Test seat

Abstract

The utility model relates to the technical field of chip testing equipment, in particular to a testing seat, which comprises a fixing mechanism, a conduction mechanism arranged at the upper part of the fixing mechanism, and a gland arranged at the upper part of the conduction mechanism, the fixing mechanism comprises a clamping assembly, the clamping assembly comprises a first clamping plate, a second clamping plate is arranged on the upper portion of the first clamping plate, a pulling plate is arranged between the first clamping plate and the second clamping plate in a sliding mode, a containing groove is formed in the pulling plate, and an adsorption pad is arranged in the containing groove; the PCB can be pulled out from the position between the first clamping plate and the second clamping plate in a pulling mode, connection between the first clamping plate and the second clamping plate does not need to be removed, the PCB testing plate is convenient to replace, and abrasion of the PCB testing plate cannot be caused in the pulling process.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing equipment, in particular to a test socket. Background Art

[0002] Existing chip aging test equipment generally includes an upper fixing plate, a lower fixing plate, a chip holder, a drilling plate, a probe and a pressure cover. During the test, the PCB board used for testing is clamped between the upper and lower fixing plates, and the chip to be tested is placed on the chip holder. The PCB board and the chip are connected through the probe.

[0003] The problem with the above-mentioned chip aging test equipment is that the PCB board is clamped between the upper fixing plate and the lower fixing plate, which are fixed by bolts. When a different PCB test board needs to be replaced, the upper fixing plate and the lower fixing plate need to be disassembled, and then the PCB test board needs to be taken out and replaced, which is a cumbersome and time-consuming operation. Utility Model Content

[0004] The purpose of this section is to summarize some aspects of the embodiments of the present invention and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this section and in the abstract and title of the utility model to avoid obscuring the purpose of this section, the abstract and the title of the utility model, and such simplifications or omissions shall not be used to limit the scope of the present invention.

[0005] In view of the technical problem in the above-mentioned prior art that the replacement of the PCB test board is cumbersome and time-consuming, the present utility model is proposed.

[0006] The utility model aims to provide a test socket.

[0007] In order to solve the above technical problems, the present invention provides the following technical solutions: a test seat, including a fixing mechanism, a conducting mechanism arranged on the upper part of the fixing mechanism, and a pressure cover arranged on the upper part of the conducting mechanism; the fixing mechanism includes a clamping assembly, the clamping assembly includes a first clamping plate, a second clamping plate is arranged on the upper part of the first clamping plate, a pull plate is slidably arranged between the first clamping plate and the second clamping plate, the pull plate is provided with a receiving groove, and an adsorption pad is provided in the receiving groove.

[0008] As a preferred solution of the test seat of the present invention, the fixing mechanism also includes a limit assembly arranged between the first clamping plate and the pulling plate, the limit assembly includes an axial hole passing through both sides of the first clamping plate, a connecting hole is provided at the upper part of the axial hole, a mounting hole is provided at the upper part of the connecting hole, the mounting hole passes through between the bottom surface of the pulling plate and the accommodating groove, a rotating rod is coaxially rotated in the axial hole, a cam is coaxially fixed on the rotating rod, a limit rod is slidably arranged in the connecting hole, the limit rod is located directly above the cam, a short rod is provided on the upper part of the limit rod, the short rod is slidably arranged in the mounting hole, and the upper end of the short rod is fixedly connected to the adsorption pad.

[0009] As a preferred solution of the test stand of the present invention, the limiting assembly further includes a turntable provided at one end of the rotating rod, and a locking bolt is provided between the turntable and the first clamping plate.

[0010] As a preferred solution of the test seat of the present invention, the clamping assembly further comprises a slide groove provided on the first clamping plate, a slide rail is slidably provided in the slide groove, and the slide rail is fixed on the pull plate.

[0011] As a preferred solution of the test socket of the present invention, the clamping assembly further includes a handle provided on the pull plate.

[0012] As a preferred solution of the test socket of the utility model, the conduction mechanism includes a positioning seat arranged on the upper part of the second clamping plate, the positioning seat is provided with a positioning groove, a probe is provided in the positioning groove, and the lower end of the probe passes through the second clamping plate and extends into the accommodating groove.

[0013] As a preferred solution of the test seat of the present invention, the conduction mechanism further includes a drilling plate arranged in the positioning groove, the positioning groove passes through the upper and lower surfaces of the positioning seat, the drilling plate is provided with drill holes, and the probe is arranged in the drill holes.

[0014] As a preferred solution of the test socket of the present invention, the conduction mechanism further includes a groove provided on the top surface of the second clamping plate, and the bottom surface of the positioning seat is embedded in the groove.

[0015] As a preferred solution of the test socket of the present invention, the conduction mechanism further includes an extension groove provided on the upper edge of the positioning groove.

