Pop-up chip test socket

Abstract

The utility model discloses a pop-up chip test seat, which comprises a base, and a switch is fixedly mounted on one side of the top surface of the base. A placing block is fixedly installed on the other side of the top surface of the base, a cover plate is connected to the top surface of the placing block in an attached mode, a threaded rod is connected to the middle of the top surface of the cover plate in a penetrating mode, a placing groove is formed in the placing block, and a connecting plate is rotationally connected to the bottom surface of the threaded rod. A plurality of sliding grooves are formed in the connecting plate; by arranging the sliding grooves, the sliding rods, the sliding blocks, the connecting rods, the supporting plates, the second springs, the ejector blocks and the pressing plates, and uniformly distributing the connecting rods, the second springs and the ejector blocks on the pressing plates, spring force can be uniformly transmitted to a chip when the pressing plates press the chip, so that the spring force borne by the chip is uniform, and the chip is prevented from being damaged. Therefore, the detection accuracy of the chip is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor test sockets, in particular to a pop-up chip test socket. Background Art

[0002] The chip test socket, also known as IC socket, is an inline device designed to meet the various packaging and testing requirements of IC chips. It is a static connector between the IC and the PCB, which makes chip replacement and testing more convenient. There is no need to constantly solder and remove the chip, which can effectively prevent damage to the chip and PCB, thereby achieving the purpose of fast and efficient testing.

[0003] Publication No. CN218848278U discloses a pop-up chip test socket. The upper cover and the base are connected together by using multiple spring support seats to achieve the positioning of the upper cover and the base. Since the upper cover floats up and down under the guidance of the spring support seats, the upper cover and the base can maintain a precisely positioned state regardless of whether the upper cover is popped up or pressed down. The drawer is installed in the drawer slot. There is a rib on the inside of the drawer slot. Therefore, when the drawer is pushed inward, the rib can position the drawer and the chip to ensure that the chip and the chip block are completely aligned. The upper cover can be popped open by pinching the connecting rod. After releasing the connecting rod, the buckle can be quickly reset. Closing the upper cover only requires pressing the protective cover. This can simplify the operation steps, reduce the movement range, make the test more efficient, and make the operation more convenient. However, the following problems still exist in actual use of this patent:

[0004] The upper cover and the base are connected together by using multiple spring support seats to achieve the positioning of the upper cover and the base. Since the upper cover floats up and down under the guidance of the spring support seats, the upper cover and the base can maintain a precisely positioned state regardless of whether the upper cover is popped up or pressed down; the pull-out method can make it more convenient to take and put chips, and the drawer is installed in the drawer slot. There is a rib on the inside of the drawer slot. Therefore, when the drawer is pushed inward, the rib can position the drawer and the chip to ensure that the chip and the chip block are completely aligned; the upper cover can be popped open by pinching the connecting rod, and the buckle can be quickly reset after releasing the connecting rod. To close the upper cover, you only need to press the protective cover, which can simplify the operation steps, reduce the movement amplitude, make the test more efficient and more convenient to operate. However, when testing the chip, the chip needs to be pressed to ensure the stability of the chip. However, when the chip is pressed, the spring force in the test seat may be uneven, which may cause uneven pressure distribution between the chip and the seat, thereby affecting the accuracy of the test results.

[0005] A pop-up chip test socket is proposed to solve the above problems. Utility Model Content

[0006] The present invention aims to provide a pop-up chip test socket to solve the problem proposed in the above-mentioned background technology that the upper cover and the base are currently connected together by using multiple spring support seats to achieve the positioning of the upper cover and the base. Since the upper cover floats up and down under the guidance of the spring support seats, the upper cover and the base can maintain a precisely positioned state whether the upper cover is popped up or pressed down; the chip can be more conveniently taken in and out by adopting a pull-out method. The drawer is installed in a drawer slot, and there is a rib on the inner side of the drawer slot. Therefore, when the drawer is pushed inward, the rib can position the drawer and the chip to ensure that the chip and the chip block are completely aligned; the upper cover can be popped open by pinching the connecting rod, and the buckle can be quickly reset after releasing the connecting rod. Closing the upper cover only requires pressing the protective cover, which can simplify the operation steps, reduce the movement range, make the test efficiency higher, and make the operation more convenient. However, when testing the chip, it is necessary to press the chip to ensure the stability of the chip. However, when pressing the chip, the spring force in the test socket may be uneven, which may lead to uneven pressure distribution between the chip and the socket, thereby affecting the accuracy of the test results.

