Combined test jig for TF (Trans Flash) card memory

Abstract

The utility model relates to the technical field of TF test racks, and discloses a TF card memory combined test rack comprising a rack body, the front surface of the rack body is provided with an installation groove, the installation groove is internally provided with a test groove, the inner wall of the test groove is fixedly provided with a detection pin, the front surface of the test groove is clamped with a cover plate, the back surface of the cover plate is fixedly provided with a pressing block, and the pressing block is provided with a clamping groove. An ejection mechanism is arranged in the test groove; the ejection mechanism comprises a plate groove, the plate groove is formed in the back face of the frame body, a pressing plate is clamped in the plate groove, by arranging the ejection mechanism, all TF cards can be ejected out of the testing groove at the same time, personnel can conveniently detach the TF cards after testing from the testing groove, and therefore the testing efficiency of the TF cards is improved, and the testing efficiency of the TF cards is improved. The problems that in the prior art, after the TF cards are clamped into the testing grooves to be tested, personnel need to pick out the TF cards from the testing grooves one by one, and the TF cards are small in size, so that the operation difficulty of the personnel is large, and the subsequent testing efficiency of the TF cards is affected are solved.

Description

Technical Field

[0001] The utility model relates to the technical field of TF test racks, in particular to a TF card memory combination test rack. Background Art

[0002] TF card, also known as MicroSD card, is a very small flash memory card invented by SanDisk. When testing TF card, a TF card test stand is usually used.

[0003] According to Chinese patent publication number CN216014820U, a TF card memory combination test stand is disclosed. It provides a press-type notch-type fixing structure through the provision of test slots and matching auxiliary structures. It uses groove limiters and a top press structure for fixation. It is stabilized by magnetic attraction between metal strips and magnetic strips. The external structure is made of insulating plastic, effectively avoiding the impact of metal and magnetic materials. The overall structure is more convenient to install and avoids damage to the TF card gold fingers and shell caused by the plug-in or snap-in structure.

[0004] However, in this technical solution, after the TF cards are inserted into the test slot and tested, personnel need to pick out the TF cards from the test slot one by one. Due to the small size of TF cards, it is difficult for personnel to operate, which affects the subsequent testing efficiency of the TF cards. Therefore, we propose a TF card storage combination test stand. Utility Model Content

[0005] The purpose of the utility model is to provide a TF card memory combination test stand to solve the problems in the background technology.

[0006] To achieve the above object, the present invention provides the following technical solution: a TF card memory combination test stand, comprising a frame, a mounting slot is defined on the front of the frame, a test slot is defined in the mounting slot, a detection pin is fixedly installed on the inner wall of the test slot, a cover is engaged with the front of the test slot, a pressure block is fixedly installed on the back of the cover, and an ejection mechanism is provided in the test slot;

[0007] The ejection mechanism includes a plate slot, which is opened on the back of the frame. A pressure plate is engaged in the plate slot, and a push rod is fixedly installed on the front of the pressure plate. A rod hole is opened between the inner wall of the plate slot and the inner wall of the test slot. The push rod is inserted into the rod hole, and a top pad is fixedly installed on one end of the push rod. A spring is fixedly installed between the inner side of the pressure plate near the four corners and the inner wall of the plate slot.

[0008] Preferably, the ejector rod is adapted to the rod hole, and a top pad is fixedly mounted on one end of the ejector rod. By providing the top pad, hard contact between the ejector rod and the TF card can be avoided, thereby providing a certain degree of protection for the TF card.

[0009] Preferably, limiting columns are fixedly installed on the inner side of the pressure plate near the four corners, and column grooves are opened on the inner wall of the plate groove. The limiting columns are inserted into the column grooves, and the spring surrounds the outer wall of the limiting columns. By setting the limiting columns, the spring can be limited to ensure the stability of the spring during compression.

[0010] Preferably, there are clamping blocks fixedly installed on both sides of the cover plate, and a clamping slot is opened between the front side of the frame and the inner wall of the installation slot. The clamping block is clamped in the clamping slot, and a magnetic block is fixedly installed on the inner wall of the slot. The magnetic block is magnetically connected to the clamping block. By setting the magnetic block, a certain adsorption stability effect can be achieved on the cover plate.

[0011] Preferably, the material of the block is iron, and the material of the top pad is wear-resistant rubber.

[0012] Preferably, a support block is fixedly installed on the back of the frame, a groove is opened on the back of the support block, and a suction cup is fixedly installed on the inner wall of the groove. By setting the support block, the frame can be supported on the placement table to prevent the components in the frame from being damaged by moisture and affecting the subsequent normal use. By setting the suction cup, the support block can be firmly adsorbed on the placement table through the suction cup, thereby improving the stability of the frame during use.

