Chip resistor auxiliary testing device

Abstract

The utility model provides an auxiliary testing device for a chip resistor, and belongs to the field of chip resistors. The device comprises a base, a pressing mechanism and a PCB, the pressing mechanism and the PCB are arranged on the base, the pressing mechanism comprises a connecting rod and a pressing head rod, the connecting rod and the pressing head rod are vertically arranged above the PCB, the pressing head rod is arranged at the bottom of the connecting rod, and the connecting rod and the pressing head rod are configured to move close to or away from the PCB. The PCB is provided with a test connector and a test wire, one end of the test wire is connected with the test connector, and the other end of the test wire is connected with external test equipment. By adopting the chip resistor auxiliary testing device provided by the embodiment of the utility model, the problems that the testing efficiency is low and the chip resistor is easy to damage in the prior art can be solved.

Description

Technical Field

[0001] The utility model relates to the field of chip resistors, in particular to a chip resistor auxiliary testing device. Background Art

[0002] Chip resistors are widely used in modern production and life. After the chip resistors are produced, they need to be tested to detect whether they are qualified and meet the requirements of daily use. When testing the chip resistors, they need to be fixed through a chip resistor auxiliary test device to facilitate subsequent testing of the chip resistors.

[0003] Existing chip resistor auxiliary test devices usually use a fixture to clamp and fix the two sides of the chip resistor and connect the chip resistor to the wires to connect to the external test equipment. Fixing the chip resistor in this way requires placing the chip resistor between the jaws of the fixture for clamping and wiring. Due to the small size of the chip resistor, the operator is more complicated when performing the clamping and wiring operations, resulting in low test efficiency. At the same time, since the chip resistor is clamped from both sides, it is easy to scratch the chip resistor or even cause damage.

[0004] The chip resistor auxiliary test device in the prior art has low test efficiency and is prone to damage to the chip resistor. Utility Model Content

[0005] The present invention provides a chip resistor auxiliary test device that can solve the problems of low test efficiency and easy damage to chip resistors in the prior art. The technical solution is as follows:

[0006] A chip resistor auxiliary test device, comprising: a base, a pressing mechanism and a PCB board,

[0007] The clamping mechanism and the PCB board are arranged on the base, and the clamping mechanism includes a connecting rod and a pressure head rod. The connecting rod and the pressure head rod are vertically arranged above the PCB board, and the pressure head rod is arranged at the bottom of the connecting rod. The connecting rod and the pressure head rod are configured to move closer to or away from the PCB board. A test connector and a test wire are provided on the PCB board, one end of the test wire is connected to the test connector, and the other end is connected to an external test device.

[0008] Optionally, the pressure head rod and the connecting rod are detachably connected.

[0009] Optionally, a rubber pad is provided at the bottom of the pressure head rod.

[0010] Optionally, a plurality of PCB boards are provided, the number of the test connectors on the plurality of PCB boards is different, and a plurality of the test connectors are arranged in an array on each PCB board.

[0011] Optionally, the pressing mechanism includes a support frame, a handle and a support rod.

[0012] The support frame is vertically arranged on the base, and the support frame includes a cavity. The support rod is vertically arranged in the cavity. Mounting holes are opened at the top and bottom of the cavity. The connecting rod is arranged through the two mounting holes. One end of the handle is located outside the cavity, the other end of the handle is hinged to the connecting rod, and the middle part of the handle is hinged to the support rod.

[0013] Optionally, the cavity is provided with a slide groove along the vertical direction, the slide groove is connected to the mounting hole at the bottom of the cavity, and the connecting rod is slidably arranged in the slide groove.

[0014] Optionally, the clamping mechanism also includes a connecting plate and a spring, which are arranged in the cavity. The connecting plate is horizontally arranged on the connecting rod and is located between the hinge between the handle and the connecting rod and the top of the cavity. The spring is arranged between the connecting plate and the top of the cavity.

[0015] Optionally, the support frame includes a right-angle support, the right-angle support is arranged at the bottom of the cavity, a step surface is provided on the base, and the right angle of the right-angle support matches the step corner of the step surface.

