Chip testing device

Abstract

The utility model designs a chip testing device which comprises a testing plate, a fixing seat and a pressing assembly, a first elastic piece on the testing plate is connected with a bearing plate, the bearing plate is provided with a limiting groove and a plurality of through holes, the size of the limiting groove is matched with the size of a chip, accurate positioning of the chip in the testing process is ensured, and the testing efficiency is improved. The pressing assembly comprises a threaded rod and a pressing block piece, the threaded rod is in threaded connection with the threaded hole, and the end, close to the bearing plate, of the threaded rod is connected with the pressing block piece. During testing, the threaded rod is driven to rotate forwards, the threaded rod can drive the pressing block piece to move downwards, the pressing block piece can press the bearing plate and the chip, and the chip is clamped in the bearing plate. All test points on the chip pass through the through holes and are electrically connected with the test board, and compared with the prior art, the detection efficiency is obviously improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, and particularly relates to a chip testing device. Background Art

[0002] With the rapid development of semiconductor technology, as the core component of electronic devices, the complexity, integration level and performance requirements of chips are increasing day by day. In order to ensure the quality of chips in the design and manufacturing processes, strict testing procedures have become crucial.

[0003] In the prior art, generally, the four corners of a chip are clamped by limiting members on a probe table, and then the probes are driven to move so that the probes are in one-to-one contact with the test points on the chip. The testing time is long and the efficiency is low. Therefore, it is necessary to improve the prior art. Summary of the Utility Model

[0004] The purpose of the utility model is to provide a chip testing device to solve the technical problem of low chip testing efficiency in the prior art.

[0005] To achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A chip testing device includes a test board, a fixed seat and a pressing component. A first elastic member on the test board is connected to a supporting board. The supporting board is provided with a limiting groove and a plurality of through holes. The size of the limiting groove matches the size of the chip, and the plurality of through holes correspond to the test points on the chip one by one. A threaded hole is formed in the fixed seat. The pressing component includes a threaded rod and a pressing block. The threaded rod is in threaded connection with the threaded hole, and one end of the threaded rod close to the supporting board is connected to the pressing block. When the threaded rod is driven, the pressing block presses the supporting board and the chip, and the test points on the chip are electrically connected to the test board through the through holes.

[0007] Preferably, the chip testing device includes a base, and the base is provided with a receiving groove. The test board is limited in the receiving groove, and the size of the test board is the same as that of the receiving groove.

[0008] Preferably, the pressing block includes a first pressing block and a second pressing block. The first pressing block is connected to the side of the second pressing block close to the supporting board. The distance between the chip and the second pressing block is less than the distance between the supporting board and the first pressing block. When the threaded rod descends to a first height, the second pressing block presses the chip. When it continues to descend to a second height, the first pressing block presses the supporting board.

[0009] Preferably, the chip testing device further includes a second elastic member and a third pressing block. The third pressing block is connected to the threaded rod, and two ends of the second elastic member are respectively connected to the third pressing block and the second pressing block.

[0010] Preferably, the chip testing device further includes a first guiding post and a second guiding post. The first guiding post is connected to the testing board and penetrates through the supporting board. The second guiding post is connected to the second pressing block, and a guiding hole is provided at a position of the base corresponding to the second guiding post.

[0011] Preferably, the chip testing device further includes a handle, and the handle is connected to an end of the threaded rod away from the supporting board.

[0012] Preferably, the chip testing device further includes an adjusting block and a locking member. A first limiting hole is provided on the handle, and a plurality of second limiting holes are spaced in the height direction of the adjusting block. The locking member penetrates through the first limiting hole and any one of the second limiting holes.

[0013] Preferably, the chip testing device further includes a third guiding post and a hook. The third guiding post is connected to the base and rotatably connected to the hook of the fixing base through the fixing base. The hook is used for clamping the base.

[0014] Preferably, the chip testing device further includes a fan, an air outlet block, and a blowing member. The fixing base is provided with a first opening, a second opening, and a plurality of heat dissipation holes. The fan faces the first opening, the first opening and the second opening are oppositely arranged, the blowing member faces the second opening, the blowing member is connected to the air outlet block, and the airflow blown out by the blowing member reaches the testing board through the air outlet holes on the air outlet block.

[0015] Preferably, the chip testing device further includes an identifying member, a blocking block, and a processing mechanism. The identifying member is arranged on the fixing base and is used for identifying the abutting condition between the chip and the testing board. The blocking block is arranged in the gap between the handle and the fixing base and is used for blocking the adjusting block. The processing mechanism is electrically connected to the testing board.

