Spring needle bridging device applied to automatic test system

Abstract

A spring needle bridging device applied to an automatic test system is characterized in that a spiral spring lantern ring is arranged at one end of a connecting piece, a spring needle lap joint terminal is arranged at the other end of the connecting piece, the spiral spring lantern ring and the spring needle lap joint terminal both have conductivity, and the spiral spring lantern ring is electrically connected with the spring needle lap joint terminal. Therefore, the spring needles can be electrically connected as long as the spring needle bridging device is bridged between two spring needles of a spring needle interface, the spring needle bridging device is very easy to realize light weight and miniaturization, simple in structure and easy to use, the fragile spring needles are not easy to damage in the use process, and the service life of the spring needles is prolonged. Therefore, bridging between the spring needles can be conveniently, quickly and safely carried out, and flexible debugging and application of an automatic test system can be accelerated.

Description

Technical Field

[0001] The utility model discloses a spring pin jumper device for use in an automatic test system. The device is primarily applicable to the spring pin interface of the automatic test system. By simply connecting the spring pin jumper device between two spring pins in a spring pin interface, an electrical connection is established between the spring pins. The spring pin jumper device is easily lightweight and compact, has a simple structure, and is easy to use. Furthermore, the fragile spring pins are not easily damaged during use. Therefore, the spring pins can be easily, quickly, and safely connected to each other, facilitating flexible debugging of the automatic test system and supporting a wider range of test application requirements. Background Art

[0002] With the rapid development of the semiconductor industry, the demand for automatic test systems (ATS) is increasing. Pogo pin interfaces have been widely used in ATS, becoming the basic method for electrical connection between ATS and probe cards. Sometimes, jumpers are required on probe cards to develop and debug new features in ATS or to support changing test requirements.

[0003] See Figure 26 and Figure 27 As shown, a probe card jumper method used in conventional technology is disclosed, which includes a probe card 1 and a jumper 2. The surface of the probe card 1 is provided with multiple gold-plated contact points 3, and the two ends of the jumper 2 are respectively welded to one side of the contact points 3 through a welding point 4, so that an electrical connection can be achieved between the two contact points 3. However, the contact points 3 were originally designed to connect to multiple spring pins 6 of a spring pin interface 5. Therefore, the welding work of the jumper 2 must be very cautious, especially the position of the jumper 2 and each of the welding points 4 must not interfere with the normal connection between the spring pin interface 5 and the probe card 1, and the welding and un-welding of the jumper 2 are both very troublesome tasks. The relevant hardware tools and materials required for welding or un-soldering must be prepared first, and must be properly handled by professionals who are familiar with the operating details to avoid defects in construction quality. Therefore, the use of this conventional method is more difficult and the processing process will inevitably take more time.

[0004] As can be seen from the above, although conventional technology can achieve electrical connection between the two contact points 3 by soldering the jumper wire 2, this method is not convenient and quick for users. The implementation process is relatively time-consuming and requires relevant hardware equipment and professional operating skills. In addition, the probe card 1 may be accidentally contaminated during the soldering or unsoldering process. The shape, size and soldering position of the soldering points 4 may interfere with the normal contact between the spring pin interface 5 and the probe card 1. There is even the possibility of high-temperature burns due to careless operation. Therefore, it can be seen that conventional technology is indeed not an ideal method.

[0005] To address the limitations and safety concerns of conventional technologies, the authors, through long-term observation and active reflection, as well as multiple prototype tests and related improvements, have developed a spring pin jumper device for use in automatic test systems, which effectively addresses many of the shortcomings of conventional technologies. Utility Model Content

[0006] The present utility model aims to provide a spring pin jumper device for use in an automatic test system, which is easy to achieve lightweight and miniaturization, has a simple structure and is easy to use, and does not easily damage the fragile spring pins during use. Therefore, the spring pins can be jumped conveniently, quickly, and safely, which facilitates flexible debugging of the automatic test system and helps support more diverse test application requirements.

[0007] To achieve the above-mentioned object, the utility model discloses a spring pin jumper device for use in an automatic test system, which is characterized by comprising:

[0008] A connector, one end of which is provided with a coil spring collar, and the other end of which is provided with a spring pin bridging terminal, the coil spring collar and the spring pin bridging terminal both have conductive capabilities and form an electrical connection between the coil spring collar and the spring pin bridging terminal.

