Test fixture for memory processing and production
By designing test fixtures for memory processing and production, the problem of unqualified performance in memory chip mass production is solved, efficient inspection and low-cost production are achieved, and the stability and reliability of the chip are ensured.
Patent Information
- Application Number
- CN202421715311.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-19
- Publication Date
- 2025-08-15
- Estimated Expiration
- 2034-07-19
AI Technical Summary
In the prior art, it is difficult to efficiently screen products with unqualified performance during mass production of memory chips, resulting in low detection efficiency and high cost.
A test fixture for memory processing and production is designed, and the clamping of multiple memory chips is achieved through fixing devices and connection devices, including multiple test points and pins, which can be connected to the memory chip for testing, ensuring stability and reliability.
It improves the detection efficiency of memory chips, reduces the risk of chip damage, reduces production costs, and ensures the stability and reliability of the chip.
Smart Images
Figure CN223230125U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of memory testing equipment, in particular to a testing fixture for memory processing and production. Background Art
[0002] Memory chips are an important branch of semiconductors and are usually used to store information. During the mass production process of memory chips, products with substandard performance may appear. Since the memory chips with substandard performance are packaged and then tested, it is not easy to find the memory fault problem. Therefore, after the memory chips are manufactured, they are usually tested individually to screen out the memory chips with substandard performance. This testing method is inefficient, so we have launched a test fixture for memory processing and production. Utility Model Content
[0003] The main purpose of the present invention is to provide a test fixture for memory processing and production, which can effectively solve the problems in the background technology.
[0004] In order to achieve the above purpose, the technical solution adopted by the utility model is:
[0005] A test fixture for memory processing and production, comprising a base plate, wherein the upper end of the base plate is fixedly connected to a test board, the upper left and upper right portions of the test board are both provided with No. 1 grooves, the rear groove walls of the two No. 1 grooves are both provided with rear grooves, a fixing rod is commonly fixedly connected between the left groove wall and the right groove wall of the two rear grooves, the outer surfaces of the two fixing rods are both sleeved with fixing devices, circuit boards are arranged in the two No. 1 grooves, the upper middle portions of the two circuit boards are both fixedly connected to two test core boards, the front left and front right portions of the test board are both provided with front grooves, a buckle block is commonly fixedly connected between the left groove wall and the right groove wall of the two front grooves, the lower ends of the two buckle blocks are provided with a plurality of No. 2 grooves, and the two No. 1 grooves are both fixedly connected with a connecting device.
[0006] Preferably, the connecting device includes a connecting frame plate, the upper left and upper right parts of the connecting frame plate are provided with slots, the four corners of the upper end of the connecting frame plate are provided with mounting holes, and the connecting frame plate is fixedly connected in groove No. 1.
[0007] Preferably, the fixing device includes a cover plate, a through hole is opened at the rear right end of the cover plate, a clamping plate is fixedly connected to the middle part of the front end of the cover plate, a clamping plate is fixedly connected to the front part of the lower end of the cover plate, the lower left and lower right parts of the cover plate are fixedly connected to compression blocks, the lower ends of the two compression blocks are fixedly connected to protective pads, the front end of the clamping plate is fixedly connected to a pull strip, and the cover plate is movably connected above the test plate.
[0008] Preferably, the position and size of the two card slots correspond to the position and size of the protective pad.
[0009] Preferably, the two card slots have the same structure and are symmetrically distributed.
[0010] Preferably, the two card slots are located directly above the two test core boards on the left side.
[0011] Preferably, the position and size of the through hole are matched with the position and size of the fixing rod.
[0012] Preferably, the position and size of the clamping plate are adapted to the position and size of the buckle block.
[0013] Preferably, the four test core boards are electrically connected to the two circuit boards.
[0014] Preferably, the pull strip is located right in front of the card plate.
[0015] Preferably, the bottom plate has the same size as the test plate but a different thickness.
[0016] Preferably, the thickness of the bottom plate is smaller than the thickness of the test plate.
[0017] Compared with the prior art, the present invention has the following beneficial effects:
[0018] 1. By setting up a fixing device, multiple memory chips are placed one by one in the card slots. Holding the pull bar and closing the cover, the position and size of the two card slots correspond to the position and size of the protective pad, so that the pressing block is pressed against the upper part of the inner wall of the card slot, and the protective pad is tightly attached to the surface of the memory chip, thus achieving the clamping of multiple memory chips. The structural design of this device includes multiple test points and pins, which can be connected to the memory chip for testing, effectively detecting the quality and reliability of the memory chip, thereby ensuring the stability of the memory chip;
[0019] 2. Protective pads are set at the lower ends of the two pressing blocks. Since the position and size of the two card slots correspond to the position and size of the protective pads, the pressing blocks are pressed against the upper part of the inner wall of the card slot, and the protective pads are tightly attached to the surface of the memory chip, reducing the risk of damage to the memory chip. Multiple pieces can be inspected at one time, thereby greatly improving production efficiency and saving costs. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] Figure 1 This is a schematic diagram of the overall structure of a test fixture for memory processing and production according to the present invention;
[0021] Figure 2 This is a structural schematic diagram of a test board of a test fixture for memory processing and production according to the present invention;
[0022] Figure 3 This is a schematic diagram of the combined connection structure of a base plate, a test plate, a fixing device and a connecting device of a test fixture for memory processing and production according to the utility model;
[0023] Figure 4 This is a schematic diagram of the overall structure of a connection device for a test fixture used in memory processing and production according to the present invention;
[0024] Figure 5 The utility model is a schematic diagram of the overall structure of a fixing device of a test fixture for memory processing and production.
