Radio frequency chip assembly debugging and testing device

Abstract

The utility model discloses a radio frequency chip assembly debugging test device, and relates to the technical field of radio frequency chip debugging test. The debugging test bench comprises a debugging test bench, the top of the debugging test bench is provided with three radio frequency chip placing grooves which are arranged side by side at equal intervals, and the debugging test bench at the front sides of the radio frequency chip placing grooves is fixedly connected with an interface. According to the utility model, the three radio frequency chips to be debugged and tested are respectively placed in the three radio frequency chip placing grooves, and the chip pressing plate is respectively driven by the three pressing rods to respectively press and fix the three radio frequency chips, so that the debugging test of the three radio frequency chips can be realized at the same time, the efficiency is higher, the screw rod is rotated to drive the chip pressing plate to move downwards, and the test efficiency is improved. According to the radio frequency chip pressing device, the three pressing rods can be driven to move downwards together through the springs, the three radio frequency chips are pressed through the three chip pressing plates, workers do not need to manually press the three radio frequency chips one by one, and operation is more convenient.

Description

Technical Field

[0001] The utility model belongs to the technical field of radio frequency chip debugging and testing, in particular to a radio frequency chip component debugging and testing device. Background Art

[0002] Due to the development of highly integrated technology and the strict requirements of aerospace equipment on volume and weight, RF highly integrated circuits are widely used because of their small size and light weight. The original modular RF transceiver components or multi-channel amplifier phase shifters and other RF devices are packaged into BGA chip form through semiconductor technology, which has very obvious advantages in terms of volume and cost of use. It can greatly reduce the volume and weight of the whole equipment, reduce the power consumption of the whole equipment, and have higher reliability. At the same time, it can reduce many process assembly steps. After searching, the patent with application number 202322261445.2 discloses a RF chip component debugging and testing device, including a base, a shell one, a shell two, a cover plate, a rotating shaft, a handle, a buckle one, a support column, an interface, a clamping assembly, a RF chip, a crimping shaft, a fixing plate, a fixing pin, a crimping sleeve, a buckle two, a knob, a clamping column and a fixing plate two. First, the RF chip is placed inside the shell one. A crimping shaft is welded on the fixing plate on the lower side of the shell, and the crimping sleeve is welded on the clamping shaft. The RF chip and the crimping sleeve are in contact. A clamping assembly is provided inside the shell two, and the fixing plate two is fixedly connected to the inner wall of the shell two through the buckle two.

[0003] However, during actual use, the applicant found that when debugging and testing the RF chip, it was only possible to debug and test one RF chip at a time, which made the chip debugging and testing efficiency low. In view of this, we proposed a RF chip component debugging and testing device. Utility Model Content

[0004] In order to solve the above technical problems, the present invention is achieved through the following technical solutions:

[0005] The utility model is a debugging and testing device for a radio frequency chip component, comprising a debugging and testing seat, a radio frequency chip placement slot being provided on the top of the debugging and testing seat, and three radio frequency chip placement slots being provided side by side at equal intervals, an interface being fixedly connected to the debugging and testing seat on the front side of the radio frequency chip placement slot, the top of the debugging and testing seat being slidably connected to a top seat, the internal horizontal movability of the top seat being connected to a movable beam, a pressure rod being movably passed through the movable beam, and three pressure rods on the movable beam being arranged side by side at equal intervals, a chip pressing plate being fixedly provided at the lower end of the pressure rod, a limiting plate being fixedly provided at the upper end of the pressure rod, a spring being sleeved on the pressure rod between the chip pressing plate and the interface, a connecting frame being fixedly provided at the top of the movable beam, a screw being rotatably connected to the top of the top seat through a bearing, the lower end thread of the screw passing through the middle part of the connecting frame, the upper end of the screw extending to the outside of the top seat and being fixedly provided with an adjusting handle.

[0006] Preferably, the two ends slide along the inner side walls of the top seat.

[0007] Preferably, the upper end of the spring abuts against the upper portion, and the lower end of the spring abuts against the chip pressing plate.

[0008] Preferably, a through slot is provided on the lower top seat for avoiding the chip pressing plate.

[0009] Preferably, guide grooves are symmetrically provided on both sides of the debugging test seat, and guide sliders are symmetrically provided on the lower part of the top seat. The guide sliders slide along the guide grooves, and a blocking block is fixedly provided on the side wall of the debugging test seat in front of the guide grooves.

