Device and system for feeding and discharging aging test board

Abstract

The utility model provides a device and a system for feeding and discharging an aging test board, the device at least comprises a support device (100) for supporting the aging test board (300), and the support device (100) is not contacted with a component on the back surface of the aging test board (300). According to the device and the system for loading and unloading the aging test board, provided by the utility model, the problem that in the prior art, in the process of placing the boss test board, a bracket is directly contacted with a component on the back surface of the board, so that the component is easily collided to be damaged or fall off can be avoided. Besides, the supporting device is made of an anti-static material and is matched with the ion fan for use, so that static accumulation can be avoided, and the electronic product is prevented from being damaged.

Description

Technical Field

[0001] The utility model belongs to the technical field of semiconductor testing, and relates to a device and a system for loading and unloading aging test boards. Background Art

[0002] In the field of semiconductor testing technology, burn-in testing involves conducting long-term tests on semiconductor products by simulating their operating environments to evaluate their reliability and stability in various environments. Because the components on burn-in test boards are delicate and fragile, and primarily located on the backside of the board, the design and material selection of the burn-in test board's support are crucial for protecting these components.

[0003] The process of fixing the chip to be tested on the aging test board is called the loading process, and the process of removing the tested chip from the aging test board is called the unloading process. During the loading and unloading process of the aging test, the aging test board usually needs to be supported and fixed by a support device to ensure the smooth loading and unloading. In the prior art, the aging test board support device directly contacts the components on the back of the test board. When the tester moves the board during loading and unloading, it is easy to knock off the components on the back. In addition, the aging test board support device in the prior art is not made of anti-static material. Therefore, during the loading and unloading operation, the static electricity generated by collision and friction cannot be neutralized, thereby causing static damage to the aging test board and the chip.

[0004] Therefore, how to solve the problem of direct contact between the supporting device and the components on the back of the aging test board and the problem of electrostatic damage has become an important issue that needs to be urgently solved by those skilled in the art. Utility Model Content

[0005] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a device and system for loading and unloading aging test boards, so as to solve the problems existing in the prior art.

[0006] To achieve the above-mentioned and other related purposes, the present invention provides a device for loading and unloading an aging test board, which at least includes a supporting device for supporting the aging test board, and the supporting device does not contact the components on the back of the aging test board.

[0007] In one embodiment, the support device includes a support device body and a plurality of support limiters, wherein the plurality of support limiters are protruding from the support device body and are located at the force balance point of the support device body.

[0008] In one embodiment, the bottom surface of the supporting device is a horizontal surface.

[0009] In one embodiment, any of the support and limiting members includes a connected supporting portion and a limiting portion; the limiting portion is higher than the supporting portion; the limiting portion is used to abut against the edge of the aging test board; and multiple supporting portions form a horizontal supporting surface for supporting the aging test board.

[0010] In one embodiment, the support portion protrudes at least 2 cm relative to the upper surface of the support device body.

[0011] In one embodiment, the top surface of the supporting portion of any one of the support and limiting members is a horizontal top surface, and the limiting portion thereof is formed with an abutting surface perpendicular to the horizontal top surface of the supporting portion.

[0012] In one embodiment, the number of the plurality of support and position-limiting members is greater than or equal to 2, and at least two support and position-limiting members are arranged opposite to each other.

[0013] In one embodiment, the support and limiting member is a support and limiting member made of anti-static material.

[0014] The utility model also provides a system for loading and unloading aging test boards, comprising the device as described above and an ion fan, wherein the ion fan acts on the device to provide an anti-static environment.

[0015] In one embodiment, the air outlet of the ion fan faces the supporting device, and the supporting device is located within the working range of the ion fan.

[0016] As described above, the present invention provides a device and system for loading and unloading aging test boards, which can avoid direct contact between components on the back of the aging test board and the supporting device, thereby avoiding the falling or damage of components due to contact and collision during the loading and unloading process by the tester; in addition, the supporting device provided in this application is made of anti-static material and is combined with an ion fan to avoid damage to electronic products caused by static electricity, ultimately reducing the failure rate of the aging test board to improve the efficiency of the aging test, while avoiding damage to the quality of electronic products, and is suitable for large-scale promotion and application in the semiconductor field and the field of electrostatic sensitive products. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 The figure shows one of the structural schematic diagrams of the device for loading and unloading aging test panels according to the present invention.

[0018] Figure 2 Shown is the second structural schematic diagram of the device for loading and unloading aging test panels according to the present invention.

[0019] Figure 3 Shown is a schematic diagram of the system structure for loading and unloading aging test panels according to the present invention.

[0020] Figures 1 to 3 Component number description

[0021] 100 Support device

[0022] 110 Support device body

[0023] 120 support limiter

[0024] 121 Support

[0025] 122 Limiting part

[0026] 200 ion fan

[0027] 300 aging test board DETAILED DESCRIPTION

[0028] The following describes the embodiments of the present invention through specific examples. Those skilled in the art will readily understand the other advantages and benefits of the present invention from the disclosure herein. The present invention may also be implemented or applied through various other specific embodiments, and the details in this specification may be modified or altered based on different perspectives and applications without departing from the spirit of the present invention.

