Golden finger plugging test device and test system

Abstract

The embodiment of the utility model provides a golden finger plugging test device and test system, and relates to the technical field of circuit board test. The golden finger plugging test device comprises a golden finger interface, a butt joint detection circuit, a processor and a power supply module. The golden finger interface comprises golden fingers corresponding to at least a part of golden fingers of the aging test board in position so as to simulate the butt joint condition of the golden fingers of the aging test board; the golden finger is connected with the butt joint detection circuit, and the butt joint detection circuit is connected with the processor. The golden finger plugging test device can replace an aging test board to carry out an automatic plugging test, and according to a test result, an automatic plugging mechanical device is adjusted, for example, the plugging depth and direction are adjusted, so that the mechanical device can accurately plug the aging test board subsequently, and the aging test board is prevented from being damaged during automatic plugging.

Description

Technical Field

[0001] The present application relates to the technical field of circuit board testing, and in particular to a gold finger plugging and unplugging test device and a test system. Background Art

[0002] During the aging test, the Burn-In Board (BIB) needs to be docked with the test machine inside the furnace. The docking is completed by automatic plugging and unplugging through a mechanical device.

[0003] The burn-in test board features gold fingers. These thin, narrow connections located along the edge of a circuit board are used to connect different circuit boards or devices, enabling data, electrical signals, and power transmission. They are called "gold fingers" because of their resemblance to gold fingers. These provide a physical interface for connectors on other boards to connect. Gold fingers are used in devices like smartphones and smartwatches, as well as in audio adapters and for transmitting network data.

[0004] However, during the automatic plug-in and unplug process, the gold fingers of the aging test board may be damaged due to misalignment.

[0005] Important chips are integrated on the aging test board, and the cost of manufacturing the aging test board is high. Damage to the aging test board will cause huge cost losses.

[0006] Therefore, how to prevent the aging test board from being damaged during automatic plugging and unplugging is a technical problem that needs to be solved. Utility Model Content

[0007] The purpose of the present application is to provide a gold finger plug-in test device and a test system to prevent an aging test board from being damaged during automatic plug-in and plug-out.

[0008] To achieve the above objectives, the embodiments of the present application adopt the following technical solutions.

[0009] In a first aspect, an embodiment of the present application provides a gold finger plug and unplug test device, comprising: a gold finger interface, a docking detection circuit, a processor, and a power module;

[0010] The gold finger interface includes gold fingers corresponding to at least a portion of the gold fingers of the aging test board to simulate the docking condition of the gold fingers of the aging test board;

[0011] The gold finger is connected to the docking detection circuit, and the docking detection circuit is connected to the processor; the power module is connected to the docking detection circuit and the processor respectively;

[0012] When the gold finger is connected to the terminal of the test machine, the docking detection circuit generates a docking signal and sends it to the processor.

[0013] Optionally, the size and shape of the gold finger interface are the same as those of the aging test board.

[0014] Optionally, the docking detection circuit includes a switch module;

[0015] The first end of the switch module is connected to the power supply module, the second end of the switch module is connected to the gold finger, the third end of the switch module is grounded, and the fourth end of the switch module is connected to the processor.

[0016] Optionally, the docking detection circuit further includes an indicator light;

[0017] The indicator light is connected between the power supply module and the switch module.

[0018] Optionally, the switch module includes a bias circuit, a pull-up resistor, a first switch transistor, a second switch transistor, and a third switch transistor;

[0019] The control end of the first switch transistor is connected to the gold finger and the first end of the bias circuit, the first end of the first switch transistor is connected to the second end of the bias circuit, the third end of the bias circuit is connected to the power supply module, and the second end of the first switch transistor is grounded;

[0020] The control end of the second switch transistor is connected to the second end of the bias circuit, the first end of the second switch transistor is connected to the power supply module and the control end of the third switch transistor, and the second end of the second switch transistor is grounded;

[0021] The first end of the third switch transistor is connected to the first end of the pull-up resistor and the processor, the second end of the pull-up resistor is connected to the power supply module, and the second end of the third switch transistor is grounded.

[0022] Optionally, the docking detection circuit further includes an indicator light, a first resistor, and a second resistor;

[0023] The first end of the first resistor is connected to the power supply module, and the second end of the first resistor is connected to the first end of the second switch transistor;

[0024] The first end of the second resistor is connected to the power supply module, the second end of the second resistor is connected to the first end of the indicator light, and the second end of the indicator light is connected to the first end of the second switch transistor.