[0016] As a preferred solution of the test socket of the present invention, the pressure cover is arranged on the upper part of the positioning groove.

[0017] The beneficial effect of a test socket of the present invention is that the PCB board can be pulled out from between the first clamping plate and the second clamping plate by a pulling method, without removing the connection between the first clamping plate and the second clamping plate, the PCB test board is easy to replace, and the PCB test board will not be worn during the pulling process. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0019] Figure 1 It is a schematic structural diagram of the utility model as a whole.

[0020] Figure 2 This is a structural diagram of the pull plate in the utility model.

[0021] Figure 3 This is a structural diagram of the limiting component in the utility model.

[0022] Figure 4 For this utility model Figure 3 A magnified view of the structure at point A.

[0023] Figure 5 It is a structural schematic diagram of the rotating rod in the utility model.

[0024] Figure 6 It is a structural schematic diagram of the positioning seat in the utility model.

[0025] Figure 7 This is a structural diagram of the second clamping plate in the present invention.

[0026] Figure 8 It is a structural diagram of the drilling plate in the utility model. DETAILED DESCRIPTION

[0027] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below with reference to the accompanying drawings.

[0028] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0029] Secondly, the term "one embodiment" or "embodiment" herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in various places throughout this specification does not necessarily refer to the same embodiment, nor does it refer to a separate or selective embodiment that is mutually exclusive with other embodiments.

[0030] Example 1, with reference to Figure 1-2 , which is the first embodiment of the present utility model, provides a test socket, including a fixing mechanism 100, a conducting mechanism 200 disposed on the upper portion of the fixing mechanism 100, and a pressure cover 300 disposed on the upper portion of the conducting mechanism 200;

[0031] The fixing mechanism 100 fixes the PCB test board for testing, and the chip under test is placed on the conducting mechanism 200 and pressed by the pressure cover 300. During the test, the conducting mechanism 200 conducts the PCB test board and the chip under test;

[0032] The fixing mechanism 100 includes a clamping assembly 101, which includes a first clamping plate 101a. A second clamping plate 101b is provided on the upper part of the first clamping plate 101a. A pulling plate 101c is slidingly provided between the first clamping plate 101a and the second clamping plate 101b. A receiving groove 101d is provided on the pulling plate 101c, and an adsorption pad 101e is provided in the receiving groove 101d.

[0033] The clamping assembly 101 clamps the PCB test board. Specifically, the clamping assembly 101 includes a pull plate 101c. The PCB test board is placed on the receiving groove 101d of the pull plate 101c and fixed by the suction pad 101e. The pull plate 101c is slidably arranged between the first clamping plate 101a and the second clamping plate 101b. When replacing, the pull plate 101c is pulled out, the PCB board is removed from the suction pad 101e and replaced, and then the pull plate 101c is pushed back to its original position.

[0034] The adsorption pad 101e is in the shape of a hollow truncated cone and is adsorbed on the edge of the PCB test board by using the negative pressure principle. The adsorption pad 101e is specifically made of a rubber pad or a plastic pad.

[0035] Furthermore, the clamping assembly 101 further includes a slide groove 101f provided on the first clamping plate 101a, a slide rail 101g is slidably provided in the slide groove 101f, and the slide rail 101g is fixed on the pulling plate 101c.

[0036] There is an opening between the first clamping plate 101a and the second clamping plate 101b for accommodating the pull plate 101c, the slide groove 101f is set at the bottom of the opening, and the slide rail 101g is set at the bottom of the pull plate 101c. The pull plate 101c is slidably arranged in the opening between the first clamping plate 101a and the second clamping plate 101b through the cooperation of the slide groove 101f and the slide rail 101g. The slide rail 101g is specifically formed by extending downward from the bottom of the pull plate 101c.

[0037] Furthermore, the clamping assembly 101 further includes a handle 101h provided on the pull plate 101c.

[0038] The handle 101h is provided on the outer end surface of the pull plate 101c, so as to facilitate the operator to pull out the pull plate 101c.

[0039] Example 2, reference Figure 1-5 , which is the second embodiment of the present utility model. Different from the previous embodiment, the fixing mechanism 100 further includes a limiting assembly 102 arranged between the first clamping plate 101a and the pulling plate 101c. The limiting assembly 102 includes an axial hole 102a passing through both sides of the first clamping plate 101a. A connecting hole 102b is provided on the upper part of the axial hole 102a. A mounting hole 102c is provided on the upper part of the connecting hole 102b. The mounting hole 102c passes through the bottom surface of the pulling plate 101c. Between the accommodating groove 101d, a rotating rod 102d is coaxially rotated in the axial hole 102a, and a cam 102e is coaxially fixed on the rotating rod 102d. A limiting rod 102f is slidably arranged in the communicating hole 102b, and the limiting rod 102f is located directly above the cam 102e. A short rod 102g is provided on the upper part of the limiting rod 102f, and the short rod 102g is slidably arranged in the mounting hole 102c. The upper end of the short rod 102g is fixedly connected to the adsorption pad 101e.

