Inductor turn-to-turn short circuit test power supply circuit

Through the inductor inter-turn short-circuit test power supply circuit composed of a single pulse generator and NMOS tube, the safety hazards of manual switching control and the volume and cost problems of high-voltage equipment are solved, and safe and low-cost inductance testing are achieved.

CN223205643UActive Publication Date: 2025-08-08GUANGZHOU SHENTIE TRACTION EQUIP CO LTD
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Patent Information

Application Number
CN202422331506.2
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-09-24
Publication Date
2025-08-08
Estimated Expiration
2034-09-24

AI Technical Summary

Technical Problem

In the existing inductor inter-turn short circuit test, manual switching control poses safety risks, and high-voltage power supply equipment is large in size and expensive, making it difficult to meet the needs of the rail transit industry.

Method used

The circuit consisting of a single pulse generator and NMOS tube realizes automatic switching of the test power supply, and uses low-voltage power supply and low-voltage energy storage capacitors to control the charge and discharge process of the inductor through pulse signals to avoid manual switching operations.

Benefits of technology

It realizes safe and reliable inductor inter-turn short circuit testing, reduces equipment cost and volume, and is suitable for inductance testing in the rail transit industry.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a power supply circuit for an inductor turn-to-turn short circuit test. The power supply circuit comprises a monopulse generator; the driving plate is electrically connected with the monopulse generator; a voltage source; one end of the first capacitor is connected with the positive end of the voltage source, and the other end is connected with the negative end of the voltage source; one end of the boost inductor is connected with the positive electrode end of the voltage source; a first pin of the transistor is connected with the output end of the driving plate, and a second pin of the transistor is connected with the other end of the boost inductor; the positive electrode end of the diode is connected with the other end of the boost inductor; one end of the second capacitor is connected with the negative electrode end of the diode; one end of the switch is connected with the negative electrode end of the diode, the other end of the switch is connected with one end of a test inductor, and the other end of the test inductor is grounded. Through the above mode, automatic switching of the test power supply can be realized, operation danger caused by manual switching is avoided, a switching device is not needed, the design cost is reduced, and the size is relatively small.
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Description

Technical Field

[0001] The utility model relates to the technical field of test circuits, in particular to an inductor turn-to-turn short-circuit test power supply circuit. Background Art

[0002] Currently, the inductor turn-to-turn short-circuit test requires a high-voltage power supply, and continuous power supply is required during the test. However, in traditional methods, the inductor turn-to-turn short-circuit test requires manual switch control, but manual switch control under high-voltage power supply is a dangerous operation and poses a safety hazard.

[0003] The inter-turn short circuit test of inductor products is generally carried out by using a high-voltage power supply and an inductor to oscillate, and observing the oscillation waveform of the inductor voltage to determine whether there is a defect. Figure 1 As shown, L1 is the inductor to be tested, C1 is the energy storage capacitor, and when the voltage of capacitor C1 reaches the test voltage, switch K1 is turned on to make capacitor C1 and inductor L1 oscillate to obtain the inductor voltage waveform for analysis.

[0004] Since the rated voltage of the inductor used in the rail transit industry is relatively large, this requires that the voltage of capacitor C1 is high enough, generally a test voltage of 2500V. After the voltage of capacitor C1 reaches U1, it must be disconnected from the voltage source that charges capacitor C1 before the test can be performed. Generally, conventional tests are performed using Figure 2 Solution: The above test must disconnect switch K2, because this type of test is dangerous. It is dangerous if voltage source S1 continues to supply power. After capacitor C1 is fully charged, disconnecting switch K2 requires a high-voltage contactor or air switch. The former is larger in size, and the latter is manual and dangerous.

[0005] In addition, the voltage source S1 is generally a power supply with a 380V input and a 2000V output. The power supply is generally large in power, bulky, and inconvenient to use. Moreover, power supplies with an output voltage exceeding 2000V are rare in the market and are expensive. Utility Model Content

[0006] (1) Technical problems solved

[0007] In view of the deficiencies in the prior art, the present invention provides an inductor turn-to-turn short-circuit test power supply circuit, which can solve the above technical problems.