[0009] The coil spring collar and the spring pin connecting terminal are electrically connected directly or indirectly.

[0010] The connecting piece is made of metal material, insulating material or composite material with conductive ability.

[0011] The coil spring collar is made by bending a section of coil spring so that at least a portion of the coil spring forms a ring or an arc, and then is combined with the connecting piece to form a spring collar structure.

[0012] The spring pin connecting terminal is in the shape of a hook, a ring, a sleeve, a sleeve or a cover.

[0013] The spring pin lap terminal and the connector are combined in an integrated design.

[0014] The spring pin lap terminal also adopts the spring collar structure of the spiral spring collar.

[0015] The coil spring collars arranged at both ends of the connector are integrally formed with the spring pin lap terminal and are formed by bending a section of coil spring.

[0016] The connecting piece includes a connecting wire and two fixing pieces. The two ends of the connecting wire are connected to the fixing pieces. The fixing pieces respectively fix the coil spring ring and the spring pin lap terminal.

[0017] Wherein, the connecting piece is a metal tubular structure.

[0018] The connecting piece is formed by processing using a metal sheet material.

[0019] From the above structure, it can be seen that the advantages of the present invention are as follows:

[0020] 1. Simple structure and easy miniaturization: The present invention can make the structure of the spring pin jumper device simple and easy to be lightweight and miniaturized. Therefore, it can be smoothly set in the narrow space between a spring pin interface and a probe card without hindering the normal connection between the spring pin interface and the probe card.

[0021] 2. Simple, safe and easy to use: The utility model allows users to quickly install or remove the spring pin jumper device without preparing any tools. There is no need to deal with the troublesome jumper soldering or desoldering. The operation is simple, time-saving and trouble-free. No professional assistance is required, and there is no need to worry about accidental burns caused by careless operation.

[0022] 3. Protect the spring pin interface and probe card: Since the present invention does not require soldering jumpers on the probe card, and instead uses the spring pin jumper device to perform non-destructive jumpering between the spring pins, there is no need to worry about the high temperature during the soldering process causing the probe card to be contaminated and deteriorated, nor is there any need to worry about the spring pin interface being damaged due to inappropriate size or position of the jumper soldering point. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a three-dimensional diagram of the first embodiment of the present utility model.

[0024] Figure 2 This is an exploded view of the first embodiment of the present invention.

[0025] Figure 3 FIG. 1 is a schematic diagram of a spring pin connected across a spring pin interface according to a first embodiment of the present invention.

[0026] Figure 4 for Figure 3 Schematic diagram of the spring pin being compressed and moving the first embodiment of the present invention.

[0027] Figure 5 It is a perspective view of the second embodiment of the present invention.

[0028] Figure 6 This is an exploded view of the second embodiment of the present invention.

[0029] Figure 7 This is a perspective view of the third embodiment of the present invention.

[0030] Figure 8 This is an exploded view of the third embodiment of the present invention.

[0031] Figure 9 FIG. 1 is a schematic diagram of a spring pin connected across a spring pin interface according to a third embodiment of the present invention.

[0032] Figure 10 This is a perspective view of the fourth embodiment of the present invention.

[0033] Figure 11 This is an exploded view of the fourth embodiment of the present invention.

[0034] Figure 12 FIG. 4 is a schematic diagram of a spring pin applied to a spring pin interface according to a fourth embodiment of the present invention.

[0035] Figure 13 for Figure 12 A partial enlarged top view at point A.

[0036] Figure 14 for Figure 12 Diagram of a partial spring pin jumper with one end of the jumper removed.

[0037] Figure 15 for Figure 14 Schematic diagram of the pogo pin interface flipped downward and not yet connected to the probe card.

[0038] Figure 16 for Figure 15 Schematic diagram showing the spring pin interface being connected to the probe card.

[0039] Figure 17 This is a perspective view of the fifth embodiment of the present invention.

[0040] Figure 18 This is a perspective view of a fifth embodiment of the present invention.

[0041] Figure 19 This is a perspective view of the sixth embodiment of the present invention.

