Lamp holder of lamp testing device and lamp testing device

Abstract

The utility model relates to a lamp holder of a lamp testing device and the lamp testing device, and the lamp holder of the lamp testing device comprises a mounting seat; the first power connection terminal is arranged on the mounting seat, and is configured to fix a test lamp and abut against a first electrode of the test lamp; the second power connection terminal is arranged on the mounting seat through a conductive elastic element; and the second power connection terminal is configured to abut against a second electrode of the test lamp fixed on the mounting seat by the first power connection terminal under the elastic force of the conductive elastic element. According to the embodiment of the invention, the stable installation of the test lamp, the safe and reliable electrical connection, and the universality and adaptability of equipment are realized. Meanwhile, the special connection mode further improves the stability and safety of the test equipment, and brings more convenient and efficient use experience to users.

Description

Technical Field

[0001] The present invention relates to the field of electrical testing equipment, and in particular to a lamp holder of a lamp testing device and a lamp testing device. Background Art

[0002] Lamp aging testing is a critical step in the lamp production process. Its purpose is to simulate the aging process of lamps in actual use environments, thereby evaluating their durability and reliability. However, traditional lamp testing equipment has several challenges during the testing process, such as low test efficiency and complex operation. Therefore, a solution is needed to address these issues. Utility Model Content

[0003] In order to solve the problems existing in the prior art, this specification provides a lamp holder of a lamp testing device and a lamp testing device.

[0004] According to a first aspect of the present specification, a lamp holder for a lamp testing device is provided, the lamp holder comprising:

[0005] Mounting seat;

[0006] a first power terminal, which is disposed on the mounting base and is configured to fix the test lamp and abut against a first electrode of the test lamp;

[0007] A second power terminal is provided on the mounting base via a conductive elastic element; and

[0008] The second power terminal is configured to abut against a second electrode of the test lamp fixed to the mounting base by the first power terminal under the elastic force of the conductive elastic element.

[0009] In one embodiment of the present specification, the conductive elastic element is a compression spring, one end of the compression spring is fixedly connected to the mounting seat, and the other end is provided with the second power terminal.

[0010] In one embodiment of the present specification, the first power terminal includes a base for fixedly connecting to the mounting base and at least three conductive springs arranged on the base, wherein the at least three conductive springs are distributed in a ring-shaped manner at intervals and are configured to clamp the test lamp using elastic force and abut against the first electrode of the test lamp; and at least three conductive springs surround the conductive elastic element and the second power terminal.

[0011] In one embodiment of the present specification, the conductive elastic sheet includes a first portion fixed to the base and extending upward, a second portion formed by inward extension of the first portion, and a third portion formed by outward expansion of the second portion;

[0012] After the test lamp is installed, the first electrode of the test lamp abuts against the transition connection portion between the second part and the third part.

[0013] In one embodiment of the present specification, the first power terminal includes five conductive springs, and the five conductive springs are distributed in a ring array around the second power terminal.

[0014] In one embodiment of the present specification, the base is an annular disk surrounding the conductive elastic element, and an insulating ring is provided between the base and the conductive elastic element.

[0015] In one embodiment of the present specification, the insulating ring is an elastic insulating ring.

[0016] In one embodiment of the present specification, the insulating ring is made of polyetheretherketone.

[0017] In one embodiment of the present specification, the mounting base has a shell surrounding the at least three conductive springs.

[0018] According to a second aspect of the present specification, there is also provided a lamp testing device for use in an aging test of a lamp, the lamp testing device comprising a power supply, a test box, and the lamp holder;

[0019] The lamp holder is disposed on the test box and is used to mount a test lamp. The power supply is conductively connected to the test box and is used to provide power to the test lamp. The test box is used to support the lamp holder and protect and accommodate connection lines.

[0020] A control host is provided in the test box, and the control host is in communication connection with the lamp holder for controlling the test state of the test lamp.

[0021] One beneficial effect of this specification is that, by utilizing specific first and second electrical terminals to connect a test lamp to a circuit, the embodiments herein simultaneously secure the test lamp via the first terminal and buffer it via the second terminal. This ensures stable installation of the test lamp, secure and reliable electrical connections, and enhances the versatility and adaptability of the device. Furthermore, this unique connection method further enhances the stability and safety of the test equipment, providing users with a more convenient and efficient user experience.

