VCSEL near-field test equipment
By designing a VCSEL near-field test equipment that includes module positioning, camera detection and program-controlled power supply, the testing accuracy, cost and efficiency problems of existing equipment are solved, and efficient testing of PWM controlled modules is achieved.
Patent Information
- Application Number
- CN202422007193.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-19
- Publication Date
- 2025-08-05
- Estimated Expiration
- 2034-08-19
AI Technical Summary
The existing VCSEL near-field testing equipment has problems such as limited testing accuracy, high cost, low efficiency and inability to adapt to PWM control module testing.
A VCSEL near-field testing equipment including a module positioning device, a camera detection device and a program-controlled power supply is designed. Accurate positioning is achieved through the module positioning device, the camera detection device is achieved quickly, and the program-controlled power supply provides analog pulse width modulated signals, solving the test accuracy and efficiency problems.
Accurate testing of fine structures less than 0.01mm is achieved, reducing mutual interference between multiple laser emitters, reducing testing costs, improving testing efficiency and accuracy, and supporting testing of PWM control modules.
Smart Images
Figure CN223192531U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of VCSEL near-field testing, in particular to a VCSEL near-field testing device. Background Art
[0002] With the rapid development of optoelectronics technology, vertical cavity surface emitting lasers (VCSELs) have shown broad application potential in data communications, sensing, imaging and other fields due to their unique performance advantages. Especially in recent years, with the growing demand for high-speed data transmission and precision measurement, near-field characteristic testing of VCSELs has become one of the key links to ensure their performance reliability.
[0003] Traditional VCSEL near-field testers are mostly designed for macro-scale testing, and their minimum testable spatial resolution is typically greater than 0.01 mm. This means that for modern VCSEL devices pursuing higher integration and finer structures, this type of test equipment struggles to meet the precision requirements. To achieve the necessary resolution, these test systems often rely on specialized high-precision lenses, which not only significantly increases the purchase cost of the test system, but also incurs considerable expense in maintaining and replacing such lenses.
[0004] Furthermore, existing testing methods typically rely on lighting up the laser emitters on a VCSEL chip row by row. This approach is not only cumbersome and time-consuming, but also significantly reduces the accuracy of test results due to interference between adjacent emitters when multiple rows are lit simultaneously, severely impacting test efficiency. This testing model clearly cannot meet the high-efficiency testing requirements of large-scale production.
[0005] More importantly, with technological advancements, the market demand for VCSEL modules using pulse-width modulation (PWM) control is increasing. These modules offer more flexible power control and higher energy efficiency. However, current test instruments are not designed to fully support high-duty-cycle PWM-controlled VCSEL modules, resulting in significant limitations when testing these new devices and an inability to accurately assess their performance under specific operating conditions.
[0006] Therefore, it is imperative to redesign a VCSEL near-field test equipment. Utility Model Content
[0007] In response to the above-mentioned defects of the prior art, the present invention provides a VCSEL near-field test device, which aims to solve the problems of VCSEL near-field test devices in the prior art, such as limited test accuracy, high cost, low efficiency, and inability to adapt to PWM control module testing.
[0008] To achieve the above-mentioned purpose, the technical solution adopted by the present invention is: a VCSEL near-field testing device, comprising a shell, in which a module positioning device, a camera detection device and a programmable power supply are arranged, the module positioning device is provided with a module mounting platform and a module pressure cover hinged on the module mounting platform, the module mounting platform is provided with a module carrier unit and a signal connection unit, the module carrier unit is embedded with a VCSEL module, the camera detection device is arranged on one side of the module positioning device, and its detection camera is located directly above the laser emitting end of the VCSEL module, the module pressure cover is embedded with a signal adapter board, the two ends of the signal adapter board are respectively connected to the signal connection unit and the module carrier unit, the programmable power supply is electrically connected to the signal connection unit, so as to provide an analog pulse width modulation signal to the VCSEL module through the signal adapter board.
