Probe card with buffering function

Abstract

The utility model relates to the technical field of probe cards, and discloses a probe card with a buffer function, which comprises a shell, a probe plate is mounted in the middle of the shell, clamping rods are slidably connected to the front end and the rear end of the outer side of the top of the probe plate, and sliding strips are slidably connected to the sides, away from each other, of the two clamping rods. Rotating short columns are rotatably connected to the tops of the sliding strips, rotating circular plates are fixedly connected to the tops of the rotating short columns, connecting ropes are fixedly connected to the adjacent sides of the two rotating short columns, and a plurality of first springs are fixedly connected to the bottom of the probe plate at equal intervals. According to the utility model, when detection begins, the protective sleeve is rotated to enable the circular plate and the short column to rotate, the connecting rope is driven to wind the outer wall of the short column, the clamping rod moves along the sliding strip, the position of the probe plate is expanded, and after the size of the probe plate is selected according to the size of a chip, the second spring rebounds and is combined with the clamping rod, and the bottom of the probe plate is provided with a plurality of first springs for buffering.

Description

Technical Field

[0001] The utility model relates to the technical field of probe cards, in particular to a probe card with a buffer function. Background Art

[0002] A probe card with a buffering function is a semiconductor testing tool that is improved on the basis of the traditional probe card. In addition to its basic functions of ensuring that the signal of the test equipment can be transmitted to the chip test point and the chip feedback signal is transmitted back, it also adds a buffer structure to reduce the impact force during the contact between the probe and the chip and enhance the contact stability, thereby effectively protecting the chip and probe and improving test accuracy.

[0003] A search revealed a Chinese patent publication number of CN221883727U, which discloses a vertical probe card with a buffering function. The patent relates to the technical field of vertical probe cards and includes a detection housing having a guide hole formed in its upper surface and a carrier plate fixedly connected to its upper surface. A chip placement slot is fixedly connected to the upper surface of the carrier plate. The utility model utilizes a compression column mounted inside the buffer housing, which, in conjunction with a buffer pad, buffers the vertical downward pressure applied to the detection housing during vertical probe testing. Simultaneously, pressure is applied to the columnar buffer, causing it to change shape and squeeze outward. The squeezed plastic buffer block engages a push rod, pushing the compression plate inward, thereby compressing the buffer spring and providing buffering. The semicircular buffer plate, spring buffer rod, rubber buffer plate, and plastic buffer cooperate to gradually buffer the pressure, thereby improving the buffering effect. However, in the prior art, different chips vary in size, and probe cards with a buffering function are not well adapted to all types of chips, thereby reducing work efficiency. Utility Model Content

[0004] In order to make up for the above deficiencies, the present invention provides a probe card with a buffering function, aiming to improve the problem in the prior art that different chips have size differences and the probe card with a buffering function cannot be well adapted to all types of chips.

[0005] In order to achieve the above-mentioned purpose, the present invention adopts the following technical solutions: a probe card with a buffering function, comprising a shell, a probe board installed in the middle of the shell, the front and rear ends of the top outer side of the probe board are slidably connected to a locking rod, the two sides of the locking rods that are away from each other are slidably connected to a slide bar, the top of the slide bar is rotatably connected to a rotating short column, the top of the rotating short column is fixedly connected to a rotating circular plate, the adjacent sides of the two rotating short columns are fixedly connected to a connecting rope, the bottom of the probe board is equidistantly fixedly connected to a plurality of first springs, the bottom of the first spring is fixedly connected to a mounting base, square holes are provided on the left and right ends of the middle part of the locking rod, a second spring is installed in the middle of the square hole, and a disassembly mechanism is installed on the outside of the shell, and the disassembly mechanism is used for replacing the probe board.

[0006] As a further description of the above technical solution:

[0007] The disassembly mechanism includes a fixing ring, which is installed in the middle of the shell. Through holes are provided at the left and right ends of the fixing ring. A mounting column is rotatably connected inside the through hole. Threaded grooves are provided at the upper and lower ends of the outer sides of the mounting column. Fixing plates are installed at the upper and lower ends of the mounting column. A mounting piece is provided on the top of the fixing plate at the bottom. The right side of the fixing ring is rotatably connected to a rotating shaft.

[0008] As a further description of the above technical solution:

[0009] The front and rear ends of the top of the fixed plate are fixedly connected to a fixed circular plate, and the top of the fixed circular plate is fixedly connected to a handle.

[0010] As a further description of the above technical solution:

[0011] A mounting circular plate is installed on the top of the rotating circular plate.

