Probe with multi-point riveting structure

Abstract

The utility model discloses a probe with a multi-point riveting structure, which relates to the technical field of probes, and comprises a needle tube, one end of the needle tube is provided with a measuring head assembly, the other end of the needle tube is provided with a positioning assembly, the outer wall of one end of the needle tube close to the measuring head assembly is provided with a riveting point, and the riveting point is provided with a positioning hole. The number of the riveting points is eight, a moving groove is formed in the needle tube, a compression spring is arranged in the moving groove, the measuring head assembly comprises a crown measuring head and a first connecting base, a second connecting base is arranged on one side of the first connecting base, and the first connecting base and the second connecting base are of an integrated structure. According to the scheme, the problems that in an existing spring probe riveting technology, the number of riveting points is insufficient, the riveting strength is insufficient, and the position precision is not high are solved, the requirement for precise and efficient testing of semiconductor chips cannot be met, and the testing effect is poor are solved.

Description

Technical Field

[0001] The utility model relates to the technical field of probes, in particular to a probe with a multi-point riveting structure. Background Art

[0002] With the rapid development of electronic technology, the requirements for testing electronic components are becoming increasingly higher. As a key tool in electronic testing, the performance of ICT probes directly affects the accuracy and efficiency of testing.

[0003] For example, the Chinese authorized patent with publication number CN206193057U (a crown probe probe) comprises an outer tube and a crown probe, with a spring assembly disposed within the outer tube. Openings 1 and 2 are defined at either end of the outer tube, respectively. The inner wall of one of the outer tube openings is internally threaded. A fixing plug is disposed outside the outer tube opening, with external threads matching the internal threads of the outer tube. A spring positioning rod is secured to the fixing plug. The spring positioning rod comprises a connecting rod and a positioning head. One end of the spring assembly is sleeved onto the positioning head, and the other end of the spring assembly is provided with a connecting rod assembly. The connecting rod assembly comprises a first rod and a second rod. Rod second has a mounting hole. The crown probe is secured to rod second via a first and a second set screw. This utility model has the advantages of high precision and ease of replacement of the crown probe.

[0004] However, the existing spring probe riveting technology has problems such as insufficient number of riveting points, insufficient riveting strength, and low positioning accuracy. It cannot meet the needs of accurate and efficient testing of semiconductor chips, resulting in poor testing results. Therefore, it does not meet the existing needs. We propose a probe with a multi-point riveting structure. Utility Model Content

[0005] The purpose of the present utility model is to provide a probe with a multi-point riveting structure to solve the problems of insufficient number of riveting points, insufficient riveting strength, low positioning accuracy, etc. in the existing spring probe riveting technology proposed in the above background technology, which cannot meet the needs of accurate and efficient testing of semiconductor chips, resulting in poor testing results.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solution: a probe with a multi-point riveting structure, comprising: a needle tube, a probe assembly is provided at one end of the needle tube, a positioning assembly is provided at the other end of the needle tube, a rivet point is provided on the outer wall of the needle tube near one end of the probe assembly, and there are eight rivet points, a movable groove is provided inside the needle tube, and a compression spring is provided inside the movable groove.

[0007] Preferably, the probe assembly includes a crown probe and a first connecting seat, a second connecting seat is provided on one side of the first connecting seat, and the first connecting seat and the second connecting seat are an integrated structure, an inner groove is provided on the outer surface of the connection between the first connecting seat and the second connecting seat, a first tip socket is provided at one end of the second connecting seat, and one end of the first tip socket is inserted into one end of the compression spring, and one end of the compression spring is in contact with the second connecting seat.

[0008] Preferably, the positioning assembly includes a positioning rod and a limiting body, a second tip socket is provided on one side of the limiting body, and one end of the second tip socket is inserted into the other end of the compression spring, and the other end of the compression spring abuts against the limiting body.

[0009] Preferably, a positioning head is provided at the other end of the positioning rod, and the positioning head and the positioning rod are an integral structure.

[0010] Preferably, a limiting groove is provided on one side surface of the positioning rod, and the limiting groove and the positioning rod are an integral structure.

[0011] Preferably, one end of the movable slot is a first opening, and the probe assembly moves along the first opening; the other end of the movable slot is provided with a second opening, and the positioning assembly moves along the second opening; a limiting block is provided at one side edge of the second opening, and the limiting block moves along the limiting slot.

[0012] Preferably, the needle tube, probe assembly and positioning assembly are all made of tungsten-copper alloy material, and the outer surface is electroplated with gold.

