Test tool for detecting short circuit of electrode assembly

Abstract

The utility model discloses a test tool used for detecting short circuit of an electrode assembly, the electrode assembly comprises an electrode main body area, a thinning area and a tab, the thinning area is connected between the electrode main body area and the tab, the thickness of the thinning area is smaller than that of the electrode main body area, the test tool comprises two pressing plates, a first clamping plate and a second clamping plate, the two pressing plates are arranged in parallel in a spaced mode in the first direction and matched to define a testing space, and the two pressing plates are suitable for being connected with the two side surfaces of the electrode body area in the thickness direction in an abutting mode respectively; the profiling structure is arranged on the side, facing the testing space, of the pressing plate, the profiling structure is provided with a profiling face, and the profiling structure is suitable for being attached to and abutting against the two side surfaces, in the thickness direction, of the thinning area through the profiling face. According to the test tool for detecting the short circuit of the electrode assembly, the main body area and the thinning area of the electrode can be effectively pressed, so that the short circuit test of the electrode assembly is effectively realized, the working efficiency is effectively improved, defective products are effectively eliminated, the safety is ensured, and the cost is saved.

Description

Technical Field

[0001] The utility model relates to the technical field of testing, in particular to a testing tool for detecting short circuits of electrode components. Background Art

[0002] During the battery cell manufacturing process, inadequate control of burrs, workshop dust levels, and other factors, or oversight during production, can lead to the presence of tiny pole pieces or metallic foreign matter inside lithium-ion batteries. During use, these tiny foreign particles can scratch the separator, causing a short circuit and potentially explosion. Therefore, during battery cell production, a short-circuit test is typically performed after stacking or winding to prevent cells containing foreign matter from being transferred to later processes.

[0003] In existing technology, the process for detecting short circuits in battery cells typically involves pressing the cell together with upper and lower plates, shortening the distance between the positive and negative electrode sheets and the separator. Probes are then placed in contact with the positive and negative tabs to detect whether the cell is short-circuited. However, the pressure plates used in short-circuit testing are essentially flat, and this doesn't take into account the pressure applied to the thinned areas at both ends of the cell. This can lead to the possibility of missing foreign objects in these areas. Utility Model Content

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention provides a test fixture for detecting short circuits in electrode assemblies. The test fixture for detecting short circuits in electrode assemblies can effectively compress the electrode main body area and thinning area, thereby effectively testing the electrode assembly short circuit and effectively improving work efficiency, thereby effectively rejecting defective products, ensuring safety and saving costs.

[0005] According to the test fixture for detecting short circuit of electrode assembly of the present invention, the electrode assembly includes an electrode main body area, a thinning area and a pole ear, the thinning area is connected between the electrode main body area and the pole ear, the thickness of the thinning area is less than the thickness of the electrode main body area, the test fixture includes: two pressing plates, the two pressing plates are arranged parallel and spaced along a first direction, and cooperate to define a test space, the two pressing plates are suitable for respectively abutting with the two side surfaces of the electrode main body area in the thickness direction; a profiling structure, the profiling structure is arranged on the side of the pressing plate facing the test space, the profiling structure has a profiling surface, and the profiling structure is suitable for fitting and abutting with the two side surfaces of the thinning area in the thickness direction through the profiling surface.

[0006] According to the test fixture for detecting short circuit of electrode assembly of the utility model, a pressure plate and a profiling structure are arranged in the test fixture, the number of pressure plates is two, the two pressure plates are arranged parallel and at intervals along the first direction, and cooperate to define a test space, the two pressure plates are suitable for respectively abutting with the two side surfaces of the electrode main body area in the thickness direction, the profiling structure is arranged on the side of the pressure plate facing the test space, the profiling structure has a profiling surface, the profiling structure is suitable for fitting and abutting with the two side surfaces of the thinning area in the thickness direction through the profiling surface, and can effectively press the electrode main body area and the thinning area, thereby effectively realizing the test of short circuit of electrode assembly and effectively improving work efficiency, and then effectively eliminating defective products, ensuring safety and saving costs.