[0029] See also Figures 1 to 3 It should be noted that the illustrations provided in this embodiment are merely schematic illustrations of the basic concept of the present invention. Therefore, the illustrations only show components relevant to the present invention and are not drawn according to the number, shape, and size of components in actual implementation. In actual implementation, the type, quantity, and proportion of each component may be arbitrarily changed, and the component layout may also be more complex.

[0030] like Figure 2 As shown, this embodiment provides a specific device for loading and unloading the aging test board 300, which at least includes a supporting device 100 for supporting the aging test board 300, and the supporting device 100 does not contact the components on the back of the aging test board 300.

[0031] Specifically, in a Figure 1 In the illustrated embodiment, the support device 100 includes a support device body 110 and a plurality of support limit members 120. The plurality of support limit members 120 are protruding from the support device body 110, and the aging test board 300 is supported and fixed by the support limit members 120; and are located at the force balance point of the support device body 110, so as to stably support the aging test board 300 and ensure smooth loading and unloading of the aging test board 300.

[0032] Specifically, the bottom surface of the supporting device 100 is a horizontal surface, so that the supporting device 100 can be placed stably.

[0033] In actual use, when the operator is loading and unloading materials for the aging test, the operator places the supporting device 100 steadily, and then places the aging test board 300 on the multiple supporting limit members 120. The aging test board 300 is steadily supported and fixed by the multiple supporting limit members 120, and the components on the back of the aging test board do not contact the supporting device 100, and then the loading and unloading operations are performed.

[0034] More specifically, the bottom surface of the support device 100 is rectangular, with a length of 45 to 80 cm, a width of 50 to 60 cm, and a thickness of 1 to 3 cm. As an example, the length of the bottom surface of the support device 100 can be 53 cm or 72 cm, the width can be 53 cm or 58 cm, and the thickness can be 2 cm. In the present application, the length and width of the bottom surface of the support device 100 are designed and adjusted according to the length and width of the aging test board 300 during the actual test to fully match the aging test board 300. In a Figure 1 and 2 In the specific embodiment shown, the bottom surface of the supporting device 100 is 72 cm long, 58 cm wide, and 2 cm thick.

[0035] In a Figure 1 and Figure 2 In the specific embodiment shown, any of the support and limiting members 120 includes a connected support portion 121 and a limiting portion 122; the limiting portion 122 is higher than the support portion 121; the limiting portion 122 is used to abut against the edge of the aging test board, so that the limiting portion 122 can play a role in limiting and clamping the aging test board 300; the multiple support portions 121 form a horizontal support surface for supporting the aging test board 300, so that the aging test board 300 can be stably supported by the support portion 121.

[0036] In a Figure 1 and Figure 2 In the specific embodiment shown, the support portion 121 protrudes at least 2 cm relative to the upper surface of the support device body 110, thereby providing sufficient space to accommodate the components on the aging test board 300 and avoid contact and collision between the components and the support device 100. In addition, the setting of this technical feature also leaves a certain amount of space, which makes it easier for operators to pick up and carry the aging test board 300 after loading and unloading.

[0037] More specifically, the height of the limiting portion 122 of the support limiting member 120 is 6 to 10 cm. As an example, the height of the limiting portion 122 includes but is not limited to 6 cm, 7 cm, and 8 cm. Figure 1 In the specific embodiment shown, the height of the limiting portion 122 is 6 cm.

[0038] More specifically, the support portion 121 is lower than the height of the limiting portion 122 and protrudes at least 2 cm from the upper surface of the support device body 110. As an example, the height of the support portion 121 is 3 cm, 4 cm, or 5 cm. In a specific embodiment shown in Figure 1, the height of the support portion 121 is 4 cm.

[0039] In a Figure 1 and Figure 2 In the specific embodiment shown, the top surface of the supporting portion 121 of any of the support limit members 120 is a horizontal top surface to stably support the aging test board 300; and its limiting portion 122 is formed with an abutting surface perpendicular to the horizontal top surface of the supporting portion 121, so that the limiting portion 122 can more stably abut and fix the aging test board 300.

[0040] More specifically, the support width of the top surface of the support portion 121 is 1 to 2 cm. As an example, the width of the top surface of the support portion 121 is 1 cm or 2 cm. Figure 1 In the specific embodiment shown, the support width of the top surface of the support portion 121 is 2 cm, so as to support the aging test board 300, and at the same time enable the aging test board 300 to be clamped and fixed by the abutting surface of the limiting portion 122. Multiple features cooperate with each other to stably support and clamp the aging test board 300.

[0041] Specifically, the number of the multiple support limiters 120 is greater than or equal to 2, and at least two support limiters 120 are arranged opposite to each other to ensure that the multiple support limiters 120 are located at the force balance point of the support device body 110.

[0042] As an example, the number of the support and limiting members 120 may be 2, 3 or 4. Figure 1 As shown, there are four support limiters 120, and they are arranged in pairs. The number and specific positions of the support limiters 120 can be selected and set according to actual needs.

[0043] Specifically, the support and position-limiting member 120 is a support and position-limiting member 120 made of an antistatic material. More specifically, the support device 100 is a support device 100 made of an antistatic material.

