Test needle

Abstract

The utility model provides a test pin, which comprises a test pin body, the test pin body comprises a contact part, a detection part is arranged below the contact part, the contact part and the detection part are connected through a connecting piece, the connecting piece is arranged to be in a bent shape which is telescopic along the direction of the detection part, and the connecting piece, the contact part and the detection part are integrally arranged; one side of the detection part is connected with the connecting piece, the other side is provided with a detection head, and the test needle body is in contact with the chip through the detection head. The test pin contact part is located at the upper part, the detection part is located at the lower part, and the test pin contact part and the detection part are connected through a bent connecting piece which is telescopic along the direction of the detection part, are integrally arranged and are in contact with a chip through a detection head; the connecting piece enhances the stability and the elastic control of the test pin, reduces the bending degree when the chip is contacted, ensures the stable transmission of an electric signal, avoids test errors and inaccurate data, and improves the reliability and the accuracy of chip test.

Description

Technical Field

[0001] The utility model belongs to the technical field of test needles, and more specifically, relates to a test needle for chip detection. Background Art

[0002] During the chip testing process, test needles are often required to connect the chip to the test equipment. The test needles can contact the pins of the chip to ensure accurate transmission of electrical signals and acquisition of test data, avoiding misjudgment of chip quality.

[0003] For example, the Chinese utility model patent with patent number 202122017859.1 provides a test needle that has a strip groove in the middle of the inclined section and the curved section. The strip groove extends along the length of the inclined section and the curved section, thereby reducing the rigidity of the elastic portion and increasing the strength and elasticity of the test needle. However, when the existing test needle contacts the chip, due to the multiple sets of strip grooves formed in it, it forms an elasticity. When the pressure is unevenly distributed, it will produce a large degree of curvature, making the contact between the test needle and the chip pin unstable, which can easily lead to inaccurate electrical signals. At the same time, unstable contact may also damage the chip pin, resulting in reduced chip production quality. Utility Model Content

[0004] In order to solve the above technical problems, the utility model provides a test needle to solve the technical problem in the prior art that the existing test needle has multiple groups of strip grooves, which gives it elasticity. When it contacts the chip, it will produce a large curvature, making the electrical signal transmission unstable and easily causing damage to the chip pins, thereby reducing the quality of chip production.

[0005] The purpose and function of the test needle of the present invention are achieved by the following specific technical means:

[0006] A test needle comprises a test needle body, the test needle body comprises a contact portion, a detection portion is arranged below the contact portion, the contact portion and the detection portion are connected by a connecting piece, the connecting piece is arranged in a curved shape that can be extended and retracted along the direction of the detection portion, and is integrated with the contact portion and the detection portion; one side of the detection portion is connected to the connecting piece, and the other side is provided with a detection head, and the test needle body contacts the chip through the detection head.

[0007] According to a preferred embodiment, the test needle body is made of metal.

[0008] According to a preferred embodiment, a wear-resistant layer is provided on the top surface of the contact portion, and a connecting notch is provided on the contact portion.

[0009] According to a preferred embodiment, the bending width of the connecting member is equal to the width of the contact portion and the detection portion.

[0010] According to a preferred embodiment, the connecting member is bent to form a plurality of arcs, and the arcs have the same curvature.

[0011] According to a preferred embodiment, the bottom of the detection head is configured as a plane, and the detection head contacts the chip through the plane.

[0012] According to a preferred embodiment, a needle tip is provided at the bottom of the detection head, and the detection head contacts the chip through the needle tip.

[0013] Compared with the prior art, the present invention has the following beneficial effects:

[0014] 1. The contact and detection sections are connected by a curved connector that extends and contracts along the detection section, forming an integrated design. Furthermore, the connector is formed from a single piece of metal plate and is curved, enhancing the overall stability and elasticity of the test needle. This significantly reduces the degree of curvature when contacting the chip, ensuring stable electrical signal transmission. This effectively avoids test errors and inaccurate data caused by unstable electrical signal transmission, improves the reliability and accuracy of chip testing, and provides a strong guarantee for chip production quality.

[0015] 2. This test probe features a wear-resistant layer on the top surface of the contact portion, enhancing its wear resistance and service life, enabling it to maintain good performance even during frequent testing. The curved width of the connector is equal to the width of the contact and detection sections, making the structure more compact and transmitting force more evenly, further enhancing the stability of the test probe. The multiple arcs formed by the curved connector are of equal radius, effectively dispersing stress during testing, improving the test probe's fatigue resistance and extending its service life. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a schematic structural diagram of the first embodiment of the present invention;

[0017] Figure 2 It is a front view of the first embodiment of the present utility model;

[0018] Figure 3 It is a structural diagram of the second embodiment of the present utility model.

[0019] In the figure, the corresponding relationship between the component names and the drawing numbers is as follows:

[0020] 11. Contact part; 12. Detection part; 13. Connector; 14. Detection head; 15. Connection notch; 16. Arc; 17. Needle tip. DETAILED DESCRIPTION

[0021] The following embodiments of the present invention are described in further detail with reference to the accompanying drawings and examples. The following embodiments are used to illustrate the technical solution of the present invention, but are not intended to limit the scope of protection of the present invention.