[0007] To achieve the above object, the present invention provides the following technical solution: a pop-up chip test socket, comprising a base, a switch being fixedly mounted on one side of the top surface of the base;

[0008] A placement block is fixedly installed on the other side of the top surface of the base, the top surface of the placement block is fitted with a cover plate, a screw is connected through the middle of the top surface of the cover plate, a placement slot is opened inside the placement block, and the bottom surface of the screw is rotatably connected to a connecting plate;

[0009] Also includes:

[0010] A plurality of sliding grooves are provided inside the connecting plate;

[0011] Among them, sliding grooves are symmetrically opened on both sides of the slide groove, and sliding rods are fixedly installed inside the sliding grooves;

[0012] The surface of the sliding rod is slidably connected to a sliding block, and one side surface of the sliding block is fixedly connected to a connecting rod.

[0013] Preferably, a support plate is connected through a side surface of the connecting rod close to the middle, and a second spring is fixedly connected to the bottom surface of the support plate.

[0014] Preferably, the bottom surface of the second spring is fixedly connected to a top block, the second spring is sleeved and connected to a connecting rod, and the bottom surface of the connecting rod is fixedly connected to the top block.

[0015] Preferably, a pressure plate is fixedly connected to the bottom surface of the top block.

[0016] Preferably, the top surface of the placement block is symmetrically provided with engaging grooves on both sides, the inside of the engaging grooves is engaged with engaging blocks, and the top surface of the engaging blocks is fixedly connected to the cover plate.

[0017] Preferably, a limiting groove is provided on one side surface of the engaging block, the limiting groove is internally engaged with a limiting rod, and the limiting rod is away from the limiting groove and passes through one side surface of the placement block and is sleeved with a first spring.

[0018] Preferably, one side surface of the first spring is fixedly connected to the limiting rod, and the other side surface of the first spring is fixedly connected to the placement block.

[0019] Compared with the prior art, the beneficial effects of the present invention are as follows: the pop-up chip test seat is provided with a slide groove, a sliding groove, a sliding rod, a sliding block, a connecting rod, a support plate, a second spring, a top block and a pressure plate, and the connecting rod, the second spring and the top block are evenly distributed on the pressure plate, so that when the pressure plate presses the chip, the spring force can be evenly transmitted to the chip, so that the spring force exerted on the chip is uniform, thereby improving the detection accuracy of the chip. The specific contents are as follows:

[0020] 1. By arranging a slide groove, a sliding groove, a sliding rod, a sliding block, a connecting rod, a supporting plate, a second spring, a top block and a pressure plate, after the chip is placed inside the placement groove, the cover plate is clamped on the placement block, and the screw is rotated. At the same time, the screw and the cover plate are threadedly connected, so that the screw can descend when it rotates. At the same time, the screw and the connecting plate are rotatably connected, so that when the screw rotates and descends, it will not drive the rotation of the connecting plate, thereby causing the connecting plate to descend. Through the descent of the connecting plate, the pressure plate can contact with the chip, so that the pressure plate squeezes the chip, so that the chip contacts the seat, and at the same time, the force between the pressure plate and the chip will The movement of the pressure plate causes the pressure plate to squeeze the connecting rod, thereby causing the movement of the connecting rod to squeeze the second spring, thereby causing the second spring to deform. At the same time, the second spring is a compression spring in the prior art. According to the characteristics of the second spring, the second spring squeezes the pressure plate, thereby causing the pressure plate to squeeze the chip. At the same time, the connecting rod, the second spring and the top block are evenly distributed on the pressure plate, so that when the pressure plate presses the chip, the spring force can be evenly transmitted to the chip, thereby making the spring force on the chip uniform, thereby improving the detection accuracy of the chip.

[0021] 2. By setting the engaging groove, the engaging block, the limiting groove, the limiting rod and the first spring, and then engaging the cover plate with the placement block, the limiting rod is pulled to move to a certain position, and then the engaging block on the cover plate is inserted into the engaging groove, and the limiting rod is loosened, so that the limiting rod will drive the movement of the limiting rod under the action of the first spring, so that the limiting rod and the limiting groove are re-engaged together. At the same time, the first spring is also a compression spring in the prior art, and the elastic force of the first spring is relatively large, so that it can be ensured that the engaging block and the engaging groove can be more tightly engaged, so that the cover plate and the placement block can fit more tightly. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0023] Figure 2 This is a schematic diagram of the overall internal structure of the utility model;

[0024] Figure 3 This is a schematic diagram of the overall top view structure of the utility model;

[0025] Figure 4 For this utility model Figure 2 Schematic diagram of the enlarged structure of area A in the middle;

[0026] Figure 5 For this utility model Figure 2 Schematic diagram of the enlarged structure of area B in the middle.

