Test probe assembling jig

Abstract

The utility model discloses a test probe assembling jig which comprises a test probe assembling jig body, the lower end of the test probe assembling jig body is fixedly provided with a probe plate, and the lower end of the probe plate is fixedly connected with a mounting plate. By pressing the pressing block, the movable frame slides in the disassembly box, when the disassembly groove slides to the position aligned with the replacement groove, the test probe assembly jig body is lifted upwards, and the test probe assembly jig body of another model is placed on the disassembly box. The fixing clamping block on the test probe assembling jig body slides into the mounting groove from the replacing groove, the pressing block is loosened, the counter-acting force of the reset spring pushes the moving frame, the disassembling groove and the replacing groove are staggered, and therefore the test probe assembling jig body is rapidly replaced, and the structure is simple, operation is convenient, and the practicability is high. The replacement efficiency of the test probe assembly jig body is greatly improved, and the loss of the used bolt is also avoided.

Description

Technical Field

[0001] The utility model relates to the technical field of test probe assembly jigs, in particular to a test probe assembly jig. Background Art

[0002] The test probe assembly jig is an important tool for assembling and fixing test probes in the field of electronic testing. It is mainly used to connect the test substrate and the object under test, and to achieve quality inspection of the object under test by transmitting signals. The test probe assembly jig usually installs the test probe on the assembly jig, and then installs the assembled jig on the test equipment to detect the circuit board.

[0003] In the prior art, such as Chinese patent CN215263849U, a PCB board test assembly fixture is disclosed, including a base plate, a positioning plate, an upper pressure cover and a cylinder. The four corners of the upper surface of the base plate are provided with positioning columns vertically connected thereto, the positioning plate is arranged parallel to the base plate, and the four corners of the positioning plate are provided with through holes matching the positioning columns. The positioning columns are inserted into the through holes, and the positioning plate can be raised and lowered along the positioning columns. A buffer spring is provided between the bottom of the positioning plate and the top of the base plate; the upper surface of the positioning plate is provided with a groove matching the PCB board to be tested, and the groove is provided with a through hole facing the test point of the PCB board, the upper surface of the base plate is provided with a probe with one end facing the through hole, and the other end of the probe is connected to the conduction test equipment, the cylinder is provided directly above the groove, the upper pressure cover is arranged parallel to the positioning plate and facing the groove, the cylinder is used to drive the upper pressure cover to rise and fall vertically, and the size of the upper pressure cover is larger than the size of the groove.

[0004] Currently, most test probe assembly jigs are usually fixed with multiple bolts when installed on the test equipment. However, when used in large factories, they test a large variety of circuit boards, so the jigs need to be replaced frequently. The existing disassembly method is cumbersome, and bolts may be lost or the bolt threads may be damaged during repeated disassembly, making it inconvenient to use. Utility Model Content

[0005] The purpose of the present invention is to provide a test probe assembly jig to solve the problems raised in the above background technology.

[0006] The top end of the movable frame is fixed with a lifting mechanism, and the bottom end of the movable frame is fixed with a fixedly-mounted pin on the top end of the movable frame.

[0007] As a further preferred embodiment of the present technical solution, a plurality of test probe bodies are fixedly mounted on the middle portion of the upper end of the probe board, and the test probe bodies are located inside the test probe assembly fixture body.

[0008] As a further preferred embodiment of the present technical solution, positioning pins are fixedly connected to the four corners of the lower end of the mounting plate, and positioning holes are opened at the four corners of the upper end of the disassembly box, and the inner walls of the four positioning holes are respectively slidably connected to the outer surfaces of the four positioning pins.

[0009] As a further preferred embodiment of the present technical solution, the lower end of the disassembly box is fixedly connected to a base, a test bench is provided below the base, and fixing bolts are threadedly connected to the four corners of the base, and one end of the four fixing bolts is threadedly connected to the upper end of the test bench.

[0010] As a further preferred embodiment of the present technical solution, a support frame is fixedly connected to one side of the upper end of the test bench, a cylinder is fixedly installed on one side of the support frame, and a pressure plate is fixedly installed on the output end of the cylinder.

[0011] As a further preferred embodiment of the present technical solution, a guide groove is provided at the inner bottom of the disassembly box, a sliding block is fixedly connected to the lower end of the sliding plate 1, and an outer surface of the sliding block is slidably connected to the inner wall of the guide groove.

[0012] The utility model provides a test probe assembly fixture, which has the following beneficial effects:

[0013] (1) The utility model slides the movable frame in the disassembly box by pressing the pressing block. When the disassembly slot slides to a position aligned with the replacement slot, the test probe assembly jig body is lifted up, and another type of test probe assembly jig body is placed on the disassembly box. The fixed block on the test probe assembly jig body slides from the replacement slot to the installation slot, the pressing block is loosened, and the reaction force of the reset spring pushes the movable frame to misalign the disassembly slot with the replacement slot, thereby realizing rapid replacement of the test probe assembly jig body. This structure is simple and easy to operate, greatly improving the efficiency of replacing the test probe assembly jig body and avoiding the loss of used bolts.