[0008] (2) Technical solution

[0009] In order to solve the above technical problems, the utility model provides the following technical solutions: an inductor inter-turn short-circuit test power supply circuit, comprising a single pulse generator and a driving board electrically connected to the single pulse generator, characterized in that it also includes: a voltage source, whose negative terminal is grounded; a first capacitor, one end of which is connected to the positive terminal of the voltage source, and the other end of which is connected to the negative terminal of the voltage source; a boost inductor, one end of which is connected to the positive terminal of the voltage source; a transistor, a first pin of which is connected to the output end of the driving board, a second pin of which is connected to the other end of the boost inductor, and a third pin of which is grounded; a diode, a positive terminal of which is connected to the other end of the boost inductor; a second capacitor, one end of which is connected to the negative terminal of the diode, and the other end of which is grounded; a switch, one end of which is connected to the negative terminal of the diode, and the other end is used to be connected to one end of the test inductor, wherein the other end of the test inductor is used to be grounded.

[0010] Furthermore, the transistor is an NMOS tube, wherein the first pin of the transistor is the gate of the NMOS tube, the second pin of the transistor is the source of the NMOS tube, and the third pin of the transistor is the drain of the NMOS tube.

[0011] (3) Beneficial effects

[0012] Compared with the prior art, the present invention provides an inductor turn-to-turn short-circuit test power supply circuit, which has the following beneficial effects: the inductor turn-to-turn short-circuit test power supply circuit disclosed by the present invention includes: a single pulse generator; a driving board electrically connected to the single pulse generator; a voltage source; a first capacitor, one end of which is connected to the positive terminal of the voltage source, and the other end of which is connected to the negative terminal of the voltage source; a boost inductor, one end of which is connected to the positive terminal of the voltage source; a transistor, a first pin of which is connected to the output end of the driving board, and a second pin of which is connected to the other end of the boost inductor; a diode, a positive terminal of which is connected to the other end of the boost inductor; a second capacitor, one end of which is connected to the negative terminal of the diode; a switch, one end of which is connected to the negative terminal of the diode, and the other end is used to be connected to one end of the test inductor, wherein the other end of the test inductor is used to be grounded. Through the above manner, the present invention can realize the automatic switching of the test power supply, avoid the operational danger caused by manual switching, and do not need to add a switching device, effectively reduce the design cost, and the volume is relatively small. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 Schematic diagram of the structure of a first embodiment of a conventional inductance testing circuit;

[0014] Figure 2 Schematic diagram of the structure of a second embodiment of a conventional inductance testing circuit;

[0015] Figure 3 This is a schematic diagram of the structure of the inductor turn-to-turn short-circuit test power supply circuit of the utility model. DETAILED DESCRIPTION

[0016] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0017] like Figure 3 As shown, the utility model provides an inductor inter-turn short-circuit test power supply circuit, including a single pulse generator 10, a driving board 11 electrically connected to the single pulse generator 10, a voltage source S1, a first capacitor C1, a boost inductor L1, a transistor Q1, a diode D1, a second capacitor C2 and a switch K1.

[0018] The negative terminal of the voltage source S1 is connected to the ground GND.

[0019] One end of the first capacitor C1 is connected to the positive terminal of the voltage source S1 , and the other end of the first capacitor C1 is connected to the negative terminal of the voltage source S1 .

[0020] One end of the boost inductor L1 is connected to the positive terminal of the voltage source S1 .

[0021] A first pin of the transistor Q1 is connected to the output end of the driving board 11 , a second pin of the transistor Q1 is connected to the other end of the boost inductor L1 , and a third pin of the transistor Q1 is grounded CND.

[0022] In this embodiment, the driver board 11 is a boost resistor, that is, when the single pulse generator 10 generates a pulse signal, the boost resistor can increase the voltage of the first pin of the transistor Q1, so that the transistor Q1 is turned on. Preferably, the single pulse generator 10 is a manual single pulse generator 10.

