Temperature control testing device and three-temperature sorting machine

Abstract

The utility model relates to a temperature control testing device and a three-temperature sorting machine. The temperature control test device is used for enabling an electronic device to be tested at different temperatures, and comprises a test cavity which is configured to be capable of accommodating the electronic device and creating different temperature environments; the air pump is communicated with the testing cavity so as to pump out air in the testing cavity; the dryer is connected to the air pump and the testing cavity so as to dry the air pumped out of the testing cavity by the air pump and convey the air back to the testing cavity; wherein the test cavity, the air pump and the dryer are connected to form a gas circulation loop, so as to accelerate the replacement of gas in the test cavity. According to the temperature control testing device and the three-temperature sorting machine, gas replacement in the testing cavity can be accelerated, and the duration of dew point reduction is shortened.

Description

Technical Field

[0001] The present application relates to the field of semiconductor testing technology, and in particular to a temperature-controlled testing device and a three-temperature sorting machine. Background Art

[0002] Most electronic devices are often used in different temperature environments. Therefore, to determine their performance under different temperatures, they must be tested under different temperature conditions before leaving the factory. This is to screen out qualified electronic devices and eliminate unsuitable ones. Currently, the industry often uses three-temperature sorting machines to perform these tests on electronic devices. The test chamber of a three-temperature sorting machine can create normal temperature, high temperature, and low temperature test environments to meet the testing requirements of electronic devices at different temperatures.

[0003] In low-temperature testing environments, frost and condensation are very likely to form in the test chamber, which can adversely affect the electronic devices being tested. Therefore, frost and condensation are unacceptable in the test chamber. To address this, existing techniques typically introduce dry air directly into the test chamber to lower the dew point. However, this conventional technique results in low gas replacement efficiency, a long time to lower the dew point, and high dry air consumption.

[0004] In view of this, it is necessary to propose a new technical solution to overcome the shortcomings of the existing technology. Utility Model Content

[0005] Based on this, the present application provides a temperature-controlled testing device and a three-temperature sorting machine, which can accelerate the gas replacement in the test chamber and shorten the time to lower the dew point.

[0006] To this end, the present application adopts the following technical solution: a temperature control test device for enabling electronic devices to be tested at different temperatures, the temperature control test device comprising:

[0007] a test chamber configured to accommodate electronic devices and create different temperature environments;

[0008] an air pump connected to the test chamber to pump out the gas in the test chamber; and

[0009] a dryer connected to the air pump and the test chamber to dry the gas extracted from the test chamber by the air pump and transport the gas back to the test chamber;

[0010] The test chamber, the air pump and the dryer are connected to form a gas circulation loop to accelerate the replacement of the gas in the test chamber.

[0011] In some embodiments, a boost valve is provided between the air pump and the dryer, and the boost valve is configured to boost the pressure of the gas extracted by the air pump.

[0012] In some embodiments, the temperature-controlled testing device further includes an air compressor connected to the dryer to deliver compressed gas to the dryer.

[0013] In some embodiments, the air compressor includes a compressed air pipeline for outputting compressed gas, and a throttle valve is connected to the compressed air pipeline.

[0014] In some embodiments, the temperature control testing device includes a three-way valve, the air pump is connected to an exhaust pipeline, the compressed air pipeline and the exhaust pipeline are merged into a confluence pipeline through the three-way valve, and the confluence pipeline is connected to the dryer.

[0015] In some embodiments, the three-way valve is a Y-type three-way valve.

[0016] In some embodiments, the gas pump is configured to extract gas from an upper portion of the test chamber, and the dryer is configured to input dried gas from a lower portion of the test chamber.

[0017] In some embodiments, the temperature control testing device further includes a dew point sensor for detecting the dew point value of the gas in the test chamber.

[0018] In some embodiments, the dew point sensor is configured to detect a dew point value of gas at an upper portion of the test chamber.

