Test module and test device
By using the buffer device's buffer and probe structure in the test device, the problem of tin grid line peeling and adhesion is solved, the accuracy and stability of battery cell IV detection are improved, the test abnormality rate is reduced, and the accuracy of the test results and economic benefits are improved.
Patent Information
- Application Number
- CN202422013639.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-19
- Publication Date
- 2025-09-23
- Estimated Expiration
- 2034-08-19
AI Technical Summary
In existing testing devices, the test probe is made of gold-plated copper, which is much harder than tin. As a result, the tin grid line is easily damaged and falls off during testing and adheres to the probe, causing test abnormalities and affecting detection accuracy.
A buffer device is used, including a buffer and a probe. The hardness of the buffer is less than that of the probe and is used to contact the battery cell. The buffer is made of sponge or silicone, etc., combined with a silver-plated copper strip to ensure electrical conductivity without damaging the tin grid line. The spacing between the buffers is adjusted by a power device to clamp the battery cell.
The accuracy of battery cell IV detection is improved, the incidence of test abnormalities is reduced, the stability and accuracy of the test results are improved, the fragmentation rate of battery cells is reduced, and the production cost is reduced.
Smart Images
Figure CN223379143U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of testing technology, and in particular to a testing module and a testing device. Background Art
[0002] IV testing is a key indicator for measuring photovoltaic cell performance. IV testing, or current-voltage characteristic curve testing, involves measuring the current-voltage (IV) characteristic curve of a photovoltaic cell under varying lighting and temperature conditions to assess key parameters such as cell conversion efficiency and power output. This test is crucial for understanding the performance characteristics of photovoltaic cells and provides a valuable reference for the design, optimization, and performance monitoring of photovoltaic systems.
[0003] The test probes in existing test devices are made of gold-plated copper, which is much harder than tin. Therefore, when testing cells, the tin on the gate lines can easily become damaged and fall off, adhering to the probes. Test probes require high conductivity, and tin-contaminated probes increase their resistance, resulting in dynamic test failures. Utility Model Content
[0004] The present application provides a test module and a test device for improving detection accuracy.
[0005] An embodiment of the present application provides a test module for IV detection of battery cells. The test module includes a bracket, multiple probes and a buffer device. The multiple probes are respectively fixed on the bracket. The buffer device is fixed to the probes and electrically connected. The buffer device includes a buffer member. The hardness of the buffer member is less than the hardness of the probe. The buffer member is used to electrically contact the battery cell to achieve electrical conduction between the battery cell and the probes.
[0006] Furthermore, the buffer device includes a connecting piece, the buffer and the probe are both fixed to the connecting piece, the connecting piece electrically connects the buffer and the probe, and one end of the buffer extends beyond the connecting piece.
[0007] Furthermore, the connecting member includes a first clamping member and a second clamping member, the first clamping member and the second clamping member are fixed, and at least a portion of the buffer member and at least a portion of the probe are located between the first clamping member and the second clamping member.
[0008] Furthermore, the plurality of probes are arranged along the length direction of the bracket, the buffer and the connecting member both extend along the length direction of the bracket, and at least two probes are fixed on the connecting member along the length direction of the bracket; and / or, the length of the buffer and the length of the connecting member are greater than the row length of the plurality of probes.
[0009] Furthermore, the buffer component is plated with a conductive layer to be electrically connected to the connecting component.
[0010] Furthermore, the buffer member includes a sponge; and / or the connecting member includes a silver-plated copper strip, and the conductive layer includes a silver conductive layer.
[0011] An embodiment of the present application provides a testing device, comprising: the above-mentioned test module, wherein the test modules are set to at least two, wherein the buffer component of one of the test modules is used to electrically contact the first surface of the battery, and the buffer component of the other test module is used to electrically contact the second surface of the battery opposite to the first surface.
[0012] Furthermore, it includes a power device, a first connecting rod and a second connecting rod, wherein the bracket of one of the test modules is fixed to the first connecting rod, and the bracket of the other test module is fixed to the second connecting rod, and the power device is used to drive the first connecting rod and / or the second connecting rod to move to adjust the distance between the two buffer members.
