Multi-track performance detection structure for chip component

Abstract

The utility model provides a multi-track performance detection structure for a chip component. The multi-track performance detection structure comprises a base, a rotating assembly, an air knife feeding assembly, a capacity testing assembly, a lifting testing assembly, a static elimination assembly, a second testing assembly and a probe assembly, the rotating assembly is arranged in the middle of the base, and the air knife feeding assembly, the capacity testing assembly, the lifting testing assembly, the demagnetizing assembly and the second testing assembly are sequentially arranged on the base around the rotating assembly clockwise. The rotating assembly comprises a rotating motor and a testing disc, the rotating motor is installed in the middle of the base, the testing disc is round, a plurality of circles of rails are arranged on the testing disc, and a plurality of testing holes are formed in the rails. Through the structural design and function improvement, the chip component detection efficiency, accuracy and automation level are remarkably improved, meanwhile, the workload of operators is reduced, and powerful technical support is provided for large-scale production and quality control.

Description

Technical Field

[0001] The utility model relates to the technical field of component detection equipment, in particular to a multi-track performance detection structure for chip components. Background Art

[0002] Traditional chip component testing equipment typically uses a single-track or multi-track design to perform component performance testing. This type of equipment generally includes a material conveying mechanism and a testing mechanism, capable of measuring parameters such as capacitance and resistance of chip components. However, these traditional devices often have some limitations and shortcomings:

[0003] 1. Low detection efficiency:

[0004] Traditional equipment may only have a single or a small number of test stations, resulting in low overall detection efficiency.

[0005] The transfer speed of chip components between different workstations is slow, which affects the overall production rhythm.

[0006] 2. Insufficient comprehensiveness of testing:

[0007] Traditional equipment may not be able to complete multiple performance tests (such as capacity, IR impedance, charge and discharge characteristics, etc.) in one process, and multiple transfers are required to complete all necessary tests.

[0008] Therefore, the existing technology has deficiencies and needs further improvement. Utility Model Content

[0009] In view of the problems existing in the prior art, the utility model provides a multi-track performance detection structure for chip components.

[0010] To achieve the above purpose, the specific solutions of the present utility model are as follows:

[0011] The utility model provides a multi-track performance detection structure for chip components, comprising:

[0012] Base, rotating assembly, air knife loading assembly, capacity test assembly, lifting test assembly, static elimination assembly, second test assembly, measuring probe assembly;

[0013] The rotating assembly is arranged in the middle of the base, and the air knife loading assembly, the capacity test assembly, the lifting test assembly, the demagnetization assembly, and the second test assembly are arranged on the base in a clockwise manner around the rotating assembly;

[0014] The rotating assembly includes a rotating motor and a test disc. The rotating motor is installed in the middle of the base. The test disc is circular and has a plurality of tracks on it. The tracks are provided with a plurality of test holes.

[0015] The air knife loading assembly includes an inlet and an air knife. The inlet is arranged above the track and is used to drop the electronic components to be tested onto the track of the test tray. The air knife is used to blow the components into the track to avoid accumulation.

[0016] The capacity testing component is used to test the capacity of components;

[0017] The lifting test assembly is provided with a lifting motor, a constant current charging test unit, a constant voltage charging test unit, an IR test unit, and a constant current discharge test unit;

[0018] The static elimination component is used to eliminate static electricity on the test tray and the components to be tested;

[0019] The second test assembly includes a blanking detection unit;

[0020] The components to be tested enter the track through the feeding assembly. The second test assembly detects whether there are components entering the track. The test disk is driven by the rotating motor to enter different positions for corresponding testing. The probe assembly contains a probe, which penetrates from the test hole to contact the terminal of the component to be tested for performance testing.

[0021] Furthermore, a cooling fan is provided at the lower end of the rotating motor.

[0022] Furthermore, the air knife of the air knife feeding assembly is arranged on the lower side of the feeding port, and a soft material sweeping plate is also provided on the side of the air knife.

[0023] Furthermore, the static elimination component includes a static elimination gun, which can neutralize the charges on the test plate and the components to be tested by blowing out air masses with positive and negative charges by compressed air.

[0024] Furthermore, the lifting test assembly includes: a first mounting plate, a lifting motor, a first lifting block, and a lifting slide rail;

[0025] The lifting motor is mounted on a first mounting plate, and the first mounting plate is mounted on the base;

[0026] The first lifting block is mounted on a lifting motor, and a lifting slide rail is mounted on each of the left and right sides of the first lifting block, and the lifting motor drives the first lifting block to slide up and down along the lifting slide rail;

[0027] The constant current charging test unit, the constant voltage charging test unit, the IR test unit, and the constant current discharging test unit are installed on the first lifting block in a clockwise direction.