[0014] (2) The present invention utilizes the structural design of the positioning holes and the positioning pins to accurately position the test probe assembly fixture body when it is placed on the disassembly box, thereby improving installation efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the three-dimensional structure of the test probe assembly fixture body and the test bench of the present invention;

[0016] Figure 2 This is a schematic diagram of the three-dimensional structure of the test probe assembly fixture body in the present invention;

[0017] Figure 3 This is a schematic diagram of the exploded structure of the test probe assembly fixture body in the present invention;

[0018] Figure 4 This is a schematic cross-sectional view of the disassembly box of the present invention;

[0019] Figure 5 for Figure 4 A partial enlarged schematic diagram of area A in the middle;

[0020] In the figure: 1. Test probe assembly fixture body; 11. Test probe body; 12. Probe plate; 13. Mounting plate; 14. Fixing block; 15. Locating pin; 16. Locating hole; 2. Disassembly box; 21. Base; 22. Fixing bolt; 23. Pressing block; 24. Replacement slot; 25. Reset spring; 26. Moving frame; 27. Sliding plate 1; 28. Disassembly slot; 29. ​​Mounting slot; 3. Test bench; 31. Support frame; 32. Cylinder; 33. Pressing plate; 4. Guide slot; 41. Sliding block. DETAILED DESCRIPTION

[0021] The technical solutions in the embodiments of the present invention will be described clearly and completely below with reference to the accompanying drawings in the embodiments of the present invention.

[0022] The utility model provides a technical solution: Figure 1 - Figure 5As shown, in this embodiment, a test probe assembly fixture includes a test probe assembly fixture body 1, a probe plate 12 is fixedly installed at the lower end of the test probe assembly fixture body 1, the lower end of the probe plate 12 is fixedly connected to a mounting plate 13, the lower end of the mounting plate 13 is fixedly connected to a fixed block 14, a disassembly box 2 is provided below the mounting plate 13, and a movable frame 26 is provided inside the disassembly box 2, a mounting slot 29 is provided on one side of the movable frame 26, a disassembly slot 28 is provided on the other side of the movable frame 26, one side of the disassembly slot 28 is connected through and communicated with one side of the mounting slot 29, a replacement slot 24 is provided at the upper end of the disassembly box 2, the fixed block 14 is slidably connected to the inner wall of the mounting slot 29, and both ends of the movable frame 26 are fixedly connected to a sliding plate 1 27, one side of one sliding plate 1 27 is fixedly connected to a plurality of return springs 25, and one end of the plurality of return springs 25 are connected to the inner wall of the disassembly box 2 One side of the wall is fixedly connected, and a pressing block 23 is slidably connected to the middle part of one side of the disassembly box 2. One side of the pressing block 23 is fixedly connected to the middle part of one side of another sliding plate 27. By pressing the pressing block 23, the movable frame 26 is slid in the disassembly box 2. When the disassembly slot 28 slides to a position aligned with the replacement slot 24, the test probe assembly jig body 1 is lifted up, and another type of test probe assembly jig body 1 is placed on the disassembly box 2. The fixed block 14 on the test probe assembly jig body 1 slides from the replacement slot 24 to the installation slot 29, and the pressing block 23 is loosened. The reaction force of the reset spring 25 pushes the movable frame 26 to misalign the disassembly slot 28 with the replacement slot 24, thereby realizing rapid replacement of the test probe assembly jig body 1. This structure is simple and easy to operate, which greatly improves the efficiency of replacing the test probe assembly jig body 1 and avoids the loss of bolts.

[0023] like Figure 2 and Figure 3 As shown, a plurality of test probe bodies 11 are fixedly installed in the middle of the upper end of the probe board 12. The test probe body 11 is located inside the test probe assembly jig body 1. The probe board 12 is used to install the test probe body 11, and the detection end of the test probe body 11 is inserted into the test probe assembly jig body 1, and the test probe body 11 detects the circuit board.

[0024] like Figure 3 As shown, positioning pins 15 are fixedly connected to the four corners of the lower end of the mounting plate 13, and positioning holes 16 are opened at the four corners of the upper end of the disassembly box 2. The inner walls of the four positioning holes 16 are respectively slidably connected to the outer surfaces of the four positioning pins 15. Through the structural design of the positioning holes 16 and the positioning pins 15, the test probe assembly fixture body 1 can be accurately positioned when placed on the disassembly box 2, thereby improving the installation efficiency.

[0025] like Figure 1 - Figure 3As shown, the lower end of the disassembly box 2 is fixedly connected to the base 21, and a test bench 3 is arranged below the base 21. The four corners of the base 21 are threadedly connected with fixing bolts 22, and one end of the four fixing bolts 22 is threadedly connected to the upper end of the test bench 3. Through the structural design of the base 21 and the fixing bolts 22, the disassembly box 2 can be removed from the test bench 3.