[0013] Furthermore, the power device includes a motor and a worm gear and a worm connected to the motor, and the first connecting rod and the second connecting rod are both threadedly connected to the worm.
[0014] Furthermore, a plurality of the test modules are fixed on the first connecting rod, and the plurality of the test modules are arranged in sequence along the length direction of the first connecting rod; and a plurality of the test modules are fixed on the second connecting rod, and the plurality of the test modules are arranged in sequence along the length direction of the second connecting rod.
[0015] The test module of the present application includes a buffer component, the hardness of the buffer component is less than the hardness of the probe. When the buffer component contacts the battery cell, it prevents damage to the tin gate line of the battery cell, thereby solving the problem of test abnormalities caused by the tin of the tin gate line adhering to the probe after falling off, so as to improve the accuracy of the IV test results of the battery cell. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 is a schematic diagram of a testing device according to an embodiment of the present application;
[0017] Figure 2 yes Figure 1 A schematic diagram of a test module of a test device shown;
[0018] Figure 3 yes Figure 2 A schematic cross-sectional view of the test module shown along its length, wherein only a portion of the test module is shown;
[0019] Figure 4 yes Figure 2 A schematic cross-sectional view of the test module shown along its height direction;
[0020] Figure 5 yes Figure 2 The schematic cross-sectional view of the test module shown is along its width direction. DETAILED DESCRIPTION
[0021] Exemplary embodiments will be described in detail herein, examples of which are illustrated in the accompanying drawings. When the following description refers to the drawings, identical numbers in different figures represent identical or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments are not intended to represent all embodiments consistent with the present application. Instead, they are merely examples of apparatus and methods consistent with certain aspects of the present application, as detailed in the appended claims.
[0022] The terms used in this application are for the purpose of describing specific embodiments only and are not intended to limit this application. As used in this application and the appended claims, the singular forms "a," "an," "the," and "the" are intended to include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the term "and / or" as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items.
[0023] Ginseng Figures 1 to 2 As shown, the test module 100 and the test device 200 of the embodiment of the present application are used for IV testing of the battery cell. The IV test, that is, the current-voltage characteristic curve test, is a method of evaluating key parameters such as the conversion efficiency and power output of the battery cell by measuring the current-voltage (IV) characteristic curve of the battery cell under different light and temperature conditions. This test is crucial for understanding the performance characteristics of the battery cell. It provides an important reference for the design, optimization and performance monitoring of the photovoltaic system. In some embodiments, the copper grid line of the battery cell is tinned to protect the copper grid line.
[0024] In some embodiments, the test device 200 includes at least two test modules 100. The test module 100 includes a bracket 1, a buffer device 2, and multiple probes 3. The multiple probes 3 are respectively fixed to the bracket 1. The buffer device 2 is fixed to and electrically connected to the probes 3. The buffer device 2 includes a buffer member 21. The buffer member 21 has a hardness less than that of the probes 3 and is used to electrically contact the battery cell to achieve electrical conduction between the battery cell and the probes 3.
[0025] The test module 100 of the present application includes a buffer 21, the hardness of the buffer 21 is less than the hardness of the probe 3. When the buffer 21 contacts the battery cell, it prevents damage to the tin gate line of the battery cell, thereby solving the problem of test abnormalities caused by the tin of the tin gate line falling off and adhering to the probe 3, so as to improve the accuracy of the IV test results of the battery cell.
[0026] In some embodiments, the probe 3 is made of copper and plated with gold, and its hardness is much greater than that of tin.
[0027] See also Figure 3 In some embodiments, the probe 3 includes a first probe 31, a second probe 32, and an elastic member (not shown). The second probe 32 has a receiving cavity (not shown) that receives at least a portion of the first probe 31 and allows it to move along the cavity when a force is applied. The elastic member is located within the cavity. When the first probe 31 moves under a force, it compresses the elastic member, and the elastic force of the elastic member causes the first probe 31 to return to its original position.