[0040] On the one hand, the limiting assembly 102 is used to limit the pull plate 101c to prevent the pull plate 101c from sliding during normal use. Specifically, when the pull plate 101c slides to the point where the mounting hole 102c and the shaft hole 102a are opposite, the rotating rod 102d is rotated. The rotating rod 102d drives the cam 102e to rotate. The protruding side of the cam 102e squeezes the limiting rod 102f. The limiting rod 102f moves upward and extends into the mounting hole 102c. At this time, the limiting rod 102f is between the mounting hole 102c and the connecting hole 102b, limiting the lateral movement of the pull plate 101c.

[0041] On the other hand, the limiting component 102 is used to retract the PCB test board into the accommodating groove 101d when the pulling plate 101c slides, so as to avoid wear of the PCB test board. Specifically: when the pulling plate 101c needs to be pulled, the rotating rod 102d is rotated to make the interference between the cam 102e and the limiting rod 102f gradually change from the convex side to the concave side, and the positioning rod drops due to gravity. At the same time, the short rod 102g, the adsorption pad 101e and the PCB test board above the adsorption pad 101e drop due to gravity, so that the PCB board is retracted into the accommodating groove 101d, and the limit on the pulling plate 101c is released, so that the PCB board is retracted into the accommodating groove 101d to avoid slippage; after the pulling plate 101c is pushed back, the rotating rod 102d is rotated, and the convex side of the cam 102e squeezes the limiting rod 102f to move upward, and the limiting rod 102f lifts the short rod 102g, the adsorption pad 101e and the PCB test board for normal testing.

[0042] Furthermore, the limiting assembly 102 further includes a rotating disk 102h disposed at one end of the rotating rod 102d, and a locking bolt 102i is disposed between the rotating disk 102h and the first clamping plate 101a.

[0043] During normal use, the inner end of the locking bolt 102i presses against the side wall of the first clamping plate 101a, restricting the rotation of the rotating rod 102d.

[0044] Example 3, reference Figure 1 and Figure 6-8 , which is the third embodiment of the present utility model. Different from the previous embodiment, the conducting mechanism 200 includes a positioning seat 201 arranged on the upper part of the second clamping plate 101b, and a positioning groove 202 is provided on the positioning seat 201. A probe 203 is provided in the positioning groove 202, and the lower end of the probe 203 passes through the second clamping plate 101b and extends into the accommodating groove 101d.

[0045] Furthermore, the conducting mechanism 200 further includes a drilling 205 plate 204 disposed in the positioning groove 202 , the positioning groove 202 passing through the upper and lower surfaces of the positioning seat 201 , the drilling 205 plate 204 is provided with drilling holes 205 , and the probe 203 is disposed in the drilling holes 205 ;

[0046] The drilled hole 205 in the plate 204 is used for mounting and positioning the probe 203 .

[0047] Furthermore, the conducting mechanism 200 further includes a groove 206 provided on the top surface of the second clamping plate 101 b , and the bottom surface of the positioning seat 201 is embedded in the groove 206 .

[0048] Furthermore, the conducting mechanism 200 further includes an extension groove 207 provided on the upper edge of the positioning groove 202;

[0049] The provision of the extension groove 207 facilitates the placement and removal of the chip under test.

[0050] Usage process: The PCB test board is placed in the receiving groove 101d and lifted up by the positioning rod. The chip to be tested is placed in the positioning groove 202. The shape of the positioning groove 202 is consistent with the shape of the chip to be tested. The lower end of the probe 203 contacts the PCB test board, and the upper end of the probe 203 contacts the chip to be tested, so that the PCB test board and the chip to be tested are conductive for testing.

[0051] The PCB board can be pulled out from between the first clamping plate 101a and the second clamping plate 101b by pulling and pulling, without removing the connection between the first clamping plate 101a and the second clamping plate 101b. The PCB test board is easy to replace, and the pulling and pulling process will not cause wear to the PCB test board.

