Waveguide sheet test fixture

By designing a waveguide test fixture, using grooves, inclined sides and supporting surfaces to fix the waveguide, and through alcohol adhesion and movable bracket adjustment, the problem of test inaccuracy caused by internal stress generated by the fixture was solved, and stable fixation and efficient testing of the waveguide were achieved.

CN223431499UActive Publication Date: 2025-10-14HANGZHOU LINGXI MICRO-LIGHT TECH CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202422839246.X
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-21
Publication Date
2025-10-14
Estimated Expiration
2034-11-21

AI Technical Summary

Technical Problem

Traditional fixtures easily generate internal stress when clamping waveguides, causing microstructure deformation and affecting the accuracy of test results.

Method used

A waveguide testing fixture was designed. The waveguide was fixed by using the grooves and inclined side surfaces on the base as well as the supporting surface and the inclined side surfaces. The waveguide was adhered to the supporting surface using substances such as alcohol to avoid internal stress. At the same time, the movable bracket and adjustment assembly were used for adjustment and fixation to adapt to different models of waveguides.

Benefits of technology

Effectively maintain the position stability of the waveguide during the detection process, avoid displacement and internal stress, and improve the accuracy and efficiency of the test results.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN223431499U_ABST
    Figure CN223431499U_ABST
Patent Text Reader

Abstract

The utility model discloses a waveguide sheet test tool, comprising a pedestal provided with a groove, and the groove comprises at least one inclined side surface; the support is arranged on the base, the support at least comprises a bearing surface, the waveguide sheet is arranged between the bearing surface and the inclined side surface, and the bearing surface and the inclined side surface act together to fix the waveguide sheet. According to the waveguide sheet test fixture, on one hand, the position state of the waveguide sheet can be kept in the detection process, the situation that the test efficiency and the test accuracy are affected due to the fact that the waveguide sheet shifts in the test process is avoided, on the other hand, the waveguide sheet does not generate internal stress in the detection process, and the test accuracy is improved. Therefore, the accuracy of the waveguide sheet test result is further improved.
Need to check novelty before this filing date? Find Prior Art

Description

TECHNICAL FIELD

[0001] The utility model relates to optical waveguide technical field especially is involved in a waveguide piece test fixture. BACKGROUND

[0002] With the high -speed development of information technology, the way that human obtains, handles information from the past single to the diversification, AR glasses as the medium of man -machine information transmission and interaction have developed rapidly in the past few years. Among them, the waveguide sheet is an important component of AR equipment.

[0003] The clamp is required extremely high in the processing and testing process of waveguide sheet, and the placement mode and stress condition of waveguide sheet in the clamp can significantly affect the accuracy of its test result. At present, the traditional clamp is easy to generate internal stress to waveguide sheet when clamping waveguide sheet, and these internal stresses can cause the microstructure deformation of waveguide sheet. For example, the waveguide sheet needs to be strictly detected in the pre-manufacturing and finished product for the face shape precision and the parallelism of the front and back surfaces, and the waveguide sheet needs to be kept vertical without internal stress such as extrusion or compression. These stresses can seriously affect the accuracy of the test result. SUMMARY

[0004] The utility model discloses at least solve one of the prior art technical problems. Therefore, the utility model provides a waveguide sheet test fixture, and the waveguide sheet test fixture can satisfy the position state of waveguide sheet in the detection process without generating internal stress, and improve the accuracy of the test result.

[0005] According to the waveguide sheet test fixture of the utility model, the waveguide sheet test fixture includes:

[0006] The base is provided with a groove, and the groove includes at least one inclined side surface;

[0007] The bracket is arranged on the base, and the bracket includes at least one bearing surface, the waveguide sheet is arranged between the bearing surface and the inclined side surface, and the bearing surface and the inclined side surface jointly act to fix the waveguide sheet.