[0013] Compared with the prior art, the beneficial effects of the present invention are:

[0014] 1. The utility model sets eight rivet points at one end of the needle tube close to the probe assembly, uses a high-precision positioning mold to accurately place the spring probe at the predetermined position, and determines the positions of the eight rivet points, which greatly improves the connection density and complexity between the probe and the test circuit, meets higher-level test requirements, reduces electrical connection problems caused by position deviation, improves test accuracy, and improves the reliability of the spring probe in long-term use and complex test environments. The reliable multi-point riveting structure enables the test of semiconductor chips to be carried out more efficiently, reduces test interruptions and repeated tests caused by probe connection problems, and solves the problems of insufficient number of riveting points, insufficient riveting strength, and low position accuracy in the existing spring probe riveting technology, which cannot meet the needs of accurate and efficient testing of semiconductor chips, resulting in poor test results.

[0015] 2. By setting a limit groove on one side surface of the positioning rod and a limit block at the edge of one side of the second opening, when the needle tube moves, the limit block moves along the limit groove, thereby limiting the movement of the needle tube and preventing rotation, thereby preventing the compression spring from being subjected to force due to rotation, thereby affecting the position and effect of the needle tube movement, improving the accuracy and stability of the probe test, and preventing the compression spring from being damaged by friction due to rotation, thereby increasing its service life. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0017] Figure 2 This is a schematic diagram of the structure of the utility model after the needle tube is removed;

[0018] Figure 3 This is a schematic diagram of the left side structure of the needle tube of the present invention;

[0019] Figure 4 This is a schematic diagram of the rear side structure of the needle tube of the present invention;

[0020] In the figure: 1. needle tube; 2. probe assembly; 3. rivet point; 4. positioning assembly; 5. positioning rod; 6. limit groove; 7. limit block; 8. positioning head; 9. compression spring; 10. crown probe; 11. first connecting seat; 12. second connecting seat; 13. first tip socket; 14. inner groove; 15. limit body; 16. second tip socket; 17. movable groove; 18. first opening; 19. second opening. DETAILED DESCRIPTION

[0021] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0022] See also Figure 1-4The utility model provides an embodiment: a probe with a multi-point riveting structure, comprising: a needle tube 1, a probe assembly 2 is provided at one end of the needle tube 1, a positioning assembly 4 is provided at the other end of the needle tube 1, a rivet point 3 is provided on the outer wall of the needle tube 1 near one end of the probe assembly 2, and there are eight rivet points 3, a movable groove 17 is provided inside the needle tube 1, a compression spring 9 is provided inside the movable groove 17, the probe assembly 2 includes a crown probe 10 and a first connecting seat 11, a second connecting seat 12 is provided on one side of the first connecting seat 11, and the first connecting seat 11 and the second connecting seat 12 are an integrated structure, the first connecting seat 1 1 and the second connecting seat 12 are connected with an inner groove 14 on the outer surface, and the second connecting seat 12 is provided with a first tip socket 13 at one end, and one end of the first tip socket 13 is inserted into the interior of one end of the compression spring 9, and one end of the compression spring 9 is in contact with the second connecting seat 12. The positioning assembly 4 includes a positioning rod 5 and a limiting body 15. A second tip socket 16 is provided on one side of the limiting body 15, and one end of the second tip socket 16 is inserted into the interior of the other end of the compression spring 9, and the other end of the compression spring 9 is in contact with the limiting body 15. The other end of the positioning rod 5 is provided with a positioning head 8, and the positioning head 8 and the positioning rod 5 are an integral structure.

[0023] After the crown probe 10 is pressurized, the needle tube 1 moves along the positioning rod 5 to squeeze the compression spring 9. A high-precision positioning mold is used to accurately place the spring probe at the predetermined position to determine the positions of the eight rivet points 3, which greatly improves the connection density and complexity between the probe and the test circuit, meets higher-level test requirements, reduces electrical connection problems caused by position deviation, improves test accuracy, and improves the reliability of the spring probe in long-term use and complex test environments. The reliable multi-point riveting structure enables the testing of semiconductor chips to be carried out more efficiently, reducing test interruptions and repeated tests caused by probe connection problems.

[0024] See also Figure 1-4 A limiting groove 6 is provided on one side surface of the positioning rod 5, and the limiting groove 6 and the positioning rod 5 are an integrated structure. One end of the movable groove 17 is a first opening 18, and the probe assembly 2 moves along the first opening 18. A second opening 19 is provided at the other end of the movable groove 17, and the positioning assembly 4 moves along the second opening 19. A limiting block 7 is provided at one edge of the second opening 19, and the limiting block 7 moves along the limiting groove 6. When the needle tube 1 moves, the limiting block 7 moves along the limiting groove 6, which has a limiting effect on the movement of the needle tube 1 and avoids rotation, thereby avoiding the compression spring 9 from being subjected to force due to rotation, thereby affecting the position and effect of the movement of the needle tube 1, improving the accuracy and stability of the probe test, and preventing the compression spring 9 from being damaged by friction due to rotation, thereby improving the service life.