[0016] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0017] The utility model designs a chip testing device, which includes a test board, a fixing base and a pressing component. A first elastic member on the test board is connected to a supporting board. The supporting board is provided with a limiting groove and a number of through holes. The size of the limiting groove matches the size of the chip, ensuring the accurate positioning of the chip during the testing process. The number of through holes corresponds to the test points of the chip one by one. A threaded hole is formed on the fixing base. The pressing component includes a threaded rod and a pressing block. The threaded rod is threadedly connected to the threaded hole, and one end of the threaded rod close to the supporting board is connected to the pressing block. During testing, by driving the threaded rod to rotate forward, the threaded rod can drive the pressing block to move downward, and the pressing block will press the supporting board and the chip. All the test points on the chip will pass through the through holes and be electrically connected to the test board. Compared with the prior art, the detection efficiency has been significantly improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 FIG. is a schematic structural diagram of the chip testing device of the utility model;

[0019] Figure 2 FIG. is another schematic structural diagram of the chip testing device of the utility model;

[0020] Figure 3 FIG. is a schematic structural diagram of the pressing block and the test board of the utility model.

[0021] ILLUSTRATION DESCRIPTION:

[0022] 1. Fixing base; 2. Handle; 3. Threaded rod; 4. Adjusting block; 5. Locking member; 6. Stopper; 7. Identification member; 8. Hook; 9. First pressing block; 10. Second pressing block; 11. Third pressing block; 12. Second guiding column; 13. Guiding hole; 14. Base; 15. First guiding column; 16. Test board; 17. Heat dissipation hole; 18. Fan; 19. Air outlet block; 20. Third guiding column. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0023] In order to make the utility model purpose, features and advantages more obvious and understandable, the technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the embodiments described below are only a part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the utility model.

[0024] The technical solutions of the utility model will be further described below with reference to the drawings and through specific embodiments.

[0025] Please refer to Figure 1 and Figure 3As shown, the utility model designs a chip testing device, which includes a test board 16, a fixing seat 1 and a pressing assembly. The first elastic member on the test board 16 is connected to a supporting plate. The supporting plate is provided with a limiting groove and a plurality of through holes. The size of the limiting groove matches the size of the chip. The plurality of through holes correspond to the test points of the chip one by one. A threaded hole is provided on the fixing seat 1. The pressing assembly includes a threaded rod 3 and a pressing block. The threaded rod 3 is threadedly connected to the threaded hole. One end of the threaded rod 3 close to the supporting plate is connected to the pressing block. The threaded rod 3 is driven, and the pressing block presses the supporting plate and the chip. The test points on the chip pass through the through holes and are electrically connected to the test board 16.

[0026] It should be noted that the test board 16 of the utility model is provided with probes, the probes and test points correspond one to one, the size of the limit groove matches the size of the chip, ensuring the precise positioning of the chip during the test. During the test, the threaded rod 3 is driven to rotate in the forward direction, and the threaded rod 3 can drive the pressure block to move downward. The pressure block will press the supporting plate and the chip, and all the test points on the chip will pass through the through holes and be electrically connected to the test board 16. Compared with the existing technology, the detection efficiency has been significantly improved.

[0027] Specifically, the chip testing device includes a base 14, which is provided with a receiving groove, and the test board 16 is limited in the receiving groove, and the size of the test board 16 is consistent with the size of the receiving groove, which effectively prevents the test error caused by the movement or shaking of the test board 16 during the test process.

[0028] Specifically, the pressing block assembly includes a first pressing block 9 and a second pressing block 10. The second pressing block 10 is connected to the first pressing block 9 on one side close to the supporting plate. The distance between the chip and the second pressing block 10 is smaller than the distance between the supporting plate and the first pressing block 9. When the threaded rod 3 descends to the first height, the second pressing block 10 presses the chip. When it continues to descend to the second height, the first pressing block 9 presses the supporting plate.

[0029] When the threaded rod 3 descends to the first height, the second pressure block 10 first contacts the chip and applies pressure to ensure that the chip does not fall off the supporting plate. As the threaded rod 3 continues to descend, the first pressure block 9 applies pressure to the supporting plate. At this time, the first elastic member is in a compressed state, and the supporting plate moves in a direction close to the test board 16. The test board 16 gradually approaches the test point on the chip. When it moves to the test point abutting the test board 16, the test board 16 can detect the test point on the chip.

