Test equipment

Abstract

The utility model relates to a test equipment, including engine base, mounting subassembly, scanning device and test device, said engine base is provided with scanning station and test station along x direction, said engine base is provided with the guide structure, said guide structure extends from scanning station to test station, mounting subassembly includes mounting seat, said mounting seat is provided with the scanning station and the test station, said mounting seat is provided with the scanning station and the test station, said testing device is provided with the scanning station and the test station. The mounting base is movably arranged on the guide structure, the mounting base is provided with a mounting part for placing a chip, the code scanning device and the testing device are both arranged on one side of the machine base, the code scanning station is located in a code scanning area of the code scanning device, and the testing station is located in a testing area of the testing device. The test equipment provided by the utility model solves the problem that the code scanning product of the existing chip test equipment is not matched with the ID of the chip.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a testing device. Background Art

[0002] Existing chip testing equipment generally requires testers to first place all chips in the scanning position for scanning. After scanning, all chips are placed in the test position for testing. During this process, the ID of the scanned product may not match the chip ID, resulting in product scrapping and customer complaints. If additional QC personnel are assigned for testing, labor costs will increase sharply and efficiency will be reduced. Utility Model Content

[0003] The main purpose of this utility model is to provide a testing device that can ensure that the ID of the scanned product matches the chip.

[0004] To achieve the above-mentioned purpose, the utility model proposes a testing equipment, including a machine base, a mounting assembly, a code scanning device and a testing device, wherein the machine base is provided with a code scanning station and a testing station along the x-direction, and the machine base is provided with a guide structure, and the guide structure extends from the code scanning station to the testing station, the mounting assembly includes a mounting seat, and the mounting seat is movably set on the guide structure, and the mounting seat is provided with a mounting portion for chip placement, the code scanning device and the testing device are both arranged on one side of the machine base, the code scanning station is located in the code scanning area of the code scanning device, and the testing station is located in the testing area of the testing device.

[0005] According to some embodiments of the present invention, a connecting component and a fixing component for fixing the code scanning device are further included. The connecting component is arranged on one side of the base, and the fixing component is movably connected to the connecting component.

[0006] According to some embodiments of the present invention, the connecting component also includes a first connecting part, a second connecting part and a third connecting part. The first connecting part is arranged on one side of the machine base, the second connecting part is movably installed on the first connecting part along the z direction, the third connecting part is movably installed on the second connecting part along the y direction, and the fixing component is movably installed on the third connecting part along the x direction.

[0007] According to some embodiments of the present invention, the fixing assembly includes a connecting seat and a fixing portion for fixing the code scanning device, the connecting seat is connected to the connecting assembly, and the fixing portion is rotatably mounted on the connecting seat along an axis extending along the x-direction.

[0008] According to some embodiments of the present invention, a pressing assembly is further included, which includes a guide portion and a pressing portion for installing the testing device. The guide portion is provided on one side of the machine base and extends along the z direction. The pressing portion is movably provided on the guide portion.

[0009] According to some embodiments of the present invention, a placement station is further provided on the machine base, and the placement station is located between the code scanning station and the testing station.

[0010] According to some embodiments of the present invention, a detection unit for detecting the position of the mounting seat is further included. The detection unit is arranged on one side of the base in the y direction and is arranged corresponding to the code scanning station.

[0011] According to some embodiments of the present invention, the mounting assembly further includes an adsorption portion for adsorbing the chip, and the adsorption portion is disposed at the bottom of the mounting seat and corresponding to the mounting portion.

[0012] According to some embodiments of the present invention, an air suction hole is provided on the mounting portion, and the adsorption portion includes an air suction pipe, which is connected to the air suction hole.

[0013] According to some embodiments of the present invention, the mounting base is made of ferromagnetic material, and both the code scanning station and the testing station are provided with magnets.

[0014] The utility model has at least the following beneficial effects:

[0015] In the present invention, a code scanning station and a test station are set on the machine base. The code scanning station is in the code scanning area of the code scanning device, and the test station is in the test area of the test device. A guide structure is provided on the machine base, and the guide structure extends from the code scanning station to the test station. The mounting seat is movably provided on the guide structure. The mounting seat is provided with a mounting portion for chip placement. The tester places the chip on the mounting portion. The mounting seat moves to the code scanning station to be scanned by the code scanning device. After the code is scanned, the mounting seat moves to the test station to be tested by the test device. The code scanning station and the test station are connected by the guide structure, and the chip is transferred by the mounting seat to ensure that the ID of the code scanning chip matches the chip, avoiding product scrapping and client complaints due to mismatch problems, reducing manpower input, and improving the efficiency of the test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 A schematic structural diagram of a test device provided in an embodiment of the present utility model;

[0018] Figure 2 for Figure 1 Front view of the test equipment described in .