[0019] The present application also adopts the following technical solution: a three-temperature sorting machine, including a loading device, a receiving device and a conveying device, the three-temperature sorting machine also includes a temperature control testing device as described in any of the above embodiments, the conveying device is used to transfer the electronic devices to be tested provided by the loading device to the temperature control testing device, and is used to move the electronic devices after testing in the temperature control testing device to the receiving device for recycling.

[0020] The temperature control testing device provided in the present application includes a test chamber, an air pump and a dryer. The test chamber, the air pump and the dryer are connected to form a gas circulation loop. The air pump extracts gas from the test chamber to form a negative pressure in the test chamber. The extracted gas is dried by the dryer and then circulated back to the test chamber. This can speed up the replacement of the gas in the test chamber, shorten the time for blowing to lower the dew point, and reduce gas consumption. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the conventional technology, the following briefly introduces the drawings required for use in the embodiments or the conventional technology descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0022] Figure 1 This is a three-dimensional diagram of an embodiment of the temperature control testing device of the present application.

[0023] Figure 2 This is a three-dimensional diagram from another perspective of an embodiment of the temperature control testing device of the present application.

[0024] The components are numbered as follows: 100, temperature control test device; 1, test chamber; 11, test chamber box; 2, air pump; 3, dryer; 4, air compressor; 5, boost valve; 6, throttle valve; 7, dew point sensor; 81, exhaust pipe; 82, compressed air pipe; 83, confluence pipe; 84, three-way valve; 85, air intake pipe. DETAILED DESCRIPTION

[0025] To make the above-mentioned objects, features, and advantages of the present application more clearly understood, the specific embodiments of the present application are described in detail below with reference to the accompanying drawings. The following description sets forth many specific details to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways than those described herein, and those skilled in the art can make similar improvements without violating the scope of the present application. Therefore, the present application is not limited to the specific embodiments disclosed below.

[0026] It should be noted that when a component is referred to as being "fixed to" or "disposed on" another component, it may be directly on the other component or there may be a central component. When a component is considered to be "connected to" another component, it may be directly connected to the other component or there may be a central component at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in the specification of this application are for illustrative purposes only and do not represent the only implementation method.

[0027] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of such features. Throughout the description of this application, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.

[0028] In this application, unless otherwise expressly specified or limited, a first feature being “above” or “below” a second feature may mean that the first feature is directly in contact with the second feature, or that the first feature and the second feature are indirectly in contact through an intermediate medium. Furthermore, a first feature being “above,” “above,” or “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below,” “below,” or “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0029] Unless otherwise defined, all technical and scientific terms used in the specification of this application have the same meaning as commonly understood by those skilled in the art to which this application belongs. The terms used in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application. The term "and / or" used in the specification of this application includes any and all combinations of one or more of the relevant listed items.

[0030] See also Figure 1 and Figure 2 As shown, the present application provides a temperature control testing device 100 for enabling electronic devices to be tested at different temperatures. The temperature control testing device 100 includes a test chamber 1, an air pump 2, and a dryer 3. The test chamber 1 is configured to accommodate electronic devices and create different temperature environments. The air pump 2 is connected to the test chamber 1 so as to be able to extract the gas in the test chamber 1. The dryer 3 is connected to the air pump 2 and the test chamber 1 to dry the gas extracted from the test chamber 1 by the air pump 2 and transport it back to the test chamber. The test chamber 1, the air pump 2, and the dryer 3 are connected to form a gas circulation loop to speed up the replacement of the gas in the test chamber 1.

[0031] In the temperature control testing device 100 provided in the present application, since the test chamber 1, the air pump 2 and the dryer 3 are connected to form a gas circulation loop, the air pump 2 extracts the gas in the test chamber 1 to form a negative pressure in the test chamber 1. The extracted gas is dried by the dryer 3 and then circulated back to the test chamber 1. This can speed up the replacement of the gas in the test chamber 1, shorten the time for blowing to lower the dew point, and reduce gas consumption.