[0016] The beneficial effects of the technical solution provided by the embodiment of the utility model include at least:

[0017] An embodiment of the present invention provides an auxiliary test device for chip resistors. The device first controls a connecting rod and a pressure head rod away from a PCB board, so that the chip resistor to be tested is conveniently placed horizontally at a test connector on the PCB board, and is connected to an external test device through a test wire. The device then controls the connecting rod and the pressure head rod close to the PCB board and presses the chip resistor to be tested onto the PCB board, so that the chip resistor to be tested is in stable contact with the test connector on the PCB board, thereby ensuring connectivity of the test circuit and testing the resistor to be tested. Since the connecting rod and the pressure head rod press from the top of the chip resistor to be tested, the force area is large and the chip resistor to be tested will not be damaged. At the same time, since a corresponding test circuit is provided on the PCB board, the test can be started when the chip resistor to be tested is in close contact with the test connector, which can effectively solve the problems of low testing efficiency and easy damage to the chip resistor in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 This is an overall front view of the device provided by an embodiment of the utility model;

[0020] Figure 2 This is an overall left view of the device provided by an embodiment of the utility model;

[0021] Figure 3 This is a schematic diagram of the left side cross section of the entire device provided by the embodiment of the utility model;

[0022] Figure 4 This is a cross-sectional schematic diagram of a support frame provided by an embodiment of the present utility model;

[0023] Figure 5 This is an overall top view of the device provided by an embodiment of the utility model;

[0024] Figure 6 This is a top view of a PCB board provided by an embodiment of the utility model;

[0025] Figure 7 This is another top view of a PCB board provided by an embodiment of the present utility model.

[0026] In the figure: 1-base; 11-step surface; 2-pressing mechanism; 21-connecting rod; 22-pressing head rod; 23-support frame; 231-cavity; 232-mounting hole; 233-slide groove; 234-right-angle support; 24-handle; 25-support rod; 26-connecting plate; 27-spring; 28-rubber pad; 3-PCB board; 31-test connector; 32-test wire. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solutions and advantages of the present invention more clear, the embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

[0028] Figure 1 This is an overall front view of the device provided by an embodiment of the utility model; Figure 2 This is an overall left view of the device provided by an embodiment of the utility model; Figure 3 This is a schematic diagram of the overall left side cross-section of the device provided by the embodiment of the utility model; Figure 4 This is a cross-sectional schematic diagram of a support frame provided by an embodiment of the present utility model; Figure 5 This is an overall top view of the device provided by an embodiment of the utility model; Figure 6 This is a top view of a PCB board provided by an embodiment of the utility model; Figure 7 This is another top view of a PCB board provided by the embodiment of the present utility model. Figures 1 to 7 The chip resistor auxiliary testing device shown includes: a base 1, a clamping mechanism 2 and a PCB board 3, the clamping mechanism 2 and the PCB board 3 are arranged on the base 1, the clamping mechanism 2 includes a connecting rod 21 and a pressure head rod 22, the connecting rod 21 and the pressure head rod 22 are vertically arranged above the PCB board 3, the pressure head rod 22 is arranged at the bottom of the connecting rod 21, the connecting rod 21 and the pressure head rod 22 are configured to move toward or away from the PCB board 3, and a test connector 31 and a test wire 32 are provided on the PCB board 3, one end of the test wire 32 is connected to the test connector 31, and the other end is connected to an external test device.

[0029] For example, in an embodiment of the present invention, the PCB board 3 is placed on the base 1, directly below the connecting rod 21 and the pressure rod 22, so that when the pressure rod 22 moves closer to the PCB board 3, it can press the chip resistor to be tested onto the test connector 31. The connecting rod 21 and the pressure rod 22 are controlled to move away from the PCB board 3, and the chip resistor to be tested is placed at the test connector 31 on the PCB board 3. At this time, the connecting rod 21 and the pressure rod 22 are controlled to approach the PCB board 3, and the pressure rod 22 presses the chip resistor to be tested onto the PCB board 3. Usually, one chip resistor to be tested corresponds to two test connectors 31, and the test connector 31 is connected to the external detection equipment through the test wire 32. When the two ends of the chip resistor to be tested are respectively in contact with the two test connectors 31, the chip resistor to be tested can be directly connected to the external circuit for testing. Compared with the traditional technology, the chip resistor to be tested is clamped from both ends by a clamp. Since the force-bearing area at both ends is small, the chip resistor to be tested is easily damaged. The device in this embodiment presses and fixes the chip resistor to be tested from the top of the chip resistor to be tested. The force-bearing area is large and the operation is simple. The detection can be started while the chip resistor to be tested is pressed. There is no need for additional wiring work for the chip resistor to be tested, which greatly improves the detection efficiency.

[0030] The embodiment of the present invention provides an auxiliary testing device for chip resistors. The device first controls the connecting rod 21 and the pressure head rod 22 to be away from the PCB board 3, so that the chip resistor to be tested is conveniently placed horizontally at the test connector 31 on the PCB board 3, and is connected to the external testing equipment through the test wire 32. Then, the connecting rod 21 and the pressure head rod 22 are controlled to be close to the PCB board 3 and the chip resistor to be tested is pressed against the PCB board 3, so that the chip resistor to be tested is in stable contact with the test connector 31 on the PCB board 3, so as to ensure the connectivity of the test circuit and test the resistor to be tested. Since the connecting rod 21 and the pressure head rod 22 are pressed from the top of the chip resistor to be tested, the force area is large and the chip resistor to be tested will not be damaged. At the same time, since a corresponding test circuit is provided on the PCB board 3, the test can be started when the chip resistor to be tested is in close contact with the test connector, which can effectively solve the problems of low testing efficiency and easy damage to the chip resistor in the prior art.