[0019] Description of reference numerals:

[0020] 100-testing equipment; 1-machine base; 11-code scanning station; 12-testing station; 13-guide structure; 14-placement station; 2-installation assembly; 21-mounting seat; 211-installation part; 3-code scanning device; 4-testing device; 5-connection assembly; 51-first connection part; 52-second connection part; 53-third connection part; 6-fixing assembly; 61-connecting seat; 62-fixing part; 7-pressing assembly; 71-guide part; 72-pressing part. DETAILED DESCRIPTION

[0021] The following is a clear and complete description of the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0022] It should be noted that if the embodiments of the present invention involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indications will also change accordingly.

[0023] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or suggesting their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of such features. In addition, the meaning of "and / or" appearing throughout the text includes three parallel schemes. Taking "A and / or B" as an example, it includes scheme A, or scheme B, or a scheme in which A and B are satisfied at the same time. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is mutually contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0024] The utility model provides a testing device. Figures 1 to 2 This is a specific embodiment of a testing device provided by the utility model.

[0025] like Figure 1 and Figure 2 As shown, an embodiment of the present invention provides a testing device 100, including a machine base 1, an installation component 2, a code scanning device 3 and a testing device 4, wherein a code scanning station 11 and a testing station 12 are arranged on the machine base 1 along the x direction, and a guide structure 13 is provided on the machine base 1, and the guide structure 13 extends from the code scanning station 11 to the testing station 12, the installation component 2 includes a mounting seat 21, and the mounting seat 21 is movably set on the guide structure 13, and a mounting portion 211 is provided on the mounting seat 21 for chip placement, the code scanning device 3 and the testing device 4 are both arranged on one side of the machine base, the code scanning station 11 is in the code scanning area of the code scanning device 3, and the testing station 12 is in the testing area of the testing device 4.

[0026] In the present utility model, a code scanning station 11 and a test station 12 are set on the machine base 1, the code scanning station 11 is in the code scanning area of the code scanning device 3, and the test station 12 is in the test area of the test device 3. A guide structure 13 is provided on the machine base 1, and the guide structure 13 extends from the code scanning station 11 to the test station 12. The mounting seat 21 is movably set on the guide structure 13, and a mounting portion 211 is provided on the mounting seat 21 for chip placement. The tester places the chip on the mounting portion 211, and the mounting seat 21 moves to the code scanning station 11 to be scanned by the code scanning device 3. After the code is scanned, the mounting seat 21 moves to the test station 12 and the chip is tested by the test device 4. The scanning station 11 and the testing station 12 are connected by the guide structure 13, and the chip is transferred by the mounting seat 21 to ensure that the ID of the scanning chip matches the chip ID, thereby avoiding product scrapping and customer complaints due to mismatching problems, reducing manpower investment, and improving the efficiency of the testing process.

[0027] It should be noted that the test items on the test station 12 include the software burning status in the chip and the current status after the chip is powered on. The tester can also add test items according to the actual chip testing requirements.

[0028] It should be noted that the connection method between the mounting seat 21 and the guide structure 13 can be that a sliding groove is opened at the bottom of the mounting seat 21 corresponding to the position of the guide structure 13, and the guide structure 13 is extended into the sliding groove to complete the installation, or it can be other sliding installation methods known to those skilled in the art.

[0029] Preferably, if Figure 1 As shown, the test equipment 100 further includes a connecting assembly 5 and a fixing assembly 6 for fixing the code scanning device 3. The connecting assembly 5 is disposed on one side of the base 1, and the fixing assembly 6 is movably connected to the connecting assembly 5. The code scanning device 3 is fixed to one side of the base 1 via the connecting assembly 5 and the fixing assembly 6. The connecting assembly 5 can be disposed on one side of the base 1 in the x-direction or on one side in the y-direction, and the specific location depends on the test site.

