Buffer test device for electronic equipment

Abstract

The utility model provides a buffeting test device for electronic equipment, relates to the technical field of buffeting tests, and aims to solve the technical problem that the conventional buffeting test device is easy to damage the electronic equipment in an experiment process. The buffeting test device comprises a base table and a frame structure arranged on the base table, and the frame structure comprises a first supporting structure and a second supporting structure; the first supporting structure is arranged in the frame structure, and the first supporting structure is used for supporting the electronic equipment; the second supporting structure is arranged in the frame structure and located below the first supporting structure, and the second supporting structure is used for rigidly supporting the reference equipment; the first supporting structure comprises at least one flexible vibration reduction structure, and the electronic equipment is flexibly connected to the frame structure through the at least one vibration reduction structure; the distance between the top surface of the reference equipment and the bottom surface of the electronic equipment is smaller than a preset distance. According to the buffeting test device, the electronic equipment is protected from damage of internal elements caused by acceleration response through flexible connection.

Description

Technical Field

[0001] The utility model relates to the technical field of buffeting tests, in particular to a buffeting test device for electronic equipment. Background Art

[0002] A vibration test is a test used to assess the reliability of electronic equipment under low-frequency vibration excitation. As environmental testing requirements gradually increase, most electronic equipment will have built-in vibration reduction devices, which will amplify the acceleration response of the electronic equipment during the vibration test.

[0003] The vibration test device in the related art, after the acceleration response is amplified, is very likely to cause the electronic equipment to collide and cause damage, and this damage cannot be restored. Utility Model Content

[0004] The purpose of the utility model is to provide a vibration test device for electronic equipment, so as to solve the technical problem that the existing vibration test device easily causes damage to the electronic equipment during the experiment.

[0005] In order to achieve the above purpose, the present invention provides the following technical solutions:

[0006] The utility model provides a vibration test device for electronic equipment, comprising a base and a frame structure arranged on the base, wherein the frame structure comprises a first supporting structure and a second supporting structure;

[0007] The first supporting structure is provided inside the frame structure, and the first supporting structure is used to support the electronic device;

[0008] The second supporting structure is arranged inside the frame structure and below the first supporting structure, and the second supporting structure is used to rigidly support the reference device;

[0009] The first supporting structure includes at least one flexible vibration-damping structure, and the electronic device is flexibly connected to the frame structure via the at least one vibration-damping structure;

[0010] The distance between the top surface of the reference device and the bottom surface of the electronic device is smaller than a preset distance.

[0011] According to at least one embodiment of the present invention, one end of the vibration-damping structure is connected to the electronic device, and the other end is connected to the frame structure, and the electronic device is spaced apart from the frame structure.

[0012] According to at least one embodiment of the present invention, the frame structure includes a plurality of support rods, and the number of the vibration-damping structures is plural, and the vibration-damping structures correspond one-to-one to the support rods.

[0013] According to at least one embodiment of the present invention, one end of the vibration-damping structure is detachably connected to the outer peripheral surface of the electronic device, and the other end is detachably connected to the support rod.

[0014] According to at least one embodiment of the present utility model, the number of the support rods is four, the number of the vibration reduction structures is four, and the shape of the electronic device is a cuboid;

[0015] One end of each vibration-damping structure is connected to a corner of the electronic device, and the other end is detachably connected to the support rod.

[0016] According to at least one embodiment of the present invention, at least a portion of the reference device is attached to the frame structure via the second supporting structure.

[0017] According to at least one embodiment of the present invention, when the frame structure includes four support rods, the reference device is in the shape of a cuboid;

[0018] The parts of the reference device close to the four corners are rigidly connected to the four support rods respectively.

[0019] According to at least one embodiment of the present invention, the top surface of the reference device is attached to the bottom surface of the electronic device.

[0020] According to at least one embodiment of the present invention, the vibration test device further includes a gravity sensor, one end of the gravity sensor is connected to the base, and the other end of the gravity sensor is connected to the top surface of the electronic device.

[0021] According to at least one embodiment of the present invention, the vibration test device further includes an excitation device, which is used to generate vibrations on the electronic device and the reference device.