[0009] Based on the above, a VCSEL near-field test device has the beneficial effect of solving the problems of VCSEL near-field test devices in the prior art, such as limited test accuracy, high cost, low efficiency, and inability to adapt to PWM control module testing. This is mainly reflected in the following: the utility model realizes precise testing of fine structures less than 0.01mm through a module positioning device and a camera detection system. Specifically, the utility model provides an analog pulse width modulation signal to drive the VCSEL module through a programmable power supply, solving the problem of the VCSEL module needing to illuminate the emitters on the laser emitting end row by row in the past. This effectively reduces the mutual interference when multiple rows of laser emitters work simultaneously, making batch testing more efficient and faster, improving the overall test throughput, eliminating the need for expensive special lenses, and reducing testing costs. The beneficial effect of the module positioning device is to achieve precise positioning of the VCSEL module and ensure the accuracy of the test; the beneficial effect of the camera detection device is to achieve rapid acquisition of laser; the beneficial effect of the programmable power supply is to provide analog pulse width modulation signals for the VCSEL module, improving the flexibility and accuracy of the test; the beneficial effect of the module mounting platform is to install the module carrier unit; the beneficial effect of the module pressure cover is to protect the module and assist in positioning, ensure that the test environment is sealed, and reduce external interference; the beneficial effect of the module carrier unit is to install and place the VCSEL module; the beneficial effect of the signal connection unit is to ensure that the analog pulse width modulation signal of the programmable power supply of the test equipment can be connected to the VCSEL module; the beneficial effect of the signal adapter board is to input the analog pulse width modulation signal of the programmable power supply into the VCSEL module.
[0010] Furthermore, the module carrier unit includes a module slot plate and a pin adapter, the pin adapter is arranged on the module slot plate, and its lower end is connected to the pin end of the VCSEL module, and its upper end is connected to one end of the signal adapter board.
[0011] Based on the above, the beneficial effect of the module slot board is to accurately match the VCSEL module size and fix the module position; the beneficial effect of the pin adapter is to bridge the pins of the VCSEL module and the signal adapter board, thereby preventing interference caused by direct access and affecting the test data.
[0012] Furthermore, a plurality of adapter pins are provided through the center of the pin adapter, the lower end of each adapter pin is connected to the pin on the pin end, and the top end of each adapter pin is connected to the pin input port of the signal adapter board.
[0013] Based on the above, the beneficial effects of the transfer pins are to achieve seamless signal transmission, enhance the stability of the connection and the reliability of the test.
[0014] Furthermore, a laser test port and a signal board adapter port are provided on the module gland. The laser test port is located directly above the laser emitting end, and the signal adapter board is adapted in the signal board adapter port.
[0015] Based on the above, the beneficial effect of the laser test port is to adapt the laser of the VCSEL module to be emitted into the detection camera; the beneficial effect of the signal board adapter port is to adapt and locate the position of the signal adapter board.
[0016] Furthermore, a module clamping piece is provided on one side of the module slot plate located at the laser emitting end, the bottom end of the module clamping piece is adapted to the inner edge of the module slot plate embedded slot, and a laser passage is provided in the middle of the module clamping piece, and the laser emitting end emits the laser to the camera detection device through the laser passage.
[0017] Based on the above, the beneficial effect of the module clamping member is to provide the necessary pressure, fix the module to prevent movement, and ensure the stability of the test; the beneficial effect of the laser through-hole is to ensure that the laser is unobstructed and directly leads to the detection area.
[0018] Furthermore, the camera detection device is provided with the detection camera and the dual-axis fine-tuning module, the detection camera is arranged on the dual-axis fine-tuning module, and when the module carrier unit is located at the test position, the lens module of the detection camera is aligned with the laser emitting end.
[0019] Based on the above, the beneficial effect of the detection camera is to capture the laser characteristics with high sensitivity and improve the accuracy of the test results; the beneficial effect of the dual-axis fine-tuning module is to ensure that the camera is aligned with the laser emission end.
[0020] Furthermore, the dual-axis fine-tuning module consists of a horizontal fine-tuning component, a vertical fine-tuning component and a support frame, the horizontal fine-tuning component is arranged on the support frame, the vertical fine-tuning component is arranged on the horizontal fine-tuning component, and the detection camera is arranged on the vertical fine-tuning component.