[0030] Furthermore, the structure of the connecting component 5 is not limited, as long as the connecting component 5 is provided on one side of the base 1 and the connecting component 5 can be connected to the fixing component 6. For example, in some embodiments, Figure 1As shown, the connecting assembly 5 further includes a first connecting portion 51, a second connecting portion 52, and a third connecting portion 53. The first connecting portion 51 is provided on one side of the base 1, the second connecting portion 52 is movably mounted to the first connecting portion 51 along the z-direction, the third connecting portion 53 is movably mounted to the second connecting portion 52 along the y-direction, and the fixing assembly 6 is movably mounted to the third connecting portion 53 along the x-direction. With this arrangement, the code scanning device 3 is movable relative to the base 1 in the x-, y-, and z-directions. Since the coding positions of different chips may differ, testers can adjust the position of the code scanning device 3 according to the different coding positions, so that the code scanning device 3 is directly aligned with the coding position in the z-direction, thereby improving the recognition rate and speed of the code scanning device 3.

[0031] Furthermore, the specific structure of the fixing component 6 is not limited, as long as the fixing component 6 can fix the code scanning device 3. For example, in some embodiments, Figure 1 As shown, the fixing assembly 6 includes a connecting base 61 and a fixing portion 62 for fixing the code scanning device 3. The connecting base 61 is connected to the connecting assembly 5, and the fixing portion 62 is rotatably mounted on the connecting base 61 along an axis extending in the x-direction. Generally, when the code scanning device 3 is facing the coding position of the chip in the z-direction, the recognition rate and recognition speed of the code scanning device 3 are the highest. However, sometimes, due to the influence of light, the recognition rate and recognition speed may not be good when the code scanning device 3 is facing the coding position. In this case, the tester can rotate the fixing portion 62 to adjust the angle of the code scanning device 3 to obtain a better recognition rate and recognition speed.

[0032] Since the test device 4 is provided corresponding to the test station 12, if the test device 4 is directly provided on the test station 12, the chip will be immediately electrically connected to the test device 4 after the mounting base 21 moves to the test station 12. The interface probe of the test device 4 may scratch the chip, and the interface probe may be worn out after long-term use. Therefore, in some embodiments, Figure 1 and Figure 2 As shown, the test apparatus 100 further includes a pressing assembly 7, which includes a guide portion 71 and a pressing portion 72 for mounting the test device 4. The guide portion 71 is provided on one side of the base 1 and extends in the z-direction, and the pressing portion 72 is movably mounted on the guide portion 71. With this arrangement, the mounting base 21 first moves to the test station 12, and then the pressing portion 72 moves on the guide portion 71, driving the test device 4 in the z-direction, causing the interface probe to electrically contact the chip contacts, thereby initiating chip testing.

[0033] It should be noted that the pressing assembly 7 also includes an electric push rod or a pressing joystick, one end of which is connected to the pressing part 72. The pressing part 72 can move under the drive of the electric push rod, or the tester can rotate the pressing joystick to drive the pressing part 72 to move on the guide part 71.

[0034] The code scanning device 3 and the testing device 4 are controlled by a controller. When only the code scanning station 11 and the testing station 12 are arranged on the machine base 1, if the tester wants to pause the test, no matter the mounting base 21 is placed at the code scanning station 11 or the testing station 12, one of the devices will be in operation. For power saving considerations, the entire test device 100 must be shut down. When the test starts, the test device 100 needs to be restarted. Therefore, in some embodiments, Figure 1 As shown, the base 1 is further provided with a placement station 14, which is located between the code scanning station 11 and the test station 12. With this arrangement, the tester can place the chip when the mounting seat 21 is in the placement station 14. When the tester pauses the test, the mounting seat 21 moves to the placement station 14, and the code scanning device 3 and the test device 4 can be temporarily dormant to save power. When the test starts, there is no need to restart, thereby improving the test efficiency.

[0035] Specifically, in some embodiments, the testing device 100 further includes a detection unit for detecting the position of the mounting seat 21. The detection unit is provided on one side of the base 1 in the y direction and is provided corresponding to the code scanning station 11. The detection unit can detect whether the mounting seat 21 is in the code scanning station 11. When the mounting seat 21 leaves the code scanning station 11, the code scanning device 3 is controlled to temporarily sleep. When the mounting seat 21 moves to the code scanning station 11, the code scanning device 3 is controlled to scan the code.