[0027] In the figure: 1. Base; 2. Switch; 3. Placement block; 4. Cover plate; 5. Screw; 6. Placement slot; 7. Connecting plate; 8. Engaging slot; 9. Engaging block; 10. Limiting slot; 11. Limiting rod; 12. First spring; 13. Slide slot; 14. Sliding slot; 15. Sliding rod; 16. Sliding block; 17. Connecting rod; 18. Support plate; 19. Second spring; 20. Top block; 21. Pressing plate. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the implementation regulations described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0029] See also Figure 1-5The utility model provides a technical solution: a pop-up chip test seat, including a base 1, a switch 2 is fixedly installed on one side of the top surface of the base 1; a placement block 3 is fixedly installed on the other side of the top surface of the base 1, the top surface of the placement block 3 is fitted with a cover plate 4, a screw 5 is connected through the middle of the top surface of the cover plate 4, a placement groove 6 is opened inside the placement block 3, and the bottom surface of the screw 5 is rotatably connected to the connecting plate 7; it also includes: a plurality of sliding grooves 13 are opened inside the connecting plate 7; wherein, sliding grooves 14 are symmetrically opened on both sides of the sliding groove 13, and a sliding rod 15 is fixedly installed inside the sliding groove 14; wherein, a sliding block 16 is slidably connected to the surface of the sliding rod 15, and a connecting rod 17 is fixedly connected to one side surface of the sliding block 16, such as Figure 1-5 As shown, by setting the sliding groove 13, the sliding groove 14, the sliding rod 15, the sliding block 16, the connecting rod 17, the support plate 18, the second spring 19, the top block 20 and the pressure plate 21, the connecting rod 17, the second spring 19 and the top block 20 are evenly distributed on the pressure plate 21, so that when the pressure plate 21 presses the chip, the spring force can be evenly transmitted to the chip, so that the spring force exerted on the chip is uniform, thereby improving the detection accuracy of the chip, and the base 1, the switch 2 and the placement block 3 are all part of the test seat.

[0030] The connecting rod 17 is connected to a support plate 18 on one side surface near the middle. The bottom surface of the support plate 18 is fixedly connected to a second spring 19. The bottom surface of the second spring 19 is fixedly connected to a top block 20. The second spring 19 is sleeved and connected to the connecting rod 17. The bottom surface of the connecting rod 17 is fixedly connected to the top block 20. The bottom surface of the top block 20 is fixedly connected to a pressure plate 21. Figure 5As shown, by rotating the screw rod 5, the screw rod 5 and the cover plate 4 are connected by a threaded rotation, so that the screw rod 5 can descend when rotating. At the same time, the screw rod 5 and the connecting plate 7 are connected by rotation, so that when the screw rod 5 rotates and descends, it will not drive the rotation of the connecting plate 7, thereby causing the connecting plate 7 to descend. Through the descent of the connecting plate 7, the pressing plate 21 can be brought into contact with the chip, so that the pressing plate 21 squeezes the chip, so that the chip contacts the seat. At the same time, the force between the pressing plate 21 and the chip will cause the pressing plate 21 to move. Through the movement of the pressing plate 21, the pressing plate 21 will squeeze the connecting rod 17, thereby causing The movement of the connecting rod 17 will squeeze the second spring 19 through the movement of the connecting rod 17, thereby causing the second spring 19 to deform. At the same time, the second spring 19 is a compression spring in the prior art. Through the characteristics of the second spring 19, the second spring 19 will squeeze the pressure plate 21, so that the pressure plate 21 will squeeze the chip. At the same time, the connecting rod 17, the second spring 19 and the top block 20 are evenly distributed on the pressure plate 21, so that when the pressure plate 21 presses the chip, the spring force can be evenly transmitted to the chip, so that the spring force on the chip is uniform, thereby improving the detection accuracy of the chip.

[0031] The top surface of the placement block 3 is symmetrically provided with snap-fitting grooves 8 on both sides, and the snap-fitting grooves 8 are internally snap-fitted with snap-fitting blocks 9. The top surface of the snap-fitting block 9 is fixedly connected to the cover plate 4. A limiting groove 10 is provided on one side surface of the snap-fitting block 9. The limiting groove 10 is internally snap-fitted with a limiting rod 11. The limiting rod 11 is away from the limiting groove 10 and passes through one side surface of the placement block 3 and is sleeved with a first spring 12. One side surface of the first spring 12 is fixedly connected to the limiting rod 11, and the other side surface of the first spring 12 is fixedly connected to the placement block 3. Figure 4 As shown, when the cover plate 4 is engaged with the placement block 3, the limit rod 11 is pulled to move the limit rod 11 to a certain position, and then the engaging block 9 on the cover plate 4 is inserted into the engaging groove 8 and the limit rod 11 is loosened, so that the limit rod 11 will drive the movement of the limit rod 11 under the action of the first spring 12, thereby re-engaging the limit rod 11 with the limiting groove 10. At the same time, the first spring 12 is also a compression spring in the prior art, and the elastic force of the first spring 12 is relatively large, thereby ensuring that the engagement between the engaging block 9 and the engaging groove 8 can be tighter, thereby making the fit between the cover plate 4 and the placement block 3 tighter.