[0025] Optionally, the number of gold fingers is multiple, and the number of switch modules is multiple;

[0026] The second end of each switch module is connected to a different gold finger to detect the docking status of multiple gold fingers.

[0027] Optionally, the gold fingers include a first gold finger and two second gold fingers;

[0028] The two second gold fingers are connected to different switch modules, and each first gold finger is not connected to a switch module;

[0029] The first gold finger is located between the two second gold fingers.

[0030] Optionally, the gold fingers include two second gold fingers and two third gold fingers; the two second gold fingers are located between the two third gold fingers;

[0031] The two second gold fingers and the two third gold fingers are connected to different switch modules.

[0032] Optionally, the gold fingers include gold fingers of different lengths;

[0033] The gold fingers of different lengths are connected to different switch modules.

[0034] In a second aspect, an embodiment of the present application provides a test system, and the test system includes a test machine platform and the gold finger plugging and unplugging test device of the first aspect.

[0035] Compared with the prior art, the present application has the following beneficial effects:

[0036] In the gold finger plugging and unplugging test device provided by the embodiment of the present application, the gold finger interface can simulate the gold fingers of the aging test board, and can replace the aging test board to perform the automatic plugging and unplugging test. According to the test results, adjust the automatic plugging and unplugging mechanical device, such as adjusting the plugging and unplugging depth and direction, so that the mechanical device can accurately plug and unplug the aging test board subsequently, and avoid damage to the aging test board during automatic plugging and unplugging. Description of the Drawings

[0037] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0038] Figure 1 Schematic diagram of a gold finger plugging and unplugging test device provided by an embodiment of the present application;

[0039] Figure 2 Schematic diagram of the gold finger interface of a gold finger plugging and unplugging test device provided by an embodiment of the present application;

[0040] Figure 3 Schematic diagram of the elastic piece terminals of a test machine platform provided by an embodiment of the present application;

[0041] Figure 4 Schematic diagram of a switch module provided by an embodiment of the present application as a gold finger plugging and unplugging test device for a docking detection circuit;

[0042] Figure 5 Schematic diagram of a switch module provided by an embodiment of the present application;

[0043] Figure 6 Schematic diagram of a docking detection circuit provided by an embodiment of the present application, including a switch module and an indicator light;

[0044] Figure 7 Schematic diagram of a docking detection circuit provided by an embodiment of the present application, including a transistor and an LED indicator light;

[0045] Figure 8 Schematic diagram of two second gold fingers at both ends in a row of gold fingers for an analog aging test board provided by an embodiment of the present application;

[0046] Figure 9 Schematic diagram of adding two gold fingers outside the gold fingers at both ends provided by an embodiment of the present application;

[0047] Figure 10 Schematic diagram of setting different lengths of gold fingers provided by an embodiment of the present application.

[0048] Explanation of reference numerals:

[0049] 10 Gold finger

[0050] 11 First gold finger

[0051] 12 Second gold finger

[0052] 13 Third gold finger

[0053] 20 Docking detection circuit

[0054] 21 Switch module

[0055] 211 Bias circuit

[0056] 22 Indicator light

[0057] 30 Processor

[0058] 40 Power supply module Detailed implementation manners

[0059] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of this application. The described embodiments are some, but not all, of the embodiments of this application. The components of the embodiments of this application described herein are usually arranged and designed in various different configurations.

[0060] Therefore, the following detailed description of the embodiments of this application provided in the drawings is not intended to limit the scope of this application that is claimed, but merely represents selected embodiments of this application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of this application without creative efforts fall within the scope of protection of this application. Without conflict, the following embodiments and the features in the embodiments may be combined with each other.

[0061] In the description of this application, it should be noted that relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. The term "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected, or indirectly connected through an intermediate medium.

[0062] In the existing aging test, the aging test board is docked to the test machine through the automatic plugging and unplugging action of a mechanical device. When directly using the mechanical device to dock the aging test board, the aging test board may be damaged due to misalignment during docking. For example, mechanical damage is caused during misaligned docking insertion, or short-circuit damage is caused due to misalignment.

