convenient, simple, and fast. Then replace the chip limiting frame 310 with the one corresponding to the chip to be tested.

[0021] By replacing the chip limiting frame 310 to limit and test chips of different specifications, the chip limiting frame 310 is magnetically adsorbed and provided with a take-and-place relief structure. The take-and-place operation is simple, convenient, and fast, effectively improving the detection efficiency of small-batch products or samples.

[0022] On the basis of the above, such as Figures 1 to 3As shown, the limiting concave platform structure 120 includes an upper limiting concave platform 123 and a lower limiting concave platform 124. The upper limiting concave platform 123 is located at the outer periphery of the upper end of the lower limiting concave platform 124. The chip limiting frame 310 includes an upper limiting frame body 312 limited by the upper limiting concave platform 123 and a lower limiting frame body 313 located in the lower limiting concave platform 124 for limiting the chip. The first magnetic member 130 and the second magnetic member 330 are respectively fixedly arranged on the upper limiting concave platform 123 and the upper limiting frame body 312.

[0023] In this specific embodiment, the main structures of the upper limiting concave platform 123, the lower limiting concave platform 124, the upper limiting frame body 312, and the lower limiting frame body 313 are all square. The first magnetic member 130 and the second magnetic member 330 each have four and are respectively fixedly arranged at the four corners of the upper limiting concave platform 123 and the upper limiting frame body 312. The first magnetic member 130 and the second magnetic member 330 are both neodymium iron boron magnets. In specific implementation, the materials and fixed positions of the first magnetic member 130 and the second magnetic member 330 can be changed according to actual situations, with the criterion of being able to achieve adsorption positioning and avoid affecting the test. The two-stage stepped concave platforms are respectively used for limiting the chip limiting frame 310 and indirectly limiting the chip, avoiding the influence of the magnetic adsorption structure on the chip test while limiting and adsorbing.

[0024] On the basis of the above, as Figure 1 and Figure 2 shown, an external relief platform 122 is provided at the outer periphery of the upper end of the upper limiting concave platform 123. The pick-and-place relief groove 121 is arranged outside the upper limiting concave platform 123, and the pick-and-place relief groove 121 is within the range of the bottom of the external relief platform 122. In this specific embodiment, the upper limiting concave platform 123 is located at the central position of the bottom of the external relief platform 122. The external relief platform 122 extends a relatively long distance outward on the corresponding sides of the two pick-and-place relief grooves 121. The upper surface of the upper limiting frame body 312 is lower than the upper end surface of the external relief platform 122, that is, the chip limiting frame 310 is located inside the limiting concave platform structure 120. While limiting the chip limiting frame 310, it is also convenient to operate on the pick-and-place relief groove 121. The external relief platform 122 further facilitates the replacement and pick-and-place of the chip limiting frame 310.

[0025] On the basis of the above, as Figure 1 and Figure 2 shown, a guiding inclined surface 127 that expands outward is provided at the upper end of the side wall of the upper limiting concave platform 123. In specific implementation, due to the high precision requirements for chip testing, the chip limiting frame 310 and the upper limiting concave platform 123 need to be installed with high precision. The provision of the guiding inclined surface 127 avoids the situation where the chip limiting frame 310 is not easily aligned with the upper limiting concave platform 123 under the condition of high-precision limiting, effectively reducing the installation difficulty of the chip limiting frame 310 and improving the replacement efficiency.

[0026] On the basis described above, as Figures 1 to 3 shown, high-precision positioning posts 125 and high-precision positioning holes 314 are provided at corresponding positions on the bottom surface of the upper limit concave platform 123 and the lower end of the upper limit frame body 312. In this specific embodiment, there are two groups of high-precision positioning posts 125 and high-precision positioning holes 314, which are located on two sides adjacent to the pick-and-place relief groove 121. The upper edge of the high-precision positioning post 125 is set as a smooth arc surface, and the entrance end of the high-precision positioning hole 314 is provided with an outwardly expanding rounded corner for easy relative insertion. During specific implementation, the number and positions of the high-precision positioning posts 125 and high-precision positioning holes 314 can be adjusted according to actual requirements. The positioning accuracy of the chip limit frame 310 is improved to ensure the consistency and stability of testing.