[0007] In some embodiments, the contoured structure is configured to be elastically deformable.

[0008] In some embodiments, the contoured structure is a silicone member, a plastic member, or a rubber member.

[0009] In some embodiments, there are two thinning areas, and the two thinning areas are respectively connected to the two ends of the electrode main body area. Each pressure plate is provided with two contoured structures that are spaced apart and symmetrically arranged, and the contoured structures on the two pressure plates are symmetrically arranged on both sides of the electrode assembly in the thickness direction.

[0010] In some embodiments, in a direction from the electrode main body region toward the electrode tab, a height of the contoured structure protruding from a side surface of the pressing plate facing the test space gradually increases.

[0011] In some embodiments, the contoured surface is a curved surface that is concave toward the adjacent pressing plate.

[0012] In some embodiments, the contoured structure is detachably connected to the pressure plate.

[0013] In some embodiments, one of the contoured structure and the pressure plate is provided with a card slot and the other is provided with a card block, and the card block is fitted in the card slot.

[0014] In some embodiments, the slot is formed on a side surface of the pressure plate facing the test space and passes through an end surface of the pressure plate. The test tool also includes: a limiting mechanism, which is fixed on the pressure plate. The limiting mechanism has a limiting portion, which is located on a side of the profiling structure away from the electrode main body area and abuts against the profiling structure.

[0015] In some embodiments, the width of the slot gradually decreases in a direction from the bottom wall of the slot toward the opening, and the card block is adapted to the shape of the slot.

[0016] Additional aspects and advantages of the present invention will be given in part in the following description and will become apparent from the following description or learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 1 is a schematic diagram of a test fixture for detecting short circuits in electrode assemblies according to an embodiment of the present invention, viewed from one angle;

[0018] Figure 2 It is a schematic diagram from another angle of the test tool for detecting short circuit of an electrode assembly according to an embodiment of the present utility model.

[0019] Reference numerals:

[0020] 100. Test tooling;

[0021] 101. Test space;

[0022] 1. Pressing plate; 1a. First pressing plate; 1b. Second pressing plate;

[0023] 2. Profiling structure; 2a, first profiling structure; 2b, second profiling structure; 2c, third profiling structure; 2d, fourth profiling structure;

[0024] 3. Card block;

[0025] 4. Limiting mechanism; 41. Limiting portion; 42. Fixing portion;

[0026] 200, electrode main body area;

[0027] 300, thinning area; 300a, first thinning area; 300b, second thinning area;

[0028] 400. Earbuds. DETAILED DESCRIPTION

[0029] The following describes in detail embodiments of the present invention, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to explain the present invention, and should not be construed as limiting the present invention.

[0030] Reference below Figure 1-Figure 2 A test fixture 100 for detecting short circuits in electrode assemblies according to an embodiment of the present invention is described.

[0031] like Figure 1-Figure 2As shown, according to an embodiment of the present invention, a test fixture 100 for detecting short circuit of an electrode assembly, the electrode assembly includes an electrode main body area 200, a thinning area 300 and a pole ear 400, the thinning area 300 is connected between the electrode main body area 200 and the pole ear 400, the thickness of the thinning area 300 is less than the thickness of the electrode main body area 200, and the test fixture 100 includes: two pressing plates 1 and a contoured structure 2.

[0032] The two pressing plates 1 are arranged along a first direction (eg Figure 1 and Figure 2 The two pressing plates 1 are arranged in parallel and at intervals (in the upper and lower directions shown in the figure), and cooperate to define a test space 101. The two pressing plates 1 are suitable for respectively abutting against the two side surfaces of the electrode main area 200 in the thickness direction; the profiling structure 2 is provided on the side of the pressing plate 1 facing the test space 101, and the profiling structure 2 has a profiling surface. The profiling structure 2 is suitable for fitting and abutting against the two side surfaces of the thinning area 300 in the thickness direction through the profiling surface.