[0063] To overcome the above problems, refer to Figure 1 , an embodiment of this application provides a gold finger plugging and unplugging test device, which includes a gold finger interface, a docking detection circuit 20, a processor 30, and a power supply module 40. The gold finger interface includes a gold finger 10. The gold fingers of the gold finger interface correspond to at least a part of the gold fingers of the aging test board to simulate the docking situation of the gold fingers of the aging test board.

[0064] The gold finger 10 is connected to the docking detection circuit 20, and the docking detection circuit 20 is connected to the processor 30; the power supply module 40 is respectively connected to the docking detection circuit 20 and the processor 30.

[0065] When the gold finger 10 is connected to the terminal of the test machine, the docking detection circuit 20 generates a docking signal and sends it to the processor 30. When the processor 30 receives the docking signal, it can determine that the docking is successful. The processor 30 can also count according to the received docking signal to record the docking success rate.

[0066] In the gold finger plugging and unplugging test device provided by the embodiment of the present application, the size and shape of the gold finger interface can be the same as those of the gold finger interface of the aging test board. Figure 2 Fig. shows a partial shape schematic of a gold finger plugging and unplugging test device. The overall shape of the gold finger plugging and unplugging test device can be in the shape of a circuit board, and the shape and size of the gold finger plugging and unplugging test device can be the same as those of the aging test board. Figure 2 In, the gold finger interface is located on the left side, and the shaded part is the gold finger. The terminals of the test machine are as Figure 3 , which are composed of two upper and lower elastic pieces. The gold finger can be inserted into the elastic piece, and when the gold finger contacts the elastic piece, the docking is successful.

[0067] Therefore, the gold finger plugging and unplugging test device can replace the aging test board to perform automatic plugging and unplugging tests. Specifically, before assembling the aging test board, test whether there are abnormal states such as misalignment or incomplete insertion of the automatic plugging and unplugging mechanical device. According to the test results, adjust the automatic plugging and unplugging mechanical device, such as adjusting the plugging and unplugging depth and direction, so that the mechanical device can accurately plug and unplug the aging test board subsequently, and avoid damage to the aging test board due to misalignment or incomplete insertion during automatic plugging and unplugging.

[0068] The docking detection circuit 20, the processor 30, and the power supply module 40 can be arranged on the Figure 2 right side of the shown gold finger plugging and unplugging test device, and the processor 30 can adopt a single-chip microcomputer.

[0069] As Figure 4 , the docking detection circuit 20 may include a switch module 21 composed of transistors. The first end of the switch module 21 is connected to the power supply module 40, the second end of the switch module 21 is connected to the gold finger 10, the third end of the switch module 21 is grounded, and the fourth end of the switch module 21 is connected to the processor 30.

[0070] When the gold finger 10 is connected to the terminal of the test machine, the docking detection circuit 20 generates a docking signal in the form of a high level or a low level and sends it to the processor 30.

[0071] Figure 5 Fig. shows an implementation manner of the switch module 21. The switch module 21 includes a bias circuit 211, a pull-up resistor R3, a first switching tube Q1, a second switching tube Q2, and a third switching tube Q3. The bias circuit 211 can be composed of multiple resistors. The connection relationship is as follows:

[0072] The control end of the first switching tube Q1 is connected to the gold finger 10 and the first end of the bias circuit 211. The first end of the first switching tube Q1 is connected to the second end of the bias circuit 211. The third end of the bias circuit 211 is connected to the power supply module 40, and the second end of the first switching tube Q1 is grounded.

[0073] The control terminal of the second switching transistor Q2 is connected to the second terminal of the bias circuit 211. The first terminal of the second switching transistor Q2 is connected to the power supply module 40 and the control terminal of the third switching transistor Q3. The second terminal of the second switching transistor Q2 is grounded.

[0074] The first terminal of the third switching transistor Q3 is connected to the first terminal of the pull-up resistor R3 and the processor 30. The second terminal of the pull-up resistor R3 is connected to the power supply module 40. The second terminal of the third switching transistor Q3 is grounded.

[0075] The power supply module 40 can be a battery or a power supply interface. For example, a 4.5V DC voltage is input through a battery or a 5V DC voltage is input through a USB. The power supply module 40 can step down the voltage to 3.3V through a SY8843 chip for powering the docking detection circuit and the microcontroller processor 30. The first switching transistor Q1, the second switching transistor Q2, and the third switching transistor Q3 can be triodes or MOS transistors. Figure 5 An example of using enhancement-mode NMOS transistors as the first switching transistor Q1, the second switching transistor Q2, and the third switching transistor Q3 is shown.