[0022] One or more technical solutions provided in the exemplary embodiments of the present invention can achieve at least one of the following beneficial effects.

[0023] In the vibration test device for electronic devices of the exemplary embodiment of the present invention, a frame structure is provided below the base to support the base, and a first supporting structure and a second supporting structure are provided within the frame structure, wherein the first supporting structure is located above the second supporting structure. The electronic device to be subjected to the vibration test is flexibly connected to the frame structure via at least one vibration-damping structure, and the flexible connection can protect the electronic device from damage to internal components caused by acceleration response. In order to obtain true and reliable experimental data, a reference device is required that is rigidly connected to the frame structure via the second supporting structure. The reference device can be at a certain distance below the electronic device, and the distance allows the reference device to stop at the lower surface of the electronic device when the electronic device vibrates excessively, so that the electronic device does not vibrate excessively and cause damage to internal components. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] The accompanying drawings illustrate exemplary embodiments of the present invention and, together with the description, are used to explain the principles of the present invention. These drawings are included to provide a further understanding of the present invention, and are included in and constitute a part of this specification.

[0025] Figure 1 1 is a schematic structural diagram of a vibration test device for electronic equipment according to an embodiment of the present invention;

[0026] Figure 2 This is an axial acceleration response diagram obtained from a test using a buffeting test device according to an embodiment of the present invention;

[0027] Figure 3 This is an axial acceleration response diagram obtained by finite element simulation of the buffeting test device according to the embodiment of the present invention.

[0028] Figure numerals: 1. support rod; 2. vibration reduction structure; 3. frame structure; 4. electronic equipment; 5. reference equipment; 6. base. DETAILED DESCRIPTION

[0029] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0030] Figure 1 Schematic diagram of the structure of the vibration test device for electronic equipment according to the embodiment of the present invention. Figure 1As shown, the vibration test device provided by the exemplary embodiment of the present invention includes a base 6 and a frame structure 3 arranged on the base 6, the frame structure 3 includes a first supporting structure and a second supporting structure; the first supporting structure is arranged inside the frame structure 3, and the first supporting structure is used to support the electronic device 4; the second supporting structure is arranged inside the frame structure 3 and is located below the first supporting structure, and the second supporting structure is used to rigidly support the reference device 5; the first supporting structure includes at least one flexible vibration damping structure 2, and the electronic device 4 is flexibly connected to the frame structure 3 through at least one vibration damping structure 2.

[0031] In some embodiments, one end of the vibration-damping structure 2 is connected to the electronic device 4 , and the other end is connected to the frame structure 3 , and the electronic device 4 is spaced apart from the frame structure 3 .

[0032] In actual applications, the frame structure 3 includes multiple support rods 1, and the number of vibration-damping structures 2 is multiple, and the vibration-damping structures 2 correspond one-to-one to the support rods 1. The frame structure 3 includes four support rods 1, and the number of vibration-damping structures 2 is also four, that is, the electronic device 4 is connected to the four support rods 1 of the frame structure 3 through four vibration-damping structures 2, and the electronic device 4 does not contact the support rods 1 of the frame structure 3 but is spaced apart to avoid affecting the experimental results of the vibration-damping structure 2. Furthermore, the reference device 5 is rigidly connected to the four support rods 1 through a second supporting structure, and can serve as a reference for the electronic device 4 flexibly connected to the frame structure 3, so as to obtain accurate acceleration response results generated solely by the vibration-damping structure 2, and to evaluate the vibration-damping effect of the vibration-damping structure 2.

[0033] It should be noted that, to achieve the desired vibration acceleration response effect for electronic device 4, the buffeting test apparatus provided in the exemplary embodiment of the present invention also includes an excitation device for generating vibrations in electronic device 4 and reference device 5. The excitation source of the excitation device can be located on base 6 or on frame structure 3, depending on actual needs. The excitation frequency of the excitation source can range from 10 Hz to 500 Hz, with options including 150 Hz, 200 Hz, 300 Hz, and 400 Hz.