[0042] Figure 20 FIG. 1 is a schematic diagram of a pogo pin connected across a pogo pin interface according to a sixth embodiment of the present invention.

[0043] Figure 21 This is a perspective view of the seventh embodiment of the present invention.

[0044] Figure 22 This is an exploded view of the seventh embodiment of the present invention.

[0045] Figure 23 FIG. 1 is a schematic diagram of a pogo pin connected across a pogo pin interface according to a seventh embodiment of the present invention.

[0046] Figure 24 FIG. 1 is a schematic diagram of a pogo pin connected across a pogo pin interface according to an eighth embodiment of the present invention.

[0047] Figure 25 for Figure 24 sectional view of .

[0048] Figure 26 Schematic diagram of conventional techniques for soldering jumper wires on a probe card.

[0049] Figure 27 for Figure 26 Schematic diagram of the probe card and pogo pin interface with solder jumpers. DETAILED DESCRIPTION

[0050] See also Figure 1 and Figure 2 , which are a perspective view and an exploded view of a first embodiment of the present invention, disclose a spring pin jumper device for an automatic test system. The spring pin jumper device 10 comprises:

[0051] A connector 11 is provided with a coil spring collar 12 at one end and a spring pin connecting terminal 13 at the other end. Both the coil spring collar 12 and the spring pin connecting terminal 13 are made of metal and are therefore conductive. In this embodiment, the connector 11 is directly cut and processed from a metal tubular structure. However, in other application cases, the design of the connector 11 can be modified in various equivalent ways to still have a connecting function. Moreover, the connector 11 can be made of a conductive composite material or a non-conductive insulating material. The material selection of the connector 11 can be determined by considering whether the structural design of the coil spring collar 12 and the spring pin connecting terminal 13 is suitable for direct electrical connection between the two or requires a bridge connection through the connector 11 to form an electrical connection. In addition, the material selection can also be determined based on the actual application environment or production and processing assembly efficiency and cost considerations.

[0052] Among them, reference Figure 2As shown, the coil spring collar 12 can be made by bending a coil spring of suitable size so that at least a portion thereof forms a ring or arc structure, and then inserting the coil spring collar 12 into one end of the connector 11 for crimping and fixing. However, there are many options for combining the connector 11 with the coil spring collar 12, and there are also many options for combining the connector 11 with the spring pin terminal 13, including but not limited to crimping, welding, snap-fitting, screwing, screw locking, plastic embedding injection molding, or metal die-casting technology.

[0053] See Figure 3 As shown, a spring pin interface 20 is provided with at least two spring pins 21. In the actual application of the spring pin jumper device 10, the coil spring collar 12 and the spring pin jumper terminal 13 are respectively mounted on each of the spring pins 21 so that the spring pins 21 can be electrically connected through the spring pin jumper device 10. In this embodiment, the spring pin jumper terminal 13 is hook-shaped and made of metal material, suitable for jumping the spring pins 21. However, the design of the spring pin jumper terminal 13 can be easily modified in various equivalent ways. Examples include, but are not limited to, hook-shaped, ring-shaped, sleeve-shaped, sleeve-shaped, or sleeve-shaped structures, as long as the shape and structure are suitable for overlapping the spring pin 21 so that the spring pin 21 can be electrically connected to the spring pin connecting terminal 13. In addition, the bent shape of the coil spring collar 12 is also very easy to make various equivalent changes. As long as a bent coil spring is combined with the connecting member 11 so that it can be sleeved on the spring pin 21 to achieve a bridging connection between the spring pins 21, it can be considered an equivalent design, and is not limited to the embodiments disclosed in the present invention.

[0054] See Figure 4 As shown, when the pogo pin interface 20 and a probe card (not shown) are engaged, the pogo pins 21 provided in the pogo pin interface 20 are compressed, shortening their exposed lengths. Since the pogo pin jumper device 10 of the present invention is very light, thin, and compact, and the coil spring collar 12 has an elastic contraction and tightening force, it can flexibly move up and down with the pogo pins 21 without falling off or interfering with the length expansion and contraction of the pogo pins 21. Therefore, during actual use, the pogo pin jumper device 10 of the present invention does not hinder or interfere with the engagement of the pogo pins 21 with the probe card, thereby preventing the pogo pins 21 from being accidentally broken or damaged. The user can easily install or remove the pogo pin jumper device 10 without the need for special tools or professional skills, and without any high-temperature work safety risks. Therefore, the pogo pin jumper device 10 is indeed a new technology that is convenient, fast, safe, and reliable.

