Electric leakage test switch and circuit breaker
By designing linkage components and trip locking components to control the deformation and contact of elastic conductive parts, the problem of tripping burnout during reverse connection of load is solved, and the safety protection of circuit breakers is achieved in the case of leakage current.
Patent Information
- Application Number
- CN202422458881.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-11
- Publication Date
- 2025-08-26
- Estimated Expiration
- 2034-10-11
AI Technical Summary
When the existing residual current circuit breaker is connected in reverse, the leakage test loop is still turned on, which may cause the tripper to burn out.
A leakage test switch is designed to control the deformation and contact of the elastic conductive parts through the coordination of the linkage component and the trip locking component, ensuring that the current circuit is automatically disconnected when the leakage current occurs, and preventing the tripper from continuously passing through the current.
It effectively prevents the tripping device from burning due to continuous current flow, ensuring that the circuit breaker is safely tripped in the case of leakage current, and protecting the equipment from damage.
Smart Images
Figure CN223273196U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of low-voltage electrical appliances, and in particular to a leakage test switch and a circuit breaker. Background Art
[0002] A residual current operated circuit breaker is a safety protection device used in electrical systems. It can detect leakage in the circuit and quickly disconnect the circuit when current leakage or imbalance occurs, preventing electric shock or electrical fires. In related technologies, leakage testing of residual current operated circuit breakers generally simulates leakage current to test the operation of the release and implement leakage protection. However, this method is generally only suitable for positively connected loads. If the load is reversed and the test button is pressed, although the release trips, the leakage test circuit remains in the on state, which may cause the release to burn out. Utility Model Content
[0003] In view of this, the present application provides a leakage test switch and a circuit breaker to improve the problem that the release may fail to cut off the power during the leakage test of the circuit breaker, resulting in the release burning out.
[0004] The technical solutions adopted by this application to solve the above technical problems are:
[0005] In a first aspect, an embodiment of the present application provides a leakage test switch, comprising:
[0006] Testing active components;
[0007] Testing passive components;
[0008] A linkage component is provided between the active test component and the passive test component, and the linkage component abuts against the passive test component;
[0009] A trip locking assembly is provided between the active test assembly and the passive test assembly, and is used to lock or release the passive test assembly;
[0010] a first elastic conductive member and a second elastic conductive member, wherein the first elastic conductive member abuts against the active test component, and the second elastic conductive member abuts against the linkage component;
[0011] Among them, when no current passes through the trip locking assembly and the test passive assembly is locked, the linkage assembly is in a first position, and the test passive assembly deforms the second elastic conductive member by abutting against the linkage assembly; when current passes through the trip locking assembly and the test passive assembly is released, the test passive assembly relieves force on the linkage assembly, the linkage assembly is in a second position, and the linkage assembly drives the second elastic conductive member to restore its original state; when the linkage assembly is in the first position, the minimum distance between the first elastic conductive member and the second elastic conductive member is a first distance, and when the linkage assembly is in the second position, the minimum distance between the first elastic conductive member and the second elastic conductive member is a second distance, and the deformation amount of the first elastic conductive member driven by the test active assembly toward the second elastic conductive member is greater than or equal to the first distance and less than the second distance.
[0012] In some embodiments of the present application, the leakage test switch has a first direction and a second direction, and the linkage assembly includes a moving part, which is arranged at the top of the trip locking assembly in the first direction and is located between the test active assembly and the test passive assembly. The moving part abuts against the second elastic conductive part along one side of the second direction and abuts against the test passive assembly along the other side of the second direction.
[0013] In some embodiments of the present application, when the test passive component moves along the first direction and the trip locking component locks the test passive component, the moving part is spaced apart from the trip locking component on the side away from the test passive component along the second direction, the moving part is in the first position, and the second elastic conductive part is deformed toward the first elastic conductive part under the action of the moving part.
[0014] In some embodiments of the present application, the moving member includes a moving section, a first abutting section, and a second abutting section, wherein the first abutting section and the second abutting section are respectively connected to two ends of the moving section along the second direction;
[0015] When the movable member is in the first position, the first abutting section is spaced apart from the tripping and locking assembly and abuts against the second elastic conductive member, causing the second elastic conductive member to deform toward the first elastic conductive member, and the second abutting section abuts against the test passive assembly;
[0016] When the moving member is in the second position, the first abutting section contacts the tripping and locking assembly, the second elastic conductive member returns to its original shape and abuts against the first abutting section, and the second abutting section abuts against the test passive assembly;
[0017] The second abutting section when the moving member is in the first position and the second abutting section when the moving member is in the second position respectively abut against different positions of the test passive component.
[0018] In some embodiments of the present application, the moving part also includes a limiting section, and the linkage assembly also includes a limiting spring, one end of the limiting section along the first direction is connected to one end of the moving section close to the first abutment section, the limiting spring is arranged between the limiting section and the test active assembly and is connected to the limiting section, and the direction of the elastic force of the limiting spring is the second direction.
