Power semiconductor test experiment platform

Abstract

The utility model discloses a power semiconductor test experiment platform which comprises an experiment platform body and a first conveyor, the first conveyor is arranged outside the experiment platform body, a second conveyor is arranged outside the experiment platform body on one side of the first conveyor, and a supporting frame is arranged outside the experiment platform body on one side of the second conveyor. A sliding seat is slidably mounted at the top end of the supporting frame, a third electric push rod is mounted on the outer wall of the sliding seat, a clamping frame is arranged outside the supporting frame on one side of the third electric push rod, a connecting block is mounted on the side, close to the third electric push rod, of the clamping frame, and the output end of the third electric push rod is connected with the connecting block. According to the utility model, the power semiconductors can be conveniently and automatically moved, adjusted, clamped and conveyed, the tested power semiconductors can be conveniently conveyed and discharged, the power semiconductors with different qualities can be conveniently classified and conveyed, the time between each group of power semiconductors is shortened, and the batch testing efficiency of the power semiconductors is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of test experimental platforms, in particular to a power semiconductor test experimental platform. Background Art

[0002] Power semiconductors are semiconductor devices that can drive engines, power batteries, and operate devices such as microcomputers and LSIs. They can effectively control and supply electricity. In the fields of new energy, rail transportation, electric vehicles, industrial applications, and home appliances, power semiconductor devices play a core role. Especially with the rapid development of new energy electric vehicles, the power semiconductor device market has experienced explosive growth.

[0003] For example, a semiconductor chip testing platform disclosed in authorization announcement number CN217587307U includes a testing platform body, a limiting mechanism, an observation mechanism, an operating mechanism, a storage mechanism, and a support mechanism, wherein the limiting mechanism is located at the front end of the top of the testing platform body, the observation mechanism is located at the rear end of the top of the testing platform body, the operating mechanism is located at the left end of the observation mechanism, the storage mechanism is located at the right end of the limiting mechanism, and the support mechanism is located at the bottom end of the testing platform body;

[0004] Although it realizes the testing platform of the semiconductor chip and installs a limiting mechanism to clamp and limit the semiconductor chip, the bolt is driven to rotate inside the screw hole and contact the gasket 2 by rotating the knob, and the semiconductor chip is placed on the bottom end of the gasket 2. The bolt is continued to be rotated to make the semiconductor chip fit tightly with the gasket 1 to achieve the purpose of limiting the semiconductor chip, and there is a distance between the fixed plate and the clamping plate, which is convenient for limiting semiconductor chips of different thicknesses. However, it does not solve the problem that the existing test experimental platform is not conducive to convenient automatic movement, adjustment, clamping and conveying of power semiconductors during use, is not convenient for conveying and discharging power semiconductors that have been tested, and is not convenient for classifying and conveying power semiconductors of different qualities, which affects the time between each group of power semiconductors and affects the efficiency of batch testing of power semiconductors. Utility Model Content

[0005] The purpose of the present utility model is to provide a power semiconductor test experimental platform to solve the problems raised in the above background technology, that is, the test experimental platform is not convenient for automatic movement, adjustment, clamping and transporting power semiconductors, is not convenient for transporting and discharging power semiconductors that have completed testing, is not convenient for classifying and transporting power semiconductors of different qualities, affects the time between each group of power semiconductors, and affects the efficiency of batch testing of power semiconductors.

[0006] To achieve the above-mentioned objectives, the present invention provides the following technical solutions: a power semiconductor test experimental platform, comprising an experimental platform body and a first conveyor, a first conveyor is arranged on the outside of the experimental platform body, a second conveyor is arranged on the outside of the experimental platform body on one side of the first conveyor, a support frame is arranged on the outside of the experimental platform body on one side of the second conveyor, a sliding seat is slidably installed on the top of the support frame, a third electric push rod is installed on the outer wall of the sliding seat, a clamping frame is arranged on the outside of the support frame on one side of the third electric push rod, a connecting block is installed on the side of the clamping frame close to the third electric push rod, and the output end of the third electric push rod is connected to the connecting block, a second motor is installed on the outer wall of the clamping frame, and the second motor extends to the interior of the clamping frame, a gear is installed on the output end of the second motor, a first rack is movably installed inside the clamping frame on one side of the gear, a second rack is movably installed inside the clamping frame on one side of the first rack, and the first rack and the second rack are both meshed with the gear.