[0022] Other features and advantages of the present specification will become apparent from the following detailed description of exemplary embodiments of the present specification with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the specification and, together with the description, serve to explain the principles of the specification.

[0024] Figure 1 This is a schematic diagram of the overall structure of a lamp holder of a lamp testing device provided in one embodiment of this specification;

[0025] Figure 2 is a side view of a lamp holder of a lamp testing device provided in one embodiment of this specification;

[0026] Figure 3 This specification provides a lamp holder for a lamp testing device. Figure 2 Cross-section view of the AA plane.

[0027] Figures 1 to 3 The one-to-one correspondence between the component names and the reference numerals is as follows:

[0028] 1. Mounting seat; 2. First power terminal; 21. Base; 22. Conductive spring; 221. First part; 222. Second part; 223. Third part; 224. Transition connection part; 3. Second power terminal; 4. Conductive elastic element; 5. Housing. DETAILED DESCRIPTION

[0029] Various exemplary embodiments of the present specification will now be described in detail with reference to the accompanying drawings. It should be noted that unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of this specification.

[0030] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present disclosure, its application, or uses.

[0031] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered part of the specification.

[0032] It should be noted that like reference numerals and letters refer to like items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0033] The specific implementation of this specification will be described below with reference to the accompanying drawings.

[0034] In this document, “upper”, “lower”, “front”, “back”, “left”, “right”, etc. are only used to indicate the relative position relationship between related parts, rather than to limit the absolute positions of these related parts.

[0035] In this article, "first", "second", etc. are only used to distinguish each other, and do not indicate the importance and order, or the prerequisite for each other's existence.

[0036] In this document, “equal”, “same”, etc. are not strictly limited in a mathematical and / or geometric sense, but also include errors that can be understood by those skilled in the art and are allowed in manufacturing or use.

[0037] Aging testing of LED lamps is an important means of evaluating the durability and reliability of LED lamps. However, existing aging testing devices for LED lamps usually require the test lamps and lamp holders to be fixedly connected using threads. During the testing process, testers need to install or remove a large number of test lamps from the lamp holders. Therefore, it takes a lot of time to fix and remove each test lamp using threads, resulting in low testing efficiency.

[0038] like Figures 1 to 3 As shown, Figure 1 This is a schematic diagram of the overall structure of a lamp holder of a lamp testing device provided in an embodiment of this specification. Figure 2 1 is a side view of a lamp holder of a lamp testing device provided in one embodiment of this specification. Figure 3 This specification provides a lamp holder for a lamp testing device. Figure 2 In order to solve the above problems, the first aspect of this specification provides a lamp holder of a lamp testing device, comprising:

[0039] A mounting base 1; a first electrical terminal 2, which is arranged on the mounting base 1 and is configured to fix a test lamp and abut against a first electrode of the test lamp; a second electrical terminal 3, which is arranged on the mounting base 1 via a conductive elastic element 4; and the second electrical terminal 3 is configured to abut against a second electrode of the test lamp fixed to the mounting base 1 by the first electrical terminal 2 under the elastic force of the conductive elastic element 4.

[0040] Specifically, mounting base 1 is used to connect and secure a test lamp. To facilitate securing the test lamp and connecting it to a circuit, mounting base 1 is provided with a first power terminal 2 and a second power terminal 3. The first power terminal 2 has a certain degree of elasticity, which can secure the test lamp within mounting base 1 after the test lamp is inserted. After the test lamp is inserted into the lamp holder, if the tester does not promptly control the insertion force, the bottom of the test lamp will impact the bottom of mounting base 1, causing damage to the test lamp. Therefore, the second power terminal 3 provided at the bottom of mounting base 1 not only has a conductive function but also a buffering function. When the second power terminal 3 contacts the test lamp, due to the test lamp's certain speed, it will squeeze the conductive elastic element 4, causing the conductive elastic element 4 to generate an elastic force toward the test lamp, inhibiting the movement of the test lamp, and thus providing a buffering effect after the test lamp is inserted into the lamp holder.