[0028] Optionally, the second probe 32 is fixed to the bracket 1 , and the first probe 31 is fixed to the buffer device 2 .
[0029] In some embodiments, the test modules 100 are configured as at least two, wherein the buffer 21 of one test module 100 is used to electrically contact the first surface of the battery, and the buffer 21 of another test module 100 is used to electrically contact the second surface of the battery opposite to the first surface.
[0030] Ginseng Figure 1 As shown, the test module 100 includes a first test module 101 located at the top and a second test module 102 located at the bottom. The buffer 21 of the first test module 101 is arranged opposite to the buffer 21 of the second test module 102. The buffer 21 of the first test module 101 contacts the first surface of the battery cell, and the buffer 21 of the second test module 102 contacts the second surface of the battery cell opposite to the first surface.
[0031] In some embodiments, the testing device 200 includes a power device 4, a first connecting rod 5, and a second connecting rod 6. The bracket 1 of one testing module 100 is connected to the first connecting rod 5, and the bracket 1 of the other testing module 100 is connected to the second connecting rod 6. The power device 4 is used to drive the first connecting rod 5 and / or the second connecting rod 6 to adjust the distance between the two buffers 21 to achieve clamping of the battery cells.
[0032] Ginseng Figure 1 As shown, the bracket 1 of the first test module 101 is fixed to the first connecting rod 5 , and the bracket 1 of the second test module 102 is fixed to the second connecting rod 6 .
[0033] In some embodiments, at least two first connecting rods 5 and second connecting rods 6 are provided, the two first connecting rods 5 are respectively fixed to opposite ends of one bracket 1 , and the two second connecting rods 6 are respectively fixed to opposite ends of the other bracket 1 .
[0034] Ginseng Figure 1As shown, two first connecting rods 5 are provided, and the opposite ends of the bracket 1 of the first test module 101 are respectively fixed to the two first connecting rods 5. Two second connecting rods 6 are provided, and the opposite ends of the bracket 1 of the second test module 102 are respectively fixed to the two second connecting rods 6. This provides stability for the first test module 101, smoothness during movement, and coplanarity of the buffer member 21, thereby ensuring stable contact with the battery cell and further ensuring the accuracy of the test results.
[0035] In some embodiments, only one first connecting rod 5 and one second connecting rod 6 may be provided, and only one end of the bracket 1 of the first test module 101 is fixed to the first connecting rod 5, and the other end is suspended; only one end of the bracket 1 of the second test module 102 is fixed to the second connecting rod 6, and the other end is suspended.
[0036] In some embodiments, multiple test modules 100 are fixed on the first connecting rod 5, and the multiple test modules 100 are arranged in sequence along the length direction of the first connecting rod 5; multiple test modules 100 are fixed on the second connecting rod 6, and the multiple test modules 100 are arranged in sequence along the length direction of the second connecting rod 6.
[0037] Ginseng Figure 1 As shown, three first test modules 101 are fixed on the first connecting rod 5, and three second test modules 102 are correspondingly fixed on the second connecting rod 6. This application does not limit the number of test modules 100, and it can be adjusted according to actual test needs.
[0038] In some embodiments, the test module 100 is detachably connected to the first connecting rod 5 to facilitate replacement of the test module 100. Optionally, the bracket 1 of the test module 100 and the first connecting rod 5 can be fixed by screws or bolts, or can be fixed by snaps.
[0039] In some embodiments, the test module 100 is detachably connected to the second connecting rod 6 to facilitate replacement of the test module 100. Optionally, the bracket 1 of the test module 100 and the second connecting rod 6 can be fixed by screws or bolts, or can be fixed by snaps.
[0040] In some embodiments, the power unit 4 includes a motor 41, a worm gear (not shown), and a worm 42 connected to the motor 41. The first connecting rod 5 and the second connecting rod 6 are both threadedly connected to the worm 42. The motor 41 drives the worm gear, which in turn drives the worm 42, thereby driving the first connecting rod 5 and / or the second connecting rod 6 to move up and down along the worm 42. The motor 41, worm gear, and worm 42 can precisely control the stroke displacement of the first connecting rod 5 and the second connecting rod 6.