[0008] In some embodiments, the bracket includes a fixed bracket and a movable bracket, the fixed bracket is fixed on the base, the movable bracket can move on the base in a first direction, and the first direction is the arrangement direction of the fixed bracket and the movable bracket;

[0009] The bearing surface includes a first bearing surface on the fixed bracket and a second bearing surface on the movable bracket, the first bearing surface and the second bearing surface are arranged in the same plane, and the first bearing surface, the second bearing surface and the inclined side surface jointly act to fix the waveguide sheet.

[0010] In some optional embodiments, the bracket further includes an adjustment component, the adjustment component is disposed on the base, the movable bracket is disposed on the adjustment component, and the adjustment component is used to adjust the position of the movable bracket on the base.

[0011] In some optional embodiments, the adjustment component includes:

[0012] a guide rail, the guide rail being arranged on the base along the first direction, and the movable bracket being arranged on the guide rail;

[0013] An adjusting unit is connected to the movable bracket to enable the movable bracket to move along the first direction on the guide rail.

[0014] In some optional embodiments, the adjustment assembly further includes a guide rail fixing member, and the guide rail fixing member is used to fix the guide rail on the base.

[0015] In some optional embodiments, the adjusting unit includes an adjusting screw, a first threaded hole is provided on the movable bracket, the base also includes a boss, a receiving hole is provided on the boss, one end of the adjusting screw extends into the boss through the receiving hole, and the other end of the adjusting screw is connected to the movable bracket through the first threaded hole and passes through the first threaded hole.

[0016] In some optional embodiments, the adjusting unit further includes a screw support, which is arranged on the base, and the screw support is arranged on the side of the movable bracket away from the boss to support the adjusting screw, and a through hole is provided on the screw support, and the adjusting screw passes through the through hole and extends out from the through hole.

[0017] In some optional embodiments, the adjusting unit further includes a knob, which is arranged on a side of the screw support away from the movable bracket, and the knob is connected to the adjusting screw.

[0018] In some embodiments, the supporting surface and the oblique side surface are both planes.

[0019] In some optional embodiments, the groove further includes a bottom surface, and the bracket is arranged on the bottom surface.

[0020] According to the waveguide plate test fixture of the present invention, a groove is provided on the base, and an inclined side surface is provided on the groove for supporting the waveguide plate. At the same time, a supporting surface is also provided on the base, and the waveguide plate can be attached to the supporting surface using substances such as alcohol, so that the supporting surface and the inclined side surface can act on the waveguide plate together. On the one hand, the waveguide plate can maintain its position during the detection process, avoiding the displacement of the waveguide plate during the test process, affecting the test efficiency and test accuracy. On the other hand, the waveguide plate will not generate internal stress during the detection process, thereby further improving the accuracy of the waveguide plate test results.

[0021] Additional aspects and advantages of the present invention will be given in part in the following description and will become apparent from the following description or learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 1 is a schematic diagram of a waveguide testing fixture according to an embodiment of the present invention;

[0023] Figure 2 1 is a three-dimensional schematic diagram of a waveguide testing fixture according to an embodiment of the present invention;

[0024] Figure 3 FIG. 1 is a schematic diagram of a waveguide testing fixture according to another embodiment of the present invention.

[0025] Reference numerals:

[0026] 1000: Waveguide test fixture; 100: Base; 110: Groove; 111: Oblique side; 112: Bottom; 120: Boss; 200: Bracket; 201: Supporting surface; 210: Fixed bracket; 220: Movable bracket; 2011: First supporting surface; 2012: Second supporting surface; 230: Adjustment assembly; 240: Adjustment unit; 2401: Knob; 2402: Screw support; 2403: Adjustment screw; 250: Guide rail; 260: Guide rail fixing member;

[0027] a: Waveguide. DETAILED DESCRIPTION

[0028] The following describes in detail embodiments of the present invention, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to explain the present invention, and should not be construed as limiting the present invention.