[0010] Preferably, supporting feet are fixedly provided at the four corner positions of the bottom of the debugging test seat.

[0011] The utility model has the following beneficial effects:

[0012] The utility model discloses a radio frequency chip component debugging and testing device, which can realize the debugging and testing of the three radio frequency chips at the same time by placing three radio frequency chips to be debugged and tested in three radio frequency chip placement slots respectively, and driving the chip pressing plates to press and fix the three radio frequency chips respectively through three pressing rods, and is more efficient. By rotating the screw rod to drive the crossbeam frame to move downward, the three pressing rods can be driven downward together by the spring, and the three radio frequency chips can be pressed by the three chip pressing plates, so there is no need for personnel to manually press the three radio frequency chips one by one, and the operation is more convenient. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0014] Figure 1 This is a schematic diagram of the top view of a radio frequency chip component debugging and testing device of the present invention;

[0015] Figure 2 This is a bottom-up structural diagram of a radio frequency chip component debugging and testing device of the present invention;

[0016] Figure 3 The utility model is a schematic diagram of the internal structure of the top seat in a radio frequency chip component debugging and testing device.

[0017] In the accompanying drawings, the components represented by the reference numerals are as follows:

[0018] 1. Debugging test seat; 11. RF chip placement slot; 12. Guide slide; 13. Block block; 14. Support foot; 2. Top seat; 21. Guide slider; 3. Interface; 4. Pressure rod; 41. Chip clamping plate; 42. Limit plate; 5. Spring; 6. Screw; 61. Adjustment handle; 7. Movable beam; 71. Connecting frame. DETAILED DESCRIPTION

[0019] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0020] See also Figure 1-3 As shown, the utility model provides a technical solution:

[0021] A radio frequency chip component debugging and testing device includes a debugging and testing seat 1, a radio frequency chip placement slot 11 is provided on the top of the debugging and testing seat 1, and three radio frequency chip placement slots 11 are provided side by side with equal intervals. An interface 3 is fixedly connected to the debugging and testing seat 1 on the front side of the radio frequency chip placement slot 11, and a top seat 2 is slidably connected to the top of the debugging and testing seat 1. Guide slots 12 are symmetrically provided on both sides of the debugging and testing seat 1, and guide sliders 21 are symmetrically provided on the lower part of the top seat 2. The guide sliders 21 slide along the guide slots 12, and a blocking block 13 is fixedly provided on the side wall of the debugging and testing seat 1 on the front side of the guide slots 12. The interior of the top seat 2 is horizontally movably connected to a movable beam 7, and both ends of the interface 3 slide along the inner side wall of the top seat 2. A pressure rod 4 is movably penetrated on the movable beam 7. , and three pressure rods 4 on the movable beam 7 are arranged side by side at equal intervals, and a chip pressing plate 41 is fixedly provided at the lower end of the pressure rod 4, and a through groove for avoiding the chip pressing plate 41 is opened on the top seat 2 under the movable beam 7. By placing the three RF chips to be debugged and tested in the three RF chip placement slots 11 respectively, and driving the chip pressing plate 41 to press and fix the three RF chips respectively through the three pressure rods 4, the debugging test of the three RF chips can be achieved at the same time, which is more efficient. When debugging and testing the RF chips, the three RF chips can be placed in the three RF chip placement slots 11 respectively, and then the top seat 2 is manually pushed forward to make the guide slider 21 slide along the guide slide slot 12, and make the guide slider 21 abut against the blocking block 13.

[0022] A limit plate 42 is fixedly provided at the upper end of the pressure rod 4, and a spring 5 is sleeved on the pressure rod 4 between the chip pressing plate 41 and the interface 3. The upper end of the spring 5 abuts on the movable beam 7, and the lower end of the spring 5 abuts on the chip pressing plate 41. The top of the movable beam 7 is fixedly provided with a connecting frame 71. The top of the top seat 2 is rotatably connected to the screw 6 through a bearing. The lower end thread of the screw 6 passes through the middle of the connecting frame 71. By rotating the screw 6, the movable beam 7 is driven to move downward, and the three pressure rods 4 can be driven to move downward together through the spring 5. The three RF chips are pressed by the three chip pressing plates 41. There is no need for personnel to manually press the three RF chips one by one, and the operation is simpler. For convenience, the upper end of the screw 6 extends to the outside of the top seat 2 and is fixedly provided with an adjusting handle 61. The four corner positions of the bottom of the debugging test seat 1 are fixedly provided with supporting feet 14. After the guide slider 21 abuts against the blocking block 13, the adjusting handle 61 is then rotated clockwise to drive the screw 6 to rotate. The rotation of the screw 6 can drive the connecting frame 71 together with the movable beam 7 to move downward. The downward movement of the movable beam 7 can synchronously drive the three pressure rods 4 to move downward through the spring 5, so that the chip clamping plates 41 at the lower ends of the three pressure rods 4 are pressed on the three RF chips respectively, so that the three RF chips can be quickly clamped, and the three RF chips can be debugged and tested at the same time.