[0031] Optionally, the pressure head rod 22 and the connecting rod 21 are detachably connected.

[0032] For example, in the embodiment of the present invention, since the pressure head rod 22 is the component that directly contacts the chip resistor to be tested, by detachably connecting the pressure head rod 22 and the connecting rod 21, when the pressure head rod 22 is worn due to excessive use, it can be replaced separately, thereby eliminating the need to replace other components, reducing the use cost of the device and increasing the service life of the device.

[0033] Optionally, a rubber pad 28 is provided at the bottom of the pressing head rod 22 .

[0034] For example, in an embodiment of the present invention, by providing a rubber pad 28, when the pressure head rod 22 contacts the chip resistor to be measured, the rubber pad 28 provides a buffer to prevent hard contact between the pressure head rod 22 and the chip resistor to be measured, provide certain protection for the chip resistor to be measured, further prevent the chip resistor to be measured from being damaged, and also reduce the wear of the pressure head rod 22, further improving the service life of the device.

[0035] Optionally, a plurality of PCB boards 3 are provided, the number of test connectors 31 on the plurality of PCB boards 3 is different, and a plurality of test connectors 31 are arranged in an array on each PCB board 3 .

[0036] For example, in the embodiment of the present invention, Figure 6 As shown, two test connectors 31 are provided on the PCB board 3. The test connectors 31 are connected to the external test equipment through the test wires 32. During the test, a chip resistor to be tested is placed on the corresponding chip resistor so that the two ends of the chip resistor to be tested are respectively in contact with the two test connectors 31 to complete the connection of the test circuit. Figure 7As shown, PCB board 3 is provided with four test connectors 31, which are connected to external test equipment via test leads 32. During testing, two chip resistors to be tested are placed on the corresponding chip resistors, so that the two ends of each chip resistor to be tested contact the two test connectors 31 to complete the test circuit connection. At this time, the two chip resistors to be tested are connected in parallel. Accordingly, more different types of PCB boards 3 can be designed, with different numbers of test connectors 31 and test leads 32 on different PCB boards 3 to form different circuit types, thereby allowing different tests to be performed on the chip resistors to be tested, thereby improving the versatility of the device.

[0037] Optionally, the pressing mechanism 2 includes a support frame 23, a handle 24 and a support rod 25.

[0038] The support frame 23 is vertically arranged on the base 1, and the support frame 23 includes a cavity 231. The support rod 25 is vertically arranged in the cavity 231. Mounting holes 232 are opened at the top and bottom of the cavity 231. The connecting rod 21 is arranged through the two mounting holes 232. One end of the handle 24 is located outside the cavity 231, and the other end of the handle 24 is hinged to the connecting rod 21. The middle part of the handle 24 is hinged to the support rod 25.

[0039] For example, in an embodiment of the present invention, when the control handle 24 is pressed downward, the connecting rod 21 moves upward along the direction of the mounting hole 232. At this time, the pressure rod 22 located at the bottom of the connecting rod 21 is away from the PCB board 3, which facilitates the placement of the chip resistor to be tested on the PCB board 3. After the chip resistor to be tested is placed, the downward pressure handle 24 is released, and the connecting rod 21 and the pressure rod 22 descend under the action of gravity, so that the pressure rod 22 exerts pressure on the chip resistor to be tested and fixes it. By setting up this structure, operation is convenient. The operator only needs to manipulate the handle 24 to complete the up and down movement of the connecting rod 21 and the pressure rod 22, thereby improving the operational convenience of the device.

[0040] Optionally, the cavity 231 is provided with a sliding groove 233 along the vertical direction, the sliding groove 233 is connected to the mounting hole 232 at the bottom of the cavity 231 , and the connecting rod 21 is slidably disposed in the sliding groove 233 .

[0041] For example, in an embodiment of the present invention, by setting the slide groove 233, the connecting rod 21 can be assisted to move in the vertical direction, preventing the connecting rod 21 from tilting when moving in the vertical direction, thereby not pressing the chip resistor to be tested. By setting the slide groove 233, the stability of the device is improved.

[0042] Optionally, the clamping mechanism also includes a connecting plate 26 and a spring 27, which are arranged in the cavity 231. The connecting plate 26 is horizontally arranged on the connecting rod 21, located between the hinge between the handle 24 and the connecting rod 21 and the top of the cavity 231, and the spring 27 is arranged between the connecting plate 26 and the top of the cavity 231.

