Automatic alignment crimping equipment

Abstract

The utility model discloses an automatic alignment crimping device, and belongs to the field of display panel testing. The crimping equipment comprises a carrier plate and a test board. The carrier plate is provided with a T-shaped hole, a connector avoiding hole and a rotatably arranged buckle, the T-shaped hole comprises a first section and a second section which are communicated with each other, the diameter of the first section is larger than that of the second section, and a jacking column is slidably inserted in the first section and used for jacking the buckle; the test bench is used for supporting the carrier plate, the test bench is provided with a probe module and an ejector pin, the probe module is used for being inserted into the connector receding hole and then is connected with a connector of the display module in a pressing mode, and the ejector pin is used for penetrating through the second section and then jacking up the jacking column. According to the automatic alignment crimping equipment provided by the embodiment of the utility model, not only can the fixation of the display module be realized in the process of transferring the display module, but also the accurate alignment of the connector of the display module and the probe module can be automatically realized on the testboard.

Description

Technical Field

[0001] The utility model belongs to the field of display panel testing, and in particular relates to an automatic alignment and crimping device. Background Art

[0002] In order to effectively ensure the quality of the display module, technicians will perform a series of performance tests on it during the production process of the display module. Specifically, by providing electrical signals to the connector of the display module, the display panel is finally illuminated.

[0003] Existing display modules are typically placed on a carrier plate at the loading station and pressed onto the carrier plate using rotating clips. The carrier plate is then transferred to the test bench, where it is aligned with the test bench's probe module, pressed and illuminated, completing performance testing on the test bench. Once testing is complete, the carrier plate transports the display module to the next station.

[0004] However, due to the pressure of the buckle on the display module, the position of the connector of the display module on the carrier is relatively fixed. When the carrier is placed, the connector cannot adapt to the positioning groove of the probe module on the test bench (the positioning groove is located at the top of the probe module, the side wall of the positioning groove is inclined and conical, and the probe is located in the positioning groove) to compensate for the assembly error, which ultimately makes it difficult to accurately align the connector and the probe module. Utility Model Content

[0005] In response to the above defects or improvement needs of the prior art, the utility model provides an automatic alignment and crimping device, the purpose of which is not only to fix the display module during the transportation of the display module, but also to automatically achieve precise alignment of the connector of the display module and the probe module on the test bench.

[0006] To achieve the above-mentioned purpose, the present invention provides an automatic alignment crimping device, which includes a carrier plate and a test bench;

[0007] The carrier plate has a T-shaped hole, a connector avoidance hole, and a rotatably arranged buckle. The T-shaped hole includes a first section and a second section that are interconnected. The diameter of the first section is larger than the diameter of the second section. A top post is slidably inserted in the first section. The top post is used to lift the buckle and release the pressure on the display module.

[0008] The test bench is used to support the carrier board. The test bench is provided with a probe module and a ejector pin. The probe module is used to be inserted into the connector avoidance hole and then crimp the connector of the display module. The ejector pin is used to lift the ejector column after passing through the second section.

[0009] Optionally, the bottom of the top column has an outer flange, the outer flange is slidably engaged with the first section, the top of the first section has an inner flange, and a spring is sandwiched between the inner flange and the outer flange.

[0010] Optionally, a first magnet is provided at the pressing end of the buckle, and the top column is an iron structure.

[0011] Optionally, a second magnet is provided at the driving end of the buckle, and a third magnet is provided on the carrier plate, and the second magnet and the third magnet match to keep the buckle in an open state.

[0012] Optionally, the test bench has a plurality of positioning pins arranged at intervals, and the carrier plate has a plurality of positioning holes arranged at intervals, and each positioning pin can be movably inserted into a corresponding positioning hole.

[0013] Optionally, a bushing is inserted into each of the positioning holes, and each of the positioning pins can be movably inserted into the corresponding bushing.

[0014] Optionally, the test bench has a plurality of fourth magnets arranged at intervals, the carrier plate is mounted with a plurality of iron blocks arranged at intervals, and each of the fourth magnets is arranged opposite to the corresponding iron block.

[0015] Optionally, the carrier plate has a groove, the groove is connected to the connector avoidance hole, and the groove is used to position the display module.

[0016] Optionally, the test bench has a PCB board, the PCB board is clamped between the probe module and the test bench, and the PCB board is connected to the probes of the probe module.

[0017] Optionally, when the push column lifts up the buckle, the height of the push column protruding from the carrier plate is 0.5-1.0 mm.