[0023] Working principle: During use, when debugging and testing the RF chip, the three RF chips can be placed in the three RF chip placement slots 11 respectively, and then the top seat 2 is manually pushed forward to make the guide slider 21 slide along the guide slide slot 12, and make the guide slider 21 abut against the blocking block 13, and then the adjusting handle 61 is rotated clockwise to drive the screw 6 to rotate. The rotation of the screw 6 can drive the connecting frame 71 to move downward together with the movable beam 7. The downward movement of the movable beam 7 can synchronously drive the three pressure rods 4 to move downward through the spring 5, so that the chip clamping plates 41 at the lower ends of the three pressure rods 4 are pressed on the three RF chips respectively, so that the three RF chips can be quickly clamped, and the three RF chips can be debugged and tested at the same time.

[0024] Throughout this specification, references to terms such as "one embodiment," "example," or "specific example" indicate that a specific feature, structure, material, or characteristic described in conjunction with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of these terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0025] The above are only preferred embodiments of the present invention and do not limit the present invention. Any modification to the technical solutions described in the aforementioned embodiments and any equivalent replacement of some of the technical features therein fall within the scope of protection of the present invention.

Claims

1. A radio frequency chip component debugging and testing device, comprising a debugging and testing socket (1), characterized in that: The top of the debugging test seat (1) is provided with a radio frequency chip placement slot (11), and three radio frequency chip placement slots (11) are provided side by side with equal spacing. The debugging test seat (1) on the front side of the radio frequency chip placement slot (11) is fixedly connected with an interface (3). The top of the debugging test seat (1) is slidably connected with a top seat (2). The interior of the top seat (2) is horizontally movably connected with a movable beam (7). A pressure rod (4) is movably passed through the movable beam (7), and three pressure rods (4) on the movable beam (7) are arranged side by side with equal spacing. The pressure rod (4 ) is fixedly provided with a chip clamping plate (41) at the lower end, a limit plate (42) is fixedly provided at the upper end of the pressure rod (4), a spring (5) is sleeved on the pressure rod (4) between the chip clamping plate (41) and the interface (3), a connecting frame (71) is fixedly provided at the top of the movable beam (7), a screw rod (6) is rotatably connected to the top of the top seat (2) through a bearing, the lower end thread of the screw rod (6) passes through the middle of the connecting frame (71), and the upper end of the screw rod (6) extends to the outside of the top seat (2) and is fixedly provided with an adjusting handle (61).

2. A radio frequency chip component debugging and testing device according to claim 1, characterized in that: Both ends of the movable beam (7) slide along the inner side wall of the top seat (2).

3. The radio frequency chip component debugging and testing device according to claim 1, characterized in that: The upper end of the spring (5) abuts against the movable beam (7), and the lower end of the spring (5) abuts against the chip pressing plate (41).

4. The radio frequency chip component debugging and testing device according to claim 1, characterized in that: A through slot for avoiding the chip pressing plate (41) is provided on the top seat (2) below the movable beam (7).

5. The radio frequency chip component debugging and testing device according to claim 1, characterized in that: Guide slots (12) are symmetrically provided on both sides of the debugging test seat (1), and guide sliders (21) are symmetrically provided on the lower part of the top seat (2). The guide sliders (21) slide along the guide slots (12), and a blocking block (13) is fixedly provided on the side wall of the debugging test seat (1) on the front side of the guide slots (12).

6. The radio frequency chip component debugging and testing device according to claim 1, characterized in that: Support feet (14) are fixedly provided at the four corner positions of the bottom of the debugging test seat (1).

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