[0019] In some embodiments of the present application, the test passive component includes a passive movable member having elastic properties, wherein the passive movable member is provided with an abutment surface on a side facing the movable member, and the abutment surface is provided with an abutment protrusion protruding in a direction toward the movable member;
[0020] When the moving member is in the first position, the abutting protrusion abuts against the second abutting section; when the moving member is in the second position, the abutting surface abuts against the second abutting section.
[0021] In some embodiments of the present application, the abutment protrusion is an arc-shaped protrusion and the abutment protrusion is arc-shapedly connected to the abutment surface, the second abutment section is U-shaped, the abutment between the second abutment section and the abutment protrusion is the abutment of two arc-shaped surfaces, and the abutment between the second abutment section and the abutment surface is also the abutment of two arc-shaped surfaces.
[0022] In some embodiments of the present application, the leakage test switch has a first direction, the test active component includes a test button, a reset spring and a drive column, the drive column is connected to the test button, the reset spring is sleeved on the drive column, and the side of the drive column away from the test button along the first direction can abut against the first elastic conductive member.
[0023] In some embodiments of the present application, the leakage test switch has a first direction and a second direction, the tripping and locking assembly includes an electromagnetic tripper and an active locking member, the electromagnetic tripper is provided between the active test assembly and the passive test assembly, and the output end of the electromagnetic tripper is connected to the active locking member;
[0024] When the first elastic conductive member is not in contact with the second elastic conductive member, the active locking member locks the test passive component to restrict the movement of the test passive component in the first direction; when the first elastic conductive member is in contact with the second elastic conductive member and forms a loop with leakage current, the electromagnetic release drives the active locking member to move along the second direction to cancel the constraint of the active locking member on the test passive component in the first direction.
[0025] In a second aspect, the present application provides a circuit breaker comprising the leakage test switch as described in the first aspect.
[0026] In summary, due to the adoption of the above technical solution, this application has at least the following beneficial effects:
[0027] Embodiments of the present application provide a leakage test switch and circuit breaker. The leakage test switch limits the deformation amount of the first elastic conductive member toward the second elastic conductive member to be equal to the first distance and less than the second distance. This indicates that only when the linkage assembly is in the first position can the first elastic conductive member be driven by the active test assembly to deform and abut against the second elastic conductive member to connect the test circuit. After the test circuit is connected, current will pass through the trip lock assembly, thereby releasing the test passive assembly. At this time, the second elastic conductive member will return to its original state, and the linkage assembly is in the second position. When the linkage assembly is in the second position, the second distance between the second elastic conductive member and the first elastic conductive member is greater than the deformation amount of the first elastic conductive member. Therefore, even if the first elastic conductive member is continuously deformed, it will not contact the second elastic conductive member and no current loop will be formed, thereby avoiding the trip lock assembly from burning out due to continuous current. Specifically, the active test component abuts the first elastic conductive member, allowing the active test component to drive the first elastic conductive member to deform toward the second elastic conductive member; the passive test component abuts the linkage component, allowing the passive test component to drive the second elastic conductive member to deform through the linkage component. The two elastic conductive members deform toward each other, thereby achieving contact between the two elastic conductive members to form a test loop, thereby achieving the purpose of testing leakage current. Furthermore, the trip lock component automatically releases and locks the passive test component based on the current, allowing the passive test component to automatically control the deformation of the second elastic conductive member through the linkage component. That is, when leakage current occurs, the trip lock component releases the passive test component, and the force causing the second elastic conductive member to deform is correspondingly removed, thereby restoring the original state and increasing the distance between the second elastic conductive member and the first elastic conductive member. This ensures that no matter how the active test component drives the first elastic conductive member to deform, it will not form contact and conduction with the second elastic conductive member. This effectively ensures that after leakage current occurs, the trip lock component will not remain in the current-passing loop, preventing the trip lock component from burning out. BRIEF DESCRIPTION OF THE DRAWINGS
[0028] Figure 1 A schematic structural diagram of a circuit breaker provided in an embodiment of the present application;
[0029] Figure 2 A schematic structural diagram of a first state of a leakage test switch provided in an embodiment of the present application;
[0030] Figure 3 A schematic structural diagram of a second state of a leakage test switch provided in an embodiment of the present application;
[0031] Figure 4 A schematic structural diagram of a moving part in a leakage test switch provided in an embodiment of the present application;
[0032] Figure 5 A schematic structural diagram of a trip lock component and a locking test passive component in a leakage test switch provided in an embodiment of the present application;
[0033] Figure 6 A schematic structural diagram of a release test passive component of a trip lock component in a leakage test switch provided by an embodiment of the present application;
[0034] Figure 7 A structural diagram of a test passive component in a leakage test switch provided in an embodiment of the present application.