[0027] On the basis described above, as Figures 1 to 3 shown, anti-fooling structures are provided at corresponding positions on the upper limit concave platform 123 and the upper limit frame body 312. In this specific embodiment, the anti-fooling structure is a protruding portion 128 provided at one corner of the upper limit concave platform 123 and an avoidance concave platform 315 provided at the corresponding corner of the upper limit frame body 312. To avoid incorrect installation from affecting testing and efficiency.

[0028] On the basis described above, as Figures 1 to 4 shown, a plurality of upper avoidance grooves 126 are provided at intervals on the side wall of the upper limit concave platform 123. In this specific embodiment, there are two upper avoidance grooves 126, which are correspondingly provided on the side walls between the pick-and-place relief grooves 121, to prevent the outer wall of the chip limit frame 310 from closely fitting with the inner wall of the upper limit concave platform 123 under high-precision cooperation, resulting in too good airtightness and being difficult to install, pick and place, or get stuck.

[0029] On the basis described above, as Figures 1 to 4 shown, a limit cavity 316 for limiting the chip is provided inside the chip limit frame 310. An outwardly expanding guiding cavity 317 is provided at the upper end of the limit cavity 316. A plurality of inner avoidance grooves 318 are provided on the inner wall of the limit cavity 316, and a plurality of outer avoidance grooves 319 are provided on the outer wall of the lower limit frame body 313. In this specific embodiment, the outer themes of the upper limit frame body 312 and the lower limit frame body 313 are both rectangular, the inside of the limit cavity 316 is also rectangular, semi-circular inner avoidance groove 318 structures are provided on the four sides of the limit cavity 316 and smooth relief structural surfaces are provided at all four corners, and two semi-circular outer avoidance groove 319 structures are provided on each of the four sides of the outer wall of the lower limit frame body 313, to prevent the outer wall of the lower limit frame body 313 from getting stuck with the inner wall of the lower limit concave platform 124, prevent the rectangular chip from getting stuck or damaged when contacting the inner limit cavity 316 of the lower limit frame body 313, and facilitate picking and placing the chip inside the chip limit frame 310 with a suction head.

[0030] On the basis described above, as Figure 1 and Figure 2 shown, the upper limit component 320 of the chip is a flip limit structure fixed by a buckle structure. The upper limit component 320 of the chip includes a placement cavity, a mounting plate, and a pressing limit module 321. The placement cavity corresponds to the limit concave platform structure 120 when the upper limit component 320 of the chip limits the chip within the limit concave platform structure 120. The mounting plate is installed in the placement cavity through a rotating shaft. The pressing limit module 321 is elastically installed on the mounting plate and can move vertically relative to the mounting plate. In a specific implementation, one end of the main body of the upper limit component 320 of the chip is rotatably fixed on one side of the limit concave platform structure 120, and the other end is provided with an elastically rotatable and openable hook. A horizontal fixing rod that cooperates with the hook for clamping and locking is arranged on the test bench 100. During the process of the pressing limit module 321 on the upper limit component 320 of the chip limiting the upper surface of the chip, the end of the hook of the upper limit component 320 of the chip is first elastically rotated and expanded under pressure. When the end moves down to below the horizontal fixing rod, it elastically resets and hooks the horizontal fixing rod to be limited. At this time, the pressing limit module 321 on the upper limit component 320 of the chip elastically limits the upper surface of the chip. When it needs to be opened, pressing the end of the hook away from the horizontal fixing rod can make the hook rotate away from the horizontal fixing rod, and then rotating the upper limit component 320 of the chip upward to open it. A set of reset spring structures can also be added to the rotatably fixed end of the upper limit component 320 of the chip. After the limit between the hook and the horizontal fixing rod is opened, it automatically flips and resets under the elastic force of the reset spring. A spring is arranged between the pressing limit module 321 and the mounting plate, and the mounting plate limits the rectangular mounting part through a rectangular cavity to limit that the limit module 321 can only move vertically relative to the mounting plate, elastically pressing the upper surface of the chip to cope with chips of different thicknesses. The pressing limit module 321 has a rotation angle following the mounting plate, avoiding excessive pressure on the chip by the first-pressed corner during the gradual downward pressing process.

