ATE-based RPS chip angle error test equipment
The ATE-based RPS chip angle error test equipment uses the dynamic rotation of the servo motor and motor encoder to calculate the angle error in real time, solving the problem of insufficient dynamic performance coverage in static testing and achieving efficient and accurate angle error measurement.
Patent Information
- Application Number
- CN202422595541.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-28
- Publication Date
- 2025-09-09
- Estimated Expiration
- 2034-10-28
AI Technical Summary
In the existing technology, static measurement of RPS chip angle error cannot cover its dynamic performance, resulting in large power consumption differences, low resolution and accuracy, low test efficiency, and inability to accurately measure hysteresis at different speeds.
An ATE-based RPS chip angular error test device is designed. It uses a servo motor and motor encoder to achieve dynamic rotation. The ATE test machine's integrated board collects signals and calculates the angular error in real time. It supports arbitrary speed testing in the range of 0-5000rpm.
It achieves high-precision angular error measurement of the RPS chip under dynamic conditions, improves test efficiency and accuracy, covers performance at different speeds, and solves the shortcomings of static testing.
Smart Images
Figure CN223319789U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of steering systems, in particular to an ATE-based RPS chip angle error testing device. Background Art
[0002] With the development of the automotive industry, electric power steering (EPS) has become an important component of modern automobiles. EPS uses vector control (FOC) to achieve torque control of permanent magnet synchronous motors. It is necessary to detect the physical position of the motor rotor in real time to calculate the spatial angle between the stator magnetic field and the rotor magnetic field, thereby decoupling the stator three-phase current. To obtain the motor rotor position chip (RPS), it is necessary to accurately output the motor rotor position to the EPS ECU. The difference between the output motor rotor position and the actual position of the motor rotor is called the angle error. If the angle error is large, it will affect the FOC control and cause poor steering feel or even safety risks. Therefore, it is very important to accurately measure the angle error of the RPS chip. The reluctance motor rotor position chip (RPS) has the advantages of non-contact measurement of angle position, suitability for harsh environments, no influence from the geomagnetic field, high precision, low power consumption, and low cost, and is widely used. The present invention mainly relates to the dynamic testing of the angle error of the reluctance RPS chip.
[0003] Currently, the industry mostly uses a static method to measure the angular error of the RPS chip. That is, the external magnetic field is rotated to a certain angle (for example, 3° each time) by motor drive or manual rotation, and then stopped. The rotation angle measured by the RPS chip is then collected by the device. The difference between the external magnetic field rotation angle and the rotation angle measured by the RPS chip is calculated and recorded as the angle error. This method has the following shortcomings: 1. The EPS motor rotates dynamically at a certain speed when working, so the static method cannot cover the dynamic performance of the RPS chip, such as response hysteresis, and the chip power consumption and heat generation under static conditions are significantly different from the actual ones. 2. If the static method is to cover at least one rotation of the motor rotor, if it is calculated based on a measurement every 3° rotation, the test efficiency is low, the number of sampling points is small, the resolution and accuracy are low, and it is difficult to achieve a balance between test efficiency and accuracy. 3. The static method collects asynchronous data and cannot cover the performance of the RPS chip at different speeds. Summary of the Invention
[0004] In order to overcome the deficiencies of the prior art, the utility model provides an ATE-based RPS chip angle error test device, which solves the defects of the traditional static angle error test method, such as the inability to cover the actual dynamic working conditions of the RPS chip, large power consumption differences, low resolution and accuracy, inability to effectively and accurately measure hysteresis, low test efficiency and difficulty in balancing accuracy.
[0005] To achieve the above purpose, an ATE-based RPS chip angular error testing device is designed, including an ATE test machine and an RPS chip testing mechanism, which is characterized in that: a test bench frame is provided on one side of the ATE test machine, and an RPS chip testing mechanism is provided on the top of the test bench frame; the RPS chip testing mechanism includes a base, a servo motor, a motor encoder, a magnet, a support platform, a support frame, and a test sub-board fixing frame; a test platform is provided on the top of the test bench frame, a base is provided on the test platform, a support frame is provided on the periphery of the base, a support platform is provided on the top of the support frame, and a test sub-board fixing frame is provided on the support platform; a servo motor is provided in the support frame, and a magnet is connected to the driving shaft of the servo motor through a magnet sleeve shaft, and the motor encoder is connected to the motor encoder through the outer ring rotor clamping device located on the outside of the magnet sleeve.
[0006] The supporting platform is a rectangular panel with a groove for placing a test sub-board fixing frame. The test sub-board fixing frame is embedded in the groove, and the chip test sub-board is placed on the test sub-board fixing frame.