[0007] Preferably, a sliding frame is slidably mounted on the outer walls of the first rack and the second rack, a clamping claw is mounted on the outer wall of the sliding frame, a fourth electric push rod is mounted inside the sliding frame on one side of the clamping claw, a connecting rod is mounted on the output end of the fourth electric push rod, and the connecting rod is respectively connected to the first rack and the second rack.

[0008] Preferably, a first motor is mounted on the outer wall of the support frame, a threaded rod is movably mounted inside the support frame on one side of the first motor, and an output end of the first motor is connected to the threaded rod.

[0009] Preferably, a threaded block is sleeved on the surface of the threaded rod, and the threaded rod is threadedly connected to the threaded block, and the threaded block is fixedly connected to the sliding seat.

[0010] Preferably, a first electric push rod is installed at the top of the experimental platform body, a test frame is installed at the top of the experimental platform body on one side of the first electric push rod, an adjusting rod is installed at the output end of the first electric push rod, and a slide rail is installed at the top of the experimental platform body on the side of the adjusting rod.

[0011] Preferably, a placement plate is provided at the top of the slide rail, a slider is installed at the bottom end of the placement plate, and the slider is slidably connected to the slide rail, and the slider is connected to the adjustment rod, a second electric push rod is installed at the top of the test stand, and the second electric push rod extends to the interior of the test stand, and a semiconductor tester is installed at the output end of the second electric push rod.

[0012] Preferably, a first conveying channel is provided at the top of the first conveyor, a second conveying channel is provided at the top of the first conveyor on one side of the first conveying channel, a third motor is installed at the bottom end of the first conveyor, and the output end of the third motor extends to the top of the first conveyor, a rotating shaft is installed at the output end of the third motor, a baffle is installed on the surface of the rotating shaft, and the baffle is movably connected to the first conveyor.

[0013] Preferably, a control panel is installed on the top of the experimental platform body on one side of the test stand, and the output end of the control panel is electrically connected to the input ends of the first conveyor, the second conveyor, the first electric push rod, the semiconductor tester, the first motor, the third electric push rod, the second electric push rod, the second motor, the fourth electric push rod, and the third motor.

[0014] Compared with the existing technology, the beneficial effects of the present invention are: the test experimental platform not only realizes the convenient automatic movement and adjustment of the clamping and conveying of power semiconductors, but also facilitates the conveying and discharge of tested power semiconductors, facilitates the classification and conveying of power semiconductors of different qualities, shortens the time between each group of power semiconductors, and improves the efficiency of batch testing of power semiconductors;

[0015] (1) The power semiconductor to be tested is transported by the second conveyor, the connecting rod is driven to move by the fourth electric push rod, the sliding frame is driven by the fourth electric push rod to adjust the height, and the sliding frame is driven by the clamping claw to adjust the height to facilitate the clamping claw to adjust to both sides of the power semiconductor, the gear is driven by the second motor to rotate, and the sliding frame is driven to move the clamping claw to facilitate the two sets of clamping claws to fix the power semiconductor in a central manner, the threaded rod is driven by the first motor to rotate, the threaded block moves laterally on the surface of the threaded rod, the threaded block drives the sliding seat to move laterally, the sliding seat drives the third electric push rod to move laterally, the third electric push rod drives the clamping frame to move laterally as a whole through the connecting block, and the clamping frame drives the power semiconductor to move laterally through the clamping claw to facilitate the power semiconductor to move to the top of the placement tray, and the second motor is turned on in reverse to make the two sets of clamping claws move in reverse to facilitate the power semiconductor to be clamped and released, so as to facilitate the power semiconductor to enter the interior of the placement tray, thereby realizing the convenient central clamping and fixing of the test experimental platform, facilitating the lateral movement adjustment, and improving the convenience of adjusting the test experimental platform;