[0041] In the embodiments of this specification, the first and second power terminals 2 and 3 are connected to the two electrodes of the test lamp, respectively, energizing the test lamp for testing. Furthermore, the first power terminals 2 possess a certain degree of elasticity, replacing the traditional threaded connection method, allowing the bulb to be directly inserted into the lamp holder and securely fixed therein, improving the efficiency of installing and removing the test lamp, thereby improving the efficiency of testing the test lamp. Furthermore, the second power terminals 3 act as a buffer for the test lamp inserted into the lamp holder, preventing damage to the bulb.

[0042] Furthermore, in order to resist the pressure of the test lamp and avoid damage to the test lamp, the conductive elastic element 4 is a compression spring, one end of the compression spring is fixedly connected to the mounting base 1, and the other end is provided with a second power terminal 3.

[0043] Specifically, such as Figure 3 As shown, the conductive elastic element 4 is a compression spring that generates elastic force under pressure. The compression spring has a conductive property. The compression spring and the second power terminal 3 are arranged at the bottom of the mounting base 1. One end of the compression spring is fixed to the bottom of the mounting base 1, and the other end is fixed to the second power terminal 3.

[0044] In the embodiment of this specification, the second power terminal 3 is fixed to the bottom of the mounting base 1 by a compression spring, and the compression spring also has a conductive function, so that the second conductive terminal can achieve conductivity while playing a buffering role, thereby protecting the test lamp.

[0045] In order to make the second power terminal 3 more flexible, in another embodiment of the present specification, the portion where the second power terminal 3 is connected to the compression spring is a spherical structure, and the spherical structure is spherically connected to the insulating ring, so that the direction of the second power terminal 3 can be adjusted.

[0046] To further enhance the ability of the first power terminal 2 to secure the test lamp, the first power terminal 2 includes a base 21 for fixedly connecting to the mounting base 1 and at least three conductive springs 22 disposed on the base 21. The at least three conductive springs 22 are arranged in a ring-shaped pattern and are configured to clamp the test lamp using elastic force and abut against the first electrode of the test lamp. Furthermore, the at least three conductive springs 22 surround the conductive elastic element 4 and the second power terminal 3.

[0047] Specifically, the first power terminal 2 is composed of a base 21 and a conductive spring 22. In order to enhance the fixing ability, there are at least three conductive springs 22. The conductive springs 22 and the base 21 can be welded or integrally formed. The elastic conductive sheets are evenly distributed on the periphery of the base 21 at equal intervals and are annular. At least three conductive springs 22 cooperate with each other to clamp the test lamp. The second power terminal 3 and the pressure spring are located at the center of the base 21. Therefore, at least three conductive springs 22 are arranged around the conductive elastic element 4 and the second power terminal 3.

[0048] In the embodiments of this specification, at least three conductive springs 22 surround the conductive elastic element 4 and the second power terminal 3. This allows the test lamp to initially contact the conductive springs 22 of the first power terminal 2 when inserted. The elastic force of the conductive springs 22 clamps the test lamp, thereby initially securing the test lamp. As the test lamp is further inserted, the second power terminal 3, under the action of the conductive elastic element 4, abuts against the second electrode of the test lamp, completing the circuit. This design not only ensures a secure installation of the test lamp but also improves installation convenience and efficiency.

[0049] At the same time, in order to further ensure the stability and safety of the test lamp, the conductive spring clip 22 includes a first part 221 fixed to the base 21 and extending upward, a second part 222 formed by the inward extension of the first part 221, and a third part 223 formed by the outward expansion of the second part 222; after the test lamp is installed, the first electrode of the test lamp abuts against the transition connection part 224 between the second part 222 and the third part 223.