[0034] When performing a vibration test, the vibration test apparatus provided by the exemplary embodiment of the present invention utilizes an electronic device 4 flexibly connected to the frame structure 3 via four vibration-damping structures 2. This flexible connection protects the electronic device 4 from damage caused by acceleration responses. Furthermore, the reference device 5 can be positioned a certain distance below the electronic device 4. This distance ensures that the reference device 5 abuts against the lower surface of the electronic device 4 in the event of excessive vibration, preventing damage to internal components caused by excessive vibration.

[0035] In some embodiments, one end of the vibration-damping structure 2 is detachably connected to the outer peripheral surface of the electronic device 4 , and the other end is detachably connected to the support rod 1 .

[0036] The four vibration-damping structures 2 can be detachable from the electronic device 4 and the support rod 1. After the vibration test on the four vibration-damping structures 2 is completed, they can be further replaced with other flexible vibration-damping structures 2 to perform another vibration test, thereby making full use of the vibration test device and having higher versatility.

[0037] In some embodiments, when the frame structure 3 includes four support rods 1 , the reference device 5 is in the shape of a cuboid; portions of the reference device 5 near the four corners are rigidly connected to the four support rods 1 .

[0038] The shape of the reference device 5 is roughly the same as that of the electronic device 4, both being rectangular parallelepiped structures. In this embodiment, the four corners of the rectangular parallelepiped structure of the reference device 5 can be shaped to match the shape of the support rod 1 and fit onto the support rod 1. The reference device 5 is rigidly connected to the support rod 1 via a secondary support structure on the support rod 1, such as bolts or welding.

[0039] Exemplarily, the top surface of the reference device 5 is attached to the bottom surface of the electronic device 4. In actual application, a rubber pad is provided on the top surface of the reference device 5 to cushion the vibration damage of the electronic device 4.

[0040] In another optional embodiment, the distance between the top surface of the reference device 5 and the bottom surface of the electronic device 4 is less than the preset distance. The top surface of the reference device 5 may or may not be provided with a rubber pad, depending on actual needs and is not further limited here.

[0041] The preset distance can be such that the reference device 5 stops contacting the lower surface of the electronic device 4 when the electronic device 4 vibrates excessively, so that the electronic device 4 does not vibrate excessively and cause damage to internal components.

[0042] In some embodiments, the buffeting test apparatus provided by exemplary embodiments of the present invention further includes a gravity sensor, one end of which is connected to the base 6 and the other end to the top surface of the electronic device 4. It is understood that the gravity sensor can be located anywhere on the electronic device 4 and electrically connected to the control device to obtain the mass of the electronic device 4. Based on the weight of the electronic device 4 and the number of vibration-damping structures 2, the pre-compression of the vibration-damping structure 2 in the X, Y, and Z directions can be calculated.

[0043] Figure 2 This is an axial acceleration response diagram obtained by the vibration test device according to the embodiment of the present invention. Figure 2As shown, multiple vibration test curves of the vibration reduction structure 2 of the vibration test device provided by the exemplary embodiment of the present invention are specifically a curve diagram between the axial acceleration response of the vibration reduction structure 2 and the excitation frequency.

[0044] A specific example is given below, in which the vibration test device is verified by ANSYS modeling and simulation after eliminating relevant environmental influences.

[0045] Step A: Obtain the force curve and damping ratio of each axial direction of the vibration reduction structure 2.

[0046] Step B: Evaluate the actual use status of the vibration damping structure 2, modify the stiffness curve, and calculate the torsional stiffness curve. Use a variable stiffness three-phase spring bushing to simplify the nonlinear rubber vibration damper for modal analysis.

[0047] According to the initial placement state of the frame structure 3 of the vibration test device, the pre-compression amount is directly reflected in the stiffness curve. For example, when damping a certain electronic device 4, the pre-compression amount in three directions can be calculated based on the weight of the device and the number of vibration damping structures 2.

[0048] The torsional stiffness can be calculated according to the shape of the vibration damping structure 2. For example, for a cylindrical vibration damping structure 2, the torsional stiffness can be obtained by integration as T=K*r^2.