[0032] Working principle: Before using this pop-up chip test socket, you need to check the overall condition of the device to make sure it can work normally. Figure 1 - Figure 5As shown, first, after placing the chip inside the placement groove 6, the cover plate 4 is clamped on the placement block 3, and then the screw rod 5 is rotated. At the same time, the screw rod 5 and the cover plate 4 are threadedly connected, so that the screw rod 5 can descend when rotating. At the same time, the screw rod 5 and the connecting plate 7 are rotatably connected, so that when the screw 5 rotates and descends, it will not drive the rotation of the connecting plate 7, thereby causing the connecting plate 7 to descend. Through the descent of the connecting plate 7, the pressing plate 21 can be brought into contact with the chip, so that the pressing plate 21 squeezes the chip, so that the chip contacts the seat, and at the same time, the force between the pressing plate 21 and the chip will cause the movement of the pressing plate 21, and through the movement of the pressing plate 21, the pressing plate 21 The connecting rod 17 will be squeezed, thereby causing the connecting rod 17 to move. Through the movement of the connecting rod 17, the second spring 19 will be squeezed, thereby causing the second spring 19 to deform. At the same time, the second spring 19 is a compression spring in the prior art. Through the characteristics of the second spring 19, the second spring 19 will squeeze the pressure plate 21, thereby causing the pressure plate 21 to squeeze the chip. At the same time, the connecting rod 17, the second spring 19 and the top block 20 are evenly distributed on the pressure plate 21, so that when the pressure plate 21 presses the chip, the spring force can be evenly transmitted to the chip, so that the spring force on the chip is uniform, thereby improving the detection accuracy of the chip.

[0033] Secondly, when the cover plate 4 is engaged with the placement block 3, the limit rod 11 is pulled to move the limit rod 11 to a certain position, and then the engaging block 9 on the cover plate 4 is inserted into the engaging groove 8. By loosening the limit rod 11, the limit rod 11 will drive the movement of the limit rod 11 under the action of the first spring 12, so that the limit rod 11 and the limit groove 10 are re-engaged together. At the same time, the first spring 12 is also a compression spring in the prior art. The elastic force of the first spring 12 is relatively large, so that it can be ensured that the engagement between the engaging block 9 and the engaging groove 8 can be tighter, so that the fit between the cover plate 4 and the placement block 3 can be tighter.

[0034] Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments, or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A pop-up chip test socket, comprising a base (1), a switch (2) being fixedly mounted on one side of the top surface of the base (1); A placement block (3) is fixedly mounted on the other side of the top surface of the base (1); a cover plate (4) is fitted and connected to the top surface of the placement block (3); a screw rod (5) is connected through the middle of the top surface of the cover plate (4); a placement groove (6) is provided inside the placement block (3); and a connecting plate (7) is rotatably connected to the bottom surface of the screw rod (5); It is characterized by: Also includes: A plurality of sliding grooves (13) are provided inside the connecting plate (7); Wherein, sliding grooves (14) are symmetrically provided on both sides of the sliding groove (13), and a sliding rod (15) is fixedly installed inside the sliding groove (14); The surface of the sliding rod (15) is slidably connected to a sliding block (16), and one side surface of the sliding block (16) is fixedly connected to a connecting rod (17).

2. The pop-up chip test socket according to claim 1, characterized in that: A support plate (18) is connected through a side surface of the connecting rod (17) close to the middle, and a second spring (19) is fixedly connected to the bottom surface of the support plate (18).

3. The pop-up chip test socket according to claim 2, characterized in that: The bottom surface of the second spring (19) is fixedly connected to a top block (20), the second spring (19) is sleeve-connected to the connecting rod (17), and the bottom surface of the connecting rod (17) is fixedly connected to the top block (20).

4. The pop-up chip test socket according to claim 3, characterized in that: A pressing plate (21) is fixedly connected to the bottom surface of the top block (20).

5. The pop-up chip test socket according to claim 1, characterized in that: Clamping grooves (8) are symmetrically provided on both sides of the top surface of the placement block (3), and a clamping block (9) is clamped and connected inside the clamping groove (8), and the top surface of the clamping block (9) is fixedly connected to the cover plate (4).

6. The pop-up chip test socket according to claim 5, characterized in that: A limiting groove (10) is provided on one side surface of the engaging block (9), and a limiting rod (11) is connected to the inside of the limiting groove (10). The limiting rod (11) is away from the limiting groove (10) and passes through one side surface of the placement block (3) and is sleeved with a first spring (12).

7. The pop-up chip test socket according to claim 6, characterized in that: One side surface of the first spring (12) is fixedly connected to the limiting rod (11), and the other side surface of the first spring (12) is fixedly connected to the placement block (3).

Images