[0030] Specifically, the chip testing device further includes a second elastic member and a third pressing block 11. The third pressing block 11 is connected to the threaded rod 3, and the two ends of the second elastic member are respectively connected to the third pressing block 11 and the second pressing block 10. The introduction of the second elastic member provides a buffering effect during the pressing process. When the first pressing block 9 presses the supporting plate and the second pressing block 10 presses the chip, the second elastic member can absorb part of the impact force and transmit the pressure to the supporting plate and the chip in a more uniform and gentle manner. This helps to protect the chip from sudden impact damage and ensure the stability of the test.

[0031] Specifically, the chip testing device further includes a first guiding post 15 and a second guiding post 12. The first guiding post 15 is connected to the test board 16 and penetrates through the supporting plate. The second guiding post 12 is connected to the second pressing block 10, and a guiding hole 13 is provided at the position of the base 14 corresponding to the second guiding post 12. Due to the penetration of the first guiding post 15, the supporting plate can always maintain a facing relationship with the test board 16 during the movement process. This facing property ensures that the supporting plate can move along a predetermined trajectory during movement, avoiding deviation or inclination, and helping to achieve the electrical connection between the chip and the test board 16. The second guiding post 12 and the guiding hole 13 ensure that the second pressing block 10 can accurately press the chip and ensure that the first pressing block 9 can accurately press the supporting plate.

[0032] Specifically, the chip testing device further includes a handle 2, and the handle 2 is connected to the end of the threaded rod 3 away from the supporting plate. The handle 2 provides an additional holding point, enabling the staff to conveniently drive the threaded rod 3 to lift and lower along the threaded hole by rotating the handle 2.

[0033] Specifically, the chip testing device further includes an adjusting block 4 and a locking member 5. The handle 2 is provided with a first limiting hole, and a plurality of second limiting holes are spaced in the height direction of the adjusting block 4. The locking member 5 penetrates through the first limiting hole and any one of the second limiting holes.

[0034] Specifically, the chip testing device further includes a stop block 6. The stop block 6 is arranged in the gap between the handle 2 and the fixed seat 1 and is used to block the adjusting block 4.

[0035] It should be noted that there are two second limiting holes provided on the adjusting block 4 of the present utility model. When the locking member 5 passes through the first limiting hole and the upper second limiting hole, a part of the adjusting block 4 is located in the gap between the handle 2 and the fixed seat 1. When the threaded rod 3 is rotated forward, the distance between the bottom end of the adjusting block 4 and the fixed seat 1 gradually decreases. When it decreases to a distance less than the height of the stop block 6 and abuts against the stop block 6, the stop block 6 can lock the handle 2. When the locking member 5 passes through the first limiting hole and the lower second limiting hole, the distance between the bottom end of the adjusting block 4 and the fixed seat 1 is greater than the distance between the bottom end of the handle 2 and the fixed seat 1. When the threaded rod 3 is rotated forward, the distance between the bottom end of the handle 2 and the fixed seat 1 gradually decreases. When it decreases to a distance less than the height of the stop block 6 and abuts against the stop block 6, the stop block 6 can lock the handle 2. Of course, the handle 2 can also be locked by other means, and the present utility model does not limit this.

[0036] Specifically, the chip testing device further includes a third guiding post 20 and a hook 8. The third guiding post 20 is connected to the base 14 and, through the fixed seat 1, the hook 8 rotatably connected to the fixed seat 1 is used for clamping the base 14. Before testing, the staff passes the third guiding post 20 through the fixed seat 1, and then rotates the hook 8 to make the hook 8 clamp the base 14, so that the base 14 and the fixed seat 1 can be locked together. At this time, when the handle 2 is rotated, the threaded rod 3 can move up and down. The hook 8 can quickly fix the base 14 on the fixed seat 1 and easily detach the fixed seat 1 from the base 14, which is very convenient.

[0037] Specifically, the chip testing device further includes a fan 18, an air outlet block 19 and a blowing member. The fixed seat 1 is provided with a first opening, a second opening and a plurality of heat dissipation holes 17. The fan 18 faces the first opening, the first opening and the second opening are arranged opposite to each other, the blowing member faces the second opening, the blowing member is connected to the air outlet block 19, and the air flow blown out by the blowing member reaches the test board 16 through the air outlet holes on the air outlet block 19. The fan 18, the air outlet block 19, the blowing member and the heat dissipation holes 17 together constitute a heat dissipation system. The air flow generated by the fan 18 and the blowing member can reach the test board 16, so that the heat generated by the test board 16 can be dissipated to the outside in time through the heat dissipation holes 17.