[0018] The above-mentioned improved technical features can be combined with each other as long as they do not conflict with each other.

[0019] In general, the above technical solutions conceived by the present invention have the following beneficial effects compared with the prior art:

[0020] In the automatic alignment and crimping device provided by the present invention, when transporting a display module, the display module rests on a carrier plate with the latches closed, thereby securely pressing the display module onto the carrier plate. At this point, the top post is fully contained within the first section of the T-shaped hole and does not protrude beyond it. Furthermore, the display module's connector is positioned directly above the connector clearance hole, with the connector's test point facing downward.

[0021] When the carrier board is transferred to the test bench for crimping test, the carrier board moves down to be placed on the test bench. First, the ejector pin is aligned with the second section of the T-shaped hole and passes through the second section until the ejector pin lifts the ejector post. The ejector post then lifts the buckle, causing the pressed end of the buckle to tilt and release the pressure on the display module. In the process of the carrier board moving down, the probe module passes through the connector avoidance hole and faces the connector. Since the display module is released from pressure, its position on the carrier board can move relatively. The connector will automatically adapt to the positioning groove on the probe module. Finally, it is precisely inserted into the positioning groove of the probe module to achieve precise alignment with the probe, thereby compensating for assembly errors. Finally, the connector and the probe module are crimped, thereby finally achieving crimping and lighting of the display module.

[0022] That is to say, the automatic alignment and crimping device provided by the embodiment of the present invention can not only fix the display module during the transportation of the display module, but also automatically realize the precise alignment of the connector of the display module and the probe module on the test bench. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a working diagram of an automatic alignment crimping device provided by an embodiment of the utility model;

[0024] Figure 2 yes Figure 1 sectional view of

[0025] Figure 3 yes Figure 2 A partial enlarged view of

[0026] Figure 4 This is a schematic structural diagram of a carrier board provided by an embodiment of the present utility model;

[0027] Figure 5 It is a structural schematic diagram of a test bench provided by an embodiment of the utility model.

[0028] In all the drawings, the same reference numerals represent the same technical features, specifically:

[0029] 1. Carrier board; 11. T-shaped hole; 111. First section; 1111. Inner flange; 112. Second section; 12. Connector avoidance hole; 13. Snap-on; 131. First magnet; 132. Second magnet; 14. Ejector column; 141. Outer flange; 15. Spring; 16. Third magnet; 17. Positioning hole; 18. Groove; 2. Test bench; 21. Probe module; 22. Ejector pin; 23. Positioning pin; 24. Fourth magnet; 25. PCB board; 100. Display module. DETAILED DESCRIPTION

[0030] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only intended to explain the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

[0031] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation to the present invention.

[0032] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature specified as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of this utility model, "plurality" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0033] In this utility model, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection; direct connection, or indirect connection through an intermediate medium; internal communication between two components, or interaction between two components, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on specific circumstances.

[0034] In the present invention, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediary. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0035] Example:

[0036] Figure 1 This is a working diagram of an automatic alignment crimping device provided by an embodiment of the utility model (the buckle 13 is lifted up). Figure 2 yes Figure 1 A cross-sectional view of Figure 3 yes Figure 2 A partial enlarged view, combined with Figure 1-Figure 3 As shown, the crimping device includes a carrier plate 1 and a test bench 2 .

[0037] Figure 4 This is a schematic diagram of the structure of the carrier provided by the embodiment of the present invention (the buckle 13 is closed), as shown Figure 4 As shown, the carrier board 1 has a T-shaped hole 11, a connector avoidance hole 12 and a rotatably arranged buckle 13. The T-shaped hole 11 includes a first section 111 and a second section 112 that are connected to each other. The diameter of the first section 111 is larger than the diameter of the second section 112. A top column 14 is slidably inserted in the first section 111. The top column 14 is used to lift the buckle 13 and release the pressure on the display module 100.

[0038] Figure 5 This is a schematic diagram of the structure of the test bench provided by the embodiment of the utility model. Figure 5 As shown, the test bench 2 is used to support the carrier board 1. The test bench 2 has a probe module 21 and a push pin 22. The probe module 21 is used to be inserted into the connector avoidance hole 12 and then crimp the connector of the display module 100. The push pin 22 is used to pass through the second section 112 and then lift the push column 14.

[0039] In the automatic alignment and crimping device provided by the present embodiment, when transporting the display module 100, the display module 100 rests on the carrier 1, and the latches 13 remain closed, thereby securely pressing the display module 100 against the carrier 1. At this point, the top post 14 is fully contained within the first section 111 of the T-shaped hole 11 and does not protrude from the hole. Furthermore, the connector of the display module 100 is positioned directly above the connector clearance hole 12, with the connector's test point facing downward.