[0049] Step C: Perform modal analysis on the supporting components of vibration damping structure 2 to analyze the environmental adaptability of the damped portion. (The damping ratio of vibration damping structure 2 is input via structural damping β, which weakens the dynamic response of the softer structure.) Therefore, it is necessary to obtain the ultimate force of the damping effect on support rod 1 and apply it to the simulation of the structure containing only rigid connections for further solution.

[0050] Step D: Taking into account the ultimate force of the vibration damping structure 2, perform modal analysis on other structural components to analyze the environmental adaptability of the part without the vibration damping structure 2.

[0051] The finite element simulation of the equipment containing the vibration damping structure 2 is performed using the modal superposition method. The simulation results are as follows Figure 3 As shown, Figure 3 This is an axial acceleration response diagram obtained by finite element simulation of the buffeting test device according to the embodiment of the present invention.

[0052] Depend on Figure 3 and Figure 2 By comparison with the axial acceleration response diagram of the vibration damping structure 2 of the vibration test device of the utility model, it can be seen that the multiple test results of the axial acceleration response curve diagram of the vibration test device for the electronic device 4 provided by the exemplary embodiment of the present invention are very consistent with the axial acceleration response curve diagram calculated by finite element simulation.

[0053] From the above, it can be seen that the vibration test device for electronic equipment 4 provided by the exemplary embodiment of the present invention has very good environmental adaptability, is suitable for vibration testing of electronic equipment 4 without being restricted by environmental conditions, and does not cause damage to internal components of the electronic equipment 4.

[0054] Those skilled in the art will appreciate that the above embodiments are merely intended to clearly illustrate the present invention and are not intended to limit the scope of the present invention. Other variations or modifications may be made based on the above disclosure, and such variations or modifications are still within the scope of the present invention.

Claims

1. A vibration test device for electronic equipment, characterized in that: It includes a base and a frame structure arranged on the base, wherein the frame structure includes a first supporting structure and a second supporting structure; The first supporting structure is provided inside the frame structure, and the first supporting structure is used to support the electronic device; The second supporting structure is arranged inside the frame structure and below the first supporting structure, and the second supporting structure is used to rigidly support the reference device; The first supporting structure includes at least one flexible vibration-damping structure, and the electronic device is flexibly connected to the frame structure via the at least one vibration-damping structure; The distance between the top surface of the reference device and the bottom surface of the electronic device is smaller than a preset distance.

2. The buffeting test device according to claim 1, characterized in that: One end of the vibration-damping structure is connected to the electronic device, and the other end is connected to the frame structure, and the electronic device is spaced apart from the frame structure.

3. The buffeting test device according to claim 2, characterized in that: The frame structure includes a plurality of support rods, and the number of the vibration-damping structures is multiple, and the vibration-damping structures correspond to the support rods one by one.

4. The buffeting test device according to claim 3, characterized in that: One end of the vibration-damping structure is detachably connected to the outer peripheral surface of the electronic device, and the other end is detachably connected to the support rod.

5. The buffeting test device according to claim 4, characterized in that: The number of the support rods is four, the number of the vibration reduction structures is four, and the shape of the electronic device is a rectangular parallelepiped; One end of each vibration-damping structure is connected to a corner of the electronic device, and the other end is detachably connected to the support rod.

6. The buffeting test device according to any one of claims 1 to 5, characterized in that: At least part of the reference device is attached to the frame structure via the second supporting structure.

7. The buffeting test device according to claim 6, characterized in that: When the frame structure includes four support rods, the reference device is in the shape of a cuboid; The parts of the reference device close to the four corners are rigidly connected to the four support rods respectively.

8. The buffeting test device according to claim 7, characterized in that: The top surface of the reference device is attached to the bottom surface of the electronic device.

9. The buffeting test device according to claim 7, characterized in that: The vibration test device further includes a gravity sensor, one end of which is connected to the base, and the other end of which is connected to the top surface of the electronic device.

10. The buffeting test device according to claim 9, characterized in that: The vibration test device further includes an excitation device, which is used to generate vibrations on the electronic device and the reference device.

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