[0044] In this application, antistatic function is achieved by adding antistatic agents or conductive fillers to the material. As an example, the antistatic agent includes but is not limited to quaternary ammonium salts, sulfonates, and phosphates; the conductive filler includes but is not limited to conductive carbon black, carbon fiber, and metal powder; the antistatic material includes but is not limited to rubber or plastic added with antistatic agents or conductive fillers. Figure 1 and 2In the embodiment shown, the support device 100 is made of a rubber material with sulfonate added thereto.

[0045] More specifically, the electrostatic impedance of the support device made of antistatic material is 10 6 ~10 9 Ω. Within this range, it is possible to avoid as much as possible the static damage to electronic products caused by testers loading and unloading boards during the aging test.

[0046] like Figure 3 As shown, the present invention also provides a specific system for loading and unloading aging test boards, comprising the device as described above and an ion fan 200 , wherein the ion fan 200 acts on the device to provide an anti-static environment.

[0047] In this application, there is no specific requirement for the specifications, models and shapes of the ion fan 200. Any ion fan used in the prior art for eliminating static electricity can be used. As an example, the ion fan 200 can be a desktop ion fan, a horizontal ion fan, a hanging ion fan and a miniature ion fan; the electrostatic protection level can be level one, level two and level three, and the appropriate ion fan can be selected according to the specific usage scenario. Figure 1 In the specific embodiment shown, the electrostatic protection level of the ion fan 200 is level one, its model is Simco-XC2, the equilibrium voltage is 0±10V, and the dissipation time is less than 12 seconds at 180 cm.

[0048] Specifically, in the present application, there is no specific limitation on the relative position of the ion fan 200 and the support device 100, as long as the air outlet of the ion fan 200 faces the support device 100 and the support device 100 is within the working range of the ion fan 200. As an example, the ion fan 200 can be located above the support device 100 or in front of the support device 100. Figure 3 In the specific embodiment shown, the ion fan 200 is located 60 cm above the supporting device 100 , with the air outlet facing the supporting device 100 .

[0049] When the operator is loading and unloading the aging test, he first places the support device 100 steadily, then turns on the ion fan 200, and then places the aging test board 300 on the support device 100, so that the edges of the aging test board are supported and clamped by the multiple support limit members 120. Specifically, the aging test board is steadily supported by the support portion 121 of the support limit member 120, and its edge is clamped and fixed by the limit portion 122. At the same time, the components on the back of the aging test board do not contact the support device 100, and then the loading and unloading operations are performed.

[0050] In summary, the present invention provides a device and system for loading and unloading aging test boards, comprising a device and an ion fan. The present invention utilizes a support device to support the edge of the aging test board, thereby avoiding direct contact with components on the back of the board. Furthermore, the antistatic material of the support device, combined with the ion fan, further prevents the accumulation of static electricity caused by frictional contact, thereby avoiding potential damage to electronic products caused by static electricity. The device is suitable for large-scale application in the semiconductor and electrostatically sensitive product fields. Therefore, the present invention effectively overcomes the various shortcomings of the prior art and possesses high industrial value.

[0051] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the present invention. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical principles disclosed in the present invention are intended to be covered by the claims of the present invention.

Claims

1. A device for loading and unloading aging test panels, characterized in that: The invention at least comprises a supporting device (100) for supporting an aging test board (300), wherein the supporting device (100) does not contact components on the back of the aging test board (300); the supporting device (100) comprises a supporting device body (110) and a plurality of supporting stoppers (120), wherein the plurality of supporting stoppers (120) are protrudingly provided on the supporting device body (110) and are located at a force balance point of the supporting device body (110); The support and limiting member (120) is a support and limiting member (120) made of an anti-static material.

2. The device according to claim 1, characterized in that The bottom surface of the supporting device (100) is a horizontal surface.

3. The device according to claim 1, characterized in that Any of the support and limiting members (120) comprises a connected support portion (121) and a limiting portion (122); the limiting portion (122) is higher than the support portion (121); the limiting portion (122) is used to abut against the edge of the aging test board (300); and a plurality of support portions (121) form a horizontal support surface for supporting the aging test board (300).

4. The device according to claim 3, characterized in that The support portion (121) protrudes at least 2 cm relative to the upper surface of the support device body (110).

5. The device according to claim 1, characterized in that The top surface of the supporting portion (121) of any one of the support and limiting members (120) is a horizontal top surface, and the limiting portion (122) thereof is formed with an abutting surface perpendicular to the horizontal top surface of the supporting portion (121).

6. The device according to claim 1, characterized in that The number of the plurality of support and position-limiting members (120) is greater than or equal to 2, and at least two support and position-limiting members (120) are arranged opposite to each other.

7. A system for loading and unloading aging test panels, characterized in that: The invention comprises the device according to any one of claims 1 to 6 and an ion fan (200), wherein the ion fan (200) acts on the device to provide an anti-static environment.

8. The system according to claim 7, characterized in that The air outlet of the ion fan (200) faces the supporting device (100), and the supporting device (100) is located within the working range of the ion fan (200).

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