[0028] Furthermore, the air knife feeding assembly is also provided with a vibration assembly;

[0029] The vibration assembly includes an electromagnetic suction block and a spring piece. The electromagnetic suction block is powered on and off to absorb and release the spring piece to achieve vibration, thereby facilitating the components to enter the track from the feed port.

[0030] The technical solution of the present invention has the following beneficial effects:

[0031] 1. Improved detection efficiency:

[0032] By setting up multiple test stations (air knife loading assembly, capacity test assembly, lifting test assembly, etc.) distributed around the rotating assembly, continuous and efficient detection of components is achieved, greatly shortening the test cycle of each component.

[0033] 2. Enhanced automation:

[0034] The application of air knife loading components in conjunction with vibration components ensures that components can enter the track smoothly, reduces the need for manual intervention, and improves the level of automation.

[0035] The rotation of the test disc is driven by a motor, which, combined with precise positioning control, ensures that the components can be tested in the correct position.

[0036] 3. Improved electrostatic protection:

[0037] The static elimination component effectively neutralizes the static electricity on the test plate and components, preventing test errors or component damage caused by static electricity. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a three-dimensional diagram of the utility model;

[0039] Figure 2 It is a top view of the utility model;

[0040] Figure 3 It is a bottom view of the utility model;

[0041] Figure 4 It is a top view of the rotating assembly of the utility model;

[0042] Figure 5 It is a bottom view of the rotating assembly of the utility model;

[0043] Figure 6 It is a three-dimensional diagram of the lifting test assembly of the utility model;

[0044] Figure 7 This is a bottom view of the lifting test assembly of the utility model;

[0045] Figure 8 It is a three-dimensional diagram of the capacity test assembly of the present utility model;

[0046] Figure 9 It is a bottom view of the capacity test assembly of the present utility model;

[0047] Figure 10 This is a three-dimensional diagram of the air knife feeding assembly of the utility model;

[0048] Figure 11 This is a bottom view of the air knife feeding assembly of the utility model;

[0049] Figure 12 It is a three-dimensional diagram of the capacity test assembly of the present utility model;

[0050] Figure 13 It is a bottom view of the capacity test assembly of the present utility model;

[0051] Figure 14 It is a three-dimensional diagram of the vibration component of the utility model;

[0052] Figure 15 It is a bottom view of the vibration assembly of the utility model;

[0053] Figure 16 It is a three-dimensional diagram of the static elimination component of the utility model;

[0054] Figure 17 It is a bottom view of the static elimination component of the present utility model.

[0055] In the picture:

[0056] 1. Base;

[0057] 2. Rotating assembly;

[0058] 201, rotating motor; 202, test plate; 203, track; 204, test hole; 205, cooling fan;

[0059] 3. Air knife loading assembly;

[0060] 301, feeding port; 302, air knife; 303, sweeping soft board;

[0061] 4. Capacity test component;

[0062] 5. Lifting test components;

[0063] 501, first mounting plate; 502, lifting motor; 503, first lifting block; 504, lifting rail;

[0064] 505, constant current charging test unit; 506, constant voltage charging test unit; 507, IR test unit; 508, constant current discharge test unit;

[0065] 6. Static elimination component; 601. Static elimination gun;

[0066] 7. Second test assembly; 701. Blanking detection unit;

[0067] 8. Stylus assembly;

[0068] 9. Vibration assembly; 901. Electromagnetic suction block; 902. Shrapnel. DETAILED DESCRIPTION

[0069] The present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are intended only to illustrate the present invention and are not intended to limit the present invention. It should also be noted that, for ease of description, the accompanying drawings only illustrate portions relevant to the present invention, not all of its components.

[0070] In the description of this utility model, unless otherwise specified or limited, the terms "connected," "connect," and "fixed" should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0071] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Moreover, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0072] In the description of this embodiment, terms such as "upper," "lower," "front," "rear," "left," and "right" are used to refer to positions or locations based on the positions or locations shown in the accompanying drawings. These terms are intended solely to facilitate description and simplify operation, and are not intended to indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this invention. Furthermore, the terms "first" and "second" are used solely for descriptive purposes and have no special meaning.