[0035] Description of reference numerals:
[0036] 1. Housing; 2. Electronic component board; 3. Transformer; 4. Leakage test switch; 41. Active test component; 411. Test button; 412. Return spring; 413. Drive column; 42. Passive test component; 421. Moving part; 4211. Abutment surface; 4212. Abutment protrusion; 422. Spring; 423. Passive locking member; 43. Linkage assembly; 431. Moving part; 4311. Moving section; 4312. First abutment section; 4313. Second abutment section; 4314. Limiting section; 4315. Limiting spring; 44. Tripping locking assembly; 441. Electromagnetic release; 442. Active locking member; 4421. Limiting notch; 45. First elastic conductive member; 46. Second elastic conductive member;
[0037] Y, first direction; X, second direction. DETAILED DESCRIPTION
[0038] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.
[0039] In the description of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or the number of the technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include one or more features. In the description of this application, "plurality" means two or more, unless otherwise specifically specified.
[0040] In this application, the word “exemplary” is used to mean “serving as an example, instance, or illustration.” Any embodiment described in this application as “exemplary” is not necessarily to be construed as preferred or advantageous over other embodiments.
[0041] See Figure 1 An embodiment of the present application provides a circuit breaker, comprising a housing 1, an electronic component board 2, a transformer 3, wiring, and a leakage test switch 4. The leakage test switch 4, the electronic component board 2, and the transformer 3 are all connected by wiring and are all disposed within the housing 1. The transformer 3 is welded to the electronic component board 2, and the transformer 3 is electrically connected to the electronic component board 2. The transformer 3 is coupled to the main lines of both the L phase and the N phase. When the transformer 3 detects a leakage fault, the electronic component board 2 controls the trip lock assembly 44 in the leakage test switch 4 to operate, thereby tripping the circuit breaker. The trip lock assembly 44 will automatically reset after completing the operation.
[0042] It should be noted that the trip lock assembly 44 is activated when the mutual inductor 3 detects a leakage fault. However, the technical solution of this application is based on the premise of testing whether the circuit breaker can operate accurately. Therefore, it is necessary to assume that the current circuit breaker has a leakage fault. When conducting a test experiment, the specific method can be to short-circuit the L-phase and N-phase lines or adopt other methods to ensure that the circuit breaker is always in a state where leakage current exists during the test phase. The technical solution for leakage testing is mainly implemented through the leakage test switch 4, which will be described in detail below:
[0043] See Figures 2 to 7 A leakage test switch 4 includes an active test component 41, a passive test component 42, a linkage component 43, a trip lock component 44, a first elastic conductive member 45, and a second elastic conductive member 46. The linkage component 43 is disposed between the active test component 41 and the passive test component 42, and the linkage component 43 abuts the passive test component 42. The trip lock component 44 is disposed between the active test component 41 and the passive test component 42, and is used to lock or release the passive test component 42. The first elastic conductive member 45 abuts the active test component 41, and the second elastic conductive member 46 abuts the linkage component 43.
[0044] Among them, when no current passes through the tripping locking component 44 and the test passive component 42 is locked, the linkage component 43 is in the first position, and the test passive component 42 deforms the second elastic conductive component 46 by abutting the linkage component 43; when current passes through the tripping locking component 44 and the test passive component 42 is released, the test passive component 42 relieves the force on the linkage component 43, and the linkage component 43 is in the second position, and the linkage component 43 drives the second elastic conductive component 46 to restore its original state; when the linkage component 43 is in the first position, the minimum distance between the first elastic conductive component 45 and the second elastic conductive component 46 is the first distance, and when the linkage component 43 is in the second position, the minimum distance between the first elastic conductive component 45 and the second elastic conductive component 46 is the second distance, and the deformation amount of the test active component 41 driving the first elastic conductive component 45 toward the second elastic conductive component 46 is greater than or equal to the first distance and less than the second distance.