[0029] The disclosure below provides many different embodiments or examples for realizing different structures of the present invention. In order to simplify the disclosure of the present invention, the components and settings of specific examples are described below. Of course, they are merely examples and are not intended to limit the present invention. In addition, the present invention may repeat reference numbers and / or letters in different examples. This repetition is for the purpose of simplicity and clarity and does not in itself indicate the relationship between the various embodiments and / or settings discussed. In addition, the present invention provides examples of various specific processes and materials, but a person of ordinary skill in the art will appreciate the applicability of other processes and / or the use of other materials.

[0030] Reference below Figures 1-3 A waveguide test fixture 1000 according to an embodiment of the present invention is described. The waveguide test fixture 1000 includes a base 100 and a bracket 200. The base 100 may be shaped approximately like a rectangular parallelepiped or a cube. A groove 110 is provided on the base 100. The groove 110 includes at least one oblique side surface 111. It is understood that the groove 110 may be a V-shaped groove, a U-shaped groove, or similar shape, and the present invention is not limited thereto, as long as the groove 110 includes at least one oblique side surface 111. For example, in an embodiment of the present invention, the groove 110 may be an open groove having only one oblique side surface 111 and a bottom surface 112. Alternatively, the groove 110 may include the oblique side surface 111, the bottom surface 112, and a straight side surface connecting the oblique side surface 111 and the bottom surface 112. It should be noted that the side surface of the groove 110 forms an angle α with the surface of the base 100, where the oblique side surface 111 refers to the side surface formed when 90° < α < 180°.

[0031] Please continue to refer to Figures 1-3 Furthermore, the bracket 200 is disposed on the base 100. The bracket 200 includes at least one supporting surface 201. The waveguide sheet a is disposed between the supporting surface 201 and the oblique side surface 111. The supporting surface 201 and the oblique side surface 111 cooperate to secure the waveguide sheet a. It is understood that the bracket 200 may be disposed on the base 100. The bracket 200 may be disposed on a surface of the base 100 or within a groove 110 of the base 100. This embodiment of the present invention is not limited thereto.

[0032] It should be noted that the bracket 200 can be fixed or movably set on the base 100, and the waveguide plate a is set between the supporting surface 201 of the bracket 200 and the inclined side surface 111 of the groove 110, so that the waveguide a is fixed by the support of the supporting surface 201 and the inclined side surface 111.

[0033] Specifically, for example, in one embodiment of the present invention, alcohol can be evenly sprayed on the supporting surface 201, and then the waveguide plate a to be tested is tilted and placed in the groove 110 of the base 100, and then the waveguide plate a is gently pushed onto the supporting surface 201 sprayed with alcohol. When the supporting surface 201 sprayed with alcohol is bonded to the waveguide plate a, the alcohol will displace the air between the waveguide plate a and the supporting surface 201, so there is no atmospheric pressure in the displaced area. Assuming that the contact area of ​​the displaced air is ΔS and the atmospheric pressure is P, there is an atmospheric pressure difference of f=P*ΔS between the two surfaces of the waveguide plate a. The atmospheric pressure difference is the bonding force of the waveguide plate a on the supporting surface 201, so that the waveguide plate a can be fixed between the supporting surface 201 and the inclined side surface 111, so that the position state of the waveguide plate a is maintained during the detection process without generating internal stress, thereby improving the accuracy of the test results. Moreover, due to the volatility of alcohol, when the waveguide plate a is tested and removed from the waveguide plate test fixture 1000, the alcohol attached to the surface of the waveguide plate a will evaporate quickly, and no residue will be generated on the surface of the waveguide plate a, which is beneficial to improving the yield of the production of the waveguide plate a.

[0034] Of course, in some other embodiments of the present invention, it is also possible to coat a substance with high viscosity such as vaseline on the supporting surface 201, or to stick double-sided tape on the supporting surface 201, so that the waveguide plate a can be attached to the supporting surface 201 through the adhesion of vaseline or double-sided tape.