[0032] In this embodiment, the test chamber 1 is enclosed by a test chamber housing 11. The test chamber 1 is relatively closed to reduce the impact of the external environment on the environment within the test chamber 1 and facilitate the creation of an ideal testing environment within the test chamber 1. The temperature-controlled testing device 100 also includes a dew point sensor 7 for detecting the dew point of the gas within the test chamber 1. In this embodiment, the dew point sensor 7 is mounted on the top wall of the test chamber housing 11 to detect the dew point of the gas at the upper portion of the test chamber 1. When the humid gas within the test chamber 1 is replaced with dry gas, the dry gas is introduced into the test chamber 1 from the lower portion, and the humid gas rises to the upper portion of the test chamber 1. Therefore, the dew point sensor 7 detects the dew point of the gas at the upper portion of the test chamber 1, allowing for a more accurate determination of the gas replacement status within the test chamber 1. In other embodiments, the dew point sensor 7 may be positioned elsewhere within the test chamber housing 11, or multiple dew point sensors 7 may be provided to detect the dew point of the gas at multiple locations to comprehensively determine the gas replacement status within the test chamber 1.

[0033] The air pump 2 is connected to the test chamber 1 to extract the gas within the test chamber 1. In this embodiment, the air pump 2 is mounted on the test chamber housing 11; in other embodiments, the air pump 2 can also be mounted at any other location, as long as it can be connected to the test chamber 1 to extract the gas within the test chamber 1. In this embodiment, the air pump 2 is a vacuum pump, which is mounted on the top wall of the test chamber housing 11. The air pump 2 is configured to extract gas from the upper portion of the test chamber 1. When the moist gas within the test chamber 1 is replaced with dried gas, the density of the dry gas is greater than that of the moist gas. The dry gas is input into the test chamber 1 from the lower portion of the test chamber 1, and the moist gas floats to the upper portion of the test chamber 1. The air pump 2 extracting the moist gas from the upper portion of the test chamber 1 can accelerate the replacement of the gas within the test chamber 1 and accelerate the reduction of the dew point of the gas within the test chamber 1.

[0034] The air pump 2 is connected to the dryer 3 through a pipeline. The dryer 3 is a mechanical device that removes moisture from the gas through a specific technology to achieve the purpose of drying. Commonly used dryers 3 mainly include refrigeration dryers and adsorption dryers. The refrigeration dryer works through a refrigeration cycle to condense and discharge the moisture in the gas, thereby obtaining dry gas; while the adsorption dryer uses the adsorption effect of the adsorbent on the moisture in the gas to adsorb and remove the moisture in the gas. The present application does not limit the specific type of dryer 3, and those skilled in the art can choose according to actual needs. In this embodiment, a boost valve 5 is provided between the air pump 2 and the dryer 3, and the boost valve 5 is configured to boost the gas extracted by the air pump 2. The boost valve 5 can be provided to adjust the gas pressure and control the gas flow rate and other functions, thereby improving the efficiency of gas delivery to the dryer 3 and ensuring the normal operation and efficient operation of the system.

[0035] In this embodiment, the temperature control test device 100 also includes an air compressor 4, which is connected to the dryer 3 to deliver compressed gas to the dryer 3. By setting up the air compressor 4 to obtain gas from the outside and deliver it to the test chamber 1 together with the gas extracted from the test chamber 1, the gas flow rate can be increased and the replacement of the gas in the test chamber 1 can be accelerated. The air compressor 4 includes a compressed gas pipeline 82 for outputting compressed gas, and the compressed gas pipeline 82 is connected to a throttle valve 6. In this embodiment, the throttle valve 6 is an electronic gas throttle valve, and its opening is adjustable, so that the amount of compressed gas delivered by the air compressor 4 can be controlled, and the total flow rate of gas delivered to the test chamber 1 can be changed. In this way, the gas flow rate can be reasonably controlled according to the change of the dew point to achieve precise control of the dew point.