[0013] The utility model provides a TF card memory combination test stand. The TF card memory combination test stand has the following beneficial effects:

[0014] (1) The TF card memory combination test stand can eject all TF cards from the test slot at the same time by setting an ejection mechanism, which is convenient for personnel to remove the TF cards from the test slot after testing, thereby improving the testing efficiency of the TF cards. It solves the problem in the existing technical solution that after the TF cards are inserted into the test slot and the test is completed, personnel need to pick out the TF cards from the test slot one by one, which is difficult for personnel to operate due to the small size of the TF cards, thereby affecting the subsequent testing efficiency of the TF cards;

[0015] (2) The TF card memory combination test stand can support the frame on the placement table by setting a support block, so as to prevent the components in the frame from being damaged by moisture and affecting the subsequent normal use. In addition, by setting a suction cup, the support block can be firmly adsorbed on the placement table through the suction cup, thereby improving the stability of the frame during use. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a schematic diagram of the overall structure of the utility model;

[0017] Figure 2 This is a schematic diagram of the side sectional structure of the utility model;

[0018] Figure 3 This is a schematic diagram of the cross-sectional structure of the top of the limit column of the utility model;

[0019] Figure 4 This is a schematic diagram of the cross-sectional structure of the top of the card board of the utility model;

[0020] Figure 5 For this utility model Figure 2 A schematic diagram of the enlarged structure of the middle part A;

[0021] Figure 6 For this utility model Figure 3 A schematic diagram of the enlarged structure of the middle B part;

[0022] Figure 7 For this utility model Figure 4 Schematic diagram of the enlarged structure of part C in the middle.

[0023] In the figure: 1. frame; 2. mounting slot; 3. test slot; 4. detection pin; 5. ejection mechanism; 6. cover plate; 7. pressure block; 8. clamping block; 9. clamping slot; 10. magnetic block; 11. support block; 12. groove; 13. suction cup; 501. plate slot; 502. pressure plate; 503. ejector rod; 504. rod hole; 505. top pad; 506. limit column; 507. column slot; 508. spring. DETAILED DESCRIPTION

[0024] The following embodiments of the present invention are described in further detail with reference to the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0025] In the description of this utility model, unless otherwise specified, "plurality" means two or more; the terms "upper," "lower," "left," "right," "inner," "outer," "front end," "rear end," "head," "tail," etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of this utility model and simplify the description. They do not indicate or imply that the devices or components referred to must have a specific direction, be constructed, or operate in a specific direction, and therefore should not be construed as limiting this utility model. Furthermore, the terms "first," "second," "third," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0026] In the description of this utility model, it should be noted that, unless otherwise specified or limited, the terms "connected" and "connection" should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integral connection; mechanical connection, electrical connection; direct connection, or indirect connection through an intermediary. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0027] Example 1:

[0028] The TF card memory combination test stand provided by the utility model is preferably implemented as follows Figures 1 to 7 Figure 1 shows a TF card memory combination test stand, comprising a frame 1, a mounting slot 2 being defined on the front of the frame 1, a test slot 3 being defined in the mounting slot 2, a detection pin 4 being fixedly mounted on the inner wall of the test slot 3, a cover plate 6 being engaged with the front of the test slot 3, a pressure block 7 being fixedly mounted on the back of the cover plate 6, and an ejection mechanism 5 being provided in the test slot 3;

[0029] The ejection mechanism 5 includes a plate slot 501, which is opened on the back of the frame 1. A pressure plate 502 is engaged in the plate slot 501, and a push rod 503 is fixedly installed on the front of the pressure plate 502. A rod hole 504 is opened between the inner wall of the plate slot 501 and the inner wall of the test slot 3. The push rod 503 is inserted into the rod hole 504. A top pad 505 is fixedly installed on one end of the push rod 503. A spring 508 is fixedly installed between the inner side of the pressure plate 502 near the four corners and the inner wall of the plate slot 501.

[0030] Specifically, the above technical solution is that after the test of the TF card memory combination test stand is completed, the cover 6 can be opened, and then the pressure plate 502 is pressed. The pressure plate 502 will squeeze the spring 508, and the pressure plate 502 drives the push rod 503 to move toward the test slot 3, so that the push rod 503 pushes the TF card through the top pad 505, so that multiple TF cards are simultaneously separated from the test slot 3, thereby completing the removal of the TF card. Through the above structure, all TF cards can be ejected from the test slot 3 at the same time, which is convenient for personnel to remove the tested TF cards from the test slot 3, thereby improving the testing efficiency of the TF card, and solving the problem in the existing technical solution that after the TF card is inserted into the test slot 3 and the test is completed, the personnel need to pick out the TF cards from the test slot 3 one by one. Due to the small size of the TF card, it is difficult for the personnel to operate, thereby affecting the subsequent testing efficiency of the TF card.