[0007] A magnetic sensing area is provided in the middle of the chip test sub-board, and test connection interfaces are provided on the left and right sides of the magnetic sensing area respectively. The two connection interfaces are connected to the peripheral interface J1 and the peripheral interface J2 of the peripheral circuit respectively.
[0008] The peripheral interface J1 of the peripheral circuit is provided with four connection ports, port 1 of the peripheral interface J1 is connected to the COS1 PIN pin of the RPS chip, port 2 of the peripheral interface J1 is connected to the VCC1 PIN pin of the RPS chip, port 3 of the peripheral interface J1 is connected to the SIN1 PIN pin of the RPS chip, and port 4 of the peripheral interface J1 is connected to the GND1 of the RPS chip.
[0009] The peripheral interface J2 of the peripheral circuit is provided with four connection ports, port 4 of the peripheral interface J2 is connected to the COS2 PIN pin of the RPS chip, port 3 of the peripheral interface J2 is connected to the VCC2 PIN pin of the RPS chip, port 2 of the peripheral interface J2 is connected to the SIN2 PIN pin of the RPS chip, and port 1 of the peripheral interface J2 is connected to the GND2 of the RPS chip.
[0010] The driving end of the servo motor is connected to the motor driver, and the motor driver is located at the rear side of the servo motor; one side of the servo motor is connected to the motor adjustment auxiliary mechanism through a motor connector.
[0011] The motor encoder is fixed on a motor encoder fixing frame, and the motor encoder fixing frame is fixedly connected to the bottom of the supporting platform.
[0012] The ATE tester integrates a CBITE board that provides conventional power supply, a high-precision voltage and current source FPVIE board with arbitrary waveform generator AWG function, a high-precision voltage and current source FXVIE board with arbitrary waveform generator AWG function, and an acquisition board QVME with programmable multi-channel synchronous acquisition function.
[0013] Compared with the existing technology, the present invention provides an ATE-based RPS chip angle error test device, which solves the problems of traditional static angle error test methods, such as failure to cover the actual dynamic working conditions of the RPS chip, large power consumption differences, low resolution and accuracy, inability to effectively and accurately measure hysteresis, low test efficiency and difficulty in balancing accuracy; and dynamic angle error test at any speed within the range of 0-5000rpm can be achieved by changing the voltage value of the motor speed control signal. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 This is a schematic structural diagram of the utility model.
[0015] Figure 2 This is an exploded diagram of the RPS chip testing mechanism structure in this utility model.
[0016] Figure 3 This is a schematic diagram of the chip test daughter board structure.
[0017] Figure 4 , Figure 5 This is the peripheral circuit diagram of the chip test board.
[0018] Figure 6 Schematic diagram of designing two rows of interfaces for the chip test board. DETAILED DESCRIPTION
[0019] The present invention will be further described below with reference to the accompanying drawings.
[0020] like Figures 1 to 3 As shown, a test bench frame 3 is provided on one side of the ATE test machine 1, and an RPS chip test mechanism 2 is provided on the top of the test bench frame 3; the RPS chip test mechanism 2 includes a base, a servo motor, a motor encoder, a magnet, a support platform, a support frame, and a test sub-board fixing frame. A test platform is provided on the top of the test bench frame 3, and a base 2-1 is provided on the test platform. A support frame 2-2 is provided on the periphery of the base 2-1, and a support platform 2-3 is provided on the top of the support frame 2-2, and a test sub-board fixing frame 2-4 is provided on the support platform 2-3; a servo motor 2-6 is provided in the support frame 2-2, and a magnet 2-11 is connected to the driving shaft of the servo motor 2-6 through a magnet sleeve 2-10, and the motor encoder 2-9 is connected to the motor encoder outer ring rotor clamping device 2-12 located on the outside of the magnet sleeve 2-10.
[0021] The supporting platform 2-3 is a rectangular panel with a groove for placing the test sub-board fixing frame 2-4. The test sub-board fixing frame 2-4 is embedded in the groove, and the chip test sub-board 2-5 is placed on the test sub-board fixing frame 2-4.
[0022] A magnetic sensing area 2-5-1 is provided in the middle of the chip test sub-board 2-5, and test connection interfaces 2-5-2 are provided on the left and right sides of the magnetic sensing area 2-5-1. The two connection interfaces 2-5-2 are respectively connected to the peripheral interface J1 and the peripheral interface J2 of the peripheral circuit 4.