[0016] (2) The first electric push rod drives the adjustment rod to move, and the adjustment rod drives the slider to move on the surface of the slide rail, and the slider drives the placement plate to move, and the placement plate drives the power semiconductor to move, so as to facilitate the power semiconductor to move to the bottom end of the semiconductor tester, and the second electric push rod drives the semiconductor tester to adjust the height, so as to facilitate the semiconductor tester to adjust to the top end of the placement plate, and the semiconductor tester tests the power semiconductor inside the placement plate. When the test is completed, the first electric push rod is reset to make the placement plate drive the power semiconductor to move out of the test rack, and the second motor drives two sets of clamps to clamp and fix the power semiconductor after the test, and the third electric push rod drives the connection block to move, and the connection block drives the clamping frame to move, and the clamping frame drives the clamping claw to move, so as to facilitate the clamping claw to drive the power semiconductor to the top end of the first conveyor. By operating to shut down the second motor, the power semiconductors can be conveniently dropped to the top of the first conveyor, and the power semiconductors are conveyed by the first conveyor. When the power semiconductor test is qualified, the third motor drives the rotating shaft to rotate, and the rotating shaft drives the baffle to rotate, so as to facilitate the baffle to rotate to one side of the second conveying channel, so as to facilitate the closing of the second conveying channel, so as to facilitate the qualified power semiconductors to be conveyed to the next link through the first conveying channel. When the power semiconductor test is unqualified, the third motor drives the rotating shaft to rotate, and the rotating shaft drives the baffle to rotate, and the baffle closes the first conveying channel, so as to facilitate the unqualified power semiconductors to be conveyed to the next link through the second conveying channel, thereby realizing convenient and highly mobile testing of the test experimental platform, facilitating the classified conveying of power semiconductors of different qualities, and improving the conveying efficiency of the test experimental platform. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic diagram of the three-dimensional structure of the utility model;

[0018] Figure 2 This is a schematic diagram of the three-dimensional structure of the slide rail of the present invention;

[0019] Figure 3 This is a front view structural diagram of the utility model;

[0020] Figure 4 This is a schematic diagram of the rear cross-sectional structure of the support frame of the present invention;

[0021] Figure 5 This is a three-dimensional enlarged structural diagram of the second rack of the present invention;

[0022] Figure 6 This is a schematic side sectional structural diagram of the first conveyor of the present invention.

[0023] In the figure: 1. Experimental platform body; 2. First conveyor; 3. Second conveyor; 4. Support frame; 5. First electric push rod; 6. Test frame; 7. Slide rail; 8. Slider; 9. Placement plate; 10. Semiconductor tester; 11. Adjustment rod; 12. Second electric push rod; 13. Sliding seat; 14. First motor; 15. Threaded rod; 16. Threaded block; 17. Third electric push rod; 18. Connecting block; 19. Clamping frame; 20. Second motor; 21. Gear; 22. First rack; 23. Second rack; 24. Sliding frame; 25. Clamp; 26. Fourth electric push rod; 27. Connecting rod; 28. First conveying channel; 29. ​​Second conveying channel; 30. Third motor; 31. Rotating shaft; 32. Baffle; 33. Control panel. DETAILED DESCRIPTION

[0024] In order to further illustrate the technical means and effects adopted by the present invention to achieve the predetermined purpose of the utility model, the following is a detailed description of the specific implementation method, structure, characteristics and effects of the present invention in combination with the accompanying drawings and preferred embodiments.