[0073] Combine Figures 1-17 As shown, the utility model provides a multi-track performance detection structure for chip components, comprising:

[0074] Base 1, rotating assembly 2, air knife 302 loading assembly 3, capacity test assembly 4, lifting test assembly 5, static elimination assembly 6, second test assembly 7, measuring needle assembly 8;

[0075] The rotating assembly 2 is arranged in the middle of the base 1, and the air knife 302 loading assembly 3, capacity test assembly 4, lifting test assembly 5, demagnetization assembly, and second test assembly 7 are arranged on the base 1 in a clockwise manner around the rotating assembly 2;

[0076] The rotating assembly 2 includes a rotating motor 201 and a test disc 202. The rotating motor 201 is installed in the middle of the base 1. The test disc 202 is circular and has a plurality of tracks 203 arranged thereon. The tracks 203 are provided with a plurality of test holes 204.

[0077] The air knife 302 loading assembly 3 includes an inlet 301 and an air knife 302. The inlet 301 is arranged above the track 203 and is used to drop the electronic components to be tested onto the track 203 of the test tray 202. The air knife 302 is used to blow the components into the track 203 to avoid accumulation.

[0078] The capacity testing component 4 is used to test the capacity of components;

[0079] The lifting test assembly 5 is provided with a lifting motor 502, a constant current charging test unit 505, a constant voltage charging test unit 506, an IR test unit 507, and a constant current discharge test unit 508;

[0080] The static elimination component 6 is used to eliminate static electricity on the test tray 202 and the components to be tested;

[0081] The second testing assembly 7 includes a blanking detection unit 701;

[0082] The components to be tested enter the track 203 through the feeding assembly, and the second test assembly 7 detects whether there are components entering the track 203. The test disk 202 is driven by the rotating motor 201 to enter different positions for corresponding testing. The probe assembly 8 includes a probe, which penetrates from the test hole 204 to contact the terminal of the component to be tested to test its performance.

[0083] A cooling fan 205 is also provided at the lower end of the rotating motor 201 .

[0084] The air knife 302 of the air knife 302 feeding assembly is arranged at the lower side of the feeding port 301 , and a material sweeping soft plate 303 is further arranged on the side of the air knife 302 .

[0085] The static elimination component 6 includes a static elimination gun 601, which can neutralize the charges on the test plate 202 and the components to be tested by blowing out air masses with positive and negative charges by compressed air.

[0086] The lifting test assembly 5 includes: a first mounting plate 501, a lifting motor 502, a first lifting block 503, and a lifting slide rail 504;

[0087] The lifting motor 502 is mounted on the first mounting plate 501, and the first mounting plate 501 is mounted on the base 1;

[0088] The first lifting block 503 is mounted on the lifting motor 502. A lifting rail 504 is mounted on the left and right sides of the first lifting block 503. The lifting motor 502 drives the first lifting block 503 to slide up and down along the lifting rail 504.

[0089] The constant current charging test unit 505 , the constant voltage charging test unit 506 , the IR test unit 507 , and the constant current discharging test unit 508 are installed on the first lifting block 503 in a clockwise direction.

[0090] The air knife 302 feeding assembly is also provided with a vibration assembly 9;

[0091] The vibration assembly 9 includes an electromagnetic suction block 901 and a spring 902 . The electromagnetic suction block 901 is energized and deenergized to absorb and release the spring 902 , thereby achieving vibration, thereby facilitating the components to enter the track 203 from the feed port 301 .

[0092] The principle of this utility model is as follows:

[0093] Component loading:

[0094] The chip components to be inspected first enter the air knife 302 loading assembly 3 through the feed port 301 .

[0095] The air knife 302 in the air knife loading assembly 3 blows the components into the track 203 of the test tray 202 to prevent the components from piling up.

[0096] The vibration assembly 9 helps the components to smoothly enter the track 203 through the vibration of the electromagnetic suction block 901 and the spring 902 .

[0097] Static elimination:

[0098] The static elimination component 6 emits air masses with positive and negative charges through the static elimination gun 601 to eliminate static electricity on the test plate 202 and the surface of the components to avoid interference during the test process.

[0099] Rotation positioning:

[0100] The rotary motor 201 drives the test plate 202 to rotate, so that the components move to the designated test position.

[0101] The track 203 on the test disc 202 is provided with a plurality of test holes 204 for subsequent performance testing.

[0102] Capacity test:

[0103] When the component arrives at the location of the capacity testing component 4, the component performs a capacity test on it.

[0104] Lifting test:

[0105] The lifting test assembly 5 includes a lifting motor 502 , a first lifting block 503 and a plurality of test units (a constant current charging test unit 505 , a constant voltage charging test unit 506 , an IR test unit 507 and a constant current discharge test unit 508 ).