[0023] There are 4 connection ports on the peripheral interface J1 of the peripheral circuit. Port 1 4-1 of the peripheral interface J1 is connected to the COS1 PIN pin of the RPS chip, port 2 4-2 of the peripheral interface J1 is connected to the VCC1 PIN pin of the RPS chip, port 3 4-3 of the peripheral interface J1 is connected to the SIN1 PIN pin of the RPS chip, and port 4-4 of the peripheral interface J1 is connected to the GND1 of the RPS chip.
[0024] There are 4 connection ports on the peripheral interface J2 of the peripheral circuit. Port 4-5 of the peripheral interface J2 is connected to the COS2 PIN pin of the RPS chip, port 3-6 of the peripheral interface J2 is connected to the VCC2 PIN pin of the RPS chip, port 2-7 of the peripheral interface J2 is connected to the SIN2 PIN pin of the RPS chip, and port 1-8 of the peripheral interface J2 is connected to the GND2 of the RPS chip.
[0025] The driving end of the servo motor 2-6 is connected to the motor driver 2-7, and the motor driver 2-7 is located at the rear side of the servo motor 2-6; one side of the servo motor 2-6 is connected to the motor adjustment auxiliary mechanism 2-8 through a motor connector.
[0026] The motor encoder 2-9 is fixed on the motor encoder fixing bracket 2-13, and the motor encoder fixing bracket 2-13 is fixedly connected to the bottom of the supporting platform 2-3.
[0027] ATE tester 1 integrates a CBITE board that provides conventional power supply, a high-precision voltage and current source FPVIE board with arbitrary waveform generator AWG function, a high-precision voltage and current source FXVIE board with arbitrary waveform generator AWG function, and an acquisition board QVME with programmable multi-channel synchronous acquisition function.
[0028] The CBITE board in ATE tester 1 supplies 15V to the motor driver, the FPVIE board supplies 15V to motor encoders 2-9, and FXVIE channel 0 supplies 5V to the RPS chip under test. FXVIE channel 1 provides an enable signal to the motor driver (5V for on, 0V for off), while FXVIE channel 2 provides a speed control signal, XV, to the motor (X is a constant from 0V to 10V, linearly corresponding to a speed from 0rpm to 5000rpm). The motor uses X*500rpm as its target speed. The servo motor driver uses a closed-loop control loop to maintain speed stability, integrating the encoder signal with the actual rotational speed. As the motor rotates, it rotates the magnet on the motor shaft, providing a rotating magnetic field for the RPS chip under test.
[0029] Channel 0 of the QVME board on ATE tester 1 collects the sinusoidal signal output by the RPS chip under test due to the rotation of the external magnetic field. Channel 1 simultaneously collects the cosine signal output by the RPS chip under test. The motor rotor angle θ1 measured by the RPS chip under test is obtained through data analysis.
[0030] Channel 2 of the QVME board on ATE tester 1 synchronously collects the motor rotation angle output by the motor encoder, which ranges from 0V to 10V and linearly corresponds to 0-360°. This angle is used as the actual angle of the motor rotor, that is, the reference angle θ2.
[0031] ATE tester 1 is programmed to subtract the values of θ1 and θ2 collected at the same time to obtain the angular error value δθ of the RPS chip under test. When servo motors 2-6 rotate dynamically for one revolution, a series of angular errors δθ are obtained.
[0032] The specific implementation steps of the dynamic angle error test are as follows:
[0033] 1. The design of chip test sub-board 2-5 is as follows Figure 3 As shown, the peripheral circuits of the chip test board are as follows Figure 4 , Figure 5 As shown, the RPS chip to be tested is placed in the dedicated socket on the chip test sub-board 2-5, with the pin 1 mark point of the RPS chip to be tested facing the A1 point on the socket. The socket where the RPS chip to be tested is placed is electrically connected to the peripheral interface J1 and the peripheral interface J2 of the peripheral circuit through the design interface 2-5-2 on the chip test sub-board 2-5 using a cable. The magnet 2-11 is aligned with the center of the magnet sensing area 2-5-1 on the chip test sub-board 2-5.