[0050] Specifically, the second electrical terminal 3 is disposed within a central recess of the mounting base 1. The base 21 of the first electrical terminal 2 surrounds the first electrical terminal 2 and is disposed at the top of the mounting base 1. The first portion 221 extending upward from the base 21 represents the conductive spring 22 extending axially away from the mounting base 1. The inward extension of the first portion 221 refers to the extension of the first portion 221 toward the central axis of the mounting base 1. The outward expansion of the second portion 222 to form the third portion 223 refers to the extension of the second portion 222 away from the central axis of the mounting base 1. Thus, the junction of the second portion 222 and the third portion 223 forms an inwardly protruding transition portion 224. When the test lamp is installed, the first electrode of the test lamp abuts the transition portion 224 of the first electrical terminal 2, powering the test lamp.

[0051] The embodiments of this specification utilize a specific conductive spring 22 design to ensure that the test lamp, when inserted into the lamp holder, more accurately contacts the first electrical terminal 2, ensuring a good electrical connection. This design not only improves the stability of the test lamp but also enhances the safety and reliability of the electrical connection.

[0052] In addition, in addition to the above-mentioned inwardly protruding transition connection portion 224 formed by bending the conductive spring sheet 22, in another embodiment of the present solution, a hemispherical inwardly protruding component can be provided on the conductive spring sheet 22, and multiple spring sheets can cooperate with each other to achieve the effect of clamping the light bulb.

[0053] The embodiment of this specification also achieves a secure installation of the test lamp by providing a hemispherical, inwardly protruding feature on the conductive spring 22. This hemispherical protrusion allows the conductive spring 22 to more evenly distribute pressure when contacting the first electrode of the test lamp, preventing damage to the test lamp caused by excessive pressure at a single point. This design also increases the contact area between the conductive spring 22 and the test lamp, improving conductivity and further ensuring test accuracy and stability.

[0054] Furthermore, in order to make the test lamp bear force uniformly, in one embodiment of the present specification, the first power terminal 2 includes five conductive springs 22 , and the five conductive springs 22 are distributed in a ring array around the second power terminal 3 .

[0055] Specifically, the design of five conductive springs 22 further enhances the test lamp's securement and the stability of the electrical connection. These five conductive springs 22 are evenly distributed around the second power terminal 3, forming a circular array. This ensures uniform force is applied to the test lamp during insertion, preventing damage caused by excessive pressure at a single point. This design also ensures closer contact between the test lamp and the first power terminal 2, improving the reliability and stability of the electrical connection.

[0056] Furthermore, the circular array of five conductive springs 22 accommodates test lamps of varying shapes and sizes. Whether the bulb is slightly larger or smaller in diameter, this design ensures effective contact with the electrical terminals, ensuring smooth testing. This design not only improves test accuracy and stability, but also enhances the versatility and adaptability of the test equipment.

[0057] In other embodiments of the present specification, the number of the conductive spring clips 22 can also be four, six, etc., and the number of the conductive spring clips 22 can be determined according to actual needs. However, in order to ensure that the test lamp can be evenly stressed, the conductive spring clips 22 need to be evenly spaced around the second power terminal 3.

[0058] Furthermore, the base 21 is an annular disk surrounding the conductive elastic element 4 , and an insulating ring is provided between the base 21 and the conductive elastic element 4 .

[0059] Specifically, the insulating ring is designed to prevent accidental electrical connection between the first and second electrical terminals 2, 3 during use of the test lamp, thereby ensuring safe circuit operation. The insulating ring is typically made of a material with excellent insulation and high-temperature resistance, such as rubber. It effectively isolates the first and second electrical terminals 2, 3, preventing current leakage between them. Furthermore, the insulating ring design makes the mounting base 1 more compact, improving the overall performance and reliability of the test equipment.

[0060] In the embodiments of this specification, the insulating ring is fixed to the mounting base 1 together with the base 21 and the conductive elastic element 4 to form an integral structure. During the manufacturing process, the insulating ring can be secured to the base 21 and the conductive elastic element 4 by bonding, snapping, or other methods to ensure the stability and reliability of its position. Furthermore, the size and shape of the insulating ring can be adjusted according to actual needs to accommodate test lamps of different specifications and models. This flexible design enables the test equipment to better meet the needs of different users, improving the equipment's versatility and adaptability.

[0061] In addition, the insulating ring is arranged on the periphery of the second electrical terminal 3 and the compression spring, which can limit the movement range of the second electrical terminal 3 to move along the axial direction of the insulating ring, thereby improving the stability of the second electrical terminal 3.