[0055] See Figure 5 and Figure 6 FIG. 2 shows a second embodiment of the present invention. The main difference from the first embodiment is that the spring pin terminal 13 is designed as a collar structure. The structure can be manufactured by first cutting a section of metal wire, bending it into a shape, and then placing it on one end of the connector 11 and crimping it. In addition, both the spring pin terminal 13 and the coil spring collar 12 can be gold-plated, which helps to improve the quality of the electrical connection.

[0056] See Figures 7 to 9 As shown, it discloses the third embodiment of the present invention. The main difference from the first embodiment is that the connector 11 and the spring pin terminal 13 are integrally formed. The manufacturing method can be processed and formed using metal sheet material. The applicable processing methods include but are not limited to cutting, stamping, bending, laser cutting, laser welding or spot welding. In this embodiment, the metal sheet material is cut and precisely bent to form an accommodating space 14 at one end of the connector 11. The accommodating space 14 can be used to crimp the coil spring ring 12. In this embodiment, due to the use of an integral molding design, the connector 11 and the spring pin terminal 13 are combined into one metal part. This can avoid the contact resistance caused by crimping or buckling between metal parts, thereby improving the quality of the electrical connection, reducing the number of parts and assembly processes, and helping to reduce production costs.

[0057] See Figures 10 to 14 As shown, it discloses the fourth embodiment of the present invention. The main difference from the second embodiment is that the structural design of the spring pin connecting terminal 13 adopts a spring collar structure similar to the coil spring collar 12. The advantage of this design is that the coil spring collar 12 and the spring pin connecting terminal 13 are both spring collar structures, and can be elastically connected with the spring pins 21 to form multiple points of contact (such as Figure 13 As shown), this helps to reduce contact resistance to improve the quality and stability of the electrical connection. In addition, this structural design can make the spring pin jumper device 10 lighter and more flexible, which helps to avoid damage to the spring pins 21 due to jumpering.

[0058] Among them, since both ends of the connecting member 11 use a spring ring structure with elastic contraction and tightening ability, which is respectively sleeved on the spring pins 21 to be bridged, the setting of the spring pin bridge device 10 is very stable and reliable, see Figure 14As shown, since the pogo pin jumper device 10 is very light, thin and short, even the sleeve force at one end is sufficient to suspend and fix it to the pogo pin 21 without falling off. Therefore, in some application cases, if multiple pogo pin jumper devices 10 need to be used simultaneously to perform multiple jumpers, the user can retain the sleeve at one end to save the manpower and time required for multiple installation or removal.

[0059] Continue reading Figures 14 to 16 As shown, further illustrating how to apply the aforementioned fourth embodiment, the user first sleeves a plurality of the pogo pin jumper devices 10 onto the pogo pins 21. Furthermore, the user may leave one end of some of the pogo pin jumper devices 10 unsleeved on any of the pogo pins 21 according to actual application requirements. The pogo pin interface 20 is then joined to a probe card 30. After the joining is completed, the distance between the pogo pin interface 20 and the probe card 30 is very close, typically within 1 cm, or even less than 0.5 cm. Using the pogo pin jumper device 10 of the present invention, the pogo pins 21 can be bridged in such a narrow gap. Because the pogo pin jumper devices 10 are very thin and compact, they can be safely used in narrow gaps without interfering with the joining between the pogo pin interface 20 and the probe card 30.

[0060] See Figure 17 and Figure 18 As shown, it discloses the fifth embodiment of the present invention. The same as the fourth embodiment mentioned above is that both ends of the connector 11 use a spring collar structure with elastic contraction and tightening ability. The difference is that in this embodiment, the spring collar structure provided at both ends of the connector 11 is integrally formed. In other words, the spring pin connecting terminal 13 and the coil spring collar 12 are integrally formed. The manufacturing method can be to bend a long coil spring so that a portion of it becomes two spring collars in an arc shape, a semicircular shape or a nearly annular shape (such as Figure 18 As shown), the connecting piece 11 is then used to assist in fixing the bent coil spring so that the bent shape can be maintained.