[0036] In this embodiment, the temperature-controlled testing device 100 includes a three-way valve 84. An air pump 2 is connected to an exhaust line 81. The compressed air line 82 and the exhaust line 81 merge through the three-way valve 84 into a confluence line 83, which is then connected to the dryer 3. The dryer 3 is connected to the test chamber 1 via an air inlet line 85 to deliver dry gas back to the test chamber 1. The exhaust line 81 is connected to the aforementioned boost valve 5 and the air pump 2. The end of the exhaust line 81 connected to the test chamber 1 is connected to the upper portion of the test chamber 1. The air inlet line 85 connects to the dryer 3 at one end and to the lower portion of the test chamber 1 at the other. The air pump 2 extracts gas from the upper portion of the test chamber 1 and delivers it to the dryer 3 via the exhaust line 81 and confluence line 83. The gas dried in the dryer 3 is then fed into the lower portion of the test chamber 1. In this embodiment, the three-way valve 84 is a Y-type three-way valve, two of which serve as input ports and one as an output port. The flow channel between the input port and the output port of the Y-type three-way valve is designed to be flat, with low fluid resistance and strong flow capacity, which is conducive to reducing energy consumption and improving the gas flow efficiency of the system.

[0037] During use, the air pump 2 draws humid air from the test chamber 1. After being pressurized through the air extraction pipeline 81 and the boost valve 5, the air enters the dryer 3 through one input port of the three-way valve 84 and the confluence pipeline 83. At the same time, the compressed air pipeline 82 of the air compressor 4 enters the dryer 3 through the other input port of the three-way valve 84 and the confluence pipeline 83. The air extracted by the air pump and the compressed air of the air compressor 4 are mixed and then enter the dryer 3 to complete the drying. The dryer 3 then transports the dried air back to the test chamber 1 through the air inlet pipeline 85.

[0038] During the process of the temperature control test device 100 generating a low-temperature test environment for the test chamber 1, after setting the target dew point value according to the actual production temperature, the dew point sensor 7 monitors the dew point value inside the test chamber 1 in real time and controls the feedback information to the throttle valve 6 through the host computer. When it is detected that the dew point value inside the test chamber 1 has not reached the target dew point value, the host computer controls the throttle valve 6 to open wider, so that more dry gas enters the test chamber 1 and the dew point of the test chamber 1 drops faster; when it is detected that the dew point value inside the test chamber 1 reaches near the target dew point value, the host computer controls the throttle valve 6 to open narrower, so that less dry gas enters the test chamber 1 and the dew point of the test chamber 1 stabilizes near the target value. The present application can adjust the real-time demand for dry gas according to the change in the dew point value, thereby reducing gas consumption and saving energy and reducing emissions.

[0039] The present application also provides a three-temperature sorting machine, comprising a loading device, a receiving device, and a conveying device. The three-temperature sorting machine also includes a temperature-controlled testing device 100 as described in any of the above embodiments. The conveying device is used to transfer electronic devices to be tested provided by the loading device to the temperature-controlled testing device 100, and to move electronic devices tested in the temperature-controlled testing device 100 to the receiving device for recycling. The three-temperature sorting machine provided in the present application, because it includes the above-mentioned temperature-controlled testing device 100, naturally also has the above-mentioned beneficial effects.

[0040] From the above description of the specific embodiment, it can be seen that the temperature control testing device 100 provided in the present application includes a test chamber 1, an air pump 2 and a dryer 3. The test chamber 1, the air pump 2 and the dryer 3 are connected to form a gas circulation loop. The air pump 2 extracts the gas in the test chamber 1 to form a negative pressure in the test chamber 1. The extracted gas is dried by the dryer 3 and then circulated back to the test chamber 1. This not only speeds up the replacement of the moist gas in the test chamber 1, but also reduces the consumption of compressed air by the air compressor 4 and reduces the burden on the dryer 3.