[0035] The inventors discovered in their research that the placement and stress conditions of the waveguide in the fixture during waveguide processing and testing significantly affect the accuracy of test results. Conventional fixtures often generate internal stresses in the waveguide when holding it. These stresses can cause microstructural deformation in the waveguide, severely impacting the accuracy of test results.

[0036] In view of this, according to the waveguide plate test fixture 1000 of the present invention, a groove 110 is provided on the base 100, and an inclined side surface 111 is provided on the groove 110 for supporting the waveguide plate a. At the same time, a supporting surface 201 is also provided on the base 100, and the waveguide plate a can be attached to the supporting surface 201 using substances such as alcohol, so that the supporting surface 201 and the inclined side surface 111 can act on the waveguide plate a together. On the one hand, the waveguide plate a can maintain its position during the detection process, avoiding the displacement of the waveguide plate a during the test process, affecting the test efficiency and test accuracy, and the waveguide plate a can be vertically set in the waveguide plate test fixture; on the other hand, the waveguide plate a will not generate internal stress during the detection process, thereby further improving the accuracy of the test results of the waveguide plate a.

[0037] Please continue to refer to Figures 1-3In some embodiments, the bracket 200 includes a fixed bracket 210 and a movable bracket 220. The fixed bracket 210 is fixed to the base 100, and the movable bracket 220 can be moved along a first direction (such as Figure 2 The first direction is the arrangement direction of the fixed bracket 210 and the movable bracket 220, and the supporting surface 201 includes a first supporting surface 2011 located on the fixed bracket 210 and a second supporting surface 2012 located on the movable bracket 220. The first supporting surface 2011 and the second supporting surface 2012 are arranged in the same plane, and the first supporting surface 2011, the second supporting surface 2012 and the oblique side surface 111 work together to fix the waveguide sheet a.

[0038] It can be understood that the waveguide plate a is a sheet-like optical element. During the test process, light may need to pass through the waveguide plate a. Therefore, the bracket 200 is set as a fixed bracket 210 and a movable bracket 220. The supporting surface 201 includes a first supporting surface 2011 located on the fixed bracket 210 and a second supporting surface 2012 located on the movable bracket 220. In addition, the first supporting surface 2011 and the second supporting surface 2012 are arranged coplanarly, so that the waveguide plate a can be fixed from opposite ends, so that the central part of the waveguide plate a will not be blocked, and the stability of the waveguide plate a fixed on the waveguide plate test fixture 1000 is guaranteed.

[0039] Furthermore, since the waveguide sheet a has many different models with different shapes or sizes, in the embodiment of the present invention, the bracket 200 is configured as a fixed bracket 210 and a movable bracket 220, and the movable bracket 220 can move along the first direction on the base 100. Therefore, for waveguide sheets a of different shapes or sizes, the waveguide sheet test fixture 1000 can flexibly adjust the position of the movable bracket 220 to adapt to different models of waveguide sheets a, thereby improving the versatility of the waveguide sheet test fixture 1000.

[0040] It should be noted that since the first bearing surface 2011 is disposed on the fixed support 210 and the second bearing surface 2012 is disposed on the movable support 220, when alcohol is sprayed on the first bearing surface 2011 and the second bearing surface 2012 and the waveguide sheet is attached to the first bearing surface 2011 and the second bearing surface 2012, the atmospheric pressure difference between the two surfaces of the waveguide sheet is related to ΔS, where ΔS is the contact area of ​​the displaced air, i.e., the total contact area between the waveguide sheet and the first bearing surface 2011 and the waveguide sheet and the second bearing surface 2012. By adjusting the position of the movable support 220, the magnitude of ΔS can be adjusted, thereby adjusting the adhesion force between the waveguide sheet and the first bearing surface 2011 and the second bearing surface 2012.