[0036] It should be noted that the detection unit may be a photoelectric sensor, an ultrasonic sensor, or other sensors with object detection functions known to those skilled in the art.

[0037] Since the interface probe of the test device 4 needs to be in electrical contact with the contacts of the chip, it is necessary to ensure that the chip does not move on the mounting portion 211. If a clamping component is used to clamp the chip, it may cause damage to the corners of the chip and it is also inconvenient for the tester to pick up the chip. Therefore, in some embodiments, the mounting assembly 2 also includes an adsorption portion for adsorbing the chip. The adsorption portion is provided at the bottom of the mounting seat 21 and is provided corresponding to the mounting portion 211. In this manner, the chip is adsorbed by the adsorption portion, preventing the chip from moving on the mounting portion 211, so that the interface probe of the test device 4 can be aligned with the contacts of the chip, facilitating electrical contact to complete the test.

[0038] Specifically, in some embodiments, the mounting portion 211 is provided with an air suction hole, and the adsorption portion includes an air suction pipe that is connected to the air suction hole. This arrangement allows the chip to be fixed to the mounting portion 211 by air pressure, preventing damage to the chip. The air suction pipe is connected to a solenoid valve, and the opening and closing of the solenoid valve is controlled by a controller, making it easier for testers to remove the chip.

[0039] It should be noted that the adsorption portion may also be a magnet, which can adsorb some chips containing ferromagnetic materials through magnetism.

[0040] When the mounting base 21 moves to the code scanning station 11 and the test station 12, it may slightly exceed the preset position. If a limiter is provided on the two stations, the mounting base 21 may collide with the limiter, which may cause damage after long-term use. Therefore, in some embodiments, the mounting base 21 is made of ferromagnetic material, and the code scanning station 11 and the test station 12 are both provided with magnets. The two magnets secure the mounting base 21 in the preset position by magnetic attraction, and even after long-term use, the mounting base 21 will not be damaged.

[0041] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A testing device, characterized in that: It includes a machine base, a mounting assembly, a code scanning device and a testing device. The machine base is provided with a code scanning station and a testing station along the x direction. The machine base is provided with a guide structure, and the guide structure extends from the code scanning station to the testing station. The mounting assembly includes a mounting seat, and the mounting seat is movably set on the guide structure. The mounting seat is provided with a mounting portion for placing a chip. The code scanning device and the testing device are both arranged on one side of the machine base. The code scanning station is located in the code scanning area of the code scanning device, and the testing station is located in the testing area of the testing device.

2. The test device according to claim 1, wherein It also includes a connecting component and a fixing component for fixing the code scanning device. The connecting component is arranged on one side of the machine base, and the fixing component is movably connected to the connecting component.

3. The test device according to claim 2, wherein: The connecting component also includes a first connecting part, a second connecting part and a third connecting part. The first connecting part is arranged on one side of the machine base, the second connecting part is movably installed on the first connecting part along the z direction, the third connecting part is movably installed on the second connecting part along the y direction, and the fixing component is movably installed on the third connecting part along the x direction.

4. The testing device according to claim 2, wherein: The fixing assembly includes a connecting seat and a fixing portion for fixing the code scanning device. The connecting seat is connected to the connecting assembly, and the fixing portion is rotatably mounted on the connecting seat along an axis extending along the x direction.

5. The testing device according to claim 1, wherein It also includes a pressing assembly, which includes a guide part and a pressing part for installing the testing device. The guide part is arranged on one side of the machine base and extends along the z direction. The pressing part is movably arranged on the guide part.

6. The testing device according to claim 1, wherein: The machine base is also provided with a placement station, which is located between the code scanning station and the testing station.

7. The testing device according to claim 1 or 6, characterized in that It also includes a detection unit for detecting the position of the mounting seat. The detection unit is arranged on one side of the base in the y direction and is arranged corresponding to the code scanning station.

8. The testing device according to claim 1, wherein: The mounting assembly further includes an adsorption portion for adsorbing the chip. The adsorption portion is disposed at the bottom of the mounting seat and is arranged corresponding to the mounting portion.

9. The testing device according to claim 8, wherein An air suction hole is formed on the mounting portion, and the adsorption portion includes an air suction pipe, which is communicated with the air suction hole.

10. The testing device according to claim 1, wherein: The mounting base is made of ferromagnetic material, and both the code scanning station and the testing station are provided with magnets.

Images