[0052] It is important to note that the construction and arrangement of the present application shown in a number of different exemplary embodiments are merely illustrative. Although only a few embodiments are described in detail in this disclosure, it should be readily understood by those who refer to this disclosure that many modifications are possible (e.g., the size, scale, structure, shape and proportion of various elements, and parameter values ​​(e.g., temperature, pressure, etc.), mounting arrangements, use of materials, colors, directional changes, etc.) without departing substantially from the novel teachings and advantages of the subject matter described in this application. For example, an element shown as integrally formed may be composed of multiple parts or elements, the position of the element may be inverted or otherwise changed, and the nature or number or position of the discrete elements may be altered or changed. Therefore, all such modifications are intended to be included within the scope of the present invention. The order or sequence of any process or method steps may be changed or reordered according to alternative embodiments. In the claims, any "means plus function" clause is intended to cover the structure of performing the function described herein, and is not only structurally equivalent but also an equivalent structure. Without departing from the scope of the present invention, other substitutions, modifications, changes and omissions may be made in the design, operating conditions and arrangement of the exemplary embodiments. Therefore, the present invention is not limited to the specific embodiments, but extends to various modifications that still fall within the scope of the appended claims.

[0053] Additionally, in order to provide a concise description of example embodiments, all features of an actual embodiment (ie, those features that are not relevant to the best mode presently contemplated for carrying out the invention or those that are not relevant to implementing the invention) may not be described.

[0054] It will be appreciated that in the development of any actual embodiment, as in any engineering or design project, numerous implementation-specific decisions may be made. Such a development effort may be complex and time-consuming, but will, for those of ordinary skill having the benefit of this disclosure, be a routine undertaking of design, fabrication, and production without undue experimentation.

[0055] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, and all of these should be included in the scope of the claims of the present invention.

Claims

1. A test socket, characterized in that: It comprises a fixing mechanism (100), a conducting mechanism (200) arranged on the upper part of the fixing mechanism (100), and a pressure cover (300) arranged on the upper part of the conducting mechanism (200); The fixing mechanism (100) includes a clamping assembly (101), the clamping assembly (101) includes a first clamping plate (101a), a second clamping plate (101b) is provided on the upper portion of the first clamping plate (101a), a pulling plate (101c) is slidably provided between the first clamping plate (101a) and the second clamping plate (101b), a receiving groove (101d) is provided on the pulling plate (101c), and an adsorption pad (101e) is provided in the receiving groove (101d).

2. The test socket according to claim 1, wherein: The fixing mechanism (100) further comprises a limiting assembly (102) arranged between the first clamping plate (101a) and the pulling plate (101c), the limiting assembly (102) comprising an axial hole (102a) passing through both sides of the first clamping plate (101a), a connecting hole (102b) being provided on the upper portion of the axial hole (102a), a mounting hole (102c) being provided on the upper portion of the connecting hole (102b), the mounting hole (102c) passing through between the bottom surface of the pulling plate (101c) and the receiving groove (101d), the axial hole A rotating rod (102d) is coaxially rotatably provided in (102a), a cam (102e) is coaxially fixed on the rotating rod (102d), a limiting rod (102f) is slidably provided in the connecting hole (102b), the limiting rod (102f) is located directly above the cam (102e), a short rod (102g) is provided on the upper part of the limiting rod (102f), the short rod (102g) is slidably provided in the mounting hole (102c), and the upper end of the short rod (102g) is fixedly connected to the adsorption pad (101e).

3. The test socket according to claim 2, wherein: The limiting assembly (102) further comprises a rotating disk (102h) arranged at one end of the rotating rod (102d), and a locking bolt (102i) is arranged between the rotating disk (102h) and the first clamping plate (101a).

4. The test socket according to claim 3, wherein: The clamping assembly (101) further comprises a slide groove (101f) provided on the first clamping plate (101a), a slide rail (101g) being slidably provided in the slide groove (101f), and the slide rail (101g) being fixed on the pulling plate (101c).

5. The test socket according to claim 4, wherein: The clamping assembly (101) further comprises a handle (101h) arranged on the pulling plate (101c).

6. The test socket according to claim 5, wherein: The conducting mechanism (200) comprises a positioning seat (201) arranged on the upper part of the second clamping plate (101b), a positioning groove (202) being provided on the positioning seat (201), a probe (203) being provided in the positioning groove (202), and the lower end of the probe (203) passing through the second clamping plate (101b) and extending into the accommodating groove (101d).

7. The test socket according to claim 6, wherein: The conducting mechanism (200) further comprises a drilling (205) plate (204) arranged in the positioning groove (202), the positioning groove (202) passing through the upper and lower surfaces of the positioning seat (201), the drilling (205) plate (204) being provided with drilling holes (205), and the probe (203) being arranged in the drilling holes (205).

8. The test socket according to claim 7, wherein: The conducting mechanism (200) further comprises a groove (206) provided on the top surface of the second clamping plate (101b), and the bottom surface of the positioning seat (201) is embedded in the groove (206).

9. The test socket according to claim 8, wherein: The conducting mechanism (200) further comprises an extension groove (207) arranged on the upper edge of the positioning groove (202).

10. The test socket according to claim 8 or 9, characterized in that: The pressure cover (300) is arranged on the upper portion of the positioning groove (202).

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