[0034] 2. The peripheral circuit 4 of the chip test board is as follows Figure 4 , Figure 5As shown, the ATE test resources required for testing the RPS chip to be tested are brought out through the peripheral interface J1 and the peripheral interface J2. Port 1 4-1 of the peripheral interface J1 corresponds to the COS1PIN pin of the RPS chip to be tested (connected to channel 2 of S1 FPVIE and channel 0 of S4QVME through relays, and both board resources can be used to collect and measure the output signal of the COS1 PIN of the RPS chip to be tested). Port 2 4-2 of the peripheral interface J1 corresponds to the VCC1 PIN pin of the RPS chip to be tested (connected to S13FXVIE channel 0, used to power the RPS chip channel to be tested with a 15V working voltage, and a 0.1uF filter capacitor is installed near RPS VCC1 to enhance the anti-interference ability of the circuit). Port 3 4-3 of the peripheral interface J1 corresponds to the SIN1 PIN pin of the RPS chip to be tested (connected to S1 FPVIE channel 1 and S6 QVME channel 1 through relays, and both board resources can be used to collect and measure the SIN1 of the RPS chip to be tested). PIN output signal), port 4-4 of the peripheral interface J1 corresponds to the GND1 of the RPS chip under test (connected to the GND of the chip test board), port 4-5 of the peripheral interface J2 corresponds to the COS2 PIN pin of the RPS chip under test (connected to channel 1 of S32 FPVIE and channel 2 of S4 QVME through relays, both board resources can be used to collect and measure the output signal of the COS2 PIN of the RPS chip under test), port 3-6 of the peripheral interface J2 corresponds to the VCC2 PIN pin of the RPS chip under test (connected to S13 FXVIE channel 3, used to power the RPS chip under test channel 25V working voltage, and a 0.1uF filter capacitor is installed near RPS VCC2 to enhance the circuit's anti-interference ability), port 2-7 of the peripheral interface J2 corresponds to the SIN2 PIN pin of the RPS chip under test (connected to S32 FPVIE channel 0 and S6 QVME channel 3 through relays, both board resources can be used to collect and measure the SIN2 of the RPS chip under test PIN output signal), port 1 4-8 of the peripheral interface J2 corresponds to the GND2 of the RPS chip to be tested (connected to the GND of the chip test board), and then the ATE test resources on the chip test board are flexibly called through the cable chip test daughter board.
[0035] 3. Move the motor adjustment auxiliary mechanism 2-8 in the vertical direction to change the air gap between the RPS chip to be tested and the magnet 2-11. At the same time, use a magnetic induction intensity tester to detect the magnetic induction intensity on the chip surface. The output signal of the motor encoder 2-9 must meet the magnetic field intensity range requirements for normal operation of the RPS defined in the chip manual.
[0036] 4. The chip test board also has two rows of interfaces (i.e. ATE signal output terminal 5 and GND ground terminal 6). Figure 6 As shown in the figure, ATE resources such as FXVIE, QVME, CBITE, and FPVIE are introduced. 5-1 is channel 1 of S13 FXVIE, which provides an enable signal to the motor driver (5V for on, 0V for off). 5-2 is channel 2 of S13 FXVIE, which provides the motor driver with a speed control signal XV (X is a constant, with a linear range of 0V to 10V corresponding to a speed of 0 to 5000rpm). Servo motor 2-6 uses X*500rpm as its target speed. Motor driver 2-7 uses the signal from motor encoder 2-9 in a closed-loop control to ensure speed stability. 5-4 is channel 0 of S1 FPVIE, which provides a 24V operating voltage to the motor encoder. 5-5 is channel 0 of S6 QVME, which collects and measures the output signal of motor encoder 2-9. 5-6 is the CBITE 15V output, which supplies 15V to motor driver 2-7. This design flexibly implements ATE control of the motor and motor driver, as well as measurement of motor encoder signals.
[0037] 5. After servo motor 2-6 stabilizes at X*500 rpm, channel 0 of the QVME board on ATE tester 1 simultaneously collects the sine signal output by the RPS chip under test due to the rotation of the external magnetic field. Channel 1 also collects the cosine signal output by the RPS chip under test. The motor rotor angle θ1 measured by the RPS chip under test is obtained through data analysis.
[0038] 6. Channel 2 of the QVME board on ATE tester 1 synchronously collects the motor rotation angle output by the motor encoder, which ranges from 0V to 10V and linearly corresponds to 0-360°. This angle is used as the actual motor rotor angle, or reference angle θ2.
[0039] 7. ATE tester 1 is programmed to subtract the values of θ1 and θ2 collected at the same time to obtain the angular error value δθ of the RPS chip under test. When the motor rotates dynamically for one revolution, a series of dynamic angular errors δθ are obtained.
[0040] 8. After signal acquisition and processing are complete, ATE tester 1 sends a low-level signal to motor driver 2-7, turning off servo motor 2-6. ATE tester 1 then applies a 0V voltage to the RPS chip under test and motor encoder 2-9, powering off the RPS chip under test and motor encoder 2-9.