[0025] See also Figure 1-6, the utility model provides an embodiment: a power semiconductor test experimental platform, including an experimental platform body 1 and a first conveyor 2, the first conveyor 2 is arranged on the outside of the experimental platform body 1, the second conveyor 3 is arranged on the outside of the experimental platform body 1 on one side of the first conveyor 2, and a support frame 4 is arranged on the outside of the experimental platform body 1 on one side of the second conveyor 3, and a sliding seat 13 is slidably installed on the top of the support frame 4, and a third electric push rod 17 is installed on the outer wall of the sliding seat 13, and the third electric push rod 17 plays a role in power output, and a clamping frame 19 is arranged on the outside of the support frame 4 on one side of the third electric push rod 17, and a connecting block 18 is installed on the side of the clamping frame 19 close to the third electric push rod 17, and the output end of the third electric push rod 17 is connected to the connecting block 18, and a second motor 20 is installed on the outer wall of the clamping frame 19, and the second motor 20 plays a role in power output, and the second motor 20 extends to the inside of the clamping frame 19, and a gear 21 is installed on the output end of the second motor 20, and the inside of the clamping frame 19 on the side of the gear 21 A first rack 22 is movably mounted, and a second rack 23 is movably mounted inside the clamping frame 19 on one side of the first rack 22, and the first rack 22 and the second rack 23 are meshed with the gear 21. A sliding frame 24 is slidably mounted on the outer wall of the first rack 22 and the second rack 23, and a clamping claw 25 is mounted on the outer wall of the sliding frame 24. A fourth electric push rod 26 is mounted inside the sliding frame 24 on one side of the clamping claw 25. The fourth electric push rod 26 plays the role of power output. The output end of the fourth electric push rod 26 A connecting rod 27 is installed, and the connecting rod 27 is respectively connected to the first rack 22 and the second rack 23. A first motor 14 is installed on the outer wall of the support frame 4. The first motor 14 plays the role of power output. A threaded rod 15 is movably installed inside the support frame 4 on one side of the first motor 14, and the output end of the first motor 14 is connected to the threaded rod 15. A threaded block 16 is set on the surface of the threaded rod 15, and the threaded rod 15 is threadedly connected to the threaded block 16, and the threaded block 16 is fixedly connected to the sliding seat 13;

[0026] During use, the second conveyor 3 is turned on by operating the control panel 33, and the second conveyor 3 conveys the power semiconductor that needs to be tested. When the second conveyor 3 conveys the power semiconductor to the bottom of the clamping jaw 25, the fourth electric push rod 26 is turned on by operating the control panel 33, and the fourth electric push rod 26 drives the connecting rod 27 to move. Under the support of the first rack 22 and the second rack 23, the fourth electric push rod 26 drives the sliding frame 24 to adjust the height, and the sliding frame 24 drives the clamping jaw 25 to adjust the height to facilitate the adjustment of the clamping jaw 25 to both sides of the power semiconductor. The second motor 20 is turned on by operating the control panel 33, and under the support of the clamping frame 19, the second motor 20 drives the gear 21 to rotate. Under the meshing action of the gear 21 and the first rack 22 and the second rack 23, the second motor 20 drives the first rack 22 and the second rack 23 to move, and the first rack 22 and the second rack 23 respectively drive a group of sliding frames 24 to move, and the sliding frame 24 drives the clamping jaw 25 to move, to facilitate the two groups of clamping jaws 25. The power semiconductor is clamped and fixed in a centered manner. The first motor 14 is turned on by operating the control panel 33. Under the support of the support frame 4, the first motor 14 drives the threaded rod 15 to rotate. Under the threaded support of the threaded rod 15 and the threaded block 16, the threaded block 16 moves laterally on the surface of the threaded rod 15. Under the sliding support of the sliding seat 13 and the support frame 4, the threaded block 16 drives the sliding seat 13 to move laterally. The sliding seat 13 drives the third electric push rod 17 to move laterally. The third electric push rod 17 drives the clamping frame 19 to move laterally as a whole through the connecting block 18. The clamping frame 19 drives the power semiconductor to move laterally through the clamping claws 25, so as to facilitate the power semiconductor to move to the top of the placement tray 9. By turning on the second motor 20 in the opposite direction, the two sets of clamping claws 25 move in the opposite direction, so as to facilitate the power semiconductor to be clamped and released, so as to facilitate the power semiconductor to enter the interior of the placement tray 9. The convenient centered clamping and fixing of the test experimental platform is realized, the lateral movement adjustment is convenient, and the adjustment convenience of the test experimental platform is improved.

