Chip performance detection equipment

Abstract

The utility model discloses chip performance detection equipment, which comprises a detection device main body, a control panel arranged at the front side of the detection device main body, a tester fixedly arranged at the rear end of the middle part of the detection device main body, five groups of test assemblies connected with the tester, and a gantry carrying assembly, the gantry carrying assembly is fixedly installed at the upper ends of the supporting columns. According to the chip performance detection equipment, detected chips can be conveniently and automatically fed, the chips can be driven to be conveyed and transferred through the gantry carrying assembly and the carrying swing arm after the chips are adsorbed through the Z-axis suction nozzle, the chips are arranged on the rotating tower, and all-directional detection is conducted through the tester and the testing assembly; high-temperature and normal-temperature separated electrical performance tests can be realized through two groups of turrets, high-temperature and normal-temperature environment tests of a chip can be separated through a double-turret mechanism, the detection efficiency is high, the test seat is adopted to rotate, only two times of needle insertion are adopted in chip detection, and needle marks are small.

Description

Technical Field

[0001] The utility model relates to the technical field related to chip detection, in particular to a chip performance detection device. Background Art

[0002] A chip is a miniature electronic circuit that integrates a large number of tiny electronic components on a single semiconductor substrate. It is also called an integrated circuit. It is widely used in various electronic devices and can complete calculations and processing tasks. During the production and processing of chips, the performance of the chip needs to be tested with the help of corresponding testing equipment.

[0003] However, the existing technology has the problem that it is inconvenient to automatically load the chips to be tested, it is inconvenient to unload the chips that have been tested correctly, and it is inconvenient to automatically transfer, transport and convey the chips to be tested.

[0004] To this end, we proposed a chip performance testing equipment to solve the above problems. Utility Model Content

[0005] The purpose of the present utility model is to provide a chip performance testing equipment to solve the problems in the prior art proposed in the above background technology, namely, that it is inconvenient to automatically load the chips to be tested, that it is inconvenient to unload the chips that have been tested correctly, and that it is inconvenient to automatically transfer, transport and convey the chips to be tested.

[0006] To achieve the above-mentioned object, the present invention provides the following technical solution: a chip performance testing device, comprising a testing device body, a control panel mounted on the front side of the testing device body, a tester fixedly mounted on the middle and rear end of the testing device body, and six test components connected to the tester;

[0007] It is characterized by further comprising:

[0008] A gantry handling assembly is fixedly mounted on the upper end of the support, and the support is fixedly mounted to the middle of the detection device body by bolts, and a Z-axis suction nozzle is installed in the middle of the gantry handling assembly;

[0009] The blanking and mold expanding component is arranged on the front side of the right end of the detection device body, and the blanking and mold expanding component is used to blank the chips that have been detected correctly.

[0010] Preferably, a supporting foot is welded to the lower end of the detection device body, and a basket loading assembly is provided at the left end of the front side of the detection device body, and a basket unloading assembly is provided at the right end of the front side of the detection device body;

[0011] Wherein, a bracket is fixedly connected to the left side of the detection device body, and a waffle box feeding component is provided at the upper end of the bracket.

[0012] Preferably, a supporting foot is welded to the lower end of the detection device body, and a basket loading assembly is provided at the left end of the front side of the detection device body.

[0013] Preferably, a basket unloading assembly is provided at the right end of the front side of the detection device body.

[0014] Preferably, a bracket is fixedly connected to the left side of the detection device body, and a waffle box feeding assembly is provided at the upper end of the bracket.

[0015] Preferably, a marble slab is laid and fixed on the upper end of the workbench in the middle of the main body of the detection device, and a fixing plate is provided at the rear end of the marble slab.

[0016] Preferably, the fixing plate is fixed to the rear end of the detection device body, and a tester is fixedly mounted on the upper end of the fixing plate.

[0017] Preferably, a loading and expanding mold assembly is provided on the left front side of the workbench in the middle of the main body of the detection device.

[0018] Preferably, two groups of visual cameras are installed at the rear end of the detection device body, and a transport swing arm is provided on the rear side of the loading and mold expansion assembly.

[0019] Preferably, turrets are provided on both the left and right sides of the rear end of the main body of the detection device, and test components are provided at equal angles on the upper ends of the turrets.

[0020] Compared with the prior art, the beneficial effects of the present invention are as follows: the chip performance testing equipment is convenient for automatically loading the chip to be tested through the arrangement of the basket loading component and the basket unloading component, takes pictures of the chip and reads data through the visual camera, and after the chip is adsorbed by the Z-axis suction nozzle, the gantry handling component and the handling swing arm can drive the chip to be transported and transferred, and the chip is placed on the turret for all-round testing by the tester and the test component, and the two sets of turrets can realize two separate electrical performance tests at high temperature and room temperature, and the dual turret mechanism can separate the high temperature and room temperature environment tests of the chip, with high testing efficiency. At the same time, the test seat is rotated, and the chip detection only requires two needle insertions, and the needle marks are small. At the same time, multiple test stations are tested in parallel, and the test seat is rotated to adapt to different test machine stations. The number of chip needle insertions is small, and there is no need to insert the needle once for each test station. After the test is completed, the unloading and expanding component and the basket unloading component can automatically unload the chip that has been detected correctly, with a high degree of automation and a relatively convenient detection operation.