[0012] As a further description of the above technical solution:

[0013] A protective cover is installed in the middle of the mounting circular plate, and a right-angle rod is installed on the outer side of the protective cover.

[0014] As a further description of the above technical solution:

[0015] A plurality of circular grooves are equidistantly formed on the top of the shell.

[0016] As a further description of the above technical solution:

[0017] A mounting ring is installed at the lower middle portion of the outer side of the shell.

[0018] As a further description of the above technical solution:

[0019] The outer side of the mounting ring is threaded with a plurality of screws at equal intervals.

[0020] The utility model has the following beneficial effects:

[0021] 1. In the present invention, when the detection starts, the protective cover is rotated to rotate the circular plate and the short column, driving the connecting rope to wrap around the outer wall of the short column, and the locking rod moves along the slide bar to expand the position of the probe plate. After the probe plate size is selected according to the chip size, the second spring rebounds and merges the locking rod. Multiple first springs are installed at the bottom of the probe plate for buffering.

[0022] 2. In the present invention, when inspecting, the handle is turned to rotate the mounting post, and the housing is opened and disassembled by utilizing the forward and reverse directions of the threaded groove. After reaching the top, the fixing plate can be removed through the bottom mounting piece, thereby quickly disassembling the device for inspection. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a three-dimensional diagram of a probe card with a buffering function proposed by the present invention;

[0024] Figure 2 This is a front view of a probe card with a buffering function proposed by the present invention;

[0025] Figure 3 This is a top view of a probe card with a buffering function proposed by the present invention;

[0026] Figure 4 This is a schematic diagram of the partial structure of a probe card with a buffer function proposed by the present invention;

[0027] Figure 5 This is a partial structural breakdown diagram of a probe card with a buffering function proposed in the present invention.

[0028] Legend:

[0029] 1. Housing; 2. Disassembly mechanism; 201. Fixing ring; 202. Through hole; 203. Threaded groove; 204. Mounting column; 205. Mounting piece; 206. Fixing plate; 207. Rotating shaft; 3. Circular groove; 4. Engaging rod; 5. Connecting rope; 6. Slide bar; 7. Protective cover; 8. Right-angle rod; 9. Rotating short column; 10. Mounting ring; 11. Screw; 12. Probe plate; 13. Fixed circular plate; 14. Mounting circular plate; 15. Rotating circular plate; 16. Handle; 17. First spring; 18. Mounting base plate; 19. Second spring; 20. Square hole. DETAILED DESCRIPTION

[0030] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0031] Reference Figure 1 、 Figure 2 and Figure 4 , the utility model provides an embodiment: a probe card with a buffer function, including a shell 1, a probe plate 12 is installed in the middle of the shell 1, the front and rear ends of the top outer side of the probe plate 12 are slidably connected to the clamping rod 4, the two clamping rods 4 are slidably connected to the away side of the two sliding bars 6, the top of the sliding bar 6 is rotatably connected to the rotating short column 9, through the installation of the sliding bar 6, the clamping rod 4 can move along a predetermined track, the top of the rotating short column 9 is fixedly connected to the rotating circular plate 15, the adjacent sides of the two rotating short columns 9 are fixedly connected to the connecting rope 5, the probe plate 12 A plurality of first springs 17 are fixedly connected to the bottom of the housing 1 at equal intervals, and a mounting base 18 is fixedly connected to the bottom of the first spring 17. The installation of the first spring 17 allows it to play a buffering role during detection. Square holes 20 are provided at the left and right ends of the middle of the locking rod 4, and a second spring 19 is installed in the middle of the square hole 20. A disassembly mechanism 2 is installed on the outside of the housing 1. The disassembly mechanism 2 is used for replacing the probe plate 12. A mounting circular plate 14 is installed on the top of the rotating circular plate 15, and a protective cover 7 is installed in the middle of the mounting circular plate 14. A right-angle rod 8 is installed on the outside of the protective cover 7.

[0032] Reference Figure 1 、 Figure 3 and Figure 5 The disassembly mechanism 2 includes a fixing ring 201, which is mounted on the middle part of the shell 1. The left and right ends of the fixing ring 201 are provided with through holes 202. The inside of the through hole 202 is rotatably connected to a mounting post 204. The upper and lower ends of the outer sides of the mounting post 204 are provided with threaded grooves 203. The opening directions of the threaded grooves 203 are opposite, so that the shell 1 can be disassembled. The upper and lower ends of the mounting post 204 are provided with fixing plates 206. The top of the bottom fixing plate 206 is provided with a mounting piece 205. The right side of the fixing ring 201 is rotatably connected to a rotating shaft 207. Through the installation of the rotating shaft 207, the device can be rotated and disassembled. The front and rear ends of the top fixing plate 206 are fixedly connected to the fixing circular plate 13. The top of the fixing circular plate 13 is fixedly connected to the handle 16, and the handle 16 can be used to rotate and take the whole.