[0062] The embodiments of this specification utilize a specific design of the conductive springs 22, the placement of the insulating ring, and the annular array arrangement of multiple conductive springs 22 to achieve stable installation of the test lamp, secure and reliable electrical connections, and the versatility and adaptability of the device. These features not only improve the performance and reliability of the test equipment, but also provide users with a more convenient and efficient user experience.

[0063] Furthermore, the insulating ring is an elastic insulating ring, which can play a role of shock absorption and buffering to a certain extent, reducing the mechanical impact of the test lamp on the connecting terminal during the insertion and removal process, and extending the service life of the connecting terminal.

[0064] In a preferred embodiment of the present specification, the insulating ring is made of polyetheretherketone (PEEK), which is a new type of semi-crystalline aromatic plastic engineering plastic with excellent comprehensive performance. Its physical and mechanical properties are excellent, especially its high temperature resistance and good stability.

[0065] This embodiment utilizes polyetheretherketone (PEEK) to manufacture the insulating ring, ensuring not only high-temperature resistance but also stability and reliability in extreme environments. PEEK's high strength, high modulus, and excellent chemical resistance enable the insulating ring to operate stably and for extended periods in complex electrical environments, effectively preventing electrical failures and safety hazards caused by aging and deformation.

[0066] Furthermore, PEEK offers excellent processing properties, allowing the size and shape of the insulating ring to be flexibly adjusted to accommodate test lamps of varying specifications and models. This flexible design allows the test equipment to better meet the needs of diverse users, enhancing its versatility and adaptability.

[0067] Furthermore, in order to improve the safety and stability of the lamp holder, the mounting base 1 has a shell 5 surrounding the at least three conductive springs 22 .

[0068] Specifically, the housing 5 is designed to further protect the conductive spring 22 and the test lamp from external interference or damage during testing. The housing 5 is typically made of a durable, high-temperature-resistant material, such as a plastic alloy, which can effectively withstand high temperatures, pressure, and vibration, ensuring the stability and safety of the test lamp during testing. The design of the housing 5 also takes into account ventilation and heat dissipation requirements, ensuring that the test lamp is not damaged by overheating during extended operation.

[0069] In the embodiments of this specification, by combining the specific design of the conductive spring clips 22, the placement of the insulating ring, the annular array distribution of multiple conductive spring clips 22, and the protection of the housing 5, the test lamp is securely installed, the electrical connection is safe and reliable, and the device is versatile and adaptable. These structures and designs not only improve the performance and reliability of the test equipment, but also provide users with a more convenient and efficient user experience. Whether in the laboratory, production line, or other testing environments, the test lamp holders provided in the embodiments of this specification can meet the various needs of users and provide strong support for testing work.

[0070] In another aspect of the embodiments of this specification, a lamp testing device is also provided, which is used for aging testing of lamps. The lamp testing device includes a power supply, a test box and the lamp holder of the above embodiment; the lamp holder is arranged on the test box, and the lamp holder is used to install the test lamp. The power supply is conductively connected to the test box, and the power supply is used to provide electrical energy to the test lamp. The test box is used to carry the lamp holder and is also used to protect and accommodate connecting lines; a control host is provided in the test box, and the control host is communicatively connected to the lamp holder for controlling the test status of the test lamp.

[0071] Specifically, the lamp test device utilizes a modular design, simplifying and facilitating the connection between the power supply, test box, and lamp holder. Furthermore, the lamp holder utilizes a specific conductive spring 22 design, an insulating ring configuration, and a circular array arrangement of multiple conductive springs 22, significantly enhancing the secure installation of the test lamp, the safety and reliability of the electrical connection, and the versatility and adaptability of the device.

[0072] The test chamber features a robust heat dissipation system, including fans and vents, to protect the test lamps from damage due to overheating during extended operation. Furthermore, the chamber's excellent sealing prevents the test lamps from being affected by dust and moisture, ensuring accurate and stable testing.

[0073] As the core component of the lighting test system, the control unit possesses powerful data processing and control capabilities. It monitors the operating status of the tested lighting in real time and makes adjustments and controls based on the test results. The control unit also features data storage and transmission, allowing test data to be saved locally or transferred to a remote server via the network, facilitating subsequent data analysis and processing.