[0021] 1. It is equipped with a basket loading component and a loading and expanding component. Through the setting of the basket loading component and the basket unloading component, the chips to be tested can be loaded automatically;

[0022] 2. It is equipped with a gantry handling component, a visual camera, a handling swing arm, a tester, a test component and a turret. The visual camera takes pictures of the chip and reads the data. The gantry handling component, the handling swing arm and the handling swing arm drive the chip to be transferred and transported to the turret. The tester and test component are used to test the chip, which has a high degree of automation.

[0023] 3. It is equipped with a blanking and expanding component and a basket blanking component. Through the setting of the blanking and expanding component and the testing component, the chips that have been tested correctly can be automatically blanked. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is a schematic diagram of the overall structure of the utility model;

[0025] Figure 2 This is a schematic diagram of the top view of the detection device body, the basket loading assembly, the basket unloading assembly, the loading and expanding mold assembly, and the unloading and expanding mold assembly of the utility model;

[0026] Figure 3 This is a schematic diagram of the top view of the marble slab, gantry handling assembly and turret of the utility model;

[0027] Figure 4 This is a schematic diagram of the gantry handling assembly and the overall structure of the gantry handling assembly of the utility model;

[0028] Figure 5 This is a schematic diagram of the overall structure of the waffle box feeding assembly and the bracket of the utility model;

[0029] Figure 6 This is a schematic diagram of the overall structure of the visual camera, turret and blanking and expanding mold assembly of the utility model;

[0030] Figure 7 This is a schematic diagram of the overall structure of the marble plate, fixed plate and tester of the utility model;

[0031] Figure 8 This is a schematic diagram of the overall structure of the marble slab, test assembly and turret of the utility model.

[0032] In the figure: 1. Detection device body; 2. Support legs; 3. Control panel; 4. Basket loading assembly; 5. Basket unloading assembly; 6. Waffle box loading assembly; 7. Marble slab; 8. Loading and expanding mold assembly; 9. Z-axis nozzle; 10. Gantry transport assembly; 11. Vision camera; 12. Transport swing arm; 13. Fixing plate; 14. Tester; 15. Test assembly; 16. Turret; 17. Unloading and expanding mold assembly; 18. Pillar; 19. Bracket. DETAILED DESCRIPTION

[0033] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0034] See also Figures 1-8 , the utility model provides the following technical solutions.

[0035] Example 1: In order to solve the problem of inconvenience in automatically loading the chips to be tested in the prior art, this embodiment adopts the following technical solution: a chip performance testing equipment is provided, which includes a testing device body 1, a support leg 2, a control panel 3, a basket loading assembly 4, a waffle box loading assembly 6, a loading and expanding mold assembly 8 and a bracket 19, as shown in FIG. Figure 1 and Figure 2 As shown, a supporting foot 2 is fixedly provided at the lower end of the detection device body 1, and a control panel 3 is fixedly installed on the front side of the detection device body 1. The data of the entire loading and unloading and testing process are displayed and observed through the control panel 3. A basket loading assembly 4 is provided at the left end of the front side surface of the detection device body 1, and a loading and expanding mold assembly 8 is provided on the left front side of the workbench in the middle of the detection device body 1. The left side of the detection device body 1 is fixedly connected to a bracket 19, and a waffle box loading assembly 6 is provided at the upper end of the bracket 19. Through the arrangement of the basket loading assembly 4 and the loading and expanding mold assembly 8, it is convenient to automatically load the chip to be tested. Combined with the waffle box loading assembly 6 arranged on the bracket 19, it is convenient to realize the loading of the chip on the waffle box.