[0022] Example 1:

[0023] like Figure 1 、 Figure 2 As shown, the present invention provides a test needle comprising a contact portion 11, located at the top of the entire structure. This portion is responsible for the important task of establishing the initial connection with external test equipment or circuits, and its performance directly impacts the reception and transmission of test signals. Below the contact portion 11 is a detection portion 12, and connecting the contact portion 11 and detection portion 12 is a connector 13. Connector 13 is configured to be curved and extendable along the detection portion 12, effectively buffering and dissipating the pressure and impact forces that may be generated during chip testing. Connector 13 is integrated with the contact portion 11 and detection portion 12, and lacks slots, enhancing the stability and reliability of the entire test needle. This avoids problems such as signal transmission interruption and increased error that may occur due to loose or loose connections between components. A detection head 14 is located on the other side of the detection portion 12. It is through this detection head 14 that the test needle body contacts the chip, enabling comprehensive and in-depth testing of various chip performance indicators.

[0024] The top surface of contact portion 11 is provided with a wear-resistant layer, which enhances its durability and stability. During frequent testing operations, contact portion 11 inevitably rubs and contacts external devices or components. The wear-resistant layer effectively resists this wear, reducing surface damage to contact portion 11 caused by friction, thereby extending its service life.

[0025] At the same time, a connection notch 15 is also provided on the contact portion 11, providing a more flexible and convenient way to connect the contact portion 11 to other components. Through this connection notch 15, a more stable connection can be achieved, ensuring the stable transmission and reception of the test signal. The bending width of the connector 13 is equal to the width of the contact portion 11 and the detection portion 12, ensuring uniform distribution of force during the transmission process. When the test needle is working, the external force it is subjected to can be evenly transmitted to the contact portion 11 and the detection portion 12 through the connector 13, avoiding local damage or performance degradation caused by concentrated force.

[0026] Connector 13 is bent into multiple arcs 16, each with equal curvature. This further enhances the connector's elasticity and flexibility, allowing it to better adapt to the various changes and challenges encountered during testing. Furthermore, these equal curvatures ensure that stresses are balanced across all parts of connector 13 during expansion and contraction, effectively improving its fatigue resistance and service life.

[0027] The bottom of the detection head 14 is designed to be flat. This flat contact surface provides a larger contact area, thereby increasing the stability and reliability of contact with the chip. During the test process, stable contact is crucial for accurately obtaining chip performance data. The flat contact surface reduces errors and interference caused by poor contact, ensuring the accuracy and consistency of test results. This design enables the detection head 14 to interact with the chip more effectively, providing a foundation for chip testing.

[0028] Example 2:

[0029] Based on the test needle provided in Example 1 of this application, Example 2 of this application provides a test needle. This Example 2 is merely a preferred embodiment of Example 1, and the implementation of Example 2 will not affect the independent implementation of Example 1. The second embodiment of this utility model will be further described below.

[0030] like Figure 3 As shown, a needle tip 17 is provided at the bottom of the detection head 14, and the needle tip 17 can make the contact between the detection head 14 and the chip more accurate and concentrated. When performing chip testing, the needle tip 17 can accurately locate the specific test point on the chip, effectively avoiding contact deviation. Since the tip area of ​​the needle tip 17 is small, pressure can be applied and signals can be transmitted more concentratedly, thereby improving the sensitivity and resolution of the test. This contact method is particularly critical when testing tiny areas or high-density pins on the chip, and can obtain more accurate test data. In addition, the needle tip 17 also reduces unnecessary large-area contact with the chip, reducing the risk of potential damage to the chip.

[0031] The difference between this second embodiment and the first embodiment is that the bottom of the test head 14 is provided with a needle tip 17. The needle tip 17 can more accurately contact the chip pins, making the test needle more flexible and effectively avoiding contact deviation. At the same time, it also reduces unnecessary contact with the chip and reduces the risk of chip damage. The remaining conditions are the same as those of the first embodiment and are not further described in this embodiment.

[0032] The basic principles, main features and advantages of the present invention are shown and described above. It is obvious to those skilled in the art that the present invention is not limited to the details of the above exemplary embodiments.

Claims

1. A test needle, comprising a test needle body, characterized in that: The test needle body comprises a contact portion (11), a detection portion (12) is provided below the contact portion (11), the contact portion (11) and the detection portion (12) are connected via a connecting piece (13), the connecting piece (13) is arranged in a curved shape that can be extended and retracted along the direction of the detection portion (12), and is integrated with the contact portion (11) and the detection portion (12); one side of the detection portion (12) is connected to the connecting piece (13), and the other side is provided with a detection head (14), and the test needle body contacts the chip via the detection head (14).

2. The test needle according to claim 1, characterized in that: The test needle body is made of metal.

3. The test needle according to claim 2, characterized in that: The top surface of the contact portion (11) is provided with a wear-resistant layer, and a connecting notch (15) is provided on the contact portion (11).

4. The test needle according to claim 1, characterized in that: The bending width of the connecting member (13) is equal to the width of the contact portion (11) and the detection portion (12).

5. The test needle according to claim 4, characterized in that: The connecting member (13) is bent to form a plurality of circular arcs (16), and the arcs (16) have the same curvature.

6. The test needle according to claim 5, characterized in that: The bottom of the detection head (14) is configured as a plane, and the detection head (14) contacts the chip through the plane.

7. The test needle according to claim 1, characterized in that: A needle tip (17) is provided at the bottom of the detection head (14), and the detection head (14) contacts the chip through the needle tip (17).

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