[0040] When the carrier 1 is transferred to the test table 2 for the press-fit test, the carrier 1 is moved down to be placed on the test table 2. First, the ejector pin 22 is aligned with the second section 112 of the T-shaped hole 11 and passes through the second section 112 until the ejector pin 22 lifts the ejector post 14. The ejector post 14 then lifts the buckle 13, causing the pressing end of the buckle 13 to tilt and release the pressing position on the display module 100 (see FIG. Figure 2 As the carrier board 1 moves downward, the probe module 21 passes through the connector avoidance hole 12 and faces the connector. Since the display module 100 is released from its compression, its position on the carrier board 1 can move relatively. The connector automatically adapts to the positioning groove on the probe module 21 and is ultimately precisely inserted into the positioning groove of the probe module 21 to achieve precise alignment with the probe, thereby compensating for assembly errors. Finally, the connector and probe module 21 are crimped together, ultimately achieving crimping and lighting of the display module 100.

[0041] That is to say, the automatic alignment and crimping device provided by the embodiment of the present invention can not only fix the display module 100 during the transportation of the display module 100, but also automatically realize the precise alignment of the connector of the display module 100 and the probe module 21 on the test bench 2.

[0042] It should be noted that the probe module 21 is a conventional structure in this field, and its specific structure will not be described in detail here.

[0043] For example, there can be two clips 13, two ejector pins 14, and two ejector pins 22, one on each side of the display module 100. The clips 13 press against the display module 100's cable to prevent damage to the display module 100. The bottom end of the ejector pin 22 is inserted into the test platform 2, while the top end of the ejector pin 22 protrudes from the test platform 2.

[0044] It is easy to understand that after the crimping test is completed, the carrier board 1 is removed from the test bench 2, so that the ejector pin 22 disengages from the T-shaped hole 11, and the ejector column 14 moves downward and resets under the action of gravity (i.e., it is re-accommodated in the first section 111), thereby releasing the lifting of the buckle 13, and the buckle 13 will close again to press the display module 100, and then the display module 100 will be transported to the next workstation through the carrier board 1.

[0045] In addition, the diameter of the first section 111 is greater than the diameter of the second section 112 , which can prevent the top column 14 from falling downward from the second section 112 of the T-shaped hole 11 during transportation.

[0046] Continue to see Figure 3 The bottom of the top column 14 has an outer flange 141, which is slidably fitted with the first section 111. The top of the first section 111 has an inner flange 1111, and a spring 15 is sandwiched between the inner flange 1111 and the outer flange 141.

[0047] In the above embodiment, while carrier 1 is placed on test bench 2, ejector pins 22 push against ejector post 14, compressing spring 15. After the crimping test, when carrier 1 is removed from test bench 2, the ejector pins 22 separate from ejector post 14. The restoring force generated by spring 15 causes ejector post 14 to reliably move downward and retract into first section 111, preventing ejector post 14 from becoming stuck during its downward movement.

[0048] In this embodiment, the pressing end of the buckle 13 is provided with a first magnet 131, and the top post 14 is made of iron. During the transportation of the display module 100 by the carrier 1, the top post 14 is in the first section 111, and the buckle 13 is engaged. At this time, the iron material of the top post 14 generates a magnetic force on the magnet on the buckle 13, which can keep the buckle 13 closed and prevent it from opening accidentally during transportation.

[0049] In addition, a second magnet 132 is provided at the driving end of the buckle 13 , and a third magnet 16 is provided on the carrier plate 1 . The second magnet 132 and the third magnet 16 match to keep the buckle 13 in an open state.

[0050] It is easy to understand that before placing the display module 100 on the carrier 1 at the loading position, the buckle 13 needs to be opened first, and the magnetic force generated between the second magnet 132 and the third magnet 16 can keep the buckle 13 in the open state, avoiding the buckle 13 from accidentally closing during the process of placing the display module 100.

[0051] Continue to see Figure 5 The test bench 2 has a plurality of positioning pins 23 arranged at intervals, and the carrier board 1 has a plurality of positioning holes 17 arranged at intervals. Each positioning pin 23 can be movably inserted into the corresponding positioning hole 17. The positioning between the carrier board 1 and the test bench 2 can be achieved through the cooperation of the positioning pins 23 and the positioning holes 17, ensuring that the probe module 21 can smoothly pass through the connector avoidance hole 12.