[0031] Furthermore, the top rod 503 is adapted to the rod hole 504, and a top pad 505 is fixedly mounted on one end of the top rod 503;

[0032] The top pad 505 can avoid hard contact between the top rod 503 and the TF card, thereby protecting the TF card to a certain extent.

[0033] Furthermore, the inner side of the pressure plate 502 is fixedly installed near the four corners with limiting posts 506, the inner wall of the plate slot 501 is provided with post slots 507, the limiting posts 506 are inserted into the post slots 507, and the springs 508 are wrapped around the outer wall of the limiting posts 506;

[0034] The limiting column 506 can be provided to limit the spring 508 and ensure the stability of the spring 508 during compression.

[0035] Furthermore, a card block 8 is fixedly installed on both sides of the cover plate 6, and a card slot 9 is opened between the front of the frame 1 and the inner wall of the installation slot 2. The card block 8 is clamped in the card slot 9. A magnetic block 10 is fixedly installed on the inner wall of the card slot 9, and the magnetic block 10 is magnetically connected to the card block 8;

[0036] The magnetic block 10 can provide a certain adsorption stability to the cover plate 6 .

[0037] Furthermore, the material of the block 8 is iron, and the material of the top pad 505 is wear-resistant rubber.

[0038] Example 2:

[0039] On the basis of the first embodiment, the TF card memory combination test stand provided by the present invention is preferably implemented as follows: Figures 1 to 7 As shown: a support block 11 is fixedly installed on the back of the frame 1, a groove 12 is opened on the back of the support block 11, and a suction cup 13 is fixedly installed on the inner wall of the groove 12.

[0040] Specifically, the above technical solution is that by setting a support block 11, the frame 1 can be supported on the placement table to prevent the components in the frame 1 from being damaged by moisture and affecting subsequent normal use. By setting a suction cup 13, the support block 11 can be firmly adsorbed on the placement table through the suction cup 13, thereby improving the stability of the frame 1 during use.

[0041] The embodiments of the present invention are provided for purposes of illustration and description and are not intended to be exhaustive or to limit the present invention to the disclosed forms. Many modifications and variations will be apparent to those skilled in the art. The embodiments are selected and described to better illustrate the principles and practical applications of the present invention and to enable those skilled in the art to understand the present invention and design various embodiments with various modifications suitable for specific applications.

Claims

1. A TF card memory combination test stand, comprising a frame (1), characterized in that: The frame (1) has a mounting slot (2) on its front side, a test slot (3) in its mounting slot (2), a detection pin (4) fixedly mounted on the inner wall of the test slot (3), a cover plate (6) engaged on the front side of the test slot (3), a pressure block (7) fixedly mounted on the back side of the cover plate (6), and an ejection mechanism (5) provided in the test slot (3); The ejection mechanism (5) includes a plate slot (501), the plate slot (501) is provided on the back of the frame (1), a pressure plate (502) is engaged in the plate slot (501), a push rod (503) is fixedly installed on the front of the pressure plate (502), a rod hole (504) is provided between the inner wall of the plate slot (501) and the inner wall of the test slot (3), the push rod (503) is inserted into the rod hole (504), a top pad (505) is fixedly installed on one end of the push rod (503), and a spring (508) is fixedly installed between the inner side of the pressure plate (502) near the four corners and the inner wall of the plate slot (501).

2. A TF card memory combination test stand according to claim 1, characterized in that: The push rod (503) is adapted to the rod hole (504), and a top pad (505) is fixedly mounted on one end of the push rod (503).

3. The TF card memory combination test stand according to claim 1, wherein: Limiting columns (506) are fixedly installed on the inner side of the pressure plate (502) near the four corners, and column grooves (507) are opened on the inner wall of the plate groove (501). The limiting columns (506) are inserted into the column grooves (507), and the springs (508) are surrounded by the outer walls of the limiting columns (506).

4. The TF card memory combination test stand according to claim 1, wherein: Clamping blocks (8) are fixedly mounted on both sides of the cover plate (6); a clamping slot (9) is provided between the front surface of the frame (1) and the inner wall of the mounting slot (2); the clamping block (8) is clamped in the clamping slot (9); a magnetic block (10) is fixedly mounted on the inner wall of the clamping slot (9); and the magnetic block (10) is magnetically connected to the clamping block (8).

5. The TF card memory combination test stand according to claim 4, characterized in that: The material of the clamping block (8) is iron, and the material of the top pad (505) is wear-resistant rubber.

6. The TF card memory combination test stand according to claim 1, characterized in that: A support block (11) is fixedly mounted on the back of the frame (1), a groove (12) is provided on the back of the support block (11), and a suction cup (13) is fixedly mounted on the inner wall of the groove (12).

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