[0027] A first electric push rod 5 is installed at the top of the experimental platform body 1, and the first electric push rod 5 plays the role of power output. A test stand 6 is installed at the top of the experimental platform body 1 on one side of the first electric push rod 5, and an adjusting rod 11 is installed at the output end of the first electric push rod 5. A slide rail 7 is installed at the top of the experimental platform body 1 on one side of the adjusting rod 11, and a placement plate 9 is provided at the top of the slide rail 7. A slider 8 is installed at the bottom end of the placement plate 9, and the slider 8 is slidably connected to the slide rail 7, and the slider 8 is connected to the adjusting rod 11. A second electric push rod 12 is installed at the top of the test stand 6, and the second electric push rod 12 plays the role of power output, and the second electric push rod 12 extends to the interior of the test stand 6. A semiconductor tester 10 is installed at the output end of the second electric push rod 12, and a first conveying channel 28 is provided at the top of the first conveyor 2 A second conveying channel 29 is provided at the top of the first conveyor 2 on one side of the first conveying channel 28, and a third motor 30 is installed at the bottom end of the first conveyor 2. The third motor 30 plays a role of power output, and the output end of the third motor 30 extends to the top of the first conveyor 2, and a rotating shaft 31 is installed at the output end of the third motor 30. A baffle 32 is installed on the surface of the rotating shaft 31, and the baffle 32 is movably connected to the first conveyor 2. A control panel 33 is installed at the top of the experimental platform body 1 on one side of the test stand 6, and the output end of the control panel 33 is electrically connected to the input ends of the first conveyor 2, the second conveyor 3, the first electric push rod 5, the semiconductor tester 10, the first motor 14, the third electric push rod 17, the second electric push rod 12, the second motor 20, the fourth electric push rod 26, and the third motor 30;

[0028] When in use, the first electric push rod 5 is opened by operating the control panel 33. Under the support of the experimental platform body 1, the first electric push rod 5 drives the adjustment rod 11 to move. Under the sliding support of the slide rail 7 and the slider 8, the adjustment rod 11 drives the slider 8 to move on the surface of the slide rail 7, and the slider 8 drives the placement plate 9 to move, and the placement plate 9 drives the power semiconductor to move, so as to facilitate the movement of the power semiconductor to the bottom end of the semiconductor tester 10. The second electric push rod 12 and the semiconductor tester 10 are opened by operating the control panel 33. Under the support of the test stand 6, the second electric push rod 12 drives the semiconductor tester 10 to move. The height of the device 10 is adjusted to facilitate the adjustment of the semiconductor tester 10 to the top of the placement tray 9. The semiconductor tester 10 tests the power semiconductor inside the placement tray 9. When the test is completed, the first electric push rod 5 is reset to allow the placement tray 9 to drive the power semiconductor out of the interior of the test rack 6. The second motor 20 is operated again to open the second motor 20, and the second motor 20 drives the two sets of clamps 25 to clamp and fix the power semiconductor after the test. The third electric push rod 17 is opened by operating the control panel 33, and the third electric push rod 17 drives the connecting block 18 to move, and the connecting block 18 drives the clamping frame 1 9 moves, and the clamping frame 19 drives the clamping claw 25 to move, so that the clamping claw 25 drives the power semiconductor to move to the top of the first conveyor 2, and the second motor 20 is turned off by operation to facilitate the power semiconductor to fall into the top of the first conveyor 2. The first conveyor 2 is opened by operating the control panel 33, and the power semiconductor is conveyed by the first conveyor 2. When the power semiconductor test is qualified, the third motor 30 is turned on by operating the control panel 33, and the third motor 30 drives the rotating shaft 31 to rotate, and the rotating shaft 31 drives the baffle 32 to rotate, so as to facilitate the baffle 32 to rotate to the second conveying channel 29. On one side, the second conveying channel 29 is closed to facilitate the conveying of qualified power semiconductors to the next link through the first conveying channel 28. When the power semiconductor test fails, the third motor 30 is operated to drive the rotating shaft 31 to rotate, and the rotating shaft 31 drives the baffle 32 to rotate, and the baffle 32 closes the first conveying channel 28 to facilitate the conveying of unqualified power semiconductors to the next link through the second conveying channel 29, realizing convenient and highly mobile testing of the test experimental platform, facilitating the classified conveying of power semiconductors of different qualities, and improving the conveying efficiency of the test experimental platform.