[0023] The anode terminal of the diode D1 is connected to the other end of the boost inductor L1 .

[0024] One end of the second capacitor C2 is connected to the cathode end of the diode D1 , and the other end of the second capacitor C2 is grounded GND.

[0025] One end of the switch K1 is connected to the cathode terminal of the diode D1, and the other end of the switch K1 is connected to one end of the test inductor L2, wherein the other end of the test inductor L2 is grounded GND. It should be understood that the test inductor L3 is the inductor to be tested.

[0026] In this embodiment, the transistor Q1 is an NMOS transistor, wherein the first pin of the transistor Q1 is the gate of the NMOS transistor, the second pin of the transistor Q1 is the source of the NMOS transistor, and the third pin of the transistor Q1 is the drain of the NMOS transistor.

[0027] The specific principles are as follows:

[0028] Start the voltage source S1 to charge the first capacitor C1. When the current of the voltage source S1 is zero, which means that the capacitance of the first capacitor C1 and the second capacitor C2 reaches the output voltage of the voltage source S1, the single pulse generator 10 outputs a short pulse to the driver board 11 to drive the transistor Q1 to turn on for a period of time. At this time, since the positive terminal of the diode D1 is pulled low (that is, the driving transistor Q1 is turned on so that the positive terminal of the diode D1 is grounded GND), and the negative terminal of the diode D1 has a voltage, the diode D1 is in the cut-off state;

[0029] The current of the boost inductor L1 increases linearly. When the falling edge of the pulse arrives, since the inductor current cannot change suddenly, a high voltage (that is, greater than the voltage of the second capacitor C2) is induced on the right side of the boost inductor L1, causing the diode D1 to turn on, and the current of the boost inductor L1 flows to the second capacitor C2 to charge. The diode D1 is not turned off until the current of the boost inductor L1 is 0. At this time, the voltage rise of the second capacitor C2 can be seen through the detection device. Then the second pulse, the third pulse,..., the nth pulse, and so on are continuously input. Each pulse will store the electrical energy of the voltage source S1 in the boost inductor L1. The moment the transistor Q1 is disconnected, this energy will be forcibly pushed into the second capacitor C2 to complete the charging.

[0030] In summary, the voltage source S1 of this embodiment is a low-voltage power supply with a 110V output. The first capacitor C1 is a low-voltage energy storage capacitor. When the voltage of the second capacitor C2 is higher than the voltage on the low-voltage side, the diode D1 is cut off and there is no need to add a switching device. The transistor Q1 and the diode D1 work in the form of a single pulse each time, do not require heat dissipation, and the overall volume is small.

[0031] It should be noted that the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus that includes a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprises a ..." does not preclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

[0032] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An inductor turn-to-turn short-circuit test power supply circuit, comprising a single pulse generator and a drive board electrically connected to the single pulse generator, characterized in that: Also includes: A voltage source with its negative terminal grounded; a first capacitor, one end of which is connected to the positive terminal of the voltage source, and the other end of which is connected to the negative terminal of the voltage source; a boost inductor, one end of which is connected to the positive terminal of the voltage source; a transistor, a first pin of which is connected to the output terminal of the driving board, a second pin of which is connected to the other end of the boost inductor, and a third pin of which is grounded; a diode, a positive terminal of which is connected to the other end of the boost inductor; a second capacitor, one end of which is connected to the negative terminal of the diode and the other end of which is grounded; A switch has one end connected to the negative terminal of the diode and the other end connected to one end of a test inductor, wherein the other end of the test inductor is grounded.

2. The inductor turn-to-turn short circuit test power supply circuit according to claim 1, characterized in that: The transistor is an NMOS tube, wherein the first pin of the transistor is the gate of the NMOS tube, the second pin of the transistor is the source of the NMOS tube, and the third pin of the transistor is the drain of the NMOS tube.