[0033] Among them, for the convenience of description, the thickness direction of the pressing plate 1 is set as the first direction. In a specific example, the first direction is the up and down direction. It should be noted that the manufacture of lithium-ion batteries can be divided into four major processes: electrode production, cell assembly, cell testing and module packaging. Among them, cell assembly includes processes such as winding or lamination. The structure of a lithium-ion battery cell using a lamination process includes a plurality of positive plates and negative plates alternately stacked at intervals, and a separator is provided between adjacent positive plates and negative plates.

[0034] The process for detecting battery cell short circuits is usually to press the battery cell together with upper and lower plates to shorten the distance between the positive and negative electrodes and the diaphragm, and then use probes to contact the positive and negative tabs 400. If there is a tiny foreign object inside the battery cell, the foreign object can scratch the diaphragm, causing the battery cell to short circuit, thereby effectively detecting the presence of foreign objects in the battery cell.

[0035] For example Figure 1 and Figure 2 As shown, the two pressing plates 1 are respectively a first pressing plate 1a and a second pressing plate 1b. The first pressing plate 1a is arranged on the upper side of the second pressing plate 1b, and the first pressing plate 1a and the second pressing plate 1b are parallel. Furthermore, the first pressing plate 1a and the second pressing plate 1b can be rectangular plates, and the material of the first pressing plate 1a and the second pressing plate 1b can be steel, so as to ensure that the first pressing plate 1a and the second pressing plate 1b have sufficient structural strength. The lower surface of the first pressing plate 1a can be aligned and abutted with the upper surface of the electrode main body area 200, and the upper surface of the second pressing plate 1b can be aligned and abutted with the lower surface of the electrode main body area 200.

[0036] For example Figure 1 and Figure 2As shown, the thickness of the thinned region 300 in the vertical direction is less than that of the electrode main body region 200. Therefore, a gap exists between the thinned region 300 and the pressing plate 1. The profiling structure 2 is disposed between the first pressing plate 1a and the second pressing plate 1b. Furthermore, the profiling structure 2 can be disposed between the pressing plate 1 and the thinned region 300. The pressing plate 1 can be aligned with and abutted against the profiling structure 2, and the profiling surface of the profiling structure 2 can be aligned with and abutted against the upper and lower side surfaces of the thinned region 300. In addition, the test fixture 100 also includes a drive mechanism capable of driving the first pressing plate 1a downward and the second pressing plate 1b upward.

[0037] In this embodiment, when the test fixture 100 of the present application is used to detect short circuits of electrode assemblies, for example Figure 1 and Figure 2 As shown, the electrode assembly is installed between the first pressing plate 1a and the second pressing plate 1b. The driving mechanism can drive the first pressing plate 1a and the second pressing plate 1b toward each other, so that the pressing plate 1 can effectively press the electrode main body area 200. At the same time, the pressing plate 1 can effectively press the contoured structure 2, thereby effectively pressing the thinning area 300.

[0038] In this way, the distance between the positive and negative electrodes and the diaphragm of the electrode assembly can be effectively shortened. Then, by conducting a power-on test on the electrode assembly, it can be effectively detected whether there are foreign objects in the electrode main area 200 and the thinning area 300, thereby effectively eliminating defective products and avoiding safety hazards caused by manufacturing defects, thereby effectively improving safety and effectively reducing costs.

[0039] According to the test fixture 100 for detecting short circuit of electrode assembly according to the embodiment of the present invention, a pressure plate 1 and a profiling structure 2 are arranged in the test fixture 100, the number of the pressure plates 1 is two, the two pressure plates 1 are arranged parallel and at intervals along the first direction, and cooperate to define a test space 101, the two pressure plates 1 are suitable for respectively abutting against the two side surfaces of the electrode main body area 200 in the thickness direction, the profiling structure 2 is provided on the side of the pressure plate 1 facing the test space 101, the profiling structure 2 has a profiling surface, the profiling structure 2 is suitable for fitting and abutting against the two side surfaces of the thinning area 300 in the thickness direction through the profiling surface, and can effectively press the electrode main body area 200 and the thinning area 300, thereby effectively realizing the test of short circuit of the electrode assembly and effectively improving work efficiency, thereby effectively eliminating defective products, ensuring safety and saving costs.