[0029] Working principle: When in use, an external power supply is connected. First, the second conveyor 3 conveys the power semiconductor that needs to be tested. When the second conveyor 3 conveys the power semiconductor to the bottom of the clamping jaw 25, the fourth electric push rod 26 drives the connecting rod 27 to move, and the fourth electric push rod 26 drives the sliding frame 24 to adjust the height, and the sliding frame 24 drives the clamping jaw 25 to adjust the height to facilitate the adjustment of the clamping jaw 25 to both sides of the power semiconductor. The second motor 20 drives the gear 21 to rotate, and the second motor 20 drives the first rack 22 and the second rack 23 to move. The first rack 22 and the second rack 23 respectively drive a group of sliding frames 24 to move, and the sliding frame 24 drives the clamping jaw 25 to move, so as to facilitate the two groups of clamping jaws 25 to center the power semiconductor. The clamping is fixed, and the threaded rod 15 is driven to rotate by the first motor 14, and the threaded block 16 moves laterally on the surface of the threaded rod 15, and the threaded block 16 drives the sliding seat 13 to move laterally, and the sliding seat 13 drives the third electric push rod 17 to move laterally, and the third electric push rod 17 drives the clamping frame 19 to move laterally as a whole through the connecting block 18, and the clamping frame 19 drives the power semiconductor to move laterally through the clamping claw 25, so as to facilitate the power semiconductor to move to the top of the placement disk 9, and by opening the second motor 20 in the reverse direction, the two sets of clamping claws 25 move in the reverse direction, so as to facilitate the power semiconductor to be released from the clamping state, so as to facilitate the power semiconductor to enter the interior of the placement disk 9, and the first electric push rod 5 drives the adjusting rod 11 to move, and the adjusting rod 11 drives the slider 8 to slide The surface of the rail 7 moves, and the slider 8 drives the placement tray 9 to move, and the placement tray 9 drives the power semiconductor to move, so as to facilitate the power semiconductor to move to the bottom end of the semiconductor tester 10. The second electric push rod 12 drives the semiconductor tester 10 to adjust the height, so as to facilitate the semiconductor tester 10 to adjust to the top end of the placement tray 9. The semiconductor tester 10 tests the power semiconductor inside the placement tray 9. When the test is completed, the first electric push rod 5 is operated to reset, so that the placement tray 9 drives the power semiconductor to move out of the interior of the test rack 6, and the second motor 20 is operated again to open the second motor 20, and the second motor 20 drives the two sets of clamps 25 to clamp and fix the power semiconductor after the test. The third electric push rod 17 drives the connecting block 18 to move, and the connecting block 18 drives the connecting block 18 to move. The dynamic clamping frame 19 moves, and the clamping frame 19 drives the clamping claw 25 to move, so that the clamping claw 25 drives the power semiconductor to move to the top of the first conveyor 2, and the second motor 20 is turned off by operation to facilitate the power semiconductor to fall into the top of the first conveyor 2, and the power semiconductor is conveyed by the first conveyor 2. When the power semiconductor test is qualified, the third motor 30 drives the rotating shaft 31 to rotate, and the rotating shaft 31 drives the baffle 32 to rotate, so that the baffle 32 rotates to one side of the second conveying channel 29, so as to facilitate the closing of the second conveying channel 29, so as to facilitate the qualified power semiconductor to be conveyed to the next link through the first conveying channel 28. When the power semiconductor test fails, the rotating shaft 31 is driven to rotate by operating the third motor 30.The baffle 32 is driven by the rotating shaft 31 to rotate, and the baffle 32 closes the first conveying channel 28 to facilitate the conveyance of unqualified power semiconductors to the next link through the second conveying channel 29, thereby completing the use of the test experimental platform.

[0030] The above description is merely a preferred embodiment of the present invention and does not constitute any form of limitation to the present invention. Although the present invention has been disclosed as a preferred embodiment as above, it is not intended to limit the present invention. Any person skilled in the art can make some changes or modifications to equivalent embodiments using the technical contents disclosed above without departing from the scope of the technical solution of the present invention. However, any brief modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention are still within the scope of the technical solution of the present invention.