[0025] See also Figure 1The needle tube 1, probe assembly 2 and positioning assembly 4 are all made of tungsten-copper alloy material, and the outer surface is electroplated with gold, so that the probe has good conductivity, elasticity and wear resistance. By electroplating gold on the outer surface, the oxidation resistance and corrosion resistance of the probe are improved.

[0026] Working principle: When in use, insert one end of the positioning rod 5 of the positioning assembly 4 along the first opening 18, and then move out from the second opening 19, and the limiting body 15 has a limiting effect due to the size difference with the second opening 19, and is located inside the needle tube 1, and then put the compression spring 9 into the needle tube 1, and the probe assembly 2 has one end of the first tip socket 13 inserted into the needle tube 1 along the first opening 18, and one end of the first tip socket 13 is inserted into one end of the compression spring 9, and one end of the compression spring 9 is abutted against the second connecting seat 12, the crown probe 10 is located outside the first opening 18, and one end of the second tip socket 16 is inserted into the other end of the compression spring 9, and the compression spring 9 The other end is in contact with the limit body 15. After the crown probe 10 is pressurized, the needle tube 1 moves along the positioning rod 5 to squeeze the compression spring 9. A high-precision positioning mold is used to accurately place the spring probe in the predetermined position and determine the positions of the eight rivet points 3. This greatly improves the connection density and complexity between the probe and the test circuit, meets higher-level test requirements, reduces electrical connection problems caused by position deviation, improves test accuracy, and improves the reliability of the spring probe in long-term use and complex test environments. The reliable multi-point riveting structure enables the testing of semiconductor chips to be carried out more efficiently, reducing test interruptions and repeated tests caused by probe connection problems.

[0027] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the present invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be encompassed within the present invention. Any reference sign in a claim should not be construed as limiting the claim to which it relates.

Claims

1. A probe with a multi-point riveted structure, comprising a needle tube (1), characterized in that: A probe assembly (2) is provided at one end of the needle tube (1), a positioning assembly (4) is provided at the other end of the needle tube (1), a rivet point (3) is provided on the outer wall of the needle tube (1) near one end of the probe assembly (2), and eight rivet points (3) are provided. A movable groove (17) is provided inside the needle tube (1), and a compression spring (9) is provided inside the movable groove (17).

2. The probe with a multi-point riveting structure according to claim 1, characterized in that: The probe assembly (2) includes a crown probe (10) and a first connecting seat (11), a second connecting seat (12) is provided on one side of the first connecting seat (11), and the first connecting seat (11) and the second connecting seat (12) are an integrated structure, an inner groove (14) is provided on the outer surface of the connection between the first connecting seat (11) and the second connecting seat (12), a first tip socket (13) is provided at one end of the second connecting seat (12), and one end of the first tip socket (13) is inserted into one end of the compression spring (9), and one end of the compression spring (9) is in contact with the second connecting seat (12).

3. The probe with a multi-point riveting structure according to claim 1, characterized in that: The positioning assembly (4) includes a positioning rod (5) and a limiting body (15), and a second tip socket (16) is provided on one side of the limiting body (15), and one end of the second tip socket (16) is inserted into the other end of the compression spring (9), and the other end of the compression spring (9) is in contact with the limiting body (15).

4. The probe with a multi-point riveting structure according to claim 3, characterized in that: A positioning head (8) is provided at the other end of the positioning rod (5), and the positioning head (8) and the positioning rod (5) are an integrated structure.

5. The probe with a multi-point riveting structure according to claim 3, characterized in that: A limiting groove (6) is provided on one side surface of the positioning rod (5), and the limiting groove (6) and the positioning rod (5) are an integrated structure.

6. The probe with a multi-point riveting structure according to claim 5, characterized in that: One end of the movable slot (17) is a first opening (18), and the probe assembly (2) moves along the first opening (18); the other end of the movable slot (17) is provided with a second opening (19), and the positioning assembly (4) moves along the second opening (19); a limiting block (7) is provided at an edge of one side of the second opening (19), and the limiting block (7) moves along the limiting slot (6).

7. The probe with a multi-point riveting structure according to claim 1, characterized in that: The needle tube (1), the probe assembly (2) and the positioning assembly (4) are all made of a tungsten-copper alloy material, and the outer surfaces are electroplated with gold.

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