[0033] Reference Figure 1 、 Figure 2 and Figure 3, a plurality of circular grooves 3 are equidistantly provided on the top of the shell 1 for locking, a mounting ring 10 is installed on the lower middle part of the outer side of the shell 1, and a plurality of screws 11 are equidistantly threaded on the outer side of the mounting ring 10, and the mounting ring 10 is fixed by the screws 11 to play a protective role;

[0034] Working principle: During the detection process, the protective cover 7 protected by the right-angle rods 8 on both sides is first rotated to rotate the rotating circular plate 15, thereby rotating the rotating short column 9. At this time, the connecting rope 5 will be wrapped around the outer wall of the rotating short column 9, and the locking rods 4 on both sides will slide along the track of the slide bar 6, thereby expanding the position of the probe plate 12. The size of the probe plate 12 can then be selected according to the size of the chip. After the selection is completed, the locking rods 4 are merged through the rebound of the second spring 19. During the detection process, multiple first springs 17 are installed at the bottom of the probe plate 12 to buffer the probe plate 12.

[0035] When the device needs to be repaired, the handles 16 on both sides are rotated to rotate the mounting posts 204 accordingly. Since the upper and lower ends of the threaded grooves 203 provided on the mounting posts 204 are opposite, the housing 1 can be disassembled. When the device is rotated to the top, the mounting piece 205 installed at the bottom allows the fixing plate 206 at the bottom to be removed, thereby allowing the device to be disassembled for repair. Through the above process, the device can be quickly disassembled, thereby facilitating the repair of the device.

[0036] Finally, it should be noted that the above are only preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent replacements for some of the technical features therein. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A probe card with a buffering function, comprising a housing (1), characterized in that: A probe plate (12) is installed in the middle of the shell (1), and the front and rear ends of the top outer side of the probe plate (12) are slidably connected to the locking rod (4), and the two sides of the locking rod (4) that are away from each other are slidably connected to the sliding bar (6), the top of the sliding bar (6) is rotatably connected to the rotating short column (9), the top of the rotating short column (9) is fixedly connected to the rotating circular plate (15), and the adjacent sides of the two rotating short columns (9) are fixedly connected to the connecting rope (5), and the bottom of the probe plate (12) is equidistantly fixedly connected to a plurality of first springs (17), and the bottom of the first spring (17) is fixedly connected to the mounting base (18), and the left and right ends of the middle part of the locking rod (4) are provided with square holes (20), and the middle of the square hole (20) is installed with a second spring (19), and the outer side of the shell (1) is installed with a disassembly mechanism (2), and the disassembly mechanism (2) is used for replacing the probe plate (12).

2. The probe card with a buffer function according to claim 1, wherein: The disassembly mechanism (2) comprises a fixing ring (201), the fixing ring (201) being mounted in the middle of the housing (1), the left and right ends of the fixing ring (201) being provided with through holes (202), the interior of the through hole (202) being rotatably connected to a mounting post (204), the upper and lower ends of the outer sides of the mounting post (204) being provided with threaded grooves (203), the upper and lower ends of the mounting post (204) being provided with fixing plates (206), the top of the fixing plate (206) being provided with a mounting piece (205), and the right side of the fixing ring (201) being rotatably connected to a rotating shaft (207).

3. The probe card with a buffer function according to claim 2, wherein: The front and rear ends of the top of the fixed plate (206) are fixedly connected to a fixed circular plate (13), and the top of the fixed circular plate (13) is fixedly connected to a handle (16).

4. The probe card with a buffer function according to claim 1, wherein: A mounting circular plate (14) is mounted on the top of the rotating circular plate (15).

5. The probe card with a buffer function according to claim 4, characterized in that: A protective cover (7) is installed in the middle of the mounting circular plate (14), and a right-angle rod (8) is installed on the outer side of the protective cover (7).

6. The probe card with a buffer function according to claim 1, wherein: A plurality of circular grooves (3) are equidistantly formed on the top of the housing (1).

7. The probe card with a buffer function according to claim 1, wherein: A mounting ring (10) is mounted on the lower middle portion of the outer side of the housing (1).

8. The probe card with a buffer function according to claim 7, characterized in that: The outer side of the mounting ring (10) is equidistantly threaded with a plurality of screws (11).

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