[0041] Please continue to refer to Figures 1-3In some optional embodiments, the bracket 200 further includes an adjustment assembly 230. The adjustment assembly 230 is disposed on the base 100, and the movable bracket 220 is disposed on the adjustment assembly 230. The adjustment assembly 230 is used to adjust the position of the movable bracket 220 on the base 100. Thus, by using the adjustment assembly 230 to adjust the movable bracket 220, the adjustment is convenient, which is conducive to improving the testing efficiency of the waveguide sheet a.

[0042] Specifically, the adjustment component 230 can be a component such as a slider, which can move along the first direction on the base 100, thereby driving the movable bracket 220 to move on the base 100. Of course, the adjustment component 230 can also be other structures, and the embodiment of the utility model is not limited to this.

[0043] Please continue to refer to Figures 1-3 In some optional embodiments, the adjustment assembly 230 includes a guide rail 250 and an adjustment unit 240. The guide rail 250 is arranged on the base 100 along a first direction, and the movable bracket 220 is disposed on the guide rail 250. The adjustment unit 240 is connected to the movable bracket 220, and the adjustment unit 240 is adjusted to move the movable bracket 220 along the first direction on the guide rail 250. Thus, by providing the guide rail 250 on the base 100 and arranging the guide rail 250 along the first direction, the movable bracket 220 can move along the guide rail 250 in the first direction, further improving the adjustment stability of the waveguide test fixture 1000 and thereby further improving the accuracy of the waveguide test results.

[0044] It should be noted that the movable bracket 220 is disposed on the guide rail 250 and is connected to the adjustment unit 240, so that by adjusting the adjustment unit 240, the movable bracket 220 can be moved along the first direction on the guide rail 250. The adjustment unit 240 may include a motor, and after the motor is activated, the adjustment unit 240 can adjust the position of the movable bracket 220. Of course, the embodiment of the present invention is not limited to this, and the adjustment unit 240 can also be manually controlled by the tester to adjust the position of the movable bracket 220.

[0045] Please continue to refer to Figures 1-3 In some optional embodiments, the adjustment assembly 230 further includes a guide rail fixing member 260, which is used to fix the guide rail 250 to the base 100. Thus, using the guide rail fixing member 260 to fix the guide rail 250 further improves the stability of the adjustment of the waveguide test fixture 1000, thereby further improving the accuracy of the waveguide test results. The guide rail fixing member 260 can be a fixing element such as a screw or bolt, thereby fixing the guide rail 250 to the base 100.

[0046] Please continue to refer to Figures 1-3In some optional embodiments, the adjusting unit 240 comprises an adjusting screw rod 2403, the movable support 220 is provided with a first threaded hole, the base 100 further comprises a boss 120, the boss 120 is provided with a receiving hole, one end of the adjusting screw rod 2403 extends into the boss 120 through the receiving hole, and the other end of the adjusting screw rod 2403 is connected with the movable support 220 through the first threaded hole and passes through the first threaded hole. When it is necessary to adjust the position of the movable support 220, the movable support 220 can be moved along the first direction on the guide rail 250 by rotating the adjusting screw rod 2403, so that the control of the movable support 220 is simple and easy to operate, which is beneficial to simplify the structure of the waveguide sheet testing fixture 1000 and improve the testing efficiency of the waveguide sheet.

[0047] Understandably, the other end of the adjusting screw rod 2403 is connected with the movable support 220 through the first threaded hole and passes through the first threaded hole, so that the adjusting screw rod 2403 extends out of the side of the movable support 220 away from the guide rail fixing member 260, so as to facilitate the operator to grasp the adjusting screw rod 2403, thereby facilitating the control of the position of the movable support 220.

[0048] It should be noted that the boss 120 can be arranged in the groove 110, and the receiving hole arranged on the boss 120 can be a light hole or a threaded hole, which is not limited in the embodiments of the present application. The base 100 with the groove 110 and the boss 120 can be formed by an integral molding process, so as to simplify the structure of the waveguide sheet testing fixture 1000.