[0040] In one embodiment of the present invention, Figure 1 and Figure 2 As shown, the profiling structure 2 is configured to be elastically deformable. That is, the profiling structure 2 has the ability to be elastically deformable, and the profiling structure 2 can be deformed when subjected to an external force, and can restore its shape when no external force is applied.

[0041] Therefore, the contoured structure 2 can better adapt to thinning areas 300 of different sizes or shapes, ensuring good contact even with slight differences, thereby enabling the test fixture 100 to test electrode assemblies of various specifications. In addition, the contoured structure 2, with its elastic deformation capability, can absorb some of the impact when subjected to force, preventing damage to the electrode assembly caused by excessive force.

[0042] This embodiment configures the contoured structure 2 to be elastically deformable, which not only enables the test fixture 100 to effectively adapt to and test electrode assemblies of various specifications, thereby effectively increasing the test range, but also effectively protects the thinning area 300 of the electrode assembly, thereby effectively improving safety.

[0043] In one embodiment of the present invention, Figure 1 and Figure 2 As shown, the contoured structure 2 is made of silicone, plastic, or rubber. Silicone has excellent softness and elasticity, and can adapt well to subtle changes in the surface of the electrode assembly. Silicone also has good chemical stability, so the contoured structure 2 made of silicone is less likely to react with the electrode assembly, thereby effectively ensuring the accuracy of the test results.

[0044] Plastic components possess a certain degree of elasticity while maintaining a certain degree of rigidity. This means that the contoured structure 2, constructed using plastic components, is both elastically deformable and possesses a certain degree of structural strength, making it less susceptible to permanent deformation and thus ensuring durability. Furthermore, plastic components are lightweight and inexpensive, effectively reducing the overall weight and cost of the test fixture 100.

[0045] The rubber parts have high elasticity and good durability. The contoured structure 2 using rubber parts can withstand repeated stress without damage, thereby effectively increasing the service life of the contoured structure 2. In addition, the rubber parts can be customized through vulcanization and other methods to meet the specific hardness and elasticity requirements of the contoured structure 2.

[0046] This embodiment, by setting the profiling structure 2 as a silicone part, a plastic part or a rubber part, can effectively meet the requirements of different electrode assemblies and different test environments on the basis of ensuring that the profiling structure 2 effectively compresses the thinning area 300, so that the test fixture 100 can effectively meet various test conditions.

[0047] In one embodiment of the present invention, Figure 1 and Figure 2As shown, there are two thinning areas 300, which are respectively connected to the two ends of the electrode main area 200. Each pressing plate 1 is provided with two contour structures 2 that are spaced apart and symmetrically arranged. The contour structures 2 on the two pressing plates 1 are symmetrically arranged on both sides of the electrode assembly in the thickness direction.

[0048] For example Figure 1 and Figure 2 As shown, the two thinned regions 300 are a first thinned region 300a and a second thinned region 300b. The first thinned region 300a is located at the left end of the electrode main region 200, and the second thinned region 300b is located at the right end of the electrode main region 200. A first contoured structure 2a and a second contoured structure 2b are provided on the lower side of the first pressing plate 1a. The first contoured structure 2a and the second contoured structure 2b are spaced apart and arranged symmetrically, with the first contoured structure 2a being provided to the left of the second contoured structure 2b.

[0049] The upper side of the second pressing plate 1b is provided with a third profiling structure 2c and a fourth profiling structure 2d. The third profiling structure 2c and the fourth profiling structure 2d are spaced apart and arranged symmetrically, with the third profiling structure 2c being located to the left of the fourth profiling structure 2d. The first profiling structure 2a and the second profiling structure 2b are symmetrically arranged on either side of the third profiling structure 2c and the fourth profiling structure 2d in the vertical direction.