[0041] In comparison, conventional dew point lowering methods directly introduce dry air into the sealed test chamber 1, where the dry air mixes with the moist air inside the test chamber 1 to reduce the overall humidity within the chamber, resulting in a long dew point lowering time. Furthermore, conventional dew point lowering methods do not recycle gas or adjust the dry gas demand in real time. Gas consumption is always based on maximum consumption, resulting in high gas and energy consumption for overall dew point lowering. The present application also implements closed-loop feedback through the coordination of a throttle valve 6 and a dew point sensor 7. The amount of dry gas used can be controlled in real time based on dew point changes. When the dew point lowering requirement is high, the opening of the throttle valve 6 is increased to increase the dry gas input, thereby rapidly lowering the dew point. When the dew point lowering requirement is low, the opening of the throttle valve 6 is decreased to reduce the dry gas input. This reduces gas consumption and energy consumption while maintaining a stable dew point value in the test chamber 1.

[0042] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0043] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, all of which fall within the scope of protection of the present application. Therefore, the scope of patent protection for the present application shall be determined by the appended claims.

Claims

1. A temperature control test device for enabling electronic devices to be tested at different temperatures, characterized in that: The temperature control testing device (100) comprises: A test chamber (1) configured to accommodate electronic devices and create different temperature environments; an air pump (2) connected to the test chamber (1) so as to be able to extract the gas in the test chamber (1); and a dryer (3) connected to the air pump (2) and the test chamber (1) to dry the gas extracted from the test chamber (1) by the air pump (2) and transport the gas back to the test chamber (1); The test chamber (1), the air pump (2) and the dryer (3) are connected to form a gas circulation loop to accelerate the replacement of the gas in the test chamber (1).

2. The temperature control test device according to claim 1, characterized in that: A boost valve (5) is provided between the air pump (2) and the dryer (3), and the boost valve (5) is configured to boost the pressure of the gas extracted by the air pump (2).

3. The temperature control test device according to claim 1, characterized in that: The temperature control testing device (100) further comprises an air compressor (4), wherein the air compressor (4) is connected to the dryer (3) to deliver compressed gas to the dryer (3).

4. The temperature control test device according to claim 3, characterized in that: The air compressor (4) comprises a compressed air pipeline (82) for outputting compressed air, and a throttle valve (6) is connected to the compressed air pipeline (82).

5. The temperature control test device according to claim 4, characterized in that: The temperature control test device (100) comprises a three-way valve (84), the air pump (2) is connected to an air extraction pipeline (81), the compressed air pipeline (82) and the air extraction pipeline (81) are merged into a confluence pipeline (83) through the three-way valve (84), and the confluence pipeline (83) is connected to the dryer (3).

6. The temperature control test device according to claim 5, characterized in that: The three-way valve (84) is a Y-shaped three-way valve (84).

7. The temperature control testing device according to any one of claims 1 to 6, characterized in that: The gas pump (2) is configured to extract gas from the upper part of the test chamber (1), and the dryer (3) is configured to input dried gas from the lower part of the test chamber (1).

8. The temperature control test device according to claim 7, characterized in that: The temperature control test device (100) further comprises a dew point sensor (7) for detecting the dew point value of the gas in the test chamber (1).

9. The temperature control testing device according to claim 8, characterized in that: The dew point sensor (7) is configured to detect the dew point value of the gas at the upper portion of the test chamber (1).

10. A three-temperature sorting machine, comprising a feeding device, a receiving device and a conveying device, characterized in that: The three-temperature sorting machine also includes a temperature control test device (100) as described in any one of claims 1 to 9, and the conveying device is used to transfer the electronic devices to be tested provided by the loading device to the temperature control test device (100), and is used to move the electronic devices tested in the temperature control test device (100) to the receiving device for recycling.

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