Claims

1. A power semiconductor test experimental platform, comprising an experimental platform body (1) and a first conveyor (2), characterized in that: A first conveyor (2) is provided on the outside of the experimental platform body (1), a second conveyor (3) is provided on the outside of the experimental platform body (1) on one side of the first conveyor (2), a support frame (4) is provided on the outside of the experimental platform body (1) on one side of the second conveyor (3), a sliding seat (13) is slidably installed on the top of the support frame (4), a third electric push rod (17) is installed on the outer wall of the sliding seat (13), a clamping frame (19) is provided on the outside of the support frame (4) on one side of the third electric push rod (17), and the clamping frame (19) is installed on one side close to the third electric push rod (17). A connecting block (18) is provided, and an output end of the third electric push rod (17) is connected to the connecting block (18); a second motor (20) is installed on the outer wall of the clamping frame (19), and the second motor (20) extends to the inside of the clamping frame (19); a gear (21) is installed on the output end of the second motor (20); a first rack (22) is movably installed inside the clamping frame (19) on one side of the gear (21); a second rack (23) is movably installed inside the clamping frame (19) on one side of the first rack (22); and the first rack (22) and the second rack (23) are both meshed with the gear (21).

2. A power semiconductor test experimental platform according to claim 1, characterized in that: A sliding frame (24) is slidably mounted on the outer wall of the first rack (22) and the second rack (23), a clamping claw (25) is mounted on the outer wall of the sliding frame (24), a fourth electric push rod (26) is mounted inside the sliding frame (24) on one side of the clamping claw (25), and a connecting rod (27) is mounted on the output end of the fourth electric push rod (26), and the connecting rod (27) is connected to the first rack (22) and the second rack (23) respectively.

3. The power semiconductor test experimental platform according to claim 1, characterized in that: A first motor (14) is mounted on the outer wall of the support frame (4), a threaded rod (15) is movably mounted inside the support frame (4) on one side of the first motor (14), and an output end of the first motor (14) is connected to the threaded rod (15).

4. A power semiconductor test experimental platform according to claim 3, characterized in that: A threaded block (16) is sleeved on the surface of the threaded rod (15), the threaded rod (15) and the threaded block (16) are threadedly connected, and the threaded block (16) is fixedly connected to the sliding seat (13).

5. The power semiconductor test experimental platform according to claim 1, characterized in that: A first electric push rod (5) is installed at the top of the experimental platform body (1), a test frame (6) is installed at the top of the experimental platform body (1) on one side of the first electric push rod (5), an adjustment rod (11) is installed at the output end of the first electric push rod (5), and a slide rail (7) is installed at the top of the experimental platform body (1) on one side of the adjustment rod (11).

6. The power semiconductor test experimental platform according to claim 5, characterized in that: A placement plate (9) is provided at the top end of the slide rail (7), a slider (8) is installed at the bottom end of the placement plate (9), and the slider (8) is slidably connected to the slide rail (7), and the slider (8) is connected to the adjustment rod (11), a second electric push rod (12) is installed at the top end of the test frame (6), and the second electric push rod (12) extends to the interior of the test frame (6), and a semiconductor tester (10) is installed at the output end of the second electric push rod (12).

7. The power semiconductor test experimental platform according to claim 1, characterized in that: A first conveying channel (28) is provided at the top of the first conveyor (2), a second conveying channel (29) is provided at the top of the first conveyor (2) on one side of the first conveying channel (28), a third motor (30) is installed at the bottom of the first conveyor (2), and the output end of the third motor (30) extends to the top of the first conveyor (2), a rotating shaft (31) is installed at the output end of the third motor (30), a baffle (32) is installed on the surface of the rotating shaft (31), and the baffle (32) is movably connected to the first conveyor (2).

8. The power semiconductor test experimental platform according to claim 5, characterized in that: A control panel (33) is installed on the top of the experimental platform body (1) on one side of the test stand (6), and the output end of the control panel (33) is electrically connected to the input ends of the first conveyor (2), the second conveyor (3), the first electric push rod (5), the semiconductor tester (10), the first motor (14), the third electric push rod (17), the second electric push rod (12), the second motor (20), the fourth electric push rod (26), and the third motor (30).

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