[0050] In this embodiment, two contour structures 2 are provided on each pressure plate 1 at intervals and symmetrically arranged. The contour structures 2 on the two pressure plates 1 are symmetrically arranged on both sides of the electrode assembly in the thickness direction. This can effectively ensure that the thinning area 300 is uniformly stressed during the test, avoid test errors caused by local uneven stress, and thus effectively improve the accuracy of the test results.

[0051] In one embodiment of the present invention, Figure 1 As shown, in the direction from the electrode main body area 200 toward the electrode tab 400 , the height of the contoured structure 2 protruding from the surface of the side of the pressing plate 1 facing the test space 101 gradually increases.

[0052] In a specific example, Figure 1 As shown, from right to left, the cross-sectional heights of the first profiling structure 2a and the third profiling structure 2c increase gradually in the vertical direction. From left to right, the cross-sectional heights of the second profiling structure 2b and the fourth profiling structure 2d increase gradually in the vertical direction.

[0053] In this embodiment, the height of the profiling structure 2 protruding from the surface of the side of the pressure plate 1 facing the test space 101 is set to gradually increase in the direction from the electrode main body area 200 toward the electrode ear 400, so that the profiling structure 2 can better fit the surface of the thinning area 300, thereby ensuring the maximization of the contact area between the profiling structure 2 and the thinning area 300, avoiding stress concentration on the contact surface, thereby effectively protecting the thinning area 300 of the electrode assembly and effectively improving the reliability of the test results.

[0054] In one embodiment of the present invention, Figure 1 As shown, the profiling surface is a curved surface that is concave toward the adjacent pressing plate 1. In other words, the profiling surface is a curved surface that is concave toward one side, rather than a flat surface. In a specific example, as Figure 1 As shown, the profiling surfaces of the first profiling structure 2a and the second profiling structure 2b are upwardly concave arc surfaces, and the profiling surfaces of the third profiling structure 2c and the fourth profiling structure 2d are downwardly concave arc surfaces.

[0055] This embodiment enables the profiling structure 2 to further adapt to the complex curved surface of the thinning area 300 of the electrode assembly by setting the profiling surface as a curved surface that is concave toward the adjacent pressure plate 1, thereby further improving the fit between the profiling structure 2 and the thinning area 300, thereby effectively ensuring the abutment effect between the profiling structure 2 and the thinning area 300, and further effectively improving the adaptability of the test fixture 100.

[0056] In one embodiment of the present invention, Figure 1 and Figure 2 As shown, the profiling structure 2 is detachably connected to the pressing plate 1. That is, different profiling structures 2 can be replaced according to the specific shapes and sizes of the thinning areas 300 of different electrode assemblies, thereby meeting the testing requirements of various electrode assemblies.

[0057] In addition, when the profiling structure 2 is worn or damaged after long-term use and cannot meet the test requirements, a new profiling structure 2 can be replaced without replacing the entire test fixture 100, thereby effectively increasing the convenience of maintenance of the test fixture 100 and effectively reducing maintenance costs.

[0058] This embodiment provides a detachable connection between the contoured structure 2 and the pressure plate 1, which can not only effectively meet various testing requirements, thereby effectively improving the flexibility of the test fixture 100, but also effectively improve the maintenance efficiency of the test fixture 100 and effectively reduce maintenance costs.

[0059] In one embodiment of the present invention, Figure 1 and Figure 2As shown, one of the profiling structure 2 and the pressure plate 1 is provided with a slot and the other is provided with a block 3, which fits into the slot. For example, the profiling structure 2 is provided with a block 3 and the pressure plate 1 is provided with a slot; for another example, the profiling structure 2 is provided with a slot and the pressure plate 1 is provided with a block 3.

[0060] In a specific example, Figure 1 and Figure 2 As shown, the pressing plate 1 is provided with a slot, and the profiling structure 2 is provided with a block 3. Specifically, the block 3 is provided on the side of the profiling structure 2 facing the pressing plate 1 and protrudes toward the pressing plate 1. The block 3 extends in the left-right direction, and the slot extends in the left-right direction. The block 3 fits within the slot. The slot and block 3 connect the profiling structure 2 to the pressing plate 1 and restrict the vertical movement of the profiling structure 2. Furthermore, the slot and block 3 enable the profiling structure 2 to move in the left-right direction.