[0021] Based on the above, the beneficial effects of the horizontal fine-tuning component and the vertical fine-tuning component are that they are responsible for fine-tuning the horizontal and vertical axes respectively, ensuring accurate positioning of the camera; the beneficial effect of the support frame is to provide stable support for the camera and fine-tuning module, maintaining the stability of the overall structure.
[0022] Furthermore, the module positioning device includes a module clamp assembly and an in-and-out material displacement assembly, the module clamp assembly is composed of the module mounting platform and the module pressure cover, and the module clamp assembly is slidably connected to the in-and-out material displacement assembly.
[0023] Based on the above, the beneficial effect of the module fixture assembly is to achieve the positioning and clamping of the module; the beneficial effect of the inlet and outlet displacement assembly is to achieve automatic inlet and outlet of the module, thereby improving the automation level and efficiency of the test process.
[0024] Furthermore, an electric control module is mounted above the programmable power supply, the module positioning device, the camera detection device and the programmable power supply are all electrically connected to the electric control module, and the electric control module is electrically connected to an external computer.
[0025] Based on the above, the beneficial effects of the electronic control module are that it integrates the control logic of the test system, realizes the coordinated work between various components, and optimizes the test process and data processing.
[0026] In order to more clearly illustrate the above features of the present invention and the objectives to be achieved, the present invention will be further described below with reference to the accompanying drawings and specific embodiments. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] Figure 1 : It is a schematic diagram of the internal structure of the utility model;
[0028] Figure 2 : A schematic diagram of a module positioning device of the present invention;
[0029] Figure 3 : This is a schematic diagram of the installation of the module pressing member of the utility model;
[0030] Figure 4 : This is a schematic diagram of the installation of the module installation components of the present invention;
[0031] Figure 5: This is a schematic diagram of the installation of the VCSEL module of the present invention;
[0032] Figure 6 :for Figure 5 An enlarged schematic diagram of part A;
[0033] Figure 7 : It is a three-dimensional schematic diagram of the module fixture assembly of the utility model;
[0034] Figure 8 : It is a three-dimensional diagram of the utility model.
[0035] Explanation of the accompanying numbers: 1-shell, 2-module positioning device, 21-module fixture assembly, 211-module mounting table, 212-module pressure cover, 2121-laser test port, 2122-signal board adapter port, 2123-signal adapter board, 22-feed and discharge displacement assembly, 3-camera detection device, 31-detection camera, 32-dual-axis fine-tuning module, 321-horizontal fine-tuning component, 322-vertical fine-tuning component, 323-support frame, 4-programmable power supply, 5-electric control module, 6-module carrier unit, 61-module slot plate, 611-module clamping part, 62-pin adapter, 7-signal connection unit, 10-VCSEL module, 101-laser emitting end, 102-pin end. DETAILED DESCRIPTION
[0036] like Figures 1-8 As shown, a VCSEL near-field test device comprises a housing 1, wherein a module positioning device 2, a camera detection device 3 and a programmable power supply 4 are provided in the housing 1, wherein the module positioning device 2 is provided with a module mounting platform 211 and a module pressure cover 212 hinged on the module mounting platform 211, wherein the module mounting platform 211 is provided with a module carrier unit 6 and a signal connection unit 7, wherein a VCSEL module 10 is embedded in the module carrier unit 6, and the camera detection device 3 is provided on the module positioning device 2. The VCSEL module 10 is located on one side of the positioning device 2, and its detection camera 31 is located directly above the laser emitting end 101 of the VCSEL module 10. A signal adapter board 2123 is embedded in the module cover 212. The two ends of the signal adapter board 2123 are respectively connected to the signal connection unit 7 and the module stage unit 6. The programmable power supply 4 is electrically connected to the signal connection unit 7 to provide an analog pulse width modulation signal to the VCSEL module 10 through the signal adapter board 2123.