[0106] The lifting motor 502 drives the first lifting block 503 to slide up and down along the lifting rail 504 so that the corresponding test unit is aligned with the component in the test hole 204.

[0107] Conduct various electrical performance tests (such as charge and discharge, IR impedance, etc.).

[0108] Second test component 7:

[0109] The blanking detection unit 701 detects whether any components have entered the track 203 to ensure that each track 203 has components in place.

[0110] Performance testing:

[0111] The stylus in the stylus assembly 8 penetrates through the test hole 204 and contacts the terminal of the component to perform performance testing.

[0112] After the test is completed, the test disk 202 continues to rotate and the components move to the next test position.

[0113] Cooling fan 205:

[0114] The cooling fan 205 below the rotating motor 201 helps to dissipate heat and keep the motor running stably during long hours of operation.

[0115] Sweeping soft board 303 in air knife loading assembly 3:

[0116] The sweeping soft board 303 helps to clean the residues in the track 203 and avoid the accumulation of components.

[0117] Through the above working principle, the multi-track 203 performance detection structure can achieve efficient and continuous testing of chip components while ensuring the accuracy and reliability of the test. The entire testing process is highly automated, greatly improving production efficiency and reducing human error.

[0118] The above description is only a preferred embodiment of the present invention and does not limit the scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the practical concept of the present invention, or direct / indirect application in other related technical fields are included in the scope of protection of the present invention.

Claims

1. A multi-track performance detection structure for chip components, characterized in that: include: Base, rotating assembly, air knife loading assembly, capacity test assembly, lifting test assembly, static elimination assembly, second test assembly, measuring probe assembly; The rotating assembly is arranged in the middle of the base, and the air knife loading assembly, the capacity test assembly, the lifting test assembly, the demagnetization assembly, and the second test assembly are arranged on the base in a clockwise manner around the rotating assembly; The rotating assembly includes a rotating motor and a test disc. The rotating motor is installed in the middle of the base. The test disc is circular and has a plurality of tracks on it. The tracks are provided with a plurality of test holes. The air knife loading assembly includes an inlet and an air knife. The inlet is arranged above the track and is used to drop the electronic components to be tested onto the track of the test tray. The air knife is used to blow the components into the track to avoid accumulation. The capacity testing component is used to test the capacity of components; The lifting test assembly is provided with a lifting motor, a constant current charging test unit, a constant voltage charging test unit, an IR test unit, and a constant current discharge test unit; The static elimination component is used to eliminate static electricity on the test tray and the components to be tested; The second test assembly includes a blanking detection unit; The components to be tested enter the track through the feeding assembly. The second test assembly detects whether there are components entering the track. The test disk is driven by the rotating motor to enter different positions for corresponding testing. The probe assembly contains a probe, which penetrates from the test hole to contact the terminal of the component to be tested for performance testing.

2. The multi-track performance detection structure for chip components according to claim 1, characterized in that: A cooling fan is also provided at the lower end of the rotating motor.

3. The multi-track performance detection structure for chip components according to claim 1, characterized in that: The air knife of the air knife feeding assembly is arranged at the lower side of the feeding port, and a soft material sweeping plate is also arranged on the side of the air knife.

4. The multi-track performance detection structure for chip components according to claim 1, characterized in that: The static elimination component includes a static elimination gun, which can neutralize the charges on the test plate and the components to be tested by blowing out air masses with positive and negative charges by compressed air.

5. The multi-track performance detection structure for chip components according to claim 1, characterized in that: The lifting test assembly includes: a first mounting plate, a lifting motor, a first lifting block, and a lifting slide rail; The lifting motor is mounted on a first mounting plate, and the first mounting plate is mounted on the base; The first lifting block is mounted on a lifting motor, and a lifting slide rail is mounted on each of the left and right sides of the first lifting block, and the lifting motor drives the first lifting block to slide up and down along the lifting slide rail; The constant current charging test unit, the constant voltage charging test unit, the IR test unit, and the constant current discharging test unit are installed on the first lifting block in a clockwise direction.

6. The multi-track performance detection structure for chip components according to claim 1, characterized in that: The air knife feeding assembly is also provided with a vibration assembly; The vibration assembly includes an electromagnetic suction block and a spring piece. The electromagnetic suction block is powered on and off to absorb and release the spring piece to achieve vibration, thereby facilitating the components to enter the track from the feed port.

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