[0045] See Figure 2 and Figure 3The technical solution provided in this application limits the deformation amount of the first elastic conductive member 45 toward the second elastic conductive member 46 to be equal to the first distance and less than the second distance. This means that only when the linkage assembly 43 is in the first position can the first elastic conductive member 45 be driven by the active test assembly to deform and abut against the second elastic conductive member 46 to connect the test circuit. After the test circuit is connected, current will pass through the trip locking assembly 44, thereby releasing the test passive assembly 42. At this time, the second elastic conductive member 46 will return to its original state, and the linkage assembly 43 is in the second position. When the linkage assembly 43 is in the second position, the second distance between the second elastic conductive member 46 and the first elastic conductive member 45 is greater than the deformation amount of the first elastic conductive member 45. Therefore, even if the first elastic conductive member 45 is continuously deformed, it will not contact the second elastic conductive member 46, and no current loop will be formed, thereby avoiding the trip locking assembly 44 from burning out due to continuous current. In detail, by abutting the test active component 41 against the first elastic conductive component 45, the test active component 41 can drive the first elastic conductive component 45 to deform toward the second elastic conductive component 46; by abutting the test passive component 42 against the linkage component 43, the test passive component 42 can drive the second elastic conductive component 46 to deform through the linkage component 43, and the two elastic conductive components are deformed toward each other, thereby achieving contact between the two elastic conductive components to form a test circuit, thereby achieving the purpose of testing leakage current. By utilizing the trip locking component 44, the test passive component 42 can be automatically released and locked according to the current, so that the test passive component 42 can automatically control the deformation of the second elastic conductive component 46 through the linkage component 43. That is, when a leakage current occurs, the trip locking component 44 will release the test passive component 42, and the second elastic conductive component 46 will correspondingly be relieved of the force that causes its deformation, thereby restoring its original state, increasing the distance between the second elastic conductive component 46 and the first elastic conductive component 45, and ensuring that no matter how the test active component 41 drives the first elastic conductive component 45 to deform, it will not form contact and conduction with the second elastic conductive component 46, thereby effectively ensuring that after the leakage current occurs, the trip locking component 44 will not continue to be in a circuit with current passing through, thereby preventing the trip locking component 44 from being burned out.
[0046] In some embodiments, the leakage test switch 4 has a first direction Y and a second direction X. Figure 2 and Figure 4, the linkage assembly 43 includes a moving part 431. The moving part 431 is arranged at the top of the trip locking assembly 44 in the first direction Y, and is located between the test active assembly 41 and the test passive assembly 42. The moving part 431 abuts against the second elastic conductive member 46 along one side of the second direction X, and abuts against the test passive assembly 42 along the other side of the second direction X. When the staff starts the test active assembly 41, the test active assembly 41 will generate a force and act on the first elastic conductive member 45. The first elastic conductive member 45 is deformed toward the second elastic conductive member 46 by the force until the first elastic conductive member 45 contacts the second elastic conductive member 46 to connect the test circuit. At this time, since the circuit breaker is in a leakage state by default, the mutual inductor 3 will detect the leakage current, thereby driving the trip locking assembly 44 to operate to complete the tripping of the circuit breaker. With the operation of the trip locking assembly 44, the test passive assembly 42 will be unlocked. The force on the movable member 431 is released, and the movable member 431 then releases the force on the second elastic conductive member 46, and the second elastic conductive member 46 returns to its original state along the second direction X. The movement process of returning to its original state is the movement process of the second elastic conductive member 46 away from the first elastic conductive member 45, thereby disconnecting the two conductive members. The whole process can not only detect the leakage of the circuit breaker, but also avoid the situation where the staff continues to turn on the test active component 41 after the leakage occurs, and the trip locking component 44 continues to be connected to the current, resulting in the trip locking component 44 being burned out. In other words, after leakage current occurs and the test switch is turned on, the trip locking component 44 will trip, prompting the movable member 431 to remove the force on the second elastic conductive member 46, and the second elastic conductive member 46 will return to its original state in the direction away from the first elastic conductive member 45, thereby increasing the distance between the first elastic conductive member 45 and the second elastic conductive member 46. This distance is the distance that the test active component 41 is turned on and continuously acts on the first elastic conductive member 45 to cause it to deform and cannot contact the second elastic conductive member 46, thereby effectively protecting the trip locking component 44 from damage caused by continuous current flow.
[0047] It should be noted that, in the initial state of the leakage test switch 4, that is, when the leakage test switch 4 is not activated, the test passive component 42 is locked by the trip lock component 44, the test passive component maintains its compression on the moving member 431, and the moving member 431 maintains its compression on the second elastic conductive member 46, so that the second elastic conductive member 46 is always in a state of deformation toward the first elastic conductive member 45. When the test passive component 42 moves along the first direction Y and the trip lock component 44 locks the test passive component 42, the moving member 431 is spaced apart from the trip lock component 44 along the second direction X away from the side of the test passive component 42. At this time, the second elastic conductive member 46 is subjected to the squeezing force of the moving member 431, and the second elastic conductive member 46 is deformed toward the first elastic conductive member 45, and is also spaced apart from the trip lock component 44. At this time, the leakage test switch 4 is in the initial state, and the moving member 431 is in the first position. At this time, the staff activates the test active component 41 to deform the first elastic conductive member 45 toward the second elastic conductive member 46 , so that the first elastic conductive member 45 can contact the second elastic conductive member 46 , thus completing the test circuit.