[0037] The module carrier unit 6 includes a module slot plate 61 and a pin adapter 62. The pin adapter 62 is arranged on the module slot plate 61, and its lower end is connected to the pin end 102 of the VCSEL module 10, and its upper end is connected to one end of the signal adapter board 2123.
[0038] A plurality of adapter pins are provided through the center of the pin adapter 62 , the lower end of each adapter pin is connected to the pin on the pin end 102 , and the top end of each adapter pin is connected to the pin input port of the signal adapter board 2123 .
[0039] The module cover 212 is provided with a laser test port 2121 and a signal board adapter port 2122 . The laser test port 2121 is located directly above the laser emitting end 101 , and the signal transfer board 2123 is adapted in the signal board adapter port 2122 .
[0040] A module pressing piece 611 is provided on the module slot plate 61 on one side of the laser emitting end 101, the bottom end of the module pressing piece 611 is adapted to the inner edge of the module slot plate 61 embedded in the slot, and a laser passage is provided in the middle of the module pressing piece 611, and the laser emitting end 101 emits the laser to the camera detection device 3 through the laser passage.
[0041] The camera detection device 3 is provided with the detection camera 31 and the dual-axis fine-tuning module 32. The detection camera 31 is set on the dual-axis fine-tuning module 32. When the module carrier unit 6 is located at the test position, the lens module of the detection camera 31 is aligned with the laser emitting end 101.
[0042] The dual-axis fine-tuning module 32 consists of a horizontal fine-tuning component 321, a vertical fine-tuning component 322 and a support frame 323. The horizontal fine-tuning component 321 is arranged on the support frame 323, the vertical fine-tuning component 322 is arranged on the horizontal fine-tuning component 321, and the detection camera 31 is arranged on the vertical fine-tuning component 322.
[0043] The module positioning device 2 includes a module fixture assembly 21 and an in-and-out material displacement assembly 22 . The module fixture assembly 21 is composed of the module mounting platform 211 and the module pressure cover 212 . The module fixture assembly 21 is slidably connected to the in-and-out material displacement assembly 22 .
[0044] An electric control module 5 is mounted above the programmable power supply 4. The module positioning device 2, the camera detection device 3 and the programmable power supply 4 are all electrically connected to the electric control module 5. The electric control module 5 is electrically connected to an external computer.
[0045] In summary, the specific implementation of the present invention is as follows: First, the operator needs to ensure that the interior of the housing 1 is clean and free of foreign matter, then open the module fixture assembly 21, and gently place the VCSEL module 10 to be tested in the module slot plate 61 on the module mounting platform 211, ensuring that the VCSEL module 10 fits perfectly with the inner edge of the module slot plate 61 without tilting or shaking, and then, on the laser emitting end 101 side of the VCSEL module 10, install the module pressing piece 611 in the The module slot plate 61 is used to press the VCSEL module 10 tightly. On the pin end 102 side of the VCSEL module 10, a pin adapter 62 is installed on the module slot plate 61 so that the lower end of the adapter pin is connected to the pin end 102. After confirming that the connection is secure, the module cover 212 is closed and the signal adapter board 2123 is inserted into the signal board adapter port 2122 of the module cover 212 so that the top ends of the adapter pins are connected to the pin input ports of the signal adapter board 2123.
[0046] After the operator enters or selects the parameters required for this test in the computer, clicks the "Start Test" button, and the system enters the automatic mode. After receiving the instruction, the feed and discharge displacement assembly 22 drives the entire module fixture assembly 21 to slide smoothly to the test position;
[0047] After reaching the test position, if fine-tuning is required, the electronic control module 5 adjusts the horizontal fine-tuning component 321 or the vertical fine-tuning component 322 as needed until the detection camera 31 is perfectly aligned with the laser emitting end 101 of the VCSEL module 10. At this time, the programmable power supply 4 simulates a pulse width modulation signal to drive the VCSEL module 10 to more accurately reflect the performance of the VCSEL module 10 in a real working scenario. At this time, the detection camera 31 begins to collect light data, and the data is immediately transmitted to the electronic control module 5 for preliminary processing, including optical power calculation and wavelength correction.