[0061] This embodiment provides a slot on one of the profiling structure 2 and the pressure plate 1, and a block 3 on the other. The block 3 fits into the slot, effectively simplifying the structural structure of the connection between the profiling structure 2 and the pressure plate 1 and effectively enabling rapid installation and removal of the profiling structure 2. Furthermore, the stability of the connection between the profiling structure 2 and the pressure plate 1 is ensured, thereby effectively improving the stability of the test.

[0062] In one embodiment of the present invention, Figure 1 and Figure 2 As shown, the card slot is formed on the side surface of the pressing plate 1 facing the test space 101 and passes through one end surface of the pressing plate 1. The test fixture 100 also includes: a limiting mechanism 4, the limiting mechanism 4 is fixed on the pressing plate 1, and the limiting mechanism 4 has a limiting portion 41. The limiting portion 41 is located on the side of the profiling structure 2 away from the electrode main body area 200 and abuts against the profiling structure 2.

[0063] In a specific example, Figure 1 and Figure 2 As shown, the first profiling structure 2a, the second profiling structure 2b, the third profiling structure 2c, and the fourth profiling structure 2d are each provided with two latching blocks 3. Two latching slots are provided on the lower side of the left end of the first pressing plate 1a, two latching slots are provided on the lower side of the right end of the first pressing plate 1a, two latching slots are provided on the upper side of the left end of the second pressing plate 1b, and two latching slots are provided on the upper side of the right end of the second pressing plate 1b. The latching slots extend through one end of the pressing plate 1, meaning that the profiling structure 2 can be inserted into the latching slots from one end of the pressing plate 1 via the latching blocks 3, ensuring convenient installation and removal of the profiling structure 2.

[0064] The block 3 of the first profiling structure 2a can cooperate with the slot on the lower side surface of the left end of the first pressure plate 1a, the block 3 of the second profiling structure 2b can cooperate with the slot on the lower side surface of the right end of the first pressure plate 1a, the block 3 of the third profiling structure 2c can cooperate with the slot on the upper side surface of the left end of the second pressure plate 1b, and the block 3 of the fourth profiling structure 2d can cooperate with the slot on the upper side surface of the right end of the second pressure plate 1b.

[0065] This embodiment can effectively improve the convenience of installing and disassembling the profiling structure 2 by forming the card slot on the side surface of the pressure plate 1 facing the test space 101 and passing through one end surface of the pressure plate 1, thereby effectively improving the efficiency of installing and disassembling the profiling structure 2.

[0066] In a specific example, Figure 1 As shown, there are four limiting mechanisms 4, each of which further includes a fixing portion 42. One end of the limiting portion 41 abuts against the contoured structure 2, and the other end is connected to the fixing portion 42. Furthermore, the limiting mechanism 4 can be made of plastic, and the fixing portion 42 can be fixed to one end of the pressure plate 1 by screws, thereby effectively fixing the limiting mechanism 4.

[0067] In this embodiment, a limiting mechanism 4 is provided in the test fixture 100. The limiting mechanism 4 is fixed on the pressure plate 1. The limiting mechanism 4 has a limiting portion 41. The limiting portion 41 is located on the side of the profiling structure 2 that is away from the electrode main area 200 and abuts against the profiling structure 2. It can effectively fix the profiling structure and prevent the profiling structure from sliding along the slot during testing, thereby ensuring the stability of the profiling structure 2. In this way, it is effectively ensured that the profiling structure 2 can fit tightly with the pressure plate 1 and the thinning area 300, thereby effectively ensuring that the thinning area 300 is under pressure.