[0025] In the figure: 1. Base plate; 2. Test board; 3. Fixing device; 4. Connecting device; 5. No. 1 groove; 6. Rear groove; 7. Fixing rod; 8. Test core board; 9. Circuit board; 10. Front groove; 11. Buckle block; 12. No. 2 groove; 41. Connecting frame plate; 42. Mounting hole; 43. Card slot; 31. Cover plate; 32. Through hole; 33. Pull strip; 34. Card plate; 35. Compression block; 36. Protective pad. DETAILED DESCRIPTION
[0026] In order to make the technical means, creative features, objectives and effects achieved by the present invention easier to understand, the present invention is further described below in conjunction with specific implementation methods.
[0027] In the description of this utility model, it should be noted that the terms "upper," "lower," "inner," "outer," "front end," "rear end," "both ends," "one end," "the other end," and the like, indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of this utility model and simplify the description. They are not intended to indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0028] In the description of this utility model, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "provided with," "connected," etc. should be understood in a broad sense. For example, "connected" can mean a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be internal communication between two components. Those skilled in the art will be able to understand the specific meanings of the above terms in this utility model based on the specific circumstances.
[0029] See also Figure 1-5 , the utility model provides a technical solution:
[0030] A test fixture for memory processing and production includes a base plate 1, a test board 2 is fixedly connected to the upper end of the base plate 1, a No. 1 groove 5 is opened at the upper left and upper right parts of the test board 2, the rear groove walls of the two No. 1 grooves 5 are opened with rear grooves 6, a fixing rod 7 is fixedly connected between the left groove wall and the right groove wall of the two rear grooves 6, the outer surfaces of the two fixing rods 7 are sleeved with fixing devices 3, a circuit board 9 is arranged in the two No. 1 grooves 5, two test core boards 8 are fixedly connected to the middle parts of the upper ends of the two circuit boards 9, a front groove 10 is opened at the front left and front right parts of the test board 2, a buckle block 11 is fixedly connected between the left groove wall and the right groove wall of the two front grooves 10, a plurality of No. 2 grooves 12 are opened at the lower ends of the two buckle blocks 11, and a connecting device 4 is fixedly connected to the two No. 1 grooves 5.
[0031] In this embodiment, the connecting device 4 includes a connecting frame plate 41, and a card slot 43 is opened on the upper left and upper right parts of the connecting frame plate 41, and mounting holes 42 are opened on the four corners of the upper end of the connecting frame plate 41. The connecting frame plate 41 is fixedly connected to the No. 1 groove 5; the position and size of the two card slots 43 correspond to the position and size of the protective pad 36; the two card slots 43 have the same structure and are symmetrically distributed on the left and right; the two card slots 43 are located directly above the two test core boards 8 on the left; by making the position and size of the two card slots 43 correspond to the position and size of the protective pad 36, the pressing block 35 is pressed and fixed on the upper inner wall of the card slot 43, and the protective pad 36 is tightly attached to the surface of the memory chip. The protective pad 36 is made of flexible rubber material and has a certain resistance to prevent the memory chip from position displacement, while reducing the risk of damage to the memory chip and detecting multiple pieces at one time.
[0032] In this embodiment, the fixing device 3 includes a cover plate 31, a through hole 32 is opened at the rear right end of the cover plate 31, a card plate 34 is fixedly connected to the middle of the front end of the cover plate 31, and the front end of the lower end of the cover plate 31 is fixedly connected to the card plate 34. The left and right lower ends of the cover plate 31 are fixedly connected to a pressing block 35, and the lower ends of the two pressing blocks 35 are fixedly connected to a protective pad 36. The front end of the card plate 34 is fixedly connected to a pull bar 33, and the cover plate 31 is movably connected to the top of the test plate 2 ; The position and size of the through hole 32 are adapted to the position and size of the fixing rod 7; the position and size of the card plate 34 are adapted to the position and size of the buckle block 11; the pull bar 33 is located directly in front of the card plate 34; by adapting the position and size of the card plate 34 to the position and size of the buckle block 11, multiple memory chips are placed one by one in the card slot 43, and the pull bar 33 is held in the hand. The cover plate 31 moves on the outer surface of the fixing rod 7, and the cover plate 31 is covered so that the cover plate 31 can be fixed to the surface of the buckle block 11.