[0048] Further, see Figure 4 The moving member 431 includes a moving section 4311, a first abutting section 4312, and a second abutting section 4313. The first abutting section 4312 and the second abutting section 4313 are respectively connected to the two ends of the moving section 4311 along the second direction X. The first abutting section 4312 is mainly used to abut the second elastic conductive member 46 to deform the second elastic conductive member 46, and the second abutting section 4313 is mainly used to abut the test passive component 42 to transmit the force applied by the test passive component 42 to the first abutting section 4312.
[0049] When the movable member 431 is in the first position, the second abutting section 4313 abuts against the test passive component 42, and the test passive component 42 exerts a force that drives the second abutting section 4313 toward the first abutting section 4312. The first abutting section 4312 is spaced apart from the trip lock component 44 and abuts against the second elastic conductive member 46, causing the second elastic conductive member 46 to deform toward the first elastic conductive member 45, thereby shortening the distance between the first elastic conductive member 45 and the second elastic conductive member 46. This provides a distance basis for the subsequent test active component 41 to drive the first elastic conductive member 45 to deform and contact the second elastic conductive member 46.
[0050] When the movable member 431 is in the second position, the second abutting section 4313 abuts the test passive component 42. However, the abutting force between the test passive component 42 and the second abutting section 4313 is very small, or even zero. The first abutting section 4312 contacts the trip lock component 44, and the second elastic conductive member 46 returns to its original shape and abuts the first abutting section 4312. The abutting force between the second elastic conductive member 46 and the first abutting section 4312 is very small, or even zero. Because the direction in which the second elastic conductive member 46 returns to its original shape is away from the first elastic conductive member 45, the distance between the second elastic conductive member 46 and the first elastic conductive member 45 increases, while the deformation of the first elastic conductive member 45 toward the second elastic conductive member 46 does not change. Therefore, no matter how the first elastic conductive member 45 deforms under the force of the test active component 41, it will not contact the second elastic conductive member 46. This means that the test circuit will not be conductive, and no current will continue to flow in the trip lock component 44, effectively preventing the trip lock component 44 from burning out.
[0051] It should be noted that the second abutting section 4313 of the movable member 431 when it is in the first position and the second abutting section 4313 when it is in the second position respectively abut against different positions of the test passive component 42. Specifically, the test passive component 42 has a protrusion in the direction toward the movable member 431, and the protrusion abuts against the second abutting section 4313 of the movable member 431 when it is in the first position, and a portion of the non-protrusion abuts against the second abutting section 4313 of the movable member 431 when it is in the second position. In this way, by switching the abutment between the protrusion and the non-protrusion, the movable member 431 is moved in the second direction X, thereby achieving the purpose of adjusting the distance between the two elastic conductive members.
[0052] For details, see Figure 5 and Figure 6 The test passive component 42 includes a passive movable part with elastic properties. The passive movable part is provided with an abutting surface 4211 on the side facing the moving part 431. The abutting surface 4211 is provided with an abutting protrusion 4212 that protrudes in the direction of the moving part 431. The passive movable part here can be a movable part 421 with elastic properties itself, or a movable part 421 formed by combining other parts with elastic properties. In this embodiment, the passive movable part is a movable part 421 with elastic properties formed by combining other parts with elastic properties. For details, please refer to Figure 7The test passive component 42 includes a movable part 421, a spring 422 and a passive locking part 423. The movable part 421 and the spring 422 together constitute a passive movable part with elastic characteristics. The spring 422 is arranged inside the movable part 421, and one end of the spring 422 is connected to the inner top wall of the movable part 421, and the other end is connected to the internal structure of the housing 1 of the circuit breaker. When the movable part 421 moves downward along the first direction Y, the spring 422 is squeezed and compressed. The passive locking part 423 is integrally formed and connected to the bottom of the movable part 421. The passive locking part 423 is mainly used to cooperate with the trip locking assembly 44 to lock the movement of the movable part 421. For the movable part 421, it has an abutment surface 4211 and an abutment protrusion 4212 in the direction toward the movable part 431. When the moving member 431 is in the first position, the abutting protrusion 4212 abuts the second abutting section 4313. At this point, the moving member 431 exerts an abutting force on the second elastic conductive member 46, causing the second elastic conductive member 46 to deform and maintain its position. When the moving member 431 is in the second position, the abutting surface 4211 abuts the second abutting section 4313. The abutting force exerted by the moving member 431 on the second elastic conductive member 46 is reduced compared to the first position, or even eliminated. Under the elastic force of the second elastic conductive member 46, the moving member 431 returns to its original position. The switching of the moving part 431 from the first position to the second position requires the cooperation of the tripping locking assembly 44. Specifically, the tripping locking assembly 44 is actuated to unlock the passive locking part 423. At this time, the movable part 421 is acted upon by the spring 422 and moves upward, switching the abutment protrusion 4212 and the second abutment section 4313 into abutment with the abutment surface 4211 and the second abutment section 4313, thereby switching the moving part 431 from the first position to the second position.