[0049] Please continue to refer to Figures 1-3 In some optional embodiments, the adjusting unit 240 further comprises a screw rod support member 2402, the screw rod support member 2402 is arranged on the base 100, and the screw rod support member 2402 is arranged on the side of the movable support 220 away from the boss 120 to support the adjusting screw rod 2403, the screw rod support member 2402 is provided with a through hole, and the adjusting screw rod 2403 passes through the through hole and extends out of the through hole. Therefore, by arranging the screw rod support member 2402, the stability of the control of the screw rod can be further improved, so as to improve the stability of the adjustment of the movable support 220, and further improve the stability of the adjustment of the waveguide sheet testing fixture 1000, thereby further improving the accuracy of the waveguide sheet testing result. The through hole on the screw rod support member 2402 can also be a threaded hole.

[0050] Please continue to refer to Figures 1-3In some optional embodiments, the adjustment unit 240 further includes a knob 2401, which is disposed on a side of the screw support 2402 away from the movable bracket 220. The knob 2401 is connected to the adjustment screw 2403. This facilitates the operator's grip on the adjustment screw 2403, thereby facilitating control of the position of the movable bracket 220 and further improving waveguide testing efficiency.

[0051] It can be understood that the knob 2401 can also be provided with a groove with a thread, so that the knob 2401 can be fixed to the adjusting screw 2403 through a threaded connection. Of course, the embodiment of the present invention is not limited to this. The knob 2401 can also be fixed to the adjusting screw 2403 in other ways, for example, by fixing the adjusting screw 2403 to the knob 2401 through a snap.

[0052] Please continue to refer to Figures 1-3 In some embodiments, both the supporting surface 201 and the oblique side surface 111 are planar. Thus, by configuring the supporting surface 201 and the oblique side surface 111 as planar surfaces, the position of the movable bracket 220 can be adjusted to adjust the magnitude of ΔS, thereby adjusting the adhesion force between the waveguide sheet and the first supporting surface 2011 and the second supporting surface 2012. Furthermore, by configuring both the supporting surface 201 and the oblique side surface 111 as planar surfaces, the waveguide sheet testing fixture 1000 has a simple structure, is easy to manufacture, and has high versatility.

[0053] It is understood that in some other embodiments, the supporting surface 201 and the oblique side surface 111 may also be curved surfaces, and the embodiments of the present invention are not limited thereto. When the first supporting surface 2011 and the second supporting surface 2012 are curved surfaces, the first supporting surface 2011 and the second supporting surface 2012 are coplanar, meaning that the surface of the first supporting surface 2011 in contact with the waveguide sheet a is coplanar with the surface of the second supporting surface 2012 in contact with the waveguide sheet a.

[0054] Please continue to refer to Figures 1-3 In some optional embodiments, the groove 110 further includes a bottom surface 112, and the bracket 200 is disposed on the bottom surface 112. It can be understood that disposing the bracket 200 on the bottom surface 112 of the groove 110 is conducive to improving the stability of the bracket 200, thereby further improving the adjustment stability of the waveguide test fixture 1000, thereby further improving the accuracy of the waveguide test results, and helping to reduce the volume of the waveguide test fixture 1000.

[0055] Other structures and operations of the waveguide testing fixture 1000 according to the embodiment of the present invention are known to those skilled in the art and will not be described in detail here.

[0056] In the description of the utility model, it is understood that the orientation or positional relationship indicated by the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like is the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the utility model and simplifying the description, and does not indicate or imply that the device or element indicated must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the utility model.

[0057] In addition, the terms "first" and "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first" and "second" can explicitly or implicitly include one or more of the features. In the description of the utility model, the meaning of "multiple" is two or more than two, unless otherwise specifically limited.