[0076] When the gold finger 10 is not successfully docked, the gold finger 10 floats. Since the power supply module 40 provides a voltage to the gate of the first switching transistor Q1 through the bias circuit 211, a voltage conduction is formed between the gate and the source of the first switching transistor Q1, thereby turning off the second switching transistor Q2 and turning on the third switching transistor Q3. The signal received by the processor 30 is a low level.

[0077] When the gold finger 10 is successfully docked, the gold finger 10 is pulled to a low level, turning off the first switching transistor Q1, thereby turning on the second switching transistor Q2 and turning off the third switching transistor Q3. The processor 30 receives a high-level docking signal.

[0078] Based on the switching module 21, the docking detection circuit 20 can further include an LED indicator, such as Figure 6 , and the docking detection circuit 20 further includes an indicator 22. The indicator 22 is connected between the power supply module 40 and the switching module 21.

[0079] Figure 7 An implementation manner of the switching module 21 is shown. On the basis of Figure 5 , the indicator 22 is added. The docking detection circuit 20 includes the indicator 22, a first resistor R1, and a second resistor R2. The indicator 22 is connected in series with the second resistor R2 and then in parallel with the first resistor R1. The first terminal of the second switching transistor Q2 is connected to the power supply module through this parallel structure.

[0080] When the gold finger 10 is not successfully docked, the gold finger 10 floats, the first switching transistor Q1 is turned on, and the second switching transistor Q2 is turned off. Therefore, no current can flow through the loop of the indicator 22, and the indicator 22 does not light up.

[0081] When the gold finger 10 is successfully docked, the first switching transistor Q1 is turned off and the second switching transistor Q2 is turned on. Therefore, a loop for current to flow through the indicator lamp 22 can be formed, and the indicator lamp 22 lights up.

[0082] Figure 5 and Figure 7 The number of gold fingers shown is 1. When the number of gold fingers is multiple, each gold finger can be connected to a switching module 21, and each switching module 21 can be connected to an indicator lamp.

[0083] To simplify the circuit, the number of switching modules 21 can be omitted, such that some gold fingers are connected to the switching module 21 while some are not.

[0084] For example, by connecting the gold fingers at both ends of a row of gold fingers on the analog aging test board to the switching module 21, it is possible to detect whether the docking is offset. The two ends of a row of gold fingers on the aging test board are Figure 2 the uppermost and lowermost gold fingers in

[0085] such as Figure 8 , the gold finger 10 includes a first gold finger 11 and two second gold fingers 12. The first gold finger 11 is located between the two second gold fingers 12. The second gold fingers 12 simulate the gold fingers at both ends of a row of gold fingers on the aging test board. The two second gold fingers 12 are connected to different switching modules 21, and the middle first gold finger 11 is not connected to the switching module 21. When the docking is not offset, docking signals can be generated by both the upper and lower switching modules 21; when the docking is offset upward, the lower switching module 21 does not generate a docking signal; when the docking is offset downward, the upper switching module 21 does not generate a docking signal.

[0086] It is also possible to add two gold fingers outside both ends of a row of gold fingers on the aging test board. Such as Figure 9 , the gold finger 10 includes two second gold fingers 12 and two third gold fingers 13. The two second gold fingers 12 are located between the two third gold fingers 13. The two second gold fingers 12 and the two third gold fingers 13 are connected to different switching modules 21. When the docking is not offset, the switching modules of neither of the two third gold fingers 13 generate docking signals; when the docking is offset upward, the switching module 21 of the upper third gold finger 13 generates a docking signal; when the docking is offset downward, the switching module 21 of the lower third gold finger 13 generates a docking signal. Figure 9 The indicator lamp is omitted in

[0087] such as Figure 10, the length of the gold fingers can be set differently. A part of the gold fingers are shorter than those of the aging test board. The gold fingers with different lengths are connected to different switch modules 21. Then, the insertion effects of different automatic insertion depths can be tested to calibrate the stroke for the automatic plugging and unplugging mechanical device. Since the force of the automatic plugging and unplugging device is very large, if the stroke is too long, the connectors of the aging test board and the test machine will be easily damaged during docking. If the stroke is too short, the insertion will be insufficient and the connection will be unstable. According to the test results of the gold fingers with different lengths, the appropriate stroke can be finally selected.