[0053] Furthermore, the abutting protrusion 4212 is an arc-shaped protrusion, and the abutting protrusion 4212 is connected to the abutting surface 4211 in an arc shape. The second abutting section 4313 is U-shaped, and the abutment between the second abutting section 4313 and the abutting protrusion 4212 is abutted by two arc-shaped surfaces, and the abutment between the second abutting section 4313 and the abutting surface 4211 is abutted by two arc-shaped surfaces. By configuring the second abutting section 4313, the abutting protrusion 4212, and the abutting surface 4211 to all be arranged in an arc-shaped abutment, it is conducive to the abutment of the second abutting section 4313 between the abutting protrusion 4212 and the abutting surface 4211 to smoothly transition, thereby improving the smoothness of the position switching of the moving member 431.
[0054] In some embodiments, see Figure 4The movable member 431 further includes a limiting section 4314. The linkage assembly 43 further includes a limiting spring 4315. One end of the limiting section 4314 along the first direction Y is connected to an end of the movable section 4311 near the first abutting section 4312. The limiting spring 4315 is disposed between the limiting section 4314 and the active test assembly 41 and is connected to the limiting section 4314. The elastic force of the limiting spring 4315 is directed in the second direction X. When the movable member 431 is in the first position, the movable member 431 is subjected to the abutting force of the abutting protrusion 4212, causing the limiting spring 4315 to be in a compressed state. When the trip lock assembly 44 unlocks the movable member 421, the movable member 421 is moved upward by the action of the spring 422, causing the movable member 431 to switch from abutting the abutting protrusion 4212 to abutting the abutting surface 4211. During the switching process, the movable member 431 is subjected to the elastic force of the limiting spring 4315 and always keeps the movable member 431 in contact with the movable member 421. By providing the limiting spring 4315, the movable member 431 can automatically return to the second position from the first position. Compared with relying solely on the force of the second elastic conductive member 46, the additional limiting spring 4315 ensures that the movable member 431 can better switch from the first position to the second position, avoiding the situation where the movable member 431 cannot move into place by relying solely on the force of the second elastic conductive member 46.
[0055] In some embodiments, see Figure 2 and Figure 3The leakage test switch 4 has a first direction Y. The active test component 41 includes a test button 411, a return spring 412, and a drive post 413. The drive post 413 is connected to the test button 411. The return spring 412 is mounted on the drive post 413. The side of the drive post 413 facing away from the test button 411 along the first direction Y can abut against the first elastic conductive member 45. When the test button 411 is pressed, the return spring 412 is compressed by the pressure, and the drive post 413 moves downward synchronously, causing the first elastic conductive member 45 to deform toward the second elastic conductive member 46. The portion of the first elastic conductive member 45 that abuts the drive post 413 is inclined. When the drive post 413 presses the first elastic conductive member 45 downward, the first elastic conductive member 45 also deforms downward. Due to its inclined shape, as the first elastic conductive member 45 deforms downward, its end moves closer and closer to the second elastic conductive member 46 until the first elastic conductive member 45 contacts the second elastic conductive member 46, completing the test circuit. After the test circuit is notified, because it is assumed that there is leakage current in the current circuit breaker, the trip locking assembly 44 will trip, releasing the passive movable part, and the passive movable part rebounds. Under the action of the limit spring 4315, the movable part 431 switches from abutting with the abutting protrusion 4212 to abutting with the abutting surface 4211, and resets to the second position. At this time, there is a gap between the second elastic conductive part 46 and the first elastic conductive part 45. Even if the staff continues to press the test button 411, the first elastic conductive part 45 cannot contact the second elastic conductive part 46, thereby effectively protecting the trip locking assembly 44.
[0056] In some embodiments, the leakage test switch 4 has a first direction Y and a second direction X. Figure 5 and Figure 6The tripping and locking assembly 44 includes an electromagnetic release 441 and an active locking member 442. The electromagnetic release 441 is a structure wound with multiple turns of copper wire, resulting in high resistance. Prolonged power supply will cause it to heat up and eventually burn out. The electromagnetic release 441 is located between the active test component 41 and the passive test component 42, and the output end of the electromagnetic release 441 is connected to the active locking member 442. When the electromagnetic release 441 is connected to the test circuit, current flows through the electromagnetic release 441, causing the electromagnetic release 441 to actuate through the electromagnet core, causing its output end to expand and contract. Specifically, the output end of the electromagnetic release 441 is initially extended. When current flows through the electromagnetic release 441, the electromagnetic release 441 contracts. One end of the active locking member 442 is sleeved onto the output end of the electromagnetic release 441, and the other end is hinged to the internal structure of the housing 1, enabling the active locking member 442 to rotate in the second direction X. When the output end of the electromagnetic release 441 contracts, the active locking member 442 rotates away from the test passive component 42. The active locking member 442 defines a limiting notch 4421, which the passive locking member 423 in the test passive component 42 can mate with. When the movable member 431 is in the first position, the passive locking member 423 passes through the limiting notch 4421. The active locking member 442 now limits the movable member 421 in the first direction Y, thereby locking the test passive component 42.