[0031] In the specific embodiments described above, the purpose, technical solutions, and beneficial effects of the present invention have been further described in detail. It should be understood that the above are only specific embodiments of the present invention and are not used to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. A chip testing fixture, comprising a test bench (100), a chip testing circuit board (200) and a chip limiting mechanism, characterized in that: The chip test circuit board (200) is fixed inside the test bench (100). A limiting concave structure (120) is provided on the upper end surface of the test bench (100). A test docking module (110) for docking with the chip test circuit board (200) is provided at the bottom of the limiting concave structure (120). The chip limiting mechanism includes a chip limiting frame (310) provided inside the limiting concave structure (120) and a chip upper limiting component (320) provided on the upper surface of the test bench (100) for limiting the upper surface of the chip. A first magnetic member (130) and a second magnetic member (330) which attract each other are correspondingly provided on the limiting concave structure (120) and the chip limiting frame (310). Take-and-place relief grooves (121) are provided on two corresponding sides of the limiting concave structure (120). Take-and-place relief concave platforms (311) are provided at positions corresponding to the take-and-place relief grooves (121) on the lower end of the outer side wall of the chip limiting frame (310).

2. The chip testing fixture according to claim 1, characterized in that: The limiting concave structure (120) includes an upper limiting concave (123) and a lower limiting concave (124). The upper limiting concave (123) is located at the upper periphery of the lower limiting concave (124). The chip limiting frame (310) includes an upper limiting frame body (312) limited by the upper limiting concave (123) and a lower limiting frame body (313) located in the lower limiting concave (124) for limiting the chip. The first magnetic member (130) and the second magnetic member (330) are respectively and fixedly provided on the upper limiting concave (123) and the upper limiting frame body (312).

3. The chip testing fixture according to claim 2, characterized in that: An external relief platform (122) is provided at the upper periphery of the upper limiting concave (123). The take-and-place relief grooves (121) are provided outside the upper limiting concave (123), and the take-and-place relief grooves (121) are located within the range of the bottom of the external relief platform (122).

4. The chip testing fixture according to claim 2, wherein: An outwardly expanding guiding inclined surface (127) is provided at the upper end of the side wall of the upper limiting concave (123).

5. A chip test fixture according to claim 2, characterized in that: High-precision positioning posts (125) and high-precision positioning holes (314) are provided at corresponding positions on the bottom surface of the upper limiting concave (123) and the lower end of the upper limiting frame body (312).

6. The chip testing fixture according to claim 2, wherein: Anti-fooling structures are provided at corresponding positions on the upper limiting concave (123) and the upper limiting frame body (312).

7. The chip test fixture according to claim 2, wherein: A plurality of upper relief grooves (126) are provided at intervals on the side wall of the upper limiting concave (123).

8. The chip testing fixture according to claim 2, wherein: A limiting cavity (316) for limiting the chip is provided inside the chip limiting frame (310). An outwardly expanding guiding cavity (317) is provided at the upper end of the limiting cavity (316). A plurality of inner relief grooves (318) are provided on the inner wall of the limiting cavity (316). A plurality of outer relief grooves (319) are provided on the outer wall of the lower limiting frame body (313).

9. The chip testing fixture according to claim 1, wherein: The upper limit component (320) on the chip is a flip limit structure fixed by a buckle structure. The upper limit component (320) on the chip includes a placement cavity, a mounting plate, and a pressing limit module (321). The placement cavity corresponds to the limit concave structure (120) when the upper limit component (320) on the chip limits the chip located within the limit concave structure (120). The mounting plate is installed in the placement cavity through a rotating shaft. The pressing limit module (321) is elastically installed on the mounting plate and can move in the vertical direction relative to the mounting plate.

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