[0088] Based on the above embodiments, the embodiment of the present application further provides a test system, which includes a test machine and the above gold finger plugging and unplugging test device to perform automatic plugging and unplugging tests before the aging test board test.

[0089] The device and system embodiments described above are only illustrative. Some or all of the modules can be selected according to actual needs to achieve the purpose of the embodiment solution. Those of ordinary skill in the art can understand and implement it without creative efforts.

[0090] The above is only a preferred specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed in the present application should be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A gold finger plug and unplug test device, characterized in that Comprising: A gold finger interface, a docking detection circuit (20), a processor (30), and a power supply module (40); The gold finger interface includes gold fingers (10) corresponding to at least a part of the gold finger positions of the aging test board to simulate the docking situation of the gold fingers of the aging test board; The gold fingers (10) are connected to the docking detection circuit (20), and the docking detection circuit (20) is connected to the processor (30); the power supply module (40) is respectively connected to the docking detection circuit (20) and the processor (30); When the gold fingers (10) are connected to the terminals of the test machine, the docking detection circuit (20) generates a docking signal and sends it to the processor (30).

2. The gold finger plugging and unplugging test device according to claim 1, wherein The docking detection circuit (20) includes a switch module (21); A first end of the switch module (21) is connected to the power supply module (40), a second end of the switch module (21) is connected to the gold fingers (10), a third end of the switch module (21) is grounded, and a fourth end of the switch module (21) is connected to the processor (30).

3. The gold finger plugging and unplugging test device according to claim 2, wherein, The docking detection circuit (20) further includes an indicator light (22); The indicator light (22) is connected between the power supply module (40) and the switch module (21).

4. The gold finger plugging and unplugging test device according to claim 2, wherein The switch module (21) includes a bias circuit (211), a pull-up resistor (R3), a first switching tube (Q1), a second switching tube (Q2), and a third switching tube (Q3); A control end of the first switching tube (Q1) is connected to the gold fingers (10) and a first end of the bias circuit (211), a first end of the first switching tube (Q1) is connected to a second end of the bias circuit (211), a third end of the bias circuit (211) is connected to the power supply module (40), and a second end of the first switching tube (Q1) is grounded; A control end of the second switching tube (Q2) is connected to the second end of the bias circuit (211), a first end of the second switching tube (Q2) is connected to the power supply module (40) and a control end of the third switching tube (Q3), and a second end of the second switching tube (Q2) is grounded; A first end of the third switching tube (Q3) is connected to a first end of the pull-up resistor (R3) and the processor (30), a second end of the pull-up resistor (R3) is connected to the power supply module (40), and a second end of the third switching tube (Q3) is grounded.

5. The gold finger plugging and unplugging test device according to claim 4, wherein, The docking detection circuit (20) further includes an indicator light (22), a first resistor (R1), and a second resistor (R2); A first end of the first resistor (R1) is connected to the power supply module (40), and a second end of the first resistor (R1) is connected to a first end of the second switching tube (Q2); A first end of the second resistor (R2) is connected to the power supply module (40), a second end of the second resistor (R2) is connected to a first end of the indicator light (22), and a second end of the indicator light (22) is connected to a first end of the second switching tube (Q2).

6. The gold finger plugging and unplugging test device according to claim 2, characterized in that, The number of gold fingers (10) is multiple, and the number of switch modules (21) is multiple; The second end of each switch module (21) is connected to a different gold finger (10) to detect the docking status of multiple gold fingers (10).

7. The gold finger plug and unplug test device according to claim 6, wherein The gold finger (10) includes a first gold finger (11) and two second gold fingers (12); The two second gold fingers (12) are connected to different switch modules (21), and each first gold finger (11) is not connected to a switch module (21); The first gold finger (11) is located between the two second gold fingers (12).

8. The gold finger plugging and unplugging test device according to claim 6, characterized in that, The gold finger (10) includes two second gold fingers (12) and two third gold fingers (13); the two second gold fingers (12) are located between the two third gold fingers (13); The two second gold fingers (12) and the two third gold fingers (13) are connected to different switch modules (21).

9. The gold finger plugging and unplugging test device according to claim 6, characterized in that, The gold finger (10) includes gold fingers of different lengths; The gold fingers of different lengths are connected to different switch modules (21).

10. A test system, characterized in that, The test system includes a test machine and the gold finger plugging and unplugging test device according to any one of claims 1 to 9.

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