[0061] The connector 11 can be made of a metal conductor, an insulating material, or a composite material. If the connector 11 is made of an insulating material, it can be partially inserted into an engineering plastic material using an insert molding process. A bent coil spring is placed in a mold and then plastic injection molded. Using plastic material to make the connector 11 can make the spring pin jumper device 10 lighter and reduce exposed metal, making it more suitable for applications requiring enhanced insulation protection.

[0062] Continue reading Figure 19 and Figure 20 , which discloses a sixth embodiment of the present invention. The main difference from the aforementioned fourth embodiment is that the connector 11 includes a connecting wire 111 and two fixing members 112. The two ends of the connecting wire 111 are connected to the fixing members 112. Each fixing member 112 is used to fix the coil spring collar 12 and the pogo pin connecting terminal 13. By increasing the length of the connecting wire 111, the overall length of the connector 11 can be extended, allowing the pogo pin jumper device 10 to support a larger span, and can be used to jumper two pogo pins 21 that are separated by a large distance.

[0063] Continue reading Figures 21 to 23 , which discloses the seventh embodiment of the present invention. The difference from the aforementioned third embodiment is that the spring pin connecting terminal 13 is designed as a sleeve structure, which can be used to increase the contact area between the spring pin connecting terminal 13 and the spring pin 21, thereby reducing the contact resistance and helping to improve the quality of the electrical connection.

[0064] Continue reading Figure 24 and Figure 25 , which discloses the eighth embodiment of the present invention. The difference from the aforementioned seventh embodiment is that the spring pin jumper terminal 13 is designed as a cover structure, which can increase the contact area between the spring pin jumper terminal 13 and the spring pin 21, thereby reducing the contact resistance and improving the quality of the electrical connection. Furthermore, the cover structure design of the spring pin jumper terminal 13 can more thoroughly prevent the spring pin jumper device 10 from slipping, and can be applied to implementation cases where the mechanical vibration environment is relatively large.

Claims

1. A spring pin jumper device for an automatic test system, characterized in that Include: A connector, one end of which is provided with a coil spring collar, and the other end of which is provided with a spring pin bridging terminal, the coil spring collar and the spring pin bridging terminal both have conductive capabilities and form an electrical connection between the coil spring collar and the spring pin bridging terminal.

2. The spring pin jumper device for an automatic test system according to claim 1, wherein: The spiral spring collar and the spring pin connecting terminal are electrically connected directly or indirectly.

3. The spring pin jumper device for an automatic test system according to claim 1, wherein: The connecting piece is made of metal material, insulating material or composite material with conductive ability.

4. The spring pin jumper device for an automatic test system according to claim 1, wherein: The coil spring collar is made by processing and bending a section of coil spring so that at least a portion of the coil spring is formed into a ring or an arc shape, and then combined with the connecting piece to form a spring collar structure.

5. The spring pin jumper device for an automatic test system according to claim 1, wherein: The spring pin connecting terminal is in the shape of a hook, a ring, a collar, a sleeve or a cover.

6. The spring pin jumper device for an automatic test system according to claim 1, wherein: The spring pin lap terminal and the connector are combined in an integrated design.

7. The spring pin jumper device for an automatic test system according to claim 4, wherein: The spring pin lap terminal also adopts the spring collar structure of the spiral spring collar.

8. The spring pin jumper device for an automatic test system according to claim 7, wherein: The coil spring collars arranged at both ends of the connector are integrally formed with the spring pin lap terminal and are formed by bending a section of coil spring.

9. The spring pin jumper device for an automatic test system according to claim 1, wherein: The connecting piece includes a connecting wire and two fixing pieces. The two ends of the connecting wire are connected to the fixing pieces. The fixing pieces respectively fix the spiral spring ring and the spring pin lap terminal.

10. The spring pin jumper device for an automatic test system according to claim 1, wherein: The connecting piece is a metal tubular structure.

11. The spring pin jumper device for an automatic test system according to claim 1, wherein: The connecting piece is processed and formed by using a metal sheet material.

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