[0033] In this embodiment, the four test core boards 8 are electrically connected to the two circuit boards 9; the size of the base board 1 is the same as the size of the test board 2 but the thickness is different; the thickness of the base board 1 is smaller than the thickness of the test board 2; the four test core boards 8 are electrically connected to the two circuit boards 9, and contain multiple test points and pins, which can be connected to the memory chip and tested, thereby effectively detecting the quality and reliability of the memory chip.
[0034] It should be noted that the utility model is a test fixture for memory processing and production. During use, multiple memory chips are placed one by one in the card slot 43, the pull bar 33 is held, the cover 31 is movable on the outer surface of the fixing rod 7, and the cover 31 is covered. Since the position and size of the two card slots 43 correspond to the position and size of the protective pad 36, the pressing block 35 is pressed and fixed on the upper part of the inner wall of the card slot 43, and the protective pad 36 is tightly attached to the surface of the memory chip, thereby clamping multiple memory chips. The structural design of this device includes multiple test points and pins, which can be connected to the memory chip and tested, effectively detecting the quality and reliability of the memory chip, thereby ensuring the stability of the memory chip. Compared with the traditional clamping and welding method, it is simpler and also reduces the risk of damage to the memory chip. Multiple pieces can be tested at one time, thereby greatly improving production efficiency and saving costs.
[0035] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.
Claims
1. A test fixture for memory processing and production, comprising a base plate (1), characterized in that: The upper end of the bottom plate (1) is fixedly connected to a test board (2), the upper left and upper right portions of the test board (2) are both provided with a No. 1 groove (5), the rear groove walls of the two No. 1 grooves (5) are both provided with a rear groove (6), a fixing rod (7) is fixedly connected between the left groove wall and the right groove wall of the two rear grooves (6), the outer surfaces of the two fixing rods (7) are sleeved with a fixing device (3), a circuit board (9) is provided in the two No. 1 grooves (5), the middle portions of the upper ends of the two circuit boards (9) are both fixedly connected to two test core boards (8), the front left and front right portions of the test board (2) are both provided with a front groove (10), a buckle block (11) is fixedly connected between the left groove wall and the right groove wall of the two front grooves (10), the lower ends of the two buckle blocks (11) are both provided with a plurality of No. 2 grooves (12), and the two No. 1 grooves (5) are both fixedly connected with a connecting device (4).
2. The test fixture for memory production according to claim 1, characterized in that: The connecting device (4) comprises a connecting frame plate (41), the upper left portion and the upper right portion of the connecting frame plate (41) are both provided with a card slot (43), the upper four corners of the connecting frame plate (41) are both provided with a mounting hole (42), and the connecting frame plate (41) is fixedly connected in the No. 1 groove (5).
3. The test fixture for memory production according to claim 1, wherein: The fixing device (3) comprises a cover plate (31), a through hole (32) is formed at the rear right end of the cover plate (31), a clamping plate (34) is fixedly connected to the middle of the front end of the cover plate (31), a clamping plate (34) is fixedly connected to the front end of the lower end of the cover plate (31), a pressing block (35) is fixedly connected to the left and right lower ends of the cover plate (31), a protective pad (36) is fixedly connected to the lower ends of the two pressing blocks (35), a pull bar (33) is fixedly connected to the front end of the clamping plate (34), and the cover plate (31) is movably connected to the upper part of the test plate (2).
4. The test fixture for memory production according to claim 2, wherein: The position and size of the two clamping slots (43) correspond to the position and size of the protective pad (36).
5. The test fixture for memory production according to claim 2, characterized in that: The two clamping slots (43) have the same structure and are symmetrically distributed.
6. The test fixture for memory production according to claim 2, characterized in that: The two card slots (43) are both located directly above the two test core plates (8) on the left side.
7. The test fixture for memory production according to claim 3, characterized in that: The position and size of the insertion hole (32) are matched with the position and size of the fixing rod (7).
8. The test fixture for memory production according to claim 3, characterized in that: The position and size of the clamping plate (34) are adapted to the position and size of the buckle block (11).
9. The test fixture for memory production according to claim 1, characterized in that: The four test core boards (8) are all electrically connected to the two circuit boards (9).
10. The test fixture for memory production according to claim 3, characterized in that: The pull strip (33) is located right in front of the clamping plate (34).
11. The test fixture for memory production according to claim 1, characterized in that: The bottom plate (1) has the same size as the test plate (2) but has a different thickness.
12. The test fixture for memory production according to claim 1, characterized in that: The thickness of the bottom plate (1) is smaller than the thickness of the test plate (2).