[0052] Exemplarily, a bushing is inserted into each positioning hole 17 , and each positioning pin 23 is movably inserted into the corresponding bushing. The bushing can prevent the positioning hole 17 from being worn by the positioning pin 23 .

[0053] In addition, the test bench 2 has a plurality of spaced fourth magnets 24 , and the carrier plate 1 is mounted with a plurality of spaced iron blocks. Each fourth magnet 24 is arranged relative to the corresponding iron block, thereby fixing the carrier plate 1 on the test bench 2 .

[0054] In this embodiment, a groove 18 is provided on the carrier board 1, and the groove 18 is connected to the connector avoidance hole 12. The groove 18 is used to position the display module 100, thereby realizing the positioning of the display module 100 on the carrier board 1, ensuring the relative accuracy of the connector of the display module 100 and the probe module 21 on the test bench 2, and avoiding excessive position deviation between the connector and the probe module 21 after the carrier board 1 is placed in place, resulting in the connector being unable to adapt to the positioning groove of the probe module 21.

[0055] For example, the test bench 2 includes a PCB 25, which is sandwiched between the probe module 21 and the test bench 2. The PCB 25 is connected to the probes of the probe module 21. The PCB 25 serves as a transfer for the probe module 21. By providing a test electrical signal to the PCB 25, the electrical signal passes through the probe module 21 and the connector, ultimately illuminating the screen of the display module 100.

[0056] In order to prevent the buckle 13 from being completely lifted up and opened by the push column 14 when the carrier 1 is placed on the test bench 2, when the push column 14 lifts the buckle 13, the height of the push column 14 protrudes from the carrier 1 by 0.5-1.0mm, so that the buckle 13 can automatically close under the action of gravity after the crimping test is completed, avoiding manual operation of closing the buckle 13.

[0057] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention shall be included in the scope of protection of the present invention.

Claims

1. An automatic alignment crimping device, characterized in that: The crimping equipment includes a carrier plate and a test bench; The carrier plate has a T-shaped hole, a connector avoidance hole, and a rotatably arranged buckle. The T-shaped hole includes a first section and a second section that are interconnected. The diameter of the first section is larger than the diameter of the second section. A top post is slidably inserted in the first section. The top post is used to lift the buckle and release the pressure on the display module. The test bench is used to support the carrier board. The test bench is provided with a probe module and a ejector pin. The probe module is used to be inserted into the connector avoidance hole and then crimp the connector of the display module. The ejector pin is used to lift the ejector column after passing through the second section.

2. The automatic alignment crimping equipment according to claim 1, characterized in that: The bottom of the top column is provided with an outer flange, and the outer flange is slidably matched with the first section. The top of the first section is provided with an inner flange, and a spring is sandwiched between the inner flange and the outer flange.

3. The automatic alignment crimping equipment according to claim 1, characterized in that: The pressing end of the buckle is provided with a first magnet, and the top column is an iron structure.

4. The automatic alignment crimping equipment according to claim 2, characterized in that: The driving end of the buckle is provided with a second magnet, and the carrier plate is provided with a third magnet. The second magnet and the third magnet match to keep the buckle in an open state.

5. The automatic alignment crimping equipment according to claim 1, characterized in that: The test bench is provided with a plurality of positioning pins arranged at intervals, and the carrier plate is provided with a plurality of positioning holes arranged at intervals. Each positioning pin can be movably inserted into the corresponding positioning hole.

6. The automatic alignment crimping equipment according to claim 5, characterized in that: A bushing is inserted into each of the positioning holes, and each of the positioning pins can be movably inserted into the corresponding bushing.

7. The automatic alignment crimping device according to any one of claims 1 to 6, characterized in that: The test bench is provided with a plurality of fourth magnets arranged at intervals, the carrier plate is provided with a plurality of iron blocks arranged at intervals, and each of the fourth magnets is arranged opposite to the corresponding iron block.

8. The automatic alignment crimping device according to any one of claims 1 to 6, characterized in that: The carrier plate has a groove, which is communicated with the connector avoidance hole and is used to position the display module.

9. The automatic alignment and crimping equipment according to any one of claims 1 to 6, characterized in that: The test bench is provided with a PCB board, which is clamped between the probe module and the test bench, and is connected to the probes of the probe module.

10. The automatic alignment and crimping equipment according to any one of claims 1 to 6, characterized in that: When the push column lifts up the buckle, the push column protrudes from the carrier plate by a height of 0.5-1.0 mm.

Images