[0074] In practice, users simply install the test lamp on the lamp holder and connect the power supply to the test box to begin testing. During the test, the control host automatically controls the test according to the preset test parameters and test procedures, without the need for human intervention. After the test is completed, users can view the test results and test data through the control host and perform appropriate analysis and processing as needed.

[0075] In summary, the lamp testing device provided in the embodiments of this specification has the advantages of simple structure, easy operation, and stable and reliable performance. It not only meets the testing requirements of various types of lamps, but also improves test accuracy and stability, providing strong support for lamp production and quality control. Furthermore, the lamp testing device is highly versatile and adaptable, making it suitable for a wide range of testing environments, including laboratories and production lines.

[0076] While the embodiments of the present disclosure have been described above, the foregoing description is intended to be illustrative, non-exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is selected to best explain the principles of the embodiments, their practical applications, or technological improvements in the marketplace, or to enable others skilled in the art to understand the embodiments disclosed herein. The scope of this disclosure is defined by the appended claims.

Claims

1. A lamp holder for a lamp testing device, characterized in that: The lamp holder comprises: Mounting seat (1); a first power terminal (2), the first power terminal (2) being arranged on the mounting seat (1), being configured to fix the test lamp, and being in contact with a first electrode of the test lamp; A second power terminal (3), the second power terminal (3) being arranged on the mounting seat (1) via a conductive elastic element (4); and The second power terminal (3) is configured to abut against the second electrode of the test lamp fixed to the mounting base (1) by the first power terminal (2) under the elastic force of the conductive elastic element (4); the conductive elastic element (4) is a compression spring; the portion where the second power terminal (3) is connected to the compression spring is a spherical structure; the spherical structure is connected to an insulating ring in a spherical manner; and the insulating ring is arranged between the base (21) of the first power terminal and the elastic element (4).

2. The lamp holder according to claim 1, wherein One end of the compression spring is fixedly connected to the mounting seat (1), and the other end is provided with the second power terminal (3).

3. The lamp holder according to claim 1, wherein The first power terminal (2) comprises a base (21) for fixedly connecting to the mounting base (1) and at least three conductive springs (22) arranged on the base (21), wherein the at least three conductive springs (22) are distributed in a ring-shaped manner at intervals and are configured to clamp the test lamp by elastic force and abut against the first electrode of the test lamp; and the at least three conductive springs (22) surround the conductive elastic element (4) and the second power terminal (3).

4. The lamp holder according to claim 3, wherein: The conductive spring (22) comprises a first portion (221) fixed to the base (21) and extending upward, a second portion (222) formed by inward extension of the first portion (221), and a third portion (223) formed by outward expansion of the second portion (222); After the test lamp is installed, the first electrode of the test lamp abuts against the transition connection portion (224) between the second part (222) and the third part (223).

5. The lamp holder according to claim 3, characterized in that The first power terminal (2) comprises five conductive springs (22), and the five conductive springs (22) are distributed in a ring array around the second power terminal (3).

6. The lamp holder according to claim 3, wherein: The base (21) is an annular disk surrounding the conductive elastic element (4), and an insulating ring is provided between the base (21) and the conductive elastic element (4).

7. The lamp holder according to claim 6, wherein: The insulating ring is an elastic insulating ring.

8. The lamp holder according to claim 6, wherein: The insulating ring is made of polyetheretherketone.

9. The lamp holder according to any one of claims 3 to 8, characterized in that: The mounting seat (1) has a shell (5) surrounding the at least three conductive elastic sheets (22).

10. A lamp testing device, used for aging test of lamps, characterized in that: The lamp testing device comprises a power supply, a test box and a lamp holder according to any one of claims 1 to 9; The lamp holder is disposed on the test box and is used to mount a test lamp. The power supply is conductively connected to the test box and is used to provide power to the test lamp. The test box is used to support the lamp holder and protect and accommodate connection lines. A control host is provided in the test box, and the control host is in communication connection with the lamp holder for controlling the test state of the test lamp.

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