[0058] In the utility model, unless otherwise specifically defined and limited, the terms "mounting", "connection", "connection", "fixing" and the like should be understood in a broad sense, for example, it can be fixed connection, or detachable connection, or integrated; it can be mechanical connection, or electrical connection, or communication; it can be directly connected, or indirectly connected through intermediate medium, or the communication or interaction relationship between two elements. For ordinary skilled in the art, the specific meaning of the above terms in the utility model can be understood according to the specific circumstances.

[0059] In the utility model, unless otherwise specifically defined and limited, the first feature is "on" or "under" the second feature, which can be direct contact between the first and second features, or indirect contact between the first and second features through intermediate medium. Moreover, the first feature "above", "above" and "above" the second feature can be directly above or obliquely above the first feature, or only indicate that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "below" and "below" the second feature can be directly below or obliquely below the first feature, or only indicate that the horizontal height of the first feature is less than that of the second feature.

[0060] In the description of the present specification, the description referring to the terms "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" and the like means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In the present specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples. Furthermore, the person skilled in the art can combine and combine the different embodiments or examples described in the present specification and the features of the different embodiments or examples, without mutual contradiction.

[0061] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, replacements and variations can be made to these embodiments without departing from the principles and spirits of the present application, and the scope of the present application is defined by the claims and their equivalents.

Claims

1. A waveguide testing fixture, characterized in that: The waveguide test fixture includes: A base, wherein the base is provided with a groove, and the groove includes at least one oblique side surface; The bracket is arranged on the base, the bracket includes at least one supporting surface, the waveguide plate is arranged between the supporting surface and the inclined side surface, and the supporting surface and the inclined side surface work together to fix the waveguide plate.

2. The waveguide testing fixture according to claim 1, characterized in that: The bracket includes a fixed bracket and a movable bracket, the fixed bracket is fixed on the base, and the movable bracket can move on the base along a first direction, and the first direction is the arrangement direction of the fixed bracket and the movable bracket; The supporting surface includes a first supporting surface located on the fixed bracket and a second supporting surface located on the movable bracket, the first supporting surface and the second supporting surface are arranged coplanarly, and the first supporting surface, the second supporting surface and the oblique side surface work together to fix the waveguide plate.

3. The waveguide testing fixture according to claim 2, characterized in that: The bracket further includes an adjusting component, which is arranged on the base. The movable bracket is arranged on the adjusting component, and the adjusting component is used to adjust the position of the movable bracket on the base.

4. The waveguide testing fixture according to claim 3, characterized in that: The adjustment component includes: a guide rail, the guide rail being arranged on the base along the first direction, and the movable bracket being arranged on the guide rail; An adjusting unit is connected to the movable bracket to enable the movable bracket to move along the first direction on the guide rail.

5. The waveguide testing fixture according to claim 4, characterized in that: The adjustment assembly further includes a guide rail fixing member, which is used to fix the guide rail on the base.

6. The waveguide testing fixture according to claim 5, characterized in that: The adjusting unit includes an adjusting screw, a first threaded hole is provided on the movable bracket, the base also includes a boss, a receiving hole is provided on the boss, one end of the adjusting screw extends into the boss through the receiving hole, and the other end of the adjusting screw is connected to the movable bracket through the first threaded hole and passes through the first threaded hole.

7. The waveguide testing fixture according to claim 6, characterized in that: The adjusting unit also includes a screw support, which is arranged on the base, and the screw support is arranged on the side of the movable bracket away from the boss to support the adjusting screw. A through hole is provided on the screw support, and the adjusting screw passes through the through hole and extends out from the through hole.

8. The waveguide testing fixture according to claim 7, characterized in that: The adjusting unit further includes a knob, which is arranged on a side of the screw support away from the movable bracket, and the knob is connected to the adjusting screw.

9. The waveguide testing fixture according to any one of claims 1 to 8, characterized in that: The supporting surface and the oblique side surface are both planes.

10. The waveguide testing fixture according to claim 9, characterized in that: The groove further includes a bottom surface, and the bracket is arranged on the bottom surface.