[0068] In one embodiment of the present invention, Figure 2 As shown, the width of the card slot gradually decreases from the bottom wall of the card slot toward the opening, and the card block 3 is adapted to the shape of the card slot. In a specific example, as shown in FIG. Figure 2 As shown, the cross-sectional shape of the slot is trapezoidal, that is, the width of the slot gradually decreases from the bottom wall of the slot toward the opening. When the profiling structure 2 is installed, the block 3 is located in the slot, and the slot can effectively limit the movement of the block 3 in the up and down directions, so that the slot can effectively fix the profiling structure 2 in the up and down directions.

[0069] In this embodiment, the width of the slot is set to gradually decrease in the direction from the bottom wall of the slot toward the opening, and the card block 3 is adapted to the shape of the slot, so that the slot and the card block 3 can effectively realize the self-locking function, thereby effectively fixing the profiling structure 2, and further effectively improving the stability of the connection between the profiling structure 2 and the pressure plate 1.

[0070] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation to the present invention.

[0071] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature specified as "first" or "second" may explicitly or implicitly include one or more of such features. In the description of this utility model, "plurality" means two or more, unless otherwise specifically defined.

[0072] In this utility model, unless otherwise expressly specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection, or communication; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. For those skilled in the art, the specific meanings of the above terms in this utility model can be understood according to specific circumstances.

[0073] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0074] Although the embodiments of the present invention have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and purpose of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test fixture for detecting short circuits in an electrode assembly, wherein the electrode assembly comprises an electrode main body region, a thinning region, and a tab, wherein the thinning region is connected between the electrode main body region and the tab, and the thickness of the thinning region is less than the thickness of the electrode main body region, characterized in that: The test tooling includes: Two pressing plates, the two pressing plates are arranged parallel to and spaced apart in a first direction and cooperate to define a test space, the two pressing plates being adapted to respectively abut against two side surfaces of the electrode main body region in a thickness direction; A profiling structure is provided on the side of the pressing plate facing the test space, and the profiling structure has a profiling surface, and the profiling structure is suitable for being attached and abutted with the two side surfaces of the thinning area in the thickness direction through the profiling surface.

2. The test fixture for detecting short circuit of an electrode assembly according to claim 1, characterized in that: The contoured structure is configured to be elastically deformable.

3. The test fixture for detecting short circuit of an electrode assembly according to claim 2, characterized in that: The contoured structure is a silicone part, a plastic part or a rubber part.

4. The test tool for detecting short circuit of an electrode assembly according to any one of claims 1 to 3, characterized in that: There are two thinning areas, and the two thinning areas are connected to the two ends of the electrode main area respectively. Each of the pressing plates is provided with two contoured structures that are spaced apart and symmetrically arranged, and the contoured structures on the two pressing plates are symmetrically arranged on both sides of the electrode assembly in the thickness direction.

5. The test fixture for detecting short circuit of an electrode assembly according to claim 4, characterized in that: In a direction from the electrode main body area toward the electrode lug, the height of the contoured structure protruding from a side surface of the pressing plate facing the test space gradually increases.

6. The test fixture for detecting short circuit of an electrode assembly according to claim 5, characterized in that: The contoured surface is a curved surface that is concave toward the adjacent pressing plate.

7. The test fixture for detecting short circuit of an electrode assembly according to claim 1, characterized in that: The contoured structure is detachably connected to the pressing plate.

8. The test fixture for detecting short circuit of an electrode assembly according to claim 7, characterized in that: One of the profiling structure and the pressing plate is provided with a card slot and the other is provided with a card block, and the card block is fitted in the card slot.

9. The test fixture for detecting short circuit of an electrode assembly according to claim 8, characterized in that: The card slot is formed on a side surface of the pressing plate facing the test space and passes through one end surface of the pressing plate. The testing fixture further includes: a limiting mechanism, which is fixed to the pressing plate and has a limiting portion, which is located on a side of the profiling structure away from the electrode main body area and abuts against the profiling structure.

10. The test fixture for detecting short circuit of an electrode assembly according to claim 8, characterized in that: In the direction from the bottom wall of the card slot toward the opening, the width of the card slot gradually decreases, and the card block is adapted to the shape of the card slot.

Images