[0041] In some embodiments, the motor 41, the turbine and the worm 42 may be provided in one or more configurations. Figure 1As shown, the number of the motor 41 , the turbine and the worm 42 is four to ensure the smoothness and stability of the up and down movement of the test module 100 .
[0042] In some embodiments, when the motor 41 , the turbine and the worm 42 are provided as one, they can be connected to the first connecting rod 5 and the second connecting rod 6 via a smooth connecting rod instead of a screw rod.
[0043] See also Figures 3 to 5 The buffer device 2 includes a connector 22, to which the buffer 21 and the probe 3 are fixed. The connector 22 electrically connects the buffer 21 and the probe 3. One end of the buffer 21 extends beyond the connector 22 to contact the battery cell.
[0044] In some embodiments, the buffer 21 may be directly fixed on the probe 3 .
[0045] In some embodiments, the connecting member 22 includes a first clamping member 221 and a second clamping member 222 . The first clamping member 221 and the second clamping member 222 are fixed, and at least a portion of the buffer member 21 and at least a portion of the probe 3 are located between the first clamping member 221 and the second clamping member 222 .
[0046] A receiving portion 223, a first opening 224, and a second opening 225 communicating with the receiving portion 223 are defined between the first clamping member 221 and the second clamping member 222. A portion of the buffer member 21 and a portion of the first probe 31 are located within the receiving portion 223. One end of the buffer member 21 extends through the first opening 224, and the first probe 31 extends through the second opening 225. At least a portion of the receiving portion 223 is larger than the second opening 225 to prevent the probe 3 from escaping from the receiving portion 223.
[0047] Optionally, the first probe 31 includes a base 311 and a fixing portion 312 located at one end of the base 311. The base 311 can move along the second probe 32, and the fixing portion 312 is located in the receiving portion 223. The area of the fixing portion 312 is larger than the area of the second opening 225 to prevent the probe 3 from falling out of the receiving portion 223.
[0048] In some embodiments, the first clamping member 221 and the second clamping member 222 can be fixed by a fixing member 226, or can be fixed by welding, gluing, or clamping. When the fixing member 226 passes through the first clamping member 221 and the second clamping member 222 and is locked, the first clamping member 221 and the second clamping member 222 clamp the probe 3, which can ensure the tightness of the clamping contact between the connecting member 22 and the probe 3, and at the same time ensure the accuracy of the assembly position of the connecting member 22, ensuring the overall level of the test module 100 during testing, providing a basic guarantee for test accuracy.
[0049] Optionally, the fixing member 226 may be a bolt or a screw.
[0050] In some embodiments, multiple probes 3 are arranged along the length direction of the bracket 1, the buffer 21 and the connector 22 both extend along the length direction of the bracket 1, and at least two probes 3 are fixed on the connector 22 along the length direction of the bracket 1.
[0051] In some embodiments, the number of buffers 21 and the number of connectors 22 are the same as the number of probes 3 , and the buffers 21 and connectors 22 are arranged in a one-to-one correspondence, and the connectors 22 and probes 3 are arranged in a one-to-one correspondence.
[0052] In some embodiments, the length of the buffer 21 and the length of the connector 22 are greater than the length of a row of probes 3 , and only one buffer 21 and connector 22 are provided to facilitate assembly and disassembly.
[0053] In some embodiments, there are multiple fixing members 226 , and the multiple fixing members 226 are sequentially arranged along the length direction of the connecting member 22 .
[0054] In some embodiments, the buffer 21 is plated with a conductive layer to be electrically connected to the connector 22 .
[0055] In some embodiments, the buffer 21 comprises a sponge. The sponge serves as the main body for contacting the grid lines of the cell. The ultra-flexible contact ensures that the grid lines are not damaged, effectively solving the problem of test abnormalities caused by tin shedding from the grid lines and adhering to the probe 3, and ensuring the dynamic stability of the test.