[0057] When the first elastic conductive member 45 is not in contact with the second elastic conductive member 46 , the active locking member 442 locks the test passive component 42 , restricting the movement of the test passive component 42 in the first direction Y. Specifically, the movable member 421 is pressed down, causing the passive locking member 423 connected to the movable member 421 to be located in the limiting notch 4421 of the active locking member 442 , restricting the movable member 421 from returning to its original position via the spring 422 . At this time, the abutting protrusion 4212 on the movable member 421 abuts against the moving member 431 , forcing the moving member 431 to be in the first position. The moving member 431 causes the second elastic conductive member 46 to deform toward the first elastic conductive member 45 . At this time, the closest distance between the first elastic conductive member 45 and the second elastic conductive member 46 is the first distance. When the staff presses the test button 411, the drive column 413 drives the first elastic conductive part 45 to deform and contact the second elastic conductive part 46, thereby turning on the test circuit. There is a leakage current in the circuit, which causes the output end of the electromagnetic release 441 to contract, driving the active locking part 442 to rotate in the direction away from the passive locking part 423, thereby causing the passive locking part 423 to disengage from the limiting notch 4421. At this time, since the passive locking member 423 is disengaged from the limiting notch 4421, there is no restraining force in the first direction Y, and the elastic force of the spring 422 causes the movable member 421 to move upward. During the upward movement of the movable member 421, the movable member 431 slowly transitions from abutting against the abutting protrusion 4212 to abutting against the abutting surface 4211. The movable member 431 is also driven by the limiting spring 4315 to ensure that the movable member 431 can always abut against the movable member 421 along the second direction X. Since the movable member 431 moves to the second position, the squeezing force on the second elastic conductive member 46 toward the first elastic conductive member 45 The second elastic conductive member 46 also disappears, so that the second elastic conductive member 46 relies on its own elasticity to return to its original shape in the direction away from the first elastic conductive member 45. At this time, the second elastic conductive member 46 is disconnected from the first elastic conductive member 45 and the minimum distance between the two is the second distance. The deformation of the first elastic conductive member 45 is less than the second distance, resulting in that no matter how the tester continues to press the test button 411 at this time, the first elastic conductive member 45 cannot contact the second elastic conductive member 46, that is, the test circuit will not be turned on, and no current will pass through the electromagnetic release 441, effectively preventing the electromagnetic release 441 from being burned out due to being in the on state for a long time.
[0058] At the same time, this application uses specific terms to describe the embodiments of this application. For example, "one embodiment," "an embodiment," and / or "some embodiments" refer to a certain feature, structure, or characteristic related to at least one embodiment of this application. Therefore, it should be emphasized and noted that "one embodiment," "an embodiment," or "an alternative embodiment" mentioned twice or multiple times in different locations in this specification does not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of this application may be appropriately combined.
[0059] Similarly, it should be noted that, in order to simplify the description of the present disclosure and thus facilitate understanding of one or more embodiments of the present disclosure, the foregoing description of the embodiments of the present disclosure sometimes combines multiple features into a single embodiment, figure, or description thereof. However, this disclosure method does not mean that the present disclosure requires more features than those recited in the claims. In fact, the features of the embodiments may be fewer than the total features of the individual embodiments disclosed above.
Claims
1. A leakage test switch, characterized in that: include: Testing active components (41); Testing passive components (42); A linkage component (43) is provided between the active test component (41) and the passive test component (42), and the linkage component (43) abuts against the passive test component (42); A trip locking component (44) is provided between the test active component (41) and the test passive component (42), and the trip locking component (44) is used to lock or release the test passive component (42); a first elastic conductive member (45) and a second elastic conductive member (46), wherein the first elastic conductive member (45) abuts against the active test component (41), and the second elastic conductive member (46) abuts against the linkage component (43); When no current flows through the trip locking assembly (44) and the test passive assembly (42) is locked, the linkage assembly (43) is in the first position, and the test passive assembly (42) deforms the second elastic conductive member (46) by abutting against the linkage assembly (43); When current passes through the trip locking component (44) and the test passive component (42) is released, the test passive component (42) releases force on the linkage component (43), the linkage component (43) is in the second position, and the linkage component (43) drives the second elastic conductive member (46) to restore to its original state; when the linkage component (43) is in the first position, the minimum distance between the first elastic conductive member (45) and the second elastic conductive member (46) is the first distance, and when the linkage component (43) is in the second position, the minimum distance between the first elastic conductive member (45) and the second elastic conductive member (46) is the second distance, and the deformation amount of the first elastic conductive member (45) driven by the test active component (41) toward the second elastic conductive member (46) is greater than or equal to the first distance and less than the second distance.