[0026] like Figure 1 As shown, a support frame 31 is fixedly connected to one side of the upper end of the test table 3, a cylinder 32 is fixedly installed on one side of the support frame 31, and a pressure plate 33 is fixedly installed on the output end of the cylinder 32. Through the structural design of the cylinder 32 and the pressure plate 33, the circuit board on the test probe assembly fixture body 1 can be fully contacted with the test probe body 11 to detect the circuit board.

[0027] like Figure 4 and Figure 5 As shown, a guide groove 4 is provided at the inner bottom of the disassembly box 2, and a sliding block 41 is fixedly connected to the lower end of the sliding plate 27. The outer surface of the sliding block 41 is slidably connected to the inner wall of the guide groove 4. The sliding direction of the movable frame 26 is limited by the structural design of the sliding block 41 and the guide groove 4.

[0028] The utility model provides a test probe assembly fixture, the specific working principle is as follows:

[0029] When using the test probe assembly jig to test the circuit board, first place the circuit board in the groove of the test probe assembly jig body 1, and the lower end of the circuit board contacts the needle of the test probe body 11. Then turn on the cylinder 32 to make the pressure plate 33 squeeze the circuit board, and the test probe body 11 detects the circuit board. When testing circuit boards of different models, press the pressing block 23 to slide the movable frame 26 in the disassembly box 2. When the disassembly slot 28 slides to a position aligned with the replacement slot 24, lift the test probe assembly jig body 1 upward and place another type of test probe assembly jig body 1 on the disassembly box 2. The fixed block 14 on the test probe assembly jig body 1 slides from the replacement slot 24 to the installation slot 29, loosen the pressing block 23, and the reaction force of the reset spring 25 pushes the movable frame 26 to misalign the disassembly slot 28 with the replacement slot 24, thereby realizing the replacement of the test probe assembly jig body 1, and then repeat the above operation for testing.

[0030] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test probe assembly jig, comprising a test probe assembly jig body (1), characterized in that: The lower end of the test probe assembly fixture body (1) is fixedly mounted with a probe plate (12), the lower end of the probe plate (12) is fixedly connected to a mounting plate (13), the lower end of the mounting plate (13) is fixedly connected to a fixed block (14), a disassembly box (2) is provided below the mounting plate (13), a movable frame (26) is provided inside the disassembly box (2), a mounting groove (29) is provided on one side of the movable frame (26), a disassembly groove (28) is provided on the other side of the movable frame (26), one side of the disassembly groove (28) is connected to one side of the mounting groove (29), and the disassembly box (26) is provided with a mounting groove (29). A replacement slot (24) is provided through the upper end of the disassembly box (2), the fixed block (14) is slidably connected to the inner wall of the mounting slot (29), and both ends of the movable frame (26) are fixedly connected to a sliding plate (27), one side of one of the sliding plates (27) is fixedly connected to a plurality of return springs (25), one end of each of the return springs (25) is fixedly connected to one side of the inner wall of the disassembly box (2), a pressing block (23) is slidably connected to the middle of one side of the disassembly box (2), and one side of the pressing block (23) is fixedly connected to the middle of one side of another of the sliding plates (27).

2. The test probe assembly jig according to claim 1, characterized in that: A plurality of test probe bodies (11) are fixedly mounted on the middle portion of the upper end of the probe plate (12), and the test probe bodies (11) are located inside the test probe assembly jig body (1).

3. The test probe assembly jig according to claim 1, characterized in that: The four corners of the lower end of the mounting plate (13) are fixedly connected with positioning pins (15), and the four corners of the upper end of the disassembly box (2) are provided with positioning holes (16), and the inner walls of the four positioning holes (16) are respectively slidably connected to the outer surfaces of the four positioning pins (15).

4. The test probe assembly jig according to claim 1, characterized in that: The lower end of the disassembly box (2) is fixedly connected to a base (21), a test bench (3) is provided below the base (21), four corners of the base (21) are threadedly connected to fixing bolts (22), and one end of each of the four fixing bolts (22) is threadedly connected to the upper end of the test bench (3).

5. The test probe assembly jig according to claim 4, characterized in that: A support frame (31) is fixedly connected to one side of the upper end of the test bench (3), a cylinder (32) is fixedly mounted on one side of the support frame (31), and a pressure plate (33) is fixedly mounted on the output end of the cylinder (32).

6. The test probe assembly jig according to claim 1, characterized in that: A guide groove (4) is provided at the inner bottom of the disassembly box (2), and a sliding block (41) is fixedly connected to the lower end of the sliding plate (27), and the outer surface of the sliding block (41) is slidably connected to the inner wall of the guide groove (4).

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