[0041] 9. The ATE tester 1 processes the collected data to obtain the dynamic angle error during the rotation of the motor rotor.
[0042] The utility model completely solves the defects of the traditional static angle error test method, such as the inability to cover the actual dynamic working conditions of the RPS chip to be tested, large power consumption differences, low resolution and accuracy, inability to effectively and accurately measure hysteresis, low test efficiency and difficulty in balancing accuracy. By changing the voltage value of the motor speed control signal, dynamic angle error testing can be achieved at any speed in the range of 0-5000rpm.
Claims
1. An ATE-based RPS chip angle error test device, comprising an ATE tester and an RPS chip test mechanism, characterized in that: A test bench frame (3) is provided on one side of an ATE test machine (1), and an RPS chip test mechanism (2) is provided on the top of the test bench frame (3); the RPS chip test mechanism (2) comprises a base, a servo motor, a motor encoder, a magnet, a support platform, a support frame, and a test sub-board fixing frame; a test platform is provided on the top of the test bench frame (3), a base (2-1) is provided on the test platform, a support frame (2-2) is provided on the periphery of the base (2-1), a support platform (2-3) is provided on the top of the support frame (2-2), and a test sub-board fixing frame (2-4) is provided on the support platform (2-3); a servo motor (2-6) is provided in the support frame (2-2), a magnet (2-11) is connected to the drive shaft of the servo motor (2-6) through a magnet sleeve (2-10), and a motor encoder (2-9) is connected to the motor encoder outer ring rotor clamping device (2-12) located outside the magnet sleeve (2-10).
2. The ATE-based RPS chip angle error test device according to claim 1, characterized in that: The supporting platform (2-3) is a rectangular panel provided with a groove for placing a test sub-board fixing frame (2-4), the test sub-board fixing frame (2-4) being embedded in the groove, and the chip test sub-board (2-5) being placed on the test sub-board fixing frame (2-4).
3. The ATE-based RPS chip angle error test device according to claim 2, characterized in that: A magnetic sensing area (2-5-1) is provided in the middle of the chip test sub-board (2-5), and test connection interfaces (2-5-2) are provided on the left and right sides of the magnetic sensing area (2-5-1), respectively. The two connection interfaces (2-5-2) are respectively connected to the peripheral interface J1 and the peripheral interface J2 of the peripheral circuit (4).
4. The ATE-based RPS chip angle error test device according to claim 3, characterized in that: The peripheral interface J1 of the peripheral circuit is provided with four connection ports, port 1 (4-1) of the peripheral interface J1 is connected to the COS1 PIN pin of the RPS chip, port 2 (4-2) of the peripheral interface J1 is connected to the VCC1 PIN pin of the RPS chip, port 3 (4-3) of the peripheral interface J1 is connected to the SIN1 PIN pin of the RPS chip, and port 4 (4-4) of the peripheral interface J1 is connected to the GND1 of the RPS chip.
5. The ATE-based RPS chip angle error test device according to claim 3, characterized in that: The peripheral interface J2 of the peripheral circuit is provided with four connection ports, port No. 4 (4-5) of the peripheral interface J2 is connected to the COS2 PIN pin of the RPS chip, port No. 3 (4-6) of the peripheral interface J2 is connected to the VCC2 PIN pin of the RPS chip, port No. 2 (4-7) of the peripheral interface J2 is connected to the SIN2 PIN pin of the RPS chip, and port No. 1 (4-8) of the peripheral interface J2 is connected to the GND2 of the RPS chip.
6. The ATE-based RPS chip angle error test device according to claim 1, characterized in that: The driving end of the servo motor (2-6) is connected to the motor driver (2-7), and the motor driver (2-7) is located at the rear side of the servo motor (2-6); and the motor adjustment auxiliary mechanism (2-8) is connected to one side of the servo motor (2-6) through a motor connector.
7. The ATE-based RPS chip angle error test device according to claim 1, characterized in that: The motor encoder (2-9) is fixed on a motor encoder fixing frame (2-13), and the motor encoder fixing frame (2-13) is fixedly connected to the bottom of the support platform (2-3).
8. The ATE-based RPS chip angle error test device according to claim 1, characterized in that: The ATE tester (1) integrates a CBITE board for providing conventional power supply, a high-precision voltage and current source FPVIE board with arbitrary waveform generator AWG function, a high-precision voltage and current source FXVIE board with arbitrary waveform generator AWG function, and an acquisition board QVME with programmable multi-channel synchronous acquisition function.