[0038] Specifically, the chip testing device further includes an identification member 7 and a processing mechanism. The identification member 7 is arranged on the fixed seat 1 and is used for identifying the abutting situation between the chip and the test board 16. The processing mechanism is electrically connected to the test board 16.

[0039] The identification member 7 of the present utility model includes a first identification and a second identification. In the initial state, the first position of the handle 2 faces the second identification. At this time, the second pressing block 10 disengages from the supporting plate, and the first pressing block 9 disengages from the chip. When the staff rotates the handle 2 forward until the first position of the handle 2 faces the first identification, the test points on the chip are electrically connected to the test board 16. The identification member 7 facilitates the staff to quickly identify the abutting condition between the chip and the test board 16, which is intuitive and easy to understand. The processing mechanism is electrically connected to the test board 16 and is used to receive the test data on the test board 16 and perform corresponding processing and analysis to detect whether the chip is qualified.

[0040] In the description of the present utility model, it should be understood that the orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present utility model.

[0041] The above is the case. The above embodiments are only used to illustrate the technical solutions of the present utility model, rather than to limit them; although the present utility model has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present utility model.

Claims

1. A chip testing device, characterized in that: It includes a test board, a fixing base and a pressing component. A first elastic member on the test board is connected to a supporting board. The supporting board is provided with a limiting groove and a plurality of through holes. The size of the limiting groove matches the size of the chip. The plurality of through holes correspond to the test points of the chip one by one. A threaded hole is formed in the fixing base. The pressing component includes a threaded rod and a pressing block member. The threaded rod is threadedly connected to the threaded hole. One end of the threaded rod close to the supporting board is connected to the pressing block member. When the threaded rod is driven, the pressing block member presses the supporting board and the chip. The test points on the chip pass through the through holes and are electrically connected to the test board.

2. The chip testing device according to claim 1, characterized in that: It includes a base. The base is provided with a receiving groove. The test board is limited in the receiving groove, and the size of the test board is the same as the size of the receiving groove.

3. The chip testing device according to claim 2, wherein: The pressing block member includes a first pressing block and a second pressing block. One side of the second pressing block close to the supporting board is connected to the first pressing block. The distance between the chip and the second pressing block is less than the distance between the supporting board and the first pressing block. When the threaded rod descends to a first height, the second pressing block presses the chip. When it continues to descend to a second height, the first pressing block presses the supporting board.

4. The chip testing device according to claim 3, wherein: It further includes a second elastic member and a third pressing block. The third pressing block is connected to the threaded rod. Two ends of the second elastic member are respectively connected to the third pressing block and the second pressing block.

5. The chip testing device according to claim 3, wherein: It further includes a first guiding post and a second guiding post. The first guiding post is connected to the test board and penetrates through the supporting board. The second guiding post is connected to the second pressing block. A guiding hole is provided in the base at a position corresponding to the second guiding post.

6. The chip testing device according to claim 1, characterized in that: It further includes a handle. The handle is connected to one end of the threaded rod away from the supporting board.

7. The chip testing device according to claim 6, characterized in that: It further includes an adjusting block and a locking member. A first limiting hole is provided on the handle. A plurality of second limiting holes are spaced in the height direction of the adjusting block. The locking member penetrates through the first limiting hole and any one of the second limiting holes.

8. The chip testing device according to claim 2, wherein: It further includes a third guiding post and a hook. The third guiding post is connected to the base and is rotatably connected to the fixing base through the fixing base. The hook of the fixing base is used for clamping the base.

9. The chip testing device according to claim 1, wherein: It further includes a fan, an air outlet block and a blowing member. The fixing base is provided with a first opening, a second opening and a plurality of heat dissipation holes. The fan faces the first opening. The first opening and the second opening are oppositely arranged. The blowing member faces the second opening. The blowing member is connected to the air outlet block. The airflow blown out by the blowing member reaches the test board through the air outlet holes on the air outlet block.

10. The chip testing device according to claim 7, wherein: It further includes an identifying member, a blocking block and a processing mechanism. The identifying member is provided on the fixing base and is used for identifying the abutting situation between the chip and the test board. The blocking block is arranged in the gap between the handle and the fixing base and is used for blocking the adjusting block. The processing mechanism is electrically connected to the test board.

Images