2. The leakage test switch according to claim 1, characterized in that: The leakage test switch (4) has a first direction (Y) and a second direction (X); the linkage assembly (43) includes a moving member (431); the moving member (431) is arranged at the top of the tripping locking assembly (44) in the first direction (Y), and is located between the active test assembly (41) and the passive test assembly (42); the moving member (431) abuts against the second elastic conductive member (46) along one side of the second direction (X), and abuts against the passive test assembly (42) along the other side of the second direction (X).
3. The leakage test switch according to claim 2, characterized in that: When the test passive component (42) moves along the first direction (Y) and the trip locking component (44) locks the test passive component (42), the moving member (431) is spaced apart from the trip locking component (44) along the second direction (X) on the side away from the test passive component (42), the moving member (431) is in the first position, and the second elastic conductive member (46) is deformed toward the first elastic conductive member (45) under the action of the moving member (431).
4. The leakage test switch according to claim 3, characterized in that: The moving member (431) comprises a moving section (4311), a first abutting section (4312), and a second abutting section (4313), wherein the first abutting section (4312) and the second abutting section (4313) are respectively connected to two ends of the moving section (4311) along the second direction (X); When the moving member (431) is in the first position, the first abutting section (4312) is spaced apart from the tripping locking component (44) and abuts against the second elastic conductive member (46), causing the second elastic conductive member (46) to deform toward the first elastic conductive member (45), and the second abutting section (4313) abuts against the test passive component (42); When the moving member (431) is in the second position, the first abutting section (4312) contacts the tripping locking component (44), the second elastic conductive member (46) returns to its original shape and abuts against the first abutting section (4312), and the second abutting section (4313) abuts against the test passive component (42); The second abutting section (4313) of the moving member (431) when it is in the first position and the second abutting section (4313) when it is in the second position respectively abut against different positions of the test passive component (42).
5. The leakage test switch according to claim 4, characterized in that: The movable member (431) further includes a limiting section (4314), and the linkage assembly (43) further includes a limiting spring (4315). One end of the limiting section (4314) along the first direction (Y) is connected to one end of the movable section (4311) close to the first abutting section (4312). The limiting spring (4315) is arranged between the limiting section (4314) and the test active assembly (41) and is connected to the limiting section (4314). The elastic force direction of the limiting spring (4315) is the second direction (X).
6. The leakage test switch according to claim 4, characterized in that: The test passive component (42) comprises a passive movable part (421) having elastic properties, the passive movable part (421) being provided with an abutting surface (4211) on a side facing the moving part (431), and the abutting surface (4211) being provided with an abutting protrusion (4212) protruding in a direction facing the moving part (431); When the moving member (431) is in the first position, the abutting protrusion (4212) abuts against the second abutting section (4313); when the moving member (431) is in the second position, the abutting surface (4211) abuts against the second abutting section (4313).
7. The leakage test switch according to claim 6, characterized in that: The abutting protrusion (4212) is an arc-shaped protrusion and the abutting protrusion (4212) is connected to the abutting surface (4211) in an arc shape. The second abutting section (4313) is U-shaped. The abutment between the second abutting section (4313) and the abutting protrusion (4212) is the abutment of two arc-shaped surfaces. The abutment between the second abutting section (4313) and the abutting surface (4211) is also the abutment of two arc-shaped surfaces.
8. The leakage test switch according to claim 1, wherein: The leakage test switch (4) has a first direction (Y), the test active component (41) comprises a test button (411), a reset spring (412) and a drive column (413), the drive column (413) is connected to the test button (411), the reset spring (412) is sleeved on the drive column (413), and the side of the drive column (413) facing away from the test button (411) along the first direction (Y) can abut against the first elastic conductive member (45).
9. The leakage test switch according to claim 1, wherein: The leakage test switch (4) has a first direction (Y) and a second direction (X); the tripping and locking assembly (44) comprises an electromagnetic tripper (441) and an active locking member (442); the electromagnetic tripper (441) is arranged between the active test assembly (41) and the passive test assembly (42); and the output end of the electromagnetic tripper (441) is connected to the active locking member (442); When the first elastic conductive member (45) and the second elastic conductive member (46) are not in contact, the active locking member (442) locks the test passive component (42) to constrain the movement of the test passive component (42) in the first direction (Y); when the first elastic conductive member (45) and the second elastic conductive member (46) are in contact and form a loop with leakage current, the electromagnetic release (441) drives the active locking member (442) to move along the second direction (X) to cancel the constraint of the active locking member (442) on the test passive component (42) in the first direction (Y).
10. A circuit breaker, characterized in that: It comprises the leakage test switch (4) according to any one of claims 1 to 9.