[0048] The electronic control module 5 sends the processed data to an external computer via electrical signals for engineers to evaluate the performance of the VCSEL module.
[0049] The above description is only the optimal solution embodiment of the present invention and is not intended to limit the present invention. Various modifications or replacements of the present invention made by those skilled in the art without departing from the essence and protection scope of the present invention should also be within the protection scope of the present invention.
Claims
1. A VCSEL near-field test device, comprising a housing (1), characterized in that: The housing (1) is provided with a module positioning device (2), a camera detection device (3) and a programmable power supply (4); the module positioning device (2) is provided with a module mounting platform (211) and a module pressure cover (212) hinged on the module mounting platform (211); the module mounting platform (211) is provided with a module carrier unit (6) and a signal connection unit (7); a VCSEL module (10) is embedded and installed in the module carrier unit (6); the camera detection device (3) is provided on one side of the module positioning device (2); The detection camera (31) is located directly above the laser emitting end (101) of the VCSEL module (10), a signal adapter board (2123) is embedded in the module cover (212), two ends of the signal adapter board (2123) are respectively connected to the signal connection unit (7) and the module carrier unit (6), and the programmable power supply (4) is electrically connected to the signal connection unit (7) to provide an analog pulse width modulation signal to the VCSEL module (10) through the signal adapter board (2123).
2. A VCSEL near-field test device according to claim 1, characterized in that: The module carrier unit (6) comprises a module slot plate (61) and a pin adapter (62), wherein the pin adapter (62) is arranged on the module slot plate (61), and its lower end is connected to the pin end (102) of the VCSEL module (10), and its upper end is connected to one end of the signal adapter board (2123).
3. A VCSEL near-field test device according to claim 2, characterized in that: A plurality of adapter pins are provided through the center of the pin adapter (62), the lower end of each adapter pin is connected to the pin on the pin end (102), and the top end of each adapter pin is connected to the pin input port of the signal adapter board (2123).
4. The VCSEL near-field test device according to claim 1, wherein: A laser test port (2121) and a signal board adapter port (2122) are provided on the module gland (212); the laser test port (2121) is located directly above the laser emitting end (101); and the signal transfer board (2123) is adapted in the signal board adapter port (2122).
5. The VCSEL near-field test device according to claim 2, characterized in that: A module pressing member (611) is provided on the module slot plate (61) on one side of the laser emitting end (101), the bottom end of the module pressing member (611) is adapted to the inner edge of the module slot plate (61) embedded in the slot, and a laser passage is provided in the middle of the module pressing member (611), and the laser emitting end (101) emits laser light onto the camera detection device (3) through the laser passage.
6. The VCSEL near-field test device according to claim 1, characterized in that: The camera detection device (3) is provided with the detection camera (31) and a dual-axis fine-tuning module (32); the detection camera (31) is provided on the dual-axis fine-tuning module (32); when the module carrier unit (6) is located at the test position, the lens module of the detection camera (31) is aligned with the laser emitting end (101).
7. The VCSEL near-field test device according to claim 6, characterized in that: The dual-axis fine-tuning module (32) is composed of a horizontal fine-tuning component (321), a vertical fine-tuning component (322) and a support frame (323), wherein the horizontal fine-tuning component (321) is arranged on the support frame (323), the vertical fine-tuning component (322) is arranged on the horizontal fine-tuning component (321), and the detection camera (31) is arranged on the vertical fine-tuning component (322).
8. The VCSEL near-field test device according to claim 1, characterized in that: The module positioning device (2) comprises a module fixture assembly (21) and an inlet and outlet displacement assembly (22), wherein the module fixture assembly (21) is composed of the module mounting platform (211) and the module pressure cover (212), and the module fixture assembly (21) is slidably connected to the inlet and outlet displacement assembly (22).
9. The VCSEL near-field test device according to claim 1, characterized in that: An electric control module (5) is mounted above the programmable power supply (4); the module positioning device (2), the camera detection device (3) and the programmable power supply (4) are all electrically connected to the electric control module (5); and the electric control module (5) is electrically connected to an external computer.