[0056] Optionally, the buffer member 21 may also be made of silicone, rubber, etc.
[0057] In some embodiments, connector 22 comprises a silver-plated copper strip, and the conductive layer comprises a silver conductive layer. Silver is the most conductive metal. When pressed together, the silver-plated sponge contracts tightly and contacts the silver-plated copper strip, significantly reducing the resistance of test module 100. This excellent conductivity provides a fundamental guarantee for accurate testing.
[0058] Optionally, the conductive layer may also be gold or copper.
[0059] Optionally, the connector 22 is made of a conductive material, such as metal; or it can be made of a non-conductive material and then plated with a conductive material.
[0060] The test device 200 of the present application adds silver-plated copper strips and silver-plated sponges on the basis of retaining the elastic contact of the probe 3, which greatly reduces the resistance of the test module 100, improves the accuracy of the IV test results of the battery cell, and reduces the test error and fluctuation; the silver-plated sponge is combined with the silver-plated copper strip to be fixed on the probe 3, and double buffering and ultra-flexible contact between the silver-plated sponge and the battery cell can greatly reduce the fragmentation rate of the battery cell during testing, improve the production yield of the battery cell, and reduce production costs. The test device 200 of the present application has high economic benefits and can promote technological progress in battery cell efficiency testing.
[0061] It should also be noted that the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprises a ..." does not preclude the presence of additional identical elements in the process, method, article, or apparatus that includes the element.
Claims
1. A test module for IV testing of battery cells, characterized in that: The test module includes: Bracket; A plurality of probes are respectively fixed on the bracket; A buffer device is fixed to and electrically connected to the probe, the buffer device includes a buffer member, the hardness of the buffer member is less than the hardness of the probe, and the buffer member is used to electrically contact the battery cell to achieve electrical conduction between the battery cell and the probe.
2. The test module according to claim 1, wherein: The buffer device includes a connecting piece, the buffer and the probe are both fixed to the connecting piece, the connecting piece electrically connects the buffer and the probe, and one end of the buffer extends beyond the connecting piece.
3. The test module according to claim 2, wherein: The connecting member includes a first clamping member and a second clamping member, the first clamping member and the second clamping member are fixed, and at least a portion of the buffer member and at least a portion of the probe are located between the first clamping member and the second clamping member.
4. The test module according to claim 2, wherein: The plurality of probes are arranged along the length direction of the bracket, the buffer and the connecting member both extend along the length direction of the bracket, and at least two probes are fixed to the connecting member along the length direction of the bracket; and / or, The length of the buffer and the length of the connecting member are greater than the length of a row of the plurality of probes.
5. The test module according to any one of claims 2 to 4, characterized in that: The buffer component is plated with a conductive layer to be electrically connected to the connecting component.
6. The test module according to claim 5, characterized in that: The buffer member includes a sponge; and / or, The connecting member includes a silver-plated copper strip, and the conductive layer includes a silver conductive layer.
7. A testing device, characterized in that: include: The test module according to any one of claims 1 to 6, wherein the test modules are provided in at least two pieces, wherein the buffer of one of the test modules is used to electrically contact the first surface of the battery, and the buffer of the other test module is used to electrically contact the second surface of the battery opposite to the first surface.
8. The testing device according to claim 7, characterized in that: It includes a power device, a first connecting rod and a second connecting rod, wherein the bracket of one of the test modules is fixed to the first connecting rod, and the bracket of the other test module is fixed to the second connecting rod, and the power device is used to drive the first connecting rod and / or the second connecting rod to move to adjust the distance between the two buffer members.
9. The testing device according to claim 8, characterized in that: The power device includes a motor and a worm gear and a worm connected to the motor, and the first connecting rod and the second connecting rod are both threadedly connected to the worm.
10. The testing device according to claim 8, characterized in that: A plurality of the test modules are fixed on the first connecting rod, and the plurality of the test modules are arranged in sequence along the length direction of the first connecting rod. A plurality of the test modules are fixed on the second connecting rod, and the plurality of the test modules are arranged in sequence along the length direction of the second connecting rod.