[0043] For example, in an embodiment of the present invention, the spring 27 is in a compressed state. By providing the connecting plate 26 and the spring 27, when no force is applied to the handle 24, the spring 27 always applies a downward force to the connecting rod 21, so that the pressure head rod 22 below the connecting rod 21 generates pressure on the chip resistor to be tested on the PCB board 3, so that the connecting rod 21 and the pressure head rod 22 not only fix the chip resistor to be tested by gravity, but also fix it by the pressure transmitted by the spring 27, so that the chip resistor to be tested is more firmly fixed on the PCB board 3, thereby improving the stability of the device in just one step.

[0044] Optionally, the support frame 23 includes a right-angle support 234 , which is arranged at the bottom of the cavity 231 . A step surface 11 is provided on the base 1 , and the right angle of the right-angle support 234 matches the step corner of the step surface 11 .

[0045] For example, in an embodiment of the present utility model, by setting a right-angle support 234 and a step surface 11 in cooperation, the step corner of the step surface 11 provides a limiting effect on the right-angle support 234, and mounting holes can be opened on the horizontal plate surface of the right-angle support 234 and the step surface 11, and the bracket support and the step surface 11 are fixed by screws, so that the support frame 23 is firmly fixed on the base 1 as a whole, thereby further improving the stability of the device.

[0046] Unless otherwise defined, the technical or scientific terms used herein shall have the ordinary meaning understood by persons of ordinary skill in the field to which the present invention belongs. The terms "first", "second" and similar words used in the specification and claims of the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, terms such as "a" or "an" do not indicate a quantity limitation, but rather indicate the presence of at least one. Terms such as "include" or "comprising" mean that the elements or objects appearing before "include" or "comprising" include the elements or objects listed after "include" or "comprising" and their equivalents, and do not exclude other elements or objects. Terms such as "connected" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. Terms such as "upper", "lower", "left", and "right" are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0047] The above description is only an optional embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A chip resistor auxiliary test device, characterized in that: include: Base (1), pressing mechanism (2) and PCB board (3), The clamping mechanism (2) and the PCB board (3) are arranged on the base (1), and the clamping mechanism (2) includes a connecting rod (21) and a pressure head rod (22), wherein the connecting rod (21) and the pressure head rod (22) are vertically arranged above the PCB board (3), and the pressure head rod (22) is arranged at the bottom of the connecting rod (21), and the connecting rod (21) and the pressure head rod (22) are configured to move closer to or away from the PCB board (3), and a test connector (31) and a test wire (32) are provided on the PCB board (3), and one end of the test wire (32) is connected to the test connector (31), and the other end is connected to an external test device.

2. The chip resistor auxiliary testing device according to claim 1, characterized in that: The pressure head rod (22) and the connecting rod (21) are detachably connected.

3. The chip resistor auxiliary testing device according to claim 1, characterized in that: A rubber pad (28) is provided at the bottom of the pressure head rod (22).

4. The chip resistor auxiliary testing device according to claim 1, characterized in that: A plurality of the PCB boards (3) are provided, the number of the test connectors (31) on the plurality of the PCB boards (3) is different, and each of the PCB boards (3) is provided with a plurality of the test connectors (31) in an array.

5. The chip resistor auxiliary testing device according to claim 1, characterized in that: The pressing mechanism (2) comprises a support frame (23), a handle (24) and a support rod (25). The support frame (23) is vertically arranged on the base (1), the support frame (23) includes a cavity (231), the support rod (25) is vertically arranged in the cavity (231), the top and bottom of the cavity (231) are provided with mounting holes (232), the connecting rod (21) is arranged through the two mounting holes (232), one end of the handle (24) is located outside the cavity (231), the other end of the handle (24) is hinged to the connecting rod (21), and the middle part of the handle (24) is hinged to the support rod (25).

6. The chip resistor auxiliary testing device according to claim 5, characterized in that: The cavity (231) is provided with a sliding groove (233) along the vertical direction, the sliding groove (233) is connected to the mounting hole (232) at the bottom of the cavity (231), and the connecting rod (21) is slidably arranged in the sliding groove (233).

7. The chip resistor auxiliary testing device according to claim 5, characterized in that: The clamping mechanism further comprises a connecting plate (26) and a spring (27), wherein the connecting plate (26) and the spring (27) are arranged in the cavity (231), the connecting plate (26) is horizontally arranged on the connecting rod (21), and is located between the hinge between the handle (24) and the connecting rod (21) and the top of the cavity (231), and the spring (27) is arranged between the connecting plate (26) and the top of the cavity (231).

8. The chip resistor auxiliary testing device according to claim 5, characterized in that: The support frame (23) includes a right-angle support (234), the right-angle support (234) is arranged at the bottom of the cavity (231), a step surface (11) is provided on the base (1), and the right angle of the right-angle support (234) matches the step corner of the step surface (11).

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