[0036] Example 2: The existing chip performance testing equipment is not convenient for automatically transferring, transporting and conveying the chips to be tested. Therefore, by setting up a marble plate 7, a loading and expanding mold component 8, a gantry transport component 10, a visual camera 11, a transport swing arm 12, a tester 14, a test component 15, a turret 16 and a Z-axis suction nozzle 9, the tester 14 is set at the rear end of the middle part of the detection device body 1, and the tester 14 is connected to the 6 groups of test components 15. The gantry transport component 10 is fixedly installed on the upper end of the pillar 18, and the pillar 18 is fixedly installed in the middle part of the detection device body 1 by bolts. The middle part of the gantry transport component 10 is installed. Equipped with a Z-axis suction nozzle 9, a marble slab 7 is fixed on the upper end of the middle workbench of the detection device body 1, and a fixed plate 13 is provided at the rear end of the marble slab 7, the fixed plate 13 is fixed to the rear end of the detection device body 1, and a tester 14 is fixedly installed on the upper end of the fixed plate 13, a loading and expanding mold component 8 is provided on the left front side of the middle workbench of the detection device body 1, two groups of visual cameras 11 are installed at the rear end of the detection device body 1, a transport swing arm 12 is provided on the rear side of the loading and expanding mold component 8, a turret 16 is provided on both sides of the rear end of the detection device body 1, and a test component 15 is provided at equal angles on the upper end of the turret 16, such as Figure 2 、 Figure 3 、 Figure 4 、 Figure 5 、 Figure 6 、 Figure 7 and Figure 8 As shown, after loading, the chip is adsorbed and transported by the gantry transport assembly 10, the transport swing arm 12 and the Z-axis suction nozzle 9. After the chip is transported to the turret 16, two groups of visual cameras 11 are provided. After the first group of visual cameras 11 takes a picture of the chip, it can be recalibrated by the second group. The visual camera 11 takes a picture of the chip and reads the data. The chip is tested in combination with the tester 14 and the test assembly 15. The two groups of turrets 16 rotate with the test seat to achieve different project tests, that is, the two groups of turrets 16 can achieve high temperature and room temperature two separate electrical performance tests. At the same time, the chip only needs to be needled twice. The setting of the dual turrets 16 can separate the high temperature and room temperature environment tests of the chip, with high detection efficiency. At the same time, the test seat rotates, and the chip detection only needs two needles, with small needle marks. During the entire test process, the chip is visually scanned and aligned. The dual suction nozzles quickly absorb the chip to the intermediate transfer platform. After visual correction, it is transported to the test position. 6 stations are tested in parallel. After the test is completed, it is automatically binned on the blue film to complete the test work.

[0037] Example 3: The existing chip performance testing equipment is not convenient for unloading the chips that have been tested correctly. Therefore, a unloading and expanding mold component 17 and a basket unloading component 5 are set. The unloading and expanding mold component 17 is set on the front side of the right end of the detection device body 1, and the unloading and expanding mold component 17 is used to unload the chips that have been tested correctly. The right end of the front side of the detection device body 1 is provided with a basket unloading component 5, as shown in FIG. Figure 1 and Figure 2 As shown, after the chips are processed, the chips that have been correctly detected can be automatically unloaded through the arrangement of the unloading and expanding component 17 and the basket unloading component 5.

[0038] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A chip performance testing device, comprising a testing device body (1), a control panel (3) mounted on the front side of the testing device body (1), a tester (14) fixedly mounted at the middle rear end of the testing device body (1), and six test components (15) connected to the tester (14); It is characterized by: Also includes: A gantry transport assembly (10), wherein the gantry transport assembly (10) is fixedly mounted on the upper end of a support (18), and the support (18) is fixedly mounted on the middle portion of the detection device body (1) by means of bolts, and a Z-axis suction nozzle (9) is mounted on the middle portion of the gantry transport assembly (10); A blanking and mold expansion component (17) is provided on the front side of the right end of the detection device body (1), and the blanking and mold expansion component (17) is used to blank chips that have been correctly detected.

2. The chip performance testing equipment according to claim 1, characterized in that: A support leg (2) is welded to the lower end of the detection device body (1), and a basket loading assembly (4) is provided at the left end of the front side of the detection device body (1).

3. The chip performance testing equipment according to claim 1, characterized in that: A basket unloading assembly (5) is provided at the right end of the front side of the detection device body (1).

4. The chip performance testing equipment according to claim 1, characterized in that: A bracket (19) is fixedly connected to the left side of the detection device body (1), and a waffle box loading assembly (6) is provided at the upper end of the bracket (19).

5. The chip performance testing equipment according to claim 1, characterized in that: A marble slab (7) is laid and fixed on the upper end of the workbench in the middle of the detection device body (1), and a fixing plate (13) is provided at the rear end of the marble slab (7).

6. The chip performance testing equipment according to claim 5, characterized in that: The fixing plate (13) is fixed to the rear end of the detection device body (1), and a tester (14) is fixedly mounted on the upper end of the fixing plate (13).

7. The chip performance testing equipment according to claim 1, characterized in that: A loading and expanding mold assembly (8) is provided on the left front side of the central workbench of the detection device body (1).

8. The chip performance testing equipment according to claim 7, characterized in that: Two groups of visual cameras (11) are installed at the rear end of the detection device body (1), and a transport swing arm (12) is provided at the rear side of the loading and expanding mold assembly (8).

9. The chip performance testing equipment according to claim 1, characterized in that: Turrets (16) are provided on both the left and right sides of the rear end of the detection device body (1), and